JPS60117695A - Semiconductor laser light source device - Google Patents
Semiconductor laser light source deviceInfo
- Publication number
- JPS60117695A JPS60117695A JP22729283A JP22729283A JPS60117695A JP S60117695 A JPS60117695 A JP S60117695A JP 22729283 A JP22729283 A JP 22729283A JP 22729283 A JP22729283 A JP 22729283A JP S60117695 A JPS60117695 A JP S60117695A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- light
- output
- light detector
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/024—Arrangements for thermal management
- H01S5/02407—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling
- H01S5/02415—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling by using a thermo-electric cooler [TEC], e.g. Peltier element
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
- H01S5/0687—Stabilising the frequency of the laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
- H01S5/06837—Stabilising otherwise than by an applied electric field or current, e.g. by controlling the temperature
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
Abstract
Description
【発明の詳細な説明】
く技術分野〉
本発明は、波長制御型半導体レーザを用いた光源装置に
関するものである。DETAILED DESCRIPTION OF THE INVENTION Technical Field The present invention relates to a light source device using a wavelength-controlled semiconductor laser.
〈従来技術〉
近時、光を用いた計測技術の発達に伴い、波長を媒体と
した計測技術が重要視されるようになってきた。波長を
媒体とした計測技術で必要とされるものに、波長を安定
化した半導体レーザがある。<Prior Art> Recently, with the development of measurement technology using light, measurement technology using wavelength as a medium has come to be regarded as important. Semiconductor lasers with stabilized wavelengths are required for measurement technology that uses wavelength as a medium.
通常の半導体レーザ装置では周囲温度等の変化による発
振波長の変動が大きく、定波長出力光源として使用する
のは困難である。従って上述の波長を安定化した光源と
しては、D B R(DistributedBrgg
Reflection)W(ブラッグ反射型)レーザ
やDFB (Distributed FeedBac
k)型(分布帰還型)レーザ等の回折格子を利用して波
長を決定する構造のものが用いられる。In a typical semiconductor laser device, the oscillation wavelength fluctuates greatly due to changes in ambient temperature, etc., making it difficult to use it as a constant wavelength output light source. Therefore, as a light source with the above-mentioned wavelength stabilized, DBR (Distributed Brgg
Reflection) W (Bragg reflection type) laser and DFB (Distributed FeedBac)
A type k (distributed feedback) laser or the like having a structure in which the wavelength is determined using a diffraction grating is used.
しかしながら、これらの半導体レーザ素子は、その構造
が複雑であシ、一定ピツチの細かい回折格子を活性領域
に連設して形成する必要上製作も困難となり、歩留りが
悪く非常に高価なものになるという問題点がある。However, these semiconductor laser devices have a complicated structure, and are difficult to manufacture because they require continuous formation of fine diffraction gratings with a constant pitch in the active region, resulting in low yields and very high costs. There is a problem.
〈発明の目的〉
本発明は上述の問題点に鑑みてなされたもので、比較的
簡単な構造の半導体レーザを用いた波長の安定な光源装
置を提供することを目的とする。<Object of the Invention> The present invention has been made in view of the above-mentioned problems, and an object of the present invention is to provide a light source device with a stable wavelength using a semiconductor laser having a relatively simple structure.
〈実施例〉
第1図は本発明の一実施例を示す光源装置の概略構成図
である。1は通常のファプリベロー共振器型の半導体レ
ーザで、共振器の両端面より出射された光のうち、一方
が光源として使用される。<Embodiment> FIG. 1 is a schematic configuration diagram of a light source device showing an embodiment of the present invention. Reference numeral 1 denotes a normal fiber bellows resonator type semiconductor laser, and one of the lights emitted from both end faces of the resonator is used as a light source.
また、他方の共振器端面よシ出射された光の一部は駆動
電流を制御するための光検出器2に直接入射され、残り
の一部は干渉フィルタ4を通過したのち発振波長を制御
するための光検出器5に入射される。光検出器2に入射
した光の光量は電気信号に変換され、定出力回路3に導
びかれる。定出力回路3は半導体レーザ1に駆動電流を
供給する回路3であり、光検出器2からの電気信号は半
導体レーザ1の出力を一定にするだめの帰還信号となる
。光検出器5に入射した光は電気信号に変換され、ベル
チェ素子駆動回路6に入力される。ベルチェ素子駆動回
路6からの出力は半導体レーザ1に連結されたベルチェ
素子7に入力される。Further, a part of the light emitted from the other resonator end face is directly incident on the photodetector 2 for controlling the drive current, and the remaining part passes through the interference filter 4 and then controls the oscillation wavelength. The light is incident on the photodetector 5. The amount of light incident on the photodetector 2 is converted into an electrical signal and guided to a constant output circuit 3. The constant output circuit 3 is a circuit 3 that supplies a driving current to the semiconductor laser 1, and the electric signal from the photodetector 2 serves as a feedback signal to keep the output of the semiconductor laser 1 constant. The light incident on the photodetector 5 is converted into an electrical signal and input to the Vertier element drive circuit 6. The output from the Beltier element drive circuit 6 is input to the Beltier element 7 connected to the semiconductor laser 1.
次に、干渉フィルタ4の透過特性と半導体レーザ1の波
長λの関係を第2図に示す。第2図に示す例では、半導
体レーザ1をAlGaAs 系レーザダイオードとし、
波長λが室温25゛Cで7sooAとなるようにレーザ
素子を製作した。干渉フィルター4としては5if2/
Ti1t 系をフィルり用材料として選定し、波長78
00λで透過率の変化が極大から極小へ最も急峻となる
短波長透過フィルタを設計製作した。膜厚精度を1%と
して50層の上記フィルタ用材料薄膜を積層した多層膜
を連続して電子線蒸着したところ、λ<780 OA〜
では透過率が100%に近くλ〉8000Aでは透過率
が0%に近い第2図に示す様な透過特性を有する干渉フ
ィルタか得られた。この干渉フィルり4に半導体レーザ
1の出力光を照射すると波長7800λでの透過率の温
度変化 /6λは、△T/ コ=8−5%/λであった
。Next, the relationship between the transmission characteristics of the interference filter 4 and the wavelength λ of the semiconductor laser 1 is shown in FIG. In the example shown in FIG. 2, the semiconductor laser 1 is an AlGaAs laser diode,
A laser element was manufactured so that the wavelength λ was 7 sooA at a room temperature of 25°C. The interference filter 4 is 5if2/
Ti1t system was selected as the filling material, and the wavelength was 78.
We designed and manufactured a short wavelength transmission filter whose transmittance changes most steeply from maximum to minimum at 00λ. When a multilayer film consisting of 50 layers of the above filter material thin films was successively deposited with an electron beam with a film thickness accuracy of 1%, the transmittance was close to 100% at λ < 780 OA ~ and the transmittance was low at λ > 8000 A. An interference filter having a transmission characteristic as shown in FIG. 2 close to 0% was obtained. When this interference filter 4 was irradiated with the output light of the semiconductor laser 1, the temperature change in transmittance /6λ at a wavelength of 7800λ was ΔT/co=8−5%/λ.
△
このように波長に対する透過率の変化の大きいと色ろに
、半導体レーザ1の発振波長を設定すると、周囲温度T
の変化等で発振波長が変化すると干渉フィルタ4を通過
する光量か大きく変化し、従って発振波長の変化を光検
出器5への入射光量の変化として電気的に検出すること
ができる。これをベルエ素子駆動回路6に帰還すること
により、ベルチェ素子駆動回路6からの出力で光検出器
5の入射光量が一定となるように、即ち半導体レーザ1
の発振波長が一定となるようにベルチェ素子7を駆動し
半導体レーザ1のステム温度を変化させることができる
。ベルチェ素子7は電流に応答して発熱冷却を制御する
ことのできる素子であり、半導体レーザ1を搭載したス
テムに直結されている。従ってベルチェ素子駆動回路6
からの出力によりステムの加熱冷却を制御することがで
きる。△ If the change in transmittance with respect to wavelength is large as described above, when the oscillation wavelength of the semiconductor laser 1 is set, the ambient temperature T
When the oscillation wavelength changes due to a change in the amount of light passing through the interference filter 4, the amount of light passing through the interference filter 4 changes significantly. Therefore, the change in the oscillation wavelength can be electrically detected as a change in the amount of light incident on the photodetector 5. By feeding this back to the Bertier element driving circuit 6, the output from the Bertier element driving circuit 6 makes the amount of light incident on the photodetector 5 constant, that is, the semiconductor laser 1
The stem temperature of the semiconductor laser 1 can be changed by driving the Vertier element 7 so that the oscillation wavelength of the semiconductor laser 1 remains constant. The Bertier element 7 is an element that can control heat generation and cooling in response to current, and is directly connected to the stem on which the semiconductor laser 1 is mounted. Therefore, the Beltier element drive circuit 6
Heating and cooling of the stem can be controlled by the output from.
以上要約すると光検出器2によって半導体レーザ1の出
力光を一定に制御し、干渉フィルタ4、光検出器5及び
ベルチェ素子7によシ半導体レーザ1の発振波長を一定
とすることができる。第1゛図に示すレーザ光源装置の
周囲温度を0℃から50℃迄変化させたところ、半導体
レーザlの発振波長の変化は2Å以下であった。To summarize the above, the output light of the semiconductor laser 1 can be controlled to be constant by the photodetector 2, and the oscillation wavelength of the semiconductor laser 1 can be kept constant by the interference filter 4, the photodetector 5, and the Vertier element 7. When the ambient temperature of the laser light source device shown in FIG. 1 was varied from 0° C. to 50° C., the oscillation wavelength of the semiconductor laser I varied by 2 Å or less.
〈発明の効果〉
以上、詳述したように、本発明によれば、発振波長の変
化が極めて小さいレーザ光源を容易に得ることができ、
特に計測技術や通信技術分野での利用価値は極めて大き
い。尚、上記実施例では、半導体レーザの材料としてG
aAlAs 系を用いだが、これはInGaAsP 系
等の4元系やその他の材料によっても同様な半導体レー
ザ装置を構成することができる。また、干渉フィルタの
材料も、5if2/Ti1t系に限定されるものではな
く、Altos 、 B a205 jYxαB、Ta
、O,その他種々の材料を用いることができる。<Effects of the Invention> As detailed above, according to the present invention, a laser light source with extremely small change in oscillation wavelength can be easily obtained.
In particular, the value of use in the fields of measurement technology and communication technology is extremely large. In the above embodiment, G is used as the material of the semiconductor laser.
Although an aAlAs system is used, a similar semiconductor laser device can be constructed using a quaternary system such as an InGaAsP system or other materials. Furthermore, the material of the interference filter is not limited to the 5if2/Ti1t system, but may include Altos, Ba205jYxαB, Ta
, O, and various other materials can be used.
第1図は、本発明の1実施例を示す半導体レーザ光源装
置の構成図である。
第2図は第1図に示す干渉フィルタの透過率の波燥、依
存性と、半導体レーザの発振波長(室温25℃)を示す
説明図である。
1・・・半導体レーザ、2・・・光検出器、3・・・定
出力回路、 4・・・干渉フィルタ、5・・・光検出器
、 6・・・ベルチェ素子駆動回路、7・・・ベルチェ
素子。FIG. 1 is a configuration diagram of a semiconductor laser light source device showing one embodiment of the present invention. FIG. 2 is an explanatory diagram showing the variation and dependence of the transmittance of the interference filter shown in FIG. 1 and the oscillation wavelength of the semiconductor laser (room temperature 25° C.). DESCRIPTION OF SYMBOLS 1... Semiconductor laser, 2... Photodetector, 3... Constant output circuit, 4... Interference filter, 5... Photodetector, 6... Vertier element drive circuit, 7...・Beltier element.
Claims (1)
干渉フィルタと、該干渉フィルタ透過光量を検出する光
検出器と、該光検出器の出力に応答して温度制御される
ベルチェ素子とを具備して成り、前記半導体レーザの出
力光波長に対応して前記ベルチェ素子を加熱冷却させる
ことにより前記半導体レーザの温度制御を行なうように
したことを特徴とする半導体レーザ光源装置。 2、前記半導体レーザか出力光強度を検出して出力光を
一定に保持する定出力駆動回路で駆動制御されている特
許請求の範囲第1項記載の半導体レーザ光源装置。[Claims] 1. An interference filter that transmits the output light of a semiconductor laser in accordance with the wavelength, a photodetector that detects the amount of light transmitted through the interference filter, and a temperature-controlled device in response to the output of the photodetector. A semiconductor laser light source device, characterized in that the temperature of the semiconductor laser is controlled by heating and cooling the Vertier element in accordance with the output light wavelength of the semiconductor laser. . 2. The semiconductor laser light source device according to claim 1, wherein the semiconductor laser is driven and controlled by a constant output drive circuit that detects the output light intensity and keeps the output light constant.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22729283A JPS60117695A (en) | 1983-11-29 | 1983-11-29 | Semiconductor laser light source device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22729283A JPS60117695A (en) | 1983-11-29 | 1983-11-29 | Semiconductor laser light source device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60117695A true JPS60117695A (en) | 1985-06-25 |
Family
ID=16858523
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22729283A Pending JPS60117695A (en) | 1983-11-29 | 1983-11-29 | Semiconductor laser light source device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60117695A (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63181389A (en) * | 1987-01-23 | 1988-07-26 | Nec Corp | Semiconductor module |
JPS63257285A (en) * | 1987-03-30 | 1988-10-25 | シーメンス、アクチエンゲゼルシヤフト | Apparatus for controlling or regulating emitted light wavelength and emitted light power of semiconductor laser |
EP0390525A2 (en) * | 1989-03-28 | 1990-10-03 | Sharp Kabushiki Kaisha | An optical pumping-type solid-state laser apparatus with a semiconductor laser device |
EP0516318A2 (en) * | 1991-05-27 | 1992-12-02 | Pioneer Electronic Corporation | Apparatus for controlling semiconductor laser operating temperature |
EP0818859A1 (en) * | 1996-07-11 | 1998-01-14 | Nortel Networks Corporation | Wavelength monitoring and control assembly for WDM optical transmission systems |
EP1239560A3 (en) * | 2001-03-09 | 2006-02-22 | The Furukawa Electric Co., Ltd. | Optical module and method of making the same |
EP1754292B1 (en) * | 2004-06-10 | 2008-10-08 | Finisar Corporation | Wavelength stabilized laser module |
WO2010042301A3 (en) * | 2008-10-10 | 2010-07-01 | Ge Infrastructure Sensing, Inc. | Wavelength-modulation spectroscopy method |
US7943915B2 (en) | 2008-10-10 | 2011-05-17 | Ge Infrastructure Sensing, Inc. | Method of calibrating a wavelength-modulation spectroscopy apparatus |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5595384A (en) * | 1979-01-13 | 1980-07-19 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor laser device |
-
1983
- 1983-11-29 JP JP22729283A patent/JPS60117695A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5595384A (en) * | 1979-01-13 | 1980-07-19 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor laser device |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63181389A (en) * | 1987-01-23 | 1988-07-26 | Nec Corp | Semiconductor module |
JPS63257285A (en) * | 1987-03-30 | 1988-10-25 | シーメンス、アクチエンゲゼルシヤフト | Apparatus for controlling or regulating emitted light wavelength and emitted light power of semiconductor laser |
EP0390525A2 (en) * | 1989-03-28 | 1990-10-03 | Sharp Kabushiki Kaisha | An optical pumping-type solid-state laser apparatus with a semiconductor laser device |
EP0516318A2 (en) * | 1991-05-27 | 1992-12-02 | Pioneer Electronic Corporation | Apparatus for controlling semiconductor laser operating temperature |
EP0818859A1 (en) * | 1996-07-11 | 1998-01-14 | Nortel Networks Corporation | Wavelength monitoring and control assembly for WDM optical transmission systems |
US5825792A (en) * | 1996-07-11 | 1998-10-20 | Northern Telecom Limited | Wavelength monitoring and control assembly for WDM optical transmission systems |
EP1239560A3 (en) * | 2001-03-09 | 2006-02-22 | The Furukawa Electric Co., Ltd. | Optical module and method of making the same |
EP1754292B1 (en) * | 2004-06-10 | 2008-10-08 | Finisar Corporation | Wavelength stabilized laser module |
WO2010042301A3 (en) * | 2008-10-10 | 2010-07-01 | Ge Infrastructure Sensing, Inc. | Wavelength-modulation spectroscopy method |
US7943915B2 (en) | 2008-10-10 | 2011-05-17 | Ge Infrastructure Sensing, Inc. | Method of calibrating a wavelength-modulation spectroscopy apparatus |
US7957001B2 (en) | 2008-10-10 | 2011-06-07 | Ge Infrastructure Sensing, Inc. | Wavelength-modulation spectroscopy method and apparatus |
CN102177423A (en) * | 2008-10-10 | 2011-09-07 | 通用电气基础设施传感公司 | Wavelength-modulation spectroscopy method |
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