JPS5635738A - High-nickel high-hardness corrosion resistant alloy for electrically conductive roll - Google Patents

High-nickel high-hardness corrosion resistant alloy for electrically conductive roll

Info

Publication number
JPS5635738A
JPS5635738A JP11217379A JP11217379A JPS5635738A JP S5635738 A JPS5635738 A JP S5635738A JP 11217379 A JP11217379 A JP 11217379A JP 11217379 A JP11217379 A JP 11217379A JP S5635738 A JPS5635738 A JP S5635738A
Authority
JP
Japan
Prior art keywords
electrically conductive
conductive roll
alloy
corrosion resistant
resistant alloy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11217379A
Other languages
Japanese (ja)
Other versions
JPS6332856B2 (en
Inventor
Yoshiaki Yamagami
Arata Komitsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kubota Corp
Original Assignee
Kubota Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kubota Corp filed Critical Kubota Corp
Priority to JP11217379A priority Critical patent/JPS5635738A/en
Publication of JPS5635738A publication Critical patent/JPS5635738A/en
Publication of JPS6332856B2 publication Critical patent/JPS6332856B2/ja
Granted legal-status Critical Current

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  • Electroplating Methods And Accessories (AREA)

Abstract

PURPOSE: To obtain an Ni alloy for an electrically conductive roll with superior corrosion resistance, eletric conductivity, hardness and strength by adding Cr, Mo, W, V, B, etc. to an Ni-base alloy contg. a specified small amount of C, Si, Mn and Fe essential components.
CONSTITUTION: One or more among 0.1W5.0% Cr, 0.1W3.0% Mo, 0.1W2.0% W, 0.01W0.5% V and 0.002W1.0% B are added to an Ni-base alloy contg. 0.02W 0.5% C, 0.05W2.0% Si, 0.05W2.0% Mn and <1.5% Fe as essential components to obtain a high Ni alloy equal to pure Ni in corrosion resistance and electric conductivity as a material for an electrically conductive roll used in zinc electroplating, tin electroplating or other process. In addition, this alloy has superior hardness and strength.
COPYRIGHT: (C)1981,JPO&Japio
JP11217379A 1979-08-31 1979-08-31 High-nickel high-hardness corrosion resistant alloy for electrically conductive roll Granted JPS5635738A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11217379A JPS5635738A (en) 1979-08-31 1979-08-31 High-nickel high-hardness corrosion resistant alloy for electrically conductive roll

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11217379A JPS5635738A (en) 1979-08-31 1979-08-31 High-nickel high-hardness corrosion resistant alloy for electrically conductive roll

Publications (2)

Publication Number Publication Date
JPS5635738A true JPS5635738A (en) 1981-04-08
JPS6332856B2 JPS6332856B2 (en) 1988-07-01

Family

ID=14580070

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11217379A Granted JPS5635738A (en) 1979-08-31 1979-08-31 High-nickel high-hardness corrosion resistant alloy for electrically conductive roll

Country Status (1)

Country Link
JP (1) JPS5635738A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100471341B1 (en) * 1996-05-23 2005-07-21 제네시스 테크놀로지 가부시키가이샤 Contact Probe and Probe Device with It

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54112174A (en) * 1978-02-22 1979-09-01 Nec Corp Testing method for semiconductor device
JPS54112175A (en) * 1978-02-22 1979-09-01 Nec Corp High-frequency transistor testing equipment

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54112174A (en) * 1978-02-22 1979-09-01 Nec Corp Testing method for semiconductor device
JPS54112175A (en) * 1978-02-22 1979-09-01 Nec Corp High-frequency transistor testing equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100471341B1 (en) * 1996-05-23 2005-07-21 제네시스 테크놀로지 가부시키가이샤 Contact Probe and Probe Device with It

Also Published As

Publication number Publication date
JPS6332856B2 (en) 1988-07-01

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