JPS57500441A - - Google Patents

Info

Publication number
JPS57500441A
JPS57500441A JP56500614A JP50061481A JPS57500441A JP S57500441 A JPS57500441 A JP S57500441A JP 56500614 A JP56500614 A JP 56500614A JP 50061481 A JP50061481 A JP 50061481A JP S57500441 A JPS57500441 A JP S57500441A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56500614A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=22443384&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JPS57500441(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed filed Critical
Publication of JPS57500441A publication Critical patent/JPS57500441A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
JP56500614A 1980-03-13 1980-11-07 Pending JPS57500441A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/130,171 US4375921A (en) 1980-03-13 1980-03-13 Dimension measuring apparatus

Publications (1)

Publication Number Publication Date
JPS57500441A true JPS57500441A (ja) 1982-03-11

Family

ID=22443384

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56500614A Pending JPS57500441A (ja) 1980-03-13 1980-11-07

Country Status (5)

Country Link
US (1) US4375921A (ja)
EP (2) EP0150408A3 (ja)
JP (1) JPS57500441A (ja)
DE (1) DE3071910D1 (ja)
WO (1) WO1981002628A1 (ja)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
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US4473750A (en) * 1980-07-25 1984-09-25 Hitachi, Ltd. Three-dimensional shape measuring device
FR2522408A1 (fr) * 1982-02-26 1983-09-02 Delmas Jeannine Dispositif optoelectronique de mesure dimensionnelle de haute precision sans contact avec la piece a controler
US4501961A (en) * 1982-09-01 1985-02-26 Honeywell Inc. Vision illumination system for range finder
US4589082A (en) * 1983-01-17 1986-05-13 Westinghouse Electric Corp. Nuclear fuel rod straightness measuring system and method
US4688184A (en) * 1984-03-29 1987-08-18 Mitsubishi Denki Kabushiki Kaisha System for measuring three-dimensional coordinates
US4593967A (en) * 1984-11-01 1986-06-10 Honeywell Inc. 3-D active vision sensor
US4936676A (en) * 1984-11-28 1990-06-26 Honeywell Inc. Surface position sensor
US4682894A (en) * 1985-03-21 1987-07-28 Robotic Vision Systems, Inc. Calibration of three-dimensional space
US4825394A (en) * 1985-05-07 1989-04-25 General Dynamics Corporation Vision metrology system
AU589651B2 (en) * 1985-06-14 1989-10-19 Broken Hill Proprietary Company Limited, The Surface profile determination
EP0208060B1 (de) * 1985-06-26 1993-06-02 Wilhelm Hegenscheidt Gesellschaft mbH Verfahren und Messanlage zur Durchmesserbestimmung der Räder von Radsätzen
US4796997A (en) * 1986-05-27 1989-01-10 Synthetic Vision Systems, Inc. Method and system for high-speed, 3-D imaging of an object at a vision station
DE3624959A1 (de) * 1986-07-23 1988-01-28 Mannesmann Ag Automatisches verfahren zur beruehrungslosen dreidimensionalen vermessung von objekten grosser ausdehnung
US4710808A (en) * 1986-08-05 1987-12-01 Mechanical Technology Incorporated Machine vision differential measurement system
US4724886A (en) * 1986-11-25 1988-02-16 Selective Electronic, Inc. Mold cavity misalignment detection system
US4724894A (en) * 1986-11-25 1988-02-16 Selective Electronic, Inc. Molten metal pour control system
US4913551A (en) * 1987-07-28 1990-04-03 Davis Richard B Log measuring method and apparatus
IT212380Z2 (it) * 1987-10-26 1989-07-04 Advanced Data Processing Macchina per il rilevamento e la matematizzazione della superficie di modelli tridimensionali partico larmente per la costruzione di stampi con macchine utensili a controllo numerico
DE3743363A1 (de) * 1987-12-21 1989-07-06 Zeiss Carl Fa Verfahren und einrichtung zur regelung der emissionslichtmenge in einem optischen tastkopf
JPH0674968B2 (ja) * 1988-03-15 1994-09-21 三菱電機株式会社 光学式測定装置
US4925308A (en) * 1988-08-09 1990-05-15 Robotic Vision System, Inc. Calibration of three-dimensional space
US4942814A (en) * 1989-08-10 1990-07-24 Shinohara Machinery Co., Ltd. Operation stand for measuring sheet size for sheet-fed press
DE9017645U1 (ja) * 1990-03-17 1991-07-04 Koenig & Bauer Ag, 8700 Wuerzburg, De
US5351126A (en) * 1991-10-31 1994-09-27 Matsushita Electric Works, Ltd. Optical measurement system for determination of an object's profile or thickness
US5337149A (en) * 1992-11-12 1994-08-09 Kozah Ghassan F Computerized three dimensional data acquisition apparatus and method
WO1996003616A1 (en) * 1994-07-21 1996-02-08 Wangner Systems Corporation Apparatus and method for measuring the caliper of papermaking fabric in a non-contacting manner
US5587051A (en) * 1994-07-29 1996-12-24 Ostermayer; Volker Simplified laser apparatus and method for measuring stock thickness on papermaking machines
US5530548A (en) * 1994-11-07 1996-06-25 Automotive Systems Laboratory, Inc. Calibratable optical distance sensing system and method
US5796635A (en) * 1995-08-08 1998-08-18 Rieter Ingolstadt Spinnereimaschinenbau Ag Device and process for linear measurement of fiber sliver thickness or mass
US5663795A (en) * 1995-09-07 1997-09-02 Virtek Vision Corp. Method of calibrating laser positions relative to workpieces
FR2774757B1 (fr) * 1998-02-06 2001-03-16 Premium Instr Sa Procede et dispositif de mesure de la forme et/ou de la position d'un profil d'une surface d'un produit en defilement
US7006132B2 (en) * 1998-02-25 2006-02-28 California Institute Of Technology Aperture coded camera for three dimensional imaging
US7612870B2 (en) * 1998-02-25 2009-11-03 California Institute Of Technology Single-lens aperture-coded camera for three dimensional imaging in small volumes
US6252623B1 (en) 1998-05-15 2001-06-26 3Dmetrics, Incorporated Three dimensional imaging system
US6381026B1 (en) 1999-03-15 2002-04-30 Lifecell Corp. Method of measuring the contour of a biological surface
US7295186B2 (en) * 2003-01-14 2007-11-13 Avago Technologies Ecbuip (Singapore) Pte Ltd Apparatus for controlling a screen pointer that distinguishes between ambient light and light from its light source
US7417738B2 (en) * 2004-01-27 2008-08-26 Tradewind Scientific Ltd. Determining surface properties of a roadway or runway from a moving vehicle
JP5684991B2 (ja) * 2010-02-17 2015-03-18 株式会社キーエンス 測定システム及びその校正方法
DE102010015689B4 (de) * 2010-04-21 2019-05-23 Aktiebolaget Skf Verfahren und Vorrichtung zur Vermessung eines Lagerbauteils
US8134717B2 (en) 2010-05-21 2012-03-13 LTS Scale Company Dimensional detection system and associated method
US20130144568A1 (en) 2011-08-31 2013-06-06 Rodrigo A. Palma-Amestoy System and Method for Variable Detection in Objects
RU2521220C2 (ru) * 2012-07-17 2014-06-27 Закрытое акционерное общество "Научно-проектный инстиут "Исследование мостов и других инженерных сооружений" Способ измерения линейных перемещений объекта
DE102012217175A1 (de) * 2012-09-24 2014-03-27 Evonik Litarion Gmbh Verfahren zur Ausrichtung zweier Lasersensoren zueinander
US20150226573A1 (en) * 2014-02-11 2015-08-13 Qualcomm Incorporated Pedometer integrated pedestrian positioning
RU2596557C1 (ru) * 2015-05-05 2016-09-10 Публичное акционерное общество "Северский трубный завод" Способ стабилизации положения металлической полосы в зоне измерения
PL3508315T3 (pl) * 2018-01-03 2021-10-04 Upm Plywood Oy Sposób i układ wytwarzania sklejki

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Publication number Priority date Publication date Assignee Title
US3289298A (en) * 1964-06-01 1966-12-06 Collins Microflat Company Inc Calibration apparatus for surface plates
US3393600A (en) * 1965-09-10 1968-07-23 Atomic Energy Commission Usa Optical ranging apparatus
US3565531A (en) * 1969-03-12 1971-02-23 Sanders Associates Inc Electro-optical thickness measurement apparatus
US3671726A (en) * 1969-05-23 1972-06-20 Morvue Inc Electro-optical apparatus for precise on-line measurement of the thickness of moving strip material
US3612890A (en) * 1969-10-13 1971-10-12 Trw Inc Radiation sensitive optical gaging system
US3646331A (en) * 1970-09-03 1972-02-29 Kollmorgen Corp Automatic 100{11 line adjustment of spectrophotometers
GB1439322A (en) * 1972-06-08 1976-06-16 Hawker Siddeley Dynamics Ltd Optical instruments
SU449235A1 (ru) * 1973-07-13 1974-11-05 Государствееный Научно-Исследовательский Институт Машиноведения Оптический измеритель перемещений
CH572201A5 (ja) * 1973-08-31 1976-01-30 Alcyon
BE824959A (fr) * 1975-01-29 1975-05-15 Procede et dispositif de mesure d'epaisseur
US4040738A (en) * 1975-03-20 1977-08-09 Gulton Industries, Inc. Railroad track profile spacing and alignment apparatus
US4103177A (en) * 1975-12-01 1978-07-25 Phillips Petroleum Company Surface quality analysis
US4084248A (en) * 1976-02-02 1978-04-11 The Perkin-Elmer Corporation Method and apparatus for error correction
SE406643B (sv) * 1977-02-16 1979-02-19 Aga Ab Elektronisk korrigeringsanordning for en lengd- eller vinkelmetare
FR2393295A1 (fr) * 1977-05-31 1978-12-29 Snecma Appareil de mesure du pouvoir transmissif de l'atmosphere

Also Published As

Publication number Publication date
EP0150408A2 (en) 1985-08-07
DE3071910D1 (en) 1987-04-02
EP0047250A4 (en) 1982-07-13
EP0047250A1 (en) 1982-03-17
EP0150408A3 (en) 1987-04-22
EP0047250B1 (en) 1987-02-25
US4375921A (en) 1983-03-08
WO1981002628A1 (en) 1981-09-17

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