JPH0590347U - Insulation thin film hardness measuring device - Google Patents

Insulation thin film hardness measuring device

Info

Publication number
JPH0590347U
JPH0590347U JP7299191U JP7299191U JPH0590347U JP H0590347 U JPH0590347 U JP H0590347U JP 7299191 U JP7299191 U JP 7299191U JP 7299191 U JP7299191 U JP 7299191U JP H0590347 U JPH0590347 U JP H0590347U
Authority
JP
Japan
Prior art keywords
film
conductive
needle
load cell
load
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7299191U
Other languages
Japanese (ja)
Inventor
和彦 柴田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Stanley Electric Co Ltd
Original Assignee
Stanley Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Stanley Electric Co Ltd filed Critical Stanley Electric Co Ltd
Priority to JP7299191U priority Critical patent/JPH0590347U/en
Publication of JPH0590347U publication Critical patent/JPH0590347U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】 【目的】この考案は、絶縁薄膜の硬度を数値化する絶縁
薄膜の硬度測定装置である。 【構成】導電性膜3上に絶縁膜4を塗布した被測定物A
を載置するステージ1に、ほぼ垂直にエアシリンダ7を
配置し、該エアシリンダ7のロッド72下端にロードセ
ル5を装着すると共に、該ロードセル5にはほぼ垂直に
導電性針6を取付け、かつ前記ロードセル5と導電性針
6と導電性膜3とを検出器8に接続し、該導電性針6を
絶縁膜4につき立てて荷重をかけ、導電性膜3と導電性
針6との電気信号を検出して膜の破壊点を検出器8で検
出し、該膜の耐荷重を測定する構成にされている。
(57) [Abstract] [Purpose] The present invention is an insulating thin film hardness measuring device that digitizes the hardness of an insulating thin film. [Structure] A device under test A in which an insulating film 4 is coated on a conductive film 3
The air cylinder 7 is arranged substantially vertically on the stage 1 on which the load cell 5 is mounted, the load cell 5 is attached to the lower end of the rod 72 of the air cylinder 7, and the conductive needle 6 is attached substantially vertically to the load cell 5. The load cell 5, the conductive needle 6 and the conductive film 3 are connected to the detector 8, the conductive needle 6 is erected on the insulating film 4 and a load is applied to the conductive film 3 and the conductive needle 6. A signal is detected to detect the breaking point of the film by the detector 8, and the withstand load of the film is measured.

Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】[Industrial applications]

この考案は、薄膜製品一般に利用される絶縁薄膜の硬度測定装置に関するもの である。 The present invention relates to an insulating thin film hardness measuring device generally used for thin film products.

【0002】[0002]

【従来の技術】[Prior Art]

従来における絶縁薄膜の硬度測定は、基板上に塗布、形成された絶縁膜をカッ ター等を用いてこすり、傷が付くかどうかで硬度を評価している。 In the conventional measurement of hardness of an insulating thin film, the hardness is evaluated by rubbing the insulating film applied and formed on a substrate with a cutter or the like and scratching.

【0003】[0003]

【考案が解決しようとする課題】[Problems to be solved by the device]

しかし、前記従来の技術では、測定者の感に頼って絶縁膜の硬度測定を行って いるため、測定の際は個人差が出るという問題点がある。 However, in the above-mentioned conventional technique, the hardness of the insulating film is measured depending on the feeling of the measurer, and therefore, there is a problem in that there are individual differences in the measurement.

【0004】 また、定量的に測定できないため、硬度評価は数値化できないという問題点が ある。Further, there is a problem that the hardness evaluation cannot be quantified because it cannot be quantitatively measured.

【0005】 そこで、本考案は、上記従来の技術の問題点に鑑み案出されたもので、絶縁膜 の硬度を数値化する絶縁薄膜の硬度測定装置の提供を目的としている。Therefore, the present invention has been devised in view of the problems of the above-mentioned conventional techniques, and an object thereof is to provide a hardness measuring device for an insulating thin film that digitizes the hardness of the insulating film.

【0006】[0006]

【課題を解決するための手段】[Means for Solving the Problems]

上記目的を達成するために、本考案における絶縁薄膜の硬度測定装置において は、導電性膜上に絶縁膜を塗布した被測定物を載置するステージに、ほぼ垂直に エアシリンダを配置し、該エアシリンダのロッド下端にロードセルを装着すると 共に、該ロードセルにはほぼ垂直に導電性針を取付け、かつ前記ロードセルと導 電性針と導電性膜とを検出器に接続し、該導電性針を絶縁膜につき立てて荷重を かけ、導電性膜と導電性針との電気信号を検出して膜の破壊点を検出器で検出し 、該膜の耐荷重を測定する構成にされている。 In order to achieve the above object, in the insulating thin film hardness measuring apparatus according to the present invention, an air cylinder is arranged substantially vertically on a stage on which an object to be measured having an electrically conductive film coated with an insulating film is placed. A load cell is attached to the lower end of the rod of the air cylinder, and a conductive needle is attached almost vertically to the load cell, and the load cell, the conductive needle, and the conductive film are connected to a detector, and the conductive needle is attached. The insulating film is erected and applied with a load, the electric signal between the conductive film and the conductive needle is detected, the breaking point of the film is detected by a detector, and the withstand load of the film is measured.

【0007】[0007]

【作用】[Action]

被測定物をステージ上に載置した後、エアシリンダのロッドを作動させて導電 性針を徐々に降下させ、更に、薄膜に針を突き立てエアーの圧力で更に、該針に 荷重をかけてゆく。 After placing the object to be measured on the stage, operate the rod of the air cylinder to gradually lower the conductive needle, and then push the needle against the thin film and apply a load to the needle by the air pressure. go.

【0008】 この時、前記導電性針の針先と絶縁膜下の導電性部分との間に電気信号をかけ ておき、絶縁膜が該針によって破壊された時、該針と絶縁膜下の導電性部分と接 触し、両者間に信号が流れる。これを検出器で検知し、その時のロードセル(導 電性針の針先)にかかっている荷重を測定する。At this time, an electric signal is applied between the needle tip of the conductive needle and the conductive portion under the insulating film, and when the insulating film is broken by the needle, It contacts the conductive part and a signal flows between them. This is detected by the detector and the load applied to the load cell (tip of the conductive needle) at that time is measured.

【0009】[0009]

【実施例】【Example】

実施例について図1を参照して説明すると、被測定物Aは、例えばAl、Fe 等の金属板又はガラス基板2上の導電性膜(ITO等)3の表面に、絶縁膜4が 塗布されている。 An example will be described with reference to FIG. 1. An object to be measured A is a metal plate of Al, Fe, or the like, or a surface of a conductive film (ITO or the like) 3 on a glass substrate 2 coated with an insulating film 4. ing.

【0010】 前記被測定物Aを載置するステージ1には、ほぼ垂直にエアー71の供給によ り作動するエアシリンダ7が設置され、該エアシリンダ7のロッド72下端には ロードセル(荷重計)5が装着されている。An air cylinder 7 that operates by supplying air 71 substantially vertically is installed on the stage 1 on which the object to be measured A is placed, and a lower end of a rod 72 of the air cylinder 7 is a load cell (load cell). ) 5 is installed.

【0011】 また、該ロードセル5には、ほぼ垂直に針先0.1mmφ程度の金属の導電性 針6が取付けられている。Further, a metal conductive needle 6 having a needle tip of about 0.1 mmφ is attached to the load cell 5 almost vertically.

【0012】 検出器8は、ロードセル5、導電性針6、導電性膜3の各々に接続してあり、 該導電性膜3と導電性針6との電気信号を検出して絶縁膜4の破壊点を検出し、 該膜の耐荷重を測定するものである。The detector 8 is connected to each of the load cell 5, the conductive needle 6 and the conductive film 3, and detects an electric signal between the conductive film 3 and the conductive needle 6 to detect the insulating film 4. The breaking point is detected and the withstand load of the film is measured.

【0013】 すなわち、導電性針6の針先と絶縁膜4下の導電性部分との間に電気信号をか けておき、絶縁薄膜4が該針によって破壊された時、該針6と絶縁膜4下の導電 性部分と接触し、両者間に信号が流れるのを検知し、その時のロードセル5(導 電性針6の針先)にかかっている荷重を測定している。That is, an electric signal is placed between the needle tip of the conductive needle 6 and the conductive portion under the insulating film 4, and when the insulating thin film 4 is broken by the needle, it is insulated from the needle 6. The load is applied to the load cell 5 (needle tip of the conductive needle 6) at that time by detecting a signal flowing between the conductive portion under the membrane 4 and the conductive portion.

【0014】[0014]

【考案の効果】[Effect of the device]

本考案は、上述の通り構成されているので、従来は、測定者の評価で硬度測定 を行っていたのを、機械的に定量的に測定して数値化できる。従って、絶縁薄膜 の硬度測定は機械的に行うことができる。 Since the present invention is configured as described above, it is possible to quantify by mechanically quantitatively measuring the hardness that was conventionally measured by the measurer. Therefore, the hardness of the insulating thin film can be mechanically measured.

【0015】 また、絶縁膜の測定が定量的に測定でき数値化できるため、測定者の個人差が 出るのを解決でき、均一な測定ができる。Further, since the measurement of the insulating film can be quantitatively performed and can be converted into a numerical value, it is possible to solve the problem of individual difference of the measurer, and it is possible to perform uniform measurement.

【図面の簡単な説明】[Brief description of drawings]

【図1】本考案の装置の概略図である。FIG. 1 is a schematic view of the device of the present invention.

【符合の説明】[Explanation of sign]

1 ステージ 3 導電性膜 4 絶縁膜 5 ロードセル 6 導電性針 7 エアシリンダ 72 ロッド 8 検出器 A 被測定物 1 Stage 3 Conductive Film 4 Insulating Film 5 Load Cell 6 Conductive Needle 7 Air Cylinder 72 Rod 8 Detector A Measured Object

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】導電性膜上に絶縁膜を塗布した被測定物を
載置するステージに、ほぼ垂直にエアシリンダを配置
し、該エアシリンダのロッド下端にロードセルを装着す
ると共に、該ロードセルにはほぼ垂直に導電性針を取付
け、かつ前記ロードセルと導電性針と導電性膜とを検出
器に接続し、該導電性針を絶縁膜につき立てて荷重をか
け、導電性膜と導電性針との電気信号を検出して膜の破
壊点を検出器で検出し、該膜の耐荷重を測定して成る絶
縁膜硬度測定装置。
1. An air cylinder is disposed substantially vertically on a stage on which an object to be measured having an electrically conductive film coated with an insulating film is placed, and a load cell is attached to the lower end of the rod of the air cylinder and the load cell Attach a conductive needle almost vertically, and connect the load cell, the conductive needle, and the conductive film to a detector, and set the conductive needle on the insulating film to apply a load to the conductive film and the conductive needle. An insulation film hardness measuring device, which detects an electric signal of the film, detects a breaking point of the film with a detector, and measures a withstand load of the film.
JP7299191U 1991-08-20 1991-08-20 Insulation thin film hardness measuring device Pending JPH0590347U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7299191U JPH0590347U (en) 1991-08-20 1991-08-20 Insulation thin film hardness measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7299191U JPH0590347U (en) 1991-08-20 1991-08-20 Insulation thin film hardness measuring device

Publications (1)

Publication Number Publication Date
JPH0590347U true JPH0590347U (en) 1993-12-10

Family

ID=13505384

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7299191U Pending JPH0590347U (en) 1991-08-20 1991-08-20 Insulation thin film hardness measuring device

Country Status (1)

Country Link
JP (1) JPH0590347U (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009158266A (en) * 2007-12-26 2009-07-16 Tdk Corp Evaluation method of electrochemical element and evaluation device of electrochemical element
JP2013540275A (en) * 2010-10-22 2013-10-31 セルガード エルエルシー Penetration and / or compression test system and method
JP2014032173A (en) * 2012-07-11 2014-02-20 Nippon Soken Inc Puncture strength measuring apparatus
JP2020041819A (en) * 2018-09-06 2020-03-19 住友金属鉱山株式会社 Method for measuring hardness of sintered product, hardness measurement device, and crushability determination method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02304338A (en) * 1989-05-18 1990-12-18 Seiko Epson Corp Device for measuring electric resistance

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02304338A (en) * 1989-05-18 1990-12-18 Seiko Epson Corp Device for measuring electric resistance

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009158266A (en) * 2007-12-26 2009-07-16 Tdk Corp Evaluation method of electrochemical element and evaluation device of electrochemical element
JP2013540275A (en) * 2010-10-22 2013-10-31 セルガード エルエルシー Penetration and / or compression test system and method
JP2016176959A (en) * 2010-10-22 2016-10-06 セルガード エルエルシー Penetration and/or compression testing system and method
JP2014032173A (en) * 2012-07-11 2014-02-20 Nippon Soken Inc Puncture strength measuring apparatus
JP2020041819A (en) * 2018-09-06 2020-03-19 住友金属鉱山株式会社 Method for measuring hardness of sintered product, hardness measurement device, and crushability determination method

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