JPS53142259A - Threshold condition testing system - Google Patents
Threshold condition testing systemInfo
- Publication number
- JPS53142259A JPS53142259A JP5646777A JP5646777A JPS53142259A JP S53142259 A JPS53142259 A JP S53142259A JP 5646777 A JP5646777 A JP 5646777A JP 5646777 A JP5646777 A JP 5646777A JP S53142259 A JPS53142259 A JP S53142259A
- Authority
- JP
- Japan
- Prior art keywords
- threshold condition
- testing system
- condition testing
- ease
- cpu
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To automatically make out and record test hysteresis including fail information of every apparatus being tested with ease and accuracy by making out threshold condition chart assigned through CPU, etc. in performing program processing.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5646777A JPS53142259A (en) | 1977-05-18 | 1977-05-18 | Threshold condition testing system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5646777A JPS53142259A (en) | 1977-05-18 | 1977-05-18 | Threshold condition testing system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS53142259A true JPS53142259A (en) | 1978-12-11 |
Family
ID=13027900
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5646777A Pending JPS53142259A (en) | 1977-05-18 | 1977-05-18 | Threshold condition testing system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS53142259A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59127158A (en) * | 1983-01-12 | 1984-07-21 | Hitachi Electronics Eng Co Ltd | Selection test device of mpu element |
JPS61165670A (en) * | 1985-01-18 | 1986-07-26 | Clarion Co Ltd | Automatic reliability testing system |
JPS61147979U (en) * | 1985-03-05 | 1986-09-12 |
-
1977
- 1977-05-18 JP JP5646777A patent/JPS53142259A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59127158A (en) * | 1983-01-12 | 1984-07-21 | Hitachi Electronics Eng Co Ltd | Selection test device of mpu element |
JPS61165670A (en) * | 1985-01-18 | 1986-07-26 | Clarion Co Ltd | Automatic reliability testing system |
JPS61147979U (en) * | 1985-03-05 | 1986-09-12 |
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