JPS56132571A - Fine current measuring circuit - Google Patents

Fine current measuring circuit

Info

Publication number
JPS56132571A
JPS56132571A JP3596680A JP3596680A JPS56132571A JP S56132571 A JPS56132571 A JP S56132571A JP 3596680 A JP3596680 A JP 3596680A JP 3596680 A JP3596680 A JP 3596680A JP S56132571 A JPS56132571 A JP S56132571A
Authority
JP
Japan
Prior art keywords
current
input
measuring circuit
current measuring
fine current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3596680A
Other languages
Japanese (ja)
Inventor
Hirotaka Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP3596680A priority Critical patent/JPS56132571A/en
Publication of JPS56132571A publication Critical patent/JPS56132571A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0023Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

PURPOSE:To enable measurement of fine current at high accuracy by removing ripples completely with a subtractor provided at the rear stage of a current reading amplifier. CONSTITUTION:Current flowing through a CMOSFET is detected with a current reading amplifier 3 according to 1 level or phi level of a control signal. A detected waveform at the output point C is applied to one input of a subtractor 6 while to the other input thereof as a waveform D by way of a capacitor 5. Both the input signals undergoes an analog subtraction. Thus, only a true measured current is obtained an in the output.
JP3596680A 1980-03-21 1980-03-21 Fine current measuring circuit Pending JPS56132571A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3596680A JPS56132571A (en) 1980-03-21 1980-03-21 Fine current measuring circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3596680A JPS56132571A (en) 1980-03-21 1980-03-21 Fine current measuring circuit

Publications (1)

Publication Number Publication Date
JPS56132571A true JPS56132571A (en) 1981-10-16

Family

ID=12456683

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3596680A Pending JPS56132571A (en) 1980-03-21 1980-03-21 Fine current measuring circuit

Country Status (1)

Country Link
JP (1) JPS56132571A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60107769U (en) * 1983-12-27 1985-07-22 日本電気ホームエレクトロニクス株式会社 DC component measurement circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60107769U (en) * 1983-12-27 1985-07-22 日本電気ホームエレクトロニクス株式会社 DC component measurement circuit

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