JPS5874041A - Etchant for polyimide resin - Google Patents

Etchant for polyimide resin

Info

Publication number
JPS5874041A
JPS5874041A JP17399681A JP17399681A JPS5874041A JP S5874041 A JPS5874041 A JP S5874041A JP 17399681 A JP17399681 A JP 17399681A JP 17399681 A JP17399681 A JP 17399681A JP S5874041 A JPS5874041 A JP S5874041A
Authority
JP
Japan
Prior art keywords
etching
polyimide resin
solution
resin film
etchant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17399681A
Other languages
Japanese (ja)
Other versions
JPS6347140B2 (en
Inventor
Hiroshi Suzuki
宏 鈴木
Daisuke Makino
大輔 牧野
Atsushi Saiki
斉木 篤
Yukiyoshi Harada
原田 征喜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Resonac Corp
Original Assignee
Hitachi Chemical Co Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd, Hitachi Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP17399681A priority Critical patent/JPS5874041A/en
Publication of JPS5874041A publication Critical patent/JPS5874041A/en
Publication of JPS6347140B2 publication Critical patent/JPS6347140B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching

Abstract

PURPOSE:To stably and reliably form a micro-miniature through hole which is required for multi-layer wirings of LSI, by using the alcohol liquid of methylammonium tetrahydride as an etchant. CONSTITUTION:An etchant consisting of the alcohol liquid of methylammonium tetra hydride is used for the etching of polyimide resin. In this case, the preferable concentration of alcohol liquid of methylammonium tetra hydride should be in the range 5-35wt% from the point of view of etching capability for the polyimide resin film and solubility of etchant. It is also preferable that this etchant is used for a polyimide resin film having imidation ratio of 5-90%. When the polyimide resin film 2 formed over the substrate 1 is etched with this etchant using the photo resist, while the etching is carried out in the shape having almost linear inclination and a swelling region cannot be recognized at all. This shape is desirable for formation of wiring conductor of the second layer.

Description

【発明の詳細な説明】 本発明は、ポリイミド系樹脂用エツチング液に関する。[Detailed description of the invention] The present invention relates to an etching solution for polyimide resins.

近年、絶縁特性、耐熱性等に優れたポリイミド系樹脂の
半導体部品、と9わけ半導体集積回路における配線基板
絶縁膜や、モノリシックL8Iの保!I膜、多層配線絶
縁膜等への利用が増加している。この中で配fmm板上
及びモノリシックLaI上の多層配線の層間絶縁膜とし
てポリイミド系樹脂膜を用いる場合には集積度の向上の
上から微細なエツチング加工が要求される。
In recent years, semiconductor parts made of polyimide resin with excellent insulation properties and heat resistance, especially wiring board insulation films in semiconductor integrated circuits, and monolithic L8I protection! Its use in I films, multilayer wiring insulating films, etc. is increasing. Among these, when a polyimide resin film is used as an interlayer insulating film for multilayer wiring on an FM board or on a monolithic LaI board, fine etching processing is required in order to improve the degree of integration.

従来よp、ポリイミド系樹脂膜のエツチング方法として
、ポリイミド系樹脂膜の前駆物質であるポリアミド酸を
200℃以上の温度でベークし、イミド化率が90−以
上の状態でエツチングを行なう方法と、130℃前後の
温度でベークし、5〜101程度イミド化した状態でエ
ツチングを行なう方法が行なわれている。
Conventionally, as a method for etching a polyimide resin film, polyamic acid, which is a precursor of the polyimide resin film, is baked at a temperature of 200° C. or higher, and etching is performed in a state where the imidization rate is 90 or higher. A method is used in which the material is baked at a temperature of about 130 DEG C. and then etched in a state where it is imidized to about 5 to 101.

ポリイミド系樹脂膜のエツチング法の1つとして、その
前駆物質であるポリアミド酸の膜を形成し九段階でポジ
タイプのホトレジストを用い、このホトレジストの現偉
と同時に、この現儂液そのもので、ポリアミド酸の膜を
エツチングする方法が知られている。この方法は0例え
ば特公J1147−12609号に述゛べられている。
As one of the etching methods for polyimide resin films, a film of polyamic acid, which is its precursor, is formed, and a positive type photoresist is used in nine steps. A method of etching the film is known. This method is described in, for example, Japanese Patent Publication No. J1147-12609.

こ“O方法では、まずN−メチル−2−ビts IJト
ン、ジメチルアセトアミド等を溶媒とするポリアミドa
l溶液を基体に塗布し九のち82℃で3分の乾燥を行な
ってポリアミド酸の膜を形成する。次でポジタイプのホ
トレジストとして1例えば5hipley社のA213
00を塗布し、82℃で15分乾燥し、ホトマスクを密
着させて露光を行なう。AZ1300のgL像液はアル
カリ性で、かつポリアミド酸をも溶解する能力があるの
でAZ1300の#4儂液に浸漬すると人21300の
露光部分が溶解すると同時にポリアミド酸も溶解する。
In this method, first, polyamide a is prepared using N-methyl-2-bits IJ ton, dimethylacetamide, etc. as a solvent.
The solution was applied to the substrate, and then dried at 82° C. for 3 minutes to form a polyamic acid film. As a positive type photoresist, for example, 5hipley's A213
00 was applied, dried at 82° C. for 15 minutes, and exposed using a photomask. The gL image solution of AZ1300 is alkaline and has the ability to dissolve polyamic acid as well, so when it is immersed in the #4 solution of AZ1300, the exposed portion of Person 21300 dissolves and at the same time the polyamic acid also dissolves.

そしてアセトンに浸漬することによってAZ1300の
みを溶解するといった手順で行なわれる。
The procedure is then to dissolve only AZ1300 by immersing it in acetone.

この方法ではボリア真ド酸を高々82℃で。In this method, boriadic acid is heated at a temperature of no more than 82°C.

しかも3分しかベー〉していない丸め沸点が202℃で
あるN−メチル−2−ピロリドンや沸点が167℃であ
るジメチルアセトアミドなどの沸点の高め溶媒は完全に
は蒸発していない状態にある。また、エツチング形状も
不安定で再現性も悪い丸め実用的に加工し得る寸法は数
十μm以上である。
Moreover, solvents with high boiling points such as N-methyl-2-pyrrolidone, which has a boiling point of 202°C and dimethylacetamide, which has a boiling point of 167°C, are not completely evaporated. Further, the etched shape is unstable, the reproducibility is poor, and the size that can be practically processed is several tens of μm or more.

また、ポリイミド系樹脂膜をエツチングする方法として
第4級水酸化アンモニウムの濃縮水溶液あるhは非水溶
媒中に第4級水酸化アンモニウムのl11#l水溶液を
混合し大濤液による方法も知られている。第4級水酸化
アンモニウムとして水酸化テトラメチルアンモニウム、
水酸化ナト2エチルアンモニウム、水酸化ブチルアンモ
ニウム等が挙げられ、また非水溶媒としてジメチをスル
ホキシド、スルホラン、ジメチルホルムアミド、ピリジ
ン等が挙げられる。上記の2種類の方法によるエツチン
グではポリアミド酸又はポリイミドイソ、、インドロキ
ナゾリンジオン(po ly im ide 1s(i
ndroqu inago I 1ned 1one。
Furthermore, as a method for etching a polyimide resin film, there is also a method using a concentrated aqueous solution of quaternary ammonium hydroxide, or a method using Ohto solution, in which an aqueous solution of quaternary ammonium hydroxide is mixed in a non-aqueous solvent. ing. Tetramethylammonium hydroxide as quaternary ammonium hydroxide,
Examples include sodium 2-ethylammonium hydroxide, butylammonium hydroxide, and examples of non-aqueous solvents include dimethysulfoxide, sulfolane, dimethylformamide, and pyridine. In the etching using the above two methods, polyamic acid, polyimide iso, indoroquinazolinedione (polyimide is
ndroqu inago I 1ned 1one.

以下PIQとする。’PIQは日立化成工業株式会社の
商標)のプレポリマの膜を200”Cの温度でベータし
、イミド化した状態でもエツチングすることは可能であ
るが、エツチング時にイミド化した膜が膨潤する。第1
図はポリアミド酸もしくはPIQのプレポリマOjIを
200℃の温度でベークしイミド化し九状能でホトレジ
スト逃場を行ないエツチング液に浸漬した時のポリイミ
ド系樹脂膜の膜厚変化を調べた結果を示したものである
。曲線aはエツチング液として水酸化テトラメチルアン
モニウム10重量−水溶液を約30重量−に濃縮し九溶
液を用いた場合を示す。ま九曲線すはエツチング液とし
てスルホ2ン中に上記と同じ水酸化ナト2メチルアンモ
ニウムの約30重量優水溶液を50容量−の割合で混合
した#液を用いた場合を示す。
Hereinafter referred to as PIQ. It is possible to etch a prepolymer film (PIQ is a trademark of Hitachi Chemical Co., Ltd.) that has been betatized at a temperature of 200"C and is imidized, but the imidized film swells during etching. 1
The figure shows the results of investigating the change in film thickness of a polyimide resin film when polyamic acid or PIQ prepolymer OjI was baked at a temperature of 200°C to imidize, photoresist escape was performed using a 9-shaped resin, and the film was immersed in an etching solution. It is something. Curve a shows the case where an aqueous solution of 10% by weight of tetramethylammonium hydroxide was concentrated to about 30% by weight and a 9% solution was used as the etching solution. The curve 9 shows the case in which a solution # was used as an etching solution, which was prepared by mixing an approximately 30% aqueous solution of sodium dimethylammonium hydroxide (the same as above) in a sulfone solution at a ratio of 50 volumes.

水酸化テトラメチルアンモ二りムの濃縮水溶液をエツチ
ング液とじ九場合は9曲線aに示すようにポリイミド系
樹脂膜はエツチング液の浸透によ如膨濶し、膜厚増加は
約20−になる。スルホランに水酸化テトラメチルアン
モニクムの濃縮溶液を混合し九溶液をエツチング液とし
九場合、−線すに示すように曲纏鳳よ)さらに膨潤が大
金くなシ膜厚増加は約aOSにも適する。
In the case where a concentrated aqueous solution of tetramethylammonium hydroxide is applied to the etching solution, the polyimide resin film swells as the etching solution penetrates, as shown in curve a, and the film thickness increases by approximately 20 -. . In the case where a concentrated solution of tetramethylammonium hydroxide is mixed with sulfolane and the solution is used as an etching solution, the swelling will not be large and the film thickness will increase to about aOS. is also suitable.

このIIIIIIL九部分の断面形部分観察すると、第
2図(a)のような形状である。すなわち基体1の上に
形成したポリイミド系樹脂膜2をホトレジストをマスク
してエツチングしたのち、ホトレジストを除去して断面
を研磨して観察し九ものである。膨潤によって生じたパ
ターン周辺部での盛)上がり部分3が明瞭に認められる
。この盛シ上がりは9例えば多層配線を行なう場合。
When the cross-sectional shape of this IIIIIIL9 section is observed, it has a shape as shown in FIG. 2(a). That is, after etching the polyimide resin film 2 formed on the substrate 1 using a photoresist as a mask, the photoresist was removed and the cross section was polished and observed. A raised portion 3 at the periphery of the pattern caused by swelling can be clearly seen. This rise is caused by, for example, multi-layer wiring.

第2層の配線導体の形成に障害となるばかりでなく耐熱
性が低下するなど以後の工程での安定性、信頼性を低下
させるという欠点を有する。
This has the disadvantage that it not only hinders the formation of the second layer wiring conductor, but also reduces the stability and reliability in subsequent steps, such as a decrease in heat resistance.

一方ポリアミド酸又はPIQのプレポリマを200℃以
下の温度9例えば130〜150℃の温度でベークした
状態でエツチングするとエツチング速度が大きすぎ、1
0〜20秒でエツチング終了してしまうので、エツチン
グ時間の管理が難しく、エツチングの精度・再現性も悪
い。
On the other hand, if a prepolymer of polyamic acid or PIQ is baked at a temperature of 200°C or less9, e.g. 130-150°C, the etching rate is too high;
Since etching is completed in 0 to 20 seconds, it is difficult to manage the etching time, and the etching accuracy and reproducibility are also poor.

またポリイミド系樹脂膜のエツチング方法としてエチレ
ンジアミン、ジエチレントリアはン。
Ethylenediamine and diethylenetriamine are also used as an etching method for polyimide resin films.

トリエチルテトラミン等を用いる方法も知られている。A method using triethyltetramine and the like is also known.

しかし、上記のいずれをもエツチング液として用いても
ポリアミド酸又はPIQのプレポリマt180℃以上の
温度で硬化したポリイミド系樹脂膜をエツチングすると
エツチング液に浸漬後、ポリイミド系樹脂膜は膨潤する
のみでエツチングされず、180℃未満の温度。
However, even if any of the above is used as an etching solution, if a polyimide resin film cured at a temperature of 180°C or higher is etched using a polyamic acid or PIQ prepolymer, the polyimide resin film will only swell after being immersed in the etching solution and will not be etched. temperature below 180°C.

例えば100〜130℃で硬化し九ボリイイド系樹脂膜
をエツチングすると、エツチング形状が悪く再現性も悪
く、シかも上記のエツチング液は毒性が強い。
For example, when a nine-bolyide resin film is cured at 100 to 130° C. and etched, the etched shape is poor, the reproducibility is poor, and the above-mentioned etching solution is highly toxic.

また、ポリイミド系樹脂膜のエツチング方法としてとド
ラジンあるいは、ヒドラジンとエチレンジアミン、ジエ
チレントリアはン等のボリアオン化合物との混合滓液を
用いる方法がある。
Further, as a method for etching a polyimide resin film, there is a method of using a mixed slag of hydrazine or hydrazine and a boriaone compound such as ethylenediamine or diethylenetriamine.

このエツチング液をFf!1ヤ九場合、ポリアミド酸又
はPIQのプレポリマを200℃以上の温度でベークし
、イミド化し良状態でもエツチングすることは可能であ
るが、サイドエッチが太きく、スルーホール設計値と実
際のエッチ後の開口部の寸法に差が生じ中す−ため数#
mΩのエツチング安定性が悪い。200℃未満のall
tLでベータし、イミド化した状履でエツチングすると
Ff this etching liquid! In the case of 1 or 9, it is possible to bake the polyamic acid or PIQ prepolymer at a temperature of 200°C or higher to imidize it and etch it even in good condition, but the side etch is thick and the through-hole design value differs from the actual etching value. Due to the difference in the opening dimensions of the
Poor etching stability in mΩ. All below 200℃
Beta with tL and etching with imidized material.

上記のエツチング液のエツチング能力が非常に大きく、
エツチング時間が短いため、適正なエツチング時間の幅
が極端に狭く、エツチングの管埋が−しい。又、エツチ
ングの再現性、安定性が悪い丸め実用的に加工し得る寸
法は数十μm以上である。を九とドラジンは魂4輪11
艷11蝙峰参参毒性が強い。
The etching ability of the above etching solution is very high.
Since the etching time is short, the width of the appropriate etching time is extremely narrow, making it difficult to bury the etching. Further, the reproducibility and stability of etching are poor, and the size that can be practically processed is several tens of μm or more. 9 and Drazin are soul 4 wheels 11
11. Ginseng is highly toxic.

本発明の目的は、かかる従来のエツチング液−ルが安定
に確実に形成出来るエツチング液を提供することに娶る
It is an object of the present invention to provide an etching solution that can be formed stably and reliably over the conventional etching solution.

本発明は、水酸化テトラメチルアンモニウムのアルコー
ル溶液からなるポリイミド系樹脂用エツチング液に関す
る。
The present invention relates to an etching solution for polyimide resins comprising an alcoholic solution of tetramethylammonium hydroxide.

本発明を適用し得るポリイミド系樹脂について説明する
The polyimide resin to which the present invention can be applied will be explained.

′−一般 式示される繰シ返し単位(ここでR1は芳香環を有する
4価の基であシ、−は芳香環を有する2価の基である)
を有するポリイミド樹脂が用いられる。これは、芳香族
ジアミンと芳香族酸二無水物とから合成される重合物で
あシ1例えばPyr@−ML(デュポン社1ft)、)
レニース(東し社製)を用いて製作される。さらに詳し
くは米lil特許11&17@634号明細書に述ぺら
れている。
'-Repeating unit represented by the general formula (where R1 is a tetravalent group having an aromatic ring, - is a divalent group having an aromatic ring)
A polyimide resin having the following properties is used. This is a polymer synthesized from an aromatic diamine and an aromatic acid dianhydride.
Manufactured using Lenise (manufactured by Toshisha). More details are described in US Lil' Patent No. 11 & 17@634.

一般式 %式%() (式中Ar1 、 Arl 、 Arc及びAr4は芳
香族残基を示しYはSO,t+はCOを示す)で示され
るPIQも用いられる。
PIQ represented by the general formula % (in which Ar1, Arl, Arc and Ar4 represent aromatic residues, Y represents SO, and t+ represents CO) is also used.

これは一般式 (式中Arは芳香族残基を示しYは80.を九はCOを
示す。また1個のアミノ基とY−Nl丸基とは互いにオ
ルト位置に位置する)で示されるジアミノアミド化合物
とジアミン及びテトラカルボン酸二無水物とを反応させ
てポリアミド蓋中間体を生成させ、しかる後、該中間体
を脱水・閉漂させることによυ製造することができる。
This is shown by the general formula (in the formula, Ar represents an aromatic residue, Y represents 80., and 9 represents CO; one amino group and the Y-Nl circle group are located at ortho positions to each other). υ can be produced by reacting a diaminoamide compound with a diamine and a tetracarboxylic dianhydride to produce a polyamide lid intermediate, and then dehydrating and drifting the intermediate.

例えば一般式 3価基)を有する高耐熱性重合体である。For example, general formula It is a highly heat-resistant polymer having a trivalent group).

^ PIQについては、さらに詳しくは特公昭48−285
6号公報に述べられている。を九本発@になるエツチン
グ液は、ポリアミドイミド、ポリエステルイミド膜等の
イミド基を有するボリイミ、ド系樹脂膜のエツチングに
も適用できる。
^ For more information on PIQ, please refer to the Special Publication Publication No. 48-285
This is stated in Publication No. 6. This etching solution can also be applied to etching polyamide-imide, polyester-imide, and other polyamide-based resin films having imide groups.

本発明になるエツチング液は、ポリアミド酸又はPIQ
のプレポリマを130〜200℃の温度でベークし、イ
ミド化率が5〜90−のポリイミド系樹脂膜に用いるこ
とが好ましい。
The etching solution of the present invention is polyamic acid or PIQ.
It is preferable to bake the prepolymer at a temperature of 130 to 200° C. and use it for a polyimide resin film having an imidization rate of 5 to 90 −.

イミド化率と紘、完!蚕にイミド化した状態のポリイミ
ド系樹脂膜のイミド基(例えば1775(1’jll”
、あるいは1375aI−”)の吸収強度を基準KL、
前駆物質であるポリアミド酸あるいはPIQのプレポリ
マそのもののイミド基の吸収強度を前述の基準イミド基
吸収強度で割シ対数をとった値を初期値0とし、各熱処
理し九時のポリイミド系樹脂膜のイミド基吸収強度を基
準イミド基吸収で割9対数をとつ九値を、その熱処理温
度でのポリイミド系樹脂膜のインド化率とする。
Imidization rate and Hiro are complete! The imide group of the imidized polyimide resin film on the silkworm (for example, 1775 (1'jll)
, or 1375aI-”) as the reference KL,
The initial value is 0, which is the logarithm of the imide group absorption intensity of the polyamic acid precursor or the PIQ prepolymer itself divided by the above-mentioned standard imide group absorption intensity. The imide group absorption intensity is divided by the standard imide group absorption and the 9-logarithm value is taken as the indization rate of the polyimide resin film at the heat treatment temperature.

ポリイミド系樹脂膜に対するエツチング能力。Etching ability for polyimide resin films.

エツチング液の溶解性の点から水酸化ナト2メチルアン
モニウムのアルコール溶液の濃度は5乃至35重量−が
好ましい。
From the viewpoint of the solubility of the etching solution, the concentration of the alcohol solution of sodium dimethylammonium hydroxide is preferably 5 to 35% by weight.

水酸化テトラメチルアンモニウムのアルコール溶液とし
ては、メタノール溶液、エタノール溶液等が挙げられる
Examples of alcohol solutions of tetramethylammonium hydroxide include methanol solutions and ethanol solutions.

エツチングは1例えば130〜200℃で熱処理したポ
リイミ:1□1□′)°系樹脂表面に通常のホトリング
ラフイーエiと同様な方法で開口部をもつ九レジスト層
をパターン形成し1次いでエツチング液中に浸漬するか
、或はエツチング液をシャワー状にして吹きつけて石門
われる。レジスト層の開口部のポリイミド系樹脂をエツ
チング後レジスト層は除去される。
Etching is carried out by patterning a resist layer with openings on the surface of a polyimide resin heat-treated at 130 to 200°C, for example, using a method similar to that used for ordinary photolithography. It can be removed by immersing it in an etching solution or by spraying it with a shower of etching solution. After etching the polyimide resin in the openings of the resist layer, the resist layer is removed.

本発明の代表的なエツチング液である水酸化テトラメチ
ルアンモニウムの20重量−メタノール溶液を用いてエ
ツチングし九場合のポリイミド系樹脂膜の膜厚変化を調
ぺ九結果を第1図の曲線Cに示す。この時のエツチング
条件はポリアミド酸もしくはPIQのプレポリマの膜を
150℃の温度でベークし、イミド化し良状態でホトレ
ジスト処理を行ない25℃のエツチング液に浸漬し丸も
のである。−線Cでは2曲線ミド系樹脂膜の膜厚増加(
膨潤)は無い。事実。
We investigated the change in film thickness of the polyimide resin film when etching was performed using a 20% methanol solution of tetramethylammonium hydroxide, which is a typical etching solution of the present invention.The results are shown in curve C in Figure 1. show. The etching conditions at this time are that a film of polyamic acid or PIQ prepolymer is baked at a temperature of 150°C, imidized, subjected to photoresist treatment in good condition, and immersed in an etching solution at 25°C. - Line C shows an increase in the thickness of the two-curve mid-based resin film (
There is no swelling. fact.

水酸化テトラメチルアンモニクムの20重量−メタノー
ル1液によってエツチングしたポリイミド系樹脂膜の断
面を観察すると第2図(blに示すように、はぼ直線的
な傾斜をもつ丸形状でエツチングされておシ、かつ水酸
化ナト2メチルアンモニウム水溶液の濃縮溶液単独のエ
ツチング液でみられる膨潤領域は全く認められない。
Observing the cross section of a polyimide resin film etched with 20 weight of tetramethylammonicum hydroxide and 1 solution of methanol, as shown in Figure 2 (bl), it was etched in a round shape with an almost straight slope. Moreover, the swelling region seen in the etching solution of a concentrated solution of sodium dimethylammonium hydroxide alone is not observed at all.

このような形状は第2層の配線導体の形成にとってまこ
とに好ましく1例えば導体の段差での断線という事故は
全く発生しないといってよい。
Such a shape is very suitable for the formation of the second layer wiring conductor 1. For example, it can be said that accidents such as disconnection at the step of the conductor do not occur at all.

次に本発明になるエツチング液をエツチングの安定性の
点から述べる。第3図(11はエツチング時間とエツチ
ングされたスルーホール仕上シ寸法の関係を、第3図(
b)はスルーホール寸法の設計値に対するエツチングさ
れたスルーホール仕上り寸法を示す。ここでスルーホー
ル仕上゛シ寸法は樹脂膜の開口寸法をさすものである。
Next, the etching solution of the present invention will be described from the viewpoint of etching stability. Figure 3 (11) shows the relationship between etching time and finished dimensions of etched through holes.
b) shows the finished dimensions of the etched through-holes relative to the design values of the through-hole dimensions. Here, the through-hole finishing dimension refers to the opening dimension of the resin film.

第4図に示される直線c、d、eのエツチング液組成と
イミド化するときの温度、エツチング温度は次のとおシ
である。
The composition of the etching solution, the imidization temperature, and the etching temperature of the lines c, d, and e shown in FIG. 4 are as follows.

イミドイヒ温度り50℃、エツチング温度4o℃d ヒ
ドラジンヒトラード8〇−水溶液イミドイヒ温度り00
℃、エツチング温度25℃C水酸化テトラメチルアンモ
ニウム10重量−水溶液イミド化温度150℃、エツチ
ング温度40℃ポリイミド系樹脂膜をヒドラジンでエツ
チングする場合、ホトレジスト膜が薄いと龜は、ヒドラ
ジンがホトレジスト膜の下までまわシ込んでエツチング
するためサイドエッチが大きくなってしまい、tたエツ
チングされたスルーホール寸法の拡が多速度も速い、シ
九がって大きいスルーホールと小さいスルーホールが両
方存在する部分等をエツチングする場合、大きいスルー
ホールホト大きく、速くスルーホールエッチされる丸め
、第4図(b)に示すようにスルーホール設計値と実際
のエッチ後の仕上シ寸法に差が生じ、エツチングの安定
性が愚い。
Imide temperature: 50℃, etching temperature: 4o℃d Hydrazine hydrogen hydride 80 - aqueous solution imide temperature: 00
℃, etching temperature 25℃, 10 weight of tetramethylammonium hydroxide - aqueous solution imidization temperature 150℃, etching temperature 40℃ When etching a polyimide resin film with hydrazine, if the photoresist film is thin, the hydrazine may damage the photoresist film. Because the etching is done by going all the way to the bottom, the side etch becomes large, and the etched through hole expands quickly, resulting in areas where there are both large and small through holes. When etching large through-holes, there is a difference between the through-hole design value and the actual finished size after etching, as shown in Figure 4(b). Stability is poor.

まえ、水酸化ナト2メチルアンモニウムの:: 10重量−水溶液単独で/d、、s″22テ2グ能力1
50℃で処理し、イしド化し九ポリイミド系樹脂膜に対
して第4図(a)K示すようにスルーホールの拡が多速
度は大きいが、第4図(b)に示すようにスルーホール
設計値と実際のスルーホール仕上シ寸法に大きな差が生
じておシ、エツチングの安定性悪く、微細加工は困難で
ある。
Before, sodium 2 methyl ammonium hydroxide:: 10 weight - aqueous solution alone /d,, s''22 te 2g capacity 1
After treatment at 50°C and idization, the through-holes expand at a high speed as shown in Figure 4(a)K for the polyimide resin film, but as shown in Figure 4(b), the through-holes expand rapidly. There is a large difference between the hole design value and the actual finished through-hole dimension, and etching stability is poor, making microfabrication difficult.

これに対し本発明の一実施例になるエツチング液である
水酸化テトラメチルアンモニウムのメタノール溶液では
第4図(alに示すようにスルーホールの拡がり速度が
大きいのにもかかわらず第4図[b)に示すようにスル
ーホール寸法設計値とスルーホール仕上如寸法の関係が
極めて良い。このことは大きなスルーホールと小さいス
ルーホールが混在していても設計値どおシの均一なスル
ーホール形成が可′能であることを示し。
On the other hand, in the case of a methanol solution of tetramethylammonium hydroxide, which is an etching solution according to an embodiment of the present invention, the through-holes expand at a high speed as shown in FIG. 4 (al). ), the relationship between the through-hole dimension design values and the through-hole finished dimensions is extremely good. This shows that even if large through holes and small through holes coexist, it is possible to form through holes that are uniform compared to the design value.

しかも3μm0の微細なスルーホールもエツチング可能
である。スルーホールの拡が多速度が大きいことから、
エツチング時間が短くてすむことから、量産性にも−れ
ている。
Furthermore, it is possible to etch fine through holes as small as 3 μm. Because the through hole has a large expansion speed,
Since the etching time is short, it is suitable for mass production.

又、微細加工にと=、1.、、F重要なエツチングファ
クタ(FIC)について、エツチング液c、Leについ
て調べると、各々1.3〜1.4,1.0〜1.2゜0
.85〜1.0となる。エツチングファクタは第4図に
示すようにエツチングする被膜の厚さdと傾斜部の幅W
に対して で表わされる。したがってエツチング7アクタが大きい
程傾斜部の傾きは基板に対して自直に近くなり、その後
の2層配線形成時の配線幅の設計値が小さくてすむので
、微細加工がよシ容蟲に可能となる。この点で4他のエ
ツチング液と比較して、水酸化テトラメチルアンモニウ
ムのメタノール溶液は優れている。
Also, for fine processing = 1. ,,F Important etching factor (FIC) is 1.3~1.4 and 1.0~1.2°0 respectively for etching liquids C and Le.
.. It becomes 85-1.0. The etching factor is determined by the thickness d of the film to be etched and the width W of the slope, as shown in Figure 4.
It is expressed as against. Therefore, the larger the etching 7 actor is, the more the slope of the slope becomes perpendicular to the substrate, and the design value of the wiring width when forming the subsequent two-layer wiring can be made smaller, making microfabrication easier. becomes. In this respect, a methanol solution of tetramethylammonium hydroxide is superior to other etching solutions.

ポリイミド系樹脂膜に対する水酸化ナト2メチルアンモ
ニウムのアルコール溶液ニよるエツチング効果は上記で
述べた水酸化ナト2メチルアンモニウムのアルコール溶
液の濃度以外にボリア建ド酸、PIQのプレポリマ等を
イミド化するときの温度、エツチング液の温度等によっ
て異なる。まずイきド化するときの温度についていえば
エツチング速度、スルーホールのエツチング安定性等か
ら130〜200℃で行なうのが好ましい。またエツチ
ング液の温度はエツチング速度及びエツチング液の安定
性から25〜30℃が好ましい。
The etching effect of an alcoholic solution of dimethylammonium hydroxide on a polyimide resin film is determined by the etching effect of an alcoholic solution of dimethylammonium hydroxide when imidizing boria-containing acid, PIQ prepolymer, etc. It varies depending on the temperature of the etching solution, the temperature of the etching solution, etc. First, regarding the temperature at which the oxidizing process is performed, it is preferable to carry out the process at a temperature of 130 to 200 DEG C. in view of the etching rate, the etching stability of through holes, and the like. Further, the temperature of the etching solution is preferably 25 to 30 DEG C. from the viewpoint of etching speed and stability of the etching solution.

エツチングのマスクとして用いることのできるホトレジ
ストは環化ゴム系のネガタイプが好ましく例えばコダッ
ク社製のKMER,KTFR。
The photoresist that can be used as an etching mask is preferably a cyclized rubber negative type photoresist, such as KMER or KTFR manufactured by Kodak.

東京応化工業社製のOMRなどが用いられる。OMR manufactured by Tokyo Ohka Kogyo Co., Ltd. or the like is used.

エツチングを終了したのちホトレジストは、九とえばイ
ンダスト・す・ケミカルラボラトリイ(Indust 
−Ri −chem−Laboratory )社製の
除去剤J−loo等によって除去することができる。J
−100を用いる場合、200℃以下の温度でベークし
たポリイミド系樹脂膜は完全にイミド化していない丸め
、J−100にポリイミド系樹脂膜がわずかにおかされ
ることがある。そのため、ポリイミド系樹脂膜のエツチ
ングが終了したのち、ホトレジストを除去する前にポリ
イミド系樹脂膜を200〜220℃の温度でベークする
必要がある。ホトレジストを除去し、この後さらに第2
層の配線導体の形成工程に入る前に、少なくとも250
℃以上の温度でポリイミド系樹脂膜を再ベークし、完全
にイミド化することが好ましい。なお、この再ベークの
際9本発明になるエツチング液を用いて形成したスルー
ホールパターンは形状がダしたり変形し−Itシする現
像はほとんどないのに対して。
After finishing the etching, the photoresist is processed by a manufacturer, for example, an industrial chemical laboratory (Industry Chemical Laboratory).
It can be removed using a removal agent such as J-loo manufactured by -Ri-chem-Laboratory). J
When using J-100, the polyimide resin film baked at a temperature of 200° C. or lower may not be completely imidized and may be rounded, and the polyimide resin film may be slightly damaged in J-100. Therefore, after etching of the polyimide resin film is completed, it is necessary to bake the polyimide resin film at a temperature of 200 to 220° C. before removing the photoresist. The photoresist is removed, and then a second
At least 250% of
It is preferable to re-bake the polyimide resin film at a temperature of 0.degree. C. or higher to completely imidize it. It should be noted that during this re-baking, the through-hole pattern formed using the etching solution of the present invention suffers from deformation or deformation, whereas there is almost no development.

ポジ形ホトレジストの現儂液あるいは水酸化テトラメチ
ルアンモニウム水溶液、の濃縮溶液、ヒドラジンでエツ
チングして形成し九スルーホールパターンは形状がダレ
九シ著しく変形し九りするという欠点がある。これは、
上記のエツチング液が浸透した膨潤領域が熱的にも不安
定である丸めである。
The through-hole pattern formed by etching with an active solution of positive photoresist, a concentrated solution of aqueous tetramethylammonium hydroxide, or hydrazine has the disadvantage that its shape is significantly distorted and distorted. this is,
The swollen region penetrated by the etching solution is rounded and is thermally unstable.

次に実施例により本発明を具体的Km明する。Next, the present invention will be specifically explained with reference to Examples.

実施例1 ポリアミド酸およびPIQのプレポリマの溶液としてそ
れぞれ次のも・のを準備し九。
Example 1 The following prepolymer solutions of polyamic acid and PIQ were prepared.

ル Pyre −ML 、 RC−5057デュポン(
Dupont)社製 B、  )レニース 東し社製 C,PIQのプレポリマ 日立化成社製PIQのプレポ
リマは次のようにして得たものを用いた。
Le Pyre-ML, RC-5057 DuPont (
Prepolymer of B manufactured by DuPont), Lenise C manufactured by Toshi Co., and PIQ The prepolymer of PIQ manufactured by Hitachi Chemical Co., Ltd. was obtained as follows.

温度針、攪拌機および塩化カルシウム管を備え九100
ccの三つロフラスコに、4.4’−ジアミノジフェニ
ルエーテル−3−カルボンアミド2.43)、44’−
ジアミノジフェニルエーテルλOfおよびN−メチル−
2−ピロリドン60coを入れ。
9100 equipped with temperature needle, stirrer and calcium chloride tube
4,4'-diaminodiphenyl ether-3-carbonamide 2.43), 44'-
Diaminodiphenyl ether λOf and N-methyl-
Add 60 co of 2-pyrrolidone.

よく攪拌しておく。これにビ°ロメリット酸二無水物4
.36 Pを徐々に加える。添加終了後5時間攪拌9反
応を続けてPIQのプレポリ1を樽形(イミド化率的a
OS )。A、B、CにそれぞれN−メチル−2−ピロ
リドンを加えて粘度を1.000cpsに調整した。以
上のように粘度を調整したA。
Stir well. In this, biromellitic dianhydride 4
.. Add 36 P gradually. After the addition was completed, the reaction was continued for 5 hours with stirring, and the PIQ prepoly 1 was heated to a barrel shape (imidization rate a).
OS). N-methyl-2-pyrrolidone was added to each of A, B, and C to adjust the viscosity to 1.000 cps. A whose viscosity was adjusted as described above.

B、Cをそれぞh表面を熱酸化し九半導体装置用シリコ
ンウェーレ1上に滴下しホトレジスト回転塗布機(スピ
ンナ’−IH−DS型、ミカサ株式会社製)を用いて毎
分へ〇′”00〜4.000回転の回転速度で塗布した
The surfaces of B and C were thermally oxidized and then dropped onto silicon wafer 1 for semiconductor devices, and coated every minute using a photoresist spin coater (Spinner'-IH-DS type, manufactured by Mikasa Corporation). "Coating was carried out at a rotational speed of 00 to 4,000 revolutions.

これを150℃で60分乾燥させ、ついでこの樹脂膜上
にホトレジストを回転塗布しえ、ホトレジストは東京応
化工業のOMB−83の39 cps溶液を用い九。毎
分4000の回転速度で塗布し。
This was dried at 150° C. for 60 minutes, and then a photoresist was spin-coated on the resin film using a 39 cps solution of OMB-83 manufactured by Tokyo Ohka Kogyo. Apply at a rotational speed of 4000 rpm.

ホトレジストの膜厚は1.0μmであつ九。The photoresist film thickness was 1.0 μm.

ホトレジストを90℃で20分乾燥させたのちホトマス
クを密着させて紫外線を露光し1次いでOMRI@現儂
液(東京応化工業)に浸漬して、未露光のホトレジスト
を溶解した。さらに感光して樹脂膜上に残り所定のパタ
ーンを形成したホトレジスト膜を140℃で20分硬化
し、ボストベーク処理を行なつ九。
The photoresist was dried at 90° C. for 20 minutes, then exposed to ultraviolet light with a photomask attached, and then immersed in OMRI @ Current Solution (Tokyo Ohka Kogyo) to dissolve the unexposed photoresist. Furthermore, the photoresist film that remained on the resin film and formed a predetermined pattern by exposure to light was cured at 140° C. for 20 minutes, and a post-baking process was performed.

ポリイミド系樹脂膜の膜厚は各々 A、26μm B、25μm c、’hsμm であつ九。しかるのち水酸化テトラメチルアンモニラ1
30重量嚢メタノール溶液にエツチング液度30℃で5
0秒浸漬し喪。
The film thicknesses of the polyimide resin films were A, 26 μm, B, 25 μm, and hsμm, respectively. Then, tetramethylammonyl hydroxide 1
Etching into 30 weight bags of methanol solution at a liquid level of 5 at 30℃.
Immersed for 0 seconds and mourned.

上記のエツチング条件でエツチングを行なった場合の開
口寸法、パターンの寸法精度について下記の結果を得た
The following results were obtained regarding the opening dimensions and pattern dimensional accuracy when etching was performed under the above etching conditions.

すなわちA、B、Cのいずれについても厚さ15〜16
4mの樹脂膜において10/Am’、74m’の開口に
対してへ3〜0.4μmの誤差の寸法精度で、 54m
’、 4 prno、 34m°の開口に対し0.2〜
0.3μnlo娯差の寸法精度でエツチング可能であっ
た。なお開口寸法はマスク寸法に対するポリイミド系樹
脂膜の底面の寸法である。パターンの形状は、A、B、
Cともに3μm0の開口部に丸味がほとんどなく良好な
形状で6つ九。
That is, the thickness of each of A, B, and C is 15 to 16
With a dimensional accuracy of 3 to 0.4 μm for an opening of 10/Am' and 74 m' for a 4 m resin film, 54 m
', 4 prno, 0.2 to 34 m° aperture
Etching was possible with a dimensional accuracy of 0.3 μnlo tolerance. Note that the opening dimension is the dimension of the bottom surface of the polyimide resin film relative to the mask dimension. The shape of the pattern is A, B,
Both Cs have a 3μm0 opening with almost no roundness and a good shape with 6x9.

またエツチングファクタについて測定したところA、B
、Cともに1.30〜1.40の範囲にToC。
Also, when the etching factor was measured, A and B
, C are both in the range of 1.30 to 1.40.

パターン端部の傾斜は52〜55°であつ九。このよう
に3μm’のスルーホールが良好な形状にエツチング可
能であり、かつテーパー角が52〜s5@で得られるこ
とは微細加工性にとって極めて嵐い特性を有するといえ
る。
The slope of the pattern end is 52 to 55 degrees. The fact that a 3 μm' through hole can be etched into a good shape and the taper angle is 52 to s5 can be said to have extremely excellent characteristics for microfabrication.

比較例1 実施例1で使用したのと同じポリイミド系樹脂jlA、
B、Cを水酸化テトラメチルアンモニウム10重量嚢水
溶液でエツチングし九場合、同一時昧を帯びておシ、オ
ーバーエッチ状11になっている。尚、関口しているス
ルーホールのエツチング7アクタはA、B、Cともにα
85〜1.0の範囲であつ九。
Comparative Example 1 The same polyimide resin jlA used in Example 1,
When B and C were etched with a 10-weight bag aqueous solution of tetramethylammonium hydroxide, an overetched pattern 11 was obtained with the same spacing. In addition, the etching 7 actors of the through-hole that are connected are α for A, B, and C.
85 to 1.0.

比較例2 実施例1で使用したのと同じボリイきド系樹脂\ 1[A、B、Cをエチレン2アミン単独のエツチング液
でエツチングし九場合、同一時間では74m’以下は開
口されず、開口し九10μm’のスルーホール4丸味を
帯びてエツチングされてしまう。
Comparative Example 2 When the same polyhydric resin used in Example 1 was used to etch A, B, and C with an etching solution containing ethylene diamine alone, 74 m' or less was not opened in the same time; Through holes 4 of 910 μm are rounded and etched.

実施例2 実施例1と同じ溶液A、BおよびCをそれぞれ1、00
0 cpsの粘度にして亀ooo 〜4ooo rpm
で所定の基板上に回転塗布し、160℃で60分。
Example 2 The same solutions A, B and C as in Example 1 were added at 1,000% each.
0 cps viscosity to 4ooo rpm
Spin coating onto a specified substrate at 160°C for 60 minutes.

加熱硬化処理を施しイミド化した。樹脂膜の膜厚は26
〜27μmであつ九。次で実施例1と同様にしてパター
ン寸法104m’〜3μm’のホトレジストパターンを
形成したのち水酸化テトラメチルアンモニウム25重量
−メタノール溶液を有するエツチング液にエツチング温
度28℃で80秒あるいはエツチング温度25℃で10
0秒浸漬し大。
It was heat-cured and imidized. The thickness of the resin film is 26
〜27μm and nine. Next, a photoresist pattern with a pattern size of 104 m' to 3 μm' was formed in the same manner as in Example 1, and then etched in an etching solution containing 25 weight of tetramethylammonium hydroxide-methanol solution at a temperature of 28°C for 80 seconds or at a temperature of 25°C. So 10
Immerse for 0 seconds.

2つのエツチング条件の場合とも同様な結果を示しA、
B、Cのいずれについてもパターンの寸法精度は実施例
1とほとんど有意差のない範囲で開口が形成された。
Similar results were obtained under the two etching conditions.
For both B and C, openings were formed within a range with almost no significant difference in pattern dimensional accuracy from Example 1.

実施例3 ・:、、 実施例1と同じ一液人、BおよびCをそれぞれ1、。Example 3 ・:、、 The same one liquid as in Example 1, 1 each of B and C.

各々Looocp易の粘度にして&000〜400゜r
pmで所定の基板上に回転塗布し、150℃−60分の
加熱硬化処理を施しイミド化した。樹脂膜O膜厚は27
〜29μmであった。次いで実施例1と同様にしてパタ
ーン寸法10μm0〜3 sm。
The viscosity of each Looocp is &000~400゜r
It was spin-coated onto a predetermined substrate at 150° C. and heat-cured at 150° C. for 60 minutes to imide. Resin film O film thickness is 27
It was ~29 μm. Then, in the same manner as in Example 1, the pattern size was 10 μm and 0 to 3 sm.

のホトレジストパターンを形成し九のち水酸化テトラメ
チルアンモニウム30重量−エタノール溶液を有するエ
ツチング液にエツチング温度30℃で80秒浸漬し友。
After forming a photoresist pattern, it was immersed in an etching solution containing 30% by weight of tetramethylammonium hydroxide-ethanol solution for 80 seconds at an etching temperature of 30°C.

パターン寸法はA、B、CともlQμm’、74m’。The pattern dimensions are 1Qμm' and 74m' for A, B, and C.

5μm0.4μmOKついてはα3μm以内の誤差の精
度であつ九が3μm0では開口物の寸法は25 am。
For 5 μm and 0.4 μm OK, the accuracy is within α3 μm, and for 3 μm, the opening size is 25 am.

であった。Met.

本発明になるエツチング液によれば、ポリイミド系樹脂
のエツチングに際して、従来のポリアンド酸又はPIQ
のプレポリマの段階でのポジタイプのホトレジストの現
俸液でエツチングする場合又はイミド化し九段階での従
来の第4級水酸化アンモニウム溶液、非水溶媒中に第4
級水酸化アンモニウム溶液を混合し九潜液若しくはヒド
ラジンでエツチングする場合に比べて、エツチング速度
が天動く、又、エツチング時に膨潤することなく極めて
正確に微細な加工が可能となる。
According to the etching solution of the present invention, when etching polyimide resin, conventional polyandroic acid or PIQ
When etching with the current solution of positive type photoresist at the prepolymer stage or imidization and conventional quaternary ammonium hydroxide solution at the nine stage, the quaternary
Compared to the case where a grade ammonium hydroxide solution is mixed and etched with a diluent solution or hydrazine, the etching speed is dramatically higher, and extremely precise fine processing is possible without swelling during etching.

又、ポリイミド系樹脂のエツチングに要する時間が50
〜100秒と従来の他のエツチング液による場合と比較
して短いため、量産性に優れているのが特長である。そ
の丸め、エツチング方法をバッチ処理からスプレーエッ
チによる1枚毎の処理も可能で、この場合エツチングの
自動処理化することによシ、量産性に優れ、エツチング
精度良く、カつ安全性の高いエツチングを行なうことが
出来ろ。
Also, the time required for etching polyimide resin is 50
Since the etching time is 100 seconds, which is shorter than that using other conventional etching solutions, it is characterized by excellent mass productivity. The rounding and etching method can be changed from batch processing to individual sheet processing using spray etching.In this case, by automating the etching process, it is possible to achieve excellent mass production, high etching accuracy, and highly safe etching. Be able to do this.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はエツチング液のエツチング特性を示す図、第2
図はエツチングされ九ボリイξド系樹脂膜の断面図、第
3図(a)はスルーホール寸法の拡がシ速度、メχ爾(
b)はスルーホールの設計値と実際のスルーホール開口
部寸法の関係を示す図及び第4図はエツチングファクタ
を説明する図である。 符号の説明 1・・・基体      2・・・ポリイミド系樹脂膜
3・・・盛シ上がシ部分 lb  1  日 0/234567   δ 9 1フチン7゛鴫ゴ旬 ()F8ノ1イ直)第 2 図 (d)           <bン 寛 3 口 (dン 工・rチシグー■司(、相2↑逅〕 (b) スルーホール7を汰級計値(μmン ’f)  4  Ui ηT
Figure 1 shows the etching characteristics of the etching solution, Figure 2 shows the etching characteristics of the etching solution.
The figure is a cross-sectional view of an etched nine-bolyide resin film, and FIG.
b) is a diagram showing the relationship between the design value of the through hole and the actual through hole opening size, and FIG. 4 is a diagram explaining the etching factor. Explanation of symbols 1... Base 2... Polyimide resin film 3... Embossed upper part lb 1 day 0/234567 δ 9 1 7th position 2 Diagram (d)

Claims (1)

【特許請求の範囲】 1、水酸化テトラメチルアンモニウムのアルコール溶液
からなるポリイミド系樹脂用エツチング液。 2 水酸化テトラメチルアンモニウムのアルコール溶液
中の水酸化テトフメチルアンモエウムの濃度が5乃至3
5重量−である特許請求の範囲第1項記載のポリイミド
系樹脂用エツチング液。 & ポリイミド系樹脂が、イミド化率が5乃至90−の
ポリイミド系樹脂である特許請求の範囲第1項又祉第2
項記載のボリイきド系樹脂用エツチング液。
[Claims] 1. An etching solution for polyimide resins comprising an alcoholic solution of tetramethylammonium hydroxide. 2 The concentration of tetramethylammonium hydroxide in the alcohol solution of tetramethylammonium hydroxide is 5 to 3.
5. The etching solution for polyimide resin according to claim 1, which has a weight of 5. & Claim 1 and Claim 2, wherein the polyimide resin is a polyimide resin with an imidization rate of 5 to 90.
Etching liquid for bolioid resin as described in .
JP17399681A 1981-10-29 1981-10-29 Etchant for polyimide resin Granted JPS5874041A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17399681A JPS5874041A (en) 1981-10-29 1981-10-29 Etchant for polyimide resin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17399681A JPS5874041A (en) 1981-10-29 1981-10-29 Etchant for polyimide resin

Publications (2)

Publication Number Publication Date
JPS5874041A true JPS5874041A (en) 1983-05-04
JPS6347140B2 JPS6347140B2 (en) 1988-09-20

Family

ID=15970820

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17399681A Granted JPS5874041A (en) 1981-10-29 1981-10-29 Etchant for polyimide resin

Country Status (1)

Country Link
JP (1) JPS5874041A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5944830A (en) * 1982-08-02 1984-03-13 フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン Method of bonding, coupling and destroying lift-off region on semiconductor structure
WO2001014463A1 (en) * 1999-08-19 2001-03-01 Sony Chemicals Corp. Etchant composition for polyimide resin and method of etching

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5944830A (en) * 1982-08-02 1984-03-13 フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン Method of bonding, coupling and destroying lift-off region on semiconductor structure
JPH0345895B2 (en) * 1982-08-02 1991-07-12 Fueachairudo Kamera Endo Insutsurumento Corp
WO2001014463A1 (en) * 1999-08-19 2001-03-01 Sony Chemicals Corp. Etchant composition for polyimide resin and method of etching

Also Published As

Publication number Publication date
JPS6347140B2 (en) 1988-09-20

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