JPH05167051A - Solid-state image sensing device - Google Patents
Solid-state image sensing deviceInfo
- Publication number
- JPH05167051A JPH05167051A JP3327850A JP32785091A JPH05167051A JP H05167051 A JPH05167051 A JP H05167051A JP 3327850 A JP3327850 A JP 3327850A JP 32785091 A JP32785091 A JP 32785091A JP H05167051 A JPH05167051 A JP H05167051A
- Authority
- JP
- Japan
- Prior art keywords
- solid
- image pickup
- ccd
- lens
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Solid State Image Pick-Up Elements (AREA)
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は、固体撮像装置、詳しく
は、固体撮像装置の保護カバ−に付着する塵埃と使用さ
れるレンズの特性に対応して、所定のＳ／Ｎ値特性を保
証できる固体撮像装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a solid-state image pickup device, and more specifically, it guarantees a predetermined S / N value characteristic in accordance with the characteristics of dust attached to a protective cover of the solid-state image pickup device and the lens used. The present invention relates to a solid-state imaging device that can be used.
【０００２】[0002]
【従来の技術】近年、１／３インチ，１／４インチのＣ
ＣＤ等の固体撮像装置が、量産されるビデオカメラ等に
数多く使用されるようになっている。ところが、上記固
体撮像装置には光電変換面を保護するためにその前面に
透明な保護カバ−が配設されており、組立作業をクリー
ンルームで行ったとしても、該保護カバ−には製造上微
細な塵埃が付着する可能性がある。その塵埃の大きさに
よっては、正常な光電変換動作の障害になり、該塵埃の
付着により歩留まり率が非常に悪くなっていた。そこ
で、その解決策として提案された技術として、特開昭６
３−１１４１６６号公報に開示されたＣＣＤイメージセ
ンサがある。このＣＣＤイメージセンサは、従来、ＣＣ
Ｄデバイスの表面と保護ガラス外部表面の間の距離が
１．６３ｍｍとされていたのに対して、その寸法を約３
ｍｍとすることにより、保護ガラス上に付着している塵
埃の撮影に対する影響を減少させ、また、保護ガラスの
外部表面を清浄にするための作業を容易にする効果を与
えるものであった。2. Description of the Related Art Recently, C of 1/3 inch and 1/4 inch
Many solid-state imaging devices such as CDs are used in mass-produced video cameras and the like. However, the above-mentioned solid-state imaging device is provided with a transparent protective cover on its front surface in order to protect the photoelectric conversion surface, and even if the assembling work is performed in a clean room, the protective cover does not have a fine structure. Dust may adhere. Depending on the size of the dust, it interferes with the normal photoelectric conversion operation, and the adhesion of the dust causes the yield rate to be extremely poor. Therefore, as a technique proposed as a solution to the problem, Japanese Patent Laid-Open No.
There is a CCD image sensor disclosed in Japanese Patent Laid-Open No. 3-114166. This CCD image sensor is conventionally a CC
The distance between the surface of the D device and the outer surface of the protective glass was 1.63 mm, while the dimension was about 3 mm.
When the thickness is set to mm, the effect of dust adhering on the protective glass on photography is reduced, and the work for cleaning the outer surface of the protective glass is facilitated.
【０００３】[0003]
【発明が解決しようとする課題】保護ガラス上に付着し
ている塵埃のＣＣＤの光電変換に与える影響の度合に変
化を与える要因としては、上記ＣＣＤの露光面と保護ガ
ラス外部表面の間の距離の他に、適用する撮像光学系も
大きく影響するものである。例えば、撮像光学系のレン
ズの絞り値が非常に大きくなると、塵埃の大きさがある
程度小さくても、撮像光路上で占める塵埃の占有面積の
割合は大きくなり、撮像面上での光量変化のＳ／Ｎ比に
対する影響を無視することができなくなる。ところが、
前記の特開昭６３−１１４１６６号公報に開示されたＣ
ＣＤイメージセンサにおいては、単にＣＣＤデバイスの
表面と保護ガラス外部表面の間の距離を３ｍｍに指定す
るのみであって、上述のレンズの絞り値等の考慮はなさ
れていない。従って、適用される撮像光学系に適した条
件に基づいて、ＣＣＤの露光面と保護ガラス外部表面の
間の距離が選定されたものとはいえない。The factor that changes the degree of the influence of the dust adhering on the protective glass on the photoelectric conversion of the CCD is the distance between the exposed surface of the CCD and the outer surface of the protective glass. In addition, the image pickup optical system to be applied has a great influence. For example, when the aperture value of the lens of the image pickup optical system becomes very large, even if the size of the dust is small to some extent, the ratio of the area occupied by the dust on the image pickup optical path becomes large, and the change of the light amount S on the image pickup surface is increased. The influence on the / N ratio cannot be ignored. However,
C disclosed in the above-mentioned JP-A-63-114166
In the CD image sensor, the distance between the surface of the CCD device and the outer surface of the protective glass is simply specified to be 3 mm, and the above-mentioned lens aperture value and the like are not taken into consideration. Therefore, it cannot be said that the distance between the exposed surface of the CCD and the outer surface of the protective glass is selected based on the conditions suitable for the image pickup optical system to be applied.
【０００４】本発明は、上述の不具合を解決するために
なされたものであって、固体撮像装置に対して、適用さ
れる撮像光学系に適した条件に基づいて、ＣＣＤデバイ
スの表面と保護ガラス外部表面の間の距離を設定するこ
とによって、固体撮像装置の塵埃の付着による歩留まり
率を改善することを可能とする固体撮像装置を提供する
ことを目的とする。The present invention has been made to solve the above-mentioned problems, and is based on conditions suitable for an image pickup optical system applied to a solid-state image pickup device, and the surface of a CCD device and a protective glass. An object of the present invention is to provide a solid-state imaging device that can improve the yield rate due to the adhesion of dust on the solid-state imaging device by setting the distance between the outer surfaces.
【０００５】[0005]
【課題を解決するための手段】本発明の固体撮像装置
は、撮像面上に透明な保護カバ−が配されてなる固体撮
像装置において、当該想定された塵埃の最長寸法方向に
沿う寸法を△ｄ，上記固体撮像装置の光電変換出力に基
づいて得られる映像信号に対して求められるＳ／Ｎ値を
表す係数をｋ，上記固体撮像装置に対するレンズの使用
状態でのＦナンバーをＦとしたとき、上記固体撮像装置
の撮像面から上記保護カバ−の上記レンズへの対向面ま
での光路長△ｔを上記ｋ，△ｄおよびＦの積によって表
される値乃至その近傍値以上のものとすることを特徴と
する。The solid-state image pickup device of the present invention is a solid-state image pickup device in which a transparent protective cover is arranged on the image pickup surface, and the dimension of the assumed dust along the longest dimension direction is Δ. d, where k is a coefficient representing the S / N value obtained for the video signal obtained based on the photoelectric conversion output of the solid-state imaging device, and F is the F number in the usage state of the lens for the solid-state imaging device. , The optical path length Δt from the image pickup surface of the solid-state image pickup device to the surface of the protective cover facing the lens is equal to or greater than the value represented by the product of k, Δd and F or a value close thereto. It is characterized by
【０００６】[0006]
【作用】上記固体撮像装置に適用されるレンズに対応し
て設定された、固体撮像装置の撮像面から上記保護カバ
−の上記レンズへの対向面までの上記光路長△ｔを有す
る固体撮像装置を用いる。このことにより、光学系の組
立中に固体撮像装置の保護カバ−上に、当該想定された
所定の大きさ（△ｄ）、あるいは、それより小さい塵埃
が付着したとしても所定の撮像特性を満足させることが
できる。A solid-state image pickup device having the optical path length Δt from the image pickup surface of the solid-state image pickup device to the surface of the protective cover facing the lens, which is set corresponding to the lens applied to the solid-state image pickup device. To use. As a result, even if dust having a predetermined size (Δd) or smaller than the assumed size adheres to the protective cover of the solid-state image pickup device during the assembly of the optical system, the predetermined image pickup characteristic is satisfied. Can be made
【０００７】[0007]
【実施例】以下、この発明の実施例を図に基づいて説明
する。図１は、この発明の実施例を示す固体撮像装置で
あるＣＣＤを用いた撮像光学系の光路を示す断面図であ
る。この図１に示すように、ＣＣＤ１には撮像面１ｂと
その前面に透明なガラスで形成される保護カバ−１ｃが
配設されている。更に、ＣＣＤ１の光軸Ｏに沿った前方
には撮像用のレンズ２が配設されるものとする。また、
上記保護ガラス１ｃのレンズ２への対向面である保護カ
バ−表面１ｄには、製造プロセスのクリーンルームの防
塵能力から割り出される最小寸法の当該想定される塵埃
３が付着しているものとする。この実施例のＣＣＤ１に
おいては、撮像光学系の特性に基づいて、上記付着する
上記塵埃３の寸法に対し、ＣＣＤ１の性能上許容できる
保護カバ−表面１ｄと撮像面１ｂの間隔の最小値を求
め、ＣＣＤ１の外形形状が決定されるものとする。Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a sectional view showing an optical path of an image pickup optical system using a CCD which is a solid-state image pickup device showing an embodiment of the present invention. As shown in FIG. 1, the CCD 1 is provided with an image pickup surface 1b and a protective cover-1c formed of transparent glass on the front surface thereof. Further, a lens 2 for image pickup is arranged in front of the CCD 1 along the optical axis O. Also,
It is assumed that the supposed dust 3 having a minimum size determined from the dustproof capacity of the clean room in the manufacturing process is attached to the protective cover surface 1d which is the surface of the protective glass 1c facing the lens 2. In the CCD 1 of this embodiment, the minimum value of the distance between the protective cover surface 1d and the image pickup surface 1b, which is allowable in terms of the performance of the CCD 1, is obtained based on the characteristics of the image pickup optical system with respect to the size of the adhering dust 3. , The outer shape of the CCD 1 is determined.
【０００８】上記レンズ２を介してＣＣＤ１に入射した
被写体光Ｈは、撮像面１ｂ上で焦点を結ぶものとする。
なお、被写体光Ｈは、保護ガラス１ｃで屈折されて透過
する。従って、厳密には被写体光Ｈが屈折されなかった
状態、即ち、空気中を直進して伝達した状態を考えた焦
点の位置を等価撮像面として上記撮像面１ｂに当てる必
要がある。ここで、レンズ２と上記撮像面１ｂ間の焦点
距離をＬとする。また、保護カバ−表面１ｄと上記撮像
面１ｂ間の光路長を示す寸法△ｔとする。更に、上記レ
ンズ２の開口径をＤとすると、このレンズ２のＦナンバ
ーを絞り値Ｆは、 Ｆ＝Ｌ／Ｄ …………………（１） となる。但し、この値Ｆは、もっとも大きく影響する場
合を考えるとして、使用する撮像光学系で使用される範
囲での最小絞り時の値が当てられるものとする。更に、
前記当該想定される塵埃３の最長方向に沿う寸法を寸法
を△ｄとする。そして、この塵埃３のレンズ２の面に撮
像面１ｂ側から投影される同方向の大きさを△Ｄとす
る。The subject light H incident on the CCD 1 through the lens 2 is focused on the image pickup surface 1b.
The subject light H is refracted by the protective glass 1c and is transmitted. Therefore, strictly speaking, it is necessary to apply the position of the focal point in consideration of the state where the subject light H is not refracted, that is, the state where the subject light H is transmitted straight in the air, to the image pickup surface 1b as an equivalent image pickup surface. Here, the focal length between the lens 2 and the imaging surface 1b is L. Further, a dimension Δt indicating the optical path length between the protective cover surface 1d and the imaging surface 1b is set. Further, if the aperture diameter of the lens 2 is D, the F number of the lens 2 and the aperture value F are: F = L / D (1) However, assuming that the value F has the greatest influence, it is assumed that the value at the minimum aperture in the range used by the imaging optical system used is applied. Furthermore,
The dimension along the longest direction of the assumed dust 3 is Δd. The size of the dust 3 projected in the same direction on the surface of the lens 2 from the image pickup surface 1b side is ΔD.
【０００９】さて、このように構成された上記撮像光学
系において、付着する塵埃３の寸法に対する、絞り値Ｆ
とＣＣＤ１の性能上、許容できる上記保護カバ−表面１
ｄまでの寸法△ｔの関係を求める。この実施例のもので
は、ＣＣＤ１の光電変換出力に基づいて得られる映像信
号に対して求められるＳ／Ｎ値を判定の基準に考えるも
のとする。このＳ／Ｎ値は、光量の減衰値で示され、一
般的な値としては、４６ｄｂである。この値は、実光量
低下率のＳ／Ｎ値を示す係数ｋで２００に相当する。従
って、実光量低下比を満足する、上記レンズ２上の投影
塵埃３の大きさ△Ｄとレンズ２の開口径をＤとの関係
は、 Ｄ2 ／△Ｄ2 ＞ ２００ …………………（２） である必要がある。また、実際の塵埃３の寸法△ｄと上
記投影塵埃の大きさ△Ｄとの関係は、図３に示される光
路から次式のようになる。即ち、 △Ｄ2 ＝（Ｌ2 ／△ｔ2 ）・△ｄ2 ………（３） となる。In the image pickup optical system thus constructed, the aperture value F with respect to the size of the dust 3 adhering to it.
And the above-mentioned protective cover surface 1 which is acceptable in terms of the performance of CCD 1.
Find the relationship of the size Δt up to d. In this embodiment, the S / N value obtained for the video signal obtained on the basis of the photoelectric conversion output of the CCD 1 is considered as a criterion for determination. This S / N value is indicated by the attenuation value of the light amount, and is 46 dB as a general value. This value corresponds to 200 as a coefficient k indicating the S / N value of the actual light amount reduction rate. Therefore, the relationship between the size ΔD of the projection dust 3 on the lens 2 and the aperture diameter D of the lens 2 that satisfies the actual light amount reduction ratio is as follows: D 2 / ΔD 2 > 200 … (2) Must be. Further, the relationship between the actual size Δd of the dust 3 and the size ΔD of the projected dust is as follows from the optical path shown in FIG. That is, ΔD 2 = (L 2 / Δt 2 ) · Δd 2 (3)
【００１０】そこで、上記（２）式に（３）式を代入す
ると、 （Ｄ2 ・△ｔ2 ）／（Ｌ2 ・△ｄ2 ）＞２００ となり、更に、値Ｄに前記（１）を代入すると、レンズ
２の最小絞り値Ｆと保護カバ−表面１ｄまでの寸法△ｔ
に対応する許容塵埃寸法△ｄが求められる。即ち、 △ｄ＜（１／Ｆ）・（△ｔ／１４）………（４） となる。即ち、撮像装置が最小絞り値Ｆをもつレンズ２
とＣＣＤ保護カバ−面１ｄまでの光路長寸法△ｔである
ＣＣＤとで構成されるとすると、（４）式を満足する大
きさの塵埃がＣＣＤ１の表面に付着してもＣＣＤ１の光
量減衰比率上支障にならない。また、最小絞り値Ｆと組
立作業環境条件から付着可能な塵埃の最大寸法△ｄとが
与えられているとすれば、支障なく使用可能なＣＣＤ１
の保護カバ−表面１ｄまでの光路長寸法△ｔが（４）か
ら求められる。Then, substituting the equation (3) into the equation (2), (D 2 · Δt 2 ) / (L 2 · Δd 2 )> 200, and further, the value D is set to the above (1). By substituting, the minimum aperture value F of the lens 2 and the dimension Δt to the protective cover surface 1d
The allowable dust size Δd corresponding to is calculated. That is, Δd <(1 / F) · (Δt / 14) ... (4). That is, the image pickup apparatus has a lens 2 having a minimum aperture value F.
And a CCD having an optical path length dimension Δt up to the CCD protection cover surface 1d, even if dust of a size satisfying the expression (4) adheres to the surface of the CCD 1, the light quantity attenuation ratio of the CCD 1 There is no hindrance. Further, if the minimum aperture value F and the maximum size Δd of dust that can be attached are given from the assembly work environment condition, the CCD 1 that can be used without any trouble
The optical path length dimension Δt to the surface 1d of the protective cover is obtained from (4).
【００１１】具体的な数値を用いて上記の値の関係をみ
てみると、例えば、レンズ２の最小絞り値Ｆを２２、ま
た、ＣＣＤ１の保護カバ−表面１ｂまでの寸法△ｔを６
ｍｍとすれば、許容できる塵埃の寸法△ｄは、（４）式
から０．０１９４ｍｍ、即ち、１９．４μｍとなる。な
お、この実施例のものでは保護カバ−１ｃの外側の表面
に付着する塵埃を対象にするものであるから、結像面内
面には塵埃は、付着しないものとし、ＣＣＤ１のケース
と保護カバ−１ｃは、接着により固着され、内部には塵
埃は、入り込まないものとする。Looking at the relationship between the above values using concrete numerical values, for example, the minimum aperture value F of the lens 2 is 22, and the dimension Δt to the protective cover surface 1b of the CCD 1 is 6
If it is mm, the allowable dust size Δd is 0.0194 mm, that is, 19.4 μm from the equation (4). In this embodiment, since the dust that adheres to the outer surface of the protective cover-1c is targeted, it is assumed that the dust does not adhere to the inner surface of the image forming surface, and the case of the CCD1 and the protective cover. 1c is fixed by adhesion so that dust does not enter inside.
【００１２】以上のように、この実施例のＣＣＤでは、
従来例のもののように保護カバ−表面１ｄまでの寸法△
ｔを３ｍｍに限定するものではなく、撮影光学系のレン
ズの設計上の最小絞り値Ｆと組立作業環境上の想定され
る塵埃の最大寸法△ｄとの適用条件から得られるＣＣＤ
の保護カバ−表面１ｄまでの光路長寸法△ｔを適用し
て、ＣＣＤの映像信号に対するＳ／Ｎ値の所定の限度を
保証可能なＣＣＤを提供でき、また、ＣＣＤ製造時の外
部に付着する塵埃による歩留まり率を高めることが可能
となる。なお、レンズの最小絞り値Ｆと保護カバ−表面
１ｄまでの光路長が与えられている条件であれば、ＣＣ
Ｄ１に付着する許容の塵埃３の大きさ△ｄを求め、組立
作業を行うクリーンルームを上記塵埃が除去可能なもの
とするようにしてもよい。As described above, in the CCD of this embodiment,
Dimension up to the protective cover surface 1d as in the conventional example Δ
The t is not limited to 3 mm, and the CCD obtained from the application condition of the minimum aperture value F in the design of the lens of the photographing optical system and the maximum dust size Δd assumed in the assembly work environment.
By applying the optical path length dimension Δt to the surface 1d of the protective cover, it is possible to provide the CCD capable of guaranteeing the predetermined limit of the S / N value for the image signal of the CCD, and to attach it to the outside when the CCD is manufactured. It is possible to increase the yield rate due to dust. If the minimum aperture value F of the lens and the optical path length up to the protective cover surface 1d are given, CC
The size Δd of the permissible dust 3 adhering to D1 may be obtained so that the dust can be removed from the clean room in which the assembly work is performed.
【００１３】[0013]
【発明の効果】上述のように本発明の固体撮像装置は、
適用される撮像光学系の絞り値と組立作業環境上の想定
される塵埃の大きさに基づいて、固体撮像装置の結像面
と保護カバー外部表面の間の光路長を設定することによ
って、映像信号に対するＳ／Ｎ値の所定の限度を保証可
能な固体撮像装置を提供でき、更に、固体撮像装置の塵
埃の付着による歩留まり率を改善することを可能とする
など数多くの顕著な効果を有する。As described above, the solid-state image pickup device of the present invention is
By setting the optical path length between the imaging surface of the solid-state imaging device and the outer surface of the protective cover based on the aperture value of the applicable imaging optical system and the size of dust assumed in the assembly work environment, It is possible to provide a solid-state image pickup device capable of guaranteeing a predetermined limit of the S / N value for a signal, and further, it is possible to improve the yield rate due to adhesion of dust on the solid-state image pickup device, which has many remarkable effects.
【図１】本発明の一実施例を示す固体撮像装置であるＣ
ＣＤの光路を示す断面図。FIG. 1 is a solid-state image pickup device C showing an embodiment of the present invention.
Sectional drawing which shows the optical path of CD.
１ …………………ＣＣＤ（固体撮像装置） １ｂ…………………ＣＣＤの撮像面 １ｃ…………………保護カバ− １ｄ…………………保護カバ−のレンズへの対向面 △ｄ…………………塵埃の最長寸法方向に沿う寸法 ｋ …………………Ｓ／Ｎ値を表す係数 Ｆ …………………レンズの絞り値（Ｆナンバー） △ｔ……………固体撮像装置の結像面と保護ガラス外部
表面の間の光路長1 …………………… CCD (solid-state image pickup device) 1b …………………… CCD image pickup surface 1c ………………… Protection cover 1d …………………… Protection cover lens Surface facing to △ d ……………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………………… Number) △ t ……………… The optical path length between the image plane of the solid-state imaging device and the outer surface of the protective glass.
Claims (1)
る固体撮像装置において、 当該想定された塵埃の最長寸法方向に沿う寸法を△ｄ，
上記固体撮像装置の光電変換出力に基づいて得られる映
像信号に対して求められるＳ／Ｎ値を表す係数をｋ，上
記固体撮像装置に対するレンズの使用状態でのＦナンバ
ーをＦとしたとき、上記固体撮像装置の撮像面から上記
保護カバ−の上記レンズへの対向面までの光路長△ｔを
上記ｋ，△ｄおよびＦの積によって表される値乃至その
近傍値以上のものとすることを特徴とする固体撮像装
置。1. In a solid-state image pickup device having a transparent protective cover on the image pickup surface, a dimension of the assumed dust along the longest dimension direction is Δd,
When the coefficient representing the S / N value obtained for the video signal obtained based on the photoelectric conversion output of the solid-state imaging device is k and the F-number in use of the lens for the solid-state imaging device is F, The optical path length Δt from the image pickup surface of the solid-state image pickup device to the surface of the protective cover facing the lens is set to a value represented by the product of k, Δd and F or a value in the vicinity thereof. A characteristic solid-state imaging device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32785091A JP3414410B2 (en) | 1991-12-11 | 1991-12-11 | Design method of solid-state imaging device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32785091A JP3414410B2 (en) | 1991-12-11 | 1991-12-11 | Design method of solid-state imaging device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH05167051A true JPH05167051A (en) | 1993-07-02 |
| JP3414410B2 JP3414410B2 (en) | 2003-06-09 |
Family
ID=18203684
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP32785091A Expired - Fee Related JP3414410B2 (en) | 1991-12-11 | 1991-12-11 | Design method of solid-state imaging device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3414410B2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7280145B2 (en) | 2002-07-30 | 2007-10-09 | Olympus Optical Co., Ltd. | Camera and image pick-up device unit having an optical member that is vibrated to remove dust |
| US7324149B2 (en) | 2002-05-20 | 2008-01-29 | Olympus Optical Co., Ltd. | Camera and image pick-up device unit having an optical member that is vibrated to remove dust |
| US7324148B2 (en) | 2002-04-26 | 2008-01-29 | Olympus Optical Co., Ltd. | Camera and image pickup device unit used therefor having a sealing structure between a dust proofing member and an image pick up device |
| US7339623B2 (en) | 2002-05-27 | 2008-03-04 | Olympus Optical Co., Ltd. | Camera and image pickup device unit which reduce influence of dust image quality |
-
1991
- 1991-12-11 JP JP32785091A patent/JP3414410B2/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7324148B2 (en) | 2002-04-26 | 2008-01-29 | Olympus Optical Co., Ltd. | Camera and image pickup device unit used therefor having a sealing structure between a dust proofing member and an image pick up device |
| US7589780B2 (en) | 2002-04-26 | 2009-09-15 | Olympus Optical Co., Ltd. | Camera and image pick-up device unit used therefor having a sealing structure between a dust-proofing member and an image pick-up device |
| US7324149B2 (en) | 2002-05-20 | 2008-01-29 | Olympus Optical Co., Ltd. | Camera and image pick-up device unit having an optical member that is vibrated to remove dust |
| US7339623B2 (en) | 2002-05-27 | 2008-03-04 | Olympus Optical Co., Ltd. | Camera and image pickup device unit which reduce influence of dust image quality |
| US7280145B2 (en) | 2002-07-30 | 2007-10-09 | Olympus Optical Co., Ltd. | Camera and image pick-up device unit having an optical member that is vibrated to remove dust |
| US7591598B2 (en) | 2002-07-30 | 2009-09-22 | Olympus Optical Co., Ltd. | Camera having a dust-proofing member that is vibrated to remove dust, the dust-proofing member being pressed by a spring pressing member toward a sealing part that seals a space between the dust-proofing member and an image pickup-device |
| US7686524B2 (en) | 2002-07-30 | 2010-03-30 | Olympus Optical Co., Ltd. | Image pick-up device unit having a dust-proofing member that is vibrated to remove dust, the dust-proofing member being pressed by a spring pressing member toward a sealing structure that seals an interval between the dust-proofing member and an image pick-up device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3414410B2 (en) | 2003-06-09 |
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