JPS60170831A - Inspecting method of sticking precision of substrate - Google Patents

Inspecting method of sticking precision of substrate

Info

Publication number
JPS60170831A
JPS60170831A JP59027616A JP2761684A JPS60170831A JP S60170831 A JPS60170831 A JP S60170831A JP 59027616 A JP59027616 A JP 59027616A JP 2761684 A JP2761684 A JP 2761684A JP S60170831 A JPS60170831 A JP S60170831A
Authority
JP
Japan
Prior art keywords
patterns
substrate
inspection
pattern
accuracy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59027616A
Other languages
Japanese (ja)
Inventor
Shozo Tanaka
田中 省造
Hiroshi Takanashi
高梨 宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP59027616A priority Critical patent/JPS60170831A/en
Publication of JPS60170831A publication Critical patent/JPS60170831A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133354Arrangements for aligning or assembling substrates

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Liquid Crystal (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

PURPOSE:To facilitate and speed up inspection by inspecting the sticking precision of two electrode substrates according to an on/off state when a turn-on voltage is applied between patterns. CONSTITUTION:A pattern 11 for the inspection of substrate sticking precision is formed of the same material with electrodes on a surface of one common electrode substrate, and a pattern 12 for the inspection is also formed similarly on a surface of the other segment electrode substrate. Both patterns 11 and 12 have such a position relation that they do not overlap each other when stuck within a permissible error range. Both patterns 11 and 12 are connected electrically to a common electrode terminal and segment electrodes by a proper connection pattern, and consequently a proper turn-on voltage is applied between both patterns 11 and 12.

Description

【発明の詳細な説明】 く技術分野〉 本発明は、2枚の電極基板を貼り合わせ、その内部に液
晶を注入することによって製造される液晶表示素子に於
ける、基板貼り合わせ精度の検査方法に門するものであ
る。
[Detailed Description of the Invention] Technical Field> The present invention provides a method for inspecting the accuracy of substrate bonding in a liquid crystal display element manufactured by bonding two electrode substrates together and injecting liquid crystal into the substrate. It is a gate to the gate.

〈従来技術〉 従来の検査方法は、第1図に示す如く、2枚の電極基板
の一方に、oの形状の基板貼り合わせ精度検査用パター
ン(基板の表示電極形成面上に、表示電極形成材料(1
,T、 O,等)と同一材料により形成される)lk設
けると共に、他方の基板には、■の形状の基板貼り合わ
せ精度検査用パターン(同)2ヶ設け、上記Oのパター
ン1の内部に■のパターン2が正しく位置しているかど
うかを目視によっ−C確認することによって、基板貼り
合わせ精度の検査全行なうものであった。
<Prior art> As shown in FIG. Materials (1
, T, O, etc.) is provided, and two board bonding accuracy inspection patterns (same) in the shape of ■ are provided on the other board, and the inside of pattern 1 of O above is provided. All inspections of substrate bonding accuracy were carried out by visually checking whether the pattern 2 (2) was positioned correctly.

しかしながら、上記従来の検査方法には、以下に示すよ
うな問題点があった。すなわち、通常の液晶表示素子に
於いては、第2図に示す如く、表示電極3の上には配向
膜4が設けられている。このために、特に、下側のパタ
ーンの目視が困難となって、検査が容易でなりという問
題点が、上記従来の検査方法にはあった。
However, the conventional inspection method described above has the following problems. That is, in a normal liquid crystal display element, as shown in FIG. 2, an alignment film 4 is provided on the display electrode 3. For this reason, the above-mentioned conventional inspection method has a problem in that it becomes difficult to visually observe the pattern on the lower side, making inspection difficult.

なお、第2図に於いて、50″iガラス等のLCD基板
、6はシール剤、7は液晶である。
In FIG. 2, there is an LCD substrate made of 50"i glass, 6 a sealant, and 7 a liquid crystal.

〈発明の目的・構成〉 不発り]は従来の検査方法に於ける上記の問題点を解決
することを目的としてなされたものであり、該目的達成
のために、2枚の電極基板のそれぞれに、導電性の基板
貼り合わせ精度検査用パターンを設けると共に、液晶表
示素子外部より上記パターン間に点灯電圧を印加するた
めの手段を設け、上記パターン間に上記点灯電圧を印加
したときの点灯・非点灯状態を確認することに、J:り
、上記2枚の電極基板の貼り合わせ精度を検査するよう
にしたこと全特徴とする、基板貼り合わせ精度の検査方
法を提供するものである。
<Purpose/Structure of the Invention> [Non-explosion] was made with the aim of solving the above-mentioned problems in the conventional inspection method, and in order to achieve this purpose, a In addition to providing a conductive substrate bonding accuracy test pattern, a means for applying a lighting voltage between the patterns from the outside of the liquid crystal display element is provided, and whether the lighting or non-lighting occurs when the lighting voltage is applied between the patterns is provided. The present invention provides a method for inspecting the bonding accuracy of substrates, which is characterized in that the lighting state is checked, and the bonding accuracy of the two electrode substrates is inspected.

〈実施例〉 第3図は、本発明に於いて、一方の電極基板(コモン電
極基板)の面上(表示用透明電極が形成される側の面上
)に、上記電極形成材料と同−利f=’1で形成される
基板貼り合わせ精度検査用パターン11と、他方の電極
基板(セグメント電極基板)の面上(同)に、同様にし
て形成される基板貼9合わせ精度検査用パターンI2と
を示す図である。
<Example> FIG. 3 shows that in the present invention, the same electrode forming material as above is applied on the surface of one electrode substrate (common electrode substrate) (on the surface on which the transparent electrode for display is formed). A pattern 11 for inspecting the accuracy of substrate bonding formed with f='1 and a pattern 11 for inspecting the accuracy of substrate bonding 9 formed in the same manner on the surface of the other electrode substrate (segment electrode substrate). It is a figure showing I2.

上記両パターンは、基板貼り合わせが許容誤差範囲内で
行なわれたときには重なり合わないような位置関係で設
けられている。そして、本発明の特徴は、上記パターン
11及び12が、適当な接続パターンによって、それぞ
れ、コモン電極端子及びセグメント電極端子と電気的に
接続された構成となっている点にある。
Both patterns are provided in such a positional relationship that they do not overlap when the substrates are bonded together within an allowable error range. A feature of the present invention is that the patterns 11 and 12 are electrically connected to the common electrode terminal and the segment electrode terminal, respectively, by appropriate connection patterns.

このような構成とすることにより、液晶表示素子完成後
に、上記両パターン間に適当な点灯電圧を印加すること
ができる。基板貼り合わせが許容誤差範囲内で行なわれ
たときは、第3図に示すように、」二重両パターンは重
なり合わないので、点月は生じない。一方、基板貼り合
わせ誤差が規定以上になると、第4図に示すように、両
パターンが重なり合う部分(図の斜線部)が生じるので
、この部分が点灯状態となる。
With this configuration, an appropriate lighting voltage can be applied between the two patterns after the liquid crystal display element is completed. When the substrates are bonded together within the allowable error range, as shown in FIG. 3, the two double patterns do not overlap, so no dots occur. On the other hand, if the substrate bonding error exceeds the specified value, as shown in FIG. 4, there will be a portion where both patterns overlap (the shaded portion in the figure), and this portion will be lit.

したがって、上記両パターン間に適当な点灯電−圧を印
加したときに、点灯が観察されれば、その液晶表示素子
には規定以上の基板貼り合わせ誤差が生じているもので
あり、一方、点灯が観察されなければ、その液晶表示素
子の基板貼り合わせ誤差は規定内のものであるというこ
としこなるものである。
Therefore, if lighting is observed when an appropriate lighting voltage is applied between the above two patterns, it means that the liquid crystal display element has a substrate bonding error that is greater than the specified value. If this is not observed, it can be said that the error in bonding the substrates of the liquid crystal display element is within the specified range.

上記実施例に於ては、各基板貼り合わせ精度検査用パタ
ーンを、それぞれ、表示電極端子に接続しているが、表
示電極端子とは別個に、上記パターン専用の引き出し端
子を設ける構成としてもよい。
In the above embodiment, each substrate bonding accuracy inspection pattern is connected to the display electrode terminal, but a lead-out terminal exclusively for the pattern may be provided separately from the display electrode terminal. .

〈発明の効果〉 以上詳細に説明したように、本発明の検査方法によれば
、点灯・非点灯というきわめて確認し易いもので、基板
貼り合わせ精度の検査を行なうことができるので、上記
従来の問題点を解決することができ、検査の容易化、迅
速化をはかることができるものである。
<Effects of the Invention> As explained in detail above, according to the inspection method of the present invention, the accuracy of board bonding can be inspected by checking whether the lights are lit or not, which is extremely easy to confirm, and therefore it is possible to inspect the accuracy of board bonding. It is possible to solve problems and facilitate and speed up inspection.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は平面図、第2図は断面図、第3図及び第4図は
平面図である。 打号の説り] 1.2:基板貼り合わせ精度検査用パターン、3:表示
電極、4:配向膜、5:LCD基板、6:シール剤、7
:液晶、11,12:基板貼り合わせ精度検査用パター
ン。
FIG. 1 is a plan view, FIG. 2 is a sectional view, and FIGS. 3 and 4 are plan views. Explanation of the symbol] 1.2: Pattern for inspection of substrate bonding accuracy, 3: Display electrode, 4: Alignment film, 5: LCD substrate, 6: Sealing agent, 7
: Liquid crystal, 11, 12: Pattern for substrate bonding accuracy inspection.

Claims (1)

【特許請求の範囲】 12枚の電極基板を貼り合わせ、その内部に液晶全注入
することによって製造される液晶表示素子に於ける、基
板貼り合わせ精度の検査方法に於いて、 上記2枚の電極基板のそれぞれに、導電性の基板貼り合
わせ精度検査用パターンを設けると共に、液晶表示素子
外部より上記パターン間に点灯電圧を印加するだめの手
段を設け、上記パターン間に上記点灯電圧を印加したと
きの点灯・非点灯状態により、上記2枚の電極基板の貼
り合わせ精度を検査するようにしたことを特徴とする、
基板貼り合わせ精度の検査方法。
[Claims] In a method for inspecting the accuracy of substrate bonding in a liquid crystal display element manufactured by bonding 12 electrode substrates and fully injecting liquid crystal into the electrode substrates, A conductive substrate bonding accuracy inspection pattern is provided on each of the substrates, and a means for applying a lighting voltage between the patterns from outside the liquid crystal display element is provided, and when the lighting voltage is applied between the patterns. The bonding accuracy of the two electrode substrates is inspected based on the lighting and non-lighting states.
Inspection method for board bonding accuracy.
JP59027616A 1984-02-15 1984-02-15 Inspecting method of sticking precision of substrate Pending JPS60170831A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59027616A JPS60170831A (en) 1984-02-15 1984-02-15 Inspecting method of sticking precision of substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59027616A JPS60170831A (en) 1984-02-15 1984-02-15 Inspecting method of sticking precision of substrate

Publications (1)

Publication Number Publication Date
JPS60170831A true JPS60170831A (en) 1985-09-04

Family

ID=12225869

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59027616A Pending JPS60170831A (en) 1984-02-15 1984-02-15 Inspecting method of sticking precision of substrate

Country Status (1)

Country Link
JP (1) JPS60170831A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5153817A (en) * 1990-02-09 1992-10-06 Kabushiki Kaisha Toshiba Electronic apparatus system including an expansion device removably connected to a removable battery pack
US5175671A (en) * 1990-03-20 1992-12-29 Kabushiki Kaisha Toshiba Expanding apparatus for portable electronic apparatus
US5182698A (en) * 1989-12-15 1993-01-26 Kabushiki Kaisha Toshiba Function expanding apparatus for compact electronic device
US5210681A (en) * 1990-02-09 1993-05-11 Kabushiki Kaisha Toshiba Expansion device for expanding functions of compact electronic apparatus
US5292267A (en) * 1989-12-15 1994-03-08 Kabushiki Kaisha Toshiba Connector unit with movable connector
US5434743A (en) * 1991-09-06 1995-07-18 Kabushiki Kaisha Toshiba Electronic apparatus system having an electronic apparatus unit and an expansion unit for expanding the function of the electronic apparatus unit by connection to an expansion card connector

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5182698A (en) * 1989-12-15 1993-01-26 Kabushiki Kaisha Toshiba Function expanding apparatus for compact electronic device
US5292267A (en) * 1989-12-15 1994-03-08 Kabushiki Kaisha Toshiba Connector unit with movable connector
US5153817A (en) * 1990-02-09 1992-10-06 Kabushiki Kaisha Toshiba Electronic apparatus system including an expansion device removably connected to a removable battery pack
US5210681A (en) * 1990-02-09 1993-05-11 Kabushiki Kaisha Toshiba Expansion device for expanding functions of compact electronic apparatus
US5175671A (en) * 1990-03-20 1992-12-29 Kabushiki Kaisha Toshiba Expanding apparatus for portable electronic apparatus
US5434743A (en) * 1991-09-06 1995-07-18 Kabushiki Kaisha Toshiba Electronic apparatus system having an electronic apparatus unit and an expansion unit for expanding the function of the electronic apparatus unit by connection to an expansion card connector
US5504649A (en) * 1991-09-06 1996-04-02 Kabushiki Kaisha Toshiba Electronic apparatus system including expansion unit which has an expansion device for expanding the function of an electronic apparatus and which is connectable to the electronic apparatus by means of a card connector
US5544009A (en) * 1991-09-06 1996-08-06 Kabushiki Kaisha Toshiba Portable electronic apparatus having ejector for removing card-like electronic part from portable electronic apparatus

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