JPH05326475A - Wafer holder for cleaning and etching - Google Patents

Wafer holder for cleaning and etching

Info

Publication number
JPH05326475A
JPH05326475A JP12398092A JP12398092A JPH05326475A JP H05326475 A JPH05326475 A JP H05326475A JP 12398092 A JP12398092 A JP 12398092A JP 12398092 A JP12398092 A JP 12398092A JP H05326475 A JPH05326475 A JP H05326475A
Authority
JP
Japan
Prior art keywords
wafer
etching
cleaning
holder
wafers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP12398092A
Other languages
Japanese (ja)
Inventor
Kenichi Kamimura
賢一 上村
Tadashi Sakon
正 佐近
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP12398092A priority Critical patent/JPH05326475A/en
Publication of JPH05326475A publication Critical patent/JPH05326475A/en
Withdrawn legal-status Critical Current

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  • Weting (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To improve the uniformity of cleaning and etching operations by forming guides of a holder therefor to hold a large number of wafers in a standing position such that they are parallel with one another and slanted from the perpendicular in the same direction. CONSTITUTION:A wafer holder body consists of a pair of side panels 1 provided with a wafer supporting body 2 and a wafer support bar 6, each, and a pair of end panels 9. Each side panel 1 has two openings 5 and 8 adjacent to the respective wafer supporting body 2. The wafer supporting bodies 2 and wafer support bars 6 are provided with guides 4a and 4b to hold wafers 3. All the guides 4a and 4b are formed in a way that they are parallel with one another and slanted from the perpendicular by an angle of approx. 86.5 degrees in the same direction. Thus wafers 3, when set in the guides 4a and 4b, are slanted to the left by their weight, kept from contact with one another.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体製品の製造工程に
おいて、半導体ウェハを洗浄またはエッチングする際に
用いられる洗浄・エッチング用ウェハ保持具に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cleaning / etching wafer holder used for cleaning or etching a semiconductor wafer in a semiconductor product manufacturing process.

【0002】[0002]

【従来の技術】半導体製品の製造工程においては半導体
ウェハを洗浄したり、エッチングしたりすることが行わ
れるが、そうした処理工程では半導体ウェハを多数収容
することができる樹脂製のウェハ保持具が利用される。
例えば、特開昭61−189647号公報には、保持具
本体の内面側に対をなす細長いガイドが多数平行して設
けられていて溝を形成すると共に、本体下部にも前記ガ
イドに対応して溝が付けられたサポート部が設けられて
いて、半導体ウェハが前記ガイドとサポート部の溝内に
挿入される型式のものが開示されている。ウェハを保持
する前記溝は前記細長いガイドの長手方向および保持具
壁面に対して垂直になっているので、被保持ウェハは、
溝とウェハとのクリアランスにより若干傾くことはある
ものの、ほぼ直立しており、前記細長いガイドの長手方
向および保持具壁面に対して垂直になっている。
2. Description of the Related Art Semiconductor wafers are cleaned and etched in the manufacturing process of semiconductor products, and a resin wafer holder that can accommodate a large number of semiconductor wafers is used in such processing processes. To be done.
For example, in Japanese Unexamined Patent Publication No. 61-189647, a large number of elongated guides forming a pair are provided in parallel on the inner surface side of the holder main body to form a groove, and the lower part of the main body corresponds to the guide. There is disclosed a type in which a grooved support portion is provided and a semiconductor wafer is inserted into the groove of the guide and the support portion. Since the groove for holding the wafer is perpendicular to the longitudinal direction of the elongated guide and the wall surface of the holder, the held wafer is
Although it may be slightly inclined due to the clearance between the groove and the wafer, it is almost upright and perpendicular to the longitudinal direction of the elongated guide and the wall surface of the holder.

【0003】[0003]

【発明が解決しようとする課題】洗浄やエッチングの工
程ではウェハ保持具に半導体ウェハを収容したまま処理
液中に浸漬し、揺動させながら一定時間処理することが
行われる。前記揺動には、処理中に発生する気泡を速や
かに除いたり、ウェハ近傍の液交換を容易にする等の効
果があり、それによって前記処理の均一性が増す。とこ
ろで、特開昭61−189647号公報に記載さている
ようなウェハ保持具の場合、使用初期には形状寸法の狂
いが少ないため被洗浄ウェハはほとんど固定されている
が、何回も使用しているとウェハを保持する溝が次第に
削られてウェハを固定し難くなり、隣接するウェハ同士
が接触することすら起こる。接触すればウェハの表面に
疵がつく等の悪影響があるが、接触しないまでも被処理
ウェハの間隔がウェハ毎に異なったり、ウェハの部位に
よって異なったりすれば、洗浄やエッチングの状況が不
均一となって、揺動によっても前記処理の均一性を確保
できなくなることが起こる。
In the steps of cleaning and etching, a semiconductor wafer is kept immersed in a wafer holder and immersed in a treatment solution, and a treatment is carried out for a certain period while rocking. The swinging has effects such as promptly removing bubbles generated during processing and facilitating liquid exchange in the vicinity of the wafer, thereby increasing the uniformity of processing. By the way, in the case of the wafer holder described in Japanese Patent Laid-Open No. 61-189647, the wafer to be cleaned is almost fixed in the initial stage of use because the shape and dimension thereof are small, but it is used many times. If so, the groove for holding the wafer is gradually shaved and it becomes difficult to fix the wafer, and even adjacent wafers may come into contact with each other. If they come in contact with each other, the surface of the wafer will be damaged, but even if they do not come in contact with each other, if the intervals between the wafers to be processed are different from one wafer to another, or if they are different from one another to another, the cleaning and etching conditions will be uneven. As a result, it becomes impossible to ensure the uniformity of the processing even by the rocking.

【0004】本発明は保持されたウェハの間隔を常に一
定に保つように工夫することで前記問題点を解消し、洗
浄あるいはエッチングを効率的に行うことができる洗浄
・エッチング用ウェハ保持具を提供することを目的とす
るものである。
The present invention solves the above-mentioned problems by devising such that the distance between held wafers is always kept constant, and provides a wafer holder for cleaning / etching which can efficiently perform cleaning or etching. The purpose is to do.

【0005】[0005]

【課題を解決するための手段】本発明は、多数のウェハ
を立てた状態で保持するガイドを有するウェハの洗浄ま
たはエッチング用保持具において、前記ガイドが相互に
平行で、かつ垂直に対して同一方向に傾けて設けられて
いることを特徴とする洗浄・エッチング用ウェハ保持具
を要旨とするものである。
SUMMARY OF THE INVENTION The present invention provides a wafer cleaning or etching holder having a guide for holding a large number of wafers in an upright state, wherein the guides are parallel to each other and are the same with respect to the vertical. The gist of the present invention is a wafer holder for cleaning / etching, which is provided so as to be inclined in the direction.

【0006】[0006]

【作用】以下、図を参照しながら、本発明の具体的構成
と作用を説明する。図1、2および3は本発明の洗浄・
エッチング用ウェハ保持具の一例で、その外観図と2つ
の断面図である。図2は側断面図、図3は、図2の紙面
に垂直でかつSS’線を通る断面を表した断面図であ
る。図示されているように、ウェハ保持具本体は一対の
端板9と別の一対の側板1からなる。側板1にはウェハ
支持体2とウェハ支持棒6が取り付けられており、それ
らの隣には2つの開孔部5および8がある。ウェハ支持
体2およびウェハ支持棒6にはガイド4(a)および4
(b)が設けられており、ウェハ3を保持するためのガ
イドを形成している。互いに平行して多数個設けられた
前記ガイド4(a)、4(b)は、図2に示されている
ように、ウェハ支持棒6の長手方向D(矢印)に対して
垂直ではなく一定角度傾いており、この例ではその角度
は約86.5度(以下この角度を「傾き角度」と称す
る)である。前記ガイドと鉛直方向の成す角θは90度
から前記傾き角度を減じたもので、この例では約3.5
度である。
The specific construction and operation of the present invention will be described below with reference to the drawings. 1, 2 and 3 show the cleaning of the present invention.
It is an example of an etching wafer holder, and is an external view and two sectional views. 2 is a side sectional view, and FIG. 3 is a sectional view showing a section perpendicular to the plane of FIG. 2 and passing through the line SS ′. As shown in the figure, the main body of the wafer holder comprises a pair of end plates 9 and a pair of side plates 1 which are different from each other. A wafer support 2 and a wafer support rod 6 are mounted on the side plate 1 and adjacent to them are two openings 5 and 8. The wafer support 2 and the wafer support rod 6 have guides 4 (a) and 4
(B) is provided and forms a guide for holding the wafer 3. As shown in FIG. 2, the plurality of guides 4 (a) and 4 (b) provided in parallel with each other are not perpendicular to the longitudinal direction D (arrow) of the wafer support rod 6 but are constant. It is inclined at an angle, and in this example, the angle is about 86.5 degrees (hereinafter, this angle is referred to as a “tilt angle”). The angle θ formed by the guide and the vertical direction is 90 degrees minus the tilt angle, and is about 3.5 in this example.
It is degree.

【0007】洗浄またはエッチング前のウェハは図2に
おいてAで表される状態になっている。ガイド4
(a)、4(b)にセットされたウェハは重力によりす
べて左側に傾いており、ウェハ間隔が自然に一定になり
互いが接触することはない。これに対し、傾き角度が9
0度の従来のウェハ保持具ではウェハが左に傾いたり右
に傾いたりして一定ではないため、多数回の使用により
ガイド4(a)、4(b)が次第に削られてウェハとの
クリアランスが大きい場合には互いに接触することがあ
る。図2のような型のウェハ保持具で洗浄やエッチング
を行う際、通常、揺動は上下方向に加えられる。図2の
ウェハ保持具では下方に揺動されると洗浄またはエッチ
ング液がウェハを上方に押し上げようとするため、全て
の被保持ウェハがBの状態になる。保持具が上方に揺動
されると洗浄またはエッチング液がウエハを下方に押し
下げようとするため、全ての被保持ウェハが再びAの状
態になる。本発明の洗浄・エッチング用ウェハ保持具で
は如何に激しく揺動しても被処理ウェハの間隔は場所に
よらず常に一定方向に保持されるため、ウェハ同士が接
触して表面に疵がついたり、洗浄やエッチングの状況が
不均一になったりすることがない。これに対し、傾き角
度が90度の従来のウェハ保持具では揺動によりウェハ
が左に傾いたり右に傾いたりして一定ではないため、ウ
ェハ同士が接触して表面に疵がついたり、洗浄やエッチ
ングの状況が不均一になったりする。
The wafer before cleaning or etching is in a state indicated by A in FIG. Guide 4
The wafers set in (a) and (4) are all tilted to the left due to gravity, so that the wafer intervals are naturally constant and do not contact each other. On the other hand, the tilt angle is 9
In the conventional 0 ° wafer holder, the wafer tilts leftward or rightward and is not constant. Therefore, the guides 4 (a) and 4 (b) are gradually scraped by many times of use, and the clearance with the wafer is gradually reduced. If they are large, they may contact each other. When cleaning or etching with a wafer holder of the type shown in FIG. 2, rocking is usually applied in the vertical direction. When the wafer holder shown in FIG. 2 is swung downward, the cleaning or etching solution tries to push the wafer upward, so that all the held wafers are in the B state. When the holder is swung upward, the cleaning or etching solution tries to push the wafer downward, so that all the held wafers are in the A state again. In the wafer holder for cleaning / etching of the present invention, the distance between the wafers to be processed is always held in a constant direction regardless of the position, so that the wafers may come into contact with each other and the surface may be damaged. The cleaning and etching conditions do not become uneven. On the other hand, in the conventional wafer holder with a tilt angle of 90 degrees, the wafers are tilted leftward or rightward due to the swinging and are not constant, so that the wafers come into contact with each other to cause flaws on the surface or cleaning. Or the etching situation becomes uneven.

【0008】本発明の洗浄・エッチング用ウェハ保持具
において傾き角度が89度を越えると、傾き角度が90
度の従来のウェハ保持具と事実上同じようになり、被処
理ウェハの間隔が一定に保たれなくなって前記のような
問題を引き起こすことがある。本発明の洗浄・エッチン
グ用ウェハ保持具において傾き角度が80度未満になる
とウェハの出し入れが難しくなるため、好ましい傾き角
度は80度以上89度以下である。
In the cleaning / etching wafer holder of the present invention, when the tilt angle exceeds 89 degrees, the tilt angle is 90 degrees.
In practice, the wafer holder becomes substantially the same as the conventional wafer holder, and the distance between the wafers to be processed cannot be kept constant, which may cause the above-mentioned problems. In the cleaning / etching wafer holder of the present invention, when the tilt angle is less than 80 degrees, it becomes difficult to take in and out the wafer, and therefore the preferred tilt angle is from 80 degrees to 89 degrees.

【0009】本発明の洗浄・エッチング用ウェハ保持具
は回転によって揺動する場合にも有用で、図4はそのよ
うな保持具の例である。図4および図5は本発明ウェハ
保持具の1例で、その外観図と側断面図である。図示さ
れているように、ウェハ保持具本体は1対の側板10と
4つのウェハ保持棒11からなる。側板10にはウェハ
回転支持部12と開口部14がある。ウェハ支持棒11
にはウェハ13を支持するための溝を形成している。お
互いに平行して多数個設けられた前記溝は図5に示され
ているように、ウェハ支持棒の長手方向E(矢印)に対
して垂直でなく、一定角度傾いており、この例では傾き
角度は約84.5度である。
The cleaning / etching wafer holder of the present invention is also useful when it is rocked by rotation, and FIG. 4 shows an example of such a holder. 4 and 5 show an example of the wafer holder of the present invention, which is an external view and a side sectional view. As shown in the figure, the wafer holder body comprises a pair of side plates 10 and four wafer holding rods 11. The side plate 10 has a wafer rotation support 12 and an opening 14. Wafer support rod 11
A groove for supporting the wafer 13 is formed therein. As shown in FIG. 5, the plurality of grooves provided in parallel with each other are not perpendicular to the longitudinal direction E (arrow) of the wafer support rod but are inclined at a constant angle. The angle is about 84.5 degrees.

【0010】毎分数十回程度の回転速度で図4の保持具
を揺動すると遠心力によって被保持ウェハが一定方向に
押し付けられるため、先の例と同様に、被処理ウェハの
間隔は場所によらず常に一定に保たれる。これに対し、
傾き角度が90度の従来のウェハ保持具では揺動により
ウェハが左に傾いたり右に傾いたりして一定ではないた
め、ウェハ同士が接触して表面に疵がついたり、洗浄や
エッチングの状況が不均一になったりする。
When the holder shown in FIG. 4 is swung at a rotational speed of about several tens of minutes per minute, the wafers to be held are pressed in a certain direction by the centrifugal force. It is always kept constant regardless of In contrast,
In the conventional wafer holder with an inclination angle of 90 degrees, the wafers are tilted to the left or to the right due to rocking and are not constant. Therefore, the wafers come into contact with each other to cause surface flaws, and the cleaning and etching conditions. May become uneven.

【0011】[0011]

【実施例】【Example】

(1)厚さ6000Åの熱酸化SiO2 膜の付いたシリ
コンウェハを図1〜3に示すウェハ保持具にセットし
た。この保持具は本発明のウェハ保持具であって、傾き
角度は約86.5度である。次に、バッファード弗酸溶
液(50%弗酸:40%弗化アンモニウムを1:10の
容量比で混合)中に前記ウェハがセットされた保持具を
浸漬して、上下に揺動しながら4分40秒間エッチング
を行った。比較のために傾き角度が90度のウェハ保持
具でも同様の試験を行った。超純水によりリンスし、遠
心乾燥機により乾燥した後、エリプソメータによりエッ
チング後の酸化膜厚分布を調べた。本発明のウェハ保持
具を用いた場合には1枚のウェハにおけるエッチング後
酸化膜厚ばらつき(標準偏差)は5%ないしそれ以下
で、ウェハ間でも7%ないしそれ以下であった。比較例
の場合には、1枚のウェハにおけるエッチング後酸化膜
厚ばらつきは15%程度、ウェハ間では20%程度あっ
た。以上のように、本発明の洗浄・エッチング用ウェハ
保持具ではエッチングが均一に起こり、ウェハ毎の差異
が小さい。
(1) A silicon wafer having a thickness of 6000Å and a thermally oxidized SiO 2 film was set on the wafer holder shown in FIGS. This holder is the wafer holder of the present invention, and the tilt angle is about 86.5 degrees. Next, the holder with the wafer set therein is dipped in a buffered hydrofluoric acid solution (50% hydrofluoric acid: 40% ammonium fluoride mixed at a volume ratio of 1:10) and rocked up and down. Etching was performed for 4 minutes and 40 seconds. For comparison, a similar test was performed on a wafer holder having an inclination angle of 90 degrees. After rinsing with ultrapure water and drying with a centrifugal dryer, the oxide film thickness distribution after etching was examined with an ellipsometer. When the wafer holder of the present invention was used, the variation in oxide film thickness after etching (standard deviation) on one wafer was 5% or less, and between wafers was 7% or less. In the case of the comparative example, the variation in oxide film thickness after etching on one wafer was about 15%, and between wafers was about 20%. As described above, in the wafer holder for cleaning / etching of the present invention, etching occurs uniformly and the difference between wafers is small.

【0012】(2)ラッピング工程において荒研磨され
たシリコンウェハを洗浄した後、図4に示すウェハ保持
具にセットした。図4の保持具は本発明のウェハ保持具
であって、傾き角度は約85度である。次に、弗硝酸溶
液(50%弗酸:70%硝酸:100%酢酸を3:5:
3の容量比で混合した混酸)中に前記ウェハがセットさ
れた保持具を浸漬して、40rpmの回転速度で揺動し
ながら70秒間エッチングを行った。比較のために傾き
角度が90度のウェハ保持具でも同様の試験を行った。
超純水によりリンスした後、保持具から取り出して乾燥
し、エッチングむらの有無を調べた。本発明のウェハ保
持具を利用した場合にはエッチングむらは全く発生しな
いが、比較例ではエッチングむらが散発した。また、エ
ッチング後の形状にも差があり、本発明のウェハ保持具
を用いた場合にはウェハ毎の差はほとんどなかった。比
較例の場合にはウェハ毎にエッチング後形状が少しずつ
異なっており、なかには厚みにテーパがついていて片方
の部位が他方に比較して厚くなっているウェハも見られ
た。以上のように、本発明の洗浄・エッチング用ウェハ
保持具ではエッチングが均一に起こり、ウェハ毎の差異
が小さい。
(2) After cleaning the silicon wafer rough-polished in the lapping step, it was set on the wafer holder shown in FIG. The holder of FIG. 4 is the wafer holder of the present invention, and the tilt angle is about 85 degrees. Next, a fluorinated nitric acid solution (50% hydrofluoric acid: 70% nitric acid: 100% acetic acid 3: 5:
The holder on which the wafer was set was dipped in a mixed acid mixed at a volume ratio of 3) and etched for 70 seconds while rocking at a rotation speed of 40 rpm. For comparison, a similar test was performed on a wafer holder having an inclination angle of 90 degrees.
After rinsing with ultrapure water, it was taken out from the holder and dried, and the presence or absence of etching unevenness was examined. When the wafer holder of the present invention was used, etching unevenness did not occur at all, but in the comparative example, etching unevenness was scattered. Further, there is a difference in shape after etching, and when the wafer holder of the present invention is used, there is almost no difference between wafers. In the case of the comparative example, the shape after etching was slightly different for each wafer, and in some wafers, the thickness was tapered and one portion was thicker than the other. As described above, in the wafer holder for cleaning / etching of the present invention, etching occurs uniformly and the difference between wafers is small.

【0013】[0013]

【発明の効果】以上詳述したように、本発明の洗浄・エ
ッチング用ウェハ保持具によれば、洗浄またはエッチン
グ処理の均一性および安定性が増し、ウェハ処理後の表
面品質が安定する。
As described in detail above, according to the wafer holder for cleaning / etching of the present invention, the uniformity and stability of the cleaning or etching process is increased, and the surface quality after the wafer process is stabilized.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の洗浄・エッチング用ウェハ保持具(外
観図)の一例を示す図である。
FIG. 1 is a view showing an example of a cleaning / etching wafer holder (external view) of the present invention.

【図2】図1の保持具の側断面図である。FIG. 2 is a side sectional view of the holder shown in FIG.

【図3】図2のSS’線を通る断面図である。3 is a cross-sectional view taken along the line SS 'of FIG.

【図4】本発明の洗浄・エッチング用ウェハ保持具(外
観図)の別の例を示す図である。
FIG. 4 is a view showing another example of the cleaning / etching wafer holder (external view) of the present invention.

【図5】図4の保持具の側断面図である。FIG. 5 is a side sectional view of the holder shown in FIG.

【符号の説明】[Explanation of symbols]

1 側板 2 ウェハ支持体 3 ウェハ 4(a)、4(b) ガイド 5 開口部 6 ウェハ支持体 8 開口部 9 端板 10 側板 11 ウェハ支持体 12 ウェハ回転支持部 13 ウェハ 14 開口部 1 Side Plate 2 Wafer Support 3 Wafer 4 (a), 4 (b) Guide 5 Opening 6 Wafer Support 8 Opening 9 End Plate 10 Side Plate 11 Wafer Support 12 Wafer Rotating Support 13 Wafer 14 Opening

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 多数のウェハを立てた状態で保持するガ
イドを有するウェハの洗浄またはエッチング用保持具に
おいて、前記ガイドが相互に平行で、かつ垂直に対して
同一方向に傾けて設けられていることを特徴とする洗浄
・エッチング用ウェハ保持具。
1. A wafer cleaning or etching holder having a guide for holding a large number of wafers in an upright state, wherein the guides are provided parallel to each other and inclined in the same direction with respect to the vertical. A wafer holder for cleaning and etching, which is characterized in that
JP12398092A 1992-05-15 1992-05-15 Wafer holder for cleaning and etching Withdrawn JPH05326475A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12398092A JPH05326475A (en) 1992-05-15 1992-05-15 Wafer holder for cleaning and etching

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12398092A JPH05326475A (en) 1992-05-15 1992-05-15 Wafer holder for cleaning and etching

Publications (1)

Publication Number Publication Date
JPH05326475A true JPH05326475A (en) 1993-12-10

Family

ID=14874071

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12398092A Withdrawn JPH05326475A (en) 1992-05-15 1992-05-15 Wafer holder for cleaning and etching

Country Status (1)

Country Link
JP (1) JPH05326475A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5765982A (en) * 1995-07-10 1998-06-16 Amtech Systems, Inc. Automatic wafer boat loading system and method
CN110449401A (en) * 2019-09-10 2019-11-15 徐松 A kind of etch cleaning machine

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5765982A (en) * 1995-07-10 1998-06-16 Amtech Systems, Inc. Automatic wafer boat loading system and method
US5888048A (en) * 1995-07-10 1999-03-30 Amtech Systems, Inc. Automatic wafer boat loading
CN110449401A (en) * 2019-09-10 2019-11-15 徐松 A kind of etch cleaning machine

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Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19990803