JPS6022879A - System for controlling sensitivity of solid-state image pickup device - Google Patents

Abstract

PURPOSE:To attain partial sensitivity control as well as sensitivity control uniform for all picture by controlling an electric charge storage time to an incident light at a unit photoelectric converting element in response to the amount of a stored image pickup output signal. CONSTITUTION:The reading of a solid-state image pickup board 8 is executed by changing over a Y switch (included in each unit element in the image pickup board 8) and an X switch 11 sequentially by a Y scanning circuit 9 and and an X scanning circuit 10. The signal level is detected from an output signal read in this way by a reset signal control section 13 and the amount of incident light is detected. The reset time of each unit element is controlled independently of the signal read of the unit element in response to the amount of incident light and Y and X reset circuits 14 and 15 are provided for the purpose. Thus, the sensitivity control is attained at each unit element and mechanical aperture is not almost required.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a sensitivity control method for a photoelectric conversion device, and in particular to a sensitivity control method for a solid-state imaging device that enables not only uniform sensitivity control over the entire screen but also partial sensitivity control. be.

Conventionally, sensitivity control has been performed by controlling the amount of incident light using a mechanical aperture. First, I will explain the outline and problems of this mechanical aperture.

FIG. 1 shows a light amount control system of an imaging device that controls sensitivity by changing the amount of incident light using an aperture mechanism. The incident light is imaged by the lens system 1 on the light receiving surface of the photoelectric conversion element 2, and the photoelectrically converted electrical signal is amplified to a predetermined amplitude by the amplifier 3 and output from the output terminal 4. For example, in order to obtain an appropriate photoelectric conversion output signal within the dynamic range of the amplifier 3 and perform sensitivity control, the photoelectric conversion element 2
A diaphragm mechanism was essential to adjust the amount of light entering the camera. That is, in the configuration shown in FIG. 1, an aperture 7 is provided whose transmitted light, φ, is controlled by an aperture control circuit 5 and an aperture drive system 6 in accordance with the amplitude of the output signal of the amplifier 3.

The aperture 7 can be operated automatically using an aperture control circuit 5 or the like, or can be manually operated by the operator of the imaging device. However, in conventional imaging devices, due to the fact that a mechanical system is included inside the aperture system that controls the artificial light j for sensitivity control and the aperture system (i.e., there is inertia), The drawback was that it could not follow rapid movements.

Also, since the incident light M: from the lens is changed,
The amount of light could only be adjusted uniformly over the entire screen, and it was impossible to change the amount of light in 1, 1, 8 minute increments. Therefore,
For example, in the case of a screen where the amount of incident light is significantly different in some parts, such as a screen that partially contains the sky, or a screen shot indoors and outdoors at the same time, if you adjust the level to -force, the other side will
There was also the problem that ``over-white'' or ``over-black'' occurred.

Roughly speaking, in conventional image pickup tubes and single-body imaging devices, signal readout and reset operations are completed simultaneously for each pixel arrayed in a two-dimensional plane. Therefore, for the pixel from which the signal has been read out, the next readout II! +' (that is, after one frame time) is the charge accumulation time, but during this time, other pixels are sequentially read out and reset operations are performed continuously, and the output signal for each pixel is sent to each pixel. Since it is configured to output through a single common output terminal, (ii
It was impossible to perform the reset operation at a timing unrelated to the number reading. Therefore, in an imaging device using such an imaging tube or solid-state imaging device, sensitivity control cannot be performed without using a mechanical aperture.

Therefore, the present invention performs a reset operation for each pixel in an image sensor independently of the readout timing of that pixel, thereby making the charge accumulation time of each pixel as desired, and thereby controlling the sensitivity of each pixel. It was created with a focus on the ability to do the following:
A solid-state imaging device sensitivity control method that enables not only uniform sensitivity control over the entire screen, but also partial sensitivity control, instead of the conventional mechanical aperture that controls sensitivity uniformly over the entire screen. Our goal is to provide the following.

In order to achieve such [] objective, the present invention uses an image,
In a solid-state imaging device that obtains an imaging output signal by scanning a plurality of solid-state unit photoelectric conversion elements corresponding to 12 at a predetermined period, the imaging output signal is accumulated, and the solid-state unit photoelectric conversion element corresponding to the It is possible to control the charge accumulation time for incident light in the Clj photoelectric conversion element.

Hereinafter, with reference to the drawings, the configuration and operation of the present invention will be explained in 1.
I will explain in detail.

First, an example of a solid-state imaging device suitable for use in the solid-state imaging device sensitivity control method of the present invention will be described.

Figure Q'r 2 is a circuit showing intermediate elements and related components constituting a solid-state image pickup plate for non-destructive readout.

In this figure, the parallel connection of a capacitor C and a resistor R is such that an output signal corresponding to the rotation of a photoelectric conversion section formed of a photoconductive film is sent out, and an amplifier, ie, a cL field effect transistor (
(hereinafter referred to as FET) is input to the gate of TA.

Note that the photoelectric conversion section may also be formed by a photodiode or the like made of a PN junction.

The signal amplified by the FET TA is supplied to the next stage load R via the scanning transistor switches Ty and Tx, and is taken out as an output signal. Here, the charges accumulated in the gate of the FET TA according to the above-mentioned amount of incident light do not disappear even after the output signal is taken out, and non-destructive readout is realized.

In a normal imaging device, the reset transistor TR is installed immediately after taking out the above-mentioned output signal in order to accumulate the charge generated by the incident light until the readout time of the next frame and output it as the image signal of the next frame. The charge accumulated on the gate of FET TA is reset by
·are doing. Therefore, the power consumption for the image of the next frame may be
f accumulation time. The sensitivity of such an element is controlled by controlling the amount of incident light using, for example, an aperture.

In the 21st J, symbols Ygv, Xsw and Rsw are respectively the Y column selection pulse input terminal, the X row selection pulse 7 input terminal and the reset pulse input terminal, and the symbol Es
is the read power supply. In addition, the area surrounded by one dotted line in FIG. 2 indicates one pixel range.

FIG. 153 is a circuit diagram showing intermediate elements and related components constituting a solid-state imaging plate for destructive readout. In this figure, diode D indicates an equivalent circuit of a photoelectric conversion unit consisting of a photodiode, etc. 1 = ii depending on the amount of incident light applied here, charges are accumulated in the junction capacitance Y of the quadiode etc. . Similar to the unit element shown in the second diagram, when the scanning transistor switches Ty and Tx are turned on, this charge is supplied to the load R at the next stage and taken out as an output signal. Here, since the charge accumulated in the junction capacitance l-1 of the diode is directly read out in response to the amount of continuous manual light, destructive reading is performed, and a reset operation of this unit element is performed. In the case of such an element, since the element itself does not have a sensitivity adjustment function, the sensitivity is controlled by controlling the amount of incident light using, for example, a mechanical aperture.

In addition, in FIG. 3, parts that have the same functions as the constituent parts shown in the second diagram are given the same symbols, and detailed explanations will be omitted. Further, in FIG. 3, the area surrounded by a dotted line indicates one pixel range.

Next, an embodiment in which the uninvented solid-state imaging device sensitivity control method is applied to an imaging device using the solid-state imaging device shown in FIG. 2 or 3 will be described in detail.

FIG. 4 is a block diagram showing the basic configuration of the solid-state imaging device sensitivity control method of the present invention. In this figure, the symbol 8 is a solid-state image pickup plate in which a plurality of unit elements shown in FIG. 2 or 3 described above are two-dimensionally arranged. Then, as in a normal image pickup device, the Y switch (included in each intermediate element in the solid-state image pickup plate 8) and the 12, the output r-1 is sequentially read out from the unit elements arranged in the city direction and the horizontal direction.

In the internal body imaging device sensitivity control method of the present invention, "double f:
, 1lji' + information, the amount of incident light is detected by detecting the output signal level, and the reset time of each intermediate element is set to 1 depending on the amount of incident light as described above. In order to perform control independently of the signal reading of the 11th element, the reset signal control section 13 is provided with a Y reset circuit 14 and an X reset circuit 15. continue,
These operations will be explained.

'('S 5 In the characteristic diagram shown in Figure A, the horizontal axis represents the output signal before the control of the present invention is performed, and the vertical axis represents the accumulation time of the charge generated in the input light to be controlled by the output signal No. 11. That is, based on a certain level of the output signal of the control 111 for the incident light 1d,
3,4. ..., if 32 times the output (horizontal axis) is obtained, there is a corresponding amount of incident light, so ゛11! , load accumulation time is 1/2 of one field time.
. . , by controlling each of the angles of 32 and 32, the relationship between the output signals after the control of the incident light pair shown in FIG. 5B can be obtained. In other words, in the diagram 5B, the horizontal axis is the amount of incident light, and the vertical axis is i.
This is the output signal after controlling yI, and this is a sensitivity control in which the output changes linearly up to a certain standard amount of incident light, but output is obtained in a compressed form for higher amounts of incident light. It shows that you are doing the following.

By doing this, even when exposed to very strong light, the compressed information will not be completely blown out, and the compressed information will be visible! can do. The degree of compression is determined by the reset signal control unit 13 by determining the relationship between the amount of incident light and the charge accumulation time, that is, by associating 'l'' shown in FIGS. 5A and 5B with the value of the amount of incident light, and selecting the slope thereof. It can be made into any desired form depending on the purpose.

There are three cases in the solid-state imaging device sensitivity control method according to the present invention. In the first case, the reset time of each unit element is determined so that the charge accumulation time is the same for all unit elements, which corresponds to the conventional mechanical aperture. Uniform sensitivity control over the entire area.

In the second case, the set time of each element (a) is determined so that the same '1 is the load accumulation time for each unit arranged one-dimensionally corresponding to each scanning line. That's true.

In the third case, each unit element time set 11r is determined so that each unit element has a separate charge accumulation time.

Examples for each case will be described below.

;('t In the case of 1, &,
j to determine the single charge accumulation time.

In this case, each intermediate element constituting each horizontal scanning line is
Even if the reset time is j, that water]・in the first of the scanning lines (
:(The charge accumulation time difference between the element and the last unit element is ', =
IIi-: The sensitivity difference is 11525 and can be ignored, so the X reset circuit can be omitted. Further, the Y reset circuit does not need to be configured using a memory or the like, and a shift register driven by a clock in the horizontal scanning period can be used.

FIG. 6 is a block diagram showing an embodiment of the above-mentioned first case, and FIG. 7 shows waveforms of each part. In the embodiment shown in the sixth figure, the solid-state image pickup plate 8 is constituted by the non-destructive readout unit elements shown in the second figure. Reset signal control section 13'
A specific example of the configuration is shown surrounded by a dotted line in FIG. To control the timing of the reset pulse according to the output level of the video signal, the video signal is input to an integrating circuit made up of resistors R and R2 and a capacitor co. As a result, there are resistors R and R2 at the common connection point v1.
According to the integration circuit time constant determined by the capacitor CO, the average value of the video signal voltage is generated as the waveform pattern shown in FIG. This is supplied to one input terminal of the comparator VC, and the other input terminal is supplied with a sawtooth waveform m synchronized with the read pulse serving as a comparison reference signal.

As a result, the output of the comparator VC is as shown in waveform n.
The voltage difference in vl is converted into a time delay from the read pulse, Ll, t2 . It appears like t3. This waveform n is used to generate a reset pulse. Therefore, for a field or frame period read pulse, the reset pulse is as shown at 7t'57.

Moreover, Tl +T2 and T3 each indicate charge accumulation time. In this case, by using the waveform 1 as is and resetting it continuously for the above-mentioned predetermined period immediately after reading, it is possible to reduce or eliminate blooming and smear caused by strong light.

Next, let us consider other examples of the first case. Figure 8A is a block diagram showing its overall configuration;
Figures B and 8C show configuration examples of the reset signal control unit 13 for determining the charge accumulation time for each field and for determining the charge accumulation time for each frame, respectively. 2A and 2B each show an example of an integrated configuration of the reset signal generator 16 constituting the communication control section 13'.

Further, in these cases, FIG. 9 shows a case where the charge accumulation time is determined for each field with respect to the operation signal waveform of each part, and FIG. 1O shows a case where the charge accumulation time is determined for each frame. In this case, the output signal output in a certain field or frame is integrated over one field period or one frame period, and if the value is below a certain set level, a reset is performed immediately after reading. Generate a pulse. Also, the integral I16 of one field period or l frame period is more than one indeterminate level.]
-, the generation time of the reset pulse is changed depending on the level exceeding the set level, thereby shortening the time for accumulating charges due to the incident light.

That is, in FIGS. 9 and 10, for vertical read pulses of field frequency or frame frequency, the timing of the reset pulse is waveform 1 when resetting immediately after reading, and the timing of the reset pulse is waveform 1 when the accumulation time is shortened. is shown in waveform 2, and the reset pulse waveform when continuous reset is applied with the accumulation time xsi < is shown in waveform 3.

Also, determine the reset timing for each field!
In this case, since reading and resetting are completed in 4 fields, the reset signal control section 13'' connects four reset signal 4 generators 16 in parallel as shown in Figure 8B, and
, B, and C terminals, respectively, are applied with the same waveforms 1 and 1 of waveforms a, b, and c having a one-field difference, respectively, and these reset signal generators 16 are sequentially used. Furthermore, when determining the reset timing for each frame, reading and resetting are completed in two frames, so the reset signal control section 13'' connects two reset generators 16 in parallel as shown in FIG. B
, C: The same waveform signals of waveforms a, b, and c having a time difference of l frame are applied to the terminals r, respectively, and these reset signal generators 16 are used alternately.

Let's take a look at the operation of the reset signal generator 16 in this case.

In FIG. 8D, first, the waveform a of FIG. 9 or 10 is
A video clear pulse shown in FIG. 1 is applied to terminal A, transistor Ql is made conductive, and capacitor 6 is discharged at the same time as the vertical read pulse.

Next, a pulse shown in the waveform of FIG. 9 or FIG. It is stored in the capacitor c1 and is supplied to one input terminal E of the voltage comparator VC. The 'IE pressure change at point E is as shown in waveform e.

Next, a pulse having a waveform C shown in FIG. 9 or 10 is applied to the terminal C to once turn on the transistor 02.
After discharging the capacitor C2, charge is accumulated in the capacitor C2 from the DC voltage connected to the terminal via the resistor R2, and this is applied as a ratio +2 reference signal to the other input terminal of the voltage comparator VC. supply The voltage change at point F is as shown in waveform f. In this way, the voltages across capacitors C1 and C2 are compared, and when the terminal voltage vC2 of capacitor f2 becomes larger than the terminal voltage Vcl of capacitor CI, a reset pulse of waveform 2 is generated. , or turn off the reset pulse as shown in waveform 3 or g.

As a result, when the -1 video signal output is large, the terminal voltage Vc1 of the capacitor C1 also takes a large value, so the reset time is delayed, and therefore the charge storage time becomes 1υ. Conversely, when the video signal output is small, the terminal of the capacitor 0 plate'! [! : fE Vc also becomes a small value and is reset immediately after reading out the video. Thus,
``The charge accumulation time can be increased.

Next, the second case described above, ie, the case where the charge accumulation time is determined for each scanning line, will be described. Ishi 11
The figure shows an example of the overall configuration in this case, and FIG. 12 shows the operating waveforms of each j■. That is, in order to determine the charge accumulation time for each scanning line, the reset belief control section 13 is provided with a plurality of reset signal generators 16 for each scanning line. In this case as well, the X-resen I circuit is not required because each of the four middle gates forming each scanning line is reset at the same time.

As the Y reset circuit, a switch may be provided for each scanning line.

An example in which the solid-state image pickup plate 8 is configured using the honor element shown in the second figure will be described below. In this case, the reset timing of each unit element constituting the scanning line is determined based on the average value of the video signal during one horizontal scanning period. A specific example of the configuration of the reset signal generator 18 may be similar to that shown in FIG. 8D. The operation is almost the same as that shown in FIGS. 88 to 80 described above, but the only difference is that the read period is the horizontal scanning period. Further, it is assumed that similar waveforms are applied to each terminal A, B, and C of each reset signal generator 16 at timings shifted by one horizontal scanning period.

In the reset signal generator 16 whose specific configuration is shown in FIG. 8D, first, a video clear pulse shown in waveform a in FIG. Immediately before the generation of an X-ray readout pulse (X-ray readout pulse synchronized with the horizontal synchronization pulse of the line), the capacitor C1 is brought into a discharge state. Next, a pulse shown in the waveform of FIG.
1 and is stored in the capacitor C1, and is supplied to one input terminal of the voltage comparator VC. The voltage change at point E is as shown in waveform e.

Next, a pulse with waveform C in FIG. C2 and supplies it to the other input terminal of the voltage comparator VC as a comparison reference signal. The voltage change at point F is as shown in waveform f.

Thereby, the voltages across the capacitors CI and C2 are compared, and when the terminal voltage Vc2 of the capacitor C2 becomes larger than the terminal voltage Vcl of the capacitor C1, a reset pulse can be generated at the timing shown in the waveform g. Note that the waveform g is a suitable waveform when resetting is applied continuously immediately after reading, and the waveform is obtained by applying an appropriate voltage of 11 to the J terminal in the Y reset circuit 14' shown in Fig. 11. Y reset circuit 14
' shows the waveform generated from the output side of 111.

Next, the third case described above (that is, the case where the charge accumulation time is determined separately for each priority element) will be described.

FIG. 13 shows an example of the overall configuration in this case. The solid-state image pickup plate 8 is composed of the unit elements 18 shown in the second figure, and in FIG.
-kl only is shown.

Further, details of a specific example of the configuration of the unit element in this case are shown in FIG. 14. Here, in addition to the constituent elements of the unit element shown in Fig. 2, in order to reset each unit element,
It has reset transistors T and T in the row and column directions, respectively.

In this case, that is, a specific configuration example of the reset signal control section 13"' that determines the charge accumulation time for each unit element is shown in FIG. 15.The reset signal control section 13 shown in FIG.
"" indicates mφn reset signal generators 16-11, 18-12, 16-11, 18-12, . -=, 16-nm, and further includes an X scanning circuit 19 for a reset signal control section and a Y scanning circuit 20 for a reset signal control section for scanning these reset signal generators. The X scanning circuit 18 for the reset signal control section and the Y scanning circuit 20 for the υ reset signal control section are each a unit). It is composed of a shift register with a number of stages corresponding to the number of children and a shift register with a number of stages equal to the number of unit elements plus 2. The operating waveforms of each part in this case are shown in Figure 516. Next, we will discuss the operation in this case.

In the following explanation, among the unit elements arranged two-dimensionally on the light-receiving surface of the solid-state image pickup plate 8, the reading time of a sentence is set to T(k,
(sentence). However, if father = 0, that is, T(k
, O) indicates a time during horizontal blanking that is at least one pixel readout period or more before the readout of the first intermediate foot in the first row.

Now, vertically the th unit, horizontally the sentence th unit, +hi I
' Focus on the sentence +8-. The cent signal generator corresponding to this unit element is denoted by 16-. According to the notation described above, each unit element corresponding to the horizontal scanning line in the first row is selected at time T (k, 0), and the unit element corresponding to the horizontal scanning line in the second row is selected at time T (k, l). The first of each unit element corresponding to
The unit element is read out, and in the same manner, the time T
At (k, sentence), the vertical unit element of each unit element corresponding to the horizontal scanning line of the th row is read out.

line at the time T(k-1,0) preceding this]
2 to each reset signal generator 1B-kl, 18-.・−
・, each A terminal included in +6-km Ak+ + Ak2
, -, applying the voltage of waveform a shown in the 16th diagram to Akm,
Each reset signal generator 1B-kl, 1t3- in the th row
2. ..., all capacitors C0 of 1B-km are reset all at once. The reset signal control section X scanning circuit 19 of the reset signal control section 13''''
Since it operates in complete synchronization with the scanning circuit 10, the signal read out in the next horizontal scanning period has the voltage waveform V shown in FIG. 16 and the voltage waveform V shown in FIG.
0 to the gate of the transistor TV through the output terminal YRk, TvK is made conductive, and the times T(k, 1) and T
(k, 2) , ·, T(k.

), . . . , T(k, m), respectively corresponding reset signal generators 1B-kl, = ., 16-11. -,
ILkm (7) Charge each capacitor C1. and,
Capacitor CI continues to hold its terminal voltage Vcl until the next reset signal is received.

Next, at time T (k+1.0), each reset of the th row (+j all generators 1B-kl, -, 18-ki, -
, 113-km at each C end, I'l; + , ・'',
(kl, ”・, Ckm d 18th illustration c7)
Tt Pressure waveform C is applied to reset each capacitor c2 all at once. Therefore, at the same time, capacitor 1
] Each reset signal generator 16 is a comparison output between the terminal voltage Vcl of the capacitor c2 and the terminal voltage Vc7 of the capacitor c2.
The respective outputs -kl, -, 16-ku, -, and +13-km are turned on so as to be equal to/1 of the waveform g shown in FIG.

Next, as shown in waveform C, the two consecutive reset operations γ are completed, and each capacitor c2 is turned on by a predetermined DC' voltage from the terminal, for example, as shown in waveform Vc2 shown in FIG. 16. They are charged all at once. Here, waveform Vc7
is the comparison reference signal. Therefore, as described above, the comparison output remains on as long as Vcl>Vc2 as shown in waveform g. At this time, each reset X-ray XR connected to each output terminal of the X scanning circuit for the reset signal control section,
..., XR sentence, ...

Since pulses synchronized with the read pulses are input to XRm at respective timings, the reset Y lines Yl, . . . , Yk, . , Yn, for example the 18th
A pulse shown in the illustrated waveform r is transmitted.

On the other hand, reset X-rays XR1, -, XRu, -,
Since the pulse waveform X synchronized with the readout pulse is applied to Rm periodically at each time, the reset transistors TRy and T of the unit element where the pulses of both the reset X-ray and the reset Y-line coincide.
Rx is turned on at the same time, and this unit element is reset.

If each unit element and each reset signal generator can be directly coupled, each reset signal control section X scanning circuit 19 and reset signal control section Y scanning circuit 2o of the reset signal control section shown in FIG. Furthermore, the reset transistors TRY and TRx in each unit element can be eliminated and replaced with only the transnoster Tc shown in FIG. 15, and the configuration can be simplified to i+':i.

In each case, an example in which the solid-state image pickup plate 8 is configured using the intermediate element shown in FIG. It can also be configured using a power element. However, in this case, resetting each unit element is equivalent to reading out its r-position element, so resetting must be performed within the blanking period.

) In the second consecutive case, the timing of the reset signal is shown in Fig. 12, which shows its operating waveform, at $ 11
1j, I will explain. In this case, the waveform j' shown in f312 is applied to the J terminal of the Y reset circuit shown in FIG.
A repetitive pulse with a horizontal scanning period is applied. This pulse is extracted by wave g shown in FIG. 12 to obtain a positive signal within the horizontal blanking period as shown in waveform h'.

The solid-state imaging device sensitivity control method of the present invention provides various effects and advantages as follows.

1 According to the present invention, the sensitivity is 1 to 3. HX 105x (
In practical terms, it can be changed significantly from ~103). Therefore, a mechanical diaphragm is almost unnecessary, and even if a mechanical diaphragm is provided, it is only necessary to provide a very simple one, that is, a manual diaphragm as an auxiliary means. Therefore, it is lighter in weight than the conventional one and has a simpler configuration.

2 Since it is an all-electronic system, the response is extremely fast.

3. Since there is no mechanical system, which was an essential configuration condition in the past, failures in the mechanical system are eliminated.

4 You can change the sensitivity of a part of the screen, so you can adjust the image level to a suitable level even for bright spots.
A very wide guinamine range (~103 times) can be obtained.

5 Since the charge accumulation time can be shortened by the solid-state imaging device sensitivity control method of the present invention, the resolution for moving objects, that is, the dynamic resolution can be improved.

Conversely, by making the reset period longer than during normal operation, even extremely dark objects can be imaged with a good S/N ratio.

[Brief explanation of the drawing]

Figure 1 is a block diagram of a light amount control system of a conventional imaging device.
2 and 3 are circuit diagrams showing an example of a solid-state imaging device suitable for use in the sensitivity control force type of the solid-state imaging device of the present invention, and FIG. 4 is a circuit diagram showing the sensitivity of the solid-state imaging device of the present invention. Block diagram showing the principle configuration of the control method, Figures 5A and 5B
Each figure is a diagram for explaining the mode of sensitivity control, and FIG. 6 is a block diagram showing an embodiment of the sensitivity control method of the solid-state imaging device of the present invention. The operation waveform diagrams, FIG. 88 to FIG. 8D, are diagrams explaining other embodiments of the present invention 9 and the sensitivity control fill method of the one-body imaging device 1q, respectively, and FIG. 9 is a diagram illustrating the reset signal control jl1.
Fig. 10 is an operating waveform diagram of each part when the beam set signal control iJ1 section is set to ω86 diagram, +IN is the solid-state imaging device of the present invention; 〆I sensitivity control Block diagram showing still another embodiment of the method, first
Figure 2 is an operation waveform diagram of each part in the configuration of the 11th flash,
3 is a Pronk diagram showing still another embodiment of the solid-state imaging device sensitivity control method of the present invention, FIG. 14 is a circuit diagram showing an example of unit elements constituting the solid-state imaging plate in the configuration of FIG. 13, FIG. 15 is a block diagram showing a specific example of the configuration of the reset signal control section in the configuration of FIG. 13, and FIG. 16 is an operation waveform diagram of each part in the configuration of FIG. 13. ■... Lens system, 2... Photoelectric conversion element, 3... Amplifier, 4... Output terminal, 5... Aperture control circuit, 6... Aperture drive system, 7... Aperture, 8... Solid-state image pickup plate, 9... Y scanning circuit, 10... X scanning circuit, 11... X switch, +2... Amplifier, 13.13', 13''. 13''', +3 ""...Reset I/signal control section, 1
4... Y reset circuit, 15...・X scanning circuit for reset signal control section, 20...
- Y scanning circuit for reset signal control section. +4,. 1 Applicant Japan Broadcasting Corporation 72〉 (to O) 447- 448-

Claims (1)

[Scope of Claims] 1) In a solid-state imaging device in which a number of solid-state unit photoelectric conversion elements corresponding to pixels are distributed 1j and scanned at a predetermined period to obtain an imaging output value 1, A solid-state imaging device sensitivity control force formula, characterized in that the charge accumulation time for incident light in the solid-state unit photoelectric conversion element can be controlled according to the accumulated signal amount. , a solid-state imaging device in which the sensitivity control method according to claim 1 is characterized in that the charge accumulation time is set to a constant value of 1+1 for each screen of the imaging output signal. Sensitivity control method. 3) In the sensitivity control method according to claim 2, the average amplitude of the +iif imaging output signal detected by supplying the 11j imaging output signal to an integrating circuit having a predetermined time constant and the The charge accumulation 114j is performed based on a comparison result obtained by comparing the amplitude of a reference signal that is in phase synchronization with the readout timing of the unit light 'L conversion element and in the readout period of the L conversion element.
A solid-state imaging device N sensitivity control method characterized in that ltll is determined. 4) In the sensitivity control method according to claim 2, the imaging output signal is set to a reference that is synchronized in phase with the output amplitude accumulated during the vertical scanning period and the readout period of the unit photoelectric conversion concentrator and with the readout timing. 1. A sensitivity control method for a solid-state imaging device, characterized in that the charge accumulation time is determined based on a comparison result obtained by comparing the amplitude of a signal. 5) In the sensitivity control force formula according to claim 1, the solid-state imaging device sensitivity control is characterized in that the charge accumulation time is set to a constant value for each horizontal scan of the imaging output signal. method. 6) In the sensitivity control method according to claim 5, the imaging output signal is synchronized with the output amplitude accumulated during the horizontal scanning period and the readout cycle of the unit photoelectric conversion element, and with the readout timing in 7 phases. A solid-state imaging device sensitivity control method, characterized in that the charge accumulation time is determined based on a comparison result obtained by comparing the amplitude of a reference signal. 7) A sensitivity control method for a solid-state imaging device according to claim 1, wherein the charge accumulation time can be determined separately for each unit photoelectric conversion element. 8) In the sensitivity control method according to claim 7, the imaging output signal is converted to the unit photoelectric transformer Jff! J-f
1. A solid-state imaging device sensitivity control method, characterized in that the readout period of the unit light weight conversion element is determined by the output amplitude accumulated at each time, and the readout accumulation time is determined.