JPS5492789A - Gas analytical method by infrared ray - Google Patents

Gas analytical method by infrared ray

Info

Publication number
JPS5492789A
JPS5492789A JP16032477A JP16032477A JPS5492789A JP S5492789 A JPS5492789 A JP S5492789A JP 16032477 A JP16032477 A JP 16032477A JP 16032477 A JP16032477 A JP 16032477A JP S5492789 A JPS5492789 A JP S5492789A
Authority
JP
Japan
Prior art keywords
mirror
flux
space
horizontal direction
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16032477A
Other languages
Japanese (ja)
Inventor
Kouji Shinohara
Mitsuo Yoshikawa
Michiharu Ito
Masaru Koseto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP16032477A priority Critical patent/JPS5492789A/en
Publication of JPS5492789A publication Critical patent/JPS5492789A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To realize easily observation and analysis of harmful gases causing air pollution which exists in the multidirectional space, by controlling and moving only the lightweight plain reflecting mirror and its supporting frame in the horizontal or vertical direction. CONSTITUTION:The laser beam from a semiconductor laser 1 passes through a condenser lens 2, semi-transparent mirror 3, and concave mirror 4, and rises upward perpendicularly as parallel luminous flux. The laser flux is deflected by a plain reflecting mirror 8, and is reflected by a recurrent reflector 5 placed in a specified device in the horizontal direction. The optical axis is bend by a mirror 3 through mirrors 8, 4, and the laser flux enters a photoelectric transducer 6. The mirror 8 is supported so as to be free to turn in the horizontal direction with respect to the perpendicular optical axis A and to be capable of projecting the flux in the vertical vertical direction B. After observation and analysis of the gas being measured 7 which exists in the space in the horizontal direction to the reflector 5, the mirror 8 is directed towards recurrent reflectors 5', 5'' provided in other specified device, and gased 7', 7'' existing in the space to these reflectors 5', 5'' are observed and measured.
JP16032477A 1977-12-29 1977-12-29 Gas analytical method by infrared ray Pending JPS5492789A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16032477A JPS5492789A (en) 1977-12-29 1977-12-29 Gas analytical method by infrared ray

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16032477A JPS5492789A (en) 1977-12-29 1977-12-29 Gas analytical method by infrared ray

Publications (1)

Publication Number Publication Date
JPS5492789A true JPS5492789A (en) 1979-07-23

Family

ID=15712490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16032477A Pending JPS5492789A (en) 1977-12-29 1977-12-29 Gas analytical method by infrared ray

Country Status (1)

Country Link
JP (1) JPS5492789A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5649940A (en) * 1979-09-05 1981-05-06 Ici Ltd Laser scanner for remoteecontrolled monitoring of gas
JPS56147034A (en) * 1980-04-17 1981-11-14 Tokyo Electric Power Co Inc:The Gas leakage detector
JPH01160358U (en) * 1988-04-27 1989-11-07
JPH01309821A (en) * 1988-02-03 1989-12-14 Kanzaki Kokyukoki Mfg Co Ltd Axle driving device
JP2001521146A (en) * 1997-10-21 2001-11-06 トラスティーズ オブ プリンストン ユニバーシティ Optical Resonator for Cavity Ring-Down Spectroscopy Using Prism Retroreflector
JP2008513756A (en) * 2004-09-14 2008-05-01 ヴァイサラ オーワイジェー Gas content measuring apparatus and method
JP2018521330A (en) * 2015-06-11 2018-08-02 ネオ モニターズ アクティーゼルスカブＮｅｏ Ｍｏｎｉｔｏｒｓ Ａｓ Gas monitoring device
JP2019135471A (en) * 2018-02-05 2019-08-15 東京瓦斯株式会社 Gas detection system and gas detection method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49106875A (en) * 1973-01-23 1974-10-09

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49106875A (en) * 1973-01-23 1974-10-09

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5649940A (en) * 1979-09-05 1981-05-06 Ici Ltd Laser scanner for remoteecontrolled monitoring of gas
JPS56147034A (en) * 1980-04-17 1981-11-14 Tokyo Electric Power Co Inc:The Gas leakage detector
JPH01309821A (en) * 1988-02-03 1989-12-14 Kanzaki Kokyukoki Mfg Co Ltd Axle driving device
JPH01160358U (en) * 1988-04-27 1989-11-07
JP2001521146A (en) * 1997-10-21 2001-11-06 トラスティーズ オブ プリンストン ユニバーシティ Optical Resonator for Cavity Ring-Down Spectroscopy Using Prism Retroreflector
JP2008513756A (en) * 2004-09-14 2008-05-01 ヴァイサラ オーワイジェー Gas content measuring apparatus and method
JP4807803B2 (en) * 2004-09-14 2011-11-02 シック マイアク ゲーエムベーハー Gas content measuring apparatus and method
JP2018521330A (en) * 2015-06-11 2018-08-02 ネオ モニターズ アクティーゼルスカブＮｅｏ Ｍｏｎｉｔｏｒｓ Ａｓ Gas monitoring device
JP2019135471A (en) * 2018-02-05 2019-08-15 東京瓦斯株式会社 Gas detection system and gas detection method

Similar Documents

Publication Publication Date Title
US5115677A (en) Methods and devices for determining the contact angle of a drop of liquid placed on a substrate
WO1993006467A3 (en) Glass inspection method and device
FI892331A (en) MAETNING AV KURVATUR I ETT GENOMSYNLIGT ELLER GENOMSKINLIGT MATERIAL.
JPS5492789A (en) Gas analytical method by infrared ray
FR2552896B1 (en) MIXED APPARATUS FOR PROJECTION AND BACKPROJECTION OF SLIDES
CA2059070A1 (en) Test tube for biological analyses, provided with a device for checking efficiency and position, for photometric readings
US4147433A (en) Contour inspection
JPS5674219A (en) Three-dimensional display device
ATE107785T1 (en) PASSIVE INFRARED MOTION DETECTOR.
US3988059A (en) Projector
JPS5633572A (en) Optical rader device
SU1099097A1 (en) Scanning interferometer
GB825638A (en) Improvements relating to lighting apparatus
CN210604373U (en) Low-range sulfur dioxide measuring cell
JPS56145330A (en) Measuring device for light-scattering particulate
JPH0219707Y2 (en)
SU494720A1 (en) Spatial Angle Scanning System
JPS57178134A (en) Specular surface defect observing device
JPS6488309A (en) Collimator
SU1695207A1 (en) Dew-cell-point hydrometer
RU2047088C1 (en) Device for measurement of curvature radius of polished semiconductor plates
JPS55141657A (en) Surface inspecting apparatus
KIMIO et al. Scanning optical system by semiconductor laser beam
JPS5473065A (en) Interferometer
JPS54133180A (en) Reflectance measuring apparatus