JPS53142259A - Threshold condition testing system - Google Patents

Threshold condition testing system

Info

Publication number
JPS53142259A
JPS53142259A JP5646777A JP5646777A JPS53142259A JP S53142259 A JPS53142259 A JP S53142259A JP 5646777 A JP5646777 A JP 5646777A JP 5646777 A JP5646777 A JP 5646777A JP S53142259 A JPS53142259 A JP S53142259A
Authority
JP
Japan
Prior art keywords
threshold condition
testing system
condition testing
ease
cpu
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5646777A
Other languages
Japanese (ja)
Inventor
Yoshiaki Nakajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5646777A priority Critical patent/JPS53142259A/en
Publication of JPS53142259A publication Critical patent/JPS53142259A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To automatically make out and record test hysteresis including fail information of every apparatus being tested with ease and accuracy by making out threshold condition chart assigned through CPU, etc. in performing program processing.
COPYRIGHT: (C)1978,JPO&Japio
JP5646777A 1977-05-18 1977-05-18 Threshold condition testing system Pending JPS53142259A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5646777A JPS53142259A (en) 1977-05-18 1977-05-18 Threshold condition testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5646777A JPS53142259A (en) 1977-05-18 1977-05-18 Threshold condition testing system

Publications (1)

Publication Number Publication Date
JPS53142259A true JPS53142259A (en) 1978-12-11

Family

ID=13027900

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5646777A Pending JPS53142259A (en) 1977-05-18 1977-05-18 Threshold condition testing system

Country Status (1)

Country Link
JP (1) JPS53142259A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59127158A (en) * 1983-01-12 1984-07-21 Hitachi Electronics Eng Co Ltd Selection test device of mpu element
JPS61165670A (en) * 1985-01-18 1986-07-26 Clarion Co Ltd Automatic reliability testing system
JPS61147979U (en) * 1985-03-05 1986-09-12

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59127158A (en) * 1983-01-12 1984-07-21 Hitachi Electronics Eng Co Ltd Selection test device of mpu element
JPS61165670A (en) * 1985-01-18 1986-07-26 Clarion Co Ltd Automatic reliability testing system
JPS61147979U (en) * 1985-03-05 1986-09-12

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