JPS5570777A - Test circuit for electronic watch - Google Patents

Test circuit for electronic watch

Info

Publication number
JPS5570777A
JPS5570777A JP14479978A JP14479978A JPS5570777A JP S5570777 A JPS5570777 A JP S5570777A JP 14479978 A JP14479978 A JP 14479978A JP 14479978 A JP14479978 A JP 14479978A JP S5570777 A JPS5570777 A JP S5570777A
Authority
JP
Japan
Prior art keywords
inputted
external signal
test terminal
test
step motor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14479978A
Other languages
Japanese (ja)
Inventor
Kenichi Ono
Takashi Ishida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP14479978A priority Critical patent/JPS5570777A/en
Publication of JPS5570777A publication Critical patent/JPS5570777A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To make high speed the fast feed test, by electronically cutting off on the way of the frequency dividing stage and determining the step motor drive output with the signal inputted externally, at the test of watches.
CONSTITUTION: When nothing is connected to the test terminal T2, the transmission gates 1 and 2 are conductive, and the output a of the frequency divider 2 is delivered to the frequency dividing period 3 and the test terminal T1 as it is. When the test terminal T2 is at H level, the transmission gates 1, 2 are closed and the output a is not inputted to the frequency divider 3. With this state, when external signal is inputted to the test terminal T1, the signal inverting external signal is inputted to the C input of the flip-flop 4, and the pulse width of the external signal in frequency division 3 is made to a half the external signal and fed to the step motor drive unit 5 to perform fast feed for the step motor 6.
COPYRIGHT: (C)1980,JPO&Japio
JP14479978A 1978-11-22 1978-11-22 Test circuit for electronic watch Pending JPS5570777A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14479978A JPS5570777A (en) 1978-11-22 1978-11-22 Test circuit for electronic watch

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14479978A JPS5570777A (en) 1978-11-22 1978-11-22 Test circuit for electronic watch

Publications (1)

Publication Number Publication Date
JPS5570777A true JPS5570777A (en) 1980-05-28

Family

ID=15370721

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14479978A Pending JPS5570777A (en) 1978-11-22 1978-11-22 Test circuit for electronic watch

Country Status (1)

Country Link
JP (1) JPS5570777A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1980002880A1 (en) * 1979-06-19 1980-12-24 Fujitsu Ltd Integrated circuit having frequency divider circuit adaptable for high-speed testing
JPS58162886A (en) * 1982-03-23 1983-09-27 Seiko Instr & Electronics Ltd Electronic timepiece
JPS62116271A (en) * 1985-11-15 1987-05-27 Fujitsu Ltd Test circuit
WO2001006329A1 (en) * 1999-07-16 2001-01-25 Citizen Watch Co., Ltd. Time piece
CN106168751A (en) * 2015-05-18 2016-11-30 精工电子有限公司 Frequency dividing circuit, the control method of frequency dividing circuit and analog electronic clock

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1980002880A1 (en) * 1979-06-19 1980-12-24 Fujitsu Ltd Integrated circuit having frequency divider circuit adaptable for high-speed testing
JPS58162886A (en) * 1982-03-23 1983-09-27 Seiko Instr & Electronics Ltd Electronic timepiece
JPH0449672B2 (en) * 1982-03-23 1992-08-12 Seiko Instr & Electronics
JPS62116271A (en) * 1985-11-15 1987-05-27 Fujitsu Ltd Test circuit
JPH0644031B2 (en) * 1985-11-15 1994-06-08 富士通株式会社 Test circuit
WO2001006329A1 (en) * 1999-07-16 2001-01-25 Citizen Watch Co., Ltd. Time piece
US6751164B1 (en) 1999-07-16 2004-06-15 Citizen Watch Co., Ltd. Time piece
CN106168751A (en) * 2015-05-18 2016-11-30 精工电子有限公司 Frequency dividing circuit, the control method of frequency dividing circuit and analog electronic clock
JP2016217817A (en) * 2015-05-18 2016-12-22 セイコーインスツル株式会社 Frequency divider circuit, control method for frequency divider circuit, and analog electronic timepiece
CN106168751B (en) * 2015-05-18 2019-11-26 精工电子有限公司 Frequency dividing circuit, the control method of frequency dividing circuit and analog electronic clock

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