JPS53124984A - Burn-in system - Google Patents
Burn-in systemInfo
- Publication number
- JPS53124984A JPS53124984A JP3983377A JP3983377A JPS53124984A JP S53124984 A JPS53124984 A JP S53124984A JP 3983377 A JP3983377 A JP 3983377A JP 3983377 A JP3983377 A JP 3983377A JP S53124984 A JPS53124984 A JP S53124984A
- Authority
- JP
- Japan
- Prior art keywords
- changing
- burn
- contents
- simply
- memory elements
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To enhance versatility without changing hardware by drawing out timing signals required for different grades simply through changing the contents of memory elements.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3983377A JPS53124984A (en) | 1977-04-07 | 1977-04-07 | Burn-in system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3983377A JPS53124984A (en) | 1977-04-07 | 1977-04-07 | Burn-in system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS53124984A true JPS53124984A (en) | 1978-10-31 |
Family
ID=12563962
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3983377A Pending JPS53124984A (en) | 1977-04-07 | 1977-04-07 | Burn-in system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS53124984A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57157164A (en) * | 1981-03-25 | 1982-09-28 | Nippon Telegr & Teleph Corp <Ntt> | Testing method for reliability in thermo-acceleration of integrated circuit |
JPS57203976A (en) * | 1981-05-15 | 1982-12-14 | Thomson Csf | System selecting high-reliability integrated circuit |
-
1977
- 1977-04-07 JP JP3983377A patent/JPS53124984A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57157164A (en) * | 1981-03-25 | 1982-09-28 | Nippon Telegr & Teleph Corp <Ntt> | Testing method for reliability in thermo-acceleration of integrated circuit |
JPS57203976A (en) * | 1981-05-15 | 1982-12-14 | Thomson Csf | System selecting high-reliability integrated circuit |
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