JPH11265913A - Bonding method for electronic component with bump - Google Patents

Bonding method for electronic component with bump

Info

Publication number
JPH11265913A
JPH11265913A JP6659398A JP6659398A JPH11265913A JP H11265913 A JPH11265913 A JP H11265913A JP 6659398 A JP6659398 A JP 6659398A JP 6659398 A JP6659398 A JP 6659398A JP H11265913 A JPH11265913 A JP H11265913A
Authority
JP
Japan
Prior art keywords
bonding
bump
electronic component
bumps
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6659398A
Other languages
Japanese (ja)
Other versions
JP3833812B2 (en
Inventor
Masafumi Hisaka
雅史 桧作
Seiji Takahashi
誠司 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP6659398A priority Critical patent/JP3833812B2/en
Publication of JPH11265913A publication Critical patent/JPH11265913A/en
Application granted granted Critical
Publication of JP3833812B2 publication Critical patent/JP3833812B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/75Apparatus for connecting with bump connectors or layer connectors

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a bonding method for electronic component with bump capable of stably performing bonding improved in the strength of bonding. SOLUTION: Concerning the bonding method for pressing the bump of an electronic component with bump through a bonding tool to the electrode of a substrate and bonding the bump to the electrode of the substrate by applying vibrations, a first pressing load F1 capable of generating plastic deformation and a second pressing load F2 as a proper bonding load for bonding the bump are set to the bump. At the time of bonding operation, the electronic component is first pressed with the first pressing load F1 and next pressed with the second pressing load F2, and vibrations are applied to the electronic component with bump. Thus, even when there is a difference in the heights of substrates or dispersion in the heights of bumps, bonding improved in the strength of bonding can be performed while making uniform the state of abutting the bump and the electrode of the substrate.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、バンプ付電子部品
を基板にボンディングするバンプ付電子部品のボンディ
ング方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for bonding a bumped electronic component to a substrate and bonding the bumped electronic component to a substrate.

【0002】[0002]

【従来の技術】フリップチップなどのバンプ付電子部品
の実装方法として、超音波圧接を用いる方法が知られて
いる。この方法は、バンプ付電子部品のバンプを基板に
形成された電極に押圧し、バンプ付電子部品に超音波振
動を付与しながらバンプと基板の接合面を相互に摩擦さ
せてボンディングするものである。
2. Description of the Related Art As a method for mounting electronic components with bumps such as flip chips, a method using ultrasonic pressure welding is known. According to this method, a bump of an electronic component with a bump is pressed against an electrode formed on a substrate, and ultrasonic vibration is applied to the electronic component with a bump so that a bonding surface between the bump and the substrate is rubbed with each other to perform bonding. .

【0003】[0003]

【発明が解決しようとする課題】ところで、この超音波
圧接によってバンプと電極とを良好に接合するために
は、バンプと基板の電極とが接合に必要とされる適正な
条件で接触していることが求められ、多数のバンプを有
するバンプ付電子部品の場合には、これら全てのバンプ
を均一に電極に当接させることが必要となる。ところ
が、電子部品に形成されるバンプの高さは、製造工程で
の誤差により必ずしも均一ではなくある範囲内でばらつ
いている。またバンプ付電子部品が実装される基板も完
全な平面ではなく、うねりを生じて部分的に高低差が存
在する場合がある。
By the way, in order to bond the bump and the electrode well by this ultrasonic pressure welding, the bump and the electrode of the substrate are in contact under appropriate conditions required for the bonding. In the case of a bumped electronic component having a large number of bumps, it is necessary to uniformly contact all of these bumps with the electrodes. However, the height of the bump formed on the electronic component is not always uniform due to an error in the manufacturing process and varies within a certain range. Also, the substrate on which the electronic component with bumps is mounted may not be a perfect plane, but may have undulation and a partial height difference.

【0004】このため、ボンディング時にバンプ付電子
部品を基板に搭載した状態では、バンプと基板の電極面
との当り面は、必ずしも全てのバンプが均一に当接した
状態とはならず、部分的にバンプが電極と接触していな
い、いわゆる片当りの状態となる場合がある。
For this reason, when the electronic component with bumps is mounted on the substrate at the time of bonding, the contact surface between the bumps and the electrode surface of the substrate is not necessarily in a state in which all the bumps are in uniform contact, but is partially formed. In some cases, the bumps are not in contact with the electrodes, that is, in a so-called one-sided state.

【0005】この状態のままボンディング動作を開始し
て超音波振動を付与すると、接触状態の良い一部のバン
プに超音波振動が集中して作用したり、またバンプと電
極の間に部分的に隙間があるためにボンディングツール
と電子部品との当り面にガタが生じる結果、正常なボン
ディングが行われずに接合強度が低下するという問題点
があった。
[0005] When the ultrasonic vibration is applied by starting the bonding operation in this state, the ultrasonic vibration concentrates on some of the bumps in good contact state, or partially acts between the bump and the electrode. Since there is a gap, rattling occurs on the contact surface between the bonding tool and the electronic component. As a result, normal bonding is not performed, and the bonding strength is reduced.

【0006】そこで本発明は、接合強度に優れたボンデ
ィングを安定して行うことができるバンプ付電子部品の
ボンディング方法を提供することを目的とする。
Accordingly, an object of the present invention is to provide a method of bonding electronic components with bumps, which can stably perform bonding with excellent bonding strength.

【0007】[0007]

【課題を解決するための手段】本発明のバンプ付電子部
品のボンディング方法は、バンプ付電子部品のバンプを
ボンディングツールにより基板の電極に対して押圧する
とともに、このバンプ付電子部品に振動を付与して前記
バンプを基板の電極にボンディングするバンプ付電子部
品のボンディング方法であって、前記バンプに塑性変形
を生じさせ得る大きさの第1の押圧荷重と、この第1の
押圧荷重よりも低荷重であって前記バンプを電極にボン
ディングするための適正なボンディング荷重である第2
の押圧荷重とを設定しておき、ボンディング動作時に
は、まず前記第1の押圧荷重でバンプ付電子部品を基板
の電極に押圧し、次いで前記第2の押圧荷重で押圧する
とともに前記バンプ付電子部品に振動を付与するように
した。
According to the method of bonding an electronic component with a bump of the present invention, a bump of the electronic component with a bump is pressed against an electrode of a substrate by a bonding tool and vibration is applied to the electronic component with a bump. And bonding the bump to an electrode of a substrate by bonding the bump to an electrode of a substrate, wherein the first pressing load is large enough to cause plastic deformation of the bump, and is lower than the first pressing load. A second load, which is an appropriate bonding load for bonding the bump to the electrode.
During the bonding operation, first, the electronic component with bumps is pressed against the electrode of the substrate by the first pressing load, and then the electronic component with bumps is pressed by the second pressing load. The vibration was applied to.

【0008】本発明によれば、ボンディング動作時に、
バンプに塑性変形を生じさせる大きさの第1の押圧荷重
で押圧した後に、この第1の押圧荷重よりも低い適正な
ボンディング荷重で押圧しながら振動を付与することに
より、バンプと基板の電極との当接状態を均一にして接
合強度に優れたボンディングを行うことができる。
According to the present invention, during the bonding operation,
After the bump is pressed with a first pressing load of a size that causes plastic deformation, the bump is pressed with an appropriate bonding load lower than the first pressing load, and vibration is applied to the bump to form an electrode between the bump and the substrate. And the bonding state excellent in bonding strength can be performed.

【0009】[0009]

【発明の実施の形態】次に本発明の実施の形態を図面を
参照して説明する。図1は本発明の一実施の形態のバン
プ付電子部品のボンディング装置の正面図、図2は同バ
ンプ付電子部品のボンディングツールの斜視図、図3
(a)は同バンプ付電子部品のボンディングツールの正
面図、図3(b)は同バンプ付電子部品のボンディング
ツールの平面図、図4(a),(b)は同バンプ付電子
部品と基板の断面図、図5(a)は同バンプ付電子部品
のボンディング時の押圧荷重の変化を示すグラフ、
(b)は同バンプ付電子部品のボンディング時の超音波
振動付与のタイミングチャートである。
Embodiments of the present invention will now be described with reference to the drawings. FIG. 1 is a front view of a bonding apparatus for an electronic component with bumps according to an embodiment of the present invention. FIG. 2 is a perspective view of a bonding tool for the electronic component with bumps.
3A is a front view of a bonding tool for the electronic component with bumps, FIG. 3B is a plan view of a bonding tool for the electronic component with bumps, and FIGS. FIG. 5A is a cross-sectional view of a substrate, and FIG. 5A is a graph showing a change in a pressing load during bonding of the electronic component with bumps;
(B) is a timing chart of the application of ultrasonic vibration during bonding of the electronic component with bumps.

【0010】まず、図1を参照してバンプ付電子部品の
ボンディング装置の全体構造を説明する。1は支持フレ
ームであって、その前面には第1昇降板2と第2昇降板
3が昇降自在に設けられている。第1昇降板2にはシリ
ンダ4が装着されており、そのロッド5は第2昇降板3
に結合されている。第2昇降板3にはボンディングヘッ
ド10が装着されている。支持フレーム1の上面にはZ
軸モータ6が設けられている。Z軸モータ6は垂直な送
りねじ7を回転させる。送りねじ7は第1昇降板2の背
面に設けられたナット8に螺合している。したがってZ
軸モータ6が駆動して送りねじ7が回転すると、ナット
8は送りねじ7に沿って上下動し、第1昇降板2や第2
昇降板3も上下動する。
First, the overall structure of a bonding apparatus for electronic components with bumps will be described with reference to FIG. Reference numeral 1 denotes a support frame, on the front surface of which a first lifting plate 2 and a second lifting plate 3 are provided so as to be able to move up and down. A cylinder 4 is mounted on the first lifting plate 2, and the rod 5 is attached to the second lifting plate 3.
Is joined to. The bonding head 10 is mounted on the second lifting plate 3. Z on the upper surface of the support frame 1
A shaft motor 6 is provided. The Z-axis motor 6 rotates a vertical feed screw 7. The feed screw 7 is screwed into a nut 8 provided on the back surface of the first lifting plate 2. Therefore Z
When the shaft motor 6 is driven and the feed screw 7 is rotated, the nut 8 moves up and down along the feed screw 7, and the first lifting plate 2 and the second
The lifting plate 3 also moves up and down.

【0011】図1において、基板32は基板ホルダ34
上に載せられており、基板ホルダ34はテーブル35上
に載せられている。テーブル35は可動テーブルであっ
て、基板32をX方向やY方向へ水平移動させ、基板3
2を所定の位置に位置決めする。
In FIG. 1, a substrate 32 is a substrate holder 34.
The substrate holder 34 is placed on a table 35. The table 35 is a movable table, and moves the substrate 32 horizontally in the X direction and the Y direction.
2 is positioned at a predetermined position.

【0012】42はカメラであって、一軸テーブル43
に装着されている。44はカメラ42から前方へ延出す
る鏡筒である。カメラ42を一軸テーブル43に沿って
前進させ、鎖線で示すように鏡筒44の先端部をボンデ
ィングツール14の下面に吸着して保持されたバンプ付
電子部品30と基板32の間に位置させ、その状態でバ
ンプ付電子部品30と基板32の位置をカメラ42で観
察する。そしてこの観察結果によりバンプ付電子部品3
0と基板32の相対的な位置ずれを検出する。検出され
た位置ずれは、テーブル35を駆動して基板32をX方
向やY方向へ水平移動させることにより補正し、これに
よりバンプ付電子部品30と基板32の位置合わせがな
される。
Reference numeral 42 denotes a camera, which is a uniaxial table 43
It is attached to. Reference numeral 44 denotes a lens barrel extending forward from the camera 42. The camera 42 is moved forward along the uniaxial table 43, and the tip of the lens barrel 44 is positioned between the electronic component 30 with bumps and the substrate 32 held by being sucked and held on the lower surface of the bonding tool 14, as indicated by a chain line, In this state, the positions of the electronic component with bumps 30 and the substrate 32 are observed with the camera 42. According to the observation result, the electronic component 3 with bumps
A relative displacement between 0 and the substrate 32 is detected. The detected positional deviation is corrected by driving the table 35 to horizontally move the substrate 32 in the X direction or the Y direction, whereby the electronic component 30 with bumps and the substrate 32 are aligned.

【0013】図1において、50は主制御部であり、モ
ータ駆動部51を介してZ軸モータ6を制御し、またテ
ーブル制御部52を介してテーブル35を制御し、また
認識部53を介してカメラ42に接続されている。また
シリンダ4は荷重制御部54を介して主制御部50に接
続されており、シリンダ4のロッド5の突出力すなわち
ボンディングツール14でバンプ付電子部品30を基板
32に押し付ける押圧荷重が制御される。
In FIG. 1, reference numeral 50 denotes a main control unit, which controls the Z-axis motor 6 via a motor drive unit 51, controls the table 35 via a table control unit 52, and receives a signal via a recognition unit 53. Connected to the camera 42. The cylinder 4 is connected to the main control unit 50 via a load control unit 54, and the projection load of the rod 5 of the cylinder 4, that is, the pressing load for pressing the bumped electronic component 30 against the substrate 32 by the bonding tool 14 is controlled. .

【0014】ボンディングヘッド10の本体11の下端
部にはホルダ12が結合されている。ホルダ12にはブ
ロック13が装着され、ブロック13にはボンディング
ツール14が固定されている。以下、図2〜図4を参照
してブロック13およびボンディングツール14につい
て説明する。
A holder 12 is connected to the lower end of the main body 11 of the bonding head 10. A block 13 is mounted on the holder 12, and a bonding tool 14 is fixed to the block 13. Hereinafter, the block 13 and the bonding tool 14 will be described with reference to FIGS.

【0015】図2に示すように、ボンディングツール1
4のホーン15は細長形状の棒状体であり、側面にはホ
ーン15の中央から等距離隔てられた4ヶ所にリブ15
aがホーン15と一体的に設けられている。ボンディン
グツール14は、リブ15aによってブロック13の下
面に固定されている。
As shown in FIG. 2, the bonding tool 1
The horn 15 is an elongated rod-shaped body, and ribs 15 are provided on four sides of the horn 15 at equal distances from the center of the horn 15.
a is provided integrally with the horn 15. The bonding tool 14 is fixed to the lower surface of the block 13 by a rib 15a.

【0016】ボンディングツール14の中央部の下面に
は、下方に突出しバンプ付電子部品30を真空吸着して
保持する保持部15eが設けられ、この保持部15eの
下面は電子部品吸着用の吸着面15fとなっている。吸
着面15fにはホーン15に設けられた真空吸引用の内
孔16の一端が開口して吸着孔16aを形成している。
内孔16の他端はホーン15の上面のリブ15aの位置
に開口して吸引孔16bを形成している。
On the lower surface of the center of the bonding tool 14, there is provided a holding portion 15e which projects downward and holds the electronic component 30 with a bump by vacuum suction. The lower surface of the holding portion 15e has a suction surface for sucking the electronic component. 15f. One end of an inner hole 16 for vacuum suction provided in the horn 15 is opened in the suction surface 15f to form a suction hole 16a.
The other end of the inner hole 16 opens at the position of the rib 15a on the upper surface of the horn 15 to form a suction hole 16b.

【0017】ブロック13の側面に設けられた突部13
aには管部18が下方に突出して設けられており、図4
に示すように管部18の下端部に装着された吸着パッド
19は、ホーン15の上面の吸引孔16bの位置に当接
している。したがって突部13aに接続され突部13a
の内孔13bによって管部18と連通したチューブ20
から、吸引装置21を駆動してエアを吸引することによ
り、内孔16を介して吸着面15eに開口した吸着孔1
6a(図3(a),(b))から真空吸引し、この吸着
面15fにバンプ付電子部品30を真空吸着して保持す
ることができる。
The protrusion 13 provided on the side surface of the block 13
4A is provided with a tube portion 18 projecting downward.
The suction pad 19 attached to the lower end of the tube 18 is in contact with the position of the suction hole 16b on the upper surface of the horn 15, as shown in FIG. Therefore, the projection 13a is connected to the projection 13a.
Tube 20 communicating with the tube portion 18 by the inner hole 13b of the tube 20
Then, by driving the suction device 21 to suck air, the suction hole 1 opened on the suction surface 15 e through the inner hole 16.
6a (FIGS. 3 (a) and 3 (b)), it is possible to hold the electronic component 30 with bumps by vacuum suction on the suction surface 15f.

【0018】ホーン15の側端面には振動付与手段であ
る振動子17が装着されている。振動子17を駆動する
ことにより、ホーン15には縦振動が付与され、保持部
15eは水平方向(図3(a)に示す矢印a方向)に振
動する。図3(b)に示すように、ホーン15の形状は
両端部15bからテーパ部15cを経て中央部15dの
方向に順次幅が絞られた形状となっており、これによ
り、振動子17より保持部15eに伝達される経路にお
いて超音波振動の振幅は増幅され、保持部15eには振
動子17が発振する振幅以上の振動が伝達される。
A vibrator 17 as a vibration applying means is mounted on a side end surface of the horn 15. By driving the vibrator 17, longitudinal vibration is applied to the horn 15, and the holding portion 15e vibrates in the horizontal direction (the direction of the arrow a shown in FIG. 3A). As shown in FIG. 3B, the horn 15 has a shape in which the width is gradually reduced in the direction from the both end portions 15b to the center portion 15d via the tapered portion 15c, and thereby the horn 15 is held by the vibrator 17. The amplitude of the ultrasonic vibration is amplified in the path transmitted to the portion 15e, and a vibration having an amplitude equal to or greater than the amplitude oscillated by the vibrator 17 is transmitted to the holding portion 15e.

【0019】このバンプ付電子部品のボンディング装置
は上記のように構成されており、次に動作を説明する。
図1においてボンディングツール14の吸着面15eに
バンプ付電子部品30を真空吸着させて保持し、基板3
2の上方に位置させる。そこで鏡筒44を前進させてカ
メラ42でバンプ付電子部品30と基板32の画像を入
手し、認識部53へ画像データが送られる。主制御部5
0はこの画像データからバンプ付電子部品30と基板3
2の相対的な位置ずれを検出し、この検出結果にしたが
ってテーブル35を駆動し、基板32を水平移動させて
位置補正を行う。
The bonding device for an electronic component with bumps is configured as described above, and the operation will be described next.
In FIG. 1, the electronic component 30 with bumps is held on the suction surface 15 e of the bonding tool 14 by vacuum suction.
2 above. Then, the lens barrel 44 is advanced, and the images of the electronic component 30 with bumps and the substrate 32 are obtained by the camera 42, and the image data is sent to the recognition unit 53. Main control unit 5
0 indicates the electronic component 30 with bumps and the substrate 3 based on the image data.
2 is detected, the table 35 is driven in accordance with the detection result, and the substrate 32 is horizontally moved to perform position correction.

【0020】次にZ軸モータ6が駆動してボンディング
ヘッド10が下降し、バンプ付電子部品30のバンプを
基板32の電極33に押圧する。このとき、図4(a)
に示すように基板32の上面に高低差があり、部分的に
バンプ31と電極33の間に隙間cが生じる場合があ
る。そこで、このような基板32の上面の高低差や、あ
るいはバンプ31の高さのばらつきによって生じるバン
プ31と電極33の隙間cや当接状態の不均一を解消す
るため、ボンディング動作時に荷重制御部54により押
圧荷重の制御を行う。
Next, the Z-axis motor 6 is driven to lower the bonding head 10 and press the bumps of the electronic component 30 with bumps against the electrodes 33 of the substrate 32. At this time, FIG.
As shown in (2), there is a height difference on the upper surface of the substrate 32, and a gap c may be partially generated between the bump 31 and the electrode 33. Therefore, in order to eliminate such a difference in height between the upper surface of the substrate 32 and the gap c between the bumps 31 and the electrodes 33 and non-uniform contact states caused by variations in the height of the bumps 31, a load control unit is required during the bonding operation. The pressing load is controlled by 54.

【0021】この押圧荷重の制御について、図5を参照
して説明する。まずボンディング動作開始時に、ボンデ
ィングツール14を下降させる。これにより、図5
(a)に示すようにバンプ付電子部品30のバンプ31
が基板32の電極33に当接したタイミングt1から押
圧荷重は上昇する。そして押圧荷重がバンプ31に塑性
変形を生じさせ得る荷重である第1の押圧荷重F1に到
達したならば、この荷重にて所定時間押圧状態を保持す
る。
The control of the pressing load will be described with reference to FIG. First, at the start of the bonding operation, the bonding tool 14 is lowered. As a result, FIG.
As shown in (a), the bump 31 of the electronic component 30 with a bump is provided.
The pressing load increases from timing t <b> 1 at which the substrate abuts on the electrode 33 of the substrate 32. When the pressing load reaches the first pressing load F1, which is a load capable of causing plastic deformation of the bump 31, the pressed state is maintained for a predetermined time by this load.

【0022】これにより、バンプ31のうち既に電極3
3に当接しているものから順次押圧荷重により塑性変形
し、この結果バンプ31の高さのばらつきや基板32の
うねりに起因する片当り状態が解消されて、図4(b)
に示すように全てのバンプ31が電極33に当接した状
態となる。この第1の押圧荷重F1は、対象となるバン
プ付電子部品30のバンプ31のサイズや数量に基づい
て計算により設定しても良く、また実際のボンディング
を試行した結果に基づいて設定しても良い。
As a result, the electrodes 3 of the bumps 31 have already been formed.
3 is sequentially plastically deformed by the pressing load, and as a result, the unevenness of the height of the bumps 31 and the one-sided contact state caused by the undulation of the substrate 32 are eliminated, and FIG.
As a result, all the bumps 31 come into contact with the electrodes 33 as shown in FIG. The first pressing load F1 may be set by calculation based on the size and quantity of the bumps 31 of the target electronic component 30 with bumps, or may be set based on the result of actual bonding trial. good.

【0023】次いで、図5(a)に示すように、タイミ
ングt2にて押圧荷重を第1の押圧荷重F1から第2の
押圧荷重F2に切り換える。この第2の押圧荷重は、第
1の押圧荷重よりも低荷重に設定され、超音波振動によ
ってボンディングするために最適な荷重として設定され
る。このタイミングt2と同時に、またはタイミングt
2以後振動子17を駆動してボンディングツール14に
よりバンプ付電子部品30に超音波振動を付与する。こ
れにより、全てのバンプ31と電極33とが均一に当接
した状態で、当接面に超音波振動が作用し、偏りのない
均一なボンディングを行うことができる。
Next, as shown in FIG. 5A, at timing t2, the pressing load is switched from the first pressing load F1 to the second pressing load F2. The second pressing load is set to be lower than the first pressing load, and is set as an optimum load for bonding by ultrasonic vibration. At the same time as the timing t2 or at the timing t
After step 2, the vibrator 17 is driven to apply ultrasonic vibration to the bumped electronic component 30 by the bonding tool 14. Thereby, in a state where all the bumps 31 and the electrodes 33 are uniformly in contact with each other, ultrasonic vibration is applied to the contact surface, and uniform bonding without deviation can be performed.

【0024】このように本実施の形態は、接合不良の原
因となるバンプ31と電極33の片当り状態を解消する
ために高荷重でバンプ付電子部品30を押圧し、その後
は適正なボンディング荷重に切り換えるようにしたもの
である。これにより、過大な高荷重でボンディングを行
うことによるバンプ31のつぶれや接合強度の低下等の
新たな接合不良を招くことなく、片当り状態を解消して
接合強度に優れた良好なボンディングを行うことができ
る。
As described above, in the present embodiment, the bumped electronic component 30 is pressed with a high load in order to eliminate the one-sided contact state of the bump 31 and the electrode 33 which causes the bonding failure. Is switched. This eliminates the one-sided contact state and performs good bonding excellent in bonding strength without causing new bonding defects such as crushing of the bump 31 and reduction in bonding strength due to bonding with an excessively high load. be able to.

【0025】[0025]

【発明の効果】本発明によれば、ボンディング動作時
に、バンプに塑性変形を生じさせ得る第1の押圧荷重で
押圧してバンプと基板の電極の片当り状態を解消した後
に、この第1の押圧荷重よりも低い適正なボンディング
荷重で押圧しながら振動を付与するようにしているの
で、過大な高荷重でボンディングを行うことによるバン
プのつぶれや接合強度の低下等の新たな接合不良を招く
ことなく、片当り状態を解消して接合強度に優れた良好
なボンディングを行うことができる。
According to the present invention, during the bonding operation, the bump is pressed by the first pressing load that can cause plastic deformation of the bump to eliminate the contact between the bump and the electrode of the substrate. Vibration is applied while pressing with an appropriate bonding load that is lower than the pressing load, so new bonding defects such as crushed bumps and reduced bonding strength due to bonding with an excessively high load are caused. In addition, it is possible to eliminate the one-sided contact state and perform good bonding with excellent bonding strength.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態のバンプ付電子部品のボ
ンディング装置の正面図
FIG. 1 is a front view of a bonding apparatus for an electronic component with bumps according to an embodiment of the present invention.

【図2】本発明の一実施の形態のバンプ付電子部品のボ
ンディングツールの斜視図
FIG. 2 is a perspective view of a bonding tool for an electronic component with bumps according to an embodiment of the present invention.

【図3】(a)本発明の一実施の形態のバンプ付電子部
品のボンディングツールの正面図(b)本発明の一実施
の形態のバンプ付電子部品のボンディングツールの平面
3A is a front view of a bonding tool for an electronic component with bumps according to one embodiment of the present invention; FIG. 3B is a plan view of a bonding tool for an electronic component with bumps according to one embodiment of the present invention;

【図4】(a)本発明の一実施の形態のバンプ付電子部
品と基板の断面図 (b)本発明の一実施の形態のバンプ付電子部品と基板
の断面図
4A is a cross-sectional view of an electronic component with a bump and a substrate according to an embodiment of the present invention. FIG. 4B is a cross-sectional view of an electronic component with a bump and a substrate according to an embodiment of the present invention.

【図5】(a)本発明の一実施の形態のバンプ付電子部
品のボンディング時の押圧荷重の変化を示すグラフ (b)本発明の一実施の形態のバンプ付電子部品のボン
ディング時の超音波振動付与のタイミングチャート
FIG. 5A is a graph showing a change in a pressing load at the time of bonding of the electronic component with bumps according to the embodiment of the present invention; Timing chart for applying sound wave vibration

【符号の説明】[Explanation of symbols]

10 ボンディングヘッド 13 ブロック 14 ボンディングツール 15e 保持部 16a 吸着孔 17 振動子 30 バンプ付電子部品 31 バンプ 32 基板 33 電極 50 主制御部 54 荷重制御部 DESCRIPTION OF SYMBOLS 10 Bonding head 13 Block 14 Bonding tool 15e Holding part 16a Suction hole 17 Vibrator 30 Electronic component with bump 31 Bump 32 Substrate 33 Electrode 50 Main control part 54 Load control part

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】バンプ付電子部品のバンプをボンディング
ツールにより基板の電極に対して押圧するとともに、こ
のバンプ付電子部品に振動を付与して前記バンプを基板
の電極にボンディングするバンプ付電子部品のボンディ
ング方法であって、前記バンプに塑性変形を生じさせ得
る大きさの第1の押圧荷重と、この第1の押圧荷重より
も低荷重であって前記バンプを電極にボンディングする
ための適正なボンディング荷重である第2の押圧荷重と
を設定しておき、ボンディング動作時には、まず前記第
1の押圧荷重でバンプ付電子部品を基板の電極に押圧
し、次いで前記第2の押圧荷重で押圧するとともに前記
バンプ付電子部品に振動を付与することを特徴とするバ
ンプ付電子部品のボンディング方法。
An electronic component with a bump, wherein the bump of the electronic component with a bump is pressed against an electrode of a substrate by a bonding tool and vibration is applied to the electronic component with a bump to bond the bump to the electrode of the substrate. A bonding method, comprising: a first pressing load large enough to cause plastic deformation of the bump; and a proper bonding for bonding the bump to an electrode with a lower load than the first pressing load. A second pressing load, which is a load, is set, and at the time of the bonding operation, first, the electronic component with bumps is pressed against the electrode of the substrate by the first pressing load, and then pressed by the second pressing load. A method of bonding electronic components with bumps, wherein vibration is applied to the electronic components with bumps.
JP6659398A 1998-03-17 1998-03-17 Bonding method for electronic parts with bumps Expired - Fee Related JP3833812B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6659398A JP3833812B2 (en) 1998-03-17 1998-03-17 Bonding method for electronic parts with bumps

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6659398A JP3833812B2 (en) 1998-03-17 1998-03-17 Bonding method for electronic parts with bumps

Publications (2)

Publication Number Publication Date
JPH11265913A true JPH11265913A (en) 1999-09-28
JP3833812B2 JP3833812B2 (en) 2006-10-18

Family

ID=13320395

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6659398A Expired - Fee Related JP3833812B2 (en) 1998-03-17 1998-03-17 Bonding method for electronic parts with bumps

Country Status (1)

Country Link
JP (1) JP3833812B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011077093A (en) * 2009-09-29 2011-04-14 Texas Instr Japan Ltd Ultrasonic flip chip mounting method and ultrasonic mounting device
US8308049B2 (en) 2008-10-22 2012-11-13 Kabushiki Kaisha Toshiba Wire bonding method
JP2013141043A (en) * 2013-04-24 2013-07-18 Texas Instr Japan Ltd Ultrasonic junction method
JP2016107309A (en) * 2014-12-08 2016-06-20 株式会社ニフコ Ultrasonic welding device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8308049B2 (en) 2008-10-22 2012-11-13 Kabushiki Kaisha Toshiba Wire bonding method
JP2011077093A (en) * 2009-09-29 2011-04-14 Texas Instr Japan Ltd Ultrasonic flip chip mounting method and ultrasonic mounting device
JP2013141043A (en) * 2013-04-24 2013-07-18 Texas Instr Japan Ltd Ultrasonic junction method
JP2016107309A (en) * 2014-12-08 2016-06-20 株式会社ニフコ Ultrasonic welding device

Also Published As

Publication number Publication date
JP3833812B2 (en) 2006-10-18

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