JPH104152A - Electronic component - Google Patents

Electronic component

Info

Publication number
JPH104152A
JPH104152A JP15513996A JP15513996A JPH104152A JP H104152 A JPH104152 A JP H104152A JP 15513996 A JP15513996 A JP 15513996A JP 15513996 A JP15513996 A JP 15513996A JP H104152 A JPH104152 A JP H104152A
Authority
JP
Japan
Prior art keywords
case
hole
metal film
electrode
sealing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15513996A
Other languages
Japanese (ja)
Inventor
Sadashi Nakamura
禎志 中村
Daizo Ando
大蔵 安藤
Kunihiko Oishi
邦彦 大石
Shinji Umeda
眞司 梅田
Tetsuo Yuzawa
哲夫 湯澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP15513996A priority Critical patent/JPH104152A/en
Publication of JPH104152A publication Critical patent/JPH104152A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To prevent the deterioration of the characteristics of an electronic component, which is caused by adhesion of a bonding agent, by a method wherein sealing materials are extended so as to connect with the electrodes of an element in the part in a case and, at the same time, the outer peripheral parts of through holes on metal films are covered with the sealing materials in the outer part of the case. SOLUTION: A case is constituted of a frame material 1 and plate materials 4 and 5, and a semiconductor IC chip 3 is housed in the case. A plurality of through holes 6 are formed in the plate material 4 with a diameter longer in the side facing the IC chip 3 than in the external side. A metal film 7 is formed in the internal side of the through hole 6 and in the outer periphery of the through hole 6 in the external side of the plate member 7. Solders 8, which are used as sealing materials, are respectively provided on these films 7. These solders 8 are respectively connected with the respective input/output electrodes 9 of the chip 3 in an open part 2 of the case and are respectively connected with external electrodes 10 in such a way as to cover the outer peripheral parts of the holes 6 on the films 7 in the outer part of the case. Accordingly, the deterioration of the characteristics of an electronic component, which is caused by adhesion of a bonding agent, can be prevented from being generated.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、SAWフィルタ、
SAW発振子あるいは水晶振動子などの電子部品に関す
るものである。
TECHNICAL FIELD The present invention relates to a SAW filter,
The present invention relates to an electronic component such as a SAW oscillator or a quartz oscillator.

【0002】[0002]

【従来の技術】例えば、SAWフィルタやSAW発振子
あるいは水晶振動子は、外部雰囲気に応じてその特性が
変動するので、それらの素子をケース内に密封する構成
となっていた。
2. Description of the Related Art For example, the characteristics of a SAW filter, a SAW oscillator, or a crystal oscillator fluctuate in accordance with an external atmosphere. Therefore, these elements are sealed in a case.

【0003】[0003]

【発明が解決しようとする課題】上記従来のものにおい
ては、リード線を用いて素子の入出力電極とケースの外
部引き出し電極を接続する構成となっており、素子の固
定は接着剤により行っていたので、この接着剤の一部が
飛散しそれが素子に付着してその特性を劣化させてしま
うという問題があった。
In the above conventional device, the input / output electrodes of the element are connected to the external lead-out electrodes of the case using lead wires, and the element is fixed with an adhesive. Therefore, there is a problem that a part of the adhesive is scattered and adheres to the element to deteriorate its characteristics.

【0004】本発明はリード線や接着剤を用いずに素子
の固定と外部引き出し電極との接続を行うと同時に素子
を密封する構造とすることにより、接着剤の付着による
特性劣化を防止することを目的とするものである。
[0004] The present invention prevents the deterioration of characteristics due to the adhesion of the adhesive by fixing the element and connecting the external lead electrode without using a lead wire or an adhesive and at the same time, by sealing the element. It is intended for.

【0005】[0005]

【課題を解決するための手段】そしてこの目的を達成す
るために本発明は、絶縁性でかつ少なくとも表面が非ろ
う付け性であるケースと、このケース内に設けられた片
面に電極を具備する素子と、前記素子の電極に対応する
ケース部分に形成したケース内部分よりケース外部分の
方が開孔部の直径が大きくなる少なくとも1個以上の貫
通孔と、この貫通孔の内面及びケース外の貫通孔の外周
部分に設けた金属膜と、前記金属膜上に設けられ前記貫
通孔を封止するろう材よりなる封孔体を備え、この封孔
体は前記ケース内部分において前記素子の電極に接続さ
れるように延長されケース外部分において前記金属膜の
少なくとも貫通孔の外周部分を覆うように構成したもの
である。
In order to achieve this object, the present invention comprises a case which is insulative and has at least a non-brazing surface, and an electrode provided on one side provided in the case. An element, at least one or more through-holes in which the diameter of the opening is larger on the outside of the case than on the inside of the case formed in the case portion corresponding to the electrode of the element; A metal film provided on an outer peripheral portion of the through-hole, and a sealing member provided on the metal film and made of a brazing material for sealing the through-hole, and the sealing member includes a sealing member of the element in the case inner portion. The metal film is extended so as to be connected to the electrode and covers at least the outer peripheral portion of the through hole of the metal film in the outer portion of the case.

【0006】以上の構成とすることにより強度が強く気
密性が極めて高く、特性劣化のない電子部品が得られ
る。
With the above construction, an electronic component having high strength and extremely high hermeticity without deterioration in characteristics can be obtained.

【0007】[0007]

【発明の実施の形態】本発明の請求項1に記載の発明
は、絶縁性でかつ少なくとも表面が非ろう付け性である
ケースと、このケース内に設けられた片面に電極を具備
する素子と、前記素子の電極に対応するケース部分に形
成したケース内部分よりケース外部分の方が開孔部の直
径が大きくなる少なくとも1個以上の貫通孔と、この貫
通孔の内面及びケース外の貫通孔の外周部分に設けた金
属膜と、前記金属膜上に設けられ前記貫通孔を封止する
ろう材よりなる封孔体を備え、この封孔体は前記ケース
内部分において前記素子の電極に接続されるように延長
されておりケース外部分において前記金属膜の少なくと
も貫通孔の外周部分を覆うように構成したものであり、
気密性に優れ強度も強く特性劣化のないものとすること
ができる。
BEST MODE FOR CARRYING OUT THE INVENTION The invention according to claim 1 of the present invention relates to a case which is insulative and has at least a non-brazing surface, and an element provided in this case and having an electrode on one surface. At least one or more through-holes in which the diameter of the opening is larger on the outside of the case than on the inside of the case formed on the case corresponding to the electrode of the element; A metal film provided on an outer peripheral portion of the hole, and a sealing member provided on the metal film and made of a brazing material for sealing the through hole, and the sealing member is provided on the electrode of the element in the case inner portion. It is configured to be extended so as to be connected and to cover at least the outer peripheral portion of the through hole of the metal film in the outer portion of the case,
The airtightness is excellent, the strength is strong, and there is no characteristic deterioration.

【0008】請求項2に記載の発明は、素子が表面弾性
波デバイスよりなり、その入出力電極に封孔体を接続
し、この封孔体により素子がケース内部の少なくとも貫
通孔側の内壁面から若干離れているようにしたもので、
確実に素子を振動させるものとなる。
According to a second aspect of the present invention, the element is formed of a surface acoustic wave device, and a sealing member is connected to the input / output electrode of the device. Slightly away from the
The element is reliably vibrated.

【0009】請求項3に記載の発明は、絶縁性でかつ少
なくとも表面が非ろう付け性であるケースと、このケー
ス内に設けられた片面に電極を具備する素子と、前記素
子の電極に対応するケース部分に形成した少なくとも1
個以上の第一の貫通孔と、この第一の貫通孔の内面及び
ケース外の第一の貫通孔の外周部分に設けた金属膜と、
前記金属膜上に設けられ前記第一の貫通孔を封止するろ
う材よりなる第一の封孔体を備え、この第一の封孔体は
前記ケース内部分において素子がケース内部の少なくと
も第一の貫通孔側の内壁面から若干離れるように延長さ
れ、前記第一の封孔体のケース内部分の直径は第一の貫
通孔のケース内部分の開孔部の直径よりも若干大きくな
るよう形成し、前記第一の封孔体は前記素子の電極と接
続され、ケース外部分において前記金属膜の少なくとも
第一の貫通孔の外周部分を覆うように構成され、前記ケ
ースの第一の貫通孔を設けた面と対向する面に少なくと
も1個以上の第二の貫通孔を設け、この第二の貫通孔を
封止する無機材料よりなる第二の封孔体を備えたもので
あり、封孔体の注入が容易となる。
According to a third aspect of the present invention, there is provided a case which is insulative and has at least a non-brazing surface, an element provided in the case and having an electrode on one surface, and an electrode corresponding to the element. At least one formed in the case part
And more than one first through-hole, a metal film provided on the inner surface of the first through-hole and the outer peripheral portion of the first through-hole outside the case,
A first sealing body made of a brazing material provided on the metal film and sealing the first through-hole is provided, and the first sealing body has at least a first element inside the case inside the case. It is extended slightly away from the inner wall surface on the side of one through hole, and the diameter of the inner portion of the case of the first sealing body is slightly larger than the diameter of the opening of the inner portion of the case of the first through hole. Formed, the first sealing body is connected to the electrode of the element, and is configured to cover at least an outer peripheral portion of the first through hole of the metal film in an outer portion of the case, and a first portion of the case is formed. At least one or more second through holes are provided on a surface opposite to the surface on which the through holes are provided, and a second sealing body made of an inorganic material for sealing the second through holes is provided. In addition, injection of the sealing body becomes easy.

【0010】請求項4に記載の発明は、第二の貫通孔の
内面及びケース外の第二の貫通孔の外周部分に第一の貫
通孔と同様の金属膜と、前記金属膜上に設けられ前記第
二の貫通孔を封止する第一の封孔体と同様の材料を用い
た第二の封孔体を備え、この第二の封孔体はケース外部
分において前記金属膜の少なくとも第二の貫通孔の外周
部分を覆うように構成したものであり、気密性の向上が
図れることになる。
According to a fourth aspect of the present invention, the same metal film as the first through hole is provided on the inner surface of the second through hole and the outer peripheral portion of the second through hole outside the case, and provided on the metal film. A second sealing body using the same material as the first sealing body that seals the second through-hole, and the second sealing body has at least the metal film in the outer portion of the case. Since the outer peripheral portion of the second through hole is configured to be covered, the airtightness can be improved.

【0011】請求項5に記載の発明は、封孔体のケース
内部分の直径は、貫通孔のケース内部分に開孔部の直径
よりも若干大きくなるよう形成したものであり、素子と
の接続強度の向上が図れることになる。
According to a fifth aspect of the present invention, the diameter of the inside of the case of the sealing body is formed to be slightly larger than the diameter of the opening in the inside of the case of the through hole. The connection strength can be improved.

【0012】請求項6に記載の発明は、ガラス材料で形
成されたケースと、このケース内に設けられた表面弾性
波デバイスよりなる素子と、前記素子の電極に対応する
ケース部分に形成したケース内部分よりケース外部分の
方が開孔部の直径が大きくなる少なくとも1個以上の貫
通孔と、この貫通孔の内面及びケース外の貫通孔の外周
部分に設けた少なくとも表面を金または錫とした金属膜
と、前記金属膜上に設けられ前記貫通孔を封止する半田
材料よりなる封孔体を備え、この封孔体は前記ケース内
部分において素子がケース内部の少なくとも貫通孔側の
内壁面から若干離れるように延長され前記封孔体のケー
ス内部分の直径は貫通孔のケース内部分の開孔部の直径
よりも若干大きくなるよう形成し、前記封孔体は前記素
子の電極と接続されケース外部分において前記金属膜の
少なくとも貫通孔の外周部分を覆うように構成したもの
であり、素子との接続強度の向上と気密性の向上が図れ
ることになる。
According to a sixth aspect of the present invention, there is provided a case formed of a glass material, an element comprising a surface acoustic wave device provided in the case, and a case formed in a case portion corresponding to an electrode of the element. At least one or more through-holes in which the outer portion of the case has a larger opening diameter than the inner portion, and at least the surface provided on the inner surface of the through-hole and the outer peripheral portion of the through-hole outside the case is made of gold or tin. And a sealing body made of a solder material provided on the metal film and sealing the through-hole, and the sealing body has an element inside the case at least on the through-hole side inside the case. It is extended so as to be slightly away from the wall surface, and the diameter of the inner part of the case of the sealing body is formed to be slightly larger than the diameter of the opening of the inner part of the case of the through hole. Connected In case outside portions are those configured to cover the outer peripheral portion of at least the through hole of the metal film, so that can be improved to improve the airtightness of the connection strength between the elements.

【0013】請求項7に記載の発明は、ガラス材料で形
成されたケースと、このケース内に設けられた表面弾性
波デバイスよりなる素子と、前記素子の電極に対応する
ケース部分に形成したケース内部分よりケース外部分の
方が開孔部の直径が大きくなる少なくとも1個以上の第
一の貫通孔と、この第一の貫通孔の内面及びケース外の
第一の貫通孔の外周部分に設けた少なくとも表面を金ま
たは錫とした金属膜と、前記金属膜上に設けられ前記第
一の貫通孔を封止する半田材料よりなる第一の封孔体を
備え、この第一の封孔体は前記ケース内部分において素
子がケース内部の少なくとも第一の貫通孔側の内壁面か
ら若干離れるように延長され、前記第一の封孔体のケー
ス内部分の直径は第一の貫通孔のケース内部分の開孔部
の直径よりも若干大きくなるよう形成し、前記第一の封
孔体は前記素子の電極と接続され、ケース外部分におい
て前記金属膜の少なくとも第一の貫通孔の外周部分を覆
うように構成され、前記ケースの第一の貫通孔を設けた
面と対向する面に少なくとも1個以上の第二の貫通孔を
設け、この第二の貫通孔の内面及びケース外の第二の貫
通孔の外周部分に第一の貫通孔と同様の金属膜と、前記
金属膜上に設けられ前記第二の貫通孔を封止する第一の
封孔体と同様の材料を用いた第二の封孔体を備え、この
第二の封孔体はケース外部分において前記金属膜の少な
くとも第二の貫通孔の外周部分を覆うように構成したも
のであり、封孔体の形成が容易で気密性の向上が図れる
ことになる。
According to a seventh aspect of the present invention, there is provided a case formed of a glass material, an element comprising a surface acoustic wave device provided in the case, and a case formed in a case portion corresponding to an electrode of the element. At least one or more first through holes in which the diameter of the opening portion is larger on the outside of the case than on the inner portion, and on the inner surface of the first through hole and the outer peripheral portion of the first through hole outside the case. A metal film having at least a surface of gold or tin provided thereon, and a first sealing body made of a solder material provided on the metal film and sealing the first through hole; The body is extended in the case inner part so that the element is slightly away from the inner wall surface on the side of at least the first through hole inside the case, and the diameter of the case inner part of the first sealing body is the diameter of the first through hole. Slightly larger than the diameter of the opening inside the case The first sealing member is formed so as to be tighter, and the first sealing member is connected to the electrode of the element, and is configured to cover at least an outer peripheral portion of the first through hole of the metal film in an outer portion of the case. At least one or more second through holes are provided on a surface facing the surface provided with one through hole, and a first through hole is provided on an inner surface of the second through hole and an outer peripheral portion of the second through hole outside the case. A metal film similar to the through-hole, and a second sealing body using the same material as the first sealing body provided on the metal film and sealing the second through-hole, The second sealing member is configured so as to cover at least the outer peripheral portion of the second through hole of the metal film in the outer portion of the case, so that the sealing member can be easily formed and the airtightness can be improved. .

【0014】請求項8に記載の発明は、素子とケース内
部の貫通孔側の内壁面の間にスペーサを設けたものであ
り、素子の振動を確実に確保することができる。
According to an eighth aspect of the present invention, a spacer is provided between the element and the inner wall surface on the side of the through hole inside the case, so that vibration of the element can be reliably ensured.

【0015】請求項9に記載の発明は、スペーサが無機
材料よりなり、表面弾性波デバイスよりなる素子のくし
形電極と入出力電極以外の部分に形成されたものであ
り、表面弾性波デバイスとしての振動を確保できる。
According to a ninth aspect of the present invention, the spacer is made of an inorganic material, and is formed at a portion other than the comb-shaped electrode and the input / output electrode of the element made of the surface acoustic wave device. Vibration can be secured.

【0016】請求項10に記載の発明は、素子とケース
内部の貫通孔側の内壁面の間で、かつ貫通孔のケース内
部分の開孔部の周囲に堤防体を設けたものであり、封孔
体によってショートすることを防止することができる。
According to a tenth aspect of the present invention, a dike is provided between the element and the inner wall surface on the side of the through hole inside the case and around the opening of the through hole inside the case. Short circuit can be prevented by the sealing body.

【0017】以下、具体的な実施の形態について図面を
用いて説明する。 (実施の形態1)第一の実施の形態を図1と共に説明す
る。図1において、1は枠体で例えば硼珪酸ガラスで作
られている。この枠体1の開孔部2内には素子の一例と
して半導体ICチップ3が収納されている。また枠体1
の上下面にはそれぞれ硼珪酸ガラスで作られた第一、第
二の板体4,5がガラスどうしの直接接合により結合さ
れている。
Hereinafter, specific embodiments will be described with reference to the drawings. (Embodiment 1) A first embodiment will be described with reference to FIG. In FIG. 1, reference numeral 1 denotes a frame made of, for example, borosilicate glass. A semiconductor IC chip 3 is housed in the opening 2 of the frame 1 as an example of an element. Frame 1
First and second plate members 4 and 5 made of borosilicate glass are respectively connected to the upper and lower surfaces by direct bonding between the glasses.

【0018】また、第一の板体4には素子側の面より外
側の面の方が開孔部の直径が大となる複数個の貫通孔6
が形成され、この貫通孔6の内面及び第一の板体4の外
側の面の貫通孔6の外周部分に金属膜7を形成し、この
金属膜7上に封孔体の一例として半田8が設けられ、こ
の半田8は開孔部2内においてそれぞれの半導体ICチ
ップ3の入出力用の電極9に接続され、第一の板体4の
外側の面においては貫通孔6の外周部に設けた金属膜7
上の少なくとも貫通孔6の外周を覆うようにし、半田8
は第一の板体4の外側の面において外部電極10に接続
されている。すなわち枠体1、枠体4,5によりケース
が構成され、そのケース内に半導体ICチップ3が収納
されている。
The first plate 4 has a plurality of through-holes 6 whose outer diameters are larger on the outer surface than on the element-side surface.
A metal film 7 is formed on an inner surface of the through hole 6 and an outer peripheral portion of the through hole 6 on an outer surface of the first plate body 4, and a solder 8 is formed on the metal film 7 as an example of a sealing body. The solder 8 is connected to the input / output electrodes 9 of each semiconductor IC chip 3 in the opening 2, and on the outer surface of the first plate 4, Metal film 7 provided
At least the outer periphery of the through hole 6 is covered with the solder 8
Is connected to the external electrode 10 on the outer surface of the first plate 4. That is, the frame 1, the frames 4 and 5 form a case, and the semiconductor IC chip 3 is housed in the case.

【0019】図2は図1の第一の実施の形態の断面図で
ある。枠体1の板厚は400μmで、第一の板体4の板
厚は200μm、第二の板体5の板厚は200μmで、
さらに半導体ICチップ3の板厚は340μmとなって
いる。つまり半導体ICチップ3は枠体1よりも板厚が
薄いので、上下の板体4,5のいずれかあるいは両方の
内壁面との間には必ず空間11が形成される。ここで、
半導体ICチップ3のように配線パターン上に空間が不
必要な素子については、半田8が電極9に接続される
際、半導体ICチップ3の配線パターンの表面と第一の
板体4の内壁面との間には空間11は形成される必要は
ない。また、貫通孔6は半田8の注入を容易にするため
外側から半導体ICチップ3側の面に向かって径が小さ
くなるように形成している。
FIG. 2 is a sectional view of the first embodiment of FIG. The thickness of the frame 1 is 400 μm, the thickness of the first plate 4 is 200 μm, the thickness of the second plate 5 is 200 μm,
Further, the thickness of the semiconductor IC chip 3 is 340 μm. That is, since the semiconductor IC chip 3 is thinner than the frame 1, a space 11 is always formed between one or both of the upper and lower plates 4, 5 or both inner wall surfaces. here,
For an element such as the semiconductor IC chip 3 that does not require space on the wiring pattern, when the solder 8 is connected to the electrode 9, the surface of the wiring pattern of the semiconductor IC chip 3 and the inner wall surface of the first plate 4 The space 11 does not need to be formed between them. Further, the through hole 6 is formed so that the diameter decreases from the outside toward the surface on the semiconductor IC chip 3 side to facilitate the injection of the solder 8.

【0020】このように、半導体ICチップ3の入出力
電極9はこの数ヵ所の半田8と合金接続され、その接続
強度は半導体ICチップ3を固定するのに十分な強度を
有しているため、ケース内において前後左右方向への位
置ずれを生じることはない。また、半田8が第一の板体
4の外側の面において貫通孔6の外周部に設けた金属膜
7上の少なくとも貫通孔6の外周を覆うことにより、ケ
ース内の気密性は極めて高く保たれるようになる。
As described above, the input / output electrodes 9 of the semiconductor IC chip 3 are alloy-connected to the solders 8 at several locations, and the connection strength is sufficient to fix the semiconductor IC chip 3. In addition, there is no displacement in the front, rear, left and right directions in the case. Further, since the solder 8 covers at least the outer periphery of the through-hole 6 on the metal film 7 provided on the outer periphery of the through-hole 6 on the outer surface of the first plate body 4, the airtightness in the case is extremely high. You will be drooped.

【0021】(実施の形態2)第二の実施の形態を図3
と共に説明する。図3において、1は枠体で例えば硼珪
酸ガラスで作られている。この枠体1の開孔部2内には
素子の一例としてSAWフィルタチップ(SAW発振子
チップ等でも良い)12が収納されている。また枠体1
の上下面にはそれぞれ硼珪酸ガラスで作られた第一、第
二の板体4,5がガラスどうしの直接接合で結合されて
いる。
(Embodiment 2) The second embodiment is shown in FIG.
It is explained together with. In FIG. 3, reference numeral 1 denotes a frame made of, for example, borosilicate glass. A SAW filter chip (a SAW oscillator chip or the like) 12 is housed in the opening 2 of the frame 1 as an example of an element. Frame 1
First and second plates 4 and 5 made of borosilicate glass are connected to the upper and lower surfaces by direct bonding between the glasses.

【0022】また、第一の板体4には素子側の面より外
側の面の方が開孔部の直径が大となる複数個の貫通孔6
が形成され、この貫通孔6の内面及び第一の板体4の外
側の面の貫通孔6の外周部分に金属膜7を形成し、この
金属膜7上に封孔体の一例として半田8が設けられ、こ
の半田8は開孔部2内においてそれぞれのSAWフィル
タチップ12の入出力用の電極13に接続され、第一の
板体4の外側の面においては貫通孔6の外周部に設けた
金属膜7上の少なくとも貫通孔6の外周を覆うように
し、半田8は第一の板体4の外側の面において外部電極
10に接続されている。すなわち枠体1、板体4,5に
よりケースが構成され、そのケース内にSAWフィルタ
チップ12が収納されている。
The first plate 4 has a plurality of through-holes 6 whose outer surface has a larger diameter on the outer surface than the surface on the element side.
A metal film 7 is formed on an inner surface of the through hole 6 and an outer peripheral portion of the through hole 6 on an outer surface of the first plate body 4, and a solder 8 is formed on the metal film 7 as an example of a sealing body. The solder 8 is connected to the input / output electrodes 13 of the respective SAW filter chips 12 in the opening 2, and on the outer surface of the first plate 4, The solder 8 is connected to the external electrode 10 on the outer surface of the first plate 4 so as to cover at least the outer periphery of the through hole 6 on the provided metal film 7. That is, a case is constituted by the frame 1, the plates 4 and 5, and the SAW filter chip 12 is housed in the case.

【0023】図4は図2の第二の実施の形態の断面図で
ある。枠体1の板厚は400μmで、第一の板体4の板
厚は200μm、第二の板体5の板厚は200μmで、
さらにSAWフィルタチップ12の板厚は340μmと
なっている。つまりSAWフィルタチップ12は枠体1
よりも板厚が薄いので、上下の板体4,5のいずれかあ
るいは両方の内壁面との間には必ず空間11が形成され
る。ここで図2のようにSAWフィルタチップ12と第
一の板体4の内壁面とが接触してしまうとSAWフィル
タチップ12の振動が阻害されるため、SAWフィルタ
チップ12の配線パターンの表面と第一の板体4の内壁
面との間には振動に必要な空間14が必要となる。
FIG. 4 is a sectional view of the second embodiment of FIG. The thickness of the frame 1 is 400 μm, the thickness of the first plate 4 is 200 μm, the thickness of the second plate 5 is 200 μm,
Further, the plate thickness of the SAW filter chip 12 is 340 μm. That is, the SAW filter chip 12 is
Since the plate thickness is smaller than that, a space 11 is always formed between one or both of the upper and lower plate members 4 and 5 or both inner wall surfaces. Here, if the SAW filter chip 12 comes into contact with the inner wall surface of the first plate member 4 as shown in FIG. 2, the vibration of the SAW filter chip 12 is hindered. A space 14 required for vibration is required between the first plate 4 and the inner wall surface.

【0024】この場合には、半田8が貫通孔6内に注入
されるときに開孔部2内においてそれぞれSAWフィル
タチップ12の入出力用の電極13に接続されると同時
に、半田8の押圧力でSAWフィルタチップ12を第二
の板体5方向に押圧し振動に必要な空間14を形成して
いる。このとき、貫通孔6は外側からケース内側の面に
向かって径が小さくなるように形成しているので、半田
8の注入が容易な上半田8の押圧力が得やすい構造とな
っている。
In this case, when the solder 8 is injected into the through hole 6, the solder 8 is connected to the input / output electrodes 13 of the SAW filter chip 12 in the opening 2, and simultaneously, the solder 8 is pressed. The pressure presses the SAW filter chip 12 in the direction of the second plate 5 to form a space 14 necessary for vibration. At this time, since the through hole 6 is formed so as to decrease in diameter from the outside toward the inner surface of the case, the through-hole 6 has a structure in which the solder 8 can be easily injected and the pressing force of the upper solder 8 can be easily obtained.

【0025】つまりSAWフィルタチップ12の入出力
電極13はこの数ヵ所の半田8によって第二の板体5方
向に押圧されながら合金接続され、その接続強度はSA
Wフィルタチップ12を固定するのに十分な強度を有し
ているため、ケース内において前後左右方向への位置ず
れを生じることはない。
That is, the input / output electrodes 13 of the SAW filter chip 12 are alloy-connected while being pressed in the direction of the second plate 5 by the solders 8 at these several places, and the connection strength is SA.
Since it has sufficient strength to fix the W filter chip 12, there is no occurrence of displacement in the front, rear, left and right directions in the case.

【0026】さらに、半田8のケース内部分(貫通孔6
からSAWフィルタチップ12の入出力電極13まで延
長された部分)の直径が貫通孔6のケース内側の開孔部
の直径よりも若干大きく形成することにより、接続強度
をより向上させることができ、SAWフィルタチップ1
2が脱落することはない。また、半田8が第一の板体4
の外側の面において貫通孔6の外周部に設けた金属膜7
上の少なくとも貫通孔6の外周を覆うことにより、ケー
ス内の気密性は極めて高く保たれるようになる。
Further, the inside of the case of the solder 8 (through hole 6)
Of the SAW filter chip 12 extending to the input / output electrode 13) is slightly larger than the diameter of the opening inside the case of the through-hole 6, so that the connection strength can be further improved. SAW filter chip 1
2 never falls off. Also, the solder 8 is used as the first plate 4
Metal film 7 provided on the outer surface of through hole 6 on the outer surface of
By covering at least the outer periphery of the through hole 6 above, the airtightness in the case is kept extremely high.

【0027】(実施の形態3)第三の実施の形態を図5
と共に説明する。図5は図3において第二の板体5に第
二の貫通孔15を設けたものである。このような構造に
すると貫通孔6に半田8を形成するときケース内の空気
が第二の貫通孔15から抜け出て半田8の注入が非常に
容易になるのである。このとき、貫通孔6は外側から素
子側の面に向かって径が小さくなるように形成している
ので、半田8の注入が容易な構造となっている。
(Embodiment 3) The third embodiment is shown in FIG.
It is explained together with. FIG. 5 shows a second plate 5 in which a second through hole 15 is provided in FIG. With this structure, when the solder 8 is formed in the through-hole 6, the air in the case escapes from the second through-hole 15 and the injection of the solder 8 becomes very easy. At this time, since the through-hole 6 is formed such that the diameter decreases from the outside toward the element-side surface, the structure is such that the solder 8 can be easily injected.

【0028】また、SAWフィルタチップ12と第一の
板体4の内壁面の間に、SAWフィルタチップ12の振
動を阻害しないための空間14の確保も同時に容易に行
うことができる。半田8を形成した後、ケースを気密封
止するために第二の貫通孔15を例えば低融点ガラスの
ような材料で気密封止する必要がある。
In addition, it is possible to easily secure a space 14 between the SAW filter chip 12 and the inner wall surface of the first plate 4 so as not to hinder the vibration of the SAW filter chip 12. After the solder 8 is formed, it is necessary to hermetically seal the second through hole 15 with a material such as low-melting glass in order to hermetically seal the case.

【0029】しかし、ケース内部の素子がSAWフィル
タチップ12のようにあまり耐熱性の良くない場合には
低融点ガラスを用いることはできず、さらに融点の低い
例えば半田材料を用いるのが適当である。そこで、本発
明の第三の実施の形態では、貫通孔6に半田8を設けた
封止構造体と同様のものを第二の貫通孔15にも適用す
るため、第二の貫通孔15の内面及び第二の板体5の外
側の面の貫通孔の外周部分に第二の金属膜16を形成
し、この第二の金属膜16上に半田8を設け、第二の板
体5の外側の面において第二の貫通孔15の外周部に設
けた第二の金属膜16上の少なくとも第二の貫通孔15
の外周を覆うようにしたものである。このような構造に
することにより、ケース内の気密性は極めて高く保たれ
るようになる。
However, when the element inside the case is not so heat-resistant as the SAW filter chip 12, a low melting point glass cannot be used, and it is appropriate to use a soldering material having a lower melting point, for example. . Therefore, in the third embodiment of the present invention, the same thing as the sealing structure in which the solder 8 is provided in the through hole 6 is applied to the second through hole 15. A second metal film 16 is formed on the inner surface and the outer peripheral portion of the through hole on the outer surface of the second plate member 5, and the solder 8 is provided on the second metal film 16 to form the second plate member 5. At least the second through-hole 15 on the second metal film 16 provided on the outer surface at the outer peripheral portion of the second through-hole 15
Is covered. With such a structure, the airtightness in the case is kept extremely high.

【0030】(実施の形態4)第四の実施の形態を図6
と共に説明する。図6は第四の実施の形態の断面図であ
る。枠体1の板厚は400μmで、第一の板体4の板厚
は200μm、第二の板体5の板厚は200μmで、さ
らにSAWフィルタチップ12の板厚は340μmとな
っている。つまりSAWフィルタチップ12は枠体1よ
りも板厚が薄いので、上下の板体4,5のいずれかある
いは両方の内壁面との間には必ず空間11が形成され
る。
(Embodiment 4) A fourth embodiment is shown in FIG.
It is explained together with. FIG. 6 is a sectional view of the fourth embodiment. The thickness of the frame 1 is 400 μm, the thickness of the first plate 4 is 200 μm, the thickness of the second plate 5 is 200 μm, and the thickness of the SAW filter chip 12 is 340 μm. That is, since the SAW filter chip 12 has a smaller thickness than the frame 1, a space 11 is always formed between one or both of the upper and lower plates 4, 5 or both inner wall surfaces.

【0031】ここで、図2のようにSAWフィルタチッ
プ12と第一の板体4の内壁面とが接触してしまうとS
AWフィルタチップ12の振動が阻害されるため、SA
Wフィルタチップ12の配線パターンの表面と第一の板
体4の内壁面との間に振動に必要な空間14が必要とな
る。
Here, when the SAW filter chip 12 comes into contact with the inner wall surface of the first plate 4 as shown in FIG.
Since the vibration of the AW filter chip 12 is hindered, the SA
A space 14 necessary for vibration is required between the surface of the wiring pattern of the W filter chip 12 and the inner wall surface of the first plate 4.

【0032】そこで、SAWフィルタチップ12上にあ
らかじめ入出力電極13とは異なる位置で、かつSAW
フィルタチップ12の振動を阻害しないような部分に、
例えばAuのように容易に変形できる無機材料を用いた
スペーサ17をワイヤーボンディング時に形成されるボ
ール部分のみをボンディングする工法(あるいはワイヤ
ーバンプとも呼ばれる)等を用いて形成することによ
り、半田8を設ける前にSAWフィルタチップ12と第
一の板体4の内壁面との間の振動に必要な空間14を確
保し、SAWフィルタチップ12の振動を阻害しないよ
うにし、半田8を貫通孔6内に注入して開孔部2内にお
いてそれぞれSAWフィルタチップ12の入出力用の電
極13に接続する。
Therefore, the SAW filter chip 12 is located at a position different from the input / output
In a part that does not hinder the vibration of the filter chip 12,
For example, the solder 8 is provided by forming a spacer 17 using an inorganic material that can be easily deformed such as Au using a method of bonding only a ball portion formed at the time of wire bonding (or also called a wire bump). A space 14 necessary for vibration between the SAW filter chip 12 and the inner wall surface of the first plate 4 is secured beforehand so that the vibration of the SAW filter chip 12 is not hindered. It is injected and connected to the input / output electrodes 13 of the SAW filter chip 12 in the opening 2 respectively.

【0033】このとき、貫通孔6は外側から素子側の面
に向かって径が小さくなるように形成しているので、半
田8の注入が容易な構造となっている。つまりSAWフ
ィルタチップ12はスペーサ17によって振動を阻害し
ないための空間14を確保し、その入出力電極13はこ
の数ヵ所の半田8によって合金接続され、その接続強度
はSAWフィルタチップ12を固定するのに十分な強度
を有しているため、ケース内において前後左右方向への
位置ずれを生じることはない。また、半田8が第一の板
体4の外側の面において貫通孔6の外周部に設けた金属
膜7上の少なくとも貫通孔6の外周を覆うことにより、
ケース内の気密性は極めて高く保たれるようになる。
At this time, since the diameter of the through-hole 6 decreases from the outside toward the element-side surface, the structure is such that the solder 8 can be easily injected. That is, the SAW filter chip 12 secures a space 14 so as not to hinder the vibration by the spacer 17, and its input / output electrodes 13 are alloy-connected by these several solders 8, and the connection strength of the SAW filter chip 12 is fixed. Therefore, there is no displacement in the front, rear, left and right directions in the case. Further, the solder 8 covers at least the outer periphery of the through hole 6 on the metal film 7 provided on the outer peripheral portion of the through hole 6 on the outer surface of the first plate body 4,
The airtightness in the case is kept extremely high.

【0034】(実施の形態5)第五の実施の形態を図7
と共に説明する。図7は第五の実施の形態の断面図であ
る。枠体1の板厚は400μmで、第一の板体4の板厚
は200μm、第二の板体5の板厚は200μmで、さ
らにSAWフィルタチップ12の板厚は340μmとな
っている。つまりSAWフィルタチップ12は枠体1よ
りも板厚が薄いので、上下の板体4,5のいずれかある
いは両方の内壁面との間には必ず空間11が形成され
る。
(Embodiment 5) The fifth embodiment is shown in FIG.
It is explained together with. FIG. 7 is a sectional view of the fifth embodiment. The thickness of the frame 1 is 400 μm, the thickness of the first plate 4 is 200 μm, the thickness of the second plate 5 is 200 μm, and the thickness of the SAW filter chip 12 is 340 μm. That is, since the SAW filter chip 12 has a smaller thickness than the frame 1, a space 11 is always formed between one or both of the upper and lower plates 4, 5 or both inner wall surfaces.

【0035】ここで、図2のようにSAWフィルタチッ
プ12と第一の板体4の内壁面とが接触してしまうとS
AWフィルタチップ12の振動が阻害されるため、SA
Wフィルタチップ12の配線パターンの表面と第一の板
体4の内壁面との間に振動に必要な空間14が必要とな
る。
Here, when the SAW filter chip 12 comes into contact with the inner wall surface of the first plate 4 as shown in FIG.
Since the vibration of the AW filter chip 12 is hindered, the SA
A space 14 necessary for vibration is required between the surface of the wiring pattern of the W filter chip 12 and the inner wall surface of the first plate 4.

【0036】そこで、SAWフィルタチップ12上の入
出力電極13の周辺部でSAWフィルタチップ12の振
動を阻害しないような部分に、例えばポリイミドのテー
プのような薄板状の材料をドーナツ状に加工して堤防体
18を形成することにより、半田8を設ける前にSAW
フィルタチップ12と第一の板体4の内壁面との間の空
間11を確保してSAWフィルタチップ12の振動を阻
害しないようにし、かつ半田8が貫通孔6内に注入され
るとき、半田8がSAWフィルタチップ12上の入出力
電極13からはみ出し、他の電極とショートするのを防
止し、開孔部2内においてそれぞれSAWフィルタチッ
プ12の入出力用の電極13に接続する。
Therefore, a thin plate-like material such as a polyimide tape is processed into a donut shape in a portion of the SAW filter chip 12 around the input / output electrodes 13 where the vibration of the SAW filter chip 12 is not hindered. Forming the embankment body 18 by using the SAW before the solder 8 is provided.
The space 11 between the filter chip 12 and the inner wall surface of the first plate body 4 is secured so as not to hinder the vibration of the SAW filter chip 12, and when the solder 8 is injected into the through hole 6, 8 is prevented from protruding from the input / output electrodes 13 on the SAW filter chip 12 and short-circuiting with other electrodes, and is connected to the input / output electrodes 13 of the SAW filter chip 12 in the opening 2 respectively.

【0037】このとき、貫通孔6は外側から素子側の面
に向かって径が小さくなるように形成しているので、半
田8の注入が容易な構造となっている。つまりSAWフ
ィルタチップ12は堤防体18によって振動を阻害しな
いための空間14を確保し、かつ半田8がSAWフィル
タチップ12上の入出力電極13からはみ出し他の電極
とショートするのを防止し、入出力電極13はこの数ヵ
所の半田8によって合金接続され、その接続強度はSA
Wフィルタチップ12を固定するのに十分な強度を有し
ているため、ケース内において前後左右方向への位置ず
れを生じることはない。また、半田8が第一の板体4の
外側の面において貫通孔6の外周部に設けた金属膜7上
の少なくとも貫通孔6の外周を覆うことにより、ケース
内の気密性は極めて高く保たれるようになる。
At this time, since the through hole 6 is formed so that the diameter decreases from the outside toward the element side surface, the structure is such that the solder 8 can be easily injected. In other words, the SAW filter chip 12 secures a space 14 for preventing the vibration from being hindered by the embankment body 18, prevents the solder 8 from protruding from the input / output electrode 13 on the SAW filter chip 12, and short-circuits with other electrodes. The output electrode 13 is alloy-connected by these several solders 8 and its connection strength is SA.
Since it has sufficient strength to fix the W filter chip 12, there is no occurrence of displacement in the front, rear, left and right directions in the case. Further, since the solder 8 covers at least the outer periphery of the through-hole 6 on the metal film 7 provided on the outer periphery of the through-hole 6 on the outer surface of the first plate body 4, the airtightness in the case is extremely high. You will be drooped.

【0038】なお、第一から第五の実施の形態におい
て、枠体1の両側には第一、第二の板体4,5がガラス
どうしで直接接合されることとなる。もちろんこれらの
接合をさせるためには、枠体1と第一、第二の板体4,
5との接合面はガラスの鏡面が保持された状態でなけれ
ばならない。また、これら三者の直接接合をより確実な
ものにするためには、これら三者を加圧しながら加熱し
たりすることが好ましい。つまり、このような加圧をす
れば接合面にわずかなホコリ等が存在したとしても、そ
のホコリの外周面を強く圧接するので、直接接合が行え
ることとなるのである。
In the first to fifth embodiments, the first and second plate members 4 and 5 are directly joined to each other on both sides of the frame 1 by means of glass. Of course, in order to join these, the frame 1 and the first and second plates 4,
The joint surface with 5 must be in a state where the mirror surface of the glass is held. Further, in order to further secure the direct joining of these three members, it is preferable to heat these three members while applying pressure. In other words, if such pressure is applied, even if a small amount of dust or the like is present on the bonding surface, the outer peripheral surface of the dust is strongly pressed, so that direct bonding can be performed.

【0039】[0039]

【発明の効果】以上のように本発明は、素子のケース外
への電気的な引き出しは、貫通孔内の封孔体を介して行
うことができ、貫通孔の径をケース内部分よりケース外
部分の方が大なるようにすることにより、溶融状態の封
孔体の注入が容易となり、またこの封孔体は貫通孔内に
おいては金属膜に固着し、ケース内部においてはその径
が貫通孔のケース内部分の径よりも大なるように形成さ
れるので、強度が強く脱落は起こさず、さらにケース外
においては金属膜の貫通孔の外周部をこの封孔体によっ
て覆っているので気密性は極めて高くなり、この結果と
して素子の特性劣化は起きなくなるのである。
As described above, according to the present invention, the element can be electrically pulled out of the case through the sealing member in the through hole, and the diameter of the through hole can be made larger than that of the case inside portion. By making the outer part larger, it becomes easier to inject the sealing body in the molten state, and this sealing body adheres to the metal film in the through hole, and the diameter of the sealing body penetrates inside the case. The hole is formed to be larger than the diameter of the inner part of the case, so the strength is strong and it does not fall off.In addition, since the outer peripheral part of the through hole of the metal film is covered with this sealing body outside the case, it is airtight. The performance is extremely high, and as a result, the characteristics of the element do not deteriorate.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の電子部品の第一の実施の形態を示す分
解斜視図
FIG. 1 is an exploded perspective view showing a first embodiment of an electronic component of the present invention.

【図2】同断面図FIG. 2 is a sectional view of the same.

【図3】本発明の第二の実施の形態の分解斜視図FIG. 3 is an exploded perspective view of a second embodiment of the present invention.

【図4】同断面図FIG. 4 is a sectional view of the same.

【図5】本発明の第三の実施の形態の分解斜視図FIG. 5 is an exploded perspective view of a third embodiment of the present invention.

【図6】本発明の第四の実施の形態の断面図FIG. 6 is a sectional view of a fourth embodiment of the present invention.

【図7】本発明の第五の実施の形態の断面図FIG. 7 is a sectional view of a fifth embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 枠体 2 開孔部 3 半導体ICチップ 4 第一の板体 5 第二の板体 6 貫通孔 7 金属膜 8 半田 9 半導体ICチップの電極 10 外部電極 11 ケース内に生じる空間 12 SAWフィルタチップ 13 SAWフィルタチップの電極 14 振動に必要な空間 15 第二の貫通孔 16 第二の金属膜 17 スペーサ 18 堤防体 REFERENCE SIGNS LIST 1 frame 2 opening 3 semiconductor IC chip 4 first plate 5 second plate 6 through hole 7 metal film 8 solder 9 electrode of semiconductor IC chip 10 external electrode 11 space generated in case 12 SAW filter chip 13 SAW filter tip electrode 14 Space required for vibration 15 Second through hole 16 Second metal film 17 Spacer 18 Embankment

───────────────────────────────────────────────────── フロントページの続き (72)発明者 梅田 眞司 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 湯澤 哲夫 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 ──────────────────────────────────────────────────の Continuing on the front page (72) Inventor Shinji Umeda 1006 Kadoma Kadoma, Osaka Prefecture Inside Matsushita Electric Industrial Co., Ltd.

Claims (10)

【特許請求の範囲】[Claims] 【請求項1】 絶縁性でかつ少なくとも表面が非ろう付
け性であるケースと、このケース内に設けられた片面に
電極を具備する素子と、前記素子の電極に対応するケー
ス部分に形成したケース内部分よりケース外部分の方が
開孔部の直径が大きくなる少なくとも1個以上の貫通孔
と、この貫通孔の内面及びケース外の貫通孔の外周部分
に設けた金属膜と、前記金属膜上に設けられ前記貫通孔
を封止するろう材よりなる封孔体を備え、この封孔体は
前記ケース内部分において前記素子の電極に接続される
ように延長されておりケース外部分において前記金属膜
の少なくとも貫通孔の外周部分を覆うように構成した電
子部品。
1. A case that is insulative and has at least a non-brazing surface, an element provided in the case and having an electrode on one surface, and a case formed on a case portion corresponding to the electrode of the element. At least one or more through-holes in which the diameter of the opening portion is larger on the outside of the case than on the inner portion; a metal film provided on the inner surface of the through-hole and on the outer periphery of the through-hole outside the case; A sealing member made of a brazing material for sealing the through-hole provided on the upper portion, the sealing member being extended so as to be connected to the electrode of the element in the inner part of the case, and being formed in the outer part of the case. An electronic component configured to cover at least the outer peripheral portion of the through hole of the metal film.
【請求項2】 素子は表面弾性波デバイスよりなり、そ
の入出力電極に封孔体を接続し、この封孔体により素子
がケース内部の少なくとも貫通孔側の内壁面から若干離
れている請求項1に記載の電子部品。
2. An element comprising a surface acoustic wave device, wherein a sealing member is connected to an input / output electrode of the device, and the sealing member slightly separates the element from an inner wall surface of the case at least on a through hole side. 2. The electronic component according to 1.
【請求項3】 絶縁性でかつ少なくとも表面が非ろう付
け性であるケースと、このケース内に設けられた片面に
電極を具備する素子と、前記素子の電極に対応するケー
ス部分に形成した少なくとも1個以上の第一の貫通孔
と、この第一の貫通孔の内面及びケース外の第一の貫通
孔の外周部分に設けた金属膜と、前記金属膜上に設けら
れ前記第一の貫通孔を封止するろう材よりなる第一の封
孔体を備え、この第一の封孔体は前記ケース内部分にお
いて素子がケース内部の少なくとも第一の貫通孔側の内
壁面から若干離れるように延長され、前記第一の封孔体
のケース内部分の直径は第一の貫通孔のケース内部分の
開孔部の直径よりも若干大きくなるよう形成し、前記第
一の封孔体は前記素子の電極と接続され、ケース外部分
において前記金属膜の少なくとも第一の貫通孔の外周部
分を覆うように構成され、前記ケースの第一の貫通孔を
設けた面と対向する面に少なくとも1個以上の第二の貫
通孔を設け、この第二の貫通孔を封止する無機材料より
なる第二の封孔体を備えた電子部品。
3. A case that is insulative and has at least a non-brazing surface, an element provided with an electrode on one side provided in the case, and at least a case formed on a case portion corresponding to the electrode of the element. One or more first through holes, a metal film provided on an inner surface of the first through hole and an outer peripheral portion of the first through hole outside the case, and the first through hole provided on the metal film; A first sealing member made of a brazing material for sealing the hole, the first sealing member being such that the element in the case inner portion is slightly separated from an inner wall surface of at least the first through hole side inside the case. The diameter of the case inner portion of the first sealing body is formed to be slightly larger than the diameter of the opening of the case inner portion of the first through hole, and the first sealing body is Connected to the electrode of the element, and the metal film At least one or more second through-holes are provided on a surface of the case, which is configured to cover at least an outer peripheral portion of the first through-hole, and a surface of the case opposite to the surface where the first through-hole is provided. An electronic component comprising a second sealing body made of an inorganic material for sealing a through hole.
【請求項4】 第二の貫通孔の内面及びケース外の第二
の貫通孔の外周部分に第一の貫通孔と同様の金属膜と、
前記金属膜上に設けられ前記第二の貫通孔を封止する第
一の封孔体と同様の材料を用いた第二の封孔体を備え、
この第二の封孔体はケース外部分において前記金属膜の
少なくとも第二の貫通孔の外周部分を覆うように構成さ
れた請求項3記載の電子部品。
4. A metal film similar to the first through-hole on an inner surface of the second through-hole and on an outer peripheral portion of the second through-hole outside the case.
A second sealing body using the same material as the first sealing body that is provided on the metal film and seals the second through hole,
4. The electronic component according to claim 3, wherein the second sealing member is configured to cover at least an outer peripheral portion of the second through hole of the metal film in an outer portion of the case.
【請求項5】 封孔体のケース内部分の直径は、貫通孔
のケース内部分に開孔部の直径よりも若干大きくなるよ
う形成した請求項3または4に記載の電子部品。
5. The electronic component according to claim 3, wherein the diameter of the inside of the case of the sealing body is formed to be slightly larger than the diameter of the opening in the inside of the case of the through hole.
【請求項6】 ガラス材料で形成されたケースと、この
ケース内に設けられた表面弾性波デバイスよりなる素子
と、前記素子の電極に対応するケース部分に形成したケ
ース内部分よりケース外部分の方が開孔部の直径が大き
くなる少なくとも1個以上の貫通孔と、この貫通孔の内
面及びケース外の貫通孔の外周部分に設けた少なくとも
表面を金または錫とした金属膜と、前記金属膜上に設け
られ前記貫通孔を封止する半田材料よりなる封孔体を備
え、この封孔体は前記ケース内部分において素子がケー
ス内部の少なくとも貫通孔側の内壁面から若干離れるよ
うに延長され前記封孔体のケース内部分の直径は貫通孔
のケース内部分の開孔部の直径よりも若干大きくなるよ
う形成し、前記封孔体は前記素子の電極と接続されケー
ス外部分において前記金属膜の少なくとも貫通孔の外周
部分を覆うように構成した電子部品。
6. A case formed of a glass material, an element formed of a surface acoustic wave device provided in the case, and a case outer part formed by a case inner part formed in a case part corresponding to an electrode of the element. At least one through-hole having a larger diameter of the opening, a metal film provided on the inner surface of the through-hole and the outer peripheral portion of the through-hole outside the case, and at least a surface of which is made of gold or tin; A sealing member provided on the membrane and made of a solder material for sealing the through hole, wherein the sealing member extends in the inner portion of the case so that the element is slightly away from at least the inner wall surface on the through hole side inside the case; The diameter of the inner part of the case of the sealing body is formed so as to be slightly larger than the diameter of the opening of the inner part of the case of the through hole, and the sealing body is connected to the electrode of the element and is formed at the outer part of the case. An electronic component configured to cover at least an outer peripheral portion of the through hole of the metal film.
【請求項7】 ガラス材料で形成されたケースと、この
ケース内に設けられた表面弾性波デバイスよりなる素子
と、前記素子の電極に対応するケース部分に形成したケ
ース内部分よりケース外部分の方が開孔部の直径が大き
くなる少なくとも1個以上の第一の貫通孔と、この第一
の貫通孔の内面及びケース外の第一の貫通孔の外周部分
に設けた少なくとも表面を金または錫とした金属膜と、
前記金属膜上に設けられ前記第一の貫通孔を封止する半
田材料よりなる第一の封孔体を備え、この第一の封孔体
は前記ケース内部分において素子がケース内部の少なく
とも第一の貫通孔側の内壁面から若干離れるように延長
され、前記第一の封孔体のケース内部分の直径は第一の
貫通孔のケース内部分の開孔部の直径よりも若干大きく
なるよう形成し、前記第一の封孔体は前記素子の電極と
接続され、ケース外部分において前記金属膜の少なくと
も第一の貫通孔の外周部分を覆うように構成され、前記
ケースの第一の貫通孔を設けた面と対向する面に少なく
とも1個以上の第二の貫通孔を設け、この第二の貫通孔
の内面及びケース外の第二の貫通孔の外周部分に第一の
貫通孔と同様の金属膜と、前記金属膜上に設けられ前記
第二の貫通孔を封止する第一の封孔体と同様の材料を用
いた第二の封孔体を備え、この第二の封孔体はケース外
部分において前記金属膜の少なくとも第二の貫通孔の外
周部分を覆うように構成された電子部品。
7. A case formed of a glass material, an element formed of a surface acoustic wave device provided in the case, and a case outer part formed by a case inner part formed in a case part corresponding to an electrode of the element. At least one or more first through holes in which the diameter of the opening is larger, and at least the surface provided on the inner surface of the first through hole and the outer peripheral portion of the first through hole outside the case is made of gold or gold. A metal film made of tin,
A first sealing body made of a solder material provided on the metal film and sealing the first through-hole is provided, and the first sealing body has at least a first element inside the case inside the case. It is extended slightly away from the inner wall surface on the side of one through hole, and the diameter of the inner portion of the case of the first sealing body is slightly larger than the diameter of the opening of the inner portion of the case of the first through hole. Formed, the first sealing body is connected to the electrode of the element, and is configured to cover at least an outer peripheral portion of the first through hole of the metal film in an outer portion of the case, and a first portion of the case is formed. At least one or more second through holes are provided on a surface facing the surface on which the through holes are provided, and a first through hole is provided on an inner surface of the second through hole and an outer peripheral portion of the second through hole outside the case. A metal film similar to that described above, and the second through hole provided on the metal film is sealed. A second sealing member made of the same material as the first sealing member, and the second sealing member covers at least an outer peripheral portion of the second through hole of the metal film in an outer portion of the case. Electronic components configured as follows.
【請求項8】 素子とケース内部の貫通孔側の内壁面の
間にスペーサを設けた請求項7に記載の電子部品。
8. The electronic component according to claim 7, wherein a spacer is provided between the element and the inner wall surface on the through hole side inside the case.
【請求項9】 スペーサは、無機材料よりなり、表面弾
性波デバイスよりなる素子のくし形電極と入出力電極以
外の部分に形成された請求項8記載の電子部品。
9. The electronic component according to claim 8, wherein the spacer is made of an inorganic material and formed on a portion other than the comb-shaped electrode and the input / output electrode of the element made of the surface acoustic wave device.
【請求項10】 素子とケース内部の貫通孔側の内壁面
の間で、かつ貫通孔のケース内部分の開孔部の周囲に堤
防体を設けた請求項9に記載の電子部品。
10. The electronic component according to claim 9, wherein a dike is provided between the element and the inner wall surface on the side of the through hole inside the case and around the opening of the through hole inside the case.
JP15513996A 1996-06-17 1996-06-17 Electronic component Pending JPH104152A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15513996A JPH104152A (en) 1996-06-17 1996-06-17 Electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15513996A JPH104152A (en) 1996-06-17 1996-06-17 Electronic component

Publications (1)

Publication Number Publication Date
JPH104152A true JPH104152A (en) 1998-01-06

Family

ID=15599409

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15513996A Pending JPH104152A (en) 1996-06-17 1996-06-17 Electronic component

Country Status (1)

Country Link
JP (1) JPH104152A (en)

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Publication number Priority date Publication date Assignee Title
JP2001244785A (en) * 2000-02-29 2001-09-07 Kyocera Corp Surface acoustic wave device
US6960870B2 (en) 1997-07-29 2005-11-01 Seiko Epson Corporation Piezo-electric resonator and manufacturing method thereof
US6976295B2 (en) 1997-07-29 2005-12-20 Seiko Epson Corporation Method of manufacturing a piezoelectric device
JP2006080672A (en) * 2004-09-07 2006-03-23 Seiko Epson Corp Piezoelectric oscillator, electronic apparatus, and frequency adjustment method of piezoelectric oscillator
WO2010098250A1 (en) * 2009-02-25 2010-09-02 セイコーインスツル株式会社 Package manufacturing method, piezoelectric vibrator manufacturing method, oscillator, electronic device and radio-controlled clock
JP2011249424A (en) * 2010-05-24 2011-12-08 Daishinku Corp Sealing member of electronic component package, electronic component package, and method of manufacturing sealing member of electronic component package

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6960870B2 (en) 1997-07-29 2005-11-01 Seiko Epson Corporation Piezo-electric resonator and manufacturing method thereof
US6976295B2 (en) 1997-07-29 2005-12-20 Seiko Epson Corporation Method of manufacturing a piezoelectric device
JP2001244785A (en) * 2000-02-29 2001-09-07 Kyocera Corp Surface acoustic wave device
JP4510982B2 (en) * 2000-02-29 2010-07-28 京セラ株式会社 Surface acoustic wave device
JP2006080672A (en) * 2004-09-07 2006-03-23 Seiko Epson Corp Piezoelectric oscillator, electronic apparatus, and frequency adjustment method of piezoelectric oscillator
JP4692715B2 (en) * 2004-09-07 2011-06-01 セイコーエプソン株式会社 Piezoelectric oscillator, electronic device, and method for manufacturing piezoelectric oscillator
WO2010098250A1 (en) * 2009-02-25 2010-09-02 セイコーインスツル株式会社 Package manufacturing method, piezoelectric vibrator manufacturing method, oscillator, electronic device and radio-controlled clock
JPWO2010098250A1 (en) * 2009-02-25 2012-08-30 セイコーインスツル株式会社 Package manufacturing method, piezoelectric vibrator manufacturing method, oscillator, electronic device, and radio timepiece
JP2011249424A (en) * 2010-05-24 2011-12-08 Daishinku Corp Sealing member of electronic component package, electronic component package, and method of manufacturing sealing member of electronic component package

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