JPH0749417Y2 - Electric resistance flaw detection probe - Google Patents

Electric resistance flaw detection probe

Info

Publication number
JPH0749417Y2
JPH0749417Y2 JP10175090U JP10175090U JPH0749417Y2 JP H0749417 Y2 JPH0749417 Y2 JP H0749417Y2 JP 10175090 U JP10175090 U JP 10175090U JP 10175090 U JP10175090 U JP 10175090U JP H0749417 Y2 JPH0749417 Y2 JP H0749417Y2
Authority
JP
Japan
Prior art keywords
contact
holes
support
needles
flaw detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP10175090U
Other languages
Japanese (ja)
Other versions
JPH0459464U (en
Inventor
広次 重松
季雄 東
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP10175090U priority Critical patent/JPH0749417Y2/en
Publication of JPH0459464U publication Critical patent/JPH0459464U/ja
Application granted granted Critical
Publication of JPH0749417Y2 publication Critical patent/JPH0749417Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Description

【考案の詳細な説明】 〔産業上の利用分野〕 本考案は、金属部材表面の亀裂深さの測定に好適な電気
抵抗探傷用探触子に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to an electric resistance flaw detection probe suitable for measuring the crack depth on the surface of a metal member.

〔従来の技術〕[Conventional technology]

従来、金属部材表面の亀裂深さを非破壊的に測定する装
置の一つとして電気抵抗探傷用探触子があり、これは、
例えば第3図斜視図に示すように、基板31にねじ付けさ
れた箱状ケーシング32の等間隔配列の4個の貫通孔33
に、先端部34aが円錐状に形成された4本の接触針34が
貫設され、各接触針34には先端向きに付勢するコイルば
ね35が巻装されるとともに、後端にリード線36が接続さ
れている。
Conventionally, there is an electric resistance flaw detection probe as one of the devices for nondestructively measuring the crack depth on the surface of a metal member.
For example, as shown in the perspective view of FIG. 3, four through-holes 33 in a box-shaped casing 32 screwed onto a substrate 31 are arranged at equal intervals.
, Four contact needles 34 each having a conical tip portion 34a are provided therethrough, and each contact needle 34 is wound with a coil spring 35 for biasing the tip end direction, and a lead wire at the rear end. 36 are connected.

しかして、この探触子で金属部材表面の亀裂深さを測定
するにあたっては、第4図(A)に示すように、金属部
材37の亀裂深さdの亀裂38を4本の接触針34の中央に挾
み、両端の針34に直流電源39を接続して一定の直流電流
40を流し、内側の2本の針34に接続した電圧計41で電圧
を測定する。
Then, in measuring the crack depth on the surface of the metal member with this probe, as shown in FIG. 4 (A), the crack 38 having the crack depth d of the metal member 37 is broken into four contact needles 34. Insert the DC power supply 39 to the needles 34 at both ends and hold a constant DC current.
Flow 40 and measure the voltage with a voltmeter 41 connected to the two inner needles 34.

この電圧測定値から亀裂深さdを求めるには、亀裂がな
いときの電圧値をVo,亀裂38を挾んだときの電圧値をV
とすると、V/Voと、針34の間隔aと亀裂深さdの比d/a
とは、同図(B)のように一定の関係があることを利用
し、V/Voを測定することにより亀裂深さdを求めること
ができる。
To determine the crack depth d from this voltage measurement value, the voltage value when there is no crack is Vo, and the voltage value when the crack 38 is sandwiched is V
Then, V / Vo and the ratio d / a of the distance a between the needles 34 and the crack depth d
By utilizing the fact that there is a certain relationship as shown in FIG. 7B, the crack depth d can be obtained by measuring V / Vo.

なおこの測定対象の金属部材37の表面は平坦ばかりでは
なく凹凸部がある場合が多いが、そのような場合にも、
それぞれの接触針34がコイルばね35の付勢力により自由
に動くとともにその先端部34aが金属部材37の凹凸表面
に押付けられ、複雑な曲面に対しても常に適確な測定が
なされている。
Incidentally, the surface of the metal member 37 to be measured is often not only flat but also has irregularities, but in such a case as well,
Each contact needle 34 freely moves by the urging force of the coil spring 35 and its tip 34a is pressed against the uneven surface of the metal member 37, so that accurate measurement is always performed even on a complicated curved surface.

しかしながら、このような探触子には次の欠点がある。However, such a probe has the following drawbacks.

すなわち、亀裂38の深さが浅い場合又は亀裂38の間隔が
狭い場合は、接触針34の間隔aも小さくする必要がある
が、接触針34の周りに付勢用コイルばね35が巻装されて
いるため、各接触針34の間隔aを小さくすることは限度
がある。またコイルばね35の劣化などで押付力が不足
し、接触針34の先端部34aと測定対象の金属部材37表面
との接触不良を生じ、測定不可能となるおそれがある。
That is, when the depth of the cracks 38 is shallow or the distance between the cracks 38 is narrow, it is necessary to reduce the distance a between the contact needles 34, but the biasing coil spring 35 is wound around the contact needles 34. Therefore, there is a limit to reducing the distance a between the contact needles 34. In addition, the pressing force may be insufficient due to deterioration of the coil spring 35, which may result in poor contact between the tip end portion 34a of the contact needle 34 and the surface of the metal member 37 to be measured, making measurement impossible.

〔考案が解決しようとする課題〕[Problems to be solved by the device]

本考案は、このような事情に鑑みて提案されたもので、
接触針押付力付勢用のコイルばねが不要となり接触針周
りの機構が簡単となって接触針間隔を小さくすることが
できるとともに、接触針押付力付勢用部材の劣化による
付勢力の低下がなくなり、更に接触針先端部と金属部材
表面との距離に応じ押付力が変化する電気抵抗探傷探触
子を提供することを目的とする。
The present invention has been proposed in view of such circumstances,
Since the coil spring for urging the contact needle pressing force is not required, the mechanism around the contact needle can be simplified and the contact needle interval can be reduced, and the urging force is reduced due to deterioration of the contact needle pressing force urging member. Another object of the present invention is to provide an electric resistance flaw detection probe in which the pressing force changes according to the distance between the tip of the contact needle and the surface of the metal member.

〔課題を解決するための手段〕[Means for Solving the Problems]

そのために本考案は、等間隔に複数の貫通孔を設けた強
磁性材の支持体と、上記貫通孔を前方への抜落ち抑止的
に通る非磁性材支持杆を設け先端中央部を尖らせた複数
の強磁性材の接触針と、上記支持体の前方に取付けられ
上記接触針を等間隔にかつ軸方向摺動自在に保持する複
数の貫通孔を設けた箱状の保持体とを具え、上記支持体
と接触針とを逆向き極性に磁化したことを特徴とする。
To this end, the present invention provides a ferromagnetic material support body having a plurality of through holes at equal intervals, and a non-magnetic material support rod that passes through the through holes to prevent forward pull-out, so that the central portion of the tip is sharpened. A plurality of ferromagnetic material contact needles and a box-shaped holder provided in front of the support body and provided with a plurality of through holes for holding the contact needles at equal intervals and slidably in the axial direction. The support and the contact needle are magnetized in opposite polarities.

〔作用〕[Action]

本考案電気抵抗探傷用探触子においては、支持体と接触
針の対向する同極性の磁極間に反撥力が作用するので、
接触針はこの反撥力によって常に金属部材の表面に押付
けられ、また対向2磁極間に働く力は両磁極の強さの積
に比例し、間隔の2乗に反比例するので、探触子を押付
けるにしたがい、接触針先端部と金属部材表面との押付
力が増加する。
In the electric resistance flaw detection probe of the present invention, the repulsive force acts between the opposing magnetic poles of the support and the contact needle, which have the same polarity.
The contact needle is constantly pressed against the surface of the metal member by this repulsive force, and the force acting between the two opposing magnetic poles is proportional to the product of the strengths of both magnetic poles and inversely proportional to the square of the interval. As it is attached, the pressing force between the tip of the contact needle and the surface of the metal member increases.

〔実施例〕〔Example〕

本考案電気抵抗探傷用探触子の一実施例を図面について
説明すると、第1図はその部分截断の斜視図、第2図は
同上の作動要領の説明図である。
An embodiment of a probe for electric resistance flaw detection of the present invention will be described with reference to the drawings. FIG. 1 is a perspective view of a partial cut thereof, and FIG. 2 is an explanatory view of an operating procedure of the same.

第1図において、強磁性材で作られた角柱状の支持体1
には、側面の中心線上に長手方向に沿い等間隔に4個の
貫通孔2が穿設されている。この4個の貫通孔2に対向
する4本の接触針3は、強磁性材で作られており、その
先端部3aが円錐状に形成されるとともに、基部に貫通孔
2を挿入される非磁性材製支持杆4が取付けられ、更に
この支持杆4の後端には抜落ち抑止用のストッパー5が
付設されている。なお支持杆4の後端にはリード線6が
接続されている。
In FIG. 1, a prismatic support 1 made of a ferromagnetic material
Has four through holes 2 at equal intervals along the longitudinal direction on the center line of the side surface. The four contact needles 3 facing the four through-holes 2 are made of a ferromagnetic material, and the tips 3a thereof are formed in a conical shape, and the non-insertion holes 2 are inserted into the base. A support rod 4 made of a magnetic material is attached, and a stopper 5 for preventing falling is attached to the rear end of the support rod 4. A lead wire 6 is connected to the rear end of the support rod 4.

また上記支持体1の前部には、接触針3を等間隔にかつ
軸方向摺動自在に保持する4個の貫通孔8が穿設された
箱状の保持体7が、ねじ9により固着されている。
A box-shaped holder 7 having four through holes 8 for holding the contact needles 3 at equal intervals and slidably in the axial direction is fixed to the front portion of the support 1 with screws 9. Has been done.

このような装置において、強磁性材の支持体1と強磁性
材の接触針3とを、図示のように対向端部がS極同士と
なるよう逆向き極性に磁化し、第2図に示すように、測
定対象の金属部材10の表面に、その亀裂11を中央に挾ん
で4本の接触針3の先端部3aを当接し、両端の2本の接
触針3の先端部3aを当接し、両端の2本の接触針3に直
流電流を流し、内側の2本の接触針3で電圧を測定す
る。
In such an apparatus, the support 1 made of a ferromagnetic material and the contact needle 3 made of a ferromagnetic material are magnetized in opposite polarities so that the opposite ends are S poles as shown in FIG. As described above, the tip 11a of the four contact needles 3 are brought into contact with the surface of the metal member 10 to be measured with the crack 11 in the center, and the tip 3a of the two contact needles 3 at both ends are brought into contact. A direct current is passed through the two contact needles 3 at both ends, and the voltage is measured by the inner two contact needles 3.

このとき、支持体1と接触針3の対向するS極間に反撥
力が作用するので、接触針3はこの反撥力によって常に
金属部材10の凹凸表面に押付けられ、また対向2磁極間
に働く力は両磁極の強さの積に比例し、間隔の2乗に反
比例するので、探触子を押付けるにしたがい接触針3の
先端部3aと金属部材10の表面との押付力が増加し、4本
の接触針3の先端部3aはいかなる凹凸表面に対しても当
接し、接触不良を生ずることはない。
At this time, since a repulsive force acts between the S poles of the support 1 and the contact needle 3 which face each other, the contact needle 3 is always pressed against the uneven surface of the metal member 10 by this repulsive force, and also acts between the two opposing magnetic poles. Since the force is proportional to the product of the strengths of both magnetic poles and inversely proportional to the square of the distance, the pressing force between the tip 3a of the contact needle 3 and the surface of the metal member 10 increases as the probe is pressed. The tips 3a of the four contact needles 3 come into contact with any uneven surface, and no contact failure occurs.

また接触針3の支持杆4の後端にはストッパー5は付設
されているので、接触針3が反撥力により抜落ちること
はなく、なお測定のために通電する電流は直流電流であ
るので、磁化による影響を受けることなく測定可能であ
る。
Further, since the stopper 5 is attached to the rear end of the support rod 4 of the contact needle 3, the contact needle 3 does not drop out due to the repulsive force, and the current supplied for the measurement is a direct current. It can be measured without being affected by magnetization.

かくして、この装置によれば、次の効果が奏せられる。Thus, this device has the following advantages.

(1)従来のコイルばねの代わりに磁力を利用すること
により、コイルばねのように劣化などによる接触針3押
付力の低下がない。
(1) By using a magnetic force instead of the conventional coil spring, the pressing force of the contact needle 3 does not decrease due to deterioration unlike the coil spring.

(2)コイルばねが不要となる。(2) The coil spring is unnecessary.

(3)接触針3周りの機構が簡単になるため、各接触針
3の間隔を小さくすることができる。
(3) Since the mechanism around the contact needles 3 is simplified, the distance between the contact needles 3 can be reduced.

(4)コイルばねは付勢力が一定であるのに対し、磁力
による場合は探触子を押付けるにしたがい反撥力が強く
なるため、接触針3の先端部と金属部材10の表面との押
付力が増加する。
(4) The biasing force of the coil spring is constant, but when the magnetic force is applied, the repulsive force becomes stronger as the probe is pressed. Therefore, the tip of the contact needle 3 and the surface of the metal member 10 are pressed. Power increases.

〔考案の効果〕[Effect of device]

要するに本考案によれば、等間隔に複数の貫通孔を設け
た強磁性材の支持体と、上記貫通孔を前方への抜落ち抑
止的に通る非磁性材支持杆を設け先端中央部を尖らせた
複数の強磁性材の接触針と、上記支持体の前方に取付け
られ上記接触針を等間隔にかつ軸方向摺動自在に保持す
る複数の貫通孔を設けた箱状の保持体とを具え、上記支
持体と接触針とを逆向き極性に磁化したことにより、接
触針押付力付勢用のコイルばねが不要となり接触針周り
の機構が簡単となって接触針間隔を小さくすることがで
きるとともに、接触針押付力付勢用部材の劣化による付
勢力の低下がなくなり、更に接触針先端部と金属部材表
面との距離に応じ押付力が変化する電気抵抗探傷用探触
子を得るから、本考案は産業上極めて有益なものであ
る。
In short, according to the present invention, a ferromagnetic material support body having a plurality of through holes at equal intervals and a non-magnetic material supporting rod that passes through the through holes to prevent forward pull-out are provided, and the tip central portion is sharpened. A plurality of ferromagnetic material contact needles, and a box-shaped holder provided in front of the support body and having a plurality of through holes for holding the contact needles at equal intervals and slidably in the axial direction. Since the support and the contact needle are magnetized in opposite polarities, the coil spring for urging the contact needle pressing force is not required, and the mechanism around the contact needle is simplified and the contact needle interval can be reduced. In addition, it is possible to obtain a probe for electric resistance flaw detection in which the urging force does not decrease due to deterioration of the contact needle pressing force urging member, and the pressing force changes according to the distance between the contact needle tip and the metal member surface The present invention is extremely useful in industry.

【図面の簡単な説明】[Brief description of drawings]

第1図は本考案電気抵抗探傷用探触子の一実施例を示す
部分截断の斜視図、第2図は同上の作動要領の説明図で
ある。 第3図は従来探触子の部分截断の斜視図、第4図は亀裂
深さ測定要領の説明図である。 1…支持体、2…貫通孔、3…接触針、3a…先端部、4
…支持杆、5…ストッパー、6…リード線、7…保持
体、8…貫通孔、9…ねじ、10…金属部材、11…亀裂。
FIG. 1 is a perspective view of a partially cutaway showing an embodiment of the electric resistance flaw detection probe of the present invention, and FIG. 2 is an explanatory view of the operating procedure of the same. FIG. 3 is a perspective view of partial cutting of a conventional probe, and FIG. 4 is an explanatory view of a crack depth measuring procedure. 1 ... Support, 2 ... Through hole, 3 ... Contact needle, 3a ... Tip part, 4
... Support rod, 5 ... Stopper, 6 ... Lead wire, 7 ... Holding body, 8 ... Through hole, 9 ... Screw, 10 ... Metal member, 11 ... Crack.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】等間隔に複数の貫通孔を設けた強磁性材の
支持体と、上記貫通孔を前方への抜落ち抑止的に通る非
磁性材支持杆を設け先端中央部を尖らせた複数の強磁性
材の接触針と、上記支持体の前方に取付けられ上記接触
針を等間隔にかつ軸方向摺動自在に保持する複数の貫通
孔を設けた箱状の保持体とを具え、上記支持体と接触針
とを逆向き極性に磁化したことを特徴とする電気抵抗探
傷用探触子。
1. A support member made of a ferromagnetic material having a plurality of through holes at equal intervals, and a non-magnetic material support rod passing through the through holes so as to prevent the through hole from being pulled forward. A plurality of ferromagnetic material contact needles, and a box-shaped holder provided in front of the support and having a plurality of through holes for holding the contact needles at equal intervals and slidably in the axial direction, A probe for electrical resistance flaw detection, wherein the support and the contact needle are magnetized in opposite polarities.
JP10175090U 1990-09-28 1990-09-28 Electric resistance flaw detection probe Expired - Lifetime JPH0749417Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10175090U JPH0749417Y2 (en) 1990-09-28 1990-09-28 Electric resistance flaw detection probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10175090U JPH0749417Y2 (en) 1990-09-28 1990-09-28 Electric resistance flaw detection probe

Publications (2)

Publication Number Publication Date
JPH0459464U JPH0459464U (en) 1992-05-21
JPH0749417Y2 true JPH0749417Y2 (en) 1995-11-13

Family

ID=31845459

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10175090U Expired - Lifetime JPH0749417Y2 (en) 1990-09-28 1990-09-28 Electric resistance flaw detection probe

Country Status (1)

Country Link
JP (1) JPH0749417Y2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9291645B2 (en) 2011-10-07 2016-03-22 Nhk Spring Co., Ltd. Probe unit
US10732032B2 (en) 2018-08-09 2020-08-04 Ouster, Inc. Scanning sensor array with overlapping pass bands
US10739189B2 (en) 2018-08-09 2020-08-11 Ouster, Inc. Multispectral ranging/imaging sensor arrays and systems
US11086013B2 (en) 2017-05-15 2021-08-10 Ouster, Inc. Micro-optics for imaging module with multiple converging lenses per channel
US11287515B2 (en) 2017-12-07 2022-03-29 Ouster, Inc. Rotating compact light ranging system comprising a stator driver circuit imparting an electromagnetic force on a rotor assembly

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9291645B2 (en) 2011-10-07 2016-03-22 Nhk Spring Co., Ltd. Probe unit
US11086013B2 (en) 2017-05-15 2021-08-10 Ouster, Inc. Micro-optics for imaging module with multiple converging lenses per channel
US11131773B2 (en) 2017-05-15 2021-09-28 Ouster, Inc. Lidar unit with an optical link between controller and photosensor layer
US11287515B2 (en) 2017-12-07 2022-03-29 Ouster, Inc. Rotating compact light ranging system comprising a stator driver circuit imparting an electromagnetic force on a rotor assembly
US11300665B2 (en) 2017-12-07 2022-04-12 Ouster, Inc. Rotating compact light ranging system
US10732032B2 (en) 2018-08-09 2020-08-04 Ouster, Inc. Scanning sensor array with overlapping pass bands
US10739189B2 (en) 2018-08-09 2020-08-11 Ouster, Inc. Multispectral ranging/imaging sensor arrays and systems
US10760957B2 (en) 2018-08-09 2020-09-01 Ouster, Inc. Bulk optics for a scanning array
US11473970B2 (en) 2018-08-09 2022-10-18 Ouster, Inc. Subpixel apertures for channels in a scanning sensor array
US11473969B2 (en) 2018-08-09 2022-10-18 Ouster, Inc. Channel-specific micro-optics for optical arrays

Also Published As

Publication number Publication date
JPH0459464U (en) 1992-05-21

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