JPS5753963A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS5753963A JPS5753963A JP12793480A JP12793480A JPS5753963A JP S5753963 A JPS5753963 A JP S5753963A JP 12793480 A JP12793480 A JP 12793480A JP 12793480 A JP12793480 A JP 12793480A JP S5753963 A JPS5753963 A JP S5753963A
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- layer
- sio
- semiconductor device
- intermediary
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title abstract 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 6
- 229910052681 coesite Inorganic materials 0.000 abstract 3
- 229910052906 cristobalite Inorganic materials 0.000 abstract 3
- 239000000377 silicon dioxide Substances 0.000 abstract 3
- 229910052682 stishovite Inorganic materials 0.000 abstract 3
- 229910052905 tridymite Inorganic materials 0.000 abstract 3
- 230000015556 catabolic process Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/402—Field plates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/73—Bipolar junction transistors
- H01L29/732—Vertical transistors
- H01L29/7322—Vertical transistors having emitter-base and base-collector junctions leaving at the same surface of the body, e.g. planar transistor
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Bipolar Transistors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE: To prevent the electrolytic concentration as well as to improve the withstand voltage for the subject semiconductor device by a method wherein the second wiring, which is equipotential to a longitudinal N+ layer, is provided at the crossing section of the N+ layer and the base wiring, which constitutes the first wiring, through the intermediary of an SiO2 film.
CONSTITUTION: The second wiring 10, which is substantially equipotential to the longitudinal N+ layer, is provided at the crossing part of the N+ layer 4 and the base wiring 9 of the first wiring through the intermediary of the SiO2 film 8. According to this constitution, as the positive electric charge, accumulated on the interface of an N collector 2 and the N+ layer 4 when biased inversely, is not standing opposite to the negative electric charge of the base wiring 9 by sandwiching the SiO2 8 between them, no electric concentration is generated and also no breakdown is generated below the prescribed iverse bias voltage, thereby enabling to improve the withstand-voltage property for the subject semiconductor device.
COPYRIGHT: (C)1982,JPO&Japio
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12793480A JPS5753963A (en) | 1980-09-17 | 1980-09-17 | Semiconductor device |
DE19813136513 DE3136513A1 (en) | 1980-09-17 | 1981-09-15 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12793480A JPS5753963A (en) | 1980-09-17 | 1980-09-17 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5753963A true JPS5753963A (en) | 1982-03-31 |
Family
ID=14972242
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12793480A Pending JPS5753963A (en) | 1980-09-17 | 1980-09-17 | Semiconductor device |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS5753963A (en) |
DE (1) | DE3136513A1 (en) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3341755A (en) * | 1964-03-20 | 1967-09-12 | Westinghouse Electric Corp | Switching transistor structure and method of making the same |
CA956038A (en) * | 1964-08-20 | 1974-10-08 | Roy W. Stiegler (Jr.) | Semiconductor devices with field electrodes |
-
1980
- 1980-09-17 JP JP12793480A patent/JPS5753963A/en active Pending
-
1981
- 1981-09-15 DE DE19813136513 patent/DE3136513A1/en not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
DE3136513A1 (en) | 1982-06-09 |
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