JPS5116984A - X senoryokusokuteisochi - Google Patents
X senoryokusokuteisochiInfo
- Publication number
- JPS5116984A JPS5116984A JP49088038A JP8803874A JPS5116984A JP S5116984 A JPS5116984 A JP S5116984A JP 49088038 A JP49088038 A JP 49088038A JP 8803874 A JP8803874 A JP 8803874A JP S5116984 A JPS5116984 A JP S5116984A
- Authority
- JP
- Japan
- Prior art keywords
- senoryokusokuteisochi
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49088038A JPS5116984A (en) | 1974-08-02 | 1974-08-02 | X senoryokusokuteisochi |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49088038A JPS5116984A (en) | 1974-08-02 | 1974-08-02 | X senoryokusokuteisochi |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5116984A true JPS5116984A (en) | 1976-02-10 |
Family
ID=13931641
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP49088038A Pending JPS5116984A (en) | 1974-08-02 | 1974-08-02 | X senoryokusokuteisochi |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5116984A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003526775A (en) * | 1999-03-31 | 2003-09-09 | プロト マニュファクチャリング リミテッド | X-ray diffraction apparatus and method |
JP2005515435A (en) * | 2002-01-21 | 2005-05-26 | エックスアールディ−トールズ ソシエタ ア レスポンサビリタ リミタータ | Diffractometer and diffraction analysis method |
JP2006520902A (en) * | 2003-03-17 | 2006-09-14 | プロト マニュファクチャリング リミテッド | X-ray diffraction system and method |
EP1817575A4 (en) * | 2004-11-29 | 2016-05-11 | Stresstech Oy | Goniometer |
-
1974
- 1974-08-02 JP JP49088038A patent/JPS5116984A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003526775A (en) * | 1999-03-31 | 2003-09-09 | プロト マニュファクチャリング リミテッド | X-ray diffraction apparatus and method |
JP4786798B2 (en) * | 1999-03-31 | 2011-10-05 | プロト マニュファクチャリング リミテッド | X-ray diffractometer |
JP2005515435A (en) * | 2002-01-21 | 2005-05-26 | エックスアールディ−トールズ ソシエタ ア レスポンサビリタ リミタータ | Diffractometer and diffraction analysis method |
JP2006520902A (en) * | 2003-03-17 | 2006-09-14 | プロト マニュファクチャリング リミテッド | X-ray diffraction system and method |
EP1817575A4 (en) * | 2004-11-29 | 2016-05-11 | Stresstech Oy | Goniometer |
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