JPS5342762A - Radiation measuring apparatus - Google Patents
Radiation measuring apparatusInfo
- Publication number
- JPS5342762A JPS5342762A JP11697176A JP11697176A JPS5342762A JP S5342762 A JPS5342762 A JP S5342762A JP 11697176 A JP11697176 A JP 11697176A JP 11697176 A JP11697176 A JP 11697176A JP S5342762 A JPS5342762 A JP S5342762A
- Authority
- JP
- Japan
- Prior art keywords
- measuring apparatus
- radiation measuring
- measuring head
- distance
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To make possible on-line measuring of plating thickness, etc. at high accuracy by providing a distance detector integrally with a measuring head, detecting the distance between the specimen and the measuring head in a contactless system and correcting variation.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11697176A JPS5342762A (en) | 1976-09-29 | 1976-09-29 | Radiation measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11697176A JPS5342762A (en) | 1976-09-29 | 1976-09-29 | Radiation measuring apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5342762A true JPS5342762A (en) | 1978-04-18 |
Family
ID=14700277
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11697176A Pending JPS5342762A (en) | 1976-09-29 | 1976-09-29 | Radiation measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5342762A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5618146U (en) * | 1979-07-13 | 1981-02-17 | ||
JPS5692436A (en) * | 1979-12-27 | 1981-07-27 | Kawasaki Steel Corp | Measuring method and device for alloyed degree of plated plate due to fluorescent radiation |
DE3016458A1 (en) * | 1980-04-29 | 1981-11-19 | Robert Bosch Gmbh, 7000 Stuttgart | Coating thickness of article measured immediately after application - by radiometric thickness method and used to regulate coating apparatus |
JPS587507A (en) * | 1981-07-07 | 1983-01-17 | Fuji Electric Co Ltd | Thickness gage |
JPS5920806A (en) * | 1982-05-17 | 1984-02-02 | メジヤレツクス・コ−ポレ−シヨン | Method and device for measuring sheet-shaped material |
JPS5977308A (en) * | 1982-10-25 | 1984-05-02 | Seiko Instr & Electronics Ltd | Fluorescent x-ray film thickness measuring device |
JP2013011537A (en) * | 2011-06-30 | 2013-01-17 | Rigaku Corp | Fluorescent x-ray analyzing apparatus |
-
1976
- 1976-09-29 JP JP11697176A patent/JPS5342762A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5618146U (en) * | 1979-07-13 | 1981-02-17 | ||
JPS5692436A (en) * | 1979-12-27 | 1981-07-27 | Kawasaki Steel Corp | Measuring method and device for alloyed degree of plated plate due to fluorescent radiation |
DE3016458A1 (en) * | 1980-04-29 | 1981-11-19 | Robert Bosch Gmbh, 7000 Stuttgart | Coating thickness of article measured immediately after application - by radiometric thickness method and used to regulate coating apparatus |
JPS587507A (en) * | 1981-07-07 | 1983-01-17 | Fuji Electric Co Ltd | Thickness gage |
JPS5920806A (en) * | 1982-05-17 | 1984-02-02 | メジヤレツクス・コ−ポレ−シヨン | Method and device for measuring sheet-shaped material |
JPS5977308A (en) * | 1982-10-25 | 1984-05-02 | Seiko Instr & Electronics Ltd | Fluorescent x-ray film thickness measuring device |
JP2013011537A (en) * | 2011-06-30 | 2013-01-17 | Rigaku Corp | Fluorescent x-ray analyzing apparatus |
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