JPS58143254A - Substance identifying device - Google Patents
Substance identifying deviceInfo
- Publication number
- JPS58143254A JPS58143254A JP57027958A JP2795882A JPS58143254A JP S58143254 A JPS58143254 A JP S58143254A JP 57027958 A JP57027958 A JP 57027958A JP 2795882 A JP2795882 A JP 2795882A JP S58143254 A JPS58143254 A JP S58143254A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- ray
- substance
- data
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は与えられた試料物質、特に結晶性試料物質の同
定を行うだめの装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for identifying a given sample material, particularly a crystalline sample material.
結晶性試料の同定には多くの場合X線回折法が用いられ
る。しかしX線回折法では与えられた試料が予定された
物質であるか否かは比較的容易に決定できるが、試料物
質が何であるかを決定するのは容易でなく、同定の適中
率は余り良くない。X-ray diffraction is often used to identify crystalline samples. However, although it is relatively easy to determine whether a given sample is the expected substance using X-ray diffraction, it is not easy to determine what the sample substance is, and the predictive value of identification is low. not good.
物質の同定も研究室的に行う場合は時間的な制約もなく
、色々な装置が利用できて各種の分析方法を適用するこ
とにより確実な同定が可能であるが、日常的な業務とし
て種々な試料の同定を行う場合は時間的な制約が大きく
設備も限定されるから一つの装置で短期間に分析できる
ことが望まれる。When identifying substances in a laboratory, there is no time constraint, and a variety of equipment is available and a variety of analysis methods can be used to ensure reliable identification. When identifying a sample, there are time constraints and equipment is also limited, so it is desirable to be able to perform analysis in a short period of time with a single device.
本発明はX線回折法だけでは情報不足で同定が困難であ
る所を、他の分析手段をX線回折装置に組込むことによ
って、情報量を増し、物質同定を容易ならしめると共に
同定の確度をも高めだ物質同定装置を提供しようとする
ものである。以下実施例によって本発明を説明する。The present invention increases the amount of information, facilitates substance identification, and improves the accuracy of identification by incorporating other analytical means into the X-ray diffraction apparatus, where identification is difficult due to lack of information using X-ray diffraction alone. The aim is to provide an expensive substance identification device. The present invention will be explained below with reference to Examples.
図面は本発明の一実施例装置を示す。1はX線回折装置
のゴニオメータ、2はX線管球、3はゴニオメータ1の
中心にセットされた試料、4はX線管の電源装置であり
、6はX線検出器である。The drawing shows an embodiment of the invention. 1 is a goniometer of an X-ray diffraction apparatus, 2 is an X-ray tube, 3 is a sample set at the center of the goniometer 1, 4 is a power supply for the X-ray tube, and 6 is an X-ray detector.
5はゴニオメータ制御装置で、例えば粉末或は多結晶試
料の場合X線検出器6を試料3の周囲に回動させ、まだ
試料3に対するX線の入射角を適宜変更できるように、
試料3及びX線源2をゴニオメータ1の周囲に回動させ
ることができる。これらの回転そのものはパルスモータ
によって行われ、ゴニオメータ制御装置5はとれらのパ
ルスモータを駆動したパルス信号をデータ処理装置12
に送る。データ処理装置12ではそれらのパルスを計数
し試料3. X線管2. X線検出器6のゴニオメ
ータ上の角位置を検出している。7はx、1測定回路取
でX線検出器6の出力パルスを受要り、回折X線強度を
測定している。この強度データも上記データ処理装置1
2に入力され、データ処理装置12では回折X線のピー
クを検出してそのときのX線管2とX線検出器60角位
置から格子面間隔或はブラックの反射角を算出し、幾つ
かの回折X線のピークを検出することによって試料に対
するデバイシェラ−環に関するデータを得る。8は光源
、9は同光源の光を集光して試料3に投射する照射光学
系、10は集光光学系、11は分光光度計であり、集光
光学系10は試料3から来る光を集光して分光光度計1
1に入射させ乏。試料3から来る光は光源8の光の反射
光だけに限られないのであり、光源8からの光の照射に
よって励起されだ螢光或はラマン散乱光更にX線の照射
によって励起された螢光等も含まれる。データ処理装置
12には予め光源8の分光特性を記憶させておく。それ
には試料3の位置に標準白板を置いて光源8の反射光を
分光光度計で分光して測定し、その結果をデータ処理装
置に入力する。任意の試料3の分光反射特性は試料30
反射光の分光測光値と予め記憶させである標準白板の対
応波長における測光値光源に変えることによシ、分光光
度計11によって試料の螢光特性が得られる。また光源
8に通電せず試料をX線で照射することにより、試料を
X線で励起した場合の螢光の測定もできる。これらの測
定によるデータはデータ処理装置12に入力され記憶せ
られる。Reference numeral 5 denotes a goniometer control device, which rotates the X-ray detector 6 around the sample 3 in the case of a powder or polycrystalline sample, so that the incident angle of the X-rays relative to the sample 3 can be changed as appropriate.
The sample 3 and the X-ray source 2 can be rotated around the goniometer 1. These rotations themselves are performed by pulse motors, and the goniometer control device 5 transfers the pulse signals that drove these pulse motors to the data processing device 12.
send to The data processing device 12 counts those pulses and calculates the pulses for the sample 3. X-ray tube2. The angular position of the X-ray detector 6 on the goniometer is detected. 7 receives the output pulse of the X-ray detector 6 through the x, 1 measurement circuit and measures the diffracted X-ray intensity. This intensity data is also
2, the data processing device 12 detects the peak of the diffracted X-rays, calculates the lattice spacing or black reflection angle from the angular positions of the X-ray tube 2 and the X-ray detector 60 at that time, and calculates several By detecting the diffraction X-ray peak of , data regarding the Debye-Scherrer ring for the sample is obtained. 8 is a light source, 9 is an irradiation optical system that focuses the light from the light source and projects it onto the sample 3, 10 is a focusing optical system, 11 is a spectrophotometer, and the focusing optical system 10 collects the light coming from the sample 3. Spectrophotometer 1
1 is insufficient. The light coming from the sample 3 is not limited to only the reflected light of the light from the light source 8, but also includes fluorescent light excited by the irradiation of the light from the light source 8, Raman scattered light, and even fluorescent light excited by the irradiation of X-rays. etc. are also included. The data processing device 12 stores the spectral characteristics of the light source 8 in advance. To do this, a standard white plate is placed at the position of the sample 3, and the reflected light from the light source 8 is measured using a spectrophotometer, and the results are input into a data processing device. Spectral reflection characteristics of arbitrary sample 3 are sample 30
The spectrophotometer 11 can obtain the fluorescence characteristics of the sample by changing the light source to the spectrophotometric value of the reflected light and the photometric value at the corresponding wavelength of a standard white plate previously stored. Furthermore, by irradiating the sample with X-rays without energizing the light source 8, it is also possible to measure fluorescence when the sample is excited with X-rays. Data from these measurements are input to and stored in the data processing device 12.
上述した装置においてデータ処理装置12に集積された
一つの試料についてのデータと予め記憶させである各種
物質のデータとから試料物質の種定
別を同椀するプログラムは任意である。例えば試3−
料に関する回折X線のデータ中量も強いピークを与えて
いる回折線と同じ或はきわめて近い回折線を与える物質
を検索し、検索された物質中から試料における2番目に
強いピークの回折線と一致するような回折線を与える物
質を検索すると云う手順を繰返す。通常このようにする
と幾つかの候補物質に絞られるがX線回折のデータだけ
では物質名を一つに確定することは困難である。こ\で
試料に関する色特性即ち分光反射率及び螢光特性が参照
されて試料物質の同定が確定せられる。In the above-mentioned apparatus, any program can be used to identify the type of sample substance from the data about one sample accumulated in the data processing device 12 and the data about various substances stored in advance. For example, search for a substance that gives a diffraction line that is the same as or very similar to the diffraction line that also gives a strong peak in the diffraction The process of searching for a substance that gives a diffraction line that matches the diffraction line of is repeated. Normally, this narrows down the candidates to several candidate substances, but it is difficult to decide on a single substance name based only on X-ray diffraction data. Here, the color characteristics of the sample, ie, the spectral reflectance and fluorescence characteristics, are referenced to confirm the identity of the sample substance.
本発明装置は上述したような構成で、一つの装置でX線
回折法によるデータと分光分析的データとが得られるか
ら試料物質の同定が容易となシ適中率も向上でき、X線
を励起線とする螢光スペクトルのデータは例えば稀土類
元素を含む試料の同定にきわめて有力な情報を与え、し
かも装置構成はX線回折装置を主体とし、ゴニオメータ
は分光的測定時の試料台に兼用され、X線源も螢光分析
用励起線として利用できるので、多機能であるにもか\
わらず、各機能別の装置を設置するのに比4−
し分析のだめの設備費が大幅に節減でき、−装置多機能
であるから試料は単一でよく、試料の調整、或は試料の
装置から装置への移し替え等の時間消費がなく、同時平
行して2種の分析法を実施することもできるので、分析
作業の能率化と云う効果も得られる。The device of the present invention has the above-mentioned configuration, and can obtain X-ray diffraction data and spectroscopic data with one device, making it easy to identify the sample substance and improving the predictive value. Fluorescence spectrum data in the form of lines provides extremely powerful information for identifying samples containing rare earth elements, for example, and the equipment consists mainly of an X-ray diffraction device, with a goniometer also serving as a sample stage during spectroscopic measurements. , X-ray sources can also be used as excitation lines for fluorescence analysis, so they are multifunctional.
Compared to installing separate devices for each function, equipment costs for analysis can be significantly reduced, and since the device is multi-functional, only a single sample is needed, and sample preparation or Since there is no time consumption such as transferring from one device to another, and two types of analysis methods can be carried out simultaneously and in parallel, the effect of streamlining the analysis work can also be obtained.
図面は本発明の一実施例装置の構成を示すブロック図で
ある。
1・・・ゴニオメータ、2・・・X線管、3・・・試料
、5・・・ゴニオメータ制御装置、6・・・X線検出器
、7・・・X線測定回路、8・・・光源、9・・・照射
光学系、10・・・集光光学系、11・・・分光光度計
、12・・・データ処理装置。The drawing is a block diagram showing the configuration of an apparatus according to an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Goniometer, 2... X-ray tube, 3... Sample, 5... Goniometer control device, 6... X-ray detector, 7... X-ray measurement circuit, 8... Light source, 9... Irradiation optical system, 10... Condensing optical system, 11... Spectrophotometer, 12... Data processing device.
Claims (1)
する分光装置と、上記X線回折装置及び分光1装置より
得られるデータと内蔵された各種物質に関するデータと
によって試料物質の同定を行うデータ処理装置とよりな
る物質同定装置。The sample substance is identified using an X-ray diffraction device, a spectrometer that spectrophotometrically measures the sample set in the device, data obtained from the X-ray diffraction device and spectrometer 1 device, and data related to various substances contained therein. A substance identification device consisting of a data processing device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57027958A JPS58143254A (en) | 1982-02-22 | 1982-02-22 | Substance identifying device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57027958A JPS58143254A (en) | 1982-02-22 | 1982-02-22 | Substance identifying device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58143254A true JPS58143254A (en) | 1983-08-25 |
Family
ID=12235393
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57027958A Pending JPS58143254A (en) | 1982-02-22 | 1982-02-22 | Substance identifying device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58143254A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7623624B2 (en) * | 2005-11-22 | 2009-11-24 | Illumina, Inc. | Method and apparatus for labeling using optical identification elements characterized by X-ray diffraction |
US7659983B2 (en) | 2003-01-22 | 2010-02-09 | Electronics And Telecommunications Resarch Institute | Hybrid random bead/chip based microarray |
US7830575B2 (en) | 2006-04-10 | 2010-11-09 | Illumina, Inc. | Optical scanner with improved scan time |
US7901630B2 (en) | 2002-08-20 | 2011-03-08 | Illumina, Inc. | Diffraction grating-based encoded microparticle assay stick |
US7900836B2 (en) | 2002-08-20 | 2011-03-08 | Illumina, Inc. | Optical reader system for substrates having an optically readable code |
US7923260B2 (en) | 2002-08-20 | 2011-04-12 | Illumina, Inc. | Method of reading encoded particles |
US8081792B2 (en) | 2003-08-20 | 2011-12-20 | Illumina, Inc. | Fourier scattering methods for encoding microbeads and methods and apparatus for reading the same |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5017695A (en) * | 1973-06-14 | 1975-02-25 | ||
JPS5049533A (en) * | 1973-09-05 | 1975-05-02 | ||
JPS5081387A (en) * | 1973-11-20 | 1975-07-02 | ||
JPS5395694A (en) * | 1977-02-02 | 1978-08-22 | Rigaku Denki Co Ltd | Xxrays analyzer |
JPS56150331A (en) * | 1980-02-07 | 1981-11-20 | Perkin Elmer Corp | Method of and apparatus for determining nature of unknown substance |
-
1982
- 1982-02-22 JP JP57027958A patent/JPS58143254A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5017695A (en) * | 1973-06-14 | 1975-02-25 | ||
JPS5049533A (en) * | 1973-09-05 | 1975-05-02 | ||
JPS5081387A (en) * | 1973-11-20 | 1975-07-02 | ||
JPS5395694A (en) * | 1977-02-02 | 1978-08-22 | Rigaku Denki Co Ltd | Xxrays analyzer |
JPS56150331A (en) * | 1980-02-07 | 1981-11-20 | Perkin Elmer Corp | Method of and apparatus for determining nature of unknown substance |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7901630B2 (en) | 2002-08-20 | 2011-03-08 | Illumina, Inc. | Diffraction grating-based encoded microparticle assay stick |
US7900836B2 (en) | 2002-08-20 | 2011-03-08 | Illumina, Inc. | Optical reader system for substrates having an optically readable code |
US7923260B2 (en) | 2002-08-20 | 2011-04-12 | Illumina, Inc. | Method of reading encoded particles |
US7659983B2 (en) | 2003-01-22 | 2010-02-09 | Electronics And Telecommunications Resarch Institute | Hybrid random bead/chip based microarray |
US8081792B2 (en) | 2003-08-20 | 2011-12-20 | Illumina, Inc. | Fourier scattering methods for encoding microbeads and methods and apparatus for reading the same |
US7623624B2 (en) * | 2005-11-22 | 2009-11-24 | Illumina, Inc. | Method and apparatus for labeling using optical identification elements characterized by X-ray diffraction |
US7830575B2 (en) | 2006-04-10 | 2010-11-09 | Illumina, Inc. | Optical scanner with improved scan time |
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