JPS5762052A - Original plate to be projected for use in transmission - Google Patents
Original plate to be projected for use in transmissionInfo
- Publication number
- JPS5762052A JPS5762052A JP13648380A JP13648380A JPS5762052A JP S5762052 A JPS5762052 A JP S5762052A JP 13648380 A JP13648380 A JP 13648380A JP 13648380 A JP13648380 A JP 13648380A JP S5762052 A JPS5762052 A JP S5762052A
- Authority
- JP
- Japan
- Prior art keywords
- plate
- original plate
- projected
- original
- transmission
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/26—Phase shift masks [PSM]; PSM blanks; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/26—Phase shift masks [PSM]; PSM blanks; Preparation thereof
- G03F1/30—Alternating PSM, e.g. Levenson-Shibuya PSM; Preparation thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
PURPOSE:To from an original plate high in resolution, limit, while the light of the same wavelength and the same projection lenses as those of the conventional method are used, by providing a specified phase-regulating member in the transparent part of the original plate. CONSTITUTION:A lambda/2 plate 3 (lambda is the wavelength of an incident coherent light) is arranged in a part of the transparent part 1 (at least one of both the sides of the part 1) which composes an original grating plate (the original plate to be projected for use in transmission illumination) together with the opaque part 2. The desired plate is thus formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13648380A JPS5762052A (en) | 1980-09-30 | 1980-09-30 | Original plate to be projected for use in transmission |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13648380A JPS5762052A (en) | 1980-09-30 | 1980-09-30 | Original plate to be projected for use in transmission |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5762052A true JPS5762052A (en) | 1982-04-14 |
JPS6250811B2 JPS6250811B2 (en) | 1987-10-27 |
Family
ID=15176191
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13648380A Granted JPS5762052A (en) | 1980-09-30 | 1980-09-30 | Original plate to be projected for use in transmission |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5762052A (en) |
Cited By (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58173744A (en) * | 1982-04-05 | 1983-10-12 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Mask |
JPH03119355A (en) * | 1989-10-02 | 1991-05-21 | Hitachi Ltd | Mask and production thereof |
US5235400A (en) * | 1988-10-12 | 1993-08-10 | Hitachi, Ltd. | Method of and apparatus for detecting defect on photomask |
US5272116A (en) * | 1991-11-18 | 1993-12-21 | Mitsubishi Denki Kabushiki Kaisha | Method for pattern defect correction of a photomask |
US5290647A (en) * | 1989-12-01 | 1994-03-01 | Mitsubishi Denki Kabushiki Kaisha | Photomask and method of manufacturing a photomask |
US5322748A (en) * | 1991-09-05 | 1994-06-21 | Mitsubishi Denki Kabushiki Kaisha | Photomask and a method of manufacturing thereof comprising trapezoidal shaped light blockers covered by a transparent layer |
US5356738A (en) * | 1990-12-28 | 1994-10-18 | Nippon Steel Corporation | Reticle comprising phase shifter with a tapered edge |
US5358807A (en) * | 1988-11-22 | 1994-10-25 | Hitachi, Ltd. | Mask for manufacturing semiconductor device and method of manufacture thereof |
US5414746A (en) * | 1991-04-22 | 1995-05-09 | Nippon Telegraph & Telephone | X-ray exposure mask and fabrication method thereof |
US5426503A (en) * | 1993-10-12 | 1995-06-20 | Mitsubishi Denki Kabushiki Kaisha | Method of testing a phase shift mask and a testing apparatus used therein in the ultraviolet wavelength range |
US5429897A (en) * | 1993-02-12 | 1995-07-04 | Mitsubishi Denki Kabushiki Kaisha | Attenuating type phase shifting mask and method of manufacturing thereof |
US5455144A (en) * | 1990-03-20 | 1995-10-03 | Hitachi, Ltd. | Process for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the process |
US5464713A (en) * | 1993-09-24 | 1995-11-07 | Mitsubishi Denki Kabushiki Kaisha | Phase shift mask and method for repairing a defect of a phase shift mask |
US5474864A (en) * | 1992-11-21 | 1995-12-12 | Ulvac Coating Corporation | Phase shift mask and manufacturing method thereof and exposure method using phase shift mask |
US5482799A (en) * | 1993-10-08 | 1996-01-09 | Mitsubishi Denki Kabushiki Kaisha | Phase shift mask and manufacturing method thereof |
US5574492A (en) * | 1992-03-27 | 1996-11-12 | Canon Kabushiki Kaisha | Imaging method and semiconductor device manufacturing method using the same |
US5587834A (en) * | 1992-01-31 | 1996-12-24 | Canon Kabushiki Kaisha | Semiconductor device manufacturing method and projection exposure apparatus using the same |
US5594587A (en) * | 1994-03-11 | 1997-01-14 | Nikon Corporation | Illumination device with allowable error amount of telecentricity on the surface of the object to be illuminated and exposure apparatus using the same |
US5593801A (en) * | 1993-02-12 | 1997-01-14 | Mitsubishi Denki Kabushiki Kaisha | Attenuating type phase shifting mask, method of manufacturing thereof and semiconductor device manufactured by using the mask |
US5608575A (en) * | 1991-08-02 | 1997-03-04 | Canon Kabushiki Kaisha | Image projection method and semiconductor device manufacturing method using the same |
US5644381A (en) * | 1994-07-11 | 1997-07-01 | Mitsubishi Denki Kabushiki Kaisha | Method of exposure employing phase shift mask of attenuation type |
US5674647A (en) * | 1992-11-21 | 1997-10-07 | Ulvac Coating Corporation | Phase shift mask and manufacturing method thereof and exposure method using phase shift mask |
US5700601A (en) * | 1994-06-29 | 1997-12-23 | Hitachi, Ltd. | Photomask, manufacture of photomask, formation of pattern, manufacture of semiconductor device, and mask pattern design system |
US5715089A (en) * | 1991-09-06 | 1998-02-03 | Nikon Corporation | Exposure method and apparatus therefor |
US5717483A (en) * | 1993-12-27 | 1998-02-10 | Nikon Corporation | Illumination optical apparatus and method and exposure apparatus using the illumination optical apparatus and method |
US5739898A (en) * | 1993-02-03 | 1998-04-14 | Nikon Corporation | Exposure method and apparatus |
US5935738A (en) * | 1997-02-20 | 1999-08-10 | Nec Corporation | Phase-shifting mask, exposure method and method for measuring amount of spherical aberration |
US6004699A (en) * | 1997-02-28 | 1999-12-21 | Nec Corporation | Photomask used for projection exposure with phase shifted auxiliary pattern |
US6048647A (en) * | 1994-04-05 | 2000-04-11 | Mitsubishi Denki Kabushiki Kaisha | Phase shift mask of attenuation type and manufacturing method thereof |
US6734506B2 (en) | 2001-10-11 | 2004-05-11 | Kabushiki Kaisha Toshiba | Semiconductor device including a plurality of kinds of MOS transistors having different gate widths and method of manufacturing the same |
US6737198B2 (en) | 1999-01-13 | 2004-05-18 | Renesas Technology Corp. | Photomask, fabrication method of photomask, and fabrication method of semiconductor integrated circuit |
JP2006259381A (en) * | 2005-03-17 | 2006-09-28 | Nec Electronics Corp | Method for forming pattern, method for manufacturing semiconductor device, phase shift mask, and method for designing phase shift mask |
JP2006269853A (en) * | 2005-03-25 | 2006-10-05 | Sony Corp | Exposure apparatus and method of exposure |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5935735A (en) | 1996-10-24 | 1999-08-10 | Toppan Printing Co., Ltd. | Halftone phase shift mask, blank for the same, and methods of manufacturing these |
JP4622504B2 (en) * | 2004-12-21 | 2011-02-02 | 凸版印刷株式会社 | Mask blank for extreme ultraviolet exposure, mask and pattern transfer method |
KR101771380B1 (en) | 2008-05-09 | 2017-08-24 | 호야 가부시키가이샤 | Reflective mask, reflective mask blank and method for manufacturing reflective mask |
-
1980
- 1980-09-30 JP JP13648380A patent/JPS5762052A/en active Granted
Cited By (58)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6259296B2 (en) * | 1982-04-05 | 1987-12-10 | Intaanashonaru Bijinesu Mashiinzu Corp | |
JPS58173744A (en) * | 1982-04-05 | 1983-10-12 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Mask |
US5235400A (en) * | 1988-10-12 | 1993-08-10 | Hitachi, Ltd. | Method of and apparatus for detecting defect on photomask |
US5948574A (en) * | 1988-11-22 | 1999-09-07 | Hitachi, Ltd. | Mask for manufacturing semiconductor device and method of manufacture thereof |
US6106981A (en) * | 1988-11-22 | 2000-08-22 | Hitachi, Ltd. | Mask for manufacturing semiconductor device and method of manufacture thereof |
US6548213B2 (en) | 1988-11-22 | 2003-04-15 | Hitachi, Ltd. | Mask for manufacturing semiconductor device and method of manufacture thereof |
US5830606A (en) * | 1988-11-22 | 1998-11-03 | Hitachi, Ltd. | Mask for manufacturing semiconductor device and method of manufacture thereof |
US6458497B2 (en) | 1988-11-22 | 2002-10-01 | Hitachi, Ltd. | Mask for manufacturing semiconductor device and method of manufacture thereof |
US5358807A (en) * | 1988-11-22 | 1994-10-25 | Hitachi, Ltd. | Mask for manufacturing semiconductor device and method of manufacture thereof |
US6733933B2 (en) | 1988-11-22 | 2004-05-11 | Renesas Technology Corporation | Mask for manufacturing semiconductor device and method of manufacture thereof |
US7008736B2 (en) | 1988-11-22 | 2006-03-07 | Renesas Technology Corp. | Semiconductor integrated circuit device fabrication method using a mask having a phase shifting film covering region and an opening region |
US6420075B1 (en) | 1988-11-22 | 2002-07-16 | Hitachi, Ltd. | Mask for manufacturing semiconductor device and method of manufacture thereof |
US5484671A (en) * | 1988-11-22 | 1996-01-16 | Hitachi, Ltd. | Mask for manufacturing semiconductor device and method of manufacture thereof |
JPH03119355A (en) * | 1989-10-02 | 1991-05-21 | Hitachi Ltd | Mask and production thereof |
US5290647A (en) * | 1989-12-01 | 1994-03-01 | Mitsubishi Denki Kabushiki Kaisha | Photomask and method of manufacturing a photomask |
US6794118B2 (en) | 1990-03-20 | 2004-09-21 | Renesas Technology Corp. | Process for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the process |
US5455144A (en) * | 1990-03-20 | 1995-10-03 | Hitachi, Ltd. | Process for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the process |
US5753416A (en) * | 1990-03-20 | 1998-05-19 | Hitachi, Ltd. | Process for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the process |
US6309800B1 (en) | 1990-03-20 | 2001-10-30 | Hitachi, Ltd. | Process for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the process |
US6153357A (en) * | 1990-03-20 | 2000-11-28 | Hitachi, Ltd. | Process for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the process |
US5667941A (en) * | 1990-03-20 | 1997-09-16 | Hitachi, Ltd. | Process for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the process |
US5356738A (en) * | 1990-12-28 | 1994-10-18 | Nippon Steel Corporation | Reticle comprising phase shifter with a tapered edge |
US5414746A (en) * | 1991-04-22 | 1995-05-09 | Nippon Telegraph & Telephone | X-ray exposure mask and fabrication method thereof |
US5608575A (en) * | 1991-08-02 | 1997-03-04 | Canon Kabushiki Kaisha | Image projection method and semiconductor device manufacturing method using the same |
US5322748A (en) * | 1991-09-05 | 1994-06-21 | Mitsubishi Denki Kabushiki Kaisha | Photomask and a method of manufacturing thereof comprising trapezoidal shaped light blockers covered by a transparent layer |
US6094305A (en) * | 1991-09-06 | 2000-07-25 | Nikon Corporation | Exposure method and apparatus therefor |
US5715089A (en) * | 1991-09-06 | 1998-02-03 | Nikon Corporation | Exposure method and apparatus therefor |
US5272116A (en) * | 1991-11-18 | 1993-12-21 | Mitsubishi Denki Kabushiki Kaisha | Method for pattern defect correction of a photomask |
US5587834A (en) * | 1992-01-31 | 1996-12-24 | Canon Kabushiki Kaisha | Semiconductor device manufacturing method and projection exposure apparatus using the same |
US5574492A (en) * | 1992-03-27 | 1996-11-12 | Canon Kabushiki Kaisha | Imaging method and semiconductor device manufacturing method using the same |
US5691090A (en) * | 1992-11-21 | 1997-11-25 | Ulvac Coating Corporation | Phase shift mask and manufacturing method thereof and exposure method using phase shift mask |
US5830607A (en) * | 1992-11-21 | 1998-11-03 | Ulvac Coating Corporation | Phase shift mask and manufacturing method thereof and exposure method using phase shift mask |
US5474864A (en) * | 1992-11-21 | 1995-12-12 | Ulvac Coating Corporation | Phase shift mask and manufacturing method thereof and exposure method using phase shift mask |
US5629114A (en) * | 1992-11-21 | 1997-05-13 | Ulvac Coating Corporation | Phase shift mask and manufacturing method thereof and exposure method using phase shift mask comprising a semitransparent region |
US5674647A (en) * | 1992-11-21 | 1997-10-07 | Ulvac Coating Corporation | Phase shift mask and manufacturing method thereof and exposure method using phase shift mask |
US5739898A (en) * | 1993-02-03 | 1998-04-14 | Nikon Corporation | Exposure method and apparatus |
US5429897A (en) * | 1993-02-12 | 1995-07-04 | Mitsubishi Denki Kabushiki Kaisha | Attenuating type phase shifting mask and method of manufacturing thereof |
US5593801A (en) * | 1993-02-12 | 1997-01-14 | Mitsubishi Denki Kabushiki Kaisha | Attenuating type phase shifting mask, method of manufacturing thereof and semiconductor device manufactured by using the mask |
US5464713A (en) * | 1993-09-24 | 1995-11-07 | Mitsubishi Denki Kabushiki Kaisha | Phase shift mask and method for repairing a defect of a phase shift mask |
US5482799A (en) * | 1993-10-08 | 1996-01-09 | Mitsubishi Denki Kabushiki Kaisha | Phase shift mask and manufacturing method thereof |
US5426503A (en) * | 1993-10-12 | 1995-06-20 | Mitsubishi Denki Kabushiki Kaisha | Method of testing a phase shift mask and a testing apparatus used therein in the ultraviolet wavelength range |
US5717483A (en) * | 1993-12-27 | 1998-02-10 | Nikon Corporation | Illumination optical apparatus and method and exposure apparatus using the illumination optical apparatus and method |
US5594587A (en) * | 1994-03-11 | 1997-01-14 | Nikon Corporation | Illumination device with allowable error amount of telecentricity on the surface of the object to be illuminated and exposure apparatus using the same |
US6048647A (en) * | 1994-04-05 | 2000-04-11 | Mitsubishi Denki Kabushiki Kaisha | Phase shift mask of attenuation type and manufacturing method thereof |
US5895741A (en) * | 1994-06-29 | 1999-04-20 | Hitachi, Ltd. | Photomask, manufacture of photomask, formation of pattern, manufacture of semiconductor device, and mask pattern design system |
US5700601A (en) * | 1994-06-29 | 1997-12-23 | Hitachi, Ltd. | Photomask, manufacture of photomask, formation of pattern, manufacture of semiconductor device, and mask pattern design system |
US5644381A (en) * | 1994-07-11 | 1997-07-01 | Mitsubishi Denki Kabushiki Kaisha | Method of exposure employing phase shift mask of attenuation type |
US5935738A (en) * | 1997-02-20 | 1999-08-10 | Nec Corporation | Phase-shifting mask, exposure method and method for measuring amount of spherical aberration |
US6004699A (en) * | 1997-02-28 | 1999-12-21 | Nec Corporation | Photomask used for projection exposure with phase shifted auxiliary pattern |
US6737198B2 (en) | 1999-01-13 | 2004-05-18 | Renesas Technology Corp. | Photomask, fabrication method of photomask, and fabrication method of semiconductor integrated circuit |
US6815280B2 (en) | 2001-10-11 | 2004-11-09 | Kabushiki Kaisha Toshiba | Method of manufacturing a semiconductor device including a plurality of kinds of MOS transistors having different gate widths |
US6734506B2 (en) | 2001-10-11 | 2004-05-11 | Kabushiki Kaisha Toshiba | Semiconductor device including a plurality of kinds of MOS transistors having different gate widths and method of manufacturing the same |
JP2006259381A (en) * | 2005-03-17 | 2006-09-28 | Nec Electronics Corp | Method for forming pattern, method for manufacturing semiconductor device, phase shift mask, and method for designing phase shift mask |
US7776514B2 (en) | 2005-03-17 | 2010-08-17 | Nec Electronics Corporation | Pattern forming method, semiconductor device manufacturing method and phase shift photomask having dummy gate patterns |
JP4598575B2 (en) * | 2005-03-17 | 2010-12-15 | ルネサスエレクトロニクス株式会社 | Pattern formation method, semiconductor device manufacturing method, phase shift mask, and phase shift mask design method |
US8192919B2 (en) | 2005-03-17 | 2012-06-05 | Renesas Electronics Corporation | Pattern forming method, semiconductor device manufacturing method and phase shift photomask having dummy gate patterns |
US8617797B2 (en) | 2005-03-17 | 2013-12-31 | Renesas Electronics Corporation | Pattern forming method, semiconductor device manufacturing method and phase shift photomask having dummy gate patterns |
JP2006269853A (en) * | 2005-03-25 | 2006-10-05 | Sony Corp | Exposure apparatus and method of exposure |
Also Published As
Publication number | Publication date |
---|---|
JPS6250811B2 (en) | 1987-10-27 |
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