JPH11339260A - Manufacture of information recording medium substrate and the information recording medium substrate - Google Patents

Manufacture of information recording medium substrate and the information recording medium substrate

Info

Publication number
JPH11339260A
JPH11339260A JP10098744A JP9874498A JPH11339260A JP H11339260 A JPH11339260 A JP H11339260A JP 10098744 A JP10098744 A JP 10098744A JP 9874498 A JP9874498 A JP 9874498A JP H11339260 A JPH11339260 A JP H11339260A
Authority
JP
Japan
Prior art keywords
substrate
polishing
recording medium
information recording
water
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10098744A
Other languages
Japanese (ja)
Inventor
Kunihiko Yoshino
邦彦 吉野
Kuninori Shinada
邦典 品田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP10098744A priority Critical patent/JPH11339260A/en
Publication of JPH11339260A publication Critical patent/JPH11339260A/en
Pending legal-status Critical Current

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Landscapes

  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Surface Treatment Of Glass (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Manufacturing Optical Record Carriers (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a flat surface which has no protrusion on the surface caused by the residual of abrasives by conducting a finish grinding for a circular shaped substrate employing an artificial leather suede pad, while water is being supplied. SOLUTION: In the production of an information record medium substrate, a finish grinding of the substrate is conducted by an artificial leather suede pad, while water is being supplied. Thus, an information record medium substrate, in which no protrusion caused by the residual of abrasives exists on the surface and having a smooth surface (or a smooth surface having reduced number of protrusions), is realized and the amount of floating of a head is reduced. The finish grinding of the substrate is effective not only for the information record medium substrate, to which a low temperature type ion-exchange process is conducted, but also for the information record medium substrate, for which the low temperature type ion-exchange process has not been applied. A suitable PH value of the water used for the finish grinding is 4 to 10. Pure water, ion-exchanged water, and tap water can be used as the water. Buffer solution may be used with the water.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、情報記録媒体(例
えば、磁気ディスク、光ディスク、光磁気ディスクな
ど)用基板の製造方法及び情報記録媒体用基板に関する
ものである。
The present invention relates to a method for manufacturing a substrate for an information recording medium (for example, a magnetic disk, an optical disk, a magneto-optical disk, etc.) and a substrate for an information recording medium.

【0002】[0002]

【従来の技術】情報記録媒体用基板の一例である磁気デ
ィスク用基板として現在実用化されている基板の材料に
は、アルミニウム及びガラスの2種類がある。また、ガ
ラス基板の材料には、非晶質ガラスと結晶化ガラスがあ
る。そして、アルミニウム基板を使用するハードディス
ク(情報記録媒体の一例)の製造工程は、例えば、下記
の5工程(アルミ圧延板工程、ブランク工程、サブスト
レート工程、Ni-Pめっき工程、メディア工程)により構
成される。
2. Description of the Related Art There are two types of materials for substrates currently in practical use as substrates for magnetic disks, which are examples of substrates for information recording media, such as aluminum and glass. Further, the material of the glass substrate includes amorphous glass and crystallized glass. The manufacturing process of a hard disk (an example of an information recording medium) using an aluminum substrate includes, for example, the following five processes (aluminum rolling plate process, blanking process, substrate process, Ni-P plating process, media process). Is done.

【0003】まず、アルミ圧延板工程では、アルミニウ
ム原料を溶解、鋳造し、これを熱間圧延して5mm程度
の板厚にした後に冷間圧延を施すことにより、所定厚さ
に仕上げる。なお、アルミ圧延板は、コイル状にしてブ
ランク工程に移す。ブランク工程では、アルミ圧延板を
所定の内外径に合わせて打ち抜くことにより作製したア
ルミニウムディスクを鉄製またはアルミ製のスペーサー
に挟んで、圧力を加えたまま焼鈍し、板の反り、うね
り、歪みを除去する。そして、内外径の寸法を合わせる
と共に内外周の形状を整えることによりブランクを作製
する。
[0003] First, in an aluminum rolled plate process, an aluminum raw material is melted and cast, which is hot rolled to a plate thickness of about 5 mm, and then cold rolled to finish it to a predetermined thickness. The rolled aluminum plate is coiled and transferred to a blanking process. In the blanking process, an aluminum disk made by punching an aluminum rolled plate to a predetermined inner and outer diameter is sandwiched between iron or aluminum spacers, and annealed while applying pressure to eliminate warpage, undulation and distortion of the plate I do. Then, a blank is manufactured by adjusting the dimensions of the inner and outer diameters and adjusting the shape of the inner and outer circumferences.

【0004】サブストレート工程では、スポンジ砥石を
用いたブランク両面に対する粗研削・仕上げ研削を行っ
てから、焼鈍し工程を施すことにより、研削により生じ
た歪みを除去する。そして、ブランク表面に付着した砥
粒や汚れを除去するための洗浄を行ってサブストレート
を得る。Ni-Pめっき工程では前処理として、脱脂(非侵
食性の脱脂剤によるサブストレート表面の油脂の除
去)、エッチング(不均一な自然保護膜の除去)、亜鉛
置換処理(置換反応を利用したサブストレート表面への
亜鉛膜の形成)をそれぞれ行う。
[0004] In the substrate process, after performing rough grinding and finish grinding on both surfaces of the blank using a sponge grindstone, an annealing process is performed to remove distortion caused by the grinding. Then, cleaning is performed to remove abrasive grains and dirt attached to the blank surface to obtain a substrate. In the Ni-P plating process, as pretreatment, degreasing (removal of oils and fats on the substrate surface with a non-erosive degreasing agent), etching (removal of a non-uniform natural protective film), and zinc substitution treatment (substitution using substitution reaction) Formation of a zinc film on the straight surface).

【0005】次に、めっき液中にサブストレートを浸漬
させ、還元反応によりサブストレート表面にNi-Pめっき
層を析出させる。ここで、めっき層の厚さが12μm程
度となるまで析出させる。そして、Ni-Pめっき層が形成
されたディスクをポリウレタンの研磨布で挟み、アルミ
ナ系の研磨剤を注入しながら、めっき層の表面を1〜2
μm程度の研磨厚さにて仕上げ研磨する。
[0005] Next, the substrate is immersed in a plating solution, and a Ni-P plating layer is deposited on the surface of the substrate by a reduction reaction. Here, deposition is performed until the thickness of the plating layer becomes about 12 μm. Then, the disk on which the Ni-P plating layer is formed is sandwiched between polyurethane polishing cloths, and while the alumina-based abrasive is injected, the surface of the plating layer is 1-2
Finish polishing with a polishing thickness of about μm.

【0006】なお、磁気ディスク用基板の研磨は、例え
ば図1に示す概略構成を有する両面研磨加工機を使用し
て行われる。前記仕上げ研磨を行った後に、めっき層の
表面に残っている研磨剤を除去するための洗浄を行うこ
とにより、アルミニウム製の磁気ディスク用基板が得ら
れる。
The polishing of the magnetic disk substrate is performed by using, for example, a double-side polishing machine having a schematic configuration shown in FIG. After the finish polishing, the substrate is washed to remove the abrasive remaining on the surface of the plating layer, thereby obtaining a magnetic disk substrate made of aluminum.

【0007】最後に、メディア工程において磁気ディス
ク用基板上に磁気記録膜等が形成されることにより、ハ
ードディスクが完成する。一方、ガラス基板を使用する
ハードディスク(情報記録媒体の一例)は例えば下記の
工程により製造される。まず、ブランクと呼ばれる板素
材を所望の外径に丸め、次に内径用の孔をあけてから、
炭化珪素の微粉を用いてブランク表面をラッピング(荒
摺り、第1次ラッピング)する。
Finally, a hard disk is completed by forming a magnetic recording film and the like on the magnetic disk substrate in the media process. On the other hand, a hard disk (an example of an information recording medium) using a glass substrate is manufactured by, for example, the following steps. First, a blank called a blank is rounded to the desired outer diameter, then a hole for the inner diameter is made,
Lapping (roughing, primary lapping) of the blank surface using fine powder of silicon carbide.

【0008】そして、内外径を所定の寸法、形状に加工
した後に、再びブランク表面をラッピング(第2次ラッ
ピング)する。また、ブランクに付着した研磨剤や汚れ
は、超音波洗浄により取り除く。次に、前記第2次のラ
ッピングを終えたブランク表面を研磨剤(酸化セリウ
ム)により両面研磨して、所定の平面度(3〜5μm)
に仕上げた後に、表面に残っている研磨剤等を除去する
ために洗浄を行う。
After the inner and outer diameters are processed to predetermined dimensions and shapes, the blank surface is wrapped again (secondary lapping). In addition, abrasives and stains attached to the blank are removed by ultrasonic cleaning. Next, the blank surface after the second lapping is polished on both sides with an abrasive (cerium oxide) to a predetermined flatness (3 to 5 μm).
After finishing, cleaning is performed to remove abrasives and the like remaining on the surface.

【0009】なお、研磨は、例えば図1に示す概略構成
を有する両面研磨加工機を使用して行われる。基材がナ
トリウム等を含有する非晶質ガラスの場合には、低温型
イオン交換処理による化学強化を施した後に洗浄を行
う。次に、表面欠陥を検査することによりガラス製の磁
気ディスク用基板(サブストレート)を得ることができ
る。
The polishing is performed using, for example, a double-side polishing machine having a schematic configuration shown in FIG. When the substrate is an amorphous glass containing sodium or the like, cleaning is performed after chemical strengthening by low-temperature ion exchange treatment. Next, a glass magnetic disk substrate (substrate) can be obtained by inspecting for surface defects.

【0010】最後に、この磁気ディスク用基板上に磁気
記録膜等を形成すること(メディア工程)により、ガラ
ス基板を使用するハードディスクが完成する。
Finally, a hard disk using a glass substrate is completed by forming a magnetic recording film and the like on the magnetic disk substrate (media process).

【0011】[0011]

【発明が解決しようとする課題】従来の製造方法により
作製された磁気ディスク用基板の表面には、最終研磨工
程で使用された研磨剤が完全に除去されずに突起として
残存している。また、ガラス製の磁気ディスク用基板で
は、最終研磨工程で使用された研磨剤の残存に起因する
前記突起の存在に加えて、低温型イオン交換処理工程で
発生する基板面の突起も存在する。
On the surface of the magnetic disk substrate manufactured by the conventional manufacturing method, the abrasive used in the final polishing step remains as projections without being completely removed. In the magnetic disk substrate made of glass, in addition to the presence of the protrusions caused by the remaining abrasive used in the final polishing step, there are also protrusions on the substrate surface generated in the low-temperature ion exchange treatment step.

【0012】そして、前記突起物が磁気記録膜形成時に
基板面に残存していると、良質な磁気記録膜を得ること
ができないので問題がある。また、10Gbit / in2 の面
記録密度に対応したヘッドの浮上量は20nm程度であるこ
とを考えても、基板面に前記突起が残存することは、基
板の平滑性を著しく損なうこととなり、ヘッドと基板と
の接触の可能性を大にするので問題がある。
If the protrusions remain on the substrate surface when the magnetic recording film is formed, there is a problem that a high quality magnetic recording film cannot be obtained. Also, considering that the flying height of the head corresponding to the surface recording density of 10 Gbit / in 2 is about 20 nm, the fact that the protrusions remain on the substrate surface significantly impairs the smoothness of the substrate. There is a problem because the possibility of contact between the substrate and the substrate is increased.

【0013】本発明は、かかる問題に鑑みてなされたも
のであり、表面に研磨剤の残存等に起因する突起がない
平滑な面(或いは該突起を低減した平滑な面)を有し、
ヘッドの低浮上量化を可能とする情報記録媒体用基板と
その製造方法を提供することを目的とする。
The present invention has been made in view of such a problem, and has a smooth surface (or a smooth surface in which the protrusions are reduced) without protrusions due to the remaining abrasive or the like on the surface.
An object of the present invention is to provide an information recording medium substrate and a method for manufacturing the same, which enable a low flying height of a head.

【0014】[0014]

【課題を解決するための手段】そのため、本発明は第一
に「円板状基板に仕上げ研磨加工を施して、情報記録媒
体用の基板を製造する方法において、水を供給しながら
人工皮革スウェードパッドにより前記円板状基板の仕上
げ研磨を行うことを特徴とする情報記録媒体用基板の製
造方法(請求項1)」を提供する。
Therefore, the present invention firstly provides a method for producing a substrate for an information recording medium by subjecting a disk-shaped substrate to a finish polishing process, wherein the artificial leather suede is supplied while supplying water. A method of manufacturing a substrate for an information recording medium, characterized in that the disk-shaped substrate is finish-polished by a pad (claim 1).

【0015】また、本発明は第二に「少なくとも、円板
状のガラス基板を用意する工程と、前記ガラス基板に低
温型イオン交換処理を施す工程と、水を供給しながら人
工皮革スウェードパッドにより前記イオン交換処理が施
された基板面の仕上げ研磨を行う工程と、を有する情報
記録媒体用基板の製造方法(請求項2)」を提供する。
[0015] The present invention also provides a second aspect of the invention which comprises "at least a step of preparing a disk-shaped glass substrate, a step of performing a low-temperature ion exchange treatment on the glass substrate, and an artificial leather suede pad while supplying water. Performing a finish polishing of the substrate surface on which the ion exchange treatment has been performed, and a method of manufacturing a substrate for an information recording medium (claim 2).

【0016】また、本発明は第三に「少なくとも、円板
状のガラス基板を用意する工程と、水を供給しながら人
工皮革スウェードパッドにより前記ガラス基板の仕上げ
研磨を行う工程と前記仕上げ研磨を行ったガラス基板に
低温型イオン交換処理を施す工程と、を有する情報記録
媒体用基板の製造方法(請求項3)」を提供する。
[0016] The present invention is also characterized in that the third step is "at least a step of preparing a disk-shaped glass substrate, a step of performing a final polishing of the glass substrate with an artificial leather suede pad while supplying water, and a step of performing the final polishing. Subjecting the glass substrate to a low-temperature ion exchange treatment, the method for producing a substrate for an information recording medium (claim 3) ".

【0017】また、本発明は第四に「少なくとも、円板
状のガラス基板を用意する工程と、水を供給しながら人
工皮革スウェードパッドにより前記ガラス基板の第1次
仕上げ研磨を行う工程と前記仕上げ研磨を行ったガラス
基板に低温型イオン交換処理を施す工程と、水を供給し
ながら人工皮革スウェードパッドにより前記イオン交換
処理が施されたガラス基板の第2次仕上げ研磨を行う工
程とを有する情報記録媒体用基板の製造方法(請求項
4)」を提供する。
Further, the present invention is directed to a fourth aspect, "at least a step of preparing a disk-shaped glass substrate, a step of performing the first finish polishing of the glass substrate with an artificial leather suede pad while supplying water, and A step of performing low-temperature ion exchange treatment on the glass substrate that has been subjected to finish polishing, and a step of performing second finish polishing of the glass substrate that has been subjected to the ion exchange treatment with an artificial leather suede pad while supplying water. A method for manufacturing an information recording medium substrate (Claim 4) "is provided.

【0018】また、本発明は第五に「請求項1〜4に記
載の方法により製造された情報記録媒体用基板であり、
原子間力顕微鏡により10μm□の測定領域で測定した
主表面の表面粗さがR max100Å以下、かつRa 5Å以下で
ある情報記録媒体用基板(請求項5)」を提供する。
Further, the present invention provides, in a fifth aspect, an information recording medium substrate manufactured by the method according to claims 1 to 4,
The present invention provides an information recording medium substrate having a main surface having a surface roughness of not more than Rmax100 ° and not more than Ra5 ° as measured by an atomic force microscope in a measurement area of 10 μm □ (Claim 5).

【0019】[0019]

【発明実施の形態】前述したように、従来の製造方法に
より作製された磁気ディスク用基板の表面には、最終研
磨工程で使用された研磨剤が完全に除去されずに突起と
して残存している。そして、研磨工程において基板表面
に付着した前記研磨剤の殆どは、基板洗浄することによ
り除去することができる。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS As described above, the abrasive used in the final polishing step remains on the surface of a magnetic disk substrate manufactured by a conventional manufacturing method as projections without being completely removed. . Most of the abrasive attached to the substrate surface in the polishing step can be removed by washing the substrate.

【0020】しかしながら、基板洗浄でも除去しきれな
い研磨剤が基板表面に残存しており、しかもこの残存す
る研磨剤の大きさは微小であるため、目視による基板観
察では発見することは困難である。そこで、本発明者ら
が鋭意研究した結果、本発明者らは、水を供給しながら
人工皮革スウェードパッドにより基板の仕上げ研磨を行
えば、前記洗浄でも除去しきれずに基板表面に残存して
いる研磨剤を除去できることを、言い換えると、水を供
給しながらスウェードパッドにより情報記録媒体用基板
を擦ると、前記研磨剤を削り取ることができることを見
いだした。
However, since the abrasive which cannot be completely removed even by washing the substrate remains on the substrate surface, and the size of the remaining abrasive is minute, it is difficult to find it by visual observation of the substrate. . Therefore, as a result of intensive studies by the present inventors, the present inventors have performed a final polishing of a substrate with an artificial leather suede pad while supplying water, and have not been completely removed even by the above-mentioned cleaning, and have remained on the substrate surface. It has been found that the abrasive can be removed, in other words, the abrasive can be removed by rubbing the information recording medium substrate with a suede pad while supplying water.

【0021】そして、かかる研磨剤除去効果の原因は定
かではないが、基板に対して水を供給すると、基板面に
おける水和膜の発生を促進し、人工皮革スウェードパッ
ドは、物理的にこの水和膜に作用して、水和膜及び水和
膜内にある基板表面から突起した微小異物を除去するも
のと予想される。このように、本発明にかかる仕上げ研
磨によれば、基板に直接作用する物理的な力を極力抑制
しつつ、基板表面に発生した軟質な水和膜及び突起した
微小異物の除去を押し進めるので、新たに基板にダメー
ジを与えることなく、基板の表面粗さを示すR max値を
良好にすることができる。
Although the cause of the abrasive removal effect is not clear, when water is supplied to the substrate, the formation of a hydrated film on the substrate surface is promoted, and the artificial leather suede pad physically removes this water. It is expected to act on the hydrated film to remove the hydrated film and microscopic foreign matter protruding from the substrate surface in the hydrated film. Thus, according to the finish polishing according to the present invention, while minimizing the physical force acting directly on the substrate as much as possible, the removal of the soft hydrated film generated on the substrate surface and the removal of the protruding minute foreign matter are promoted, The Rmax value indicating the surface roughness of the substrate can be improved without newly damaging the substrate.

【0022】また、ガラス製の情報記録媒体用基板で
は、最終研磨工程で使用された研磨剤の残存に起因する
前記突起の存在に加えて、前述したように低温型イオン
交換処理工程で発生する基板面の突起も存在する。一般
に、低温型イオン交換処理工程の後でも基板を洗浄する
が、低温型イオン交換処理により発生する基板面の突起
を洗浄によりすべて除去することは極めて困難である。
Further, in the case of a glass substrate for an information recording medium, in addition to the presence of the projections caused by the remaining abrasive used in the final polishing step, the substrate is generated in the low-temperature ion exchange processing step as described above. There are also protrusions on the substrate surface. In general, the substrate is cleaned even after the low-temperature ion exchange process, but it is extremely difficult to remove all the projections on the substrate surface generated by the low-temperature ion exchange process by cleaning.

【0023】そして、本発明者らが鋭意研究した結果、
本発明者らは、水を供給しながら人工皮革スウェードパ
ッドにより低温型イオン交換処理を施した基板の仕上げ
研磨を行えば、前記洗浄でも除去しきれずに基板表面に
残存している突起を除去できることを見いだした。そこ
で、本発明(請求項1〜4)にかかる情報記録媒体用基
板の製造方法においては、水を供給しながら人工皮革ス
ウェードパッドにより基板の仕上げ研磨を行うこととし
た。
As a result of intensive studies conducted by the present inventors,
The inventors of the present invention are able to remove projections remaining on the substrate surface that cannot be completely removed by the above-mentioned cleaning by performing final polishing of a substrate subjected to a low-temperature ion exchange treatment with an artificial leather suede pad while supplying water. Was found. Therefore, in the method of manufacturing a substrate for an information recording medium according to the present invention (claims 1 to 4), finish polishing of the substrate is performed with an artificial leather suede pad while supplying water.

【0024】本発明(請求項1〜5)によれば、表面に
研磨剤の残存等に起因する大きな突起がない平滑な面
(或いは該突起を低減した平滑な面)を有し、ヘッドの
低浮上量化を可能とする情報記録媒体用基板が得られ
る。水を供給しながら人工皮革スウェードパッドにより
行う本発明にかかる基板の仕上げ研磨は、低温型イオン
交換処理を施した後の情報記録媒体用基板だけでなく、
前記イオン交換処理を施す前の情報記録媒体用基板に対
しても有効である。
According to the present invention (claims 1 to 5), the head has a smooth surface without large projections due to the remaining abrasive or the like (or a smooth surface in which the projections are reduced). An information recording medium substrate capable of reducing the flying height can be obtained. Finish polishing of the substrate according to the present invention performed by artificial leather suede pad while supplying water, not only the information recording medium substrate after subjected to low-temperature ion exchange treatment,
The present invention is also effective for an information recording medium substrate before performing the ion exchange treatment.

【0025】さらに、本発明にかかる基板の仕上げ研磨
は、イオン交換処理を行わない情報記録媒体用基板に対
しても有効である。また、本発明にかかる基板の仕上げ
研磨に使用する水のPH値は、4〜 10が好適である。
また、水としては純水、イオン交換水、水道水等が使用
できるが、緩衝溶液を併用してもよい。また、酸、アル
カリ、塩類を溶解した水溶液を使用してもよい。
Further, the finish polishing of the substrate according to the present invention is also effective for a substrate for an information recording medium which is not subjected to an ion exchange treatment. Further, the PH value of the water used for the final polishing of the substrate according to the present invention is preferably 4 to 10.
As the water, pure water, ion-exchanged water, tap water and the like can be used, but a buffer solution may be used in combination. Further, an aqueous solution in which an acid, an alkali, and a salt are dissolved may be used.

【0026】本発明にかかる仕上げ研磨は、少なくとも
基板表面の突起を除去することを目的としており、仕上
げ研磨により除去する厚みは、基板の片面につき100Å
程度かそれ以下でも前記目的を達成することができる。
本発明(請求項1〜4)にかかる製造方法により得られ
た情報記録媒体用基板の面精度の測定は、原子間力顕微
鏡を用いて行うことができる。
The final polishing according to the present invention is intended to remove at least protrusions on the substrate surface, and the thickness removed by the final polishing is 100 mm per one side of the substrate.
The above-mentioned object can be achieved with the degree or less.
The measurement of the surface accuracy of the information recording medium substrate obtained by the manufacturing method according to the present invention (claims 1 to 4) can be performed using an atomic force microscope.

【0027】即ち、曲率半径が数十nmよりも小さな探針
を備えた原子間力顕微鏡を使用して、基板表面における
10μm□の方形領域を走査すれば、微少な表面の凹凸
や突起等を測定できる。なお、触針式の表面粗さ測定に
おける針の曲率半径は、数百nm以上もあり、微少な表面
の凹凸、突起等の測定には不向きであり、得られる測定
値はかなりの誤差を含むので好ましくない。
That is, if a 10 μm square area on the substrate surface is scanned using an atomic force microscope equipped with a probe having a radius of curvature smaller than several tens of nanometers, minute surface irregularities and projections can be obtained. Can be measured. The radius of curvature of the stylus in the stylus type surface roughness measurement is several hundred nm or more, and is not suitable for measurement of minute surface irregularities, protrusions, etc., and the obtained measurement value includes a considerable error. It is not preferable.

【0028】本発明(請求項1〜4)にかかる製造方法
によれば、例えば、原子間力顕微鏡により表面10μm
□の測定領域で測定した主表面の表面粗さがR max100Å
以下、かつRa 5Å以下である情報記録媒体用基板(請求
項5)が得られる。以下、本発明を実施例により更に詳
細に説明するが、本発明はこれらの例に限定されるもの
ではない。
According to the production method according to the present invention (claims 1 to 4), for example, the surface is 10 μm
The surface roughness of the main surface measured in the measurement area of □ is R max100Å
The following provides an information recording medium substrate having a Ra of less than 5 ° (claim 5). Hereinafter, the present invention will be described in more detail with reference to examples, but the present invention is not limited to these examples.

【0029】[0029]

【実施例1】本実施例の情報記録媒体用基板は、原子間
力顕微鏡により10μm□の測定領域で測定した主表面
の表面粗さがR max90Å、Ra2.9Åであり、表面に研磨剤
の残存等に起因する大きな突起がない平滑な面を有す
る。また、本実施例の情報記録媒体用基板を製造する方
法は、円板状基板に仕上げ研磨加工を施して、情報記録
媒体用の基板を製造する方法であり、水を供給しながら
人工皮革スウェードパッドにより前記円板状基板の仕上
げ研磨を行うものである。
Embodiment 1 The substrate for an information recording medium of this embodiment has a main surface having a surface roughness of R max 90 ° and Ra 2.9 ° measured in a measurement area of 10 μm square by an atomic force microscope. It has a smooth surface without large projections due to residuals and the like. Further, the method for manufacturing the information recording medium substrate of the present embodiment is a method of manufacturing a disc-shaped substrate by subjecting the disk-shaped substrate to finish polishing, thereby manufacturing a substrate for the information recording medium. Finish polishing of the disk-shaped substrate is performed by a pad.

【0030】以下に製造工程を示す。まず、Ni-Pめっき
層を形成したアルミニウム製の磁気ディスク用基板(円
板状)を用意してをポリウレタンの研磨布で挟んでアル
ミナ系の研磨剤を注入しながら、めっき層の表面に対す
る1〜2μmの仕上げ研磨を施した後、めっき層の表面
に残っている研磨剤を除去するための洗浄を行った。
The manufacturing steps will be described below. First, an aluminum magnetic disk substrate (disc-shaped) on which a Ni-P plating layer is formed is prepared, and is sandwiched between polyurethane polishing cloths. After a final polishing of about 2 μm, cleaning was performed to remove the abrasive remaining on the surface of the plating layer.

【0031】次に、洗浄した基板の主表面を原子間力顕
微鏡を用いて表面10μm□の測定領域で観察したとこ
ろ、表面粗さがR max180Å、かつRa 8Åであり、主表面
に突起である異物が残存していた。次に、主表面に残存
している突起(異物)を除去するための仕上げ研磨加工
を施した。
Next, when the main surface of the washed substrate was observed in a measurement area of 10 μm square using an atomic force microscope, the surface roughness was R max 180 ° and Ra 8 °, and the main surface had protrusions. Foreign matter remained. Next, finish polishing was performed to remove protrusions (foreign matter) remaining on the main surface.

【0032】即ち、両面研磨機の鋳鉄製の上定盤と下定
盤に人工皮革スウェード製の研磨パッドを貼り付けて固
定し、該研磨パッドが固定された上下の研磨工具の間
に、前記イオン交換処理及び洗浄が施された基板を密着
させるとともに、パッド及び基板研磨面に純水を供給し
ながら回転、摺動することにより、基板の両面を同時に
仕上げ研磨した。
That is, a polishing pad made of artificial leather suede is attached and fixed to a cast iron upper surface plate and a lower surface plate of a double-side polishing machine, and the above-mentioned ion pad is placed between upper and lower polishing tools to which the polishing pad is fixed. The substrates subjected to the exchange treatment and the cleaning were brought into close contact with each other, and rotated and slid while supplying pure water to the pad and the substrate polishing surface, whereby both surfaces of the substrate were simultaneously finish-polished.

【0033】なお、前記スウェード製の研磨パッドに
は、幅5mmの溝が10mm間隔で入れてある(図2参
照)。また、研磨加工圧力を30〜100g / cm2、下定盤回
転数を5〜40rpm、上定盤回転数を5〜40rpm、加工時間を
2〜8分として研磨を行った。仕上げ研磨加工を施した
基板の主表面を原子間力顕微鏡を用いて表面10μm□
の測定領域で観察したところ、表面粗さはR max90Å、R
a 2.9Åであり、また前記洗浄後に主表面に残存してい
た突起(異物)は除去されていた。
The suede polishing pad has grooves 5 mm wide at intervals of 10 mm (see FIG. 2). Polishing was performed at a polishing pressure of 30 to 100 g / cm 2 , a lower platen rotation speed of 5 to 40 rpm, an upper platen rotation speed of 5 to 40 rpm, and a processing time of 2 to 8 minutes. The main surface of the substrate that has been subjected to finish polishing is surface 10 μm square using an atomic force microscope.
Observed in the measurement area, the surface roughness was R max90Å, R
a was 2.9Å, and the protrusions (foreign matter) remaining on the main surface after the washing were removed.

【0034】[0034]

【実施例2】本実施例の情報記録媒体用基板は、原子間
力顕微鏡により10μm□の測定領域で測定した主表面
の表面粗さがR max41.6Å、Ra 2.3Åであり、表面に研
磨剤の残存等に起因する大きな突起がない平滑な面を有
する。また、本実施例の情報記録媒体用基板を製造する
方法は、円板状のガラス基板を用意する工程と、前記ガ
ラス基板に低温型イオン交換処理を施す工程と、水を供
給しながら人工皮革スウェードパッドにより前記イオン
交換処理が施された基板面の仕上げ研磨を行う工程とを
有する。
Embodiment 2 The substrate for an information recording medium of the present embodiment has a main surface having a surface roughness R max of 41.6Å and a Ra of 2.3 測定 measured in an area of 10 μm square by an atomic force microscope, and has a polished surface. It has a smooth surface without large projections due to the residual agent. Further, the method of manufacturing the information recording medium substrate of the present embodiment includes a step of preparing a disk-shaped glass substrate, a step of performing a low-temperature ion exchange treatment on the glass substrate, and a step of supplying artificial water while supplying water. Performing a finish polishing of the substrate surface subjected to the ion exchange treatment by a suede pad.

【0035】以下に製造工程を示す。まず、表面を酸化
セリウム研磨剤により精密研磨したアルミノシリケート
ガラス製の磁気ディスク用基板(円板状)を用意して洗
浄した後に、硝酸カリウムの溶融塩中に浸漬し、低温型
イオン交換処理を施してガラス中のナトリウムイオンを
カリウムイオンとイオン交換することにより、基板表面
に圧縮応力層を形成した。
The manufacturing process will be described below. First, a magnetic disk substrate (disc-shaped) made of aluminosilicate glass whose surface is precisely polished with a cerium oxide abrasive is prepared, washed, immersed in a molten salt of potassium nitrate, and subjected to a low-temperature ion exchange treatment. Thus, a compressive stress layer was formed on the substrate surface by ion exchange of sodium ions in the glass with potassium ions.

【0036】次に、イオン交換処理した基板を洗浄した
後、この主表面を原子間力顕微鏡を用いて表面10μm
□の測定領域で観察したところ、表面粗さがR max128
Å、Ra3.8Åであり、主表面に突起が残存していた。次
に、主表面に残存している突起を除去するための仕上げ
研磨加工を施した。即ち、両面研磨機の鋳鉄製の上定盤
と下定盤に人工皮革スウェード製の研磨パッドを貼り付
けて固定し、該研磨パッドが固定された上下の研磨工具
の間に、前記洗浄が施された基板を密着させるととも
に、パッド及び基板研磨面に純水を供給しながら回転、
摺動することにより、基板の両面を同時に仕上げ研磨し
た。
Next, after the substrate subjected to the ion exchange treatment was washed, the main surface was cleaned to a surface of 10 μm using an atomic force microscope.
Observed in the measurement area of □, the surface roughness was R max128
Ra, Ra3.8Å, and protrusions remained on the main surface. Next, finish polishing was performed to remove protrusions remaining on the main surface. That is, an artificial leather suede polishing pad is attached and fixed to the cast iron upper and lower platens of a double-side polishing machine, and the above-mentioned cleaning is performed between the upper and lower polishing tools to which the polishing pad is fixed. The substrate is brought into close contact and rotated while supplying pure water to the pad and substrate polishing surface.
By sliding, both surfaces of the substrate were simultaneously finished and polished.

【0037】なお、前記スウェード製の研磨パッドに
は、幅5mmの溝が10mm間隔で入れてある(図2参
照)。また、研磨加工圧力を30〜100g / cm2、下定盤回
転数を5〜40rpm、上定盤回転数を5〜40rpm、加工時間を
2〜8分として研磨を行った。仕上げ研磨加工を施した
基板の主表面を原子間力顕微鏡を用いて表面10μm□
の測定領域で観察したところ、表面粗さがR max41.6
Å、Ra 2.3Åであり、また主表面に残存していた突起は
除去されていた。
The suede polishing pad has grooves 5 mm wide at intervals of 10 mm (see FIG. 2). Polishing was performed at a polishing pressure of 30 to 100 g / cm 2 , a lower platen rotation speed of 5 to 40 rpm, an upper platen rotation speed of 5 to 40 rpm, and a processing time of 2 to 8 minutes. The main surface of the substrate that has been subjected to finish polishing is surface 10 μm square using an atomic force microscope.
Observed in the measurement area, the surface roughness was R max41.6
Ra, Ra 2.3Å, and the protrusions remaining on the main surface were removed.

【0038】[0038]

【実施例3】本実施例の情報記録媒体用基板は、原子間
力顕微鏡により10μm□の測定領域で測定した主表面
の表面粗さがR max52.3Å、Ra 2.9Åであり、表面に研
磨剤の残存等に起因する大きな突起がない平滑な面を有
する。また、本実施例の情報記録媒体用基板を製造する
方法は、円板状のガラス基板を用意する工程と、水を供
給しながら人工皮革スウェードパッドにより前記ガラス
基板の仕上げ研磨を行う工程と、前記仕上げ研磨を行っ
たガラス基板に低温型イオン交換処理を施す工程とを有
する。
Embodiment 3 The substrate for an information recording medium of this embodiment has a main surface having a surface roughness R max of 52.3Å and a Ra of 2.9Å measured in an area of 10 μm □ by an atomic force microscope, and has a polished surface. It has a smooth surface without large projections due to the residual agent. Further, the method of manufacturing the information recording medium substrate of the present embodiment, a step of preparing a disk-shaped glass substrate, a step of finishing polishing the glass substrate with an artificial leather suede pad while supplying water, Performing a low-temperature ion exchange treatment on the glass substrate that has been subjected to the finish polishing.

【0039】以下に製造工程を示す。まず、表面を酸化
セリウム研磨剤により精密研磨したアルミノシリケート
ガラス製の磁気ディスク用基板(円板状)を用意して洗
浄した後に、基板の主表面を原子間力顕微鏡を用いて表
面10μm□の測定領域で観察したところ、表面粗さRma
x105Å、Ra 2.9Åであり、主表面に突起である異物が残
存していた。
The manufacturing steps will be described below. First, a magnetic disk substrate (disc-shaped) made of aluminosilicate glass whose surface is precisely polished with a cerium oxide abrasive is prepared and washed, and then the main surface of the substrate is formed with a surface of 10 μm square using an atomic force microscope. When observed in the measurement area, the surface roughness Rma
x 105 x, Ra 2.9Å, and foreign matter as projections remained on the main surface.

【0040】次に、主表面に残存している突起(異物)
を除去するための仕上げ研磨加工を施した。即ち、両面
研磨機の鋳鉄製の上定盤と下定盤に人工皮革スウェード
製の研磨パッドを貼り付けて固定し、該研磨パッドが固
定された上下の研磨工具の間に、前記洗浄が施された基
板を密着させるとともに、パッド及び基板研磨面に純水
を供給しながら回転、摺動することにより、基板の両面
を同時に仕上げ研磨した。
Next, protrusions (foreign matter) remaining on the main surface
Finish polishing was performed to remove. That is, an artificial leather suede polishing pad is attached and fixed to the cast iron upper and lower platens of a double-side polishing machine, and the above-mentioned cleaning is performed between the upper and lower polishing tools to which the polishing pad is fixed. The substrates were brought into close contact with each other, and rotated and slid while supplying pure water to the pad and the substrate polishing surface, so that both surfaces of the substrate were simultaneously finished and polished.

【0041】なお、前記スウェード製の研磨パッドに
は、幅5mmの溝が10mm間隔で入れてある(図2参
照)。また、研磨加工圧力を30〜100g / cm2、下定盤回
転数を5〜40rpm、上定盤回転数を5〜40rpm、加工時間を
2〜8分として研磨を行った。次に、仕上げ研磨加工を
施した基板の主表面を原子間力顕微鏡を用いて表面10
μm□の測定領域で観察したところ、表面粗さがR max30
Å、Ra 2.3Åであり、また主表面に残存していた突起
(異物)は除去されていた。
The above-mentioned polishing pad made of suede is provided with grooves having a width of 5 mm at intervals of 10 mm (see FIG. 2). Polishing was performed at a polishing pressure of 30 to 100 g / cm 2 , a lower platen rotation speed of 5 to 40 rpm, an upper platen rotation speed of 5 to 40 rpm, and a processing time of 2 to 8 minutes. Next, the main surface of the substrate which has been subjected to the finish polishing is surface 10 using an atomic force microscope.
When observed in the μm □ measurement area, the surface roughness was R max30
Ra, Ra 2.3Å, and protrusions (foreign matter) remaining on the main surface were removed.

【0042】ここで、仕上げ研磨加工前後の基板表面を
全反射蛍光x線によりそれぞれ分析したところ、仕上げ
研磨加工前の基板表面において検出されたセリウムは、
仕上げ研磨加工後の基板表面では検出されず、原子間力
顕微鏡で観察された突起物である研磨剤の酸化セリウム
は、仕上げ研磨加工により除去されていることが判明し
た。
Here, the surface of the substrate before and after the finish polishing was analyzed by total reflection x-ray fluorescence, and the cerium detected on the substrate surface before the finish polishing was:
It was not detected on the substrate surface after the finish polishing, and it was found that the cerium oxide of the abrasive, which was a projection observed by an atomic force microscope, was removed by the finish polishing.

【0043】次に、仕上げ研磨加工を施した基板を再度
洗浄した後に、硝酸カリウムの溶融塩中に浸漬し、低温
型イオン交換処理を施してガラス中のナトリウムイオン
をカリウムイオンとイオン交換することにより、基板表
面に圧縮応力層を形成した。次に、イオン交換処理を施
した基板を洗浄した後、この主表面を原子間力顕微鏡を
用いて表面10μm□の測定領域で観察したところ、表
面粗さがR max52.3Å、Ra 2.9Åであった。
Next, after the substrate subjected to finish polishing is washed again, it is immersed in a molten salt of potassium nitrate and subjected to a low-temperature ion exchange treatment to exchange sodium ions in the glass with potassium ions. Then, a compressive stress layer was formed on the substrate surface. Next, after washing the substrate subjected to the ion exchange treatment, the main surface was observed in a measurement area of the surface 10 μm □ using an atomic force microscope, and the surface roughness was R max 52.3Å and Ra 2.9Å. there were.

【0044】即ち、低温型イオン交換処理を施すことに
より、処理前の表面粗さの値よりも、処理後の表面粗さ
の値が大きくなっており、これは低温型イオン交換処理
工程において基板主表面の突起が発生することを示して
いる。しかしながら、本実施例にかかる仕上げ研磨加工
を基板に施さないで低温イオン交換処理を行った場合の
表面粗さは、原子間力顕微鏡を用いた表面10μm□の
測定領域における観察をした結果、R max128Å、Ra 3.8
Åであり、本実施例にかかる仕上げ研磨加工が基板の平
滑化に効果があることが判った。
That is, by performing the low-temperature ion exchange treatment, the surface roughness value after the treatment becomes larger than the surface roughness value before the treatment. This indicates that projections on the main surface occur. However, the surface roughness when the low-temperature ion exchange treatment was performed without subjecting the substrate to the finish polishing according to the present example was measured by using an atomic force microscope in a measurement area of the surface of 10 μm square. max128Å, Ra 3.8
Å, indicating that the finish polishing according to the present example was effective in smoothing the substrate.

【0045】なお、更なる基板表面の平滑化を求めるな
らば、低温型イオン交換処理工程の後に、前記仕上げ研
磨加工を再度施しても良い。また、アルミノシリケート
ガラス製の磁気ディスク用基板の表面を酸化セリウム研
磨剤により精密研磨するために使用する研磨機と、仕上
げ研磨加工において使用する研磨機とを区別して使用す
ることが、より平滑性が良い基板を得る上で好ましい。
If further smoothing of the substrate surface is required, the above-mentioned finish polishing may be performed again after the low-temperature ion exchange treatment step. In addition, the use of a polishing machine used for precisely polishing the surface of a magnetic disk substrate made of aluminosilicate glass with a cerium oxide abrasive and a polishing machine used in the finish polishing process can be performed more smoothly. Is preferable for obtaining a good substrate.

【0046】しかし、量産性を考慮すると研磨機の切り
替えを行うことは難しいので、酸化セリウム研磨剤によ
り精密研磨する工程が終了した後に、同一研磨機におい
て研磨剤の混ざった研磨液の供給を遮断し、その代わり
に水のみを研磨機に供給することで、基板の仕上げ研磨
を行う方法を採用しても、同等の効果が得られる。
However, since it is difficult to switch the polishing machine in consideration of mass productivity, the supply of the polishing liquid mixed with the polishing agent is stopped in the same polishing machine after the step of precision polishing with the cerium oxide polishing agent is completed. However, instead of supplying only water to the polishing machine, the same effect can be obtained even if a method of performing final polishing of the substrate is employed.

【0047】[0047]

【発明の効果】以上説明したように、本発明(請求項1
〜5)によれば、表面に研磨剤の残存等に起因する大き
な突起がない平滑な面(或いは該突起を低減した平滑な
面)を有し、ヘッドの低浮上量化を可能とする情報記録
媒体用基板が得られる。また、本発明(請求項1〜4)
にかかる製造方法によれば、例えば、原子間力顕微鏡に
より表面10μm□の測定領域で測定した主表面の表面
粗さがR max100Å以下、かつRa 5Å以下である情報記録
媒体用基板(請求項5)が得られる。
As described above, the present invention (Claim 1)
According to 5), information recording which has a smooth surface without large projections due to residual abrasive or the like (or a smooth surface with reduced projections) on the surface and enables a low flying height of the head. A medium substrate is obtained. The present invention (claims 1 to 4)
According to the manufacturing method described above, for example, a substrate for an information recording medium in which the surface roughness of the main surface measured by an atomic force microscope in a measurement area of the surface of 10 μm □ is R max100 ° or less and Ra 5 ° or less (claim 5) ) Is obtained.

【0048】また、本発明にかかる平滑な表面を有する
基板を情報記録媒体用基板とし、該基板上に記録媒体を
形成すれば、ヘッドの浮上量を低く抑えることができる
ので、情報記録の高密度化に対応することができる。即
ち、本発明によれば、ヘッド(例えば、磁気ヘッド)の
低浮上量化が可能となり、情報記録媒体(例えば、磁気
ディスク)の高密度化(特に線記録密度の増大化)を実
現できる。
If the substrate having a smooth surface according to the present invention is used as a substrate for an information recording medium and the recording medium is formed on the substrate, the flying height of the head can be suppressed to a low level, so It can respond to density increase. That is, according to the present invention, the flying height of the head (for example, a magnetic head) can be reduced, and the density of an information recording medium (for example, a magnetic disk) can be increased (particularly, the linear recording density can be increased).

【0049】また、情報記録媒体(例えば、磁気ディス
ク)の高密度化が実現でき、ディスク装置(ハードディ
スクドライブ装置、例えば磁気ディスクドライブ装置)
に搭載されるディスクの枚数削減や、ディスク径のサイ
ズダウンが可能となり、装置を小型化することもでき
る。特に、ハードディスクドライブ装置の高性能化、小
型化、省スペース化が進めば、ハードディスクドライブ
装置が搭載されるパソコン等の性能を向上させることが
できる。
Further, the density of an information recording medium (for example, a magnetic disk) can be increased, and a disk device (a hard disk drive device, for example, a magnetic disk drive device)
It is possible to reduce the number of disks to be mounted on the disk and to reduce the size of the disk diameter, and to reduce the size of the apparatus. In particular, if the performance of the hard disk drive is improved, the size is reduced, and the space is saved, the performance of a personal computer or the like on which the hard disk drive is mounted can be improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】は、両面研磨加工機の概略構成図である。FIG. 1 is a schematic configuration diagram of a double-side polishing machine.

【図2】は、本発明にかかる研磨パッドの上面図であ
る。
FIG. 2 is a top view of the polishing pad according to the present invention.

【符号の説明】[Explanation of symbols]

1・・磁気ディスク基板 2・・研磨液 3・・上定盤 4・・下定盤 以上 1. Magnetic disk substrate 2. Polishing liquid 3. Upper surface plate 4. Lower surface plate

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 円板状基板に仕上げ研磨加工を施して、
情報記録媒体用の基板を製造する方法において、 水を供給しながら人工皮革スウェードパッドにより前記
円板状基板の仕上げ研磨を行うことを特徴とする情報記
録媒体用基板の製造方法。
Claims: 1. A disc-shaped substrate is subjected to finish polishing,
A method for manufacturing a substrate for an information recording medium, comprising: finishing polishing the disc-shaped substrate with an artificial leather suede pad while supplying water.
【請求項2】 少なくとも、 円板状のガラス基板を用意する工程と、 前記ガラス基板に低温型イオン交換処理を施す工程と、 水を供給しながら人工皮革スウェードパッドにより前記
イオン交換処理が施された基板面の仕上げ研磨を行う工
程と、を有する情報記録媒体用基板の製造方法。
2. At least a step of preparing a disk-shaped glass substrate, a step of performing a low-temperature ion exchange treatment on the glass substrate, and the ion exchange treatment by an artificial leather suede pad while supplying water. Performing a finish polishing of the substrate surface.
【請求項3】 少なくとも、 円板状のガラス基板を用意する工程と、 水を供給しながら人工皮革スウェードパッドにより前記
ガラス基板の仕上げ研磨を行う工程と前記仕上げ研磨を
行ったガラス基板に低温型イオン交換処理を施す工程
と、を有する情報記録媒体用基板の製造方法。
3. At least a step of preparing a disk-shaped glass substrate, a step of performing finish polishing of the glass substrate with an artificial leather suede pad while supplying water, and a low-temperature mold for the glass substrate having been subjected to the finish polishing. Performing an ion exchange treatment.
【請求項4】 少なくとも、 円板状のガラス基板を用意する工程と、 水を供給しながら人工皮革スウェードパッドにより前記
ガラス基板の第1次仕上げ研磨を行う工程と前記仕上げ
研磨を行ったガラス基板に低温型イオン交換処理を施す
工程と、 水を供給しながら人工皮革スウェードパッドにより前記
イオン交換処理が施されたガラス基板の第2次仕上げ研
磨を行う工程とを有する情報記録媒体用基板の製造方
法。
4. At least a step of preparing a disk-shaped glass substrate, a step of performing primary finish polishing of the glass substrate with an artificial leather suede pad while supplying water, and a glass substrate having been subjected to the finish polishing Manufacturing a substrate for an information recording medium, comprising: performing a low-temperature ion exchange treatment on the glass substrate; and performing a second finish polishing of the glass substrate subjected to the ion exchange treatment by an artificial leather suede pad while supplying water. Method.
【請求項5】 請求項1〜4に記載の方法により製造さ
れた情報記録媒体用基板であり、原子間力顕微鏡により
10μm□の測定領域で測定した主表面の表面粗さがR m
ax100Å以下、かつRa 5Å以下である情報記録媒体用基
板。
5. A substrate for an information recording medium manufactured by the method according to claim 1, wherein the main surface has a surface roughness R m measured in an area of 10 μm square by an atomic force microscope.
An information recording medium substrate with an ax of 100 mm or less and a Ra of 5 mm or less.
JP10098744A 1998-03-25 1998-04-10 Manufacture of information recording medium substrate and the information recording medium substrate Pending JPH11339260A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10098744A JPH11339260A (en) 1998-03-25 1998-04-10 Manufacture of information recording medium substrate and the information recording medium substrate

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP10-78089 1998-03-25
JP7808998 1998-03-25
JP10098744A JPH11339260A (en) 1998-03-25 1998-04-10 Manufacture of information recording medium substrate and the information recording medium substrate

Publications (1)

Publication Number Publication Date
JPH11339260A true JPH11339260A (en) 1999-12-10

Family

ID=26419164

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10098744A Pending JPH11339260A (en) 1998-03-25 1998-04-10 Manufacture of information recording medium substrate and the information recording medium substrate

Country Status (1)

Country Link
JP (1) JPH11339260A (en)

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