JPH06223527A - Cd-r disk defect inspector - Google Patents

Abstract

PURPOSE:To certainly detect a defect of a disk and to ensure the quality of the disk by making a group level of an RF signal for detecting a defective part as disturbance of the signal 100% and generating a defective signal based on slice levels set for 80-90% and 110-120% respectively. CONSTITUTION:In the defect inspector equipped with a defect detecting circuit for detecting a defect of a CD-R disk as the disturbance of the RF signal, a slide level generating circuit 14 is composed of an LPF 15 into which a group output of the RF signal is inputted and amplifiers 16a and 16b for generating a 1st slice level SL and a 2nd slice level SH. When the group level GL is set for 100%, the slice level SL set for the level of 80-90% is given by the amplifier 16b, while the slice level SH set for the level of 110-120% is given by the amplifier 16a. By generating the defective signal based on these levels, a defect of the CD-R disk is certainly detected.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a CD-R disk defect inspection machine.

[0002]

2. Description of the Related Art FIG. 16 shows an example of the structure of a reproducing apparatus connected to a defect inspection machine for CD-R discs. C
The D-R disc 1 is adapted to be rotated on the turntable 2. Now, the laser beam emitted from the semiconductor laser 3 passes through the polarization beam splitter 4 and the λ / 4 plate 5 and enters the objective lens 7 held by the objective lens actuator 6, whereby the CD-R disc 1 It is focused and illuminated on the surface. The reflected light from the disk surface passes through the objective lens 7 and the λ / 4 plate 5 again, is reflected by the polarization beam splitter 4, and is detected by the photodetector 8. This photodetector 8 photoelectrically converts it to obtain an RF signal, which is then amplified by an amplifier 9 to be processed as a disc defect detection signal.

In the CD-R disc 1 as described above, defects on the recording surface of the disc, which occur during its production, and
As a method for inspecting a scratch on the substrate surface, there are a conventional method by visual observation in a process, and a method using a flaw defect inspection machine having a diameter larger than that of a focus beam used for actual recording / reproducing, for example, about φ1 mm. . In this case, in the visual inspection method, the optical disk is irradiated with a strong light source such as a surface inspection lamp and the reflected light is observed. If a defective portion is viewed through a polarizing plate to make it easier to see, it becomes easier to detect. In the defect inspection method, for example, a He—Ne laser light source is used as a light source, and the laser light source is focused on the recording surface of the optical disc by using an objective lens. This reflected light is photoelectrically converted by a photo detector to electrically detect the disturbance of the reflected light amount due to the defect.

[0004]

In the conventional inspection method,
The defect of the optical disk was detected by visual inspection or a defect inspection machine (using a focus beam having a large diameter), but this method has an advantage that the defect can be inspected in a short time.
However, in the CD-R disc, the defect length in which an error occurs is several μm, whereas in the visual inspection, although there are individual differences, the resolution is in the unit of several hundred μm, and in the flaw defect inspection, the focus beam diameter is about 1 mm. At the time, a few 10μ
The resolution is in m units. Therefore, a visual inspection or a defect inspection machine is not sufficient as the resolution of the defect inspection.

Further, in practical use of a CD-R disc, a CU error (error that cannot be corrected) occurs in a burst defect of about 100 μm, but CU is generated by collecting several tens of defects of about several μm per second. There may be an error. For this reason, when using a CD-R disc as a data file, the quality of the CD-R disc cannot be guaranteed without using a defect inspection machine of several μm.
When such a CU error occurs, a fatal error occurs in which the error cannot be corrected by the EFM modulation used in the CD format and the data cannot be reproduced correctly.

[0006]

According to a first aspect of the present invention, a CD-R disc (recordable / reproducible disc) is irradiated with a laser beam to produce a disc recording surface, which is generated in the production of the CD-R disc. In a CD-R disk defect inspection machine equipped with a defect detection circuit for detecting a defect portion due to a scratch on a substrate as a disturbance of an RF signal (reproduction signal), when the groove level in the RF signal is set to 100%, the CD On the other hand, two slice levels, a first slice level set to a level of 80 to 90% and a second slice level set to a level of 110 to 120% with respect to the 100%, are arranged, and these two slice levels are arranged. Defect signal generating means for generating a defect signal from the RF signal based on the slice level is provided.

According to a second aspect of the invention, in the first aspect of the invention, the groove output of the RF signal is input 1
Slice level generating means having a low-pass filter of 00 KHz or less and an amplifier connected to the low-pass filter for generating a predetermined first slice level and second slice level is provided.

According to a third aspect of the invention, in the first aspect of the invention, there is provided a defect number detecting means for counting the defect signal with a universal counter and calculating the number of defects every second.

According to a fourth aspect of the present invention, in the first aspect of the present invention, a defect length pulse signal generating means for generating a defect length pulse signal by ORing the defect signal and the reference clock pulse signal is provided, and the reference clock is provided. Pulse frequency f
(Hz) and the disk linear velocity is V (m / s), the defect length pulse signal is counted by a universal counter, and the total defect length per second is calculated from the pulse number P of the counted defect length pulse signal. A total defect length calculating means for calculating L by L = (P / f) * V (m) is provided.

According to the invention of claim 5, in the invention of claim 4, the frequency f (H
The relationship between z) and the disk linear velocity V (m / s) was set to be f = V / n (n = 1, 2 ...).

According to a sixth aspect of the present invention, in the fourth aspect of the present invention, a binary counter that counts the defect length pulse signal is compared with a count value set as a burst error to detect a burst error. And a burst error detecting means having a comparator.

According to a seventh aspect of the present invention, in the sixth aspect of the invention, the comparator has a first comparator in which a count value corresponding to a defect length of 10 μm is set in order to detect a burst error, and a burst error. For the purpose of detection, the second comparator is composed of a second comparator in which a count value corresponding to a defect length of 100 μm is set.

According to an eighth aspect of the invention, in the sixth aspect of the invention, a burst error defect number calculating means for counting the burst error signal with a universal counter and calculating the number of burst error defects per second is provided.

According to a ninth aspect of the present invention, in the first aspect of the invention, a universal counter for simultaneously calculating defect data such as the defect number, the total defect length, and the burst error number, and the calculated defect data for every second. The editing means for editing and the defect data displaying means for displaying the edited defect data on the screen are provided.

According to a tenth aspect of the present invention, in the first aspect of the present invention, a universal counter for simultaneously calculating defect data of the number of defects, total defect length, and number of burst errors, and the calculated defect data every second. Editing means for editing, a memory for storing the edited defect data, and a burst error number, a total defect length, for each recording area of the memory, the defect data after the disk inspection is completed,
Defect data printing means for printing the average defect length, the total number of defects, and the defect rate are provided.

[0016]

According to the present invention, the two slice levels are set for the groove level.
It is possible to reliably detect a defect on the disk.

According to the third aspect of the present invention, by counting the number of defects in the detected defect signal using the universal counter, the number of defects can be accurately calculated.

In the inventions of claims 4 and 5, since the disk linear velocity and the reference clock pulse frequency are properly combined, the defect length can be accurately calculated.

According to the present invention, the burst error value is accurately set, and the pulse of the burst error signal is generated by comparing with the counter and the comparator, so that the burst error is accurately detected. It becomes possible to do.

According to the ninth aspect of the present invention, the inspection data can be promptly known by monitoring the defect data during the inspection, and thus it is possible to judge the quality on the spot.

According to the tenth aspect of the present invention, since the defect data can be analyzed in detail, the defect quality of the CD-R disc can be guaranteed for each disc.

[0022]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the invention described in claims 1 and 2 is shown in FIGS.
It will be described with reference to FIG. The description of the same parts as those in the conventional technique (see FIG. 16) will be omitted, and the same reference numerals will be used for the same parts.

1A and 1B show RF signals 10 to C.
3 shows the arrangement of slice levels for detecting a defective portion of the D-R disc 1 (a scratch on the disc recording surface or the substrate surface that occurs when the CD-R disc 1 is manufactured). in this case,
In FIG. 1A, when the groove level GL in the RF signal 10 is set to 100%, the range A of the slice level SL as the first slice level for detecting the defective portion a in the region where the reflected light amount decreases due to the defect. 80 to 90
%, And the range B of the slice level SH as the second slice level for detecting the defective portion b in the region where the amount of reflected light increases due to the defect is set to 110 to 120%. That is, it was set within the range of 80% ≦ A ≦ 90% 110% ≦ B ≦ 120%. Then, the value of the defect signal DF obtained from such two slice levels SL and SH has a waveform as shown in FIG. The values of the slice levels SL and SH are set from the point that the defect length detected by the present embodiment and the defect length measured by microscope observation are substantially the same.

FIG. 2 shows the slice level S as described above.
A defect signal generation circuit 11 as defect signal generation means for generating a defect signal DF from the RF signal 10 based on L and SH.
It shows the configuration of. This defect signal generation circuit 11
Is the two comparators 12a and 12b and the OR circuit 1
It is composed of 3 and 3.

FIG. 3 shows the configuration of the slice level generating circuit 14 as a slice level generating means for generating the slice levels SL and SH. The slice level generation circuit 14 includes a low-pass filter 15 to which the groove output of the RF signal 10 is input, and amplifiers 16a and 16b which are connected to the low-pass filter 15 and generate a predetermined slice level SL and slice level SH. ing. In this case, the low pass filter 15 is 100KH
The amplifier 16a has a characteristic of z or less, is 1.1 times when B = 110% (1.2 times when B = 120%), and the amplifier 16b is 0.9 times when A = 90%. Double (0.8 times when A = 80%) is set. This slice level S
By generating L and SH from the RF signal, occurrence of erroneous defect detection due to low frequency fluctuation due to reflected light from the disk is prevented. Therefore, by using the defect signal generation circuit 11 and the slice level generation circuit 14 as described above and setting the slice levels SL and SH,
It is possible to reliably detect a defect in the CD-R disc 1.

Next, an embodiment of the invention described in claims 3 to 8 will be described with reference to FIGS. The description of the same parts as those of the first and second aspects of the present invention is omitted, and the same parts are denoted by the same reference numerals.

FIG. 4 is a block diagram showing the system configuration of the present invention. This system includes a CD-R player 17 (see FIG. 16 described above) equipped with the CD-R disc 1.
(Corresponding to the playback device) and R detected from this
Defect detection circuit 18 that sends an F signal to detect defects
And a universal counter 19 to which a defect signal DF or the like is sent from the defect detection circuit 18 and a computer 20 which performs arithmetic processing or the like based on the defect data sent from the universal counter 19.

FIG. 5 shows the internal structure of the defect detection circuit 18. The defect signal DF detected by the defect signal generation circuit 11 of FIG.
It is counted in 9 and sent to the computer 20, so that the number of defects per second can be calculated by using a defect number detecting means (not shown). Therefore, by counting the number of defects with the universal counter 19 in this manner, the number of defects can be accurately calculated.

Further, the defect signal DF is inputted to the AND circuit 21 as the defect length pulse signal generating means together with the reference clock pulse signal CLK, and the logical sum is taken to generate the defect length pulse signal LG. FIG. 6 (a)-
(C) shows a defect signal DF and a reference clock pulse signal CL
The relationship between K and the defect length pulse signal LG is shown.

When the frequency of the reference clock pulse signal CLK is f (Hz) and the disk linear velocity is V (m / s), the defect length pulse signal LG is counted by the universal counter 19. Then, by sending the counted number P of the counted defect length pulse signal LG to the computer 20, the total defect length L every second is calculated by using a total defect length calculation means (not shown): L = (P / f) It can be calculated by * V (m). However, even if the relationship between the frequency f (Hz) of the reference clock pulse signal CLK and the disk linear velocity V (m / s) is set to be f = V / n (n = 1, 2 ...) Good.

As an example, when the disc linear velocity V = 1.4 m / s and f = 5 MHz of the CD-R disc 1, the minimum resolution of the defect side length is 0.28 μm. Therefore, f = 2
MHz, using a minimum resolution of 0.7 μm,
If the number of counts when the universal counter 19 is counted for a certain period of time is P, the total defect length during that period is m.
× 0.7 μm. Therefore, the defect length can be accurately calculated by appropriately combining the disk linear velocity and the frequency of the reference clock pulse signal CLK in this way.

Next, a method of detecting the number of burst error occurrences will be described based on the defect detection circuit 18 of FIG. Here, in order to determine whether or not the defect of each CD-R disc 1 is a burst defect, the shift register 22 is used and the timing is adjusted with the reference clock pulse signal CLK. A binary counter 23 that counts the defect length pulse signal LG is provided at the subsequent stage of the shift register 22.
a and 23b are connected. Binary counter 23
In the subsequent stage of a and 23b, a comparator 25a as a first comparator is provided via latch circuits 24a and 24b.
And a comparator 25b as a second comparator are connected. These binary counters 23a, 23
b, the latch circuits 24a and 24b, and the comparator 25
Burst error detecting means 26 are constituted by a and 25b. In the comparator 25a, a count value corresponding to a defect length of 10 μm is set in order to detect a burst error. In the comparator 25b, a count value corresponding to a defect length of 100 μm is set in order to detect a burst error.

In such a configuration, the defect signal DF is sent to the shift register 22 to cause the load signal L
It is used as D and counts the number of reference clock pulse signals CLK only while a defect (at a high level) is occurring. At the same time that the defect signal DF becomes Low level, the data of the binary counters 23a and 23b are latched by the latch circuits 24a and 24b. This latched data is compared with the set value of the burst error length set by the dip switches (DIPSW) 27a, 27b in the comparators 25a, 25b, and if it is equal to or larger than the set value, two pulses from the comparators 25a, 25b,
That is, the burst error signal BRS1 and the burst error signal BRS2 are generated. Further, at the same time when the defect signal DF becomes Low level, the binary counter 23
a and 23b are reset and stand by in the state of waiting for the next defect signal DF.

Here, two levels are provided as burst defects as described above. That is, the burst error signal BRS1 set to 10 μm or more and 100 μm
A burst error signal BRS2 set to m or more is provided. The reason for this is that a C1 error that occurs during EFM demodulation will occur reliably with a defect length of 10 μm or more, and a CU error that cannot be error-corrected will occur with a defect length of 100 μm or more. This defect inspection machine is for inspecting an error occurring after recording before recording, and it is necessary to detect a burst error in which the error occurs in advance.

Further, two binary counters 23a and 23b are used to detect two levels of burst errors, but the reference clock pulse signal CLK is divided into frequency dividers 28a and 23a according to the defect length to be detected respectively. The frequency is divided by 28b to generate clock pulse signals CLK1 and CLK2. FIG. 7 shows the burst error signal BRS1 for the length of the defect signal DF based on the divided clock pulse signal CLK1 and clock pulse signal CLK2.
And how the burst error signal BRS2 is generated. In this case, when the clock pulse signal CLK1 and the clock pulse signal CLK2 are counted by 4 pulses or more (4 counts or more) in each of the comparators 25a and 25b, the burst error signal B
It is set to generate RS1 and BRS2. Then, the burst error signals BRS1 and BRS2 obtained by the circuit of FIG. 5 are counted by the universal counter 19 shown in FIG. 4 and sent to the computer 20, so that every second by using a burst error defect number calculating means (not shown). The number of burst error defects can be calculated. Therefore, in the defect detection circuit 18 as described above, the burst error value is appropriately set, and the binary counters 23a and 23b and the comparator 25 are set.
Since the pulses of the burst error signals BRS1 and BRS2 are generated by comparing with a and 25b,
The burst error can be accurately detected.

Next, an embodiment of the invention described in claim 9 will be described with reference to FIGS. 4 and 8. The description of the same parts as those of the above-described inventions of claims 1 to 8 is omitted,
The same reference numerals are used for the same portions.

As shown in FIG. 4, a universal counter 19 for simultaneously calculating defect data such as the number of defects, total defect length, and number of burst errors is connected to the defect detection circuit 18 of FIG. 5 described above. 19
A computer 20 is connected to the computer 20 as an editing unit that edits the calculated defect data every second.
The computer 20 is connected to a defect data display means (not shown) for displaying the edited defect data on the screen. Further, the computer 20 includes the defect number detecting means, the total defect length calculating means, and the burst error defect number calculating means (not shown) as described above. Figure 8
3 shows an operation flow of the computer 20. C1 (i) is the number of defects, C2 (i) is the defect length, and C3 (i) is
Represents the number of BRS1 and C4 (i) represents the number of BRS2.

The operation of the system shown in FIG. 4 having such a configuration will be described with reference to the flow of FIG. The computer 20 is used as a host to operate the CD-R player 17, and in the defect detection circuit 18, the defect signal DF, the defect length pulse signal LG, and the burst error signals BRS1, BRS.
Ask for 2. Next, the universal counter 19 counts each defect data of the number of pulses of the defect number from the defect signal DF, the number of pulses of the defect length from the defect length pulse signal LG, and the number of two levels of burst error pulses from the burst error signals BRS1 and BRS2. To do. Next, the counted defect data is taken into the computer 20 every second, so that the number of defects per second, total defect length, 1
The number of burst errors of 0 μm or more and the number of burst errors of 100 μm or more are calculated, and the CRT (see FIG.
0)). When five or more burst errors of 100 μm or more occur in one second, the defect inspection is immediately stopped and the disc is judged as NG. Therefore, the inspection data can be promptly known by monitoring the defect data during the inspection in this way, and thus the quality can be determined on the spot.

Next, an embodiment of the invention described in claim 10 will be described with reference to FIG. The above-mentioned claims 1 to 9
A description of the same parts as those in the described invention is omitted, and the same parts are denoted by the same reference numerals.

In this embodiment, in the computer 20 having the system configuration shown in FIG. 4, a memory for storing the edited defect data and the number of burst error data for each recording area of the memory after the disc inspection is completed. , A total defect length, an average defect length, a total number of defects, and a defect data printing unit for printing the defect rate. Figure 9
6 shows a flow of calculating a defect list of a disk based on the taken-in data and printing it out using the defect data printing means. AVG (k) represents an average defect length, KR represents a defect rate, C1 (k) represents a burst error number of 10 μm or more, and CU (k) represents a burst error number of 100 μm or more.

The operation of this system having the above structure will be described with reference to the flow chart of FIG. The data fetched from the universal counter 19 is edited every minute, and the defect rate, the average defect length, the number of burst errors of 10 μm or more, and the number of burst errors of 100 μm or more are calculated. Even if a burst error of 100 μm or more does not occur, if the defect rate is in the order of 10 to ⁵ , there are many defects in that area, and errors may occur in the data file. Is good. Therefore,
As described above, since the defect data can be analyzed in detail, the defect quality of the disc can be sufficiently guaranteed.

Finally, the result of the defect data inspected by this defect inspection machine will be described with reference to FIGS. FIGS. 10A to 10D show the state of the defect data shown on the CRT. (A) shows the number of burst errors of 10 μm or more, (b) shows the number of burst errors of 100 μm or more, (c) shows the total defect length, (d) shows the total number of defects, and these values are displayed every second. Each is displayed on the CRT. In the CD-R disc, the recording area is an area where PCA (P
ower Calibration Area) and PMA (Program Mea), which is an area that leaves a history of already recorded data when additional recording is performed.
mory Area) and a list of recorded data (TOC: Table)
LIA (Lead In) which is an area for recording the Off Content
Area) and PA that is a data area used by the user
(Program Area) and LOA (Lead Out Area) which is an area indicating the end of the data area.

Therefore, in the present embodiment, a printout display is made as shown below. FIG. 11 shows the display of defect data in the PCA 29, in which the defect data is printed out every second and the defect rate is displayed. 12 is P
The display of the defect data of the MA 30 is shown, and the printout format is the same as the PCA 29. FIG. 13 shows a display of the defect data of the LIA 31, and the defect data is printed out every 10 seconds. FIG. 14 shows a display of the defect data of the PMA 32, and the defect data is printed out every minute. FIG. 15 shows a display of the defect data of the LOA 33. Due to its importance, the defect data is printed out every second in the same format as the PCA 29. Therefore, in this way C
A series of defect data in each area of the D-R disc can be displayed.

[0044]

According to the first aspect of the present invention, a CD-R disc (reproducible disc) is irradiated with a laser beam to cause a defect due to scratches on a disc recording surface or a substrate which are generated in the production of the CD-R disc. CD-provided with a defect detection circuit for detecting a portion as disturbance of an RF signal (reproduction signal)
In the R disk defect inspection machine, when the groove level in the RF signal is set to 100%, the first slice level set to 80 to 90% with respect to 100% and 110 to 120 with respect to 100%. Since two slice levels, which are the second slice level set to the% level, are arranged, and defect signal generating means for generating a defect signal from the RF signal based on these two slice levels is provided, The defect can be reliably detected.

According to a second aspect of the invention, in the first aspect of the invention, the groove output of the RF signal is input 10
Since the slice level generating means having the low-pass filter of 0 KHz or less and the amplifier connected to the low-pass filter and generating the predetermined first slice level and the predetermined second slice level is provided, it is possible to reliably detect the defect of the disk. Is something that can be done.

According to a third aspect of the present invention, in the first aspect of the present invention, the defect signal is counted by the universal counter, and the defect number detecting means for calculating the number of defects per second is provided. It can be calculated accurately.

According to a fourth aspect of the present invention, in the first aspect of the present invention, a defect length pulse signal generating means for taking a logical sum of the defect signal and the reference clock pulse signal to generate a defect length pulse signal is provided, and the reference clock is provided. The pulse frequency is f (H
z) and the disk linear velocity is V (m / s), the defect length pulse signal is counted by a universal counter, and the pulse number P of the counted defect length pulse signal is
Since the total defect length calculation means for calculating the total defect length L every second from L = (P / f) * V (m) is provided, the disc linear velocity and the reference clock pulse frequency are appropriately determined in this way. The defect length can be accurately calculated by combining with.

According to a fifth aspect of the present invention, in the invention according to the fourth aspect, the frequency f (H
z) and the disc linear velocity V (m / s) are set so that f = V / n (n = 1, 2 ...), the disc linear velocity and the reference clock pulse frequency are By properly combining and, the defect length can be accurately calculated.

According to a sixth aspect of the invention, in the fourth aspect of the invention, a binary counter for counting the defect length pulse signal is compared with a count value set as a burst error to detect a burst error. By providing the burst error detection means having a comparator for, by generating a pulse of the burst error signal based on the burst error value set appropriately,
The burst error can be accurately detected.

According to a seventh aspect of the present invention, in the sixth aspect of the invention, the comparator has a first comparator in which a count value corresponding to a defect length of 10 μm is set in order to detect a burst error, and a burst error. Since it is composed of a second comparator in which a count value corresponding to a defect length of 100 μm is set for detection, by generating a pulse of a burst error signal based on a burst error value set appropriately, The burst error can be accurately detected.

According to the invention described in claim 8, in the invention described in claim 6, a burst error defect number calculating means for counting the burst error signal with a universal counter and calculating the number of burst error defects every second is provided. The burst error can be accurately detected by generating the pulse of the burst error signal based on the burst error value set appropriately.

According to a ninth aspect of the present invention, in the first aspect of the invention, a universal counter for simultaneously calculating defect data of the number of defects, total defect length, and number of burst errors, and the calculated defect data for every second. Since the edit means for editing and the defect data display means for displaying the edited defect data on the screen are provided, the inspection data can be quickly known by monitoring the defect data during the inspection. Therefore, the quality can be judged on the spot.

According to a tenth aspect of the invention, in the invention of the first aspect, a universal counter for simultaneously calculating defect data such as the number of defects, the total defect length, and the number of burst errors, and the calculated defect data every second. An editing unit for editing, a memory for storing the edited defect data, and a burst error number, a total defect length, an average defect length, and a total defect number for each recording area of the memory after the disk inspection is completed, Since the defect data printing means for printing the defect rate is provided, the defect data can be analyzed in detail, whereby the defect quality of the CD-R disc can be sufficiently guaranteed.

[Brief description of drawings]

FIG. 1 is a waveform diagram showing an arrangement of slice levels for detecting a defect from an RF signal, which is an embodiment of the present invention, and a defect signal obtained by the slice level.

FIG. 2 is a circuit diagram showing a configuration of a defect signal generation circuit that generates a defect signal.

FIG. 3 is a block diagram showing a configuration of a slice level generation circuit.

FIG. 4 is a block diagram showing a configuration of the present system.

FIG. 5 is a block diagram showing a configuration of a defect detection circuit.

FIG. 6 is a waveform diagram showing a timing chart.

FIG. 7 is a waveform diagram showing a timing chart.

FIG. 8 is a flowchart showing an operation flow of a computer.

FIG. 9 is a flowchart showing an operation flow for printing out a list of defect data.

FIG. 10 is a characteristic diagram showing defect data displayed on a CRT.

FIG. 11 is a characteristic diagram showing defect data of a PCA portion.

FIG. 12 is a characteristic diagram showing defect data of a PMA portion.

FIG. 13 is a characteristic diagram showing defect data of an LIA portion.

FIG. 14 is a characteristic diagram showing defect data of a PA section.

FIG. 15 is a characteristic diagram showing defect data of a LOA part.

FIG. 16 is a configuration diagram showing a configuration of a CD-R disc reproducing apparatus.

[Explanation of symbols]

 1 CD-R disk 11 Defect signal generating means 14 Slice level generating means 15 Low pass filter 16a, 16b Amplifier 19 Universal counter 20 Editing means 21 Defect length pulse signal generating means 23a, 23b Binary counter 25a First comparator 25b Second comparator 26 Burst Error detecting means SL First slice level SH Second slice level LG Defect length pulse signal CLK Reference clock pulse signal DF Defect signal BRS1, BRS2 Burst error signal

Claims (10)

[Claims] 1. A CD-R disc (recordable / reproducible disc) is irradiated with a laser beam to produce a CD-R disc.
In a CD-R disk defect inspection machine equipped with a defect detection circuit for detecting a defect portion due to scratches on a disk recording surface or a substrate which is generated in manufacturing an R disk as disturbance of an RF signal (reproduction signal), a groove level in the RF signal 1
When set to 00%, the first slice level set to a level of 80 to 90% relative to this 100% and the 100%
And a second slice level set to a level of 110 to 120% with respect to, and a defect signal generating means for generating a defect signal from the RF signal based on these two slice levels. A CD-R disk defect inspection machine characterized by being provided. 2. A groove output of an RF signal is input 1
The slice level generating means having a low-pass filter of 00 kHz or less and an amplifier connected to the low-pass filter for generating a predetermined first slice level and second slice level is provided.
D-R disk defect inspection machine. 3. The CD-recording device according to claim 1, further comprising defect number detecting means for counting defect signals by a universal counter and calculating the number of defects per second.
R disk defect inspection machine. 4. A defect length pulse signal generating means for generating a defect length pulse signal by ORing the defect signal and the reference clock pulse signal is provided, and the reference clock pulse frequency is f.
(Hz) and the disk linear velocity is V (m / s), the defect length pulse signal is counted by a universal counter, and the total defect length per second is calculated from the pulse number P of the counted defect length pulse signal. 2. The CD-R disk defect inspection machine according to claim 1, further comprising total defect length calculation means for calculating L by L = (P / f) * V (m). 5. The frequency f (H of the reference clock pulse signal
5. The CD-R according to claim 4, wherein the relationship between z) and the linear velocity V (m / s) of the disk is set to be f = V / n (n = 1, 2 ...). Disk defect inspection machine. 6. A burst error detecting means having a binary counter for counting a defect length pulse signal and a comparator for comparing the count value with a count value set as a burst error to detect a burst error is provided. The CD-R disk defect inspection machine according to claim 4, which is characterized in that. 7. A first comparator having a count value corresponding to a defect length of 10 μm for detecting a burst error and a count value corresponding to a defect length of 100 μm for detecting a burst error. 7. The CD-R disk defect inspection machine according to claim 6, comprising a set second comparator. 8. A CD-R disk defect according to claim 6, further comprising a burst error defect number calculating means for counting the burst error signal with a universal counter and calculating the number of burst error defects per second. Inspection machine. 9. A universal counter for simultaneously calculating defect data such as defect number, total defect length and burst error number, editing means for editing the calculated defect data every second, and a screen for displaying the edited defect data. 2. The CD-R disk defect inspection machine according to claim 1, further comprising defect data display means displayed above. 10. A universal counter for simultaneously calculating defect data such as defect number, total defect length, and burst error number, editing means for editing the calculated defect data every second, and storing the edited defect data. Memory, and the defective data after completion of the disk inspection for each recording area of the memory, the number of burst errors, the total defect length,
The CD according to claim 1, further comprising defect data printing means for printing an average defect length, a total number of defects, and a defect rate.
-R disk defect inspection machine.