JPH05267666A - Semiconductor device and its manufacture - Google Patents

Abstract

PURPOSE:To reduce leakage current in a reverse bias condition, and improve aperture ratio, by making the channel length longer than the channel direction length of a gate electrode in an insulated-gate field-effect transistor. CONSTITUTION:A blocking layer 24 is formed on an insulating board 25, on which a source region 20, a drain region 21, and a channel region 19 are arranged as semiconductor layers. Material capable of anodic oxidation for a gate electrode 15 and a gate electrode part turning to an oxide layer 16 is selected, and the oxide layer 16 is formed by anodizing the surface part. Thereby the distance between the source region 20 and the drain region 21 being the ion implantation regions, i.e., the channel region 28 is made longer than the effective channel direction length of the gate electrode 15 by nearly two times the thickness of the oxide layer 16. As the result, the electric field due to the gate electrode is not applied at all to a part 26 and a part 27 in the channel region 19 which face each other via a gate insulating film 17 or is decreased as compared with the part vertically under the gate electrode.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is applicable to an active matrix type electro-optical device, in particular an active matrix type liquid crystal electro-optical device, and shows a structure of a field effect transistor having clear switching characteristics and a method for manufacturing the same. Is.

[0002]

2. Description of the Related Art A thin film insulated gate field effect transistor used in a conventional active matrix type liquid crystal electro-optical device has a structure as shown in FIG. Insulating substrate 9
With a blocking layer 8 on top, a source 4, a drain 5,
The gate insulating film 2 and the gate electrode 1 are provided on the semiconductor layer having the channel region 3. Interlayer insulation film 12
And a source electrode 6 and a drain electrode 7.

This conventional insulated gate field effect transistor is manufactured by forming a blocking layer on a glass substrate 9 by sputtering with SiO ₂ as a target and then forming a semiconductor layer by plasma CVD. After forming a semiconductor layer to be a source, a drain and a channel region by patterning the same, a gate insulating film 2 made of silicon oxide is formed by a sputtering method, and then P ( After forming a conductive layer for a gate electrode which is heavily doped with phosphorus), patterning is performed to form the gate electrode 1. After that, impurity ions are implanted using the gate electrode as a mask to form the source 5 and the drain 4, and then heat treatment is performed to activate.

In the insulated gate field effect transistor thus manufactured, the length of the gate electrode 1 in the channel length direction is substantially equal to the channel length 10.

[0005]

The current-voltage characteristic of the insulated gate field effect transistor having such a structure is n.
In the case of the channel, as shown in FIG. 3, the reverse bias region 13 has a drawback that the leak current increases as the applied voltage between the source and the drain increases.

When such a leak current increases, when this element is used in an active matrix type liquid crystal electro-optical device, the charge stored in the liquid crystal 29 through the write current 30 as shown in FIG. In the non-writing period, the leak current 31 was discharged through the leak portion of the element, and good contrast could not be obtained.

Therefore, in such a case, as shown in FIG. 5 (B) as a conventional example, it was necessary to install a capacitor 32 for holding charges. However, in order to form these capacitors, an electrode for capacitance by metal wiring is required, which has been a factor of reducing the aperture ratio. In addition, although an example of forming this with a transparent electrode such as ITO to improve the aperture ratio has been reported, it is not welcomed because it requires an extra process. The present invention solves the above problems.

[0008]

As one of the solutions to this problem, the present inventors set the channel length (distance between the source region and the drain region) of the gate electrode to the channel length of the gate electrode in the insulated gate field effect transistor. By forming the offset region in the channel region, which is in contact with the source region or the drain region, with no or very weak electric field due to the electric field, the current voltage as shown in FIG. It was found that the characteristics were taken.

The basic configuration of the present invention is shown in FIG. A blocking layer 24 is provided on an insulating substrate 25, and a source region 20, a drain region 21, and a channel region 19 are provided on the blocking layer 24 as semiconductor layers. On the channel region 19, a gate insulating film 17 and a gate electrode 15 on which an anodizable material is anodized to form an oxide layer 16 which is an insulating layer are formed. A source electrode 22 and a drain electrode 23 are provided in contact with the source region and the drain region, respectively.

As shown in FIG. 1, a material that can be anodized is selected for the gate electrode 15 and the gate electrode portion to be the oxide layer 16, and the surface portion is anodized to form the oxide layer 16. Source region 20 which is the region of ion implantation
Between the drain region 21 and the drain region 21, that is, the channel length 28
Is about twice as long as the thickness of the oxide layer 16 than the substantial length of the gate electrode 15 in the channel length direction.

As a result, the electric field due to the gate electrode is not applied to the portions 26 and 27 in the channel region 19 facing the oxide layer 16 formed on both side surfaces of the gate electrode with the gate insulating film 17 interposed therebetween, or It is much weaker than the vertical bottom.

The manufacturing method of this device is as follows.
Semiconductor layer and gate insulating film layer 17 to be a channel region
After forming the gate electrode portion with a material capable of being anodized, the semiconductor layer is implanted with impurity ions for making it p-type or n-type to form a source region 20 and a drain region 21, and then the gate electrode portion. The surface portion is anodized to form the gate electrode 15 and the oxide layer 16,
After that, a heat treatment process is performed.

Alternatively, after the semiconductor layer and the gate insulating film layer 17 are formed, a gate electrode portion is formed of a material that can be anodized, and then the surface portion of the gate electrode portion is anodized to form the gate electrode 15 and the oxide layer 16. Alternatively, a step of forming the source region 20 and the drain region 21 by implanting impurity ions for making the semiconductor layer p-type or n-type and then performing a heat treatment step may be performed.

By taking the above steps, an insulated gate field effect transistor whose channel length is longer than the length of the gate electrode in the channel length direction can be easily and surely produced without causing performance variations due to mask shift or the like. It becomes possible to manufacture it.

Examples will be shown below.

【Example】

Example 1 In this example, a viewfinder for a video camera using a liquid crystal electro-optical device having a diagonal of 1 inch was manufactured and the present invention was carried out.

In this embodiment, a viewfinder is formed by forming an element using a high mobility TFT (thin film transistor) by the low temperature process having the constitution of the present invention with a constitution of 387 × 128 pixels. FIG. 7 shows the arrangement of the active elements on the substrate of the liquid crystal display device used in this embodiment, and FIG. 6 shows the circuit diagram of this embodiment. A manufacturing process showing the AA ′ cross section and the BB ′ cross section of FIG. 7 is drawn in FIG. 8. AA 'cross section shows NTFT, BB'
The cross section shows PTFT.

In FIG. 8A, an inexpensive glass substrate 5 that can withstand a heat treatment at 700 ° C. or lower, for example, about 600 ° C.
1. A silicon oxide film as the blocking layer 52 is formed on the substrate 1 by using a magnetron RF (radio frequency) sputtering method in an amount of 1000 to 3
It is made to a thickness of 000Å. Process condition is oxygen 100
% Atmosphere, film forming temperature 150 ° C., output 400 to 800 W,
The pressure was 0.5 Pa. The film formation rate using quartz or single crystal silicon for the target was 30 to 100 Å / min.

A silicon film was formed thereon by LPCVD (Low Pressure Vapor Phase) method, sputtering method or plasma CVD method. When forming by the reduced pressure vapor phase method, it is 1 more than the crystallization temperature.
450 to 550 ° C, which is lower than 00 to 200 ° C, for example, 530 ° C
CVD of disilane (Si ₂ H ₆ ) or trisilane (Si ₃ H ₈ ) with
The film was supplied to the apparatus to form a film. The reactor pressure is 30-300
It was Pa. The film forming rate was 50 to 250 Å / min.
Threshold voltage (Vt) between PTFT and NTFT
In order to control the concentration to be substantially the same as that of h), boron may be added during film formation using diborane at a concentration of 1 × 10 ¹⁵ to 1 × 10 ¹⁸ cm ⁻³ .

When the sputtering method is used, the back pressure before the sputtering is set to 1 × 10 ^-5 Pa or less, the single crystal silicon is used as the target, and argon is mixed with hydrogen in an amount of 20 to 80%. For example, argon was 20% and hydrogen was 80%.
The film forming temperature was 150 ° C., the frequency was 13.56 MHz, the sputter output was 400 to 800 W, and the pressure was 0.5 Pa.

When a silicon film is formed by the plasma CVD method, the temperature is, for example, 300 ° C., and monosilane (SiH ₄ ) or disilane (Si ₂ H ₆ ) is used. These were introduced into a PCVD apparatus, and high frequency power of 13.56 MHz was applied to form a film.

The coating formed by these methods is
It is preferable that oxygen is 5 × 10 ²¹ cm ⁻³ or less. If this oxygen concentration is high, it is difficult to crystallize and the thermal annealing temperature must be high or the thermal annealing time must be long.
If it is too low, the backlight will turn off the light.
The current will increase. Therefore 4 × 10 ¹⁹ to 4 × 10 ²¹
The range was cm ^-3 . Hydrogen is 4 × 10 ²⁰ cm ^-3 and silicon 4
It was 1 atom% when compared as × 10 ²² cm ^-3 .

By the above method, an amorphous silicon film is formed to a thickness of 500 to 5000 Å, for example 1500 Å, and then a heat treatment of medium temperature in a non-oxide atmosphere at a temperature of 450 to 700 ° C. for 12 to 70 hours, For example, it was held at a temperature of 600 ° C. under a hydrogen atmosphere. Since the silicon oxide film having an amorphous structure is formed on the surface of the substrate below the silicon film, no specific nuclei are present in this heat treatment and the whole is uniformly annealed by heating. That is, it has an amorphous structure during film formation, and hydrogen is simply mixed therein.

The annealing causes the silicon film to shift from an amorphous structure to a highly ordered state, and a part thereof assumes a crystalline state. Particularly, in the state after the film formation of silicon, a region having a relatively high order is particularly crystallized and tends to be in a crystalline state. However, since silicon existing between these regions is bonded to each other, the silicon members pull each other. Peak 522 of single crystal silicon as measured by laser Raman spectroscopy
Peaks shifted to lower frequencies than cm ^-1 are observed. The apparent particle size is 50 to 5 when calculated from the half width.
Although it is a microcrystal like 00Å, in reality there are many highly crystalline regions with a cluster structure, and each cluster has a semi-amorphous structure in which silicon is bonded (anchoring) with each other. Could be formed.

As a result, the coating film is in a state in which it can be said that there is substantially no grain boundary (hereinafter referred to as GB). Since the carriers can easily move between the clusters through the anchored portions, the carrier mobility becomes higher than that of polycrystalline silicon in which so-called GB is clearly present. That is, hole mobility (μh) = 10 to ²⁰⁰ cm ² /
VSec, electron mobility (μe) = 15 to 300 cm ² / V
Sec is obtained.

On the other hand, the film may be polycrystallized by a high temperature anneal of 900 to 1200 ° C. instead of the anneal at a medium temperature as described above, but in that case, the film in the film is solidified by solid phase growth from the nucleus. Segregation of impurities occurs, oxygen is present in GB,
Although impurities such as carbon and nitrogen increase, the mobility in the crystal is high, but a barrier is created in GB, which hinders the movement of carriers there. As a result 10 cm ² / Vsec
In reality, it is difficult to obtain the above mobility. Therefore, it is necessary to set the concentration of impurities such as oxygen, carbon, and nitrogen to one-several to several tenths of that of semi-amorphous ones. If you do so, 50-100 cm ² / Vse
c was obtained.

The silicon film thus formed was photoetched to form a semiconductor layer 53 for NTFT (channel width 20 μm) and a semiconductor layer 54 for PTFT.

A silicon oxide film serving as a gate insulating film is formed on this layer to a thickness of 500 to 2000Å, for example, 1000Å. This was performed under the same conditions as the production of the silicon oxide film as the blocking layer. A small amount of fluorine may be added during film formation to immobilize sodium ions.

After that, an aluminum film was formed on the upper side. This is patterned with a photomask and shown in FIG.
I got (B). The gate insulating film 55 for the NTFT and the gate electrode portion 56 are formed, and the length in the channel length direction of both is 10
μm, that is, the channel length was 10 μm. Similarly, P
A gate insulating film 57 for a TFT and a gate electrode portion 58 were formed, and the length of both of them was 7 μm, that is, the channel length was 7 μm. Further, both gate electrode portions 56,
The thickness of both 58 was 0.8 μm. In FIG. 8C, boron (B) was added to the source 59 and the drain 60 for the PTFT by an ion implantation method in a dose amount of 1 to 5 × 10 ¹⁵ cm ⁻² . Next, as shown in FIG. 8D, a photoresist 61 was formed using a photomask. NTFT
Source 62 and phosphorus 63 as drain 63
It was added by an ion implantation method at a dose amount of 5 × 10 ¹⁵ cm ⁻² .

After that, the gate electrode portion was anodized. L-tartaric acid was diluted with ethylene glycol at a concentration of 5% and the pH was adjusted to 7.0 ± 0.2 with ammonia. The substrate was dipped in the solution, the + side of the constant current source was connected, the platinum electrode was connected to the − side, a voltage was applied in a constant current state of 20 mA, and oxidation was continued until reaching 150 V. Furthermore, at constant voltage at 150V, add 0.1mA
Oxidation was continued until: In this way, the aluminum oxide layer 64 was formed on the surfaces of the gate electrode portions 56 and 58 to obtain the gate electrode 65 for NTFT and the gate electrode 66 for PTFT. Aluminum oxide layer 64 is 0.3
It was formed to a thickness of μm.

Next, heating anneal was performed again at 600 ° C. for 10 to 50 hours. The source 62 and the drain 63 of the NTFT, the source 59 and the drain 60 of the PTFT are produced as N ⁺ and P ⁺ by activating impurities. Channel forming regions 67 and 68 are formed as semi-amorphous semiconductors under the gate insulating films 55 and 57.

In this manufacturing method, the order of ion implantation of impurities and anodic oxidation around the gate electrode may be exchanged. By forming the insulating layer made of metal oxide around the gate electrode in this way, the substantial length of the gate electrode is twice the thickness of the insulating film rather than the channel length.
The length was shortened by 6 μm, and the leak current at the time of reverse bias could be reduced by providing the offset region where no electric field is applied.

In this embodiment, the thermal anneal is as shown in FIG.
(E) performed twice. However, the anneal of FIG. 8A may be omitted depending on the desired characteristics, and both may be combined with the anneal of FIG. 8E to reduce the manufacturing time. In FIG. 8E, the interlayer insulator 69 was formed as a silicon oxide film by the above-described sputtering method. The silicon oxide film may be formed by using the LPCVD method, the photo CVD method, or the atmospheric pressure CVD method. The interlayer insulator is 0.2 to 0.6 μm, for example 0.3 μm
It was formed to a thickness of m, and then a window 70 for an electrode was formed using a photomask. Further, as shown in FIG. 8 (F), aluminum is formed on all of them by a sputtering method,
After the leads 71, 73 and the contacts 72 were formed using a photomask, an organic resin 74 for flattening the surface was applied and formed, and an electrode hole was formed again using a photomask.

ITO (indium tin oxide film) was formed by the sputtering method so that the two TFTs had a complementary structure and the output terminal thereof was connected to the electrode of one pixel of the liquid crystal device as a transparent electrode. It was etched with a photomask to form the electrode 75. This ITO
Was formed at room temperature to 150 ° C. and was accomplished by oxygen at 200 to 400 ° C. or anneal in the atmosphere. In this way, the NTFT 76, the PTFT 77 and the transparent conductive film electrode 75 are formed.
And were manufactured on the same glass substrate 51. TFT obtained
The electrical characteristics of PTFT are mobility 20 (cm ² / Vs),
Vth is -5.9 (V), and the mobility is 40 (cm) with NTFT.
² / Vs) and Vth were 5.0 (V).

One substrate for a liquid crystal device was manufactured according to the method as described above. The arrangement of electrodes and the like of this liquid crystal display device is shown in FIG. The NTFT 76 and the PTFT 77 are provided at the intersection of the first signal line 40 and the second signal line 41. A matrix structure using such C / TFT is provided. The NTFT 76 is connected to the second signal line 41 via the lead 71 at the input end of the drain 63, and is connected to the gate 5
Reference numeral 6 is connected to the signal line 40 on which the multilayer wiring is formed. The output end of the source 62 is connected to a pixel electrode 75 via a contact 72.

On the other hand, in the PTFT 77, the input end of the drain 60 is connected to the second signal line 41 via the lead 73,
The gate 58 is connected to the signal line 40, and the output end of the source 59 is connected to the pixel electrode 75 via the contact 72 like the NTFT. This embodiment is constructed by repeating such a structure horizontally and vertically.

Next, as a second substrate, ITO (injected) was also formed by sputtering on a substrate in which a silicon oxide film was laminated in 2000 liters on a soda lime glass by sputtering.
A tin oxide film) was formed. This ITO is room temperature ~ 15
The film was formed at 0 ° C. and was accomplished by oxygen at 200 to 400 ° C. or an anneal in the atmosphere. Further, a color filter was formed on this substrate to obtain a second substrate.

Then, a 6: 4 mixture of an ultraviolet curable acrylic resin and a nematic liquid crystal composition was sandwiched between the first substrate and the second substrate, and the periphery was fixed with an epoxy adhesive. The pitch of the leads on the substrate is 46 μm
Therefore, the connection was made using the COG method. In this embodiment, the gold bumps provided on the IC chip are connected by an epoxy-based silver-palladium resin, and the IC chip and the substrate are embedded and fixed by epoxy modified acrylic resin for the purpose of fixing and sealing. I was there. Then, a polarizing plate was attached to the outside to obtain a transmissive liquid crystal display device.

[Embodiment 2] In this embodiment, the difference in the characteristics of the semi-amorphous silicon TFT depending on the width of the offset region will be described. In this example, the semi-amorphous silicon TFT was an aluminum gate, and the periphery of the aluminum gate was oxidized by an anodic oxidation method to form an offset region. The detailed manufacturing method will be described below.

A multilayer film of a silicon nitride film and a silicon oxide film was formed on a glass substrate, and an amorphous silicon film was formed to a thickness of 150 nm by plasma CVD. In patterning, the width was 80 μm. Therefore, this T
The channel width of FT is 80 μm. This was heated in a nitrogen atmosphere at 600 ° C. for 60 hours to obtain silicon in a semi-amorphous state.

Then, a silicon oxide film to be a gate oxide film was formed by sputtering a silicon oxide target in an oxygen atmosphere. Its thickness was 115 nm.
Further, an aluminum film was formed by electron beam evaporation, and the aluminum film and the underlying silicon oxide film were etched by a known photolithography method to form a gate electrode. A reactive ion etching (RIE) method was used for etching. The channel length of the gate electrode thus formed was 8 μm.

Then, the gate electrode and its wiring were anodized. The method of anodic oxidation was performed as follows. First, a 3% ethylene glycol solution of tartaric acid was placed in a container, and 5 wt% ammonia water was added thereto to adjust the pH to 7.0 ± 0.2. Then, the platinum electrode was used as a cathode at a temperature of 25 ± 2 ° C., the glass substrate was immersed in the solution, the aluminum wiring was connected to the positive electrode of the DC power source, and anodization was performed.

In anodic oxidation, firstly 0.2 to 1.0 mA
/ Cm ² of a constant current, and after reaching an appropriate voltage of 100 to 250 V, anodization proceeds while keeping the voltage constant, and the current is turned on when the current decreases to 0.005 mA / cm ^2. I stopped and took it out. In our experiments,
It was clarified that the initial constant current value affects only the time of oxide film formation, and has little effect on the thickness of the finally formed oxide film. A parameter that has a great influence on the thickness of the oxide film is the maximum voltage that can be reached.
When this is 100V, 150V, 200V, and 250V, the thickness of the obtained oxide film is 70 nm and 1 respectively.
It was 40 nm, 230 nm and 320 nm. Further, it was revealed from the experiment by the present inventor that aluminum oxide having a thickness 1.5 times that of aluminum to be oxidized can be obtained at this time. Furthermore, the thickness of the resulting oxide film was extremely uniform over all parts.

Then, the source and drain regions were formed by the laser doping method. The laser doping method was performed by the following method. The laser used is a KrF laser, which is one type of excimer laser, and its oscillation wavelength is 248 nm. Place the sample in an airtight container and let it be in a reduced pressure atmosphere of 95 pa.
Diborane (B ₂ H ₆ ) or foshin (PH ₃ ) was introduced inside as a doping gas, and 50 shots of a laser pulse with an energy of 350 mJ per shot were irradiated.

When forming a P-type channel, diborane diluted with hydrogen was used as a doping gas, and the flow rate was 100 sccm of diborane and 20 sccm of hydrogen.
When forming an N-type channel, foshin was used and the flow rate was 100 sccm.

After that, annealing was carried out in hydrogen at 250 ° C. for 30 minutes for the purpose of promoting activation of the channel region. Then, the interlayer insulating film and the source / drain electrodes / wirings were formed by a known method to complete the TFT.

9 and 10 show characteristic examples of the TFT thus manufactured. 9 shows a P-channel TFT, and FIG. 10 shows an N-channel TFT. Since it is difficult to directly measure the magnitude of the offset, the effect of the present invention will be described by the thickness of the oxide film around the gate electrode (which is considered to sufficiently reflect the magnitude of the offset).

As is apparent from FIGS. 9 and 10, it was found that the reverse leakage current and the off current decrease as the thickness of the oxide film increases, that is, as the width of the offset region increases. In particular, it became clear that the effect was remarkable in the N-channel TFT. That is, as can be seen from the figure, in the N-channel TFT, the current (OFF current) when the gate voltage was 0 decreased with the formation of the offset region, and fell to a practical level. P channel TF
At T, the off current did not decrease, but
The reverse leakage current was significantly reduced. The reduction of the off-current by providing the offset region in this manner is shown in FIG.
Shown in. In the figure, I _OFF is an off current and I _on is an on current.

No change in the threshold voltage (V _th ) of the TFT due to the provision of the offset region was observed. This state is shown in FIG. However, according to another experiment, when the offset region was abnormally large, the formation of the channel was discontinuous, and thus the deterioration of the characteristics was observed. For example, as shown in FIG. 13, when the width of the offset region exceeds 300 nm, the electric field mobility rapidly decreases in both N channel and P channel. Considering these results, the width of the offset region is 200 to 400n.
It has become clear that m is suitable.

[0050]

As described above, according to the present invention, by providing the insulating film layer of anodic oxidation on the surface of the gate electrode, the channel length becomes longer than the length of the gate electrode in the channel length direction, and both sides of the channel region are formed. An offset region where no electric field is applied by the gate electrode or where an extremely weak electric field is applied can be provided in the portion, and the leak current at the time of reverse bias can be reduced. As a result, the charge holding capacity, which was indispensable in the past, is no longer necessary, and the aperture ratio, which was around 20% in the past, can be increased to 35% or more, and better display quality can be obtained.

[Brief description of drawings]

FIG. 1 shows a structure of a semiconductor device according to the present invention.

FIG. 2 shows a structure of a semiconductor device according to a conventional example.

FIG. 3 shows current-voltage characteristics of a conventional semiconductor device.

FIG. 4 shows current-voltage characteristics of the semiconductor device according to the present invention.

FIG. 5 shows a circuit configuration of an active matrix type liquid crystal electro-optical device according to a conventional example.

FIG. 6 is a circuit diagram of an active matrix liquid crystal electro-optical device according to a first exemplary embodiment.

FIG. 7 shows a structure of an active matrix type liquid crystal electro-optical device in Example 1.

FIG. 8 shows a process of manufacturing an active matrix type liquid crystal electro-optical device in Example 1.

FIG. 9 shows current-voltage characteristics of the P-channel TFT in the second embodiment.

FIG. 10 shows current-voltage characteristics of the N-channel TFT in the second embodiment.

FIG. 11 shows the dependency of the drain current on the anodized film thickness in Example 2.

FIG. 12 shows the dependency of the threshold voltage on the anodized film thickness in Example 2.

13 shows the dependence of electric field mobility on anodized film thickness in Example 2. FIG.

[Explanation of symbols]

 9, 25 Insulating substrate 8, 24, 52 Blocking layer 3, 19, 67, 68 Channel region 10, 28 Channel length 4, 20, 59, 62 Source region 5, 21, 60, 63 Drain region 2, 17, 55, 57 Gate insulating film 1, 15, 65, 66 Gate electrode 16, 64 Oxide layer 6, 22 Source electrode 7, 23 Drain electrode 12, 69 Interlayer insulating film 51 Glass substrate 72 Contact 75 Pixel electrode 32 Charge holding capacitor 53 NTFT Semiconductor layer 54 PTFT semiconductor layer 76 NTFT 77 PTFT

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Yasuhiko Takemura, 398 Hase, Atsugi, Kanagawa Prefecture, Semiconducting Energy Laboratory Co., Ltd. (72) Inventor Hideki Uochi 398 Hase, Atsugi City, Kanagawa Prefecture, Semiconductor Energy Laboratory Co., Ltd. (72) Inventor, Hideki Nemoto, 398, Hase, Atsugi City, Kanagawa Prefecture, Semiconductor Energy Laboratory Co., Ltd.

Claims (4)

[Claims] 1. An insulated gate field effect transistor having at least a semiconductor layer, an insulating film layer and a conductor layer on an insulating substrate, wherein a channel length is longer than a length of a gate electrode in a channel length direction. .. 2. The semiconductor device according to claim 1, wherein the channel length is approximately twice as long as the thickness of the oxide layer formed on the surface of the gate electrode, as compared with the length of the gate electrode in the channel length direction. 3. A method of manufacturing an insulated gate field effect transistor having at least a semiconductor layer, an insulating film layer and a conductor layer on an insulating substrate, the gate electrode being made of a material which can be anodized after forming the semiconductor layer and the gate insulating film layer. Forming a source or drain region by implanting impurity ions for making the semiconductor layer into p-type or n-type after forming a portion, and then performing a heat treatment process after that. A method for manufacturing a semiconductor device, comprising: 4. A method for manufacturing an insulated gate field effect transistor having at least a semiconductor layer, an insulating film layer, and a conductor layer on an insulating substrate, the gate electrode being made of a material which can be anodized after the semiconductor layer and the gate insulating film layer are formed. After forming the portion, the surface of the gate electrode portion is anodized,
A method of manufacturing a semiconductor device, further comprising a heat treatment step after implanting impurity ions for making the semiconductor layer p-type or n-type to form a source or drain region.