JPS5342762A - Radiation measuring apparatus - Google Patents

Radiation measuring apparatus

Info

Publication number
JPS5342762A
JPS5342762A JP11697176A JP11697176A JPS5342762A JP S5342762 A JPS5342762 A JP S5342762A JP 11697176 A JP11697176 A JP 11697176A JP 11697176 A JP11697176 A JP 11697176A JP S5342762 A JPS5342762 A JP S5342762A
Authority
JP
Japan
Prior art keywords
measuring apparatus
radiation measuring
measuring head
distance
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11697176A
Other languages
Japanese (ja)
Inventor
Masato Toyoda
Yoshio Uto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP11697176A priority Critical patent/JPS5342762A/en
Publication of JPS5342762A publication Critical patent/JPS5342762A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To make possible on-line measuring of plating thickness, etc. at high accuracy by providing a distance detector integrally with a measuring head, detecting the distance between the specimen and the measuring head in a contactless system and correcting variation.
COPYRIGHT: (C)1978,JPO&Japio
JP11697176A 1976-09-29 1976-09-29 Radiation measuring apparatus Pending JPS5342762A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11697176A JPS5342762A (en) 1976-09-29 1976-09-29 Radiation measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11697176A JPS5342762A (en) 1976-09-29 1976-09-29 Radiation measuring apparatus

Publications (1)

Publication Number Publication Date
JPS5342762A true JPS5342762A (en) 1978-04-18

Family

ID=14700277

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11697176A Pending JPS5342762A (en) 1976-09-29 1976-09-29 Radiation measuring apparatus

Country Status (1)

Country Link
JP (1) JPS5342762A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5618146U (en) * 1979-07-13 1981-02-17
JPS5692436A (en) * 1979-12-27 1981-07-27 Kawasaki Steel Corp Measuring method and device for alloyed degree of plated plate due to fluorescent radiation
DE3016458A1 (en) * 1980-04-29 1981-11-19 Robert Bosch Gmbh, 7000 Stuttgart Coating thickness of article measured immediately after application - by radiometric thickness method and used to regulate coating apparatus
JPS587507A (en) * 1981-07-07 1983-01-17 Fuji Electric Co Ltd Thickness gage
JPS5920806A (en) * 1982-05-17 1984-02-02 メジヤレツクス・コ−ポレ−シヨン Method and device for measuring sheet-shaped material
JPS5977308A (en) * 1982-10-25 1984-05-02 Seiko Instr & Electronics Ltd Fluorescent x-ray film thickness measuring device
JP2013011537A (en) * 2011-06-30 2013-01-17 Rigaku Corp Fluorescent x-ray analyzing apparatus

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5618146U (en) * 1979-07-13 1981-02-17
JPS5692436A (en) * 1979-12-27 1981-07-27 Kawasaki Steel Corp Measuring method and device for alloyed degree of plated plate due to fluorescent radiation
DE3016458A1 (en) * 1980-04-29 1981-11-19 Robert Bosch Gmbh, 7000 Stuttgart Coating thickness of article measured immediately after application - by radiometric thickness method and used to regulate coating apparatus
JPS587507A (en) * 1981-07-07 1983-01-17 Fuji Electric Co Ltd Thickness gage
JPS5920806A (en) * 1982-05-17 1984-02-02 メジヤレツクス・コ−ポレ−シヨン Method and device for measuring sheet-shaped material
JPS5977308A (en) * 1982-10-25 1984-05-02 Seiko Instr & Electronics Ltd Fluorescent x-ray film thickness measuring device
JP2013011537A (en) * 2011-06-30 2013-01-17 Rigaku Corp Fluorescent x-ray analyzing apparatus

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