JPH06347380A - Testing circuit - Google Patents

Abstract

PURPOSE:To simplify an operation by sending a signal for sequentially conducting scheduled tests according to supply of a start signal by a switching operation. CONSTITUTION:A memory circuit 1f sequentially stores a series of switching operations of respective testing inspecting items from setting of a testing state of each testing circuit to display of data by using an electrically rewritable read only memory. After the storage, a starting operation by a switch 1a of a monitor panel 1 is supplied to the circuit 1f through a monitor controller 1c, a transmitter 1d, a series of switch data corresponding to an initial testing item is thereby sent through the controller 1c, the transmitter 1d, and processed by a signal processing functional unit 2. A processed result is returned to the panel 1 through a transmitter 2c, and displayed on a display unit 1b. When it is confirmed and the confirmation of the switch 2a is conducted, the circuit 1f generates a series of switch data corresponding to next testing item. Thus, a complicated test is automatically processed.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test device for performing a function test and maintenance of the device.

[0002]

2. Description of the Related Art Generally, when a device having a complicated function is adjusted in a factory, various jigs or measuring instruments can be easily obtained, so that the optimum state can be adjusted. Since tools cannot be used, it is very difficult to correct characteristic deviations due to aging and the like. Therefore, the function of performing such correction or necessary test may be added as a part of the function of the apparatus.

An example of an apparatus used for such an application is shown in FIGS. 8 and 9, and in the example of FIG. 8, the signal of the switch 1a of the monitor panel 1 is displayed on the test signal switching circuit of the signal processing function section 2. The display data signal directly connected to the signal selection circuit or the like is output from the monitor panel 1 corresponding to the display data signal.
Is supplied to the display device 1b. In the example of FIG. 9, the switch 1a of the monitor panel 1 is provided to reduce the number of wires and facilitate maintenance.
The signal generated from the signal is converted into digital data by the monitor control circuit 1c, and then transmitted to the signal processing function unit 2 via the transmission circuit 1d. The signal processing function unit 2 receives the signal via the receiving circuit 2a, converts it into a control signal or setting data by the signal processing unit 2b, and then distributes it to the test signal switching circuit in the signal processing unit 2. The display data is edited into digital data by the signal processing unit 2b and then transmitted as serial data to the monitor panel 1 via the transmission circuit 2c. The monitor panel 1 receives the serial data via the receiving circuit 1e, converts the serial data into a predetermined display signal by the monitor control circuit 1c, and then supplies the display signal to the display 1b. As described above, the conventional device controls the test circuit and sets the test data by operating the switch 1a of the monitor panel 1, displays the output of the circuit under test on the panel display, and performs the function test and the operation check. To do.

[0004]

However, such a conventional device has a problem that the operation becomes complicated because the number of switch operations increases as the number of test items and inspection items increases. The present invention has been made in view of such a situation, and is intended to facilitate the operation even if the number of test items and inspection items increases.

[0005]

In order to solve such a problem, according to the present invention, a switch operation procedure necessary for each test and inspection item is programmed, and the programmed switch data is output only by a start operation. , The test was conducted.

[0006]

When the switch is operated, the test circuit is activated, and the test signals are transmitted in the order stored therein to automatically perform the test.

[0007]

DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a block diagram showing an embodiment of the present invention, in which the same parts as those in FIGS. In this example, switch data corresponding to the switch operation of the panel is programmed in advance and stored in the storage circuit 1f,
The switch operations on the panel are limited to simple startup and operation confirmation. The memory circuit 1f uses an electrically rewritable read-only memory and sequentially stores a series of switch operations for each test from test state setting of each test circuit to data display and each inspection item.

Once the switch operation is stored, the activation operation by the switch 1a of the monitor panel 1 is thereafter supplied to the storage circuit 1f via the monitor control circuit 1c, whereby a series of switch data corresponding to the first test item is supplied. Is transmitted via the monitor control circuit 1c and the transmission circuit 1d, and is processed by the signal processing function unit 2. The processed result is returned to the monitor panel 1 via the transmission circuit 2c, and the processed result is displayed on the display 1b. If the switch 1a is checked after confirming the display result, the memory circuit 1f
Generates a series of switch data corresponding to the next test item. By using the EEPROM for this memory circuit, the procedure can be changed at any time, but if the procedure is not frequently changed, the ROM can be used to simplify the memory circuit.

FIG. 2A shows a signal generated from the monitor panel 1 when the switch 1a is operated, and FIG. 2B shows a signal returned from the signal processing unit 2. When the switch is operated, a synchronizing signal is generated and the test code, the number of words, the board number, the function code, the data 1 and the data 2 are transmitted. Here, the test code represents the type of switch data such as operation mode switching, resetting, constant setting, and display data designation. The number of words indicates the number of words of switch data and display data. The board number specifies the board to be tested. The function code specifies the function, circuit, device, etc. in the board under test. The data represents switch set values and display data.

When such data is sent from the monitor panel 1, the signal processing function unit 2 performs a predetermined process,
Since the signal shown in (b) is sent back to the monitor panel 1, the monitor panel 1 detects it and performs the necessary display on the display unit 1.

In the example shown in FIG. 3, the signal processing function unit 2 is provided with a plurality of signal processing circuits 3 each having the internal configuration shown in FIG. It is designed to be able to. Each signal processing circuit 3 includes a switch 3a and a display 3 as shown in FIG.
b, monitor control circuit 3c, test circuit 3d, transmitting / receiving circuit 3
It is composed of e and has the function of testing and inspection by itself,
The test / inspection can be performed also by a signal from the monitor panel 1 supplied via the transmission / reception circuit 3e. When the board number sent from the monitor panel 1 matches the board number of each board, each board takes in the signal and processes the switch data. The signal is passed through the transmitting / receiving circuit 3e and supplied to another signal processing circuit 3. In addition, the result of the test performed inside itself or the test performed by the signal taken in from the monitor panel is the transmission / reception circuit 3
The signal is output via e and is supplied from the monitor panel 1 via the signal processing circuit 3 in the subsequent stages.

The example of FIG. 4 is an example in which a simple test is performed by the signal processing circuit 3, but the example of FIG. 5 allows the same test as the function provided in the monitor panel 1 to be performed so that the memory circuit 1f of FIG. This is an example in which a memory circuit 4f equivalent to the above is provided. By doing so, the preprogrammed tests are sequentially performed by applying only the activation signal from the switch 4a.

In the example of FIG. 6, the monitor panel 1 is provided with an external connection circuit 1g and a test device 5 is connected thereto, and the test is performed from the test device 5 after the activation signal is generated by the switch 1a. . With such a configuration, the test content can be made more complicated, and the test result can be output to the test apparatus 5 to make a hard copy of the test result. Further, in the test apparatus 5, a test / inspection procedure is set in advance, switch data is programmed, and display / display of display data, comparison with expected value, and hard copy output are programmed to facilitate test / inspection. It is automatically executed by simple operation.

FIG. 7 shows that the test device 5 is operated by the telephone line connection circuits 6a and 6b at a place distant from the monitor panel 1. By placing the test device 5 at such a distance, for example, a test in a factory is performed. Now that the device is ready for use, the same tests as factory adjusted can be performed.

[0015]

As described above, according to the present invention, the order to be tested is stored in advance, and the predetermined test can be performed only by giving the start signal. Therefore, even a complicated test is automatically processed. Therefore, there is an effect that a complicated test can be performed without requiring skill.

[Brief description of drawings]

FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention.

2 is a diagram showing signals sent when a test is performed in the apparatus of FIG. 1. FIG.

FIG. 3 is a block diagram showing a configuration of a second exemplary embodiment.

4 is a block diagram showing an example of a configuration of a signal processing circuit used in the device of FIG.

FIG. 5 is a block diagram showing a configuration of a third exemplary embodiment.

FIG. 6 is a block diagram showing a configuration of a fourth exemplary embodiment.

FIG. 7 is a block diagram showing a configuration of a fifth exemplary embodiment.

FIG. 8 is a block diagram showing a configuration of an example of a conventional configuration.

FIG. 9 is a block diagram showing the configuration of another example of the conventional configuration.

[Explanation of symbols]

 1 Monitor Panel 1a Switch 1b Display 1c Monitor Control Circuit 1d, 2c Transmission Circuit 1e, 2a Reception Circuit 1f Storage Circuit 2 Signal Processing Function Section 3, 4 Signal Processing Circuit 5 Test Equipment 6 Telephone Line Connection Circuit

Claims (1)

[Claims] 1. A test circuit for testing a device by a switch operation, comprising a test circuit for sending a signal for sequentially performing a predetermined test by supplying a start signal by the switch operation. Test circuit to do.