JPS57169683A - Measuring device for electric current consumption - Google Patents

Measuring device for electric current consumption

Info

Publication number
JPS57169683A
JPS57169683A JP56055310A JP5531081A JPS57169683A JP S57169683 A JPS57169683 A JP S57169683A JP 56055310 A JP56055310 A JP 56055310A JP 5531081 A JP5531081 A JP 5531081A JP S57169683 A JPS57169683 A JP S57169683A
Authority
JP
Japan
Prior art keywords
circuit
signal
time
signals
electric current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56055310A
Other languages
Japanese (ja)
Inventor
Taiji Murakami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56055310A priority Critical patent/JPS57169683A/en
Publication of JPS57169683A publication Critical patent/JPS57169683A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To obtain a measuring method for electric current consumption which measures leak current accurately and detects defects by generating a timing signal and sampling signals upon lapse of a prescribed time from the point of the time when the control signals of a circuit to be tested inverts logically. CONSTITUTION:A circuit 10 to be tested is operated by the signal (a) from a high speed control signal output circuit 30, and its electric current consumption is converted to a voltage by a current to voltage conversion circuit 12, by which a signal like (b) is formed. On the othe hand, a strobe signal generating circuit 31 generates the strobe signal delayed by a preset time (t) from the rise of the output signal (b) of the circuit 12 like (c).A decision circuit 15 samples signals at the timing of these strobe signals, thereby making measurement operation. If there is the high level signal owing to a leak current defect at this time, it is decided by the circuit 15 and the output signal like (d) is obtained. Thereby, the control signal is made high in speed in consideration for only the transient current time during its logical inversion, and the effect of the reduction in the test time is high.
JP56055310A 1981-04-13 1981-04-13 Measuring device for electric current consumption Pending JPS57169683A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56055310A JPS57169683A (en) 1981-04-13 1981-04-13 Measuring device for electric current consumption

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56055310A JPS57169683A (en) 1981-04-13 1981-04-13 Measuring device for electric current consumption

Publications (1)

Publication Number Publication Date
JPS57169683A true JPS57169683A (en) 1982-10-19

Family

ID=12994985

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56055310A Pending JPS57169683A (en) 1981-04-13 1981-04-13 Measuring device for electric current consumption

Country Status (1)

Country Link
JP (1) JPS57169683A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60247941A (en) * 1984-05-23 1985-12-07 Advantest Corp Testing device for semiconductor memory
JPS6128877A (en) * 1984-07-19 1986-02-08 Yokogawa Hokushin Electric Corp Test system
JPH0541436A (en) * 1991-08-05 1993-02-19 Nec Ic Microcomput Syst Ltd Measuring circuit for leak current of semiconductor

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55164948A (en) * 1979-05-29 1980-12-23 Fujitsu Ltd Test system for logic circuit package

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55164948A (en) * 1979-05-29 1980-12-23 Fujitsu Ltd Test system for logic circuit package

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60247941A (en) * 1984-05-23 1985-12-07 Advantest Corp Testing device for semiconductor memory
JPS6128877A (en) * 1984-07-19 1986-02-08 Yokogawa Hokushin Electric Corp Test system
JPH0541436A (en) * 1991-08-05 1993-02-19 Nec Ic Microcomput Syst Ltd Measuring circuit for leak current of semiconductor

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