JPS55113200A - Checking method for ic memory - Google Patents

Checking method for ic memory

Info

Publication number
JPS55113200A
JPS55113200A JP2041879A JP2041879A JPS55113200A JP S55113200 A JPS55113200 A JP S55113200A JP 2041879 A JP2041879 A JP 2041879A JP 2041879 A JP2041879 A JP 2041879A JP S55113200 A JPS55113200 A JP S55113200A
Authority
JP
Japan
Prior art keywords
defective
information
memory
test pattern
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2041879A
Other languages
Japanese (ja)
Other versions
JPS6141080B2 (en
Inventor
Atsushi Nigorikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP2041879A priority Critical patent/JPS55113200A/en
Publication of JPS55113200A publication Critical patent/JPS55113200A/en
Publication of JPS6141080B2 publication Critical patent/JPS6141080B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

PURPOSE: To improve the efficiency of defective analysis by storing position information about a defective memory cell together with a decision result using a test pattern.
CONSTITUTION: Address information from test pattern generator 1 is supplied to MUT10 and fail memory 11 in parallel and test pattern information is compared with the output of MUT10 to make decision 13. On the other hand, before a test pattern run, information in program counter 3 is compared 14 with the content of register 5 where the count position of counter 3 can be preset and when the both agree with each other, a synchronizing signal is generated. Only when a defective signal of decision circuit 13 and the synchronizing signal are generated at the same time, defective information is written in memory 11. The address of a defective cell can therefore be found by reading memory information in memory 11 during analysis. Thus, the efficiency of defective analysis can be improved.
COPYRIGHT: (C)1980,JPO&Japio
JP2041879A 1979-02-22 1979-02-22 Checking method for ic memory Granted JPS55113200A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2041879A JPS55113200A (en) 1979-02-22 1979-02-22 Checking method for ic memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2041879A JPS55113200A (en) 1979-02-22 1979-02-22 Checking method for ic memory

Publications (2)

Publication Number Publication Date
JPS55113200A true JPS55113200A (en) 1980-09-01
JPS6141080B2 JPS6141080B2 (en) 1986-09-12

Family

ID=12026478

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2041879A Granted JPS55113200A (en) 1979-02-22 1979-02-22 Checking method for ic memory

Country Status (1)

Country Link
JP (1) JPS55113200A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57164497A (en) * 1981-03-31 1982-10-09 Toshiba Corp Controlling device of address fail memory
JPS6050698A (en) * 1983-08-26 1985-03-20 Mitsubishi Electric Corp Semiconductor testing device
JPS60106100A (en) * 1983-11-15 1985-06-11 Fujitsu Ltd Testing system of semiconductor memory
US5317573A (en) * 1989-08-30 1994-05-31 International Business Machines Corporation Apparatus and method for real time data error capture and compression redundancy analysis
JP2007172778A (en) * 2005-12-26 2007-07-05 Nec Electronics Corp Memory test circuit and memory test method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57164497A (en) * 1981-03-31 1982-10-09 Toshiba Corp Controlling device of address fail memory
JPS6232559B2 (en) * 1981-03-31 1987-07-15 Tokyo Shibaura Electric Co
JPS6050698A (en) * 1983-08-26 1985-03-20 Mitsubishi Electric Corp Semiconductor testing device
JPS60106100A (en) * 1983-11-15 1985-06-11 Fujitsu Ltd Testing system of semiconductor memory
US5317573A (en) * 1989-08-30 1994-05-31 International Business Machines Corporation Apparatus and method for real time data error capture and compression redundancy analysis
JP2007172778A (en) * 2005-12-26 2007-07-05 Nec Electronics Corp Memory test circuit and memory test method

Also Published As

Publication number Publication date
JPS6141080B2 (en) 1986-09-12

Similar Documents

Publication Publication Date Title
JPS55105897A (en) Memory device
JPS55113200A (en) Checking method for ic memory
JPS55163697A (en) Memory device
JPS5651678A (en) Testing method for memory element and pattern generator for test
JPS5693193A (en) Ic memory test device
JPS5320823A (en) Memory unit test system
JPS5654698A (en) Test method of memory device
JPS54161238A (en) Testing method for magnetic bubble memory
JPS5472924A (en) Semiconductor memory inspection equipment
JPS56107400A (en) Memory test device
JPS57130295A (en) Inspecting device for ic memory
JPS5452946A (en) Semiconductor element
JPS54139350A (en) Package testing system
JPS5673354A (en) Testing device for ic
JPS5379329A (en) Test method of memory circuit
JPS5624624A (en) Logic tracer
JPS53104135A (en) Timing test unit
JPS5690271A (en) Testing method for logic device
JPS5698796A (en) High-speed memory test system
JPS5640955A (en) Action checking system
JPS55138666A (en) Ic testing apparatus
JPS5673363A (en) Testing device of ic
JPS5384437A (en) Control system for test pattern generation
JPS5453839A (en) Magnetic bubble memory
JPS55902A (en) Testing equipment for control system