JPH05281054A - Temperature detecting mechanism - Google Patents

Temperature detecting mechanism

Info

Publication number
JPH05281054A
JPH05281054A JP7417092A JP7417092A JPH05281054A JP H05281054 A JPH05281054 A JP H05281054A JP 7417092 A JP7417092 A JP 7417092A JP 7417092 A JP7417092 A JP 7417092A JP H05281054 A JPH05281054 A JP H05281054A
Authority
JP
Japan
Prior art keywords
temperature
data
voltage
stored
measuring element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP7417092A
Other languages
Japanese (ja)
Inventor
Tsutomu Abe
勤 阿部
Shuji Mihashi
修二 三橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alps Alpine Co Ltd
Original Assignee
Alps Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alps Electric Co Ltd filed Critical Alps Electric Co Ltd
Priority to JP7417092A priority Critical patent/JPH05281054A/en
Publication of JPH05281054A publication Critical patent/JPH05281054A/en
Withdrawn legal-status Critical Current

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  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Electronic Switches (AREA)

Abstract

PURPOSE:To improve the accuracy of temperature detection by providing a temperature detecting mechanism with an output correcting means to correct a detected temperature based on the output of a temperature measuring element to a reasonable value according to dispersion in the accuracy of the temperature measuring element. CONSTITUTION:Standard voltage is applied to a series circuit composed of a thermister T and a resistance R, and the resultant data of A/D conversion of a voltage divided by both the components is compared with basic data to an influence temperature X deg.C stored in a table memory 3, and difference between the two data is stored in a fixed memory 4 as correcting data for the dispersion of temperature measuring elements. The voltage for the correcting data stored in the memory 4 is added to detected data through a data comparing section 2 to make the detected data coincide with a voltage value obtained by computation. After then, the data comparing section 2 determines temperature from in the table memory 3 on the basis of the voltage value after the above correction.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、サーミスタ等の測温素
子を用いて測定対象の温度を検出する温度検出機構に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a temperature detecting mechanism for detecting the temperature of an object to be measured by using a temperature measuring element such as a thermistor.

【0002】[0002]

【従来の技術】例えば、サーマルヘッドを用いて画像を
記録する記録装置においては、サーマルヘッドの温度に
より、その記録濃度が変化するため、サーマルヘッドの
温度に応じてサーマルヘッドに印加する印字パルスのパ
ルス幅を制御することで、記録濃度を均一に制御する温
度制御を実行している。
2. Description of the Related Art For example, in a recording apparatus for recording an image using a thermal head, the recording density changes depending on the temperature of the thermal head. Therefore, the print pulse applied to the thermal head depends on the temperature of the thermal head. By controlling the pulse width, temperature control for uniformly controlling the recording density is executed.

【0003】このように、温度制御のために、制御対象
の温度を検出する測温素子としては、温度に応じてその
抵抗値が変化するサーミスタが広く用いられている。
As described above, for temperature control, a thermistor whose resistance value changes according to the temperature is widely used as a temperature measuring element for detecting the temperature of the controlled object.

【0004】このサーミスタを用いた温度検出回路の一
例を図4に示す。
An example of a temperature detecting circuit using this thermistor is shown in FIG.

【0005】図4は、サーミスタTと抵抗Rを直列接続
させるとともに、サーミスタTを接地側に、抵抗Rを電
源側に接続させたものであり、サーミスタTは、制御対
象に密着、あるいは、近接して、制御対象の温度を感知
できる態様に配置される。
In FIG. 4, a thermistor T and a resistor R are connected in series, the thermistor T is connected to the ground side, and the resistor R is connected to the power source side. The thermistor T is in close contact with or close to a controlled object. The temperature of the controlled object is then sensed.

【0006】ここで、サーミスタTとして、温度上昇に
伴って抵抗値が減少する特性のものを用いた場合、サー
ミスタTと抵抗Rの相互接続端の電圧Vは、温度が上昇
するにつれて小さくなる。
Here, when the thermistor T having a characteristic that the resistance value decreases as the temperature rises is used, the voltage V at the interconnection end of the thermistor T and the resistance R becomes smaller as the temperature rises.

【0007】したがって、電圧Vのレベルを検出するこ
とで、制御対象の温度を検出することができる。
Therefore, the temperature of the controlled object can be detected by detecting the level of the voltage V.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、サーミ
スタT等の測温素子は、抵抗値精度やB定数精度による
ばらつきを有している。また、このサーミスタT等の測
温素子と基準電圧から分圧信号としてアナログ信号を取
り出す抵抗素子も、精度によるばらつきを有している。
However, the temperature measuring element such as the thermistor T has variations due to accuracy of resistance value and accuracy of B constant. Further, the temperature measuring element such as the thermistor T and the resistance element for extracting an analog signal as a divided voltage signal from the reference voltage also have variations due to accuracy.

【0009】この様にばらつきを有した素子からのアナ
ログ信号をA/D変換させた結果は、個々の素子によっ
て異なり、基準となる温度に対してばらつきを持った温
度が検出される。従って、実際の環境温度よりも高い温
度や低い温度を検出してしまい、サーマルヘッドへの通
電時間を決定するためのパラメータが製品毎に異なるこ
ととなり、製品毎に異なった印字品質になるという問題
が発生していた。
The result of A / D conversion of the analog signals from the elements having such variations varies depending on the individual elements, and temperatures having variations with respect to the reference temperature are detected. Therefore, the temperature that is higher or lower than the actual ambient temperature is detected, and the parameter for determining the energization time to the thermal head varies from product to product, resulting in different print quality for each product. Was occurring.

【0010】本発明は、これらの点に鑑みてなされたも
のであり、サーミスタ等の測温素子の精度のばらつきに
応じて、前記測温素子の出力を自動的に適正値に補正し
て、温度検出の精度を高めることができる温度検出機構
を提供することを目的とする。
The present invention has been made in view of these points, and automatically corrects the output of the temperature measuring element to an appropriate value according to the variation in accuracy of the temperature measuring element such as the thermistor. An object of the present invention is to provide a temperature detection mechanism that can improve the accuracy of temperature detection.

【0011】[0011]

【課題を解決するための手段】前記目的を達成するため
に、本発明の温度検出機構は、測温素子の出力に基づい
て温度を検出する温度検出機構において、前記測温素子
の出力に基づいた検出温度を、測温素子の精度のばらつ
きに応じて、適正値に補正する出力補正手段を有するこ
とを特徴とする。
In order to achieve the above object, a temperature detecting mechanism of the present invention is a temperature detecting mechanism for detecting a temperature based on an output of a temperature measuring element. It is characterized by having an output correction means for correcting the detected temperature to an appropriate value in accordance with the variation in the accuracy of the temperature measuring element.

【0012】[0012]

【作用】本発明の温度検出機構によれば、出力補正手段
がサーミスタ等の測温素子の精度のばらつきに応じて、
前記測温素子の出力を、自動的に適正値に補正するの
で、温度検出の精度を高めることができる。
According to the temperature detecting mechanism of the present invention, the output correcting means is capable of responding to variations in accuracy of temperature measuring elements such as thermistors.
Since the output of the temperature measuring element is automatically corrected to an appropriate value, the temperature detection accuracy can be improved.

【0013】[0013]

【実施例】以下、本発明の実施例を図1から図3につい
て説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIGS.

【0014】図1に示す本発明の実施例においては、サ
ーミスタTと抵抗Rとを直列接続させるとともに、サー
ミスタTを接地側に、抵抗Rを電源側に接続させてい
る。前記サーミスタTは、サーマルヘッド等の制御対象
に密着、あるいは、近接して、制御対象の温度を感知で
きる態様に配置されている。また、サーミスタTと抵抗
Rとの間には、これらによる分圧電圧をディジタル値に
変換するA/D変換部1が配設されている。このA/D
変換部1にはデータ比較部2が接続され、さらに前記デ
ータ比較部2には、テーブルメモリ3と不揮発性メモリ
4とが、それぞれ接続されている。前記テーブルメモリ
3には、あらかじめ計算によって求められた、各温度毎
の電圧値を示す基準データが記憶格納されている。ま
た、前記不揮発性メモリ4はEEP−ROM、NV−R
AM等からなり、補正データが記憶格納される。これら
のデータ比較部2、テーブルメモリ3および不揮発性メ
モリ4は、精度のばらつきに応じて検出温度を適正値に
補正する出力補正手段とされている。
In the embodiment of the present invention shown in FIG. 1, the thermistor T and the resistor R are connected in series, and the thermistor T is connected to the ground side and the resistor R is connected to the power source side. The thermistor T is arranged so as to be in close contact with or close to a controlled object such as a thermal head so that the temperature of the controlled object can be sensed. Further, between the thermistor T and the resistor R, an A / D converter 1 for converting the divided voltage by them into a digital value is arranged. This A / D
A data comparison unit 2 is connected to the conversion unit 1, and a table memory 3 and a non-volatile memory 4 are connected to the data comparison unit 2. In the table memory 3, reference data indicating a voltage value for each temperature, which is previously calculated, is stored. The non-volatile memory 4 is an EEP-ROM or NV-R.
Comprised of AM and the like, the correction data is stored and stored. The data comparison unit 2, the table memory 3, and the non-volatile memory 4 serve as an output correction unit that corrects the detected temperature to an appropriate value according to the variation in accuracy.

【0015】次に、本実施例の作用を説明する。Next, the operation of this embodiment will be described.

【0016】本実施例においては、不揮発性メモリ4へ
の補正データの入力を、温度検出機構の製造時に行う。
これを図2のフローチャートにしたがって説明する。
In this embodiment, the correction data is input to the non-volatile memory 4 when the temperature detecting mechanism is manufactured.
This will be described with reference to the flowchart of FIG.

【0017】まず、ステップST11において、図示しな
い入力手段によって、製造工程の環境温度X℃をデータ
比較部2へ入力する。次に、ステップST12において、
温度検出とA/D変換とを行なう。すなわち、測温素子
であるサーミスタTと抵抗Rとによって構成される直列
回路に標準電圧を印荷し、両者によって分圧した電圧を
アナログ信号として取り出し、このアナログ信号をA/
D変換部1においてディジタル値に変換する。次に、ス
テップST13において、A/D変換結果のデータと、テ
ーブルメモリ3に記憶格納されている環境温度X℃に対
する基準データとを比較する。次に、ステップST14に
おいて、これらの2つのデータの差を、測温素子のばら
つきの補正データとして、EEP−ROM、NV−RA
M等の不揮発性メモリ4に記憶格納する。図3はこのよ
うなばらつきの発生例を示す出力電圧・温度特性図であ
り、計算であらかじめ求めた基準電圧Aに対して、サー
ミスタTに基づく出力電圧Bと、抵抗Rに基づく出力電
圧Cとはそれぞれ一致しておらず、基準電圧Aとの差が
それぞれ補正データ分の電圧値とされる。この図3より
求められる補正データは、温度が変動してもほぼ一定で
ある。これにより製品の出荷前の自動調整モードは終了
する。
First, in step ST11, the environmental temperature X ° C. in the manufacturing process is input to the data comparison section 2 by an input means (not shown). Next, in step ST12,
Temperature detection and A / D conversion are performed. That is, a standard voltage is applied to a series circuit composed of a thermistor T which is a temperature measuring element and a resistor R, the voltage divided by the two is taken out as an analog signal, and this analog signal is A /
The D conversion unit 1 converts the digital value. Next, in step ST13, the data of the A / D conversion result is compared with the reference data stored and stored in the table memory 3 for the environmental temperature X ° C. Next, in step ST14, the difference between these two data is used as correction data for the dispersion of the temperature measuring elements, and the EEP-ROM and NV-RA are used.
It is stored in the nonvolatile memory 4 such as M. FIG. 3 is an output voltage / temperature characteristic diagram showing an example of occurrence of such a variation. An output voltage B based on a thermistor T and an output voltage C based on a resistor R with respect to a reference voltage A previously calculated. Do not match, and the difference from the reference voltage A is the voltage value for the correction data. The correction data obtained from this FIG. 3 is almost constant even if the temperature changes. This ends the automatic adjustment mode before product shipment.

【0018】その後の利用者による実使用においては、
測温素子であるサーミスタTが検出した電圧からなるア
ナログ信号をA/D変換部1によりA/D変換して得た
A/D変換結果のデータに対して、不揮発性メモリ4に
記憶格納された補正データ分の電圧を、データ比較部2
によって加えることによって、計算上求められる電圧値
と一致させる。その後、データ比較部2はその補正後の
電圧値に基づいてテーブルメモリ3に記憶されているデ
ータより温度を求める。これにより検出温度は実際の環
境温度と正確に一致した値となる。例えば、25℃の環
境温度に対して、図3のA線に示す標準データでは2.
5Vが必要なところ、図3のB線に示したサーミスタT
による検出電圧は2.6Vとなるが、不揮発性メモリ4
内の補正データである両者の差0.1Vをデータ比較部
2によって2.6Vより減算することになり、温度検出
機構から検出温度25℃が出力される。
In actual use by the user thereafter,
A / D conversion result data obtained by A / D converting the analog signal composed of the voltage detected by the thermistor T, which is a temperature measuring element, is stored and stored in the non-volatile memory 4. The voltage for the corrected data is
The voltage value obtained by calculation is matched with the calculated voltage value. Then, the data comparison unit 2 obtains the temperature from the data stored in the table memory 3 based on the corrected voltage value. As a result, the detected temperature has a value that exactly matches the actual environmental temperature. For example, with respect to the environmental temperature of 25 ° C., the standard data indicated by the line A in FIG.
Where 5V is required, the thermistor T shown in line B of FIG.
The detected voltage is 2.6V, but the nonvolatile memory 4
The difference between the two, which is the correction data in 0.1 V, is subtracted from 2.6 V by the data comparison unit 2, and the detected temperature of 25 ° C. is output from the temperature detection mechanism.

【0019】従って、本実施例によれば、サーミスタT
等の測温素子にばらつきがあっても、温度検出機構とし
てはばらつきを無くすことができ、製品毎の印字品質を
より安定させることができる。
Therefore, according to this embodiment, the thermistor T
Even if there are variations in the temperature measuring elements such as the above, the variations in the temperature detection mechanism can be eliminated, and the printing quality for each product can be made more stable.

【0020】なお、本発明は前記実施例に限定されるも
のではなく、必要に応じて変更することができる。例え
ば、製造工程の環境が常に一定に保たれている場合は、
テーブルメモリに記憶格納するデータは、その環境温度
に対する基準データのみとなり、自動調整モードにおけ
る環境温度の入力を省略することもできる。
The present invention is not limited to the above embodiment, but can be modified as necessary. For example, if the manufacturing process environment is always kept constant,
The data stored and stored in the table memory is only the reference data for the environmental temperature, and the input of the environmental temperature in the automatic adjustment mode can be omitted.

【0021】また、操作パネルのスイッチにより、デー
タをテーブルメモリに入力することにより、調整するこ
ともできる。
Further, the data can be adjusted by inputting the data into the table memory with the switch of the operation panel.

【0022】[0022]

【発明の効果】このように本発明の温度検出機構は構成
され作用するものであるから、サーミスタ等の測温素子
の精度のばらつきに応じて、前記測温素子の出力を、適
正値に補正する出力補正手段を有しているので、温度検
出の精度を高めることがでる。従って、本発明機構を備
えた複数のプリンタ等において、製品毎の印字品質をよ
り均一に安定させることができる等の効果を奏する。
As described above, since the temperature detecting mechanism of the present invention is constructed and operates, the output of the temperature measuring element is corrected to an appropriate value according to the variation in accuracy of the temperature measuring element such as the thermistor. Since it has the output correction means for controlling the temperature, the accuracy of temperature detection can be improved. Therefore, in a plurality of printers and the like equipped with the mechanism of the present invention, it is possible to stabilize the print quality of each product more uniformly.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の温度検出機構の1実施例を示すブロッ
ク図
FIG. 1 is a block diagram showing an embodiment of a temperature detecting mechanism of the present invention.

【図2】本実施例における温度補正データの設定を示す
フローチャート
FIG. 2 is a flowchart showing setting of temperature correction data in this embodiment.

【図3】ばらつき状態の1例を示す温度−出力電圧特性
FIG. 3 is a temperature-output voltage characteristic diagram showing an example of a variation state.

【図4】従来の温度検出回路図FIG. 4 Conventional temperature detection circuit diagram

【符号の説明】[Explanation of symbols]

T サーミスタ R 抵抗 V 電圧 1 A/D変換部 2 データ比較部 3 テーブルメモリ 4 不揮発性メモリ T thermistor R resistance V voltage 1 A / D conversion unit 2 data comparison unit 3 table memory 4 non-volatile memory

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 // G01K 15/00 7267−2F ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 5 Identification number Office reference number FI technical display location // G01K 15/00 7267-2F

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 測温素子の出力に基づいて温度を検出す
る温度検出機構において、前記測温素子の出力に基づい
た検出温度を、測温素子の精度のばらつきに応じて、適
正値に補正する出力補正手段を有することを特徴とする
温度検出機構。
1. A temperature detecting mechanism for detecting a temperature based on an output of a temperature measuring element, wherein a detected temperature based on an output of the temperature measuring element is corrected to an appropriate value according to a variation in accuracy of the temperature measuring element. A temperature detecting mechanism comprising:
JP7417092A 1992-03-30 1992-03-30 Temperature detecting mechanism Withdrawn JPH05281054A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7417092A JPH05281054A (en) 1992-03-30 1992-03-30 Temperature detecting mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7417092A JPH05281054A (en) 1992-03-30 1992-03-30 Temperature detecting mechanism

Publications (1)

Publication Number Publication Date
JPH05281054A true JPH05281054A (en) 1993-10-29

Family

ID=13539419

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7417092A Withdrawn JPH05281054A (en) 1992-03-30 1992-03-30 Temperature detecting mechanism

Country Status (1)

Country Link
JP (1) JPH05281054A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005140629A (en) * 2003-11-06 2005-06-02 Sanyo Electric Co Ltd Temperature-measuring device, and temperature measurement transmitting device
JP2005156509A (en) * 2003-11-28 2005-06-16 Fuji Electric Fa Components & Systems Co Ltd Analog input data transmission device
JP2007536884A (en) * 2004-04-30 2007-12-13 ミネベア株式会社 Self-calibrating fan
JP2008265486A (en) * 2007-04-19 2008-11-06 Matsushita Electric Ind Co Ltd Seat heater
JP2011001915A (en) * 2009-06-19 2011-01-06 Denso Corp Fuel temperature detector
JP2015227756A (en) * 2014-06-02 2015-12-17 矢崎エナジーシステム株式会社 Reduction quantity calculation system, reduction quantity calculation device, thermistor calibration device and calibration method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005140629A (en) * 2003-11-06 2005-06-02 Sanyo Electric Co Ltd Temperature-measuring device, and temperature measurement transmitting device
JP2005156509A (en) * 2003-11-28 2005-06-16 Fuji Electric Fa Components & Systems Co Ltd Analog input data transmission device
JP2007536884A (en) * 2004-04-30 2007-12-13 ミネベア株式会社 Self-calibrating fan
JP2008265486A (en) * 2007-04-19 2008-11-06 Matsushita Electric Ind Co Ltd Seat heater
JP2011001915A (en) * 2009-06-19 2011-01-06 Denso Corp Fuel temperature detector
US8240192B2 (en) 2009-06-19 2012-08-14 Denso Corporation Fuel temperature sensing device
JP2015227756A (en) * 2014-06-02 2015-12-17 矢崎エナジーシステム株式会社 Reduction quantity calculation system, reduction quantity calculation device, thermistor calibration device and calibration method

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