JPS5639433A - Method for measuring temperature pattern and its apparatus - Google Patents

Method for measuring temperature pattern and its apparatus

Info

Publication number
JPS5639433A
JPS5639433A JP11467179A JP11467179A JPS5639433A JP S5639433 A JPS5639433 A JP S5639433A JP 11467179 A JP11467179 A JP 11467179A JP 11467179 A JP11467179 A JP 11467179A JP S5639433 A JPS5639433 A JP S5639433A
Authority
JP
Japan
Prior art keywords
picture
filter
area
temperature pattern
affected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11467179A
Other languages
Japanese (ja)
Other versions
JPS6142807B2 (en
Inventor
Masao Tatsuwaki
Arata Nemoto
Seiichi Okuhara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHIGUMA DENSHI KOGYO KK
SIGMA DENSHI KOGYO KK
Nippon Steel Corp
Original Assignee
SHIGUMA DENSHI KOGYO KK
SIGMA DENSHI KOGYO KK
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHIGUMA DENSHI KOGYO KK, SIGMA DENSHI KOGYO KK, Sumitomo Metal Industries Ltd filed Critical SHIGUMA DENSHI KOGYO KK
Priority to JP11467179A priority Critical patent/JPS5639433A/en
Publication of JPS5639433A publication Critical patent/JPS5639433A/en
Publication of JPS6142807B2 publication Critical patent/JPS6142807B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/60—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

PURPOSE:To make possible a highly accurate and high resolving power measurement without being affected by a surrounding atmosphere by performing a two-color temperature operation per each area of a photographed picture through a filter consisted of a combination of two kinds of optical filter segments which can be allowed to transmit different wave components. CONSTITUTION:A filter 2 is made by combining optical filter segments, 21 and 22, which can transmit two kinds of wave length components respectively so that both may be adjacent to each other. A picture signal in the photograph apparatus 1 in accordance with an optical wave length from a measuring object W through the filter 2 is subjected to a two-color temperature operation by a arithmetic unit scanning the picture in an area formed by a set of the segment together with being stored in a memory 5 with a video signal treatment apparatus 4. As a result of the operation corresponding to each area of them, a temperature pattern having a combination of two-color thermometer and picture processing is determined, whereby it is possible to measure a temperature pattern having a high accuracy and a high resolving power without being affected by a surrounding atmosphere for an electric seam welded steel pipe or the like working in the humid or dusty atmosphere.
JP11467179A 1979-09-05 1979-09-05 Method for measuring temperature pattern and its apparatus Granted JPS5639433A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11467179A JPS5639433A (en) 1979-09-05 1979-09-05 Method for measuring temperature pattern and its apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11467179A JPS5639433A (en) 1979-09-05 1979-09-05 Method for measuring temperature pattern and its apparatus

Publications (2)

Publication Number Publication Date
JPS5639433A true JPS5639433A (en) 1981-04-15
JPS6142807B2 JPS6142807B2 (en) 1986-09-24

Family

ID=14643680

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11467179A Granted JPS5639433A (en) 1979-09-05 1979-09-05 Method for measuring temperature pattern and its apparatus

Country Status (1)

Country Link
JP (1) JPS5639433A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5777924A (en) * 1980-10-31 1982-05-15 Sumitomo Metal Ind Ltd Temperature pattern measuring apparatus
JPS60224034A (en) * 1984-04-23 1985-11-08 Hitachi Ltd Two-wavelength picture measuring device
JPS62129727A (en) * 1985-12-02 1987-06-12 Nippon Abionikusu Kk Radiation energy camera
US4854724A (en) * 1984-07-09 1989-08-08 Lockheed Corporation Method of and apparatus for thermographic evaluation of spot welds
US6758595B2 (en) * 2000-03-13 2004-07-06 Csem Centre Suisse D' Electronique Et De Microtechnique Sa Imaging pyrometer
WO2007089742A1 (en) * 2006-01-31 2007-08-09 Diamond Power International, Inc. Two-color flame imaging pyrometer
JP2010508534A (en) * 2006-11-04 2010-03-18 トルンプフ ヴェルクツォイクマシーネン ゲゼルシャフト ミット ベシュレンクテル ハフツング ウント コンパニー コマンディートゲゼルシャフト Method and apparatus for process monitoring during material processing
JP2011209272A (en) * 2010-03-30 2011-10-20 General Electric Co <Ge> Multi-spectral pyrometry imaging system
JP2019138715A (en) * 2018-02-08 2019-08-22 日本アビオニクス株式会社 Emissivity measuring device, temperature measuring device, method for measuring emissivity, and method for measuring temperature
JP2020038107A (en) * 2018-09-04 2020-03-12 株式会社三井フォトニクス Temperature measurement device

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5777924A (en) * 1980-10-31 1982-05-15 Sumitomo Metal Ind Ltd Temperature pattern measuring apparatus
JPS621203B2 (en) * 1980-10-31 1987-01-12 Sumitomo Kinzoku Kogyo Kk
JPS60224034A (en) * 1984-04-23 1985-11-08 Hitachi Ltd Two-wavelength picture measuring device
JPH0544611B2 (en) * 1984-04-23 1993-07-06 Hitachi Ltd
US4854724A (en) * 1984-07-09 1989-08-08 Lockheed Corporation Method of and apparatus for thermographic evaluation of spot welds
JPS62129727A (en) * 1985-12-02 1987-06-12 Nippon Abionikusu Kk Radiation energy camera
US6758595B2 (en) * 2000-03-13 2004-07-06 Csem Centre Suisse D' Electronique Et De Microtechnique Sa Imaging pyrometer
WO2007089742A1 (en) * 2006-01-31 2007-08-09 Diamond Power International, Inc. Two-color flame imaging pyrometer
JP2010508534A (en) * 2006-11-04 2010-03-18 トルンプフ ヴェルクツォイクマシーネン ゲゼルシャフト ミット ベシュレンクテル ハフツング ウント コンパニー コマンディートゲゼルシャフト Method and apparatus for process monitoring during material processing
US9089926B2 (en) 2006-11-04 2015-07-28 Trumpf Werkzeugmaschinen Gmbh + Co. Kg Process monitoring the processing of a material
JP2011209272A (en) * 2010-03-30 2011-10-20 General Electric Co <Ge> Multi-spectral pyrometry imaging system
JP2019138715A (en) * 2018-02-08 2019-08-22 日本アビオニクス株式会社 Emissivity measuring device, temperature measuring device, method for measuring emissivity, and method for measuring temperature
JP2020038107A (en) * 2018-09-04 2020-03-12 株式会社三井フォトニクス Temperature measurement device

Also Published As

Publication number Publication date
JPS6142807B2 (en) 1986-09-24

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