JPH063236A - Measuring device for young's modulus and measuring method for young's modulus - Google Patents
Measuring device for young's modulus and measuring method for young's modulusInfo
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- JPH063236A JPH063236A JP16622092A JP16622092A JPH063236A JP H063236 A JPH063236 A JP H063236A JP 16622092 A JP16622092 A JP 16622092A JP 16622092 A JP16622092 A JP 16622092A JP H063236 A JPH063236 A JP H063236A
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- modulus
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Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明はヤング率測定装置及びヤ
ング率測定方法に係り、特に紙葉類のヤング率測定に適
したヤング率測定装置及びヤング率測定方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a Young's modulus measuring apparatus and Young's modulus measuring method, and more particularly to a Young's modulus measuring apparatus and Young's modulus measuring method suitable for measuring Young's modulus of paper sheets.
【０００２】紙葉類搬送処理装置、例えば、現金自動支
払い機や現金自動入出金機、印刷装置等には、紙幣や印
刷用紙等の積み重なった紙葉類を一枚ずつ分離して紙葉
類搬送部に送り出すための繰り出し機構がある。繰り出
し機構における紙葉類の分離方法としては、紙葉類と繰
り出し機構の間に作用する摩擦力を利用するものが主流
となっている。[0002] Paper sheet conveying and processing devices such as an automatic cash dispenser, an automatic cash depositing / dispensing machine, and a printing device separate paper sheets piled up such as banknotes and printing papers one by one to separate paper sheets. There is a delivery mechanism for delivering to the transport unit. As a method of separating the paper sheets in the feeding mechanism, a method using a frictional force acting between the paper sheet and the feeding mechanism is mainly used.
【０００３】紙葉類が安定に繰り出されるための因子と
して、紙葉類と機構の間の摩擦係数と共に、紙葉類の曲
げ剛さが重要である。従って、紙葉類を安定に繰り出す
機構を開発するためには、紙葉類の曲げ剛さを知る必要
がある。曲げ剛さは紙のヤング率で定量化できるので、
紙葉類のヤング率を正確に簡便に測定するヤング率測定
装置及びヤング率測定方法の開発が必要とされている。As a factor for stably feeding the paper sheet, the bending rigidity of the paper sheet is important as well as the coefficient of friction between the paper sheet and the mechanism. Therefore, it is necessary to know the bending stiffness of the paper sheet in order to develop a mechanism for stably feeding the paper sheet. Bending stiffness can be quantified by the Young's modulus of the paper, so
It is necessary to develop a Young's modulus measuring device and a Young's modulus measuring method for accurately and easily measuring the Young's modulus of paper sheets.
【０００４】[0004]
【従来の技術】紙のヤング率の測定方法としては、振動
特性や超音波を利用した方法も提案されているが、最も
簡便で広く用いられている方法は、低速引っ張り試験で
得られる荷重−変位曲線の初期勾配から求める方法であ
る。2. Description of the Related Art As a method for measuring the Young's modulus of paper, a method utilizing vibration characteristics and ultrasonic waves has been proposed, but the most simple and widely used method is the load obtained by a low-speed tensile test. This is a method of obtaining from the initial gradient of the displacement curve.
【０００５】以下、引っ張り試験方法を文献「木村他：
“引っ張り試験からの紙のヤング率の実験的算出法”、
紙パ技協誌、第３９巻第１１号（１９８５）、ｐ５５−
６０」から引用して述べる。The tensile test method will be described in the following document "Kimura et al .:
"Experimental method of calculating Young's modulus of paper from tensile test",
Paper and Paper Cooperative Magazine, Vol. 39, No. 11 (1985), p55-
60 ”.
【０００６】図６に従来の紙葉類のヤング率測定装置の
構成図を示し、同装置を用いた測定手順を以下に述べ
る。先ず、引っ張り試験機１のチャック２に測定する紙
葉３を取付ける。続いて、モータ制御部４からの指令で
モータ５を駆動してヘッド６を一定速度で上方向に引き
上げる。このときのヘッド６の変位（紙葉３の見掛けの
変形量）を、例えばモータ５に付けたエンコーダ７で検
出し、エンコーダカウンタ８でカウントして変位データ
９を得る。FIG. 6 shows a block diagram of a conventional Young's modulus measuring apparatus for paper sheets, and a measuring procedure using the apparatus will be described below. First, the paper sheet 3 to be measured is attached to the chuck 2 of the tensile tester 1. Then, the motor 5 is driven by a command from the motor control unit 4 to pull the head 6 upward at a constant speed. The displacement of the head 6 (apparent deformation amount of the paper sheet 3) at this time is detected by, for example, the encoder 7 attached to the motor 5, and is counted by the encoder counter 8 to obtain displacement data 9.
【０００７】一方、紙葉３に作用する荷重は、チャック
２とヘッド６間に取りつけたロードセル１０で検出し、
ロードセルアンプ１１で増幅して荷重データ１２を得
る。荷重データ１２と変位データ９を荷重−変位記録部
１３で記録して、紙葉３の荷重−変形特性１４を得る。
紙葉３のスパンを４０ｍｍと１００ｍｍにしたときの荷
重−変形特性の一例を図７に示す。On the other hand, the load acting on the paper sheet 3 is detected by the load cell 10 mounted between the chuck 2 and the head 6,
The load data 12 is obtained by amplification with the load cell amplifier 11. The load data 12 and the displacement data 9 are recorded by the load-displacement recording unit 13 to obtain the load-deformation characteristics 14 of the paper sheet 3.
FIG. 7 shows an example of load-deformation characteristics when the span of the paper sheet 3 is 40 mm and 100 mm.
【０００８】以下に、本装置を使用してヤング率を求め
る方法を説明する。ヘッド６の垂直変位（＝見掛けの紙
葉３の変形量）Δｄは、下記式に示すように、紙葉３
の実質的な変形量Δｒと、測定装置に起因する変位Δｓ
との和で表されると仮定する。A method of obtaining the Young's modulus using this apparatus will be described below. The vertical displacement of the head 6 (= the amount of deformation of the apparent paper sheet 3) Δd is as shown in the following equation.
Deformation amount Δr and displacement Δs caused by the measuring device
Suppose it is expressed as the sum of and.
【０００９】Δｄ＝Δｒ＋Δｓ −−− ここで、試料の種類や厚さ、チャック２での固定圧力、
引張条件等が同じであるならば、Δｓは実験毎に同じ値
をとると仮定する。紙葉３のスパンをｒとすると、下記
式が成立する。Δd = Δr + Δs --- Here, the type and thickness of the sample, the fixed pressure on the chuck 2,
If the tensile conditions are the same, it is assumed that Δs takes the same value for each experiment. When the span of the paper sheet 3 is r, the following formula is established.
【００１０】 （Δｄ／ｒ）＝（Δｒ＋Δｓ）／ｒ −−− 図７より、荷重と変形量の関係は非線形である。そこ
で、初期直線部分（荷重と変形量が比例関係にある領
域）に着目して、直線の勾配からある荷重に対する変形
量Δｄを求める。次に、スパンを徐々に短くして引っ張
り試験を行い、横軸にスパン、縦軸にある荷重下での見
掛けの変形量をとると、ｒ＝０の時の外挿値からその荷
重下でのΔｓが実験的に求まる。このΔｓを用いて、ヤ
ング率は、下記式で求まる。(Δd / r) = (Δr + Δs) / r --- From FIG. 7, the relationship between the load and the amount of deformation is non-linear. Therefore, focusing on the initial straight line portion (a region where the load and the deformation amount are in a proportional relationship), the deformation amount Δd for a certain load is obtained from the gradient of the straight line. Next, the span is gradually shortened to perform a tensile test, and the horizontal axis represents the span and the vertical axis represents the apparent amount of deformation under load. From the extrapolated value when r = 0, Δs of is determined experimentally. Using this Δs, Young's modulus is obtained by the following formula.
【００１１】 Ｅ＝（Ｆ／Ａ）／（（Δｄ−Δｓ）／ｒ） −−− ここで、Ａは紙葉３の断面積である。E = (F / A) / ((Δd−Δs) / r) ----- where A is the cross-sectional area of the paper sheet 3.
【００１２】[0012]
【発明が解決しようとする課題】しかるに、従来の定速
引っ張り試験で得られる荷重−変位曲線の初期勾配から
ヤング率を求める方法では、下記のような問題があっ
た。まず、引っ張り過程での、チャックと紙葉間の滑
り、紙葉のチャック部付近の応力や歪みの異常分布の影
響によって、紙葉のヤング率が変化する。However, the conventional method of obtaining the Young's modulus from the initial gradient of the load-displacement curve obtained by the constant-speed tensile test has the following problems. First, the Young's modulus of the paper sheet changes due to the influence of the slip between the chuck and the paper sheet in the pulling process and the abnormal distribution of stress and strain near the chuck portion of the paper sheet.
【００１３】また、荷重−変形特性は、図７のような曲
線になるので、初期勾配の直線の引き方によって算出さ
れるヤング率の値が変化する。また、試験機のノイズ等
によって直線部分が不明確となるおそれもある。Further, since the load-deformation characteristic becomes a curve as shown in FIG. 7, the value of Young's modulus calculated by drawing the straight line of the initial gradient changes. In addition, the straight line portion may become unclear due to noise of the testing machine.
【００１４】更に、測定装置に起因する変位Δｓを補正
するため、少なくとも２〜３通りのスパンの試料に対し
て測定を繰り返す必要があり、測定時間がかかる。Furthermore, in order to correct the displacement Δs caused by the measuring device, it is necessary to repeat the measurement for the sample having at least 2-3 kinds of spans, which requires a long measuring time.
【００１５】本発明は、上記の点に鑑みてなされたもの
で、簡便かつ正確にヤング率を測定することができるヤ
ング率測定装置及びヤング率測定方法を提供することを
目的とする。The present invention has been made in view of the above points, and an object of the present invention is to provide a Young's modulus measuring device and a Young's modulus measuring method capable of easily and accurately measuring Young's modulus.
【００１６】[0016]
【課題を解決するための手段】上記課題は、請求項１の
発明では、測定対象物を梁として支持する支持手段と、
測定対象物の延在方向に対し垂直方向に荷重を印加する
荷重印加手段と、印加荷重を検出する印加荷重検出手段
と、測定対象物の所定位置における撓み量を検出する撓
み検出手段とより構成し、前記印加荷重と前記撓み量に
基づいて測定対象物のヤング率を求めることにより解決
される。According to the invention of claim 1, there is provided a supporting means for supporting an object to be measured as a beam,
A load applying means for applying a load in a direction perpendicular to the extending direction of the measuring object, an applied load detecting means for detecting the applied load, and a bending detecting means for detecting a bending amount of the measuring object at a predetermined position. Then, it is solved by obtaining the Young's modulus of the object to be measured based on the applied load and the amount of deflection.
【００１７】[0017]
【作用】請求項１の発明によれば、測定対象物に対し垂
直方向（測定対象物のずれが発生する方向と異なる方
向）に荷重を印加して測定対象物の撓み量を検出するた
め、支持手段において測定対象物に滑りが発生すること
を防止できると共に、支持位置近傍における応力や歪み
の異常発生をも防止できる。According to the invention of claim 1, since the load is applied to the measurement object in the vertical direction (direction different from the direction in which the deviation of the measurement object occurs), the deflection amount of the measurement object is detected. It is possible to prevent the measurement object from slipping in the supporting means, and to prevent abnormal stress or strain in the vicinity of the supporting position.
【００１８】よって、検出する撓み量には、測定装置の
変位等の測定装置に起因する誤差が含まれず、印加荷重
と検出した撓み量に基づいて求めるヤング率の精度を向
上させることができる。また、これに伴い、測定装置に
起因する誤差を補正するための操作を不要とすることが
できる。Therefore, the amount of bending detected does not include an error caused by the measuring device such as displacement of the measuring device, and the accuracy of the Young's modulus obtained based on the applied load and the detected amount of bending can be improved. Further, along with this, the operation for correcting the error caused by the measuring device can be eliminated.
【００１９】また、撓み量の測定値と、それから求めた
撓み曲線を比較することで、測定対象物の撓み量が、撓
みの理論に当てはまっているかどうかをチェックするこ
とができる。従って求めたヤング率の妥当性のチェック
を可能とすることができる。Further, by comparing the measured value of the bending amount with the bending curve obtained therefrom, it is possible to check whether or not the bending amount of the object to be measured fits the theory of bending. Therefore, it is possible to check the validity of the obtained Young's modulus.
【００２０】請求項２の発明によれば、片持ち梁状に支
持された測定対象物の自由端に荷重印加するため、測定
対象物を撓ませるのに要する荷重を数十ｇｆと小さな値
とすることができ、荷重印加手段及び支持手段を小型化
することができる。According to the second aspect of the present invention, since the load is applied to the free end of the measurement object supported in a cantilever shape, the load required to bend the measurement object is as small as several tens of gf. The load applying means and the supporting means can be downsized.
【００２１】請求項３の発明によれば、非接触で撓み量
を検出できるため、撓み量をより正確に測定することが
できる。According to the third aspect of the present invention, since the bending amount can be detected without contact, the bending amount can be measured more accurately.
【００２２】[0022]
【実施例】図１は本発明の一実施例の構成図を示す。ま
た、図２は一実施例の要部の平面図を示し、図３は一実
施例の要部の正面図を示す。測定対象物である紙葉２０
を長さｒだけはみ出させて紙葉取付台２１に乗せ、上か
ら押さえ板２２で紙葉取付台２１に固定する。押さえ板
２２は例えば、ネジで紙葉取付台２１に固定する。従っ
て、紙葉２０は、支持手段である紙葉取付台２１及び押
さえ板２２により片持ち梁状に支持される。DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a block diagram of an embodiment of the present invention. Further, FIG. 2 shows a plan view of the main part of one embodiment, and FIG. 3 shows a front view of the main part of the one embodiment. Paper sheet 20 that is the measurement target
Is protruded by a length r and placed on the paper sheet mounting base 21, and is fixed to the paper sheet mounting base 21 by a pressing plate 22 from above. The pressing plate 22 is fixed to the paper sheet mounting base 21 with screws, for example. Therefore, the paper sheet 20 is supported in a cantilever shape by the paper sheet mounting base 21 and the pressing plate 22 which are the supporting means.
【００２３】荷重印加手段は、Ｚ軸ステージ２５、ロー
ドセル２４、及び荷重印加部２３とよりなる。荷重は、
荷重印加部２３を先端に付けたロードセル２４をＺ軸ス
テージ２５に乗せて、そのＺ軸ステージ２５を上方に移
動させて荷重印加部２３で紙葉２０の先端部を突き上げ
るようにして加える。The load applying means comprises a Z-axis stage 25, a load cell 24, and a load applying section 23. The load is
The load cell 24 having the load applying section 23 attached to the tip is placed on the Z-axis stage 25, and the Z-axis stage 25 is moved upward so that the load applying section 23 pushes up the tip of the sheet 20.
【００２４】荷重印加部２３の紙葉２０に接する面は斜
面にして、紙葉２０と線接触させ、荷重が紙葉２０の最
先端部に加わるようにしてある。荷重検出手段であるロ
ードセル２４、に接続されたロードセルアンプ２６の出
力をモニターして、ロードセル２４の出力、即ち紙葉２
０に印加する荷重が設定値になるまで、Ｚ軸ステージ２
５でロードセル２４を上方に移動させる。The surface of the load applying section 23 in contact with the paper sheet 20 is inclined so that the load is in line contact with the paper sheet 20 so that the load is applied to the leading edge of the paper sheet 20. The output of the load cell amplifier 26 connected to the load cell 24, which is a load detecting means, is monitored to output the load cell 24, that is, the paper sheet 2.
Z axis stage 2 until the load applied to 0 reaches the set value
At 5, the load cell 24 is moved upward.
【００２５】なお、紙葉２０は押さえ板２２及び紙葉取
付台２１に片持ち梁状に支持されているため、ヤング率
測定に必要な所定の撓みを発生するのに要する印加荷重
は数十ｇｆでよい。このため、ロードセル２４には高感
度のものを使用することができる。また、紙葉２０に印
加する荷重が数十ｇｆであるため、Ｚ軸ステージ２５、
ロードセル２４、荷重印加部２３、紙葉取付台２１、押
さえ板２２等を小型化できる。Since the paper sheet 20 is supported by the pressing plate 22 and the paper sheet mounting base 21 in a cantilevered manner, the applied load required to generate the predetermined bending necessary for Young's modulus measurement is several tens. gf is sufficient. Therefore, a highly sensitive load cell 24 can be used. Further, since the load applied to the paper sheet 20 is several tens of gf, the Z-axis stage 25,
The load cell 24, the load applying section 23, the paper sheet mounting base 21, the pressing plate 22 and the like can be downsized.
【００２６】撓み検出手段は、Ｘ軸ステージ２８、及び
レーザ変位形２７とよりなる。紙葉２０の撓み量は、レ
ーザ変位計２７で測定する。レーザビームのＸ方向への
スキャンは、紙葉取付台２１とＺ軸ステージ２５を載せ
たＸ軸ステージ２８をＸ方向に移動させて行う。The deflection detecting means comprises an X-axis stage 28 and a laser displacement type 27. The amount of bending of the paper sheet 20 is measured by the laser displacement meter 27. The scanning of the laser beam in the X direction is performed by moving the X-axis stage 28 on which the paper sheet mount 21 and the Z-axis stage 25 are placed in the X direction.
【００２７】図４は、ヤング率の測定原理図を示す。先
端に集中荷重を受ける片持ち梁りの撓み曲線は、撓みが
微小量で、撓み量の変化率である（ｄｚ／ｄｘ）2 が
（ｄｚ／ｄｘ）2 ＜＜１の場合には、下記のの式で表
せる。FIG. 4 shows the principle of Young's modulus measurement. The deflection curve of a cantilever beam that receives a concentrated load at the tip is as follows when the deflection is very small and the rate of change of the deflection (dz / dx) 2 is (dz / dx) 2 << 1. It can be expressed by
【００２８】[0028]
【数１】 [Equation 1]
【００２９】但し、Ｅはヤング率、Ｉは断面２次モーメ
ントである。ここで、Ｉは試料の寸法から決まる量、Ｗ
は設定荷重、ｒは試料の長さで、いずれも既知である。
従って、紙葉の撓み曲線を測定して、ｘとｚが分かれ
ば、これらを式に代入して、ヤング率Ｅを求めること
ができる。However, E is Young's modulus and I is the second moment of area. Where I is an amount determined by the size of the sample, W
Is the set load and r is the length of the sample, both of which are known.
Therefore, if the bending curve of the paper sheet is measured and x and z are known, these can be substituted into the equation to obtain the Young's modulus E.
【００３０】なお、紙葉２０は自重で撓むので、この撓
みの影響が荷重を加えたときの撓みに対して無視できる
ように、試料長ｒを選定する必要がある。自重による撓
み量ｚは、単位長さ当たりの自重をｑとすると、下記の
式で表せる。Since the paper sheet 20 is bent by its own weight, it is necessary to select the sample length r so that the influence of this bending can be ignored with respect to the bending when a load is applied. The deflection amount z due to its own weight can be expressed by the following formula, where q is its own weight per unit length.
【００３１】[0031]
【数２】 [Equation 2]
【００３２】例えば、後述する図５に示す、荷重５ｇｆ
を加えたときの測定例では、試料の長さｒ＝４ｍｍ、試
料の幅＝１５ｍｍとしている。ヤング率Ｅ＝３ＧＰａ
（実験結果の値）、ｑ＝０．０１３ｇｆ／ｍｍ（実測
値）、紙厚０．１ｍｍ、を代入して自重による撓み量を
計算すると、ｚ＝１．３μｍとなり、荷重５ｇｆを加え
たときの撓み量ｚ＝０．２ｍｍの０．６％で自重による
撓みは無視できる値である。For example, a load of 5 gf shown in FIG. 5 described later.
In the measurement example when is added, the sample length r = 4 mm and the sample width = 15 mm. Young's modulus E = 3 GPa
(Experimental result value), q = 0.013 gf / mm (measured value), and paper thickness of 0.1 mm were calculated to calculate the amount of deflection due to its own weight, which was z = 1.3 μm, and a load of 5 gf was applied. The bending amount z = 0.2 mm is 0.6%, and the bending due to its own weight is a negligible value.
【００３３】次に、本実施例におけるヤング率の測定手
順について説明する。先ず、Ｘ軸ステージ２８を移動さ
せて、レーザ変位計２７のレーザビームが紙葉２０と押
さえ板２２との境界部分に当たるようにする。次に、Ｚ
軸ステージ２５を上方に移動させて、荷重印加部２３で
紙葉２０の先端部を突き上げる。ロードセルアンプ２６
の出力、即ち荷重が設定値になったら、Ｚ軸ステージの
移動を停止する。Next, the procedure for measuring Young's modulus in this embodiment will be described. First, the X-axis stage 28 is moved so that the laser beam of the laser displacement meter 27 hits the boundary portion between the sheet 20 and the pressing plate 22. Then Z
The shaft stage 25 is moved upward, and the load application unit 23 pushes up the leading end of the paper sheet 20. Load cell amplifier 26
When the output of, that is, the load reaches the set value, the movement of the Z-axis stage is stopped.
【００３４】次に、Ｘ軸ステージ２８を図１の右方向に
移動させて、原点２９からの距離ｘと、撓み量ｚのペア
を読み取り記録する。ｘはＸ軸ステージ２８に付いてい
るマイクロメータ４１で読み取る。また、ｚはレーザ変
位計２７の変位表示部３０の値を読み取る。レーザビー
ムを原点２９から紙葉２０の先端部までスキャンして、
Ｎ個の（ｘ，ｚ）のペアを得る。Next, the X-axis stage 28 is moved to the right in FIG. 1 to read and record the pair of the distance x from the origin 29 and the deflection amount z. x is read by a micrometer 41 attached to the X-axis stage 28. Further, z reads the value on the displacement display section 30 of the laser displacement meter 27. Scan the laser beam from the origin 29 to the tip of the paper sheet 20,
Obtain N (x, z) pairs.
【００３５】撓み量ｚは、レーザ変位計２７により非接
触で直接測定されるので、変位計の接触に起因する誤差
を含まない。Since the deflection amount z is directly measured by the laser displacement meter 27 without contact, it does not include an error due to the contact of the displacement meter.
【００３６】上記のようにして測定した撓みの測定例を
図５に◇で示す。図５の測定例では、ｒ＝４ｍｍ、試料
の幅＝１５ｍｍ、紙厚み＝０．１ｍｍ、荷重＝５ｇｆと
した場合である。An example of the deflection measured as described above is shown by ⋄ in FIG. In the measurement example of FIG. 5, r = 4 mm, sample width = 15 mm, paper thickness = 0.1 mm, and load = 5 gf.
【００３７】次に、求めたＮ個のデータ（ｘ，ｚ）を通
る撓み曲線式を求めて、ｘ3 の係数＝Ｗ／（６ＥＩ）
の値からヤング率Ｅを求める。より具体的には、最小２
乗近似法を用いて、下記の式によりヤング率Ｅを計算
する。Next, a flexure curve formula passing through the obtained N pieces of data (x, z) is obtained, and a coefficient of x 3 = W / (6EI)
The Young's modulus E is calculated from the value of. More specifically, a minimum of 2
The Young's modulus E is calculated by the following formula using the power approximation method.
【００３８】[0038]
【数３】 [Equation 3]
【００３９】この方法で求めた撓み曲線を図５の実線で
示す。原点付近では、データは曲線の上下にばらついて
いるが、ｘ＝２〜３ｍｍの範囲では、データは曲線上に
乗っていて、紙葉２０の撓みは、理論曲線と合っている
ことが分かる。式から求めたヤング率は、３．５ＧＰ
ａとなる。The deflection curve obtained by this method is shown by the solid line in FIG. In the vicinity of the origin, the data are scattered above and below the curve, but in the range of x = 2 to 3 mm, the data is on the curve, and it can be seen that the deflection of the paper sheet 20 matches the theoretical curve. Young's modulus calculated from the formula is 3.5 GP
a.
【００４０】このように、撓み量の測定値と、それから
求めた撓み曲線を比較することで、測定対象物の撓み
が、撓みの理論に当てはまっているかどうかをチェック
することができる。As described above, by comparing the measured value of the bending amount with the bending curve obtained from the measured value, it is possible to check whether the bending of the object to be measured fits the theory of bending.
【００４１】上記のように、本実施例では、紙葉２０を
梁状に支持し、紙葉２０の延在方向に対して垂直方向に
荷重を印加して撓み量を検出するため、支持位置におい
て紙葉２０に滑りが発生することを防止できると共に支
持位置付近における応力や歪みの異常発生をも防止でき
る。As described above, in the present embodiment, the paper sheet 20 is supported in a beam shape, and a load is applied in the direction perpendicular to the extending direction of the paper sheet 20 to detect the amount of bending, so that the support position In this case, it is possible to prevent the paper sheet 20 from slipping, and to prevent an abnormal occurrence of stress or strain near the supporting position.
【００４２】従って、検出する撓み量には、測定装置の
変位等の測定装置に起因する誤差が含まれず、印加荷重
と検出した撓み量に基づいて求めるヤング率の精度を向
上させることができる。また、測定装置に起因する誤差
を補正するための操作が不要で、ヤング率を簡便に測定
することができる。Therefore, the amount of deflection detected does not include an error caused by the measuring device, such as the displacement of the measuring device, and the accuracy of the Young's modulus obtained based on the applied load and the detected amount of deflection can be improved. In addition, the operation for correcting the error caused by the measuring device is not necessary, and the Young's modulus can be easily measured.
【００４３】また、撓み量の測定値と、それから求めた
撓み曲線を比較することで、紙葉２０の撓み量が、撓み
の理論に当てはまっているかどうかをチェックすること
ができるので、求めたヤング率の妥当性をチェックする
ことができる。Further, by comparing the measured value of the bending amount with the bending curve obtained from the measured value, it is possible to check whether the bending amount of the paper sheet 20 is in accordance with the bending theory. You can check the adequacy of the rate.
【００４４】また、片持ち状に支持された紙葉２０の自
由端に荷重を印加するため、紙葉２０に印加する荷重を
数十ｇｆと小さな値とすることができる。このため、Ｚ
軸ステージ２５、ロードセル２４、荷重印加部２３とか
らなる荷重印加手段、及び、紙葉取付台２１、押さえ板
２２とからなる支持手段を小型化でき、測定装置を小型
化することができる。Further, since the load is applied to the free end of the paper sheet 20 supported in a cantilever manner, the load applied to the paper sheet 20 can be as small as several tens of gf. Therefore, Z
The load applying means including the shaft stage 25, the load cell 24, and the load applying section 23, and the supporting means including the paper sheet mounting base 21 and the pressing plate 22 can be downsized, and the measuring apparatus can be downsized.
【００４５】また、印加荷重が数十ｇｆでよいので、ロ
ードセル２４には高感度のものを使用することができ、
印加荷重をより正確に検出することができ、ヤング率を
より正確に測定することができる。Further, since the applied load may be several tens of gf, it is possible to use a highly sensitive load cell 24,
The applied load can be detected more accurately, and the Young's modulus can be measured more accurately.
【００４６】また、紙葉２０の撓み量をレーザ変位計２
７により非接触で直接測定するので、より正確にヤング
率を測定することができる。Further, the deflection amount of the paper sheet 20 is measured by the laser displacement meter 2
7, the Young's modulus can be measured more accurately because it is directly measured without contact.
【００４７】なお、Ｘ軸ステージの位置データを出力す
るＸ軸ステージ位置検出部と、データ処理部とを設け、
Ｘ軸ステージの位置データ、及び変位表示部３０が出力
する撓み量ｚをデータ処理部に入力し、データ処理部
が、撓み曲線、及びヤング率を算出する構成とすること
も可能である。An X-axis stage position detector for outputting the X-axis stage position data and a data processor are provided.
The position data of the X-axis stage and the deflection amount z output by the displacement display unit 30 may be input to the data processing unit, and the data processing unit may calculate the deflection curve and Young's modulus.
【００４８】また、本実施例では、紙葉２０を片持ち梁
として支持し、荷重を印加する構成であるが、両持ち梁
等の片持ち梁以外の方法で紙葉２０を支持する構成とす
ることも可能である。In this embodiment, the paper sheet 20 is supported as a cantilever to apply a load, but the paper sheet 20 is supported by a method other than the cantilever such as a double-supported beam. It is also possible to do so.
【００４９】なお、本発明においては、測定対象物は紙
葉類に限られるものではなく、金属や木材等の他の素材
についても同様の方法でヤング率を測定することができ
る。In the present invention, the object to be measured is not limited to paper sheets, and the Young's modulus of other materials such as metal and wood can be measured by the same method.
【００５０】[0050]
【発明の効果】上述の如く、請求項１の発明によれば、
測定装置の変位等の測定装置に起因する誤差が生じず、
誤差を補正するための操作が不要であり、また、求めた
ヤング率の妥当性をチェックすることができるため、簡
便にかつ正確にヤング率を測定することができる等の特
長を有する。As described above, according to the invention of claim 1,
No error caused by the measuring device such as displacement of the measuring device occurs,
Since the operation for correcting the error is unnecessary and the validity of the obtained Young's modulus can be checked, the Young's modulus can be easily and accurately measured.
【００５１】請求項２の発明によれば、測定対象物に印
加する荷重が数十ｇｆでよいため、測定装置を小型化す
ることができる。According to the second aspect of the present invention, since the load applied to the object to be measured may be several tens of gf, the measuring device can be downsized.
【００５２】請求項３の発明によれば、非接触で正確な
撓み量を測定することができるため、ヤング率をより正
確に測定することができる。According to the third aspect of the present invention, the flexure amount can be accurately measured in a non-contact manner, so that the Young's modulus can be measured more accurately.
【図１】本発明の一実施例の構成図である。FIG. 1 is a configuration diagram of an embodiment of the present invention.
【図２】本発明の一実施例の要部の平面図である。FIG. 2 is a plan view of an essential part of an embodiment of the present invention.
【図３】本発明の一実施例の要部の正面図である。FIG. 3 is a front view of a main part of an embodiment of the present invention.
【図４】ヤング率の測定原理図である。FIG. 4 is a principle diagram of Young's modulus measurement.
【図５】撓みの測定例を示す図である。FIG. 5 is a diagram showing an example of measurement of deflection.
【図６】従来のヤング率測定装置の構成図である。FIG. 6 is a configuration diagram of a conventional Young's modulus measuring device.
【図７】従来装置による荷重−変形特性の例を示す図で
ある。FIG. 7 is a diagram showing an example of load-deformation characteristics of a conventional device.
２０ 紙葉 ２１ 紙葉取付台 ２２ 押さえ板 ２３ 荷重印加部 ２４ ロードセル ２５ Ｚ軸ステージ ２６ ロードセルアンプ ２７ レーザ変位計 ２８ Ｘ軸ステージ ２９ 原点 ３０ 変位表示部 ４１ マイクロメータ 20 paper leaf 21 paper leaf mount 22 pressing plate 23 load applying section 24 load cell 25 Z-axis stage 26 load cell amplifier 27 laser displacement meter 28 X-axis stage 29 origin 30 displacement display section 41 micrometer
Claims (5)
持手段（２１、２２）と、 該測定対象物（２０）の延在方向に対し垂直方向に荷重
を印加する荷重印加手段（２３、２４、２５）と、 該印加荷重を検出する印加荷重検出手段（２４）と、 該測定対象物の所定位置における撓み量を検出する撓み
検出手段（２７、２８）とより構成され、 前記印加荷重と前記撓み量に基づいて前記測定対象物の
ヤング率を求めることを特徴とするヤング率測定装置。1. A support means (21, 22) for supporting the measurement object (20) in a beam shape, and a load applying means for applying a load in a direction perpendicular to the extending direction of the measurement object (20). 23, 24, 25), applied load detection means (24) for detecting the applied load, and deflection detection means (27, 28) for detecting the amount of deflection of the measurement object at a predetermined position, A Young's modulus measuring device, characterized in that the Young's modulus of the object to be measured is obtained based on the applied load and the amount of bending.
対象物（２０）を片持ち梁状に支持し、前記荷重印加手
段（２３、２４、２５）は該片持ち梁の自由端に荷重を
印加することを特徴とする請求項１記載のヤング率測定
装置。2. The supporting means (21, 22) supports the measuring object (20) in a cantilever shape, and the load applying means (23, 24, 25) is provided at a free end of the cantilever. The Young's modulus measuring device according to claim 1, wherein a load is applied.
変位計であることを特徴とする請求項１又は２記載のヤ
ング率測定装置。3. The Young's modulus measuring device according to claim 1 or 2, wherein the deflection detecting means (27) is a non-contact type displacement meter.
定対象物（２０）の延在方向に対し垂直方向に荷重を印
加し、このときの該測定対象物（２０）の所定位置にお
ける撓み量を検出し、前記印加荷重と前記撓み量に基づ
いて該測定対象物（２０）のヤング率を求めることを特
徴とするヤング率測定方法。4. The measurement target (20) is supported in a beam shape, and a load is applied in a direction perpendicular to the extending direction of the measurement target (20), and the measurement target (20) is predetermined at this time. A Young's modulus measuring method characterized by detecting a bending amount at a position and obtaining a Young's modulus of the measurement object (20) based on the applied load and the bending amount.
支持し、該片持ち梁の自由端に荷重を印加することを特
徴とする請求項４記載のヤング率測定方法。5. The Young's modulus measuring method according to claim 4, wherein the object to be measured (20) is supported in a cantilever shape, and a load is applied to a free end of the cantilever.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16622092A JPH063236A (en) | 1992-06-24 | 1992-06-24 | Measuring device for young's modulus and measuring method for young's modulus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16622092A JPH063236A (en) | 1992-06-24 | 1992-06-24 | Measuring device for young's modulus and measuring method for young's modulus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH063236A true JPH063236A (en) | 1994-01-11 |
Family
ID=15827344
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16622092A Withdrawn JPH063236A (en) | 1992-06-24 | 1992-06-24 | Measuring device for young's modulus and measuring method for young's modulus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH063236A (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008039618A (en) * | 2006-08-07 | 2008-02-21 | Saitama Daiichi Seiyaku Kk | Flexibility measuring method and pasting agent |
| JP2009053058A (en) * | 2007-08-27 | 2009-03-12 | Kochi Prefecture Sangyo Shinko Center | Method of measuring young's modulus |
| CN102353593A (en) * | 2011-05-31 | 2012-02-15 | 哈尔滨工业大学 | Device for measuring young modulus by doppler vibrating mirror sinusoidal modulation multi-beam laser heterodyne and method thereof |
| CN104034574A (en) * | 2014-06-03 | 2014-09-10 | 东南大学 | Structure and method for testing Young modulus of polycrystalline silicon thin film material |
| CN104034584A (en) * | 2014-06-03 | 2014-09-10 | 东南大学 | Young modulus testing structure and method for thin film material |
| CN104568606A (en) * | 2015-01-08 | 2015-04-29 | 东南大学 | Structure for testing Young modulus of thick film silicon material on insulating substrate |
| CN104897474A (en) * | 2015-06-11 | 2015-09-09 | 湖南城市学院 | Experiment instrument for measuring Young's modulus of metal wire according to direct laser method |
| CN108303319A (en) * | 2018-02-09 | 2018-07-20 | 桂林电子科技大学 | The Young's modulus automatic testing equipment of harness |
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-
1992
- 1992-06-24 JP JP16622092A patent/JPH063236A/en not_active Withdrawn
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008039618A (en) * | 2006-08-07 | 2008-02-21 | Saitama Daiichi Seiyaku Kk | Flexibility measuring method and pasting agent |
| JP2009053058A (en) * | 2007-08-27 | 2009-03-12 | Kochi Prefecture Sangyo Shinko Center | Method of measuring young's modulus |
| CN102353593A (en) * | 2011-05-31 | 2012-02-15 | 哈尔滨工业大学 | Device for measuring young modulus by doppler vibrating mirror sinusoidal modulation multi-beam laser heterodyne and method thereof |
| AU2015202905B2 (en) * | 2014-05-28 | 2020-06-18 | Opal Packaging Australia Pty Ltd | A method and apparatus |
| CN104034574A (en) * | 2014-06-03 | 2014-09-10 | 东南大学 | Structure and method for testing Young modulus of polycrystalline silicon thin film material |
| CN104034584A (en) * | 2014-06-03 | 2014-09-10 | 东南大学 | Young modulus testing structure and method for thin film material |
| CN104568606A (en) * | 2015-01-08 | 2015-04-29 | 东南大学 | Structure for testing Young modulus of thick film silicon material on insulating substrate |
| CN104568606B (en) * | 2015-01-08 | 2017-06-16 | 东南大学 | Thick film silicon materials Young's modulus test structure in dielectric substrate |
| CN104897474A (en) * | 2015-06-11 | 2015-09-09 | 湖南城市学院 | Experiment instrument for measuring Young's modulus of metal wire according to direct laser method |
| CN108303319A (en) * | 2018-02-09 | 2018-07-20 | 桂林电子科技大学 | The Young's modulus automatic testing equipment of harness |
| CN108303319B (en) * | 2018-02-09 | 2023-09-15 | 桂林电子科技大学 | Young modulus automatic testing device for wire harness |
| ES2798200A1 (en) * | 2019-06-07 | 2020-12-09 | Seddi Inc | Device for measuring the fall of a laminar material (Machine-translation by Google Translate, not legally binding) |
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