JPS463915B1 - - Google Patents
Info
- Publication number
- JPS463915B1 JPS463915B1 JP6075767A JP6075767A JPS463915B1 JP S463915 B1 JPS463915 B1 JP S463915B1 JP 6075767 A JP6075767 A JP 6075767A JP 6075767 A JP6075767 A JP 6075767A JP S463915 B1 JPS463915 B1 JP S463915B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6075767A JPS463915B1 (en) | 1967-09-21 | 1967-09-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6075767A JPS463915B1 (en) | 1967-09-21 | 1967-09-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS463915B1 true JPS463915B1 (en) | 1971-01-30 |
Family
ID=50192561
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6075767A Pending JPS463915B1 (en) | 1967-09-21 | 1967-09-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS463915B1 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001117017A (en) * | 1999-10-21 | 2001-04-27 | Tokai Hit:Kk | Protector for specimen temperature management and specimen temperature management device |
| JP2011180375A (en) * | 2010-03-01 | 2011-09-15 | Sumitomo Bakelite Co Ltd | Inspection device for microscope, and inspection method by microscope |
| JP2015529858A (en) * | 2012-09-13 | 2015-10-08 | ブランディーズ・ユニバーシティＢｒａｎｄｅｉｓ Ｕｎｉｖｅｒｓｉｔｙ | Cooling system and method for cryogenic super-resolution fluorescence microscopy and other applications |
-
1967
- 1967-09-21 JP JP6075767A patent/JPS463915B1/ja active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001117017A (en) * | 1999-10-21 | 2001-04-27 | Tokai Hit:Kk | Protector for specimen temperature management and specimen temperature management device |
| JP2011180375A (en) * | 2010-03-01 | 2011-09-15 | Sumitomo Bakelite Co Ltd | Inspection device for microscope, and inspection method by microscope |
| JP2015529858A (en) * | 2012-09-13 | 2015-10-08 | ブランディーズ・ユニバーシティＢｒａｎｄｅｉｓ Ｕｎｉｖｅｒｓｉｔｙ | Cooling system and method for cryogenic super-resolution fluorescence microscopy and other applications |
| EP2895909A4 (en) * | 2012-09-13 | 2016-10-05 | Univ Brandeis | Cooling systems and methods for cyro super-resolution fluorescence light microscopy and other applications |
| US9784962B2 (en) | 2012-09-13 | 2017-10-10 | Brandeis University | Cooling systems and methods for cryo super-resolution fluorescence light microscopy and other applications |
| US10678039B2 (en) | 2012-09-13 | 2020-06-09 | Brandeis University | Cooling systems and methods for cryo super-resolution fluorescence light microscopy and other applications |