JPS59149780U

JPS59149780U - test signal generator

Info

Publication number: JPS59149780U
Application number: JP4328983U
Authority: JP
Inventors: 中山　一茂; 辻村　勝人
Original assignee: ソニー株式会社
Priority date: 1983-03-28
Filing date: 1983-03-28
Publication date: 1984-10-06

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

[Brief explanation of drawings]

第１図及び第２図は従来のテスト信号によって表出され
る画像を示す路線図、第３図は従来のテスト信号発生装
置を示すブロック図、第４図はそのテスト信号を示す信
号波形図、第５図は本考案によるテスト信号発生装置を
示すブロック図、第６図及び第７図はそのテスト信号を
示す路線図、第８図はその詳細構成を示すブロック図、
第９図−はその動作の説明に供する信号波形図である。２・・・−・・・タイミング信号発生回路、３・・・・
・・テスト信号形成回路、４・・・・・・出力増幅甲路
、５・・・・・・モニタ、１１・・・・・・キャラクタ
発生回路、１２・・・・・・合成回路、１３・・・・・
・キャラクタ設定回路。1 and 2 are route maps showing images expressed by conventional test signals, FIG. 3 is a block diagram showing a conventional test signal generating device, and FIG. 4 is a signal waveform diagram showing the test signal. FIG. 5 is a block diagram showing a test signal generating device according to the present invention, FIGS. 6 and 7 are route maps showing the test signal, and FIG. 8 is a block diagram showing its detailed configuration.
FIG. 9 is a signal waveform diagram for explaining the operation. 2...--timing signal generation circuit, 3...
... Test signal forming circuit, 4 ... Output amplification circuit A, 5 ... Monitor, 11 ... Character generation circuit, 12 ... Synthesis circuit, 13・・・・・・
・Character setting circuit.

Claims

[Scope of utility model registration request]

A test signal forming circuit that generates a test signal that sequentially displays a plurality of reference signals with different frequencies or periods on the same screen, and a test signal forming circuit that generates a test signal that sequentially displays a plurality of reference signals with different frequencies or periods on the same screen, and a a character generation circuit that generates a character signal representing a numerical value or a transition time value;
A test signal generation device comprising: a synthesis circuit for synthesizing a character signal of the character generation circuit with a test signal of the test signal formation circuit.