JPS5513588A - Sampling circuit - Google Patents

Sampling circuit

Info

Publication number
JPS5513588A
JPS5513588A JP8690878A JP8690878A JPS5513588A JP S5513588 A JPS5513588 A JP S5513588A JP 8690878 A JP8690878 A JP 8690878A JP 8690878 A JP8690878 A JP 8690878A JP S5513588 A JPS5513588 A JP S5513588A
Authority
JP
Japan
Prior art keywords
signals
input
inputted
input terminal
sampling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8690878A
Other languages
Japanese (ja)
Inventor
Katsura Ochi
Noboru Muranaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP8690878A priority Critical patent/JPS5513588A/en
Publication of JPS5513588A publication Critical patent/JPS5513588A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0038—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electronic Switches (AREA)

Abstract

PURPOSE:To obtain accurately and easily the relation among various kinds of analogue signal by sampling different input signals by timing signals which are formed by comparing one specific input signal of plural input signals with another input signal. CONSTITUTION:Fundamental signals for comparison are inputted to input terminal 3. Signals inputted to another input terminal 4 are amplified and are compared with signals inputted from input terminal 3; and when the level rate of these input signals reaches a fixed value, timing signals for sampling are outputted from comparator 8. Then, sample hold circuit 1 is operated by these timing signals, and signals inputted from input terminal 5 are sampled and outputted from output terminal 6. By sampling signals in this manner, the relation among various kinds of analogue signal having a complicated time change can be obtained accurately and easily.
JP8690878A 1978-07-17 1978-07-17 Sampling circuit Pending JPS5513588A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8690878A JPS5513588A (en) 1978-07-17 1978-07-17 Sampling circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8690878A JPS5513588A (en) 1978-07-17 1978-07-17 Sampling circuit

Publications (1)

Publication Number Publication Date
JPS5513588A true JPS5513588A (en) 1980-01-30

Family

ID=13899929

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8690878A Pending JPS5513588A (en) 1978-07-17 1978-07-17 Sampling circuit

Country Status (1)

Country Link
JP (1) JPS5513588A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009232184A (en) * 2008-03-24 2009-10-08 Nec Electronics Corp Semiconductor integrated circuit
CN102749489A (en) * 2011-04-20 2012-10-24 北京德威特继保自动化科技股份有限公司 Signal sampling device and method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828176A (en) * 1971-08-16 1973-04-13
JPS50110286A (en) * 1974-02-06 1975-08-30

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828176A (en) * 1971-08-16 1973-04-13
JPS50110286A (en) * 1974-02-06 1975-08-30

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009232184A (en) * 2008-03-24 2009-10-08 Nec Electronics Corp Semiconductor integrated circuit
CN102749489A (en) * 2011-04-20 2012-10-24 北京德威特继保自动化科技股份有限公司 Signal sampling device and method

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