JPS4322630B1 - - Google Patents

Info

Publication number
JPS4322630B1
JPS4322630B1 JP5855866A JP5855866A JPS4322630B1 JP S4322630 B1 JPS4322630 B1 JP S4322630B1 JP 5855866 A JP5855866 A JP 5855866A JP 5855866 A JP5855866 A JP 5855866A JP S4322630 B1 JPS4322630 B1 JP S4322630B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5855866A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4322630B1 publication Critical patent/JPS4322630B1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/273Tester hardware, i.e. output processing circuits
    • G06F11/277Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2294Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test
JP5855866A 1965-11-03 1966-09-06 Pending JPS4322630B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US50620465A 1965-11-03 1965-11-03

Publications (1)

Publication Number Publication Date
JPS4322630B1 true JPS4322630B1 (ja) 1968-09-28

Family

ID=24013620

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5855866A Pending JPS4322630B1 (ja) 1965-11-03 1966-09-06

Country Status (5)

Country Link
US (1) US3497685A (ja)
JP (1) JPS4322630B1 (ja)
DE (1) DE1524175C3 (ja)
FR (1) FR1501204A (ja)
GB (1) GB1137778A (ja)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1951861A1 (de) * 1968-10-17 1970-08-06 Gen Electric Information Syste Verfahren und Anordnung zur automatischen UEberpruefung von Karten mit gedruckten Schaltungen
US3599161A (en) * 1969-04-03 1971-08-10 Computer Test Corp Computer controlled test system and method
JPS5040745B1 (ja) * 1970-06-22 1975-12-26
US3659088A (en) * 1970-08-06 1972-04-25 Cogar Corp Method for indicating memory chip failure modes
FR2128290B1 (ja) * 1971-03-10 1974-09-27 Siemens Ag
US3714403A (en) * 1971-09-01 1973-01-30 Gte Automatic Electric Lab Inc Computer implemented method of detecting and isolating electrical faults in core memory systems
GB1422952A (en) * 1972-06-03 1976-01-28 Plessey Co Ltd Data processing system fault diagnostic arrangements
US3825901A (en) * 1972-11-09 1974-07-23 Ibm Integrated diagnostic tool
US3898621A (en) * 1973-04-06 1975-08-05 Gte Automatic Electric Lab Inc Data processor system diagnostic arrangement
US3838398A (en) * 1973-06-15 1974-09-24 Gte Automatic Electric Lab Inc Maintenance control arrangement employing data lines for transmitting control signals to effect maintenance functions
US3882305A (en) * 1974-01-15 1975-05-06 Kearney & Trecker Corp Diagnostic communication system for computer controlled machine tools
USRE31247E (en) * 1974-01-15 1983-05-17 Kearney & Trecker Corporation Diagnostic communications system for computer controlled machine tools
US3939453A (en) * 1974-04-29 1976-02-17 Bryant Grinder Corporation Diagnostic display for machine sequence controller
FR2290708A1 (fr) * 1974-11-06 1976-06-04 Honeywell Bull Soc Ind Dispositif de test d'adaptateurs logiques d'appareils peripheriques connectes a une unite de traitement de l'information
US4041292A (en) * 1975-12-22 1977-08-09 Honeywell Information Systems Inc. High speed binary multiplication system employing a plurality of multiple generator circuits
US4066883A (en) * 1976-11-24 1978-01-03 International Business Machines Corporation Test vehicle for selectively inserting diagnostic signals into a bus-connected data-processing system
DE2654389C3 (de) * 1976-12-01 1980-07-31 Ibm Deutschland Gmbh, 7000 Stuttgart Wartungssteuerung mit Prozessor und Speicher zur Fehleranalyse und -diagnose für elektronische Datenverarbeitungsanlagen und Verfahren zu deren Betrieb
US4313200A (en) * 1978-08-28 1982-01-26 Takeda Riken Kogyo Kabushikikaisha Logic test system permitting test pattern changes without dummy cycles
US4348760A (en) * 1980-09-25 1982-09-07 Lockheed Corporation Digital-fault loop probe and system
US4525789A (en) * 1982-07-16 1985-06-25 At&T Bell Laboratories Programmable network tester with data formatter
DE3335671A1 (de) * 1983-09-30 1985-04-04 Siemens AG, 1000 Berlin und 8000 München Verfahren zur lokalisierung von zeitkritischen vorgaengen im innern einer getakteten elektronischen schaltung
JPS61188602A (ja) * 1985-02-16 1986-08-22 Omron Tateisi Electronics Co 入出力バスの監視回路
US5263170A (en) * 1985-02-16 1993-11-16 Omron Tateisi Electronics, Co. Monitor circuit for detecting noise conditions through input output coincidence comparison
JPH0670764B2 (ja) * 1985-03-06 1994-09-07 株式会社日立製作所 シ−ケンス制御装置
EP0214692B1 (en) * 1985-09-05 1991-12-04 Koninklijke Philips Electronics N.V. Monitoring a conflict detector for traffic-lights
CA2020784C (en) * 1989-07-11 1994-08-23 Horoshi Shimizu Fault locating system capable of quickly locating a fault in a hierarchical communication network
DE19536203A1 (de) * 1994-09-28 1996-04-11 Nec Corp Fehlerdiagnoseverfahren für eine sequentielle Schaltung

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2690299A (en) * 1948-08-13 1954-09-28 Bell Telephone Labor Inc Testing system
US2945915A (en) * 1958-01-28 1960-07-19 Strip Joseph Operational checkout of data handling equipment
US3034051A (en) * 1959-05-21 1962-05-08 Honeywell Regulator Co Electrical apparatus
US3155939A (en) * 1960-10-31 1964-11-03 Sperry Rand Corp Counter checking circuit
US3246240A (en) * 1962-05-09 1966-04-12 Ibm System and method for electrical analysis of network interconnections
CA768761A (en) * 1962-12-12 1967-10-03 E. Jones Harold Automatic logic circuit tester

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
IBM TECHNICAL DISCLOSURE BULLETIN#N4=1958 *
THE BELL SYSTEM TECHNICAL JOURNAL#M9=1964 *
THE BELL SYSTEM TECHNICAL JOURNAL#N5=1964 *

Also Published As

Publication number Publication date
DE1524175C3 (de) 1973-10-25
DE1524175B2 (de) 1973-03-29
US3497685A (en) 1970-02-24
FR1501204A (fr) 1967-11-10
GB1137778A (en) 1968-12-27
DE1524175A1 (de) 1972-10-26

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