JPS54130152A - Micrometer - Google Patents

Micrometer

Info

Publication number
JPS54130152A
JPS54130152A JP3769878A JP3769878A JPS54130152A JP S54130152 A JPS54130152 A JP S54130152A JP 3769878 A JP3769878 A JP 3769878A JP 3769878 A JP3769878 A JP 3769878A JP S54130152 A JPS54130152 A JP S54130152A
Authority
JP
Japan
Prior art keywords
spindle
vernier
main scale
moved
scale
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3769878A
Other languages
Japanese (ja)
Inventor
Mitsugi Nakayama
Yoshio Katsuta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP3769878A priority Critical patent/JPS54130152A/en
Publication of JPS54130152A publication Critical patent/JPS54130152A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length-Measuring Instruments Using Mechanical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

PURPOSE: To obtain a digital micrometer of a small size and good operating characteristic by contacting an engaging member of a spindle and feed nut and a guide member parallel to the spindle at two points and defining the turning direction of the spindle.
CONSTITUTION: When a knob 8 is rotated, the multithread screw applied to a feed shaft 7 turns and a feed nut 10 moves in the axial direction, causing a spindle 2 supported to a scale holder 11 to be moved by a lift arm 13. The measuring object is then inserted into the gap 36 between the spindle and an anvil 3. At this time, the main scale 25 is moved with respect to the vernier 26 along a guide bar 5 by the spindle 2 and the parallel rays radiated from a light emitting element 19 via lens 22 transmit through the main scale 25. The transmitted light reaches photo detectors 34, 35 via the vernier 26, and the electrical outputs corresponding to the relative displacement quantity between the main scale 25 and vernier 26 are obtained thereby and may therefore be digitally displayed by a suitable display device.
COPYRIGHT: (C)1979,JPO&Japio
JP3769878A 1978-03-31 1978-03-31 Micrometer Pending JPS54130152A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3769878A JPS54130152A (en) 1978-03-31 1978-03-31 Micrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3769878A JPS54130152A (en) 1978-03-31 1978-03-31 Micrometer

Publications (1)

Publication Number Publication Date
JPS54130152A true JPS54130152A (en) 1979-10-09

Family

ID=12504752

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3769878A Pending JPS54130152A (en) 1978-03-31 1978-03-31 Micrometer

Country Status (1)

Country Link
JP (1) JPS54130152A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004109223A1 (en) * 2003-06-09 2004-12-16 Mitutoyo Corporation Measuring instrument
EP1746382A2 (en) 2005-07-22 2007-01-24 Mitutoyo Corporation Measurement instrument

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004109223A1 (en) * 2003-06-09 2004-12-16 Mitutoyo Corporation Measuring instrument
US7043852B2 (en) 2003-06-09 2006-05-16 Mitutoyo Corporation Measuring instrument
JPWO2004109223A1 (en) * 2003-06-09 2006-07-20 株式会社ミツトヨ Measuring instrument
JP4533314B2 (en) * 2003-06-09 2010-09-01 株式会社ミツトヨ Measuring instrument
EP1746382A2 (en) 2005-07-22 2007-01-24 Mitutoyo Corporation Measurement instrument
US7321231B2 (en) 2005-07-22 2008-01-22 Mitutoyo Corporation Measurement instrument

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