JPH11145060A - Thin film manufacture device and photoelectric conversion element - Google Patents

Thin film manufacture device and photoelectric conversion element

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Publication number
JPH11145060A
JPH11145060A JP9304008A JP30400897A JPH11145060A JP H11145060 A JPH11145060 A JP H11145060A JP 9304008 A JP9304008 A JP 9304008A JP 30400897 A JP30400897 A JP 30400897A JP H11145060 A JPH11145060 A JP H11145060A
Authority
JP
Japan
Prior art keywords
film
film forming
chamber
substrate
thin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9304008A
Other languages
Japanese (ja)
Other versions
JP3475752B2 (en
Inventor
Katsuya Tabuchi
勝也 田淵
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP30400897A priority Critical patent/JP3475752B2/en
Publication of JPH11145060A publication Critical patent/JPH11145060A/en
Application granted granted Critical
Publication of JP3475752B2 publication Critical patent/JP3475752B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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  • Photovoltaic Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To raise the air tightness between a film growth chamber and a common vacuum vessel so as to form a high-quality film and raise the photoelectric conversion efficiency of the photoelectric conversion element, by making the boundary between the film growth chamber and the common vacuum vessel air-tight, with each seal part in accordance across a board, and using inorganic material such as metal, ceramic, or the like as the seal part. SOLUTION: Band-shaped end plates 171 and 123 doubling as seal parts and a lip presser 172 are made of inorganic matter such as metal, ceramic, etc. low in degassification of Al, etc. In case that the width W of the sections to contact with a flexible board of the band-shaped ring end plates 171 and 123 doubling as seal parts installed in an upper film growth chamber wall body 22 and a lower film growth chamber 27 is made 10 mm or over, the air tightness can be secured. Furthermore, it is so arranged that the film growth chamber wall on one mobile side can bend and contact with the seal face precisely, when forming film growth chamber space across the board, thus the sealing property between the film growth chamber and the common chamber is ensured. Hereby, the leakage of gas to the common chamber at the time of having charged the film growth chamber with film growth gas can be reduced.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、薄膜光電変換素子
のような可撓性基板上に複数層を有する薄膜素子の製造
方法に用い、構成層毎にそれぞれ独立に成膜する成膜室
を複数有するステッピングロール方式の薄膜製造装置に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a thin film element having a plurality of layers on a flexible substrate such as a thin film photoelectric conversion element. The present invention relates to a stepping roll type thin film manufacturing apparatus having a plurality of thin films.

【0002】[0002]

【従来の技術】例えばアモルファスシリコン(以下a−
Siと記す)を主材料とした光電変換層を含む多層薄膜
からなる薄膜光電変換素子などを長尺の高分子材料ある
いはステンレス鋼などの金属からなる可撓性基板上に形
成しておき、後で裁断して個別化する方式は、量産性に
優れている。
2. Description of the Related Art For example, amorphous silicon (hereinafter referred to as a-
A thin film photoelectric conversion element or the like composed of a multilayer thin film including a photoelectric conversion layer mainly composed of Si) is formed on a flexible substrate made of a long polymer material or a metal such as stainless steel. The method of individualizing by cutting at is excellent in mass productivity.

【0003】長尺の可撓性基板上への複数層の成膜方式
として、各成膜室内を連続移動しながら成膜するロール
ツーロール方式と、成膜室毎に停止させて成膜した後、
成膜の終わった基板部分を成膜室外へ送り出すステッピ
ングロール方式とがある。例えば、プラズマ化学気相成
長(以下CVDと記す)により成膜するステッピングロ
ール方式では、成膜室開放−基板1フレーム移動−成膜
室封止−原料ガス導入−圧力制御−放電開始−放電終了
−原料ガス停止−ガス引き−成膜室開放からなる操作が
繰り返される。
[0003] As a method of forming a plurality of layers on a long flexible substrate, a roll-to-roll method in which a film is formed while continuously moving in each film forming chamber, and a film forming method in which the film is stopped in each film forming chamber. rear,
There is a stepping roll method in which a substrate portion on which film formation has been completed is sent out of a film formation chamber. For example, in the stepping roll method in which a film is formed by plasma enhanced chemical vapor deposition (hereinafter, referred to as CVD), a film forming chamber is opened, a substrate is moved by one frame, a film forming chamber is sealed, a source gas is introduced, a pressure is controlled, a discharge starts, and a discharge ends. The operation consisting of -stopping the source gas -degassing-opening the film forming chamber is repeated.

【0004】図6は共通真空室内に成膜室を複数有する
ステッピングロール成膜方式の薄膜製造装置の側面断面
図である。基板1はコア82から捲き出されコア83に
まきとられる間に、いくつかの成膜室80で成膜され
る。共通室81は複数の成膜室80を内部に収めてい
る。この装置は薄膜光電変換素子製造に用いることがで
き、成膜室ではスパッタ成膜またはプラズマCVD成膜
が行われる。このステッピングロール方式を採用した成
膜装置は、通常のロールツーロール成膜に比べ以下の点
が優れている。
FIG. 6 is a side sectional view of a thin film manufacturing apparatus of a stepping roll film forming system having a plurality of film forming chambers in a common vacuum chamber. The substrate 1 is formed in several film forming chambers 80 while being unwound from the core 82 and wound around the core 83. The common chamber 81 houses a plurality of film forming chambers 80 therein. This apparatus can be used for manufacturing a thin film photoelectric conversion element, and a sputter deposition or a plasma CVD deposition is performed in a deposition chamber. The film forming apparatus adopting the stepping roll method is superior to the usual roll-to-roll film forming in the following points.

【0005】(1)隣接する成膜室とのガス相互拡散が
ない。 (2)装置がコンパクトである。 ステッピングロール方式成膜装置に関する従来技術は、
特開平6−291349号公報、特開平7−6953号
公報、特開平7−221025号公報、特開平8−25
0431号公報、特開平8−293491号公報、特開
平9−63970号公報に開示されている。
(1) There is no gas mutual diffusion between the adjacent film forming chambers. (2) The device is compact. The conventional technology related to the stepping roll type film forming apparatus is as follows.
JP-A-6-291349, JP-A-7-6953, JP-A-7-221025, JP-A-8-25
No. 0431, Japanese Patent Application Laid-Open No. 8-293493, and Japanese Patent Application Laid-Open No. 9-63970.

【0006】特開平6−291349は、ステッピング
ロール方式成膜装置およびこの装置を用いた薄膜光電変
換素子の製造方法を開示している。帯状可撓性基板の上
に複数の異なる性質の薄膜を積層して光電変換素子を形
成する薄膜光電変換素子の製造方法において、一つの共
通真空室の中に配列された複数の成膜室に可撓性基板を
通し、基板の出入口を基板にシール材を介して壁によっ
て気密に保たれた成膜室内の所定の真空雰囲気内で停止
した状態の基板の表面上に成膜し、ついで成膜室壁から
離した状態の基板を次の成膜位置まで搬送する操作を繰
り返すことを開示している。そして、基板面が鉛直面内
にあることが有効としている。
JP-A-6-291349 discloses a stepping roll type film forming apparatus and a method of manufacturing a thin film photoelectric conversion element using the apparatus. In a method for manufacturing a thin film photoelectric conversion element, in which a plurality of thin films having different properties are stacked on a strip-shaped flexible substrate to form a photoelectric conversion element, a plurality of film formation chambers arranged in one common vacuum chamber are provided. Through a flexible substrate, a film is formed on the surface of the substrate which is stopped in a predetermined vacuum atmosphere in a film forming chamber in which the entrance and exit of the substrate are kept airtight by a wall through a sealing material. It discloses that the operation of transporting the substrate separated from the film chamber wall to the next film formation position is repeated. And it is effective that the substrate surface is in a vertical plane.

【0007】また、成膜室内で基板に接触する電極と基
板の成膜面に対向する電極との間に電圧を印加して成膜
し、基板搬送時に基板に接触していた電極を基板より離
すことが有効としている。用いられる基板が、一面に導
電膜を被着した樹脂フィルムであるか、金属フィルムで
あるか、あるいは一面に絶縁膜を介して導電膜を被着し
た金属フィルムであることが有効であるとしてる。
Further, a voltage is applied between an electrode in contact with the substrate and an electrode facing the film-forming surface of the substrate in the film-forming chamber to form a film. Separating is effective. It is said that it is effective that the substrate used is a resin film having a conductive film applied on one surface, a metal film, or a metal film having a conductive film applied on one surface via an insulating film. .

【0008】さらに、帯状可撓性基板の上に複数の異な
る性質の薄膜を積層して光電変換層を形成する薄膜光電
変換素子の製造装置において、共通真空室の長手方向の
両端近くにそれぞれ配置されたロールを備え、その共通
真空室内を一方のロールから巻きほぐされた方のロール
へ巻き取ることのできる可撓性基板が通る複数の成膜室
を有し、各成膜室は基板の出入口で基板にシール材を介
して密着する壁によって区切られ、その成膜室壁のシー
ル材は基板から離れる位置まで退避可能であり、共通真
空室および各成膜室がそれぞれ別個の排気系に接続され
たものとする。そして、各成膜室に基板に接触し、基板
から離れた位置まで退避可能の電極と、その電極の対向
電極とを備えることが有効としている。また、両ロール
の軸および両電極の電極面が鉛直であることが有効であ
るとしている。
Further, in a manufacturing apparatus for a thin film photoelectric conversion element in which a plurality of thin films having different properties are laminated on a strip-shaped flexible substrate to form a photoelectric conversion layer, the thin film photoelectric conversion elements are arranged near both ends in the longitudinal direction of a common vacuum chamber. A plurality of film forming chambers through which a flexible substrate that can be wound up from one of the rolls to the roll that has been unwound through the common vacuum chamber is provided. At the entrance and exit, it is separated by a wall that is in close contact with the substrate via a sealing material, and the sealing material on the film forming chamber wall can be retracted to a position away from the substrate, and the common vacuum chamber and each film forming chamber are connected to separate exhaust systems. Assume that they are connected. Further, it is effective to provide each deposition chamber with an electrode which is in contact with the substrate and which can be retracted to a position distant from the substrate, and a counter electrode of the electrode. Further, it is effective that the axes of both rolls and the electrode surfaces of both electrodes are vertical.

【0009】特開平7−6953は、互いに平行に対向
する二つの平板電極の一方に高周波電極を印加し、他方
を設置して両電極間の成膜室空間内にプラズマを発生さ
せ、反応ガスを分解して基板上に薄膜を堆積させるプラ
ズマCVD法において、反応空間を平行平板電極と側壁
とによって囲み、高周波電極の共通室空間側を1 ×10 -3
Torr以下の真空に接触させる、あるいは、高周波電極の
共通室空間側を大気に接触させるものである。このプラ
ズマCVD法により高周波電極背面での放電を防ぎ、放
電の均一性が得られて膜質を向上させることができる。
また、一つの真空室内に放電を封じ込めた成膜室を複数
置き、真空室内で送り出し、巻き取りの行われる可撓性
基板上に順次成膜すれば、ロールツーロール方式装置の
ようにバッファー真空室を設ける必要がなく、装置全体
のコンパクト化、軽量化を図ることができると共に、大
幅な製造コストの低減が可能となることを開示してい
る。
[0009] Japanese Patent Application Laid-Open No. 7-6953 is opposed to each other in parallel.
The high frequency electrode is applied to one of the two plate electrodes
To generate plasma in the deposition chamber space between the two electrodes.
To decompose the reaction gas and deposit a thin film on the substrate.
In the plasma CVD method, the reaction space is defined by parallel plate electrodes and side walls.
And the common chamber space side of the high-frequency electrode is 1 × 10 -3
Contact with a vacuum of Torr or less, or
The common room space side is brought into contact with the atmosphere. This plastic
The plasma CVD method prevents discharge on the back of the high-frequency electrode,
Uniformity of electricity can be obtained and the film quality can be improved.
In addition, there are multiple deposition chambers that contain discharges in one vacuum chamber.
Flexible to be placed, sent out in a vacuum chamber, and wound up
By sequentially forming films on a substrate, a roll-to-roll system
There is no need to provide a buffer vacuum chamber as in
Compact and lightweight, and
Discloses that a wide range of manufacturing costs can be reduced.
You.

【0010】特開平7−221025号公報は、搬送さ
れてくる可撓性基板を成膜室のそれぞれ函状の壁体を有
する二つの部分の開口側の間に停止させ、基板を成膜室
の両部分の壁体の開口側端面間にはさみ、成膜室の一方
の部分および基板により囲まれた成膜空間をその空間に
連通する排気口から真空にし、その空間内の電極と成膜
室の他方の部分および基板により囲まれた空間内の電極
との間に電圧を印加して成膜する薄膜光電変換素子の製
造装置において、成膜室の各部分および基板により囲ま
れた両空間に連通する通気路を備えたもので、その通気
路が可撓性配管であること、成膜室の両部分の壁体の開
口側の可撓性基板の通らない箇所に設けられた部分に対
して開けられ成膜時に成膜室外と気密に隔離されて連通
する開口部よりなるものである。
Japanese Patent Application Laid-Open No. 7-2221025 discloses that a flexible substrate to be conveyed is stopped between two openings of a film forming chamber each having a box-shaped wall, and the substrate is moved to the film forming chamber. Between the open end faces of the walls of the two portions, the film forming space surrounded by one portion of the film forming chamber and the substrate is evacuated from the exhaust port communicating with the space, and the electrodes in the space are formed with the electrodes. In a manufacturing apparatus for a thin-film photoelectric conversion element in which a voltage is applied between the other part of the chamber and an electrode in a space surrounded by the substrate, a film is formed. The air passage is a flexible pipe, and the air passage is provided in a portion provided at a location where the flexible substrate does not pass through on the opening side of the wall of both portions of the film forming chamber. It is opened from the opening that is open and It is intended.

【0011】この製造装置により、排気口を設けない側
の空間のガス溜まりを防ぐことができ、常に新鮮な原料
ガスが供給されるクリーンな成膜を実現できる。また、
同一成膜室で複数の種類の半導体層を形成しても残ガス
の影響の少ない成膜を実現できることを開示している。
特開平8−250431号公報は、可撓性基板を函状の
成膜室壁体の開口周囲の端面に密着させ、壁体と基板と
により囲まれた成膜空間を真空にし、この空間内に収容
された電極に電圧を印加して基板上に薄膜を形成する薄
膜光電変換素子の製造方法において、基板の成膜面外周
を成膜室壁体の開口周囲の端面状で放射状に摺動させ、
かつ、基板を電極と反対側に位置する押圧体により電極
側に向けて押圧することによって基板のしわを伸ばした
上で成膜するもので、特に押圧体として成膜空間内に収
容された電極の対向電極を用いることが有効であるとし
ている。
According to this manufacturing apparatus, it is possible to prevent gas accumulation in the space where the exhaust port is not provided, and to realize a clean film formation in which fresh raw material gas is always supplied. Also,
It discloses that even if a plurality of types of semiconductor layers are formed in the same film formation chamber, film formation with less influence of residual gas can be realized.
Japanese Patent Application Laid-Open No. 8-250431 discloses that a flexible substrate is brought into close contact with an end surface around an opening of a box-shaped film forming chamber wall, and a film forming space surrounded by the wall and the substrate is evacuated. In a method of manufacturing a thin-film photoelectric conversion element in which a thin film is formed on a substrate by applying a voltage to an electrode housed in the substrate, the outer periphery of the film-forming surface of the substrate is slid radially on the end surface around the opening of the wall of the film-forming chamber. Let
In addition, the substrate is pressed toward the electrode side by a pressing body located on the side opposite to the electrode to stretch the wrinkles of the substrate and form a film. In particular, the electrode housed in the film forming space as a pressing body It is said that it is effective to use the counter electrode of the above.

【0012】また、成膜空間を囲み、電圧が印加される
電極が収容された成膜室の函状壁体の開口に対向する開
口を有し、成膜室壁体に方向に駆動可能の第2の函状壁
体の端面に、成膜室の壁体に密着する可撓性基板の面に
対して外方に向けて傾斜した弾性のある唇状体を備え、
第2の壁体内に収容された対向電極が、その表面で基板
を押圧しながら成膜室の壁体の開口面より内側まで駆動
可能であることにより、可撓性基板のしわを伸ばして成
膜すれば、成膜パターンのずれが起きず、膜厚の均一な
成膜が可能であることを開示している。
Further, the film forming space has an opening opposed to the opening of the box-shaped wall of the film forming chamber in which an electrode to which a voltage is applied is accommodated, and can be driven in the direction of the film forming chamber wall. An end face of the second box-shaped wall is provided with an elastic lip-like body inclined outwardly with respect to the surface of the flexible substrate that is in close contact with the wall of the film formation chamber;
The counter electrode accommodated in the second wall body can be driven to the inside of the opening surface of the wall body of the film forming chamber while pressing the substrate on the surface thereof, whereby the wrinkles of the flexible substrate are extended. It is disclosed that, if a film is formed, a film formation pattern does not shift and a film having a uniform film thickness can be formed.

【0013】特開平8−293491号公報は、並行し
て搬送される2列の可撓性基板の間に第1電極、この第
1電極に対向して各基板の外側にそれぞれ第2電極を配
置し、第1電極と各基板の間に形成される成膜空間に第
1、第2電極間への電圧印加によって放電を発生させる
ことにより、各基板の一面上に薄膜を形成する薄膜光電
変換素子の製造装置において、それぞれの基板に対して
各1個の第1電極を備え、第1電極が基板面に平行な背
面部が絶縁体によって連結されている。各第1電極の背
面部に開口を有し、両第1電極の背面部を連結する絶縁
体に前記開口に連通する貫通孔が開けられ、この貫通孔
の内面に真空排気口が開口している。第1電極の端面に
は基板と密着可能のシール材が被着している。
Japanese Patent Application Laid-Open No. Hei 8-293349 discloses a method in which a first electrode is provided between two rows of flexible substrates conveyed in parallel, and a second electrode is provided on the outside of each substrate so as to face the first electrode. A thin-film photoelectric element is disposed to form a thin film on one surface of each substrate by generating a discharge by applying a voltage between the first and second electrodes in a deposition space formed between the first electrode and each substrate. In the device for manufacturing a conversion element, one first electrode is provided for each substrate, and the back surface of the first electrode parallel to the substrate surface is connected by an insulator. Each of the first electrodes has an opening on the back surface thereof, and a through hole communicating with the opening is formed in an insulator connecting the back surfaces of the first electrodes, and a vacuum exhaust port is opened on an inner surface of the through hole. I have. A sealing material that can be in close contact with the substrate is attached to the end surface of the first electrode.

【0014】また、搬送される可撓性基板の両側に電圧
印加電極および接地電極を配置し、電圧印加電極と基板
間に形成される成膜空間に電圧印加電極への電圧印加に
よって放電を発生させることにより基板の一面上に薄膜
を形成する薄膜光電変換素子の製造装置において、電圧
印加電極は平板状で基板に気密に接触可能の端面をもつ
導電性枠体に絶縁して気密に結合され、電圧印加電極の
背面および側面を囲む導電性シールド体が導電性枠体と
導電的に結合され、かつ接地されている。また、並行し
て搬送される2列の可撓性基板をそれぞれはさんで基板
の内側の電圧印加電極と外側の接地電極とが対向して配
置され、両電圧印加電極がシールド体を貫通する絶縁体
によって連結されている。各電圧印加電極に開口を有
し、両電圧印加電極を連結する絶縁体に前記開口に連通
する貫通孔が開けられ、この貫通孔の内面に真空排気口
が開口している。このような薄膜光電変換素子の製造装
置により、並行して搬送される2列の可撓性基板に対す
る成膜をそれぞれに対して備えた第1、第2電極間への
電圧印加により行うことにより、双方の成膜条件を別個
に制御することが可能になり、基板間の成膜の差異を減
少させることができ、そして、2つの第1電極を絶縁体
を介して連結して両基板の間に配置すると共に、基板の
端面が気密に接触して成膜空間を形成できるようにして
薄膜光電変換素子の製造装置の大型化を防ぐ方法を開示
している。
A voltage application electrode and a ground electrode are arranged on both sides of the flexible substrate to be conveyed, and a discharge is generated by applying a voltage to the voltage application electrode in a film forming space formed between the voltage application electrode and the substrate. In a thin-film photoelectric conversion device manufacturing apparatus in which a thin film is formed on one surface of a substrate, the voltage application electrodes are insulated and air-tightly coupled to a conductive frame having a flat plate-like end face capable of air-tightly contacting the substrate. A conductive shield surrounding the back and side surfaces of the voltage applying electrode is conductively coupled to the conductive frame and grounded. Further, a voltage application electrode inside the substrate and a ground electrode outside the substrate are arranged to face each other with the two rows of flexible substrates conveyed in parallel, and both voltage application electrodes penetrate the shield body. They are connected by insulators. Each voltage applying electrode has an opening, and a through hole communicating with the opening is formed in an insulator connecting the two voltage applying electrodes, and a vacuum exhaust port is opened on an inner surface of the through hole. By such a thin-film photoelectric conversion element manufacturing apparatus, film formation is performed on two rows of flexible substrates conveyed in parallel by applying a voltage between the first and second electrodes provided for each of them. In addition, it is possible to separately control both film forming conditions, to reduce a difference in film formation between substrates, and to connect two first electrodes via an insulator to connect both substrates. Disclosed is a method of disposing the thin film photoelectric conversion element in a space between the thin film photoelectric conversion elements and forming the film formation space by airtightly contacting the end faces of the substrates.

【0015】また、高電圧を印加する電極の背後および
側面を囲むシールド体と、その基板側に絶縁して結合さ
れ、基板との間に成膜空間を作る導電性枠体によってシ
ールドすることにより、1列の可撓性基板に順次成膜す
る複数の成膜室の基板搬送方向の配列、複数列の可撓性
基板への並行して成膜する複数の成膜室の基板搬送方向
に対して横方向の配列を、成膜室間隔を狭くして行うこ
とができ、従って、複数の薄膜の積層する必要がある薄
膜光電変換素子の製造装置の小型化が図れることを開示
している。
[0015] Further, the shield body surrounding the back and side surfaces of the electrode to which a high voltage is applied is shielded by a conductive frame body which is insulated and coupled to the substrate side and forms a film forming space between the shield body and the substrate. Arrangement of a plurality of film forming chambers for sequentially forming films on one row of flexible substrates in the substrate transfer direction, and arrangement of a plurality of film formation chambers for forming films on a plurality of rows of flexible substrates in parallel in the substrate transfer direction On the other hand, it discloses that the arrangement in the horizontal direction can be performed with a narrow interval between the film forming chambers, and therefore, the manufacturing apparatus of the thin film photoelectric conversion element which needs to stack a plurality of thin films can be downsized. .

【0016】特開平9−63970号公報は、可撓性基
板の函状の成膜室壁体の開口周囲の端面と弾性をもつシ
ール部材を介して密着させ、壁体と基板とにより囲まれ
た成膜室内を真空にし、この空間内に収容された電極に
電圧を印加して基板上に薄膜を形成するための薄膜素子
の製造装置において、シール部材がフッ素樹脂よりなる
ものを開示している。フッ素樹脂は、高分子材料あるい
は金属よりなる可撓性基板の表面と粘着性がフッ素ゴム
等より少ないため、基板搬送を妨げる粘着が生じない。
In Japanese Patent Application Laid-Open No. 9-63970, an end surface around an opening of a box-shaped film forming chamber wall of a flexible substrate is brought into close contact with an elastic sealing member, and is surrounded by the wall and the substrate. In a manufacturing apparatus of a thin film element for forming a thin film on a substrate by applying a voltage to an electrode housed in the space and applying a voltage to an electrode housed in this space, a seal member made of a fluororesin is disclosed. I have. Fluororesin has less adhesion to the surface of a flexible substrate made of a polymer material or a metal than fluororubber or the like, so that adhesion that hinders substrate transport does not occur.

【0017】また、同じく可撓性基板を函状の成膜室壁
体の開口周囲の端面と弾性をもつシール部材を介して密
着させ、壁体と基板とに囲まれた成膜室内を真空にし、
この空間内に収容された電極に電圧を印加して基板上に
薄膜を形成するための薄膜素子の製造装置において、シ
ール部材の可撓性基板と接触面が、弾性のある母材より
も基板に対する粘着力が少ない材料よりなる表面膜によ
って覆われたものについても開示している。
Also, the flexible substrate is brought into close contact with the end surface around the opening of the box-shaped film forming chamber wall through an elastic sealing member, and the film forming chamber surrounded by the wall and the substrate is evacuated. West,
In a manufacturing apparatus of a thin film element for forming a thin film on a substrate by applying a voltage to an electrode housed in this space, the contact surface between the flexible substrate of the seal member and the elastic base material is smaller than that of the elastic base material. Also disclosed is one covered with a surface film made of a material having low adhesive force to the substrate.

【0018】さらに、可撓性基板を函状の成膜室壁体の
開口周囲の端面と弾性をもつシール部材を介して密着さ
せ、壁体と基板とにより囲まれた成膜室内を真空にし、
この空間内に収容された電極に電圧を印加して基板上に
薄膜を形成する薄膜素子の製造方法において、薄膜を形
成し、成膜室壁体端面を基板に密着させる圧力を解除し
た後、基板を一面側から他面側に向けて押圧し、これに
より、シール部材に粘着した基板を外すことを開示して
いる。
Further, the flexible substrate is brought into close contact with an end surface around the opening of the box-shaped film forming chamber wall through an elastic sealing member, and the film forming chamber surrounded by the wall and the substrate is evacuated. ,
In a method of manufacturing a thin film element in which a thin film is formed on a substrate by applying a voltage to an electrode housed in this space, a thin film is formed, and after releasing the pressure for bringing the end face of the film forming chamber wall into close contact with the substrate, It discloses that the substrate is pressed from one surface side to the other surface side, thereby removing the substrate adhered to the seal member.

【0019】図7は従来のステッピングロール方式の薄
膜製造装置の成膜室の断面図であり、(a)開放時、
(b)は封止時である。断続的に搬送されてくる可撓性
基板1の上下に函状の下部成膜室壁体21と上部成膜室
壁体22が対向している。下部成膜室には電源4に接続
された高電圧電極31が、上部成膜室にはヒーター33
を内蔵した接地電極32が備えられている。
FIG. 7 is a cross-sectional view of a film forming chamber of a conventional stepping roll type thin film manufacturing apparatus.
(B) is the time of sealing. A box-shaped lower film-forming chamber wall 21 and an upper film-forming chamber wall 22 are arranged above and below the intermittently transported flexible substrate 1. A high voltage electrode 31 connected to the power supply 4 is provided in the lower film forming chamber, and a heater 33 is provided in the upper film forming chamber.
Is provided.

【0020】成膜時(図7(b))には、上部成膜室壁
体22が下降し、接地電極32が基板1を抑えて下部成
膜室壁体21の開口部側端面に取り付けられたシール材
5に接触させる。これにより、下部成膜室壁体21と基
板1によって排気管61に連通する気密に密閉された成
膜空間6が形成され、高電圧電極31への高周波電圧の
印加によりプラズマを成膜空間6に発生させ、図示しな
い導入管から導入された原料ガスを分解して基板1上に
膜を形成する。図において成膜室の外側は共通真空室で
ある。
At the time of film formation (FIG. 7B), the upper film forming chamber wall 22 is lowered, and the ground electrode 32 is attached to the opening-side end face of the lower film forming chamber wall 21 while holding down the substrate 1. The contact is made to the sealing material 5 provided. As a result, an airtightly sealed film-forming space 6 communicating with the exhaust pipe 61 is formed by the lower film-forming chamber wall 21 and the substrate 1, and plasma is applied by applying a high-frequency voltage to the high-voltage electrode 31. And a source gas introduced from an introduction pipe (not shown) is decomposed to form a film on the substrate 1. In the figure, the outside of the film forming chamber is a common vacuum chamber.

【0021】図8は従来の薄膜製造装置の成膜室の下部
および上部成膜室のシール部の断面図である。下部成膜
室壁体21の端面には、二つの帯状端板23、24が、
また上部成膜室壁体22の端面には二つの帯状端板2
5、26がそれぞれねじ止めされ、その間に形成される
あり溝にシール材5を脱落しないように保持している。
成膜時には、基板1を下部成膜室側の端板23、24の
表面およびその間のシール材5と、上部成膜室側の端板
25、26の表面およびその間のシール材5とで挟むこ
とによって上部および下部成膜室内の空間は真空に保た
れる。
FIG. 8 is a cross-sectional view of the seal portions of the lower and upper film forming chambers of the conventional film forming apparatus. On the end surface of the lower film forming chamber wall 21, two band-shaped end plates 23 and 24 are provided.
Also, two band-shaped end plates 2 are provided on the end surface of the upper film forming chamber wall 22.
5 and 26 are screwed, respectively, and hold the sealing material 5 in the dovetail groove formed therebetween so as not to fall off.
During film formation, the substrate 1 is sandwiched between the surfaces of the end plates 23 and 24 on the lower film formation chamber side and the sealing material 5 therebetween, and the surfaces of the end plates 25 and 26 on the upper film formation chamber side and the sealing material 5 therebetween. Thus, the spaces in the upper and lower film forming chambers are kept in a vacuum.

【0022】また、他の例として、特開平8−2504
31に示されるような手法もある。図9は従来のプラズ
マCVDにより成膜を行う薄膜製造装置の成膜室の開放
時を示す可撓性基板の搬送方向に垂直な断面図である。
可撓性基板1は紙面に垂直方向に搬送される。高電圧電
極31を収容する下部成膜室は壁体21と開口部を有す
るトッププレート27とで構成され、真空排気管61に
接続されている。図示しないヒーターを内蔵する接地電
極32を収容する上部成膜室は、壁体22とハウジング
28とで構成され、ハウジング28に接地電極32の支
持チューブ34が上下に移動可能に嵌合している。ハウ
ジング28の端部に移動プレート29が取り付けられて
いる。移動プレート29は上下駆動ガイド30にガイド
されてアクチュエータ41により矢印51に示すように
上下方向に駆動される。上下駆動ガイド30およびアク
チュエータ41はマウント42に固定され、成膜室チャ
ンバ35上の上部フランジ36上に載置されている。支
持チューブ34は円筒状で、内部空洞は上端は真空排気
管63と連通し、下端で貫通孔37により上部成膜室の
内部空間に連通している。真空排気管61と真空排気管
63は可撓性配管64により接続されている。一方、接
地電極の支持チューブ34は、移動プレート29を介し
てハウジング28内を移動でき、それによって接地電極
32は矢印52に示すように上下方向に駆動される。ま
た、上部成膜室の壁体22の下端と下部成膜室のトップ
プレート27の間には、しわ伸ばし構造が形成されてい
る。
Another example is disclosed in Japanese Patent Application Laid-Open No. 8-250504.
There is also a method as shown in FIG. FIG. 9 is a cross-sectional view perpendicular to the direction of transport of a flexible substrate when a film forming chamber of a conventional thin film manufacturing apparatus for forming a film by plasma CVD is opened.
The flexible substrate 1 is transported in a direction perpendicular to the paper. The lower film forming chamber for accommodating the high-voltage electrode 31 includes the wall 21 and the top plate 27 having an opening, and is connected to the vacuum exhaust pipe 61. The upper film forming chamber for accommodating the ground electrode 32 including a heater (not shown) is composed of the wall body 22 and the housing 28, and the support tube 34 of the ground electrode 32 is fitted to the housing 28 so as to be vertically movable. . A moving plate 29 is attached to an end of the housing 28. The moving plate 29 is guided by the vertical drive guide 30 and is driven by the actuator 41 in the vertical direction as indicated by the arrow 51. The vertical drive guide 30 and the actuator 41 are fixed to a mount 42 and mounted on an upper flange 36 on a film forming chamber 35. The support tube 34 is cylindrical, and the upper end of the internal cavity communicates with the vacuum exhaust pipe 63, and the lower end communicates with the internal space of the upper film formation chamber through the through hole 37 at the lower end. The vacuum exhaust pipe 61 and the vacuum exhaust pipe 63 are connected by a flexible pipe 64. On the other hand, the support tube 34 of the ground electrode can be moved in the housing 28 via the moving plate 29, whereby the ground electrode 32 is driven up and down as shown by the arrow 52. A wrinkle-stretching structure is formed between the lower end of the wall 22 of the upper film forming chamber and the top plate 27 of the lower film forming chamber.

【0023】図10は従来の薄膜製造装置(図9)の成
膜室のシール部の拡大断面図であり、(a)が成膜室開
放時、(b)が成膜室封止時である。トッププレート2
7の開口部45に近接した部分の上には、図9と同様に
シール材5が端板23、24の間に保持されている。一
方、上部成膜室壁体22の端面には、ゴムよりなるリッ
プ(唇状体)7の基部が角環状のL型パッキン71の凹
部に挿し込まれ、リップ押さえ72との間にはさみこむ
ことにより保持されている。L型パッキン71およびリ
ップ押さえ72は壁体22の端面にネジ止めで固定され
ており、従ってリップ7の着脱が容易である。リップ7
は、方形の壁体22の各辺ごとに4分割されている。
FIGS. 10A and 10B are enlarged cross-sectional views of a seal portion of a film forming chamber of a conventional thin film manufacturing apparatus (FIG. 9). FIG. 10A shows a state where the film forming chamber is opened, and FIG. is there. Top plate 2
The sealing material 5 is held between the end plates 23 and 24 on the portion close to the opening 45 of 7, as in FIG. On the other hand, the base of the lip (lip-like body) 7 made of rubber is inserted into the concave portion of the L-shaped packing 71 having a rectangular ring shape, and is sandwiched between the end face of the upper film forming chamber wall 22 and the lip retainer 72. Is held by The L-shaped packing 71 and the lip retainer 72 are fixed to the end surface of the wall 22 with screws, so that the lip 7 can be easily attached and detached. Lip 7
Is divided into four parts for each side of the rectangular wall 22.

【0024】成膜室開放時にはリップ7は可撓性基板1
の面に外方に向かって45〜60度傾斜しており、L型
パッキン71の下端より約5mm下方へ突出している。リ
ップ押さえ72の縁部は例えば30度の面取りが施され
ている。上部成膜室壁体22が矢印51の方向に下降し
始めると、リップ7の先端が鎖線で示した基板に接触
し、さらに基板1を押し込みトッププレート27上の端
板23、24の表面上に到達する。そのまま上部成膜室
壁体22が矢印53の方向に下降すると、リップ7の先
端は端板23、24の表面に平行に矢印54方向に滑っ
て変形する。リップ押さえ72の縁部が面取りされてい
るので、変形したリップ7の端部はこの面取り部へ逃げ
ることができる。
When the film forming chamber is opened, the lip 7 is
Is inclined outward by 45 to 60 degrees, and projects downward about 5 mm from the lower end of the L-shaped packing 71. The edge of the lip retainer 72 is chamfered, for example, by 30 degrees. When the upper film forming chamber wall 22 starts to descend in the direction of the arrow 51, the tip of the lip 7 comes into contact with the substrate indicated by the chain line, and further presses the substrate 1 onto the surface of the end plates 23, 24 on the top plate 27. To reach. When the upper film forming chamber wall 22 descends in the direction of arrow 53 as it is, the tip of the lip 7 slides and deforms in the direction of arrow 54 in parallel to the surfaces of the end plates 23 and 24. Since the edge of the lip retainer 72 is chamfered, the end of the deformed lip 7 can escape to this chamfer.

【0025】その際に、リップ7の先端と断面23、2
4上の基板1との間に摩擦が発生し、基板1を矢印54
の方向に外側へ引っ張るので、基板1の外周は端板2
3、24の表面上を、中心から外側に向かう放射状方向
に摺動し、しわが伸びる。そして、下降の継続によりL
型パッキン71は、下方の基板1をシール材5および端
板23、24に対して押しつけることにより、基板1の
下方の成膜空間6および基板1の上方の壁体22によっ
て囲まれた空間を真空封じする。続いて、接地電極32
を矢印55の方向に下降させ、基板1を強制的に矢印5
6の方向に引っ張ることにより、しわをさらに伸ばす。
この際、接地電極32の基板の押し込み深さdは、2.
0〜2.5mmであることが有効である。
At this time, the tip of the lip 7 and the sections 23, 2
4 causes friction between the substrate 1 and the substrate 1 on the arrow 54.
, The outer periphery of the substrate 1 is
The wrinkles are extended by sliding on the surfaces of 3, 24 in a radial direction from the center outward. Then, L continues to decrease,
The mold packing 71 presses the lower substrate 1 against the sealing material 5 and the end plates 23 and 24 to form a space surrounded by the film formation space 6 below the substrate 1 and the wall 22 above the substrate 1. Vacuum seal. Subsequently, the ground electrode 32
Is lowered in the direction of arrow 55, and the substrate 1 is forcibly moved to arrow 5
The wrinkles are further stretched by pulling in the direction of 6.
At this time, the pressing depth d of the ground electrode 32 into the substrate is 2.
It is effective that it is 0 to 2.5 mm.

【0026】上記の例では、上部成膜室も真空にするこ
とができるが、高電圧電極を収容する下部成膜室のみを
真空にする薄膜光電変換素子の製造装置においても実施
することができる。
In the above example, the upper film forming chamber can be evacuated. However, the present invention can also be carried out in a thin film photoelectric conversion device manufacturing apparatus in which only the lower film forming chamber accommodating the high voltage electrode is evacuated. .

【0027】[0027]

【発明が解決しようとする課題】図9または10の例で
は、接地電極32は、基板加熱ヒーター33を内蔵して
いるため、ヒーター周辺部の壁体22、L型パッキン7
1、リップ7、リップ押さえ72、端板23、24、ト
ッププレート27、シール材5は加熱される。通常、シ
ール材はフッ素ゴムで作製されているため、L型パッキ
ン71、リップ7、リップ押さえ72、シール材5は加
熱されることにより、粘度が増す。このため、成膜終了
後、あるいは、成膜室封止後に上部成膜室を上昇し、可
撓性基板を搬送してコマ送りする際に、図9の例では、
シール材5、図10の例では、シール材5、あるいは、
L型パッキン71のどちらか一方に粘着し、可撓性基板
が搬送できない問題が生ずることがあった。
In the example shown in FIG. 9 or 10, since the ground electrode 32 has a built-in substrate heater 33, the wall 22 around the heater and the L-shaped packing 7 are provided.
1, the lip 7, the lip holder 72, the end plates 23 and 24, the top plate 27, and the sealing material 5 are heated. Usually, since the sealing material is made of fluoro rubber, the viscosity of the L-shaped packing 71, the lip 7, the lip presser 72, and the sealing material 5 is increased by heating. For this reason, in the example of FIG. 9, when the upper film formation chamber is lifted after the film formation is completed or after the film formation chamber is sealed, and the flexible substrate is transported and frame-fed,
The sealing material 5, in the example of FIG.
There was a problem that the flexible substrate could not be transported because it adhered to one of the L-shaped packings 71.

【0028】この問題を解決するために、成膜室空間外
周の可撓性基板と接触して真空を気密するシール部材と
してフッ素系ゴムに替わり粘着性の少ない材料、例え
ば、テフロン(デュポン社の登録商標名)、ダイフロン
(ダイキン工業 (株) の登録商標名)を用いること、あ
るいは、フッ素系ゴムに粘着性を少なくする材料、例え
ば、Ag、Al、Ti、Cu、Cr等の金属膜、あるい
は、ZnO、ITO、SnO2 等の金属酸化物、あるい
は、フッ素系化合物のテフロン(デュポン社の登録商標
名)、ダイフロン(ダイキン工業 (株) の登録商標
名)、あるいは、シリコン系化合物、窒化ホウ素などを
表面にコーティングすることが考えられた。また、シー
ル部材の粘着性自体を上げないために、この周囲を冷却
してシール部材を100℃以下、望ましくは50℃以下
に保ち、シール部材の粘着性を高めないことも考えられ
た。
In order to solve this problem, as a sealing member which comes into contact with a flexible substrate on the outer periphery of the film forming chamber and seals the vacuum, instead of a fluorine-based rubber, a material having low adhesiveness, for example, Teflon (made by DuPont) is used. (Registered trademark name) or Daiflon (registered trademark name of Daikin Industries, Ltd.), or a material that reduces the adhesiveness to fluorine-based rubber, for example, a metal film such as Ag, Al, Ti, Cu, or Cr; Alternatively, metal oxides such as ZnO, ITO, and SnO 2 , or fluorine-based compounds such as Teflon (registered trademark of DuPont), Daiflon (registered trademark of Daikin Industries, Ltd.), silicon-based compounds, and nitrides It was considered to coat the surface with boron or the like. Also, in order not to increase the adhesiveness itself of the seal member, it has been considered that the surroundings are cooled and the seal member is kept at 100 ° C. or lower, preferably 50 ° C. or lower, and the adhesiveness of the seal member is not increased.

【0029】しかしながら、シール部を冷却した場合に
は、シール部に近い部分のヒーター温度が下がり、薄膜
を形成する基板温度を成膜領域全体で均一化することが
難しい。また、シール部に各種材料をコーティングした
場合でも、シール材自身の耐熱温度以上に温度が上昇し
た場合には脱ガスにより形成した膜の膜質が低下してし
まう。
However, when the seal is cooled, the temperature of the heater near the seal decreases, and it is difficult to make the temperature of the substrate on which the thin film is formed uniform over the entire film formation region. In addition, even when the seal portion is coated with various materials, if the temperature rises above the heat-resistant temperature of the seal material itself, the quality of the film formed by degassing deteriorates.

【0030】万が一、シール部材に可撓性基板が粘着し
た場合の、可撓性基板の張り付きを外す方法として、搬
送前に上部成膜室の駆動可能な押圧体を突出させて、シ
ール部材に粘着した可撓性基板をはぎ取る方法がある
が、この方法は、機械的な手段であるため可撓性基板に
傷が生じたり、形成された薄膜、あるいは、薄膜光電変
換素子が損傷する可能性があった。
In the event that the flexible substrate adheres to the seal member, as a method for removing the sticking of the flexible substrate, a drivable pressing body in the upper film forming chamber is projected before the transfer so that the flexible member is attached to the seal member. There is a method of peeling off the sticky flexible substrate, but this method is a mechanical means, and the flexible substrate may be scratched or the formed thin film or the thin film photoelectric conversion element may be damaged. was there.

【0031】図11は従来の2枚の基板に同時に成膜す
る薄膜製造装置の成膜室の断面図であり、(a)は成膜
室開放時、(b)は成膜室封止時である。高電圧電極2
21とヒーター223を内蔵する接地電極222と同電
位とされる枠体254が絶縁物253で絶縁されている
成膜室構造のものでは、例えば絶縁物253に石英を用
い高電圧電極221と石英、接地電極となる枠体254
と石英の気密を取るためシール材252を用いていた。
あるいは、シール材は絶縁材としての役割を果たすこと
も可能であるため、必要な間隔を取れる厚みのあるシー
ル材を用いることもあった。また、2枚の基板に独立に
成膜できるように、2つの高電圧電極221は絶縁ブロ
ック209で隔離されている。そして、絶縁ブロック2
09は接地電位の排気部材208に連結されている。
FIGS. 11A and 11B are cross-sectional views of a film forming chamber of a conventional thin film manufacturing apparatus for simultaneously forming a film on two substrates, wherein FIG. It is. High voltage electrode 2
In a film-forming chamber structure in which a frame 254 having the same potential as the ground electrode 222 containing the heater 21 and the heater 223 is insulated by an insulator 253, for example, quartz is used for the insulator 253, and the high-voltage electrode 221 and the quartz are used. , Frame 254 serving as ground electrode
The sealing material 252 is used to seal the airtightness of the quartz.
Alternatively, since the sealing material can also serve as an insulating material, a sealing material having a sufficient thickness to provide a necessary interval has been used in some cases. Further, the two high-voltage electrodes 221 are separated by an insulating block 209 so that films can be formed independently on two substrates. And the insulating block 2
09 is connected to the exhaust member 208 at the ground potential.

【0032】本構造の薄膜製造装置においては、成膜室
の両面がヒーターを内蔵する接地電極222で囲まれて
おり、側壁は真空で囲まれ、共通室に固定されている下
部、あるいは上部を伝わって熱が逃げるだけであるため
成膜室の内部まで十分に加熱される。例えば、ヒーター
温度が250 ℃の場合、成膜室内部の温度は約150 ℃〜20
0 ℃程度まで上昇した。そのため、成膜室内部の温度が
上がった時や下がった時に、絶縁物に石英を用いた場合
では接地電極となる枠体254、あるいは高電圧電極2
21、その他、成膜室を構成している部材(SUS、ア
ルミ)の熱膨張、熱収縮により石英に力が加わり、石英
が破損する場合があった。この場合、成膜室から共通室
へガスが漏れ、成膜室で安定に放電可能である圧力を維
持できなかったり、あるいは、共通室の圧力が上昇し、
成膜室外の高電圧電極と接地電極の間で放電を起こし、
成膜室内で安定に放電させることができなかった。
In the thin film manufacturing apparatus of this structure, both sides of the film forming chamber are surrounded by the ground electrode 222 having a built-in heater, the side wall is surrounded by vacuum, and the lower or upper part fixed to the common chamber is formed. Since only heat is transmitted and heat is released, the inside of the film forming chamber is sufficiently heated. For example, when the heater temperature is 250 ° C., the temperature inside the deposition chamber is about 150 ° C. to 20 ° C.
The temperature rose to about 0 ° C. Therefore, when the temperature inside the film formation chamber rises or falls, when quartz is used as the insulator, the frame 254 serving as a ground electrode or the high-voltage electrode 2 is used.
21. In addition, there was a case in which a force was applied to quartz due to thermal expansion and contraction of members (SUS, aluminum) constituting the film forming chamber, and the quartz was damaged. In this case, gas leaks from the film formation chamber to the common chamber, and the pressure at which stable discharge can be performed in the film formation chamber cannot be maintained, or the pressure of the common chamber increases,
Discharge occurs between the high voltage electrode and the ground electrode outside the deposition chamber,
It was not possible to stably discharge in the film forming chamber.

【0033】また、絶縁物253は、高電圧電極221
と接地電極222と同電位とされる枠体254の間に挟
み込まれた積層構造となっているため、破損した絶縁物
253を交換するためには、高電圧電極221、あるい
は、接地電極となる枠体254を分解しなければなら
ず、多大な労力と時間が必要であった。また、他の問題
として、可撓性基板を搬送するために、基板の搬送方向
に張力をかけている。搬送距離が長くなるので、可撓性
基板を支持するロールの数を増やさなければならず、ロ
ール軸での機械ロスが増え、その結果、可撓性基板にか
かる張力は弱くなり、基板に皺が生じたりしていた。
The insulator 253 is connected to the high voltage electrode 221.
And the ground electrode 222 and the frame 254 having the same electric potential, the high voltage electrode 221 or the ground electrode is required to replace the damaged insulator 253. The frame 254 had to be disassembled, requiring a great deal of labor and time. As another problem, in order to transport a flexible substrate, tension is applied in the transport direction of the substrate. Since the transport distance becomes longer, the number of rolls that support the flexible substrate must be increased, and the mechanical loss at the roll axis increases. As a result, the tension applied to the flexible substrate is reduced, and the substrate is wrinkled. Had occurred.

【0034】また シール材からの脱ガスも多く、膜質
が低下した。また、絶縁物に厚みのあるシール材を用い
た場合にはさらに脱ガスが多く膜質はさらに低下した。
本発明の目的は、成膜室が高温時にも基板と粘着し難
く、脱ガスの少ない、成膜室壁の歪みの影響を受けにく
い、また交換が容易なシール部を備えた成膜室を有する
薄膜製造装置を提供することにある。
In addition, the outgassing from the sealing material was large, and the film quality was deteriorated. Further, when a thick sealing material was used for the insulator, the outgassing was further increased and the film quality was further deteriorated.
An object of the present invention is to provide a film forming chamber having a seal portion that is hardly adhered to a substrate even at a high temperature, has little degassing, is less susceptible to distortion of a film forming chamber wall, and has an easily replaceable seal portion. To provide a thin film manufacturing apparatus having the same.

【0035】[0035]

【課題を解決するための手段】上記の目的を達成するた
めに、一つの共通真空槽の中に、可撓性基板を搬送する
搬送系と、この可撓性基板上に薄膜を成膜する手段を備
えた1ないし複数の成膜室を有し、各成膜室は可撓性基
板を境界とする開口部を有する2つの成膜部室からな
り、各開口部にはシール部が設けられており、各シール
部が基板を挟んで合致して成膜室と共通真空槽との間が
気密となる薄膜製造装置において、前記シール部は金属
またはセラミック等の無機材料からなることとする。
In order to achieve the above-mentioned object, a transport system for transporting a flexible substrate into one common vacuum chamber and a thin film formed on the flexible substrate are formed. A plurality of film forming chambers each provided with a means, and each of the film forming chambers includes two film forming section chambers each having an opening bounded by a flexible substrate, and each opening is provided with a seal portion. In a thin film manufacturing apparatus in which the seal portions are aligned with each other with the substrate interposed therebetween and the airtightness is formed between the film forming chamber and the common vacuum chamber, the seal portions are made of an inorganic material such as metal or ceramic.

【0036】前記シール部の基板と接触し合う部分の幅
は10mm以上であると良い。前記成膜部室のうち可動な
成膜部室と基板を加熱するヒーターとが一体構造である
と良い。前記可動な成膜部室とシール部が同一材料から
なり一体であると良い。前記加熱ヒーターは前記可撓性
基板上への成膜領域よりも大きいと良い。
[0036] The width of the portion of the seal portion that comes into contact with the substrate is preferably 10 mm or more. It is preferable that the movable film forming section chamber and the heater for heating the substrate in the film forming section chamber have an integral structure. It is preferable that the movable film forming section chamber and the sealing section are made of the same material and are integrated. It is preferable that the heater is larger than a film formation area on the flexible substrate.

【0037】前記シール部の圧力は 1×104Pa 以上 5×
105 Pa以下であると良い。また、一つの共通真空槽の中
に、可撓性基板を搬送する搬送系と、この可撓性基板上
に薄膜を成膜する手段を備えた1ないし複数の成膜室を
有し、各成膜室は可撓性基板を境界とする開口部を有す
る2つの成膜部室からなり、各開口部にはシール部が設
けられており、各シール部が基板を挟んで合致して成膜
室と共通真空槽との間が気密となる薄膜製造装置におい
て、一方の成膜部室の開口部のシール部は金属からなる
箔または板であり、成膜部室の外方に向けて傾斜した弾
性のある唇状体であることとする。
The pressure of the seal portion is 1 × 10 4 Pa or more and 5 ×
It is good to be 10 5 Pa or less. Further, in one common vacuum chamber, there is provided a transport system for transporting a flexible substrate, and one or a plurality of deposition chambers provided with means for depositing a thin film on the flexible substrate. The film forming chamber is composed of two film forming section chambers having an opening bounded by a flexible substrate, and each opening is provided with a seal section, and each seal section is aligned with the substrate in between. In a thin-film manufacturing apparatus in which the space between the chamber and the common vacuum chamber is airtight, the sealing portion at the opening of one of the film forming section chambers is a foil or plate made of metal, and has an elasticity inclined toward the outside of the film forming section chamber. The lips have a lip.

【0038】また、一つの共通真空槽の中に、可撓性基
板を搬送する搬送系と、この可撓性基板上に薄膜を成膜
する手段を備えた1ないし複数の成膜室を有し、各成膜
室は可撓性基板を境界とする開口部を有する2つの成膜
部室からなり、各開口部にはシール部が設けられてお
り、各シール部が基板を挟んで合致して成膜室と共通真
空槽との間が気密となる薄膜製造装置であって、一方の
成膜室部が高電圧電極とその周縁のシール部からなる薄
膜製造装置において、前記成膜室の前記高電圧電極と実
効的に接地電位となる部分との間の絶縁物として可撓性
絶縁性シートを用いることとする。
Further, in one common vacuum chamber, there is provided a transfer system for transferring a flexible substrate, and one or a plurality of film forming chambers provided with means for forming a thin film on the flexible substrate. Each of the film forming chambers includes two film forming section chambers each having an opening bounded by a flexible substrate, and each opening is provided with a seal portion, and each seal portion is aligned with the substrate interposed therebetween. A thin-film manufacturing apparatus in which the space between the film-forming chamber and the common vacuum chamber is hermetically sealed, and one of the film-forming chambers includes a high-voltage electrode and a sealing portion around the periphery thereof. A flexible insulating sheet is used as an insulator between the high-voltage electrode and a portion that effectively becomes a ground potential.

【0039】前記実効的に接地電位となる部分は成膜室
の排気部材であると良い。前記実効的に接地電位となる
部分は成膜室の接地電極の周縁部の枠体であると良い。
前記絶縁シートは帯状の固定治具によって固定されてい
ると良い。前記絶縁シートはポリイミド樹脂またはアラ
ミド樹脂からなると良い。
It is preferable that the portion which is effectively at the ground potential is an exhaust member of the film forming chamber. It is preferable that the effective ground potential portion is a frame at the periphery of the ground electrode in the film forming chamber.
The insulating sheet is preferably fixed by a band-shaped fixing jig. The insulating sheet is preferably made of a polyimide resin or an aramid resin.

【0040】前記絶縁シート厚さは10μm 〜 500μm で
あると良い。また、前記成膜室間に基板の張力調整装置
が備えられていることとする。そして、少なくとも光電
変換層および電極層が積層されてなる薄膜光電変換素子
において、上記の薄膜製造装置によって製造されたこと
とする。本発明によれば、可撓性基板と成膜室空間外周
の基板と接触して真空を気密するシール部材料を金属、
あるいはセラミック等の無機物としたので、基板に対す
る粘着性が少なく、シール部と基板との貼り付きを防ぐ
ことができる。また、シール部に金属、セラミック等の
無機物を用いることで、例えばフッ素系ゴムを用いた
り、これにコーティングしたものに比べ脱ガスが減少す
る。
The thickness of the insulating sheet is preferably 10 μm to 500 μm. Further, a tension adjusting device for the substrate is provided between the film forming chambers. Then, it is assumed that at least a thin film photoelectric conversion element in which a photoelectric conversion layer and an electrode layer are laminated is manufactured by the above thin film manufacturing apparatus. According to the present invention, a metal is used as a sealing material for sealing a vacuum by contacting a flexible substrate and a substrate on the outer periphery of a film forming chamber space.
Alternatively, since it is made of an inorganic material such as ceramics, the adhesiveness to the substrate is low, and sticking between the seal portion and the substrate can be prevented. In addition, by using an inorganic substance such as metal or ceramic for the seal portion, degassing is reduced as compared with, for example, using a fluorine-based rubber or coating the same.

【0041】可撓性基板と接触するシール部の幅を10mm
以上としたので、気密が良くなり共通室圧力を 3×10-2
Pa以下に保つことができ、成膜室で安定した放電が得ら
れる。シール部の基板への圧力を1 ×104Pa 以上5 ×10
5Pa 以下にすることで、弾性の少ない金属、セラミック
等の無機物をシール材として用いても可撓性基板が断裂
することなく、かつ、共通室圧力を 3×10-2Pa以下に保
つことができ、成膜室で安定した放電が得られる。
The width of the seal portion in contact with the flexible substrate is 10 mm
As a result, the airtightness was improved and the common chamber pressure was reduced to 3 × 10 -2
It can be kept at Pa or less, and a stable discharge can be obtained in the film forming chamber. Pressure on the substrate at the seal is 1 × 10 4 Pa or more 5 × 10
By setting the pressure to 5 Pa or less, even if inorganic materials such as metals and ceramics with low elasticity are used as sealing materials, the flexible substrate will not be torn and the common chamber pressure will be kept at 3 × 10 -2 Pa or less. And a stable discharge can be obtained in the film forming chamber.

【0042】可撓性基板を挟んで成膜室空間を形成する
際に、稼動する一方の側の成膜室の面がシール面に対し
て可動できることで、的確にシール面と接触でき、共通
室へのガスの漏れを減らすことができる。可撓性基板と
成膜室空間外周の基板と接触して真空を気密するシール
部を金属、あるいはセラミック等の無機物としたので、
シール部の冷却をなくすことで、シール部に近い部分の
ヒーター温度の低下を防がれ、薄膜を形成する基板温度
を成膜領域全体で均一化でき、膜質の均一性が向上す
る。
When the film forming chamber space is formed with the flexible substrate interposed therebetween, the surface of one of the operating film forming chambers can be moved with respect to the seal surface, so that the surface can be brought into contact with the seal surface accurately, and Gas leakage into the chamber can be reduced. Since the flexible substrate and the seal portion that comes into contact with the substrate on the outer periphery of the film forming chamber and hermetically seals the vacuum are made of metal or inorganic material such as ceramic,
Eliminating the cooling of the seal portion prevents a decrease in the heater temperature in a portion close to the seal portion, makes the temperature of the substrate on which the thin film is formed uniform over the entire film formation region, and improves the uniformity of the film quality.

【0043】リップを金属箔にすることで冷却がなくて
も取り付けることができ、可撓性基板のしわを伸ばして
成膜することができる。高電圧電極と接地電極が絶縁物
で絶縁されている成膜室構造のもので、絶縁物に可撓性
絶縁性シートを用いることで、高電圧電極と接地電極の
絶縁が取れる。可撓性絶縁性シート基板をポリイミド
系、あるいは、アラミド系の高分子フィルムとすること
で脱ガスが少なく高品質な膜、すなわち、高品質な光電
変換素子が形成できる。
By using a metal foil for the lip, the lip can be attached without cooling, and the film can be formed by extending wrinkles of the flexible substrate. The high voltage electrode and the ground electrode are insulated from each other by using a film-forming chamber structure in which the high voltage electrode and the ground electrode are insulated from each other by using a flexible insulating sheet. By using a polyimide-based or aramid-based polymer film for the flexible insulating sheet substrate, a high-quality film with little outgassing, that is, a high-quality photoelectric conversion element can be formed.

【0044】絶縁物を高電圧電極と接地電極の間に挟む
のではなくこれらの側面から固定することで、交換が容
易となる。可撓性絶縁性シートのシール面以外が粗面化
されていることにより、膜剥がれをおこしにくくなる。
The replacement is facilitated by fixing the insulator from these side surfaces instead of sandwiching it between the high voltage electrode and the ground electrode. Since the surface other than the sealing surface of the flexible insulating sheet is roughened, film peeling is less likely to occur.

【0045】[0045]

【発明の実施の形態】実施例1 図1は本発明に係る薄膜製造装置の成膜室のシール部分
の拡大断面図であり、(a)は開放時、(b)は封止時
である。成膜室全体は図1と同じであり、従来のシール
部分図10に対応している。上部成膜室壁体22と下部
成膜室壁体27のそれぞれに備えられたシール部を兼ね
る帯状端板171、123、およびリップ押さえ172
にはAl材を用いている。本実施例では、シール部を兼
ねる帯状端板171、123、およびリップ押さえ17
2には、Alを用いたが、その他、脱ガスの少ない金
属、セラミックなどの無機物であれば何でも良い。リッ
プ7はフッ素系ゴムでる。可撓性基板には厚さ50μm の
ポリイミド基板の両面に金属、あるいは金属酸化物を含
む多層膜の電極層が形成されたものを用いた。上部成膜
室壁体22と下部成膜室壁体27に備えられたシール部
を兼ねる帯状リング端板171、123の可撓性基板と
接触する部分の幅Wを10mm以上にした場合、気密(シー
ル性)を確保できた。
FIG. 1 is an enlarged sectional view of a sealing portion of a film forming chamber of a thin film manufacturing apparatus according to the present invention, wherein FIG. . The entire film forming chamber is the same as FIG. 1 and corresponds to the conventional seal partial view 10. Band-shaped end plates 171 and 123 serving also as seal portions provided on the upper film forming chamber wall 22 and the lower film forming chamber wall 27, respectively, and a lip retainer 172.
Uses an Al material. In this embodiment, the band-shaped end plates 171 and 123 also serving as a seal portion, and the lip holder 17 are provided.
Although Al was used for 2, any other inorganic material such as a metal or a ceramic with little outgassing may be used. The lip 7 is made of fluorine rubber. The flexible substrate used was a polyimide substrate having a thickness of 50 μm, on which metal or metal oxide-containing multi-layered electrode layers were formed on both surfaces. When the width W of the portion of the strip-shaped ring end plates 171 and 123 serving as the seal portions provided in the upper film forming chamber wall 22 and the lower film forming chamber wall 27 that comes into contact with the flexible substrate is set to 10 mm or more, airtightness is obtained. (Sealability) could be secured.

【0046】さらに、可撓性基板を挟んで成膜室空間を
形成する際に、可動な一方の側の成膜室壁が撓んで的確
にシール面と接触できるようにし、成膜室と共通室のシ
ールを確実にした。これらにより成膜室空間に成膜ガス
を封入した際の共通室へのガスの漏れを減少させること
ができた。成膜室の圧力をそれぞれ3 ×10-1〜 5×102P
a の範囲に維持したとき、共通室の圧力を 3×10-2Pa以
下に保つことができ、成膜室で安定して放電させること
ができた。
Further, when forming a film forming chamber space with a flexible substrate interposed therebetween, the movable film forming chamber wall on one side is flexed so as to be able to come into accurate contact with the sealing surface. The chamber seal was secured. As a result, the leakage of gas into the common chamber when the film forming gas was sealed in the film forming chamber space could be reduced. The pressure in the deposition chamber is 3 × 10 -1 to 5 × 10 2 P
When maintained in the range of a, the pressure in the common chamber could be kept at 3 × 10 -2 Pa or less, and stable discharge was possible in the film formation chamber.

【0047】可撓性基板の厚さを変えたところ、厚さが
25μm 以下では成膜室から共通室へのガスの漏れが多く
共通室圧力を 3×10-2Pa以下に保つことができなかっ
た。また、可撓性金属箔基板を用いた場合には共通室圧
力を 3×10-2Pa以下に保つことができなかった。可撓性
基板を挟む圧力が 5×105Pa 以上の場合には可撓性基板
に傷が付き、断裂することがあった。また、1 ×104Pa
以下の場合には、共通室圧力を 3×10-2Pa以下に保つこ
とができず、成膜室で安定して放電させることができな
かった。
When the thickness of the flexible substrate was changed,
At 25 μm or less, the gas leaked from the deposition chamber to the common chamber, and the common chamber pressure could not be maintained at 3 × 10 −2 Pa or less. Further, when a flexible metal foil substrate was used, the common chamber pressure could not be kept at 3 × 10 −2 Pa or less. When the pressure sandwiching the flexible substrate is 5 × 10 5 Pa or more, the flexible substrate may be damaged and torn. Also, 1 × 10 4 Pa
In the following cases, the pressure in the common chamber could not be maintained at 3 × 10 −2 Pa or less, and stable discharge could not be performed in the film formation chamber.

【0048】図2は本発明に係る薄膜製造装置により成
膜した光電変換素子の光電変換効率の成膜時のヒーター
温度依存性を示すグラフである。カーブaは本発明に係
る金属製のシール部の成膜室で真性半導体層を成膜した
素子、カーブbは従来のフッ素系ゴムのシール部の成膜
室で真性半導体層を成膜した素子の特性である。フッ素
系ゴムがシール部の場合、ヒーター温度を上げるとシー
ル部の温度が上昇するため不純物の脱ガスが増えるが、
金属製のものを用いた場合にはほとんど脱ガスは増えな
い。このため、シール部が金属製のものではフッ素系ゴ
ムのものに比較して、ヒーター温度を上げて成膜しても
シール部からの脱ガスが少ないため真性半導体層の膜質
が良く、変換効率の低下が少なかった。 実施例2 実施例1(図1)の成膜室において、リップ7の材料と
して金属(ステンレス鋼)箔を用いた。金属箔の場合に
はフッ素系ゴムに比べ基板との接触面積当たりの圧力が
高いが基板との摩擦力が小さいので、リップ7の周縁部
断面を円弧状に曲げて接触する面積を増加させて摩擦力
を増加させ、リップ7によるしわ伸ばしはの改善を図っ
た。 実施例3 図3は本発明に係る別の実施例の成膜室のシール部であ
り、(a)は開放時、(b)は封止時である。実施例2
(図1)における上部成膜室壁体22と従来のヒーター
33を有する高圧電極32とを一体構造としたものであ
る。本実施例では、シール材171、123およびリッ
プ押さえ172はAlであり、金属箔のリップ7が取り
付けられている。また、成膜室と共通室のシールを確実
にするために、可撓性基板を挟んで成膜室空間を形成す
る際に、稼動する一方の側の成膜室の面がシール面に対
して可動であるようにし、的確にシール面と接触できる
ようにした。
FIG. 2 is a graph showing the dependence of the photoelectric conversion efficiency of the photoelectric conversion element formed by the thin film manufacturing apparatus according to the present invention on the heater temperature during film formation. Curve a is an element in which an intrinsic semiconductor layer is formed in a film formation chamber of a metal seal portion according to the present invention, and curve b is an element in which an intrinsic semiconductor layer is formed in a film formation chamber of a conventional fluorine rubber seal portion. It is the characteristic of. When the fluorine rubber is used as the seal part, increasing the heater temperature will increase the temperature of the seal part, thus increasing the degassing of impurities.
When metal is used, degassing hardly increases. For this reason, when the sealing portion is made of metal, the outgassing from the sealing portion is small even when the film is formed by increasing the heater temperature, so that the intrinsic semiconductor layer has a good film quality and a high conversion efficiency, as compared with the case of the fluorine rubber. Decrease was small. Example 2 In the film forming chamber of Example 1 (FIG. 1), a metal (stainless steel) foil was used as a material of the lip 7. In the case of the metal foil, the pressure per contact area with the substrate is higher than that of the fluorine-based rubber, but the frictional force with the substrate is small. Therefore, the peripheral section of the lip 7 is bent in an arc shape to increase the contact area. The frictional force was increased, and the wrinkle extension by the lip 7 was improved. Embodiment 3 FIGS. 3A and 3B show a seal portion of a film forming chamber according to another embodiment of the present invention, in which FIG. 3A shows an opened state and FIG. 3B shows a sealed state. Example 2
The upper film forming chamber wall 22 in FIG. 1 and the high-voltage electrode 32 having a conventional heater 33 are integrally formed. In the present embodiment, the seal members 171 and 123 and the lip retainer 172 are made of Al, and the metal foil lip 7 is attached. In addition, in order to ensure the sealing between the film forming chamber and the common chamber, when forming the film forming chamber space with the flexible substrate interposed therebetween, the surface of one of the operating film forming chambers is positioned with respect to the sealing surface. Movable so as to be able to make accurate contact with the sealing surface.

【0049】本構造の場合、シール部は全て金属であり
軟化や脱ガスは起こらないためシール部の冷却機構は必
要がなく、シール部に近い部分のヒーター温度の低下は
せず、薄膜を形成する基板温度を成膜領域全体で均一化
し、成膜室壁に付着した膜の剥離を抑えることができる
ので、剥離フレークによる膜質の低下は生じなくなり、
膜質の均一性も向上することができた。 実施例4 この実施例では、実施例3(図3)における上部成膜室
壁体22と帯状端板171とを同一材質とし、さらに一
体構造とした。そのため、シール部およびその近傍の温
度も基板温度の近くにまで昇温でき、基板の温度均一性
を向上でき、基板内の特性ばらつきが減少した。 実施例5:図4は2枚の基板に同時に成膜する成膜装置
の成膜室のシール部の拡大断面図であり、(a)は本発
明に係る構造、(b)は従来構造である。本図は図11
に示した構造のシール部を簡明にするため模式化したも
のである。従来は絶縁物253として石英、シール材2
52としてフッ素系ゴムを用いるか、あるいは、シール
材と絶縁物を兼ねた肉厚のフッ素系ゴムを用いていた。
しかしながら、温度上昇に伴い、光電変換素子では不純
物となるガスが脱ガスし、膜質を低下させる原因となっ
ていた。この実施例では、高電圧電極221と接地電極
222と同電位となる枠体254を絶縁する絶縁シート
201として厚さ50μm の継ぎ目無し(エンドレス)の
ポリイミドシートを用いた。同様に排気部材208と高
電圧電極221も絶縁シート201により接続した。絶
縁シート201の高電圧電極221および接地電極とな
る枠体254への固定は、従来のサンドイッチ構造とは
異なり、側面から固定治具260をねじで固定し絶縁シ
ート201を各々の電極と挟み込む方法とした。このよ
うなシール方法においても共通室の圧力は 3×10 -2Pa以
下に保つことができ、安定した放電、均一成膜を行うこ
とができた。
In the case of this structure, the seal portion is entirely made of metal.
Since there is no softening or degassing, a cooling mechanism for the seal is required.
There is no need to reduce the heater temperature near the seal
The substrate temperature for forming a thin film is made uniform over the entire deposition area
And the peeling of the film adhered to the film forming chamber wall can be suppressed.
Therefore, deterioration of film quality due to peeling flakes does not occur,
The uniformity of the film quality was also improved. Example 4 In this example, the upper film forming chamber in Example 3 (FIG. 3) was used.
The wall 22 and the strip-shaped end plate 171 are made of the same material.
Body structure. Therefore, the temperature of the seal part and its vicinity
Temperature can be raised close to the substrate temperature, and substrate temperature uniformity
And the variation in characteristics within the substrate was reduced. Example 5: FIG. 4 shows a film forming apparatus for simultaneously forming films on two substrates.
3 is an enlarged cross-sectional view of a seal portion of a film forming chamber of FIG.
(B) is a conventional structure. This figure is shown in FIG.
In order to simplify the seal part of the structure shown in
It is. Conventionally, quartz and sealing material 2 are used as the insulator 253.
52 is made of a fluorine-based rubber or a seal
A thick fluorine-based rubber, which also serves as a material and an insulator, is used.
However, as the temperature rises, the photoelectric conversion element becomes impure.
Substance gas is degassed and causes deterioration of film quality.
I was In this embodiment, the high voltage electrode 221 and the ground electrode
Insulating sheet for insulating frame 254 having the same potential as 222
201 is a seamless (endless) 50μm thick
A polyimide sheet was used. Similarly, the exhaust member 208 and the high
The voltage electrode 221 was also connected by the insulating sheet 201. Absolute
The high voltage electrode 221 and the ground electrode of the edge sheet 201 are used.
The fixing to the frame body 254 is different from the conventional sandwich structure.
Differently, fix the fixing jig 260 with screws from the side and
The sheet 201 is sandwiched between the electrodes. This
The pressure in the common chamber is 3 × 10 -2Pa and below
It is possible to maintain stable discharge and uniform film formation.
I was able to.

【0050】ポリイミドシートに限らず耐熱性、高周波
絶縁特性に優れた材質であれば、例えばアラミド樹脂な
ども用いることができる。また、各々の電極、ならび
に、シール面形状に隙間無く適合する必要があるため、
これら絶縁シートは厚さは10〜500 μm が良いことが判
った。絶縁シートにも成膜されるので、シール部以外の
部分を例えばサンドブラスト等により粗面化することに
より、膜剥がれを抑えることができ、その結果ピンホー
ルなどの欠陥の少ない膜を成膜することができた。
The material is not limited to the polyimide sheet, and for example, an aramid resin can be used as long as the material is excellent in heat resistance and high-frequency insulation properties. In addition, since it is necessary to fit each electrode and the sealing surface shape without gaps,
It has been found that these insulating sheets preferably have a thickness of 10 to 500 μm. Since the film is formed also on the insulating sheet, it is possible to suppress film peeling by roughening a portion other than the seal portion by, for example, sandblasting, thereby forming a film having few defects such as pinholes. Was completed.

【0051】また、高圧電極221とその背面の排気ブ
ロック209との間のシールについても同様に可撓性絶
縁性シート201を用いることができる。このようなシ
ール方法を採用した装置で作成した膜は真空シール材か
らの脱ガスの影響を受けず高品質な膜質であった。 実施例6 実施例3と実施例5を組み合わせた構造の成膜室では、
成膜雰囲気にさらされる部分にフッ素系ゴムが存在せ
ず、成膜する基板と、共通室と成膜室とのシールをする
可撓性絶縁性シート以外は全て金属である。このような
構造の成膜室では、シール部を冷却する必要はない。そ
のため、成膜室には低温となる部分がなくピンホールの
発生原因となるフレーク状の膜が発生しにくい。
The seal between the high-voltage electrode 221 and the exhaust block 209 on the back surface thereof can also be made of the flexible insulating sheet 201. The film produced by the apparatus employing such a sealing method had high quality without being affected by degassing from the vacuum sealing material. Example 6 In a film forming chamber having a structure combining Example 3 and Example 5,
Fluorine-based rubber does not exist in the portion exposed to the film formation atmosphere, and all are metal except for the substrate on which the film is formed and the flexible insulating sheet for sealing the common chamber and the film formation chamber. In the film forming chamber having such a structure, it is not necessary to cool the seal portion. Therefore, there is no low-temperature portion in the film formation chamber, and a flake-like film that causes pinholes is hardly generated.

【0052】また、高電圧電極と接地電極の間がフレキ
シブルな可撓性絶縁性シートであるため、成膜室の熱膨
張または熱収縮に伴う熱歪みの影響はない。さらに、装
置構造が簡単でコストを低く抑えることができる。 実施例7 図5は本発明に係る張力調整装置を有するステッピング
ロール成膜方式の薄膜製造装置の側面断面図である。可
撓性基板を搬送するために、基板の搬送方向に張力をか
けている。搬送距離が長くなるので、可撓性基板を支持
するロールの数を増やさなければならず、ロール軸での
張力ロスが増え、その結果、可撓性基板にかかる張力は
弱くなり、基板の皺等が生じやすくなる。本実施例で
は、可撓性基板の成膜室間に張力調整装置Tを配置し
た。張力調整装置Tは駆動ロールR1および弛み調整ロ
ールR2が備えられており、駆動ロールR1は基板を引
っ張って搬送し、弛み調整ロールR2は皺の生じない程
度の引っ張り力を付加している。こうして、基板の張力
を約100 N/幅に維持し、皺の発生はなく、また、張力過
多による基板の変形による特性不良は発生しなくなっ
た。
Further, since the space between the high voltage electrode and the ground electrode is a flexible and flexible insulating sheet, there is no influence of thermal distortion due to thermal expansion or thermal contraction of the film forming chamber. Furthermore, the device structure is simple and the cost can be kept low. Embodiment 7 FIG. 5 is a side sectional view of a thin film manufacturing apparatus of a stepping roll film forming system having a tension adjusting device according to the present invention. In order to transport the flexible substrate, tension is applied in the transport direction of the substrate. Since the transport distance becomes longer, the number of rolls that support the flexible substrate must be increased, and the loss of tension on the roll axis increases. As a result, the tension on the flexible substrate is reduced, and wrinkles of the substrate are reduced. Etc. easily occur. In this embodiment, the tension adjusting device T is arranged between the film forming chambers of the flexible substrate. The tension adjusting device T includes a driving roll R1 and a slack adjusting roll R2. The driving roll R1 pulls and conveys the substrate, and the slack adjusting roll R2 applies a pulling force that does not cause wrinkles. In this manner, the tension of the substrate was maintained at about 100 N / width, no wrinkles were generated, and no characteristic failure due to deformation of the substrate due to excessive tension was generated.

【0053】この実施例の成膜室を有するにステッピン
グロール方式の薄膜製造装置でpin/pin 2層タンデムア
モルファスシリコン太陽電池を作製したところ、従来構
造の薄膜製造装置で作製したものに比べ、初期光電変換
効率が高く、光劣化率も低かった。また、特にi層を成
膜する成膜室については、実施例6の成膜室構造とする
ことが有効であった。
When a pin / pin two-layer tandem amorphous silicon solar cell was manufactured using a thin film manufacturing apparatus of the stepping roll type having the film forming chamber of this embodiment, the initial stage was smaller than that manufactured by the thin film manufacturing apparatus having the conventional structure. The photoelectric conversion efficiency was high and the light degradation rate was low. In particular, the structure of the film forming chamber of Example 6 was effective for the film forming chamber for forming the i-layer.

【0054】[0054]

【発明の効果】本発明によれば、一つの共通真空槽の中
に、可撓性基板を搬送する搬送系と、この可撓性基板上
に薄膜を成膜する手段を備えた1ないし複数の成膜室を
有し、各成膜室は可撓性基板を境界とする開口部を有す
る2つの成膜部室からなり、各開口部にはシール部が設
けられており、各シール部が基板を挟んで合致して成膜
室と共通真空槽との間が気密となる薄膜製造装置におい
て、前記シール部として金属またはセラミック等の無機
材料を用いたため、脱ガスの多いフッ素系ゴムを用いた
り、これにコーティングしたものに比べ脱ガスはなく、
また、各成膜室と共通室との気密も向上し高品質な膜の
形成が可能となり、光電変換素子の光電変換効率は向上
した。また、シール部への可撓性基板の粘着を防止でき
る。これによって、可撓性基板の搬送トラブルが無くな
った。
According to the present invention, a transport system for transporting a flexible substrate into one common vacuum chamber, and one or more units provided with means for forming a thin film on the flexible substrate are provided. Each of the film forming chambers includes two film forming section chambers each having an opening bounded by a flexible substrate, and each opening is provided with a seal section. In a thin film manufacturing apparatus in which the film formation chamber and the common vacuum chamber are hermetically sealed with the substrate interposed therebetween, since an inorganic material such as metal or ceramic is used for the seal portion, a fluorine-based rubber that is frequently degassed is used. And there is no degassing compared to what is coated on this,
In addition, the airtightness between each of the film forming chambers and the common chamber was improved, so that a high-quality film could be formed, and the photoelectric conversion efficiency of the photoelectric conversion element was improved. Further, sticking of the flexible substrate to the seal portion can be prevented. As a result, trouble in transporting the flexible substrate has been eliminated.

【0055】また、リップを金属箔にすることより、冷
却機構が不要となり、シール部に近い部分の温度を高く
維持でき、基板温度を成膜領域全体に均一化でき、膜質
の均一性が向上した。また、大幅な装置の低コスト化が
可能となった。高電圧電極と接地電極が絶縁物で絶縁さ
れている成膜室構造のもので、絶縁物に可撓性絶縁性基
板を用いることで、装置製造コストが低下した。
Further, by using a metal foil for the lip, a cooling mechanism is not required, the temperature of the portion near the seal portion can be kept high, the substrate temperature can be made uniform over the entire film formation area, and the uniformity of film quality can be improved. did. Further, the cost of the apparatus can be significantly reduced. Since the high voltage electrode and the ground electrode are of a film forming chamber structure insulated by an insulator, and a flexible insulating substrate is used for the insulator, the manufacturing cost of the apparatus is reduced.

【0056】また、絶縁物を高電圧電極と接地電極の間
に挟むのではなくこれらの側面から固定することで、交
換が容易となった。
The replacement is facilitated by fixing the insulator not from the side between the high-voltage electrode and the ground electrode but from these side surfaces.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る薄膜製造装置の成膜室のシール部
分の拡大断面図であり、(a)は開放時、(b)は封止
FIGS. 1A and 1B are enlarged cross-sectional views of a sealing portion of a film forming chamber of a thin film manufacturing apparatus according to the present invention, wherein FIG.

【図2】本発明に係る薄膜製造装置により成膜した光電
変換素子の光電変換効率の成膜時のヒーター温度依存性
を示すグラフ
FIG. 2 is a graph showing the heater temperature dependence of the photoelectric conversion efficiency of the photoelectric conversion element formed by the thin film manufacturing apparatus according to the present invention during the film formation.

【図3】本発明に係る別の実施例の成膜室のシール部分
の拡大断面図であり、(a)は開放時、(b)は封止時
3A and 3B are enlarged cross-sectional views of a sealing portion of a film forming chamber according to another embodiment of the present invention, wherein FIG. 3A is open and FIG.

【図4】2枚の基板に同時に成膜する成膜装置の成膜室
のシール部の拡大断面図であり、(a)は本発明に係る
構造、(b)は従来構造
FIGS. 4A and 4B are enlarged cross-sectional views of a sealing portion of a film forming chamber of a film forming apparatus for simultaneously forming a film on two substrates, wherein FIG. 4A is a structure according to the present invention, and FIG.

【図5】本発明に係る張力調整装置を有する有するステ
ッピングロール成膜方式の薄膜製造装置の側面断面図
FIG. 5 is a side sectional view of a thin film manufacturing apparatus of a stepping roll film forming method having a tension adjusting device according to the present invention.

【図6】共通真空室内に成膜室を複数有するステッピン
グロール成膜方式の薄膜製造装置の側面断面図
FIG. 6 is a side sectional view of a thin film manufacturing apparatus of a stepping roll film forming system having a plurality of film forming chambers in a common vacuum chamber.

【図7】従来のステッピングロール方式の薄膜製造装置
の成膜室の断面図であり、(a)開放時、(b)は封止
FIGS. 7A and 7B are cross-sectional views of a film forming chamber of a conventional stepping roll type thin film manufacturing apparatus, in which FIG.

【図8】従来の薄膜製造装置の成膜室の下部および上部
成膜室のシール部の断面図
FIG. 8 is a cross-sectional view of a seal portion of a lower and upper film forming chambers of a film forming chamber of a conventional thin film manufacturing apparatus.

【図9】従来のプラズマCVDにより成膜を行う薄膜製
造装置の成膜室の開放時を示す可撓性基板の搬送方向に
垂直な断面図
FIG. 9 is a cross-sectional view perpendicular to the direction in which a flexible substrate is conveyed when a film forming chamber of a conventional thin film manufacturing apparatus for forming a film by plasma CVD is opened.

【図10】従来の薄膜製造装置(図9)の成膜室のシー
ル部の拡大断面図であり、(a)が成膜室開放時、
(b)が成膜室封止時
10 is an enlarged cross-sectional view of a sealing portion of a film forming chamber of a conventional thin film manufacturing apparatus (FIG. 9), where FIG.
(B) when the film forming chamber is sealed

【図11】従来の2枚の基板に同時に成膜する薄膜製造
装置の成膜室の断面図であり、(a)は成膜室開放時、
(b)は成膜室封止時
11A and 11B are cross-sectional views of a film forming chamber of a conventional thin film manufacturing apparatus for simultaneously forming a film on two substrates, and FIG.
(B) when the film forming chamber is sealed

【符号の説明】[Explanation of symbols]

1 可撓性基板 21 下部成膜室壁体 22 上部成膜室壁体 27 トッププレート 28 ハウジング 29 移動プレート 43 移動プレート 30 上下駆動ガイド 31 高電圧電極 32 接地電極 36 共通真空室壁体 41 アクチュエータ 44 アクチュエータ 6 成膜空間 61 真空排気管 64 可撓性配管 7 リップ 71 L型パッキン 72 リップ押さえ 80 成膜室 81 共通室 82 コア 83 コア 123 帯状端板 171 帯状端板 173 リップ押さえ 201 絶縁性可撓性基板 205 成膜室 206 プラズマ 208 排気部材 209 排気ブロック 210 共通室 221 高電圧電極 222 接地電極 223 ヒータ 252 シール材 253 絶縁物 254 枠体 255 シール材 258 ネジ 260 固定治具 272 真空排気口 T 張力調整装置 R1 駆動ロール R2 弛み調整ロール DESCRIPTION OF SYMBOLS 1 Flexible substrate 21 Lower film forming chamber wall 22 Upper film forming chamber wall 27 Top plate 28 Housing 29 Moving plate 43 Moving plate 30 Vertical drive guide 31 High voltage electrode 32 Ground electrode 36 Common vacuum chamber wall 41 Actuator 44 Actuator 6 Film forming space 61 Vacuum exhaust pipe 64 Flexible piping 7 Lip 71 L-shaped packing 72 Lip holding 80 Film forming chamber 81 Common chamber 82 Core 83 Core 123 Band end plate 171 Band end plate 173 Lip holding 201 Insulating flexible Functional substrate 205 Deposition chamber 206 Plasma 208 Exhaust member 209 Exhaust block 210 Common chamber 221 High voltage electrode 222 Ground electrode 223 Heater 252 Seal material 253 Insulator 254 Frame 255 Seal material 258 Screw 260 Fixing jig 272 Vacuum exhaust port T tension Adjustment device First drive roll R2 slack adjustment roll

Claims (14)

【特許請求の範囲】[Claims] 【請求項1】一つの共通真空槽の中に、可撓性基板を搬
送する搬送系と、この可撓性基板上に薄膜を成膜する手
段を備えた1ないし複数の成膜室を有し、各成膜室は可
撓性基板を境界とする開口部を有する2つの成膜部室か
らなり、各開口部にはシール部が設けられており、各シ
ール部が基板を挟んで合致して成膜室と共通真空槽との
間が気密となる薄膜製造装置において、前記シール部は
金属またはセラミック等の無機材料からなることを特徴
とする薄膜製造装置。
In a common vacuum chamber, there is provided a transfer system for transferring a flexible substrate, and one or a plurality of film forming chambers provided with means for forming a thin film on the flexible substrate. Each of the film forming chambers includes two film forming section chambers each having an opening bounded by a flexible substrate, and each opening is provided with a seal portion, and each seal portion is aligned with the substrate interposed therebetween. A thin-film manufacturing apparatus in which the space between the film forming chamber and the common vacuum chamber is airtight, wherein the seal portion is made of an inorganic material such as metal or ceramic.
【請求項2】前記シール部の基板と接触し合う部分の幅
は10mm以上であることを特徴とする請求項1に記載の
薄膜製造装置。
2. The thin film manufacturing apparatus according to claim 1, wherein a width of a portion of the seal portion that contacts the substrate is 10 mm or more.
【請求項3】前記成膜部室のうち可動な成膜部室と基板
を加熱するヒーターとが一体構造であることを特徴とす
る請求項1または2に記載の薄膜製造装置。
3. The thin film manufacturing apparatus according to claim 1, wherein a movable film forming section chamber of the film forming section chamber and a heater for heating a substrate have an integral structure.
【請求項4】前記可動な成膜部室とシール部が同一材料
からなり一体であることを特徴とする請求項3に記載の
薄膜製造装置。
4. The thin-film manufacturing apparatus according to claim 3, wherein the movable film-forming section chamber and the sealing section are made of the same material and are integrated.
【請求項5】前記シール部の圧力は 1×104Pa 以上 5×
105 Pa以下であることを特徴とする請求項1ないし4に
記載の薄膜製造装置。
5. The pressure of said seal portion is 1 × 10 4 Pa or more and 5 ×
5. The thin film manufacturing apparatus according to claim 1, wherein the pressure is 10 5 Pa or less.
【請求項6】一つの共通真空槽の中に、可撓性基板を搬
送する搬送系と、この可撓性基板上に薄膜を成膜する手
段を備えた1ないし複数の成膜室を有し、各成膜室は可
撓性基板を境界とする開口部を有する2つの成膜部室か
らなり、各開口部にはシール部が設けられており、各シ
ール部が基板を挟んで合致して成膜室と共通真空槽との
間が気密となる薄膜製造装置において、一方の成膜部室
の開口部のシール部は金属からなる箔または板であり、
成膜部室の外方に向けて傾斜した弾性のある唇状体であ
ることを特徴とする薄膜製造装置。
6. A common vacuum chamber having a transport system for transporting a flexible substrate and one or a plurality of deposition chambers having means for depositing a thin film on the flexible substrate. Each of the film forming chambers includes two film forming section chambers each having an opening bounded by a flexible substrate, and each opening is provided with a seal portion, and each seal portion is aligned with the substrate interposed therebetween. In a thin-film manufacturing apparatus in which the space between the film forming chamber and the common vacuum chamber is airtight, the sealing portion of the opening of one of the film forming section chambers is a metal foil or plate,
An apparatus for manufacturing a thin film, comprising: an elastic lip-shaped body inclined toward the outside of a film forming section chamber.
【請求項7】一つの共通真空槽の中に、可撓性基板を搬
送する搬送系と、この可撓性基板上に薄膜を成膜する手
段を備えた1ないし複数の成膜室を有し、各成膜室は可
撓性基板を境界とする開口部を有する2つの成膜部室か
らなり、各開口部にはシール部が設けられており、各シ
ール部が基板を挟んで合致して成膜室と共通真空槽との
間が気密となる薄膜製造装置であって、一方の成膜室部
が高電圧電極とその周縁のシール部からなる薄膜製造装
置において、前記成膜室の前記高電圧電極と実効的に接
地電位となる部分との間の絶縁物として可撓性絶縁性シ
ートを用いることを特徴とする薄膜製造装置。
7. A common vacuum chamber having a transfer system for transferring a flexible substrate and one or more film forming chambers provided with means for forming a thin film on the flexible substrate. Each of the film forming chambers includes two film forming section chambers each having an opening bounded by a flexible substrate, and each opening is provided with a seal portion, and each seal portion is aligned with the substrate interposed therebetween. A thin-film manufacturing apparatus in which the space between the film-forming chamber and the common vacuum chamber is hermetically sealed, and one of the film-forming chambers includes a high-voltage electrode and a sealing portion around the periphery thereof. A thin-film manufacturing apparatus, wherein a flexible insulating sheet is used as an insulator between the high-voltage electrode and a portion that effectively becomes a ground potential.
【請求項8】前記実効的に接地電位となる部分は成膜室
の排気部材であることを特徴とする請求項7に記載の薄
膜製造装置。
8. The thin-film manufacturing apparatus according to claim 7, wherein the portion that effectively becomes the ground potential is an exhaust member of a film forming chamber.
【請求項9】前記実効的に接地電位となる部分は成膜室
の接地電極の周縁部の枠体であることを特徴とする請求
項7に記載の薄膜製造装置。
9. The thin-film manufacturing apparatus according to claim 7, wherein the portion which becomes an effective ground potential is a frame around the periphery of the ground electrode in the film forming chamber.
【請求項10】前記可撓性絶縁シートは帯状の固定治具
によって固定されていることを特徴とする請求項7ない
し9に記載の薄膜製造装置。
10. The thin film manufacturing apparatus according to claim 7, wherein said flexible insulating sheet is fixed by a band-shaped fixing jig.
【請求項11】前記絶縁シートはポリイミド樹脂または
アラミド樹脂からなることを特徴とする請求項7ないし
10に記載の薄膜製造装置。
11. An apparatus according to claim 7, wherein said insulating sheet is made of a polyimide resin or an aramid resin.
【請求項12】前記絶縁シート厚さは10μm 〜 500μm
であるとこを特徴とする請求項11に記載の薄膜製造装
置。
12. The insulating sheet has a thickness of 10 μm to 500 μm.
The thin film manufacturing apparatus according to claim 11, wherein
【請求項13】前記成膜室間に基板の張力調整装置が備
えられていることを特徴とする請求項1ないし12に記
載の薄膜製造装置。
13. The thin film manufacturing apparatus according to claim 1, further comprising a substrate tension adjusting device between said film forming chambers.
【請求項14】少なくとも光電変換層および電極層が積
層されてなる薄膜光電変換素子において、請求項1ない
し13に記載の薄膜製造装置によって製造されたことを
特徴とする薄膜光電変換素子。
14. A thin-film photoelectric conversion device comprising at least a photoelectric conversion layer and an electrode layer laminated, wherein the thin-film photoelectric conversion device is manufactured by the thin-film manufacturing apparatus according to claim 1.
JP30400897A 1997-11-06 1997-11-06 Thin film manufacturing equipment Expired - Lifetime JP3475752B2 (en)

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Application Number Priority Date Filing Date Title
JP30400897A JP3475752B2 (en) 1997-11-06 1997-11-06 Thin film manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30400897A JP3475752B2 (en) 1997-11-06 1997-11-06 Thin film manufacturing equipment

Publications (2)

Publication Number Publication Date
JPH11145060A true JPH11145060A (en) 1999-05-28
JP3475752B2 JP3475752B2 (en) 2003-12-08

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ID=17927961

Family Applications (1)

Application Number Title Priority Date Filing Date
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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007311417A (en) * 2006-05-16 2007-11-29 Fuji Electric Holdings Co Ltd Apparatus and method for manufacturing thin film
JP2009513020A (en) * 2005-10-19 2009-03-26 ソロパワー、インコーポレイテッド Method and apparatus for converting a precursor layer into a photovoltaic absorber
DE102011110410A1 (en) 2010-08-19 2012-03-29 Fuji Electric Co., Ltd. Multilayer film formation method and film deposition apparatus used with the method
US8323735B2 (en) 2006-10-13 2012-12-04 Solopower, Inc. Method and apparatus to form solar cell absorber layers with planar surface
US8409418B2 (en) 2009-02-06 2013-04-02 Solopower, Inc. Enhanced plating chemistries and methods for preparation of group IBIIIAVIA thin film solar cell absorbers
US9103033B2 (en) 2006-10-13 2015-08-11 Solopower Systems, Inc. Reel-to-reel reaction of precursor film to form solar cell absorber
TWI796982B (en) * 2022-03-28 2023-03-21 力哲科技股份有限公司 Fixtures for Low Pressure Chemical Vapor Deposition

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009513020A (en) * 2005-10-19 2009-03-26 ソロパワー、インコーポレイテッド Method and apparatus for converting a precursor layer into a photovoltaic absorber
JP2007311417A (en) * 2006-05-16 2007-11-29 Fuji Electric Holdings Co Ltd Apparatus and method for manufacturing thin film
US8323735B2 (en) 2006-10-13 2012-12-04 Solopower, Inc. Method and apparatus to form solar cell absorber layers with planar surface
US9103033B2 (en) 2006-10-13 2015-08-11 Solopower Systems, Inc. Reel-to-reel reaction of precursor film to form solar cell absorber
US8409418B2 (en) 2009-02-06 2013-04-02 Solopower, Inc. Enhanced plating chemistries and methods for preparation of group IBIIIAVIA thin film solar cell absorbers
DE102011110410A1 (en) 2010-08-19 2012-03-29 Fuji Electric Co., Ltd. Multilayer film formation method and film deposition apparatus used with the method
TWI796982B (en) * 2022-03-28 2023-03-21 力哲科技股份有限公司 Fixtures for Low Pressure Chemical Vapor Deposition

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