JPS57138575A - Grinding machine - Google Patents
Grinding machineInfo
- Publication number
- JPS57138575A JPS57138575A JP56020201A JP2020181A JPS57138575A JP S57138575 A JPS57138575 A JP S57138575A JP 56020201 A JP56020201 A JP 56020201A JP 2020181 A JP2020181 A JP 2020181A JP S57138575 A JPS57138575 A JP S57138575A
- Authority
- JP
- Japan
- Prior art keywords
- work
- grinding
- machine
- light
- photo
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
PURPOSE:To make it possible to work continuously without stopping machine from starting to finish of the work in a grinding machine that laps a transparent work by shooting light to the position of working of a work and receiving the light reflected from the work to detect the amount of working of the work. CONSTITUTION:A motor 5 is operated and a lapping machine 9 is rotated to grind the lower face of a work 16 that is set in the piercing hole 15 of a work holder 14 with lapping agent supplied to a polishing cloth 10. During the grinding laser light from a laser stimulating device 27 is directed to the grinding face of the work 16 through an objective lens of a weight 17 that is provided on the piercing hole 15, and the laser light reflected from the grinding face is received by a photo-sensor 28 and the light is converted into electricity. The output signal from the photo-sensor 28 is input to a control device 29. In this control device 29 the input is compared with a beforehand set reference value. If the output signal coincides with the reference value, the motor 5 is stopped, and the rotation of the lapping machine is stopped, and the work is machined to a specified dimension.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56020201A JPS57138575A (en) | 1981-02-16 | 1981-02-16 | Grinding machine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56020201A JPS57138575A (en) | 1981-02-16 | 1981-02-16 | Grinding machine |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57138575A true JPS57138575A (en) | 1982-08-26 |
JPS6211986B2 JPS6211986B2 (en) | 1987-03-16 |
Family
ID=12020545
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56020201A Granted JPS57138575A (en) | 1981-02-16 | 1981-02-16 | Grinding machine |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57138575A (en) |
Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6133857A (en) * | 1984-07-27 | 1986-02-17 | Matsushita Electric Ind Co Ltd | Accurate polishing device |
US5433651A (en) * | 1993-12-22 | 1995-07-18 | International Business Machines Corporation | In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing |
US5964643A (en) * | 1995-03-28 | 1999-10-12 | Applied Materials, Inc. | Apparatus and method for in-situ monitoring of chemical mechanical polishing operations |
US6077452A (en) * | 1992-09-17 | 2000-06-20 | Luxtron Corporation | Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment |
US6342166B1 (en) | 1998-12-10 | 2002-01-29 | Nikon Corporation | Method of detecting end point of polishing of wafer and apparatus for detecting end point of polishing |
US6537133B1 (en) | 1995-03-28 | 2003-03-25 | Applied Materials, Inc. | Method for in-situ endpoint detection for chemical mechanical polishing operations |
US6676717B1 (en) | 1995-03-28 | 2004-01-13 | Applied Materials Inc | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
US6719818B1 (en) | 1995-03-28 | 2004-04-13 | Applied Materials, Inc. | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
US6849152B2 (en) | 1992-12-28 | 2005-02-01 | Applied Materials, Inc. | In-situ real-time monitoring technique and apparatus for endpoint detection of thin films during chemical/mechanical polishing planarization |
US6876454B1 (en) | 1995-03-28 | 2005-04-05 | Applied Materials, Inc. | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
US6994607B2 (en) | 2001-12-28 | 2006-02-07 | Applied Materials, Inc. | Polishing pad with window |
US7001242B2 (en) | 2002-02-06 | 2006-02-21 | Applied Materials, Inc. | Method and apparatus of eddy current monitoring for chemical mechanical polishing |
US7011565B2 (en) | 1995-03-28 | 2006-03-14 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
US7037403B1 (en) | 1992-12-28 | 2006-05-02 | Applied Materials Inc. | In-situ real-time monitoring technique and apparatus for detection of thin films during chemical/mechanical polishing planarization |
US7118457B2 (en) | 2000-05-19 | 2006-10-10 | Applied Materials, Inc. | Method of forming a polishing pad for endpoint detection |
US7677959B2 (en) | 1999-09-14 | 2010-03-16 | Applied Materials, Inc. | Multilayer polishing pad and method of making |
US7731566B2 (en) | 1995-03-28 | 2010-06-08 | Applied Materials, Inc. | Substrate polishing metrology using interference signals |
CN110752169A (en) * | 2019-10-21 | 2020-02-04 | 西安奕斯伟硅片技术有限公司 | Wafer processing device and loading and unloading method |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5190095A (en) * | 1975-02-05 | 1976-08-06 |
-
1981
- 1981-02-16 JP JP56020201A patent/JPS57138575A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5190095A (en) * | 1975-02-05 | 1976-08-06 |
Cited By (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6133857A (en) * | 1984-07-27 | 1986-02-17 | Matsushita Electric Ind Co Ltd | Accurate polishing device |
US6077452A (en) * | 1992-09-17 | 2000-06-20 | Luxtron Corporation | Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment |
US6110752A (en) * | 1992-09-17 | 2000-08-29 | Luxtron Corporation | Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment |
US6849152B2 (en) | 1992-12-28 | 2005-02-01 | Applied Materials, Inc. | In-situ real-time monitoring technique and apparatus for endpoint detection of thin films during chemical/mechanical polishing planarization |
US7582183B2 (en) | 1992-12-28 | 2009-09-01 | Applied Materials, Inc. | Apparatus for detection of thin films during chemical/mechanical polishing planarization |
US7569119B2 (en) | 1992-12-28 | 2009-08-04 | Applied Materials, Inc. | In-situ real-time monitoring technique and apparatus for detection of thin films during chemical/mechanical polishing planarization |
US7037403B1 (en) | 1992-12-28 | 2006-05-02 | Applied Materials Inc. | In-situ real-time monitoring technique and apparatus for detection of thin films during chemical/mechanical polishing planarization |
US7024063B2 (en) | 1992-12-28 | 2006-04-04 | Applied Materials Inc. | In-situ real-time monitoring technique and apparatus for endpoint detection of thin films during chemical/mechanical polishing planarization |
US5433651A (en) * | 1993-12-22 | 1995-07-18 | International Business Machines Corporation | In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing |
US6875078B2 (en) | 1995-03-28 | 2005-04-05 | Applied Materials, Inc. | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
US8092274B2 (en) | 1995-03-28 | 2012-01-10 | Applied Materials, Inc. | Substrate polishing metrology using interference signals |
US6876454B1 (en) | 1995-03-28 | 2005-04-05 | Applied Materials, Inc. | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
US6719818B1 (en) | 1995-03-28 | 2004-04-13 | Applied Materials, Inc. | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
US8556679B2 (en) | 1995-03-28 | 2013-10-15 | Applied Materials, Inc. | Substrate polishing metrology using interference signals |
US8506356B2 (en) | 1995-03-28 | 2013-08-13 | Applied Materials, Inc. | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
US7011565B2 (en) | 1995-03-28 | 2006-03-14 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
US6676717B1 (en) | 1995-03-28 | 2004-01-13 | Applied Materials Inc | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
US6537133B1 (en) | 1995-03-28 | 2003-03-25 | Applied Materials, Inc. | Method for in-situ endpoint detection for chemical mechanical polishing operations |
US6860791B2 (en) | 1995-03-28 | 2005-03-01 | Applied Materials, Inc. | Polishing pad for in-situ endpoint detection |
US7118450B2 (en) | 1995-03-28 | 2006-10-10 | Applied Materials, Inc. | Polishing pad with window and method of fabricating a window in a polishing pad |
US7841926B2 (en) | 1995-03-28 | 2010-11-30 | Applied Materials, Inc. | Substrate polishing metrology using interference signals |
US7255629B2 (en) | 1995-03-28 | 2007-08-14 | Applied Materials, Inc. | Polishing assembly with a window |
US7775852B2 (en) | 1995-03-28 | 2010-08-17 | Applied Materials, Inc. | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
US7731566B2 (en) | 1995-03-28 | 2010-06-08 | Applied Materials, Inc. | Substrate polishing metrology using interference signals |
US5964643A (en) * | 1995-03-28 | 1999-10-12 | Applied Materials, Inc. | Apparatus and method for in-situ monitoring of chemical mechanical polishing operations |
US6342166B1 (en) | 1998-12-10 | 2002-01-29 | Nikon Corporation | Method of detecting end point of polishing of wafer and apparatus for detecting end point of polishing |
US7677959B2 (en) | 1999-09-14 | 2010-03-16 | Applied Materials, Inc. | Multilayer polishing pad and method of making |
US7429207B2 (en) | 2000-05-19 | 2008-09-30 | Applied Materials, Inc. | System for endpoint detection with polishing pad |
US7118457B2 (en) | 2000-05-19 | 2006-10-10 | Applied Materials, Inc. | Method of forming a polishing pad for endpoint detection |
US8485862B2 (en) | 2000-05-19 | 2013-07-16 | Applied Materials, Inc. | Polishing pad for endpoint detection and related methods |
US9333621B2 (en) | 2000-05-19 | 2016-05-10 | Applied Materials, Inc. | Polishing pad for endpoint detection and related methods |
US7198544B2 (en) | 2001-12-28 | 2007-04-03 | Applied Materials, Inc. | Polishing pad with window |
US6994607B2 (en) | 2001-12-28 | 2006-02-07 | Applied Materials, Inc. | Polishing pad with window |
US7591708B2 (en) | 2002-02-06 | 2009-09-22 | Applied Materials, Inc. | Method and apparatus of eddy current monitoring for chemical mechanical polishing |
US7374477B2 (en) | 2002-02-06 | 2008-05-20 | Applied Materials, Inc. | Polishing pads useful for endpoint detection in chemical mechanical polishing |
US7001242B2 (en) | 2002-02-06 | 2006-02-21 | Applied Materials, Inc. | Method and apparatus of eddy current monitoring for chemical mechanical polishing |
US8858298B2 (en) | 2002-07-24 | 2014-10-14 | Applied Materials, Inc. | Polishing pad with two-section window having recess |
CN110752169A (en) * | 2019-10-21 | 2020-02-04 | 西安奕斯伟硅片技术有限公司 | Wafer processing device and loading and unloading method |
Also Published As
Publication number | Publication date |
---|---|
JPS6211986B2 (en) | 1987-03-16 |
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