JPS53112772A - Probe for measuring apparatus - Google Patents

Probe for measuring apparatus

Info

Publication number
JPS53112772A
JPS53112772A JP477378A JP477378A JPS53112772A JP S53112772 A JPS53112772 A JP S53112772A JP 477378 A JP477378 A JP 477378A JP 477378 A JP477378 A JP 477378A JP S53112772 A JPS53112772 A JP S53112772A
Authority
JP
Japan
Prior art keywords
probe
measuring apparatus
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP477378A
Other languages
Japanese (ja)
Other versions
JPS5825202B2 (en
Inventor
Robaatsu Matsukumaat Debitsuto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rolls Royce PLC
Renishaw Electrical Ltd
Original Assignee
Rolls Royce PLC
Renishaw Electrical Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rolls Royce PLC, Renishaw Electrical Ltd filed Critical Rolls Royce PLC
Publication of JPS53112772A publication Critical patent/JPS53112772A/en
Publication of JPS5825202B2 publication Critical patent/JPS5825202B2/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G01B7/012Contact-making feeler heads therefor
JP53004773A 1977-01-20 1978-01-19 Probe for measuring equipment Expired JPS5825202B2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2255/77A GB1593682A (en) 1977-01-20 1977-01-20 Probe for use in mearusing apparatus

Publications (2)

Publication Number Publication Date
JPS53112772A true JPS53112772A (en) 1978-10-02
JPS5825202B2 JPS5825202B2 (en) 1983-05-26

Family

ID=9736338

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53004773A Expired JPS5825202B2 (en) 1977-01-20 1978-01-19 Probe for measuring equipment

Country Status (8)

Country Link
US (1) US4138823A (en)
JP (1) JPS5825202B2 (en)
CH (1) CH617617A5 (en)
DE (1) DE2801656C3 (en)
FR (1) FR2378259A1 (en)
GB (1) GB1593682A (en)
IT (2) IT1158443B (en)
SE (1) SE422996B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5834004U (en) * 1981-08-31 1983-03-05 株式会社ミツトヨ touch signal probe
JPS5948609A (en) * 1982-08-12 1984-03-19 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング Multiple coordinate detecting head

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2712181C3 (en) * 1977-03-19 1981-01-22 Fa. Carl Zeiss, 7920 Heidenheim Touch probe
SE406228B (en) * 1977-09-20 1979-01-29 Johansson Ab C E DOCTORS INTENDED FOR CONTROL SATURATION OF SURFACES
JPS5920642Y2 (en) * 1979-08-28 1984-06-15 株式会社 三豊製作所 touch signal probe
DE2947394A1 (en) * 1979-11-24 1981-05-27 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar DEVICE FOR MEASURING VALUES ON TEST UNITS
US4364179A (en) * 1980-10-31 1982-12-21 Portage Machine Company Statically balanced inspection probe assembly
JPS57152663A (en) * 1981-03-18 1982-09-21 Mitsubishi Electric Corp Micro-wave electric-discharge light source device
DE3378279D1 (en) * 1982-03-05 1988-11-24 Sony Magnescale Inc Apparatus for determining the location of the surface of a solid object
DE3234851C2 (en) * 1982-09-21 1985-11-14 Mauser-Werke Oberndorf Gmbh, 7238 Oberndorf Dynamic probe head
DE3246252A1 (en) * 1982-11-05 1984-06-28 Traub Gmbh, 7313 Reichenbach Measuring plunger
DE3325287C2 (en) * 1983-07-13 1985-07-25 Fried. Krupp Gmbh, 4300 Essen Arrangement for registering a contact between a probe and an object
IT1168698B (en) * 1983-11-21 1987-05-20 Finike Italiana Marposs HEAD FOR THE CONTROL OF LINEAR DIMENSIONS
US4523063A (en) * 1983-12-05 1985-06-11 Gte Valeron Corporation Touch probe having nonconductive contact carriers
US4553001A (en) * 1983-12-05 1985-11-12 Gte Valeron Corporation Touch probe having nonconductive contact carriers
US4786769A (en) * 1985-03-06 1988-11-22 Process Equipment Company Safety coupling device for robotic tooling
DE3604526A1 (en) * 1986-02-13 1987-08-20 Kurt Kern Gmbh & Co Kg Device for spatially scanning objects
US4780961A (en) * 1986-11-10 1988-11-01 Shelton Russell S Probe assembly and circuit for measuring machine
CH672370A5 (en) * 1987-09-15 1989-11-15 Tesa Sa
GB9004117D0 (en) * 1990-02-23 1990-04-18 Renishaw Plc Touch probe
US5491904A (en) * 1990-02-23 1996-02-20 Mcmurtry; David R. Touch probe
US5253428A (en) * 1990-02-23 1993-10-19 Renishaw Plc Touch probe
EP0465743A1 (en) * 1990-07-12 1992-01-15 British Aerospace Public Limited Company Teach and report probe for a robot arm
DE4209829A1 (en) * 1992-03-26 1993-09-30 Max Hobe Precision coupling for use in a probe of a measuring device
DE19517215C1 (en) * 1995-05-11 1997-02-06 Heidenhain Gmbh Dr Johannes Multi-coordinate probe
US5657549A (en) * 1995-10-04 1997-08-19 Shen; Yin-Lin Method of improving accuracy of touch trigger probe
JPH1062150A (en) * 1996-08-19 1998-03-06 Mitsutoyo Corp Ball probe and coordinate measuring apparatus using ball probe
US6553682B1 (en) 1999-03-15 2003-04-29 Paradyne Touch probe
GB9907643D0 (en) * 1999-04-06 1999-05-26 Renishaw Plc Measuring probe
JP3352055B2 (en) * 1999-06-16 2002-12-03 株式会社ミツトヨ Touch signal probe seating mechanism
CN100395512C (en) * 2004-07-02 2008-06-18 鸿富锦精密工业(深圳)有限公司 Contact needle for surface topography measuring and its preparing method
CN104406614B (en) * 2014-12-01 2017-07-11 哈尔滨同和光学精密机械有限公司 A kind of automatic rotary measuring head base of gear measuring center with three-dimensional anti-collision
JP6730894B2 (en) * 2016-09-20 2020-07-29 Dmg森精機株式会社 Detector
CN112194046B (en) * 2020-09-24 2021-04-02 济南金创机械制造有限公司 Hydraulic lifting platform deflection alarm device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4984370A (en) * 1972-12-18 1974-08-13

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3122970A (en) * 1964-03-03 Certificate of correction
DE835545C (en) * 1943-03-31 1952-04-03 Friedrich Wilhelm Deckel Dipl Resiliently mounted copy pen for copy milling machines
BE504244A (en) * 1950-07-12
DE1184972B (en) * 1962-07-13 1965-01-07 Hommelwerke Ges Mit Beschraenk Length measuring probe
US3250012A (en) * 1963-02-01 1966-05-10 Lockheed Aircraft Corp Inspection device and method
US3362076A (en) * 1966-03-14 1968-01-09 Computing Devices Canada Differential air gauge
DE2108632C3 (en) * 1971-02-24 1974-05-22 Heyligenstaedt & Co, Werkzeugmaschinenfabrik Gmbh, 6300 Giessen Sensors for post-forming machine tools, in particular post-forming milling machines
US3766653A (en) * 1971-10-04 1973-10-23 Lockheed Missiles Space Three axis inspection probe
GB1445977A (en) * 1972-09-21 1976-08-11 Rolls Royce Probes
GB1593050A (en) * 1976-09-30 1981-07-15 Renishaw Electrical Ltd Contact sensing probe
IT1088539B (en) * 1976-12-24 1985-06-10 Rolls Royce PROBE FOR USE IN MEASURING EQUIPMENT

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4984370A (en) * 1972-12-18 1974-08-13

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5834004U (en) * 1981-08-31 1983-03-05 株式会社ミツトヨ touch signal probe
JPS6324403Y2 (en) * 1981-08-31 1988-07-05
JPS5948609A (en) * 1982-08-12 1984-03-19 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング Multiple coordinate detecting head
JPH0322921B2 (en) * 1982-08-12 1991-03-27 Dokutoru Yohanesu Haidenhain Gmbh

Also Published As

Publication number Publication date
GB1593682A (en) 1981-07-22
IT7820521V0 (en) 1978-01-20
CH617617A5 (en) 1980-06-13
IT7819494A0 (en) 1978-01-20
IT1158443B (en) 1987-02-18
FR2378259B1 (en) 1980-08-22
DE2801656A1 (en) 1978-10-19
DE2801656C3 (en) 1980-04-10
SE7800602L (en) 1978-07-21
SE422996B (en) 1982-04-05
DE2801656B2 (en) 1979-07-26
FR2378259A1 (en) 1978-08-18
US4138823A (en) 1979-02-13
JPS5825202B2 (en) 1983-05-26

Similar Documents

Publication Publication Date Title
JPS53112772A (en) Probe for measuring apparatus
GB2010487B (en) Temperature measurement apparatus
JPS5430882A (en) Measuring apparatus
GB2007062B (en) Distance measurement apparatus
GB2008755B (en) Nondestructive testing apparatus
JPS53102068A (en) Apparatus for measure
IL55527A0 (en) Ange measuring apparatus
JPS53135360A (en) Measuring apparatus
JPS5422570A (en) Test apparatus
JPS53140057A (en) Measuring apparatus
GB2011004B (en) Corrosion measuring apparatus
GB2005932B (en) Power-supply arrangements for measuring apparatus
JPS53125056A (en) Measuring apparatus
GB2035566B (en) Thickness measuring apparatus
JPS549966A (en) Nonncontact measuring apparatus
GB2009423B (en) Test apparatus
JPS53136865A (en) Measuring apparatus for volume
JPS5459178A (en) Device for measuring frequency
GB2003301B (en) Testing apparatus
JPS5399974A (en) Measuring apparatus
JPS53132365A (en) Measuring apparatus for long scale materials
JPS5393871A (en) Measuring apparatus for volume
GB2003356B (en) Device for distance measurement
JPS53106070A (en) Measuring apparatus for dimension
JPS53149059A (en) Measuring apparatus for bending