JPS5613585A - Semiconductor memory circuit - Google Patents

Semiconductor memory circuit

Info

Publication number
JPS5613585A
JPS5613585A JP8812879A JP8812879A JPS5613585A JP S5613585 A JPS5613585 A JP S5613585A JP 8812879 A JP8812879 A JP 8812879A JP 8812879 A JP8812879 A JP 8812879A JP S5613585 A JPS5613585 A JP S5613585A
Authority
JP
Japan
Prior art keywords
circuit
write
information
comparing
control part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8812879A
Other languages
Japanese (ja)
Inventor
Youji Mukuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8812879A priority Critical patent/JPS5613585A/en
Publication of JPS5613585A publication Critical patent/JPS5613585A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/14—Error detection or correction of the data by redundancy in operation
    • G06F11/1497—Details of time redundant execution on a single processing unit

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

PURPOSE:To make it possible to malfunction detection easily and rapidly at a low cost by making it possible to a check output information and write information of a reading circuit while comparing and writing them. CONSTITUTION:In write operation, reading control part 12 and comparing circuit 13 are operated simultaneously together with write control part 11 and circuit 12 is used to make a check by comparing write information 14 to read information 15 obtained from control part 12 in the write operation. Consequently, a check on whether the write information has been stored in semiconductor memory part 17 correctly can be made over the write operation. In circuit 13 finds dissidence, an indication is made by display circuit 16.
JP8812879A 1979-07-13 1979-07-13 Semiconductor memory circuit Pending JPS5613585A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8812879A JPS5613585A (en) 1979-07-13 1979-07-13 Semiconductor memory circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8812879A JPS5613585A (en) 1979-07-13 1979-07-13 Semiconductor memory circuit

Publications (1)

Publication Number Publication Date
JPS5613585A true JPS5613585A (en) 1981-02-09

Family

ID=13934271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8812879A Pending JPS5613585A (en) 1979-07-13 1979-07-13 Semiconductor memory circuit

Country Status (1)

Country Link
JP (1) JPS5613585A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59185098A (en) * 1983-04-04 1984-10-20 Oki Electric Ind Co Ltd Semiconductor memory device incorporating self-diagnostic circuit
JPS59213097A (en) * 1983-05-18 1984-12-01 Hitachi Ltd Data processing device
JPS59229795A (en) * 1983-06-09 1984-12-24 Hitachi Ltd Memory device
JPS62109145A (en) * 1985-11-08 1987-05-20 Nec Corp Storage device
JPS63239545A (en) * 1987-03-27 1988-10-05 Toshiba Corp Memory error detecting circuit

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4964344A (en) * 1972-10-20 1974-06-21

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4964344A (en) * 1972-10-20 1974-06-21

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59185098A (en) * 1983-04-04 1984-10-20 Oki Electric Ind Co Ltd Semiconductor memory device incorporating self-diagnostic circuit
JPS6236317B2 (en) * 1983-04-04 1987-08-06 Oki Electric Ind Co Ltd
JPS59213097A (en) * 1983-05-18 1984-12-01 Hitachi Ltd Data processing device
JPS59229795A (en) * 1983-06-09 1984-12-24 Hitachi Ltd Memory device
JPS62109145A (en) * 1985-11-08 1987-05-20 Nec Corp Storage device
JPS63239545A (en) * 1987-03-27 1988-10-05 Toshiba Corp Memory error detecting circuit

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