JPH074769B2 - Polishing cloth - Google Patents

Polishing cloth

Info

Publication number
JPH074769B2
JPH074769B2 JP3263631A JP26363191A JPH074769B2 JP H074769 B2 JPH074769 B2 JP H074769B2 JP 3263631 A JP3263631 A JP 3263631A JP 26363191 A JP26363191 A JP 26363191A JP H074769 B2 JPH074769 B2 JP H074769B2
Authority
JP
Japan
Prior art keywords
polyurethane
resin
polishing
polishing cloth
composite substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP3263631A
Other languages
Japanese (ja)
Other versions
JPH058178A (en
Inventor
久保  直人
Original Assignee
ロデール・ニッタ株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ロデール・ニッタ株式会社 filed Critical ロデール・ニッタ株式会社
Priority to JP3263631A priority Critical patent/JPH074769B2/en
Publication of JPH058178A publication Critical patent/JPH058178A/en
Publication of JPH074769B2 publication Critical patent/JPH074769B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Treatments For Attaching Organic Compounds To Fibrous Goods (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Polishing Bodies And Polishing Tools (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体ウェハー、メモ
リーディスク、光学部品レンズ等を研磨する際に用いら
れる研磨用クロスに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing cloth used for polishing semiconductor wafers, memory disks, lenses for optical components and the like.

【0002】[0002]

【従来の技術】従来、集積回路を形成するための基材と
して用いられる半導体ウェハーの鏡面研磨に用いる研磨
用クロスとしては、人工皮革として一般に良く知られて
いるベロア調及びスウェード調の繊維・樹脂複合材料、
及びポリウレタン樹脂含浸湿式凝固処理フェルト状繊維
質シートが広く用いられてきた。しかるに近年特にDR
AM(Dynamic Random Access
Memory)として用いられる回路については、その
集積度を高くする努力が鋭意なされ、それに伴って回路
形成を行う基板となる半導体用ウェハーについても回路
間の線幅を縮める目的から平坦性の要求が増々厳しくな
っている状況にある。
Conventionally, polishing using the mirror-polishing of the semiconductor wafer used as a substrate for forming an integrated circuit
As a cloth for use, a velor-like and suede-like fiber / resin composite material that is generally well known as artificial leather,
And, a polyurethane resin-impregnated wet coagulation-treated felt-like fibrous sheet has been widely used. However, especially in recent years
AM (Dynamic Random Access)
With respect to the circuit used as a memory, efforts are being made to increase the degree of integration, and accordingly, the flatness of the semiconductor wafer, which will be the substrate on which the circuit is formed, is increasing in order to reduce the line width between the circuits. The situation is getting tougher.

【0003】このような要求に対して、従来からの半導
体ウェハーの鏡面加工工程においては、ウェハーの平坦
性の大部分を決定する一次研磨工程(ストック・リムー
バル・プロセス) で使用される研磨クロスの物性によっ
て仕上がりウェハーの平坦性が大きく左右されることが
明らかになってきた。すなわち、比較的柔軟な研磨クロ
スを用いた場合には、ウェハー表面の粗度は小さく、傷
(スクラッチ)の数は少ないけれども、一般に面ダレ及
びフチダレという呼称で表現されるような平坦性に対す
る悪影響が生じ易く、それに対して剛い研磨クロスを用
いた場合には、比較的良好な平坦性が得られる。
In response to such a demand, in the conventional mirror surface processing step of a semiconductor wafer, a polishing cloth used in a primary polishing step (stock removal process) that determines most of the flatness of the wafer is used. It has become clear that the flatness of the finished wafer is greatly influenced by the physical properties. That is, when a relatively soft polishing cloth is used, the roughness of the wafer surface is small and the number of scratches (scratches) is small, but the adverse effect on the flatness generally expressed by the term surface sag and edge sagging. Is likely to occur, and when a rigid polishing cloth is used, relatively good flatness can be obtained.

【0004】[0004]

【発明が解決しようとする課題】現在最も一般的に用い
られている半導体ウェハ−の研磨加工方法、すなわち
磨用クロスを貼付けた回転研磨機定盤に対向して、被加
工物を圧接させ、主としてSiO2 微粒子を遊離砥粒と
して含有する研磨液を供給しながら被加工物面を研磨加
工する方法において、加工圧力は被加工物に垂直等分布
荷重として与えられている。このような被加工物と対向
する研磨クロスは、研磨液を充分に保持するという作用
を要求され、人工皮革様の多孔質繊維樹脂複合材料が用
いられているわけであるが、加工圧力として被加工物及
び研磨液膜を介して研磨クロスに伝わる垂直等分布荷重
に対する研磨クロス内部からの反力を圧接面内において
均一にすることと、前述した伝播してくる垂直等分布荷
重により、研磨クロス自体ができるだけ小さく均一な変
形しか起こさないことが、ウェハ−の面ダレ及びフチダ
レを防止し、研磨加工後のウェハ−平坦性を向上させる
重要な要素となっているのである。
SUMMARY OF THE INVENTION The most commonly used method for polishing semiconductor wafers at the present time, that is, polishing.
A method of polishing a surface of a workpiece by pressing a workpiece against a rotary polishing machine having a polishing cloth attached thereto and pressing the workpiece and supplying a polishing liquid containing mainly SiO 2 fine particles as free abrasive grains. The processing pressure is applied to the work as a vertically evenly distributed load. Such a polishing cloth facing the work piece is required to have a function of sufficiently holding the polishing liquid, and the artificial leather-like porous fiber resin composite material is used. The uniform reaction force from the inside of the polishing cloth against the vertical evenly distributed load transmitted to the polishing cloth through the work piece and the polishing liquid film, and the above-mentioned propagating vertical evenly distributed load make the polishing cloth It is an important factor to prevent the surface sagging and the edge sagging of the wafer, and to improve the flatness of the wafer after polishing, that the wafer itself causes only small and uniform deformation.

【0005】従って、従来経験的に判断されていた研磨
用クロスの柔軟さ、あるいは剛さというものは、圧縮荷
重に対する応力の大・小、及び変形の大・小で判断され
るべきものである。このような要素を充足する材料とし
ては、まず第一に材料の均一性という点から、ゴム、プ
ラスチックの単体シートが考えられるが、研磨液により
加工を行う遊離砥粒研磨に用いる研磨クロスとしては研
磨液の保持力がほとんどないという欠点があり、実際に
は使用できない。次に、各種プラスチックの発泡体が考
えられるが、いずれも柔らかすぎたり、硬すぎたり、あ
るいは独立気泡性が高かったりするため、一部の用途で
ポリウレタンの硬質発泡体が使われているにすぎない。
一方、従来からこのような遊離砥粒方式の研磨に用いら
れている人工皮革様の研磨クロスは、研磨液の保持力、
及び圧縮荷重に対する応力、変形の点からも好適の材料
として64K、あるいは256KDRAM用の半導体ウ
ェハ−研磨に広く用いられてきたが、近年の1MDRA
M、あるいは将来の4MDRAM用ウェハ−の研磨に関
しては、圧縮荷重に対する変形量が大きいために、加工
圧力を下げて長時間の研磨を行わなければならないと
か、研磨クロス自体の厚さを薄くして相対変形量を下げ
た結果、研磨クロス寿命が短く、短時間の使用で研磨ク
ロスを貼替えなければならない等の欠点があった。
Therefore, the polishing which was conventionally judged empirically
The softness or rigidity of the cloth for use should be judged by the magnitude of the stress against the compressive load and the magnitude of the deformation. As a material satisfying such an element, first, a single sheet of rubber or plastic is considered from the viewpoint of uniformity of material, but as a polishing cloth used for free abrasive grain polishing which is processed by a polishing liquid, It has a drawback that it has almost no holding power for the polishing liquid and cannot be used in practice. Next, various plastic foams are conceivable. However, all of them are too soft, too hard, or have high closed cell properties, so hard polyurethane foams are only used in some applications. Absent.
On the other hand, the artificial leather-like polishing cloth that has been conventionally used for polishing with such loose abrasive grains has a holding power for the polishing liquid,
In addition, it has been widely used for polishing semiconductor wafers for 64K or 256K DRAM as a suitable material from the viewpoint of stress and deformation with respect to compressive load.
When polishing M or a wafer for 4MDRAM in the future, the amount of deformation with respect to a compressive load is large, so that the processing pressure must be reduced to perform polishing for a long time, or the thickness of the polishing cloth itself must be reduced. As a result of reducing the amount of relative deformation, there are drawbacks such as a short life of the polishing cloth and the need to replace the polishing cloth after a short period of use.

【0006】このような欠点を解消するために、種々の
試みがなされた。たとえば、一般に湿式凝固法という名
称で知られている熱可塑性ポリウレタンのジメチルホル
ムアミド(以下DMFと記す。)溶液をシ−ト状繊維基
材に含浸付与し、ひきつづき水浴中で水とDMFの置換
と同時に、ポリウレタン多孔体を繊維基材中に形成させ
る従来公知の方法において、含浸付与する熱可塑性ポリ
ウレタン/DMF溶液中のポリウレタン固型物質を高く
した場合、湿式凝固、洗浄、及び乾燥の各工程を経て、
最終的にバフ加工により表面スキン層を除去して仕上げ
られた研磨クロスは、非常に均一で緻密な構造を持ち、
圧縮荷重に対する変形量も小さくなるが、実際にこのよ
うな研磨クロスを用いてSiウェハ−の研磨を行った場
合、ごく短時間で研磨屑が研磨クロスに目詰まりし、そ
れ以上の研磨ができなくなる。また、前述した湿式凝固
に用いる熱可塑性ポリウレタンとして、さらに硬度の高
いものを用いた場合には凝固特性が不均一になり、一枚
の研磨クロス内における圧縮変形量に大きなバラツキが
出るようになる。さらにまた、均一で圧縮変形量の小さ
い研磨クロスを作成する目的で、熱硬化性ウレタンブレ
ポリマ−、及び硬化剤の有機溶剤溶液を直接シ−ト状繊
維基材に含浸付与し、乾燥炉内において溶剤乾燥とウレ
タンの硬化を同時に行わせる場合、乾燥硬化までの時間
に繊維基材中で厚さ方向で樹脂移行が起こり、研磨クロ
スの厚み方向で樹脂量が不均一となるという欠点を持っ
ている。
Various attempts have been made to solve these drawbacks. For example, a sheet-like fiber base material is impregnated with a dimethylformamide (hereinafter referred to as DMF) solution of thermoplastic polyurethane, which is generally known as a wet coagulation method, and then water and DMF are replaced in a water bath. At the same time, in the conventionally known method of forming a polyurethane porous body in a fiber substrate, when the polyurethane solid substance in the thermoplastic polyurethane / DMF solution to be impregnated is increased, wet coagulation, washing, and drying steps are performed. Through,
The polishing cloth finally finished by removing the surface skin layer by buffing has a very uniform and dense structure,
Although the amount of deformation with respect to the compressive load is also small, when actually polishing a Si wafer using such a polishing cloth, polishing debris is clogged in the polishing cloth in a very short time, and further polishing can be performed. Disappear. Further, when a thermoplastic polyurethane having a higher hardness is used as the above-mentioned wet coagulation, the coagulation characteristics become non-uniform, and a large amount of variation in compression deformation occurs in one polishing cloth. . Furthermore, for the purpose of producing a uniform polishing cloth having a small amount of compressive deformation, a thermosetting urethane blepolymer and an organic solvent solution of a curing agent are directly impregnated into the sheet-shaped fiber base material and then dried in a drying oven. When solvent drying and urethane curing are performed at the same time, there is a drawback that resin migration occurs in the thickness direction of the fiber substrate in the time until drying and curing, and the amount of resin becomes uneven in the thickness direction of the polishing cloth. ing.

【0007】[0007]

【課題を解決するための手段】本発明は上述したような
欠点を解消し、1MDRAMおよび将来の4MDRAM
用半導体ウェハ−を主とした高平坦性ウェハ−などの研
磨加工用クロスを提示するものである。
The present invention solves the above-mentioned drawbacks and solves the problems of 1MDRAM and future 4MDRAM.
The present invention presents a polishing cloth such as a highly flat wafer mainly for semiconductor wafers.

【0008】本発明の研磨用クロスは、フェルト状繊維
質シート中の構成繊維が、線状の熱可塑性ポリウレタン
樹脂を主体とする重合体により、埋設的に囲繞されて複
合基材が形成されるとともに、前記複合基材の多孔質相
に存在するセルの壁が、熱可塑性ポリウレタン樹脂より
硬質の樹脂の薄膜により被覆・補強されていることを特
徴とする
The polishing cloth of the present invention is a felt-like fiber.
Constituent fibers in the quality sheet are linear thermoplastic polyurethane
The polymer mainly composed of resin is embedded in the
The composite base material is formed and the porous phase of the composite base material is formed.
The cell walls present in the
It is characterized by being covered and reinforced by a thin film of hard resin.
To collect .

【0009】本発明で使用されるフェルト状繊維質シ−
トは、ナイロン、ポリエステル、アラミド繊維等のDM
F、メチル・エチルケトン(以下MEKと記す。)、テ
トラヒドロフラン等ポリウレタン可溶性の溶剤に対して
耐性があり、かつ研磨時に使用されるpH10〜11程
度の研磨液に対する耐アルカリ性をもつ繊維からなる不
織布、好ましくはバインダ−を含まないニ−ドルパンチ
不織布で、その嵩密度が0.10g/cm3 〜0.20g
/cm3 の範囲にあるものが好適である。本発明の研磨用
クロスを製造するための方法は、このようなシ−ト状繊
維基材に、ポリエステル系、あるいはポリエ−テル系の
熱可塑性ポリウレタンのDMF溶液を含浸させ、湿式凝
固させて、一旦中間的な複合基材を作成する一次処理工
程と、さらにその複合基材を熱硬化性ポリウレタン等で
処理する二次処理工程とからなる。以下にそれらを順を
追って説明する。
The felt-like fibrous sheet used in the present invention
DM is nylon, polyester, aramid fiber, etc.
A nonwoven fabric made of fibers having resistance to polyurethane-soluble solvents such as F, methyl ethyl ketone (hereinafter referred to as MEK), and tetrahydrofuran, and having alkali resistance to a polishing liquid having a pH of about 10 to 11 used at the time of polishing, preferably Is a needle-punched non-woven fabric containing no binder and has a bulk density of 0.10 g / cm 3 to 0.20 g.
Those in the range of / cm 3 are preferable. For polishing of the present invention
The cloth is manufactured by impregnating such a sheet-like fiber base material with a DMF solution of a polyester-based or polyether-based thermoplastic polyurethane, followed by wet coagulation to obtain an intermediate composite material. It comprises a primary treatment step of preparing a substrate and a secondary treatment step of treating the composite substrate with a thermosetting polyurethane or the like. These will be described below step by step.

【0010】一次処理に用いられる熱可塑性ポリウレタ
ンは、一般に人工皮革用として市販されているものがい
ずれも使用できるが、本用途として好ましくは、100
%伸び時のモジュラスが100kg/cm2 以上のものが
好ましい。この工程において、より重要なことは、湿式
凝固、洗浄、乾燥という工程を経て形成された複合基材
において、樹脂相と繊維相の重量比率がどの程度である
かということである。たとえば、その比率(樹脂相対繊
維相)が1対1を超えるような場合には、複合基材の樹
脂相に存在する湿式凝固による多孔質構造が緻密にな
り、ひきつづき行われる二次処理の熱硬化性ポリウレタ
ンによるかなりの空孔が充填されてしまうため、研磨に
使用した場合には研磨液、及び研磨屑の流通が阻害さ
れ、目詰まりが短期に起こってしまう。逆に、樹脂相対
繊維相の比率が1対5を下回る状態では、樹脂相は繊維
の交絡点、及び外周部をとり囲むだけになり、次の二次
処理で用いる熱硬化性ポリウレタンの溶剤溶液はその乾
燥硬化過程で移行し、乾燥時に下側となっていた側に局
在化してしまう。従って、この一次処理工程では、使用
するシート状繊維基材の嵩密度により含浸させる熱可塑
性ポリウレタンのDMF溶液中の固型分量を調節し、出
来上がる中間的な複合基材中における樹脂相対繊維相の
比率を1対1〜1対5にすることが好ましい。このよう
な湿式凝固、洗浄、乾燥を経て作成された中間基材は、
表面近傍にスキン層と呼ばれる緻密な発泡層を持つた
め、これを表面、裏面とも除去し、ひきつづき行われる
二次処理の含浸液を均一、かつ短時間に浸透させるよう
にする。
As the thermoplastic polyurethane used for the primary treatment, any of those generally commercially available for artificial leather can be used, but for this purpose, preferably 100
It is preferable that the modulus at% elongation is 100 kg / cm 2 or more. What is more important in this step is what is the weight ratio of the resin phase to the fiber phase in the composite substrate formed through the steps of wet coagulation, washing and drying. For example, when the ratio (resin relative fiber phase) exceeds 1: 1 the porous structure due to wet coagulation existing in the resin phase of the composite base material becomes dense, and the heat of the secondary treatment continuously performed. Since a considerable amount of pores are filled with the curable polyurethane, when used for polishing, the flow of the polishing liquid and polishing debris is obstructed, and clogging occurs in a short time. On the contrary, when the ratio of the resin relative fiber phase is less than 1: 5, the resin phase only surrounds the entanglement points of the fibers and the outer peripheral portion, and the solvent solution of the thermosetting polyurethane used in the next secondary treatment. Migrates in the process of drying and curing, and is localized on the side that was the lower side during drying. Therefore, in this primary treatment step, the solid content of the thermoplastic polyurethane to be impregnated in the DMF solution is adjusted according to the bulk density of the sheet-shaped fiber base material to be used, and the resin relative fiber phase in the intermediate composite base material to be completed is adjusted. It is preferable that the ratio is 1: 1 to 1: 5. The intermediate base material created through such wet coagulation, washing, and drying is
Since there is a dense foam layer called a skin layer near the surface, both the front surface and the back surface are removed so that the impregnating liquid for the secondary treatment that is continuously carried out can be uniformly and quickly penetrated.

【0011】こうして調製された中間基材は、ひきつづ
き二次処理にかけられる。この工程で用いられる含浸液
は、ポリエステル、あるいはポリエーテル系のMDI
(メチレンジイソシアネート)、あるいはTDI(トリ
レンジイソシアネート)末端を持つウレタンプレポリマ
ー単体、あるいは研磨クロスの硬度や圧縮率を調製する
ためにメラミン樹脂、ポリカーボネート樹脂、等をブレ
ンドしたものと、3、3’ジクロロー4、4’ジアミノ
フェニルメタン等の2官能性有機アミン硬化剤、さらに
必要であれば、アジピン酸等のジカルボン酸を主とした
促進剤、とを有機溶剤溶液としたもので、乾燥の熱効率
を考慮する場合にはMEK等の比較的低沸点の溶剤を用
いる事が望ましい。
The intermediate substrate thus prepared is subsequently subjected to a secondary treatment. The impregnating liquid used in this process is polyester or polyether MDI.
(Methylene diisocyanate), a urethane prepolymer having TDI (tolylene diisocyanate) ends, or a blend of melamine resin, polycarbonate resin, etc. for adjusting the hardness and compressibility of the polishing cloth. A bifunctional organic amine curing agent such as dichloro-4,4'diaminophenylmethane, and, if necessary, an accelerator mainly containing a dicarboxylic acid such as adipic acid, in an organic solvent solution, which has a thermal efficiency of drying. When considering, it is desirable to use a solvent having a relatively low boiling point such as MEK.

【0012】この二次処理工程において、熱硬化性ポリ
ウレタン配合液は、中間複合基材中の多孔質相に浸透
し、炉内の乾燥により溶剤成分を失いつつ、粘稠液体と
なり、多孔質相に存在するセルの壁を均一にコートして
ゆく。引き続き加熱することによりウレタンの硬化反応
が起こり、三次元架橋した熱硬化性ポリウレタンの薄膜
が、一次処理により形成されていた熱可塑性ポリウレタ
ンのセル壁を被覆・補強する。
In this secondary treatment step, the thermosetting polyurethane compounding liquid permeates the porous phase in the intermediate composite base material, loses the solvent component by drying in the furnace, and becomes a viscous liquid. The walls of the cells that are present at are evenly coated. Subsequent heating causes the urethane curing reaction, and the three-dimensionally crosslinked thermosetting polyurethane thin film covers and reinforces the cell wall of the thermoplastic polyurethane formed by the primary treatment.

【0013】この工程においても、二次処理として使用
する熱硬化性ポリウレタン配合液の固型分量が重要であ
り、多すぎる場合には、やはり一次処理で形成された空
孔が二次処理液の被膜により閉じられてしまい、低すぎ
る場合には補強効果が低く、中間複合基材の物性と大差
ない状態になってしまう。従ってこの二次処理は、乾燥
・硬化後の熱硬化剤ポリウレタンと、中間複合基材に含
まれていた熱可塑性ポリウレタンの重量比が1対3〜1
対1の範囲にコントロールされることが好ましい
Also in this step, the solid content of the thermosetting polyurethane compounding liquid used as the secondary treatment is important, and when the amount is too large, the pores formed in the primary treatment also become the secondary treatment liquid. If it is too low, the reinforcing effect is low and the physical properties of the intermediate composite base material are not so different. Therefore, in this secondary treatment, the weight ratio of the thermosetting polyurethane after drying / curing to the thermoplastic polyurethane contained in the intermediate composite base material is 1: 3 to 1: 1.
Rukoto is controlled in the range of: 1 is preferred.

【0014】本発明の研磨用クロスによると、フェルト
状繊維質シート中の構成繊維が、線 状の熱可塑性ポリウ
レタン樹脂を主体とする重合体により、埋設的に囲繞さ
れて形成された複合基材の多孔質相に存在するセルの壁
が、熱可塑性ポリウレタン樹脂より硬質の樹脂の薄膜に
より被覆・補強されているので、多孔質セルの空隙を大
幅に低下させることなく研磨用クロスの厚さ方向に於け
る圧縮変形量を小さくすることができる。
According to the polishing cloth of the present invention, the felt
The constituent fibers in the fibrous sheet are linear thermoplastic
The polymer mainly composed of retin resin is embedded in the surrounding area.
Walls present in the porous phase of the composite substrate formed by
However, a thin resin film that is harder than thermoplastic polyurethane resin
Because it is more covered and reinforced, the pores of the porous cell are larger.
In the thickness direction of the polishing cloth without reducing the width
The amount of compressive deformation can be reduced.

【0015】すなわち、研磨用クロスに存在する多孔質
セルの壁が硬質の樹脂薄膜により被覆・補強された構造
を持つため、研磨用クロスの多孔性(密度)を大幅に低
下させることなくその圧縮弾性率を高くすることができ
る。
That is, the porous material present in the polishing cloth
Structure in which the cell wall is covered and reinforced with a hard resin thin film
Has a significantly lower porosity (density) of the polishing cloth.
Its compression modulus can be increased without lowering
It

【0016】この研磨用クロスとその研磨性能につい
て、下記の実施例により、さらに詳細に説明するが、こ
れら実施例は本発明の基本的部分を限定するものではな
い。
The polishing cloth and its polishing performance will be described in more detail with reference to the following examples, but these examples do not limit the basic part of the present invention.

【0017】[0017]

【実施例】【Example】

(実施例1) 3.0デニール、繊維長50mmのポリエステル繊維で構
成される、厚さ2mm、嵩密度0.13g/cm3 、目付重
量260g/m2 のニードルバンチ不織布を基材とし、
分子量200,000、100%モジュラス120kg
/cm2 のポリエステル系ポリウレタン(商品名:クリス
ボン8867)の固型分13%のDMF溶液で、該基材
を十分浸漬含浸した後、DMF対純水の比率が10対9
0で、且つ温度30℃の凝固液に20分間浸漬後、60
分間純水中で水洗いし、ポリウレタン樹脂を湿式凝固さ
せ、ポーラス状にフェルト基材を囲繞した後、DMFを
完全に純水と置換し、更に120℃熱風で乾燥し、厚さ
2mm、嵩密度0.26g/cm3 、目付重量520g/m
2 、ウレタン対繊維の重量比0.9対1の複合基材が得
られた。該基材を60メッシュのバフロールで、表、裏
面を研削し、密度の高いスキン層を除去した。このシー
ト物の硬度はJISAで60度、圧縮率30%であっ
た。該シート物を以下の配合の二次含浸液に浸漬含浸
後、120℃の熱風で20分間乾燥、溶剤を完全に乾燥
除去し、該熱硬化性ポリウレタンを上記複合基材中のポ
リウレタン多孔質相のセル壁を被覆しながら硬化させる
ことにより、高硬度複合基材を得た。
Example 1 A needle bunch nonwoven fabric having a thickness of 2 mm, a bulk density of 0.13 g / cm 3 , and a basis weight of 260 g / m 2 , which is made of polyester fiber having a denier of 3.0 mm and a fiber length of 50 mm, is used as a base material,
Molecular weight 200,000, 100% modulus 120kg
After fully impregnating and impregnating the base material with a DMF solution having a solid content of 13% of polyester-based polyurethane (trade name: Crisbon 8867) of 10 / cm 2 , the ratio of DMF to pure water is 10: 9.
After immersing in a coagulating liquid at 0 and a temperature of 30 ° C. for 20 minutes, 60
After rinsing in pure water for a minute, the polyurethane resin is wet-coagulated and the felt base material is surrounded in a porous form, then DMF is completely replaced with pure water and further dried with hot air at 120 ° C, thickness 2 mm, bulk density 0.26 g / cm 3, a weight per unit area 520 g / m
2. A composite substrate with a urethane to fiber weight ratio of 0.9: 1 was obtained. The front and back surfaces of the base material were ground with a 60 mesh buff roll to remove the skin layer having a high density. The hardness of this sheet was 60 degrees according to JIS A, and the compression rate was 30%. The sheet material was dipped and impregnated in a secondary impregnating solution having the following composition, dried with hot air at 120 ° C. for 20 minutes, and the solvent was completely dried and removed to give the thermosetting polyurethane as a polyurethane porous phase in the composite substrate. A high hardness composite substrate was obtained by curing while covering the cell wall of.

【0018】この複合基材を更に表、裏面バフ処理した
平坦な高硬度複合基材は、厚さ1.27mm、嵩密度0.
36g/cm3 、硬度JISA85度、圧縮率6.0%、
繊維対一次樹脂対二次樹脂の比率が1対0.9対0.9
であった。この高硬度複合基材により研磨されたウェハ
ーの平坦度は良好で、研磨クロスのライフは60時間で
あった。
A flat high hardness composite base material obtained by buffing the front and back surfaces of this composite base material has a thickness of 1.27 mm and a bulk density of 0.
36 g / cm 3 , hardness JISA 85 degrees, compression rate 6.0%,
Fiber to primary resin to secondary resin ratio of 1 to 0.9 to 0.9
Met. The flatness of the wafer polished by this high hardness composite substrate was good, and the life of the polishing cloth was 60 hours.

【0019】 二次含浸液の配合例: ハイブレンL−315(三井東圧化学(株)商品名) 100.0部 イハラキュアミンMT(イハラケミカル(株)商品名) 26.9部 MEK 576.0部 計 702.9部 〔ハイブレンL−315〕 ポリオール成分 :ポリテトラメチレンエーテルグリ
コール イソシアネート成分:2、4−トルエンジイソシアネー
ト 〔イハラキュアミンMT〕 3、3’−ジクロロー4、4’−ジアミノフェニルメタ
ン (実施例2) 3.0デニール繊維長60mmのポリエステル繊維と、
2.5デニール繊維長50mmの熱収縮型ポリエステル繊
維の比率が80対20で構成される厚さ2mm、嵩密度
0.15g/cm3 、目付重量300g/m2 のニードル
パンチ不織布を基材とし、分子量200,000、10
0%モジュラス120kg/cm2 のポリエステル系ポリ
ウレタン樹脂(大日本インキ(株)商品名:クリスボン
8867)の固型分11%のDMF溶液で該基材を十分
浸漬含浸した後、DMF対純水の比率が20対80で、
且つ温度35℃の凝固液に20分間浸漬後、60分間純
水中で水洗いし、ポリウレタン樹脂を湿式凝固させ、ポ
ーラス状にフェルト基材を囲繞した後、DMFを完全に
純水と置換し、更に120℃の熱風で乾燥し、厚さ2m
m、嵩密度0.26g/cm3 、目付重量520g/
2 、ウレタン対繊維の重量比0.6対1の複合基材が
得られた。該基材を80メッシュのバフロールで表、裏
面を研削し、密度の高いスキン層を除去した。このシー
ト物の硬度はJISAで52度、圧縮率33%であっ
た。該シート物を以下の配合の二次含浸液に浸漬含浸
後、120℃の熱風で20分間乾燥、溶剤を完全に乾燥
除去し、該熱硬化性ポリウレタンを上記複合基材中のポ
リウレタン多孔質相のセル壁を被覆しながら硬化させる
ことにより、高硬度複合基材を得た。この複合基材を更
に表、裏面バフ処理した平坦な高硬度複合基材は、厚さ
1.27mm、嵩密度0.34g/cm3 、硬度JISA8
0度、圧縮率6.5%、繊維対一次樹脂対二次樹脂の比
率が1対0.6対0.5であった。この高硬度複合基材
により研磨されたシリコンウェハーの平坦度は良好で、
研磨クロスのライフは100時間であった。二次含浸液
の配合例は実施例1と同様。 (実施例3) 3.0デニール繊維長75mmのポリエステル繊維で構成
される、厚さ2mm、嵩密度0.20g /cm3 、目付重量
400g /m2 のニードルパンチ不織布を基材とし、分
子量200,000、100%モジュラス120kg/cm
2 のポリエステル系ポリウレタン樹脂(大日本インキ
(株)商品名:クリスボン8867)の固型分9%のD
MF溶液で該基材を十分浸漬含浸した後、DMF対純水
の比率が25%対75%で、且つ温度が30℃の凝固液
中に20分間浸漬し、ポリウレタン樹脂をポーラス状に
湿式凝固させた後、60分間純水中で洗浄し、DMFを
純水と完全に置換し、更に120℃の熱風で乾燥し、厚
さ2mm、嵩密度0.30g/cm3 、目付重量600g/
2 、ウレタン対繊維の重量比0.5対1の複合基材が
得られた。該基材を80メッシュのバフロールで表、裏
面を研削し、密度の高いスキン層を除去した。このシー
ト物の硬度はJISAで65度で、圧縮率22%であっ
た。該シ−ト物を以下の配合の二次含浸液に浸漬含浸
後、120℃の熱風で20分間乾燥、溶剤を完全に乾燥
除去し、該熱硬化性ポリウレタンを上記複合基材中のポ
リウレタン多孔質相のセル壁を被覆しながら硬化させる
ことにより、高硬度複合基材を得た。この複合基材を更
に表、裏面バフ処理した平坦な高硬度複合基材は、厚さ
1.27mm、嵩密度0.35g/cm3 、硬度JISA8
2度、圧縮率60%、繊維対一次樹脂対二次樹脂の比率
が1対0.5対0.3であった。この高硬度複合基材に
より研磨させたシリコンウェハーの平坦度は良好で、研
磨クロスのライフは130時間であった。二次含浸液の
配合例は実施例1と同様。 (実施例4) 3.0デニール、繊維長60mmのポリエステル繊維と、
2.5デニール、繊維長50mmの熱収縮型ポリエステル
繊維の比率が80対20で構成される、厚さ2mm、嵩密
度0.15g/cm3 、目付重量300g/m2 のニード
ルパンチ不織布を基材とし、分子量200,000、1
00%モジュラス120g/cm2 のポリエステル系ポリ
ウレタン樹脂の固型分11%のDMF溶液で該基材を十
分浸漬含浸した後、DMF対純水の比率が20対80
で、且つ温度が35℃の凝固液中に20分間浸漬し、ポ
リウレタン樹脂をポーラス状に湿式凝固させた後、60
分間純水中で洗浄し、DMFを純水と完全に置換し、更
に120℃の熱風で乾燥し、厚さ2mm、嵩密度0.26
g/cm2 、目付重量520g/m2 、ウレタン対繊維の
重量比0.6対1の複合基材が得られた。該基材を80
メッシュのバフロールで表、裏面を研削し、密度の高い
スキン層を除去した。このシート物の硬度はJISAで
58度、圧縮率33%であった。該シート物を以下の配
合の二次含浸液に浸漬含浸後、120℃の熱風で20分
間乾燥し、溶剤を完全に乾燥除去し、該熱硬化性ポリウ
レタンを上記複合基材中のポリウレタン多孔質層中のセ
ル壁を被覆しながら硬化させることにより、高硬度複合
基材を得た。この複合基材を更に表、裏面バフ処理した
平坦な高硬度複合基材は、厚さ1.27mm、嵩密度0.
35g/cm3 、硬度JISA85度、圧縮率5.0%、
繊維対一次樹脂対二次樹脂の比率が1対0.6対0.5
であった。この高硬度複合基材により研磨されたシリコ
ンウェハーの平坦度は特に良好で、研磨クロスのライフ
は95時間であった。
Blending Example of Secondary Impregnation Solution: Hibrene L-315 (trade name of Mitsui Toatsu Chemicals, Inc.) 100.0 parts Iharacuamine MT (trade name of Ihara Chemicals Co., Ltd.) 26.9 parts MEK 576. 0 part Total 702.9 parts [Hybrene L-315] Polyol component: Polytetramethylene ether glycol Isocyanate component: 2,4-toluene diisocyanate [Iharacuamine MT] 3,3′-dichloro-4,4′-diaminophenylmethane (Example 2) 3.0 denier fiber length 60 mm polyester fiber,
A needle-punched nonwoven fabric having a thickness of 2 mm, a bulk density of 0.15 g / cm 3 , and a basis weight of 300 g / m 2 , which is composed of 80 to 20 of heat-shrinkable polyester fiber having a denier of 50 mm and a length of 50 mm, is used as a base material. , Molecular weight 200,000, 10
After thoroughly impregnating the base material with a DMF solution having a solid content of 11% of a polyester polyurethane resin having a 0% modulus of 120 kg / cm 2 (trade name: Crisbon 8867, manufactured by Dainippon Ink & Co., Inc.) The ratio is 20:80,
Further, after immersing in a coagulating liquid at a temperature of 35 ° C. for 20 minutes, washing in pure water for 60 minutes to wet-coagulate the polyurethane resin and surrounding the felt base material in a porous form, DMF is completely replaced with pure water. Further dried with hot air at 120 ° C, thickness 2m
m, bulk density 0.26 g / cm 3 , basis weight 520 g /
A composite substrate with m 2 and a urethane to fiber weight ratio of 0.6 to 1 was obtained. The front and back surfaces of the base material were ground with 80 mesh baffle to remove the skin layer having a high density. The hardness of this sheet was 52 degrees according to JIS A, and the compression rate was 33%. The sheet material was dipped and impregnated in a secondary impregnating solution having the following composition, dried with hot air at 120 ° C. for 20 minutes, and the solvent was completely dried and removed to give the thermosetting polyurethane as a polyurethane porous phase in the composite substrate. A high hardness composite substrate was obtained by curing while covering the cell wall of. A flat high-hardness composite substrate obtained by buffing the front and back surfaces of this composite substrate has a thickness of 1.27 mm, a bulk density of 0.34 g / cm 3 , and a hardness of JIS A8
The compression ratio was 0 degree, the compression ratio was 6.5%, and the ratio of the fiber to the primary resin to the secondary resin was 1: 0.6: 0.5. The flatness of the silicon wafer polished by this high hardness composite substrate is good,
The life of the polishing cloth was 100 hours. The formulation example of the secondary impregnation liquid is the same as in Example 1. Example 3 A needle punched non-woven fabric having a thickness of 2 mm, a bulk density of 0.20 g / cm 3 , and a basis weight of 400 g / m 2 , which is composed of a polyester fiber having a 3.0 denier fiber length of 75 mm, is used as a base material and has a molecular weight of 200. 1,000, 100% modulus 120kg / cm
2 % polyester type polyurethane resin (Dai Nippon Ink Co., Ltd. product name: Chris Bon 8867) with a solid content of 9%
After sufficiently dipping and impregnating the base material with the MF solution, the polyurethane resin is wet-coagulated into a porous form by immersing it in a coagulating liquid having a DMF to pure water ratio of 25% to 75% and a temperature of 30 ° C. for 20 minutes. After that, it was washed in pure water for 60 minutes to completely replace DMF with pure water, and further dried with hot air at 120 ° C. to have a thickness of 2 mm, a bulk density of 0.30 g / cm 3 , and a basis weight of 600 g /
A composite substrate with m 2 and a urethane to fiber weight ratio of 0.5 to 1 was obtained. The front and back surfaces of the base material were ground with 80 mesh baffle to remove the skin layer having a high density. The hardness of this sheet was 65 degrees according to JIS A, and the compression rate was 22%. The sheet material was dipped and impregnated in a secondary impregnation solution having the following composition, dried with hot air at 120 ° C. for 20 minutes, and the solvent was completely dried and removed to give the thermosetting polyurethane as a polyurethane porous material in the composite substrate. A high hardness composite base material was obtained by curing while coating the cell walls of the matrix. A flat high-hardness composite base material obtained by buffing the front and back surfaces of this composite base material has a thickness of 1.27 mm, a bulk density of 0.35 g / cm 3 , and a hardness of JIS A8.
Twice, the compressibility was 60%, and the ratio of fiber to primary resin to secondary resin was 1: 0.5: 0.3. The flatness of the silicon wafer polished by this high hardness composite substrate was good, and the life of the polishing cloth was 130 hours. The formulation example of the secondary impregnation liquid is the same as in Example 1. (Example 4) 3.0 denier polyester fiber having a fiber length of 60 mm,
Based on a needle punched non-woven fabric with a thickness of 2 mm, a bulk density of 0.15 g / cm 3 and a basis weight of 300 g / m 2 , which is composed of heat-shrinkable polyester fibers having a ratio of 2.5 denier and a fiber length of 50 mm of 80 to 20. Material, molecular weight 200,000, 1
After sufficiently dipping and impregnating the base material with a DMF solution having a solid content of 11% of a polyester polyurethane resin having a 00% modulus of 120 g / cm 2 , the ratio of DMF to pure water is 20:80.
At a temperature of 35 ° C. for 20 minutes to wet-solidify the polyurethane resin into a porous form, and then 60
After washing in pure water for 1 minute, DMF is completely replaced with pure water, and further dried with hot air at 120 ° C to a thickness of 2 mm and a bulk density of 0.26.
A composite base material having a g / cm 2 , a basis weight of 520 g / m 2 , and a urethane to fiber weight ratio of 0.6 to 1 was obtained. 80 the substrate
The front and back surfaces were ground with a mesh baffle to remove the dense skin layer. The hardness of this sheet was 58 degrees according to JIS A, and the compression rate was 33%. The sheet material was dipped and impregnated in a secondary impregnation liquid having the following composition, and then dried with hot air at 120 ° C. for 20 minutes to completely dry and remove the solvent, and the thermosetting polyurethane was used as the polyurethane porous material in the composite substrate. A high hardness composite substrate was obtained by curing while covering the cell walls in the layer. A flat high hardness composite base material obtained by further buffing this composite base material on the front and back sides has a thickness of 1.27 mm and a bulk density of 0.
35 g / cm 3 , hardness JISA 85 degrees, compression rate 5.0%,
The ratio of fiber to primary resin to secondary resin is 1 to 0.6 to 0.5.
Met. The flatness of the silicon wafer polished by this high hardness composite substrate was particularly good, and the life of the polishing cloth was 95 hours.

【0020】 二次含浸液の配合例: バイブラセンB−803(ユニロイヤルInc.商品名) 100.0部 イハラキュアミンMT(イハラケミカル(株)商品名) 32.9部 MEK 605.0部 計 737.9部 (実施例5) 3.0デニール、繊維長60mmのポリエステル繊維と、
2.5デニール、繊維長50mmの熱収縮型ポリエステル
繊維の比率が80対20で構成される、厚さ2mm、嵩密
度0.15g/cm3 、目付重量300g/m2 のニード
ルパンチ不織布を基材とし、分子量250,000、1
00%モジュラス180g/cm2 のポリエステル系ポリ
ウレタン樹脂(サンブレンLQ3700)の固型分9%
のDMF溶液で該基材を十分浸漬含漬した後、DMF対
純水の比率が20対80で、且つ温度が35℃の凝固液
中に20分間浸漬し、ポリウレタン樹脂をポーラス状に
湿式凝固させた後、60分間純水中で洗浄し、DMFを
純水と完全に置換し、更に120℃の熱風で乾燥し、厚
さ2mm、嵩密度0.26g/cm2 、目付重量520g/
2 、ウレタン対繊維の重量比0.6対1の複合基材が
得られた。該基材を80メッシュのバフロールで表、裏
面を研削し、密度の高いスキン層を除去した。このシー
ト物の硬度はJISAで65度、圧縮率22%であっ
た。該シート物を実施例1の二次含浸液に浸漬含浸後、
120℃の熱風で20分間乾燥し、溶剤を完全に乾燥除
去し、該熱硬化性ポリウレタンを上記複合基材中のポリ
ウレタン多孔質層中のセル壁を被覆しながら硬化させる
ことにより、高硬度複合基材を得た。この複合基材を更
に表、裏面バフ処理した平坦な高硬度複合基材は、厚さ
1.27mm、嵩密度0.35g/cm3 、硬度JISA8
2度、圧縮率5.6%、繊維対一次樹脂対二次樹脂の比
率が1対0.6対0.5であった。この高硬度複合基材
により研磨させたシリコンウェハーの平坦度は良好で、
研磨クロスのライフは110時間であった。 (比較例1) 3.0デニール、繊維長60mmのポリエステル繊維と、
2.5デニール、繊維長50mmの熱収縮型ポリエステル
繊維の比率が80対20で構成される、厚さ2mm、嵩密
度0.175g/cm3 、目付重量350g/m2 のニー
ドルパンチ不織布を基材とし、分子量300,000、
100%モジュラス240g/cm2 のポリエステル系ポ
リウレタン樹脂(大日本インキ(株)商品名:クリスボ
ン8966)の固型分15%のDMF溶液で該基材を十
分浸漬含浸した後、DMF対純水の比率が20対80
で、且つ温度が35℃の凝固液中に20分間浸漬し、ポ
リウレタン樹脂をポーラス状に湿式凝固させた後、60
分間純水中で洗浄し、DMFを純水と完全に置換し、更
に120℃の熱風で乾燥し、厚さ2mm、嵩密度0.30
g/cm2 、目付重量600g/m2 、ウレタン対繊維の
重量比0.8対1の複合基材が得られた。該基材を80
メッシュのバフロールで表、裏面を研削し、密度の高い
スキン層を除去した。このシート物の硬度はJISAで
72度、圧縮率11%であった。この複合基材により研
磨されたシリコンウェハーの平坦度は面ダレが大きく、
良好とは云えないものであった。
Blending Example of Secondary Impregnation Solution: Vibrasen B-803 (Uniroyal Inc. trade name) 100.0 parts Iharacuamine MT (Ihara Chemical Co., Ltd. trade name) 32.9 parts MEK 605.0 parts Total 737.9 parts (Example 5) 3.0 denier polyester fiber having a fiber length of 60 mm,
Based on a needle punched non-woven fabric with a thickness of 2 mm, a bulk density of 0.15 g / cm 3 and a basis weight of 300 g / m 2 , which is composed of heat-shrinkable polyester fibers having a ratio of 2.5 denier and a fiber length of 50 mm of 80 to 20. Material, molecular weight 250,000, 1
Solid content 9% of polyester polyurethane resin (Sambrene LQ3700) with a 00% modulus of 180 g / cm 2
After sufficiently dipping and soaking the substrate in the DMF solution of, the DMF to pure water is immersed in a coagulating liquid having a ratio of DMF to pure water of 20 to 80 and a temperature of 35 ° C. for 20 minutes to wet-coagulate the polyurethane resin in a porous form. After that, it was washed in pure water for 60 minutes to completely replace DMF with pure water, and further dried with hot air at 120 ° C. to have a thickness of 2 mm, a bulk density of 0.26 g / cm 2 , and a basis weight of 520 g /
A composite substrate with m 2 and a urethane to fiber weight ratio of 0.6 to 1 was obtained. The front and back surfaces of the base material were ground with 80 mesh baffle to remove the skin layer having a high density. The hardness of this sheet was 65 degrees according to JIS A, and the compression rate was 22%. After dipping and impregnating the sheet material with the secondary impregnation liquid of Example 1,
Drying with hot air at 120 ° C. for 20 minutes to completely remove the solvent, and curing the thermosetting polyurethane while coating the cell walls in the polyurethane porous layer in the composite substrate, to obtain a high hardness composite. A base material was obtained. A flat high-hardness composite substrate obtained by buffing the front and back surfaces of this composite substrate has a thickness of 1.27 mm, a bulk density of 0.35 g / cm 3 , and a hardness of JIS A8
Twice, the compressibility was 5.6%, and the ratio of fiber to primary resin to secondary resin was 1: 0.6: 0.5. The flatness of the silicon wafer polished by this high hardness composite substrate is good,
The life of the polishing cloth was 110 hours. (Comparative Example 1) 3.0 denier polyester fiber having a fiber length of 60 mm,
Based on a needle punched non-woven fabric having a thickness of 2 mm, a bulk density of 0.175 g / cm 3 and a basis weight of 350 g / m 2 , which is composed of a heat-shrinkable polyester fiber having a ratio of 2.5 denier and a fiber length of 50 mm of 80 to 20. Material, molecular weight 300,000,
After thoroughly impregnating the base material with a DMF solution having a solid content of 15% of a 100% modulus 240 g / cm 2 polyester-based polyurethane resin (Dainippon Ink and Co., Ltd., trade name: Crisbon 8966), the substrate was treated with DMF and pure water. 20:80 ratio
At a temperature of 35 ° C. for 20 minutes to wet-solidify the polyurethane resin into a porous form, and then 60
After washing in pure water for a minute, DMF is completely replaced with pure water and further dried with hot air at 120 ° C. to have a thickness of 2 mm and a bulk density of 0.30.
A composite base material having a weight per unit area of g / cm 2 , a weight per unit area of 600 g / m 2 , and a weight ratio of urethane to fiber of 0.8: 1 was obtained. 80 the substrate
The front and back surfaces were ground with a mesh baffle to remove the dense skin layer. The hardness of this sheet was 72 degrees according to JIS A, and the compression rate was 11%. The flatness of the silicon wafer polished by this composite substrate has a large surface sag,
It was not good.

【0021】本実施例の研磨用クロスは、近年の1MD
RAM、あるいは将来の4MDRAM用ウェハー製造に
適した物性を保有し、LTV値が0.8μ以下で、PU
A値95%以上の高平坦性ウェハーの供給が可能となっ
たばかりか、研磨屑等による目詰まりのために研磨能力
が短期に低下する欠点のない研磨用クロスを提供するこ
とが出来た。さらに副次効果として、研磨用クロスとし
ての寿命が長い為、新しい研磨用クロスに貼り替え頻度
が格段に少なくなった。
The polishing cloth of this embodiment is 1MD in recent years.
For manufacturing RAM or wafers for future 4MDRAM
Possessing suitable physical properties, LTV value of 0.8μ or less, PU
It becomes possible to supply highly flat wafers with an A value of 95% or more.
Not only the polishing ability due to clogging by polishing debris etc.
To provide a polishing cloth that does not have the drawback that
I was able to. Furthermore, as a side effect, a polishing cloth is used.
Since it has a long life, it is frequently replaced with a new polishing cloth.
Was much less.

【0022】[0022]

【発明の効果】本発明の研磨用クロスは、研磨用クロス
に存在する多孔質セルの壁が硬質の樹脂薄膜により被覆
・補強された構造を持つため、研磨用クロスの多孔性
(密度)を大幅に低下させることなくその圧縮弾性率を
高くすることができるので、加工液及び加工屑を保持す
る空間を低下させることなく維持でき、研磨用クロスが
短時間で目詰まりを起こし研磨できなくなることを回避
することができると共に、研磨速度(生産効率)、研磨
布の使用可能時間(作業効率及び生産コスト)を低下さ
せずに被加工物の表面の高平坦性を達成することができ
る。
The polishing cloth of the present invention is a polishing cloth.
The walls of the porous cells present in the wall are covered with a hard resin thin film
・ Porosity of polishing cloth due to reinforced structure
Its compressive modulus can be reduced without significantly reducing (density)
Since it can be made higher, it holds the machining fluid and machining chips.
The polishing cloth can be maintained without lowering the space
Avoids clogging in a short time and making polishing impossible
Can be done at the same time as polishing rate (production efficiency), polishing
Reduced cloth usable time (work efficiency and production cost)
High surface flatness of the work piece can be achieved without
It

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 フェルト状繊維質シート中の構成繊維
が、線状の熱可塑性ポリウレタン樹脂を主体とする重合
体により、埋設的に囲繞されて複合基材が形成されると
ともに、前記複合基材の多孔質相に存在するセルの壁
が、熱可塑性ポリウレタン樹脂より硬質の樹脂の薄膜に
より被覆・補強されていることを特徴とする研磨用クロ
1. Constituent fibers in a felt-like fibrous sheet
Is a polymer based on linear thermoplastic polyurethane resin
When the body is embedded and surrounded to form a composite substrate
Both are the walls of the cells present in the porous phase of the composite substrate
However, a thin resin film that is harder than thermoplastic polyurethane resin
Polishing black characterized by being more covered and reinforced
Su .
【請求項2】 前記記載の熱可塑性ポリウレタン及びフ
ェルト状繊維質シートからなる複合基材が、二次処理と
して、3、3’ジクロロー4、4’ジアミノジフェニル
メタン等の有機アミン化合物により硬化し得る熱硬化性
ポリウレタン、及び該ポリウレタンの硬化剤としての有
機アミン化合物とを溶解した溶剤溶液を含浸して、該硬
化剤の反応温度以上の温度にて加熱し、溶剤を蒸発させ
て除去すると同時に、ポリウレタンの硬化反応を起こさ
せることによって製造される請求項1記載の研磨用クロ
2. A heat which can cure the composite substrate comprising the thermoplastic polyurethane and the felt-like fibrous sheet described above with an organic amine compound such as 3,3′dichloro-4,4′diaminodiphenylmethane as a secondary treatment. A curable polyurethane and an organic amine compound as a curing agent for the polyurethane are impregnated with a solvent solution and heated to a temperature equal to or higher than the reaction temperature of the curing agent to evaporate and remove the solvent. polishing black of that cause the curing reaction thus according to claim 1 to be manufactured
Su .
【請求項3】 前記記載の熱可塑性ポリウレタン及びフ
ェルト状繊維質シートからなる複合基材が、二次処理と
して、3、3’ジクロロー4、4’ジアミノジフェニル
メタン等の有機アミン化合物により硬化し得る熱硬化性
ポリウレタン及びメラミン樹脂、ポリカーボネート樹脂
等をブレンドした樹脂及び該ポリウレタンの硬化剤とし
ての有機アミン化合物とを溶解した溶剤溶液を含浸し
て、該硬化剤の反応温度以上の温度にて加熱し、溶剤を
蒸発させて除去すると同時に、ポリウレタンの硬化反応
を起こさせることによって製造される請求項1記載の
磨用クロス
3. A heat which can cure the composite base material comprising the thermoplastic polyurethane and the felt-like fibrous sheet as described above as a secondary treatment with an organic amine compound such as 3,3′dichloro-4,4′diaminodiphenylmethane. Curable polyurethane and melamine resin, impregnated with a solvent solution in which a resin obtained by blending a resin such as a polycarbonate resin and a curing agent for the polyurethane is dissolved, and heated at a temperature equal to or higher than the reaction temperature of the curing agent, At the same time the solvent is evaporated to remove, Ken according to claim 1, wherein the thus produced to cause the curing reaction of polyurethane
Polishing cloth .
【請求項4】 前記記載の熱可塑性ポリウレタン及びフ
ェルト状繊維質シートからなる複合基材が、ポリウレタ
ンと繊維との重量比率が1対5〜1対1の範囲にあるよ
うな複合基材を用いて製造される請求項1乃至3のいず
れかに記載の研磨用クロス
4. The composite base material comprising the thermoplastic polyurethane and the felt-like fibrous sheet as described above, wherein the weight ratio of polyurethane to fiber is in the range of 1 to 5 to 1: 1. Any of claims 1 to 3 manufactured by
A polishing cloth as described therein .
【請求項5】 前記複合基材を形成するのに用いる熱可
塑性ポリウレタンと、該複合基材にさらに含浸、乾燥、
硬化を行う二次処理含浸樹脂との重量比率が1対3〜1
対1にあるような請求項2乃至4のいずれかに記載の
磨用クロス
5. A thermoplastic polyurethane used to form the composite substrate, and the composite substrate further impregnated, dried,
The secondary treatment impregnating resin for curing has a weight ratio of 1: 3 to 1
Ken according to any one of claims 2 to 4, such as in-one
Polishing cloth .
JP3263631A 1991-10-11 1991-10-11 Polishing cloth Expired - Lifetime JPH074769B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3263631A JPH074769B2 (en) 1991-10-11 1991-10-11 Polishing cloth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3263631A JPH074769B2 (en) 1991-10-11 1991-10-11 Polishing cloth

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP1068389A Division JPH02250776A (en) 1989-03-21 1989-03-21 Semiconductor wafer abrasive cloth and manufacture thereof

Publications (2)

Publication Number Publication Date
JPH058178A JPH058178A (en) 1993-01-19
JPH074769B2 true JPH074769B2 (en) 1995-01-25

Family

ID=17392192

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3263631A Expired - Lifetime JPH074769B2 (en) 1991-10-11 1991-10-11 Polishing cloth

Country Status (1)

Country Link
JP (1) JPH074769B2 (en)

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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02250776A (en) * 1989-03-21 1990-10-08 Rodeele Nitta Kk Semiconductor wafer abrasive cloth and manufacture thereof

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02250776A (en) * 1989-03-21 1990-10-08 Rodeele Nitta Kk Semiconductor wafer abrasive cloth and manufacture thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007531276A (en) * 2004-03-23 2007-11-01 キャボット マイクロエレクトロニクス コーポレイション CMP porous pad having a plurality of pores filled with components

Also Published As

Publication number Publication date
JPH058178A (en) 1993-01-19

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