JPH0472181B2 - - Google Patents

Info

Publication number
JPH0472181B2
JPH0472181B2 JP57149604A JP14960482A JPH0472181B2 JP H0472181 B2 JPH0472181 B2 JP H0472181B2 JP 57149604 A JP57149604 A JP 57149604A JP 14960482 A JP14960482 A JP 14960482A JP H0472181 B2 JPH0472181 B2 JP H0472181B2
Authority
JP
Japan
Prior art keywords
output
average value
light
photoelectric converter
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57149604A
Other languages
Japanese (ja)
Other versions
JPS5937466A (en
Inventor
Yoshiaki Ida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP57149604A priority Critical patent/JPS5937466A/en
Publication of JPS5937466A publication Critical patent/JPS5937466A/en
Publication of JPH0472181B2 publication Critical patent/JPH0472181B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Description

【発明の詳細な説明】 この発明は例えば加速度等の被測定量を光学的
な変化としてとらえ、その変化から被測定量に比
例した電気出力を得るようにした光学的測定装置
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical measuring device that captures a measured quantity such as acceleration as an optical change, and obtains an electrical output proportional to the measured quantity from the change.

従来の光学的測定装置は光学計(光源、光伝送
路、光センサ、光電変換器等)の異常を監視して
いないため、例えば光源が劣化して測定装置の出
力に異常をきたしても、異常であることがわから
なかつた。特にこの測定装置の出力を常時連続し
て使う場合は問題であつた。
Conventional optical measurement devices do not monitor abnormalities in the optical meter (light source, optical transmission line, optical sensor, photoelectric converter, etc.), so even if the light source deteriorates and the output of the measurement device becomes abnormal, I had no idea that it was abnormal. This was particularly problematic when the output of this measuring device was used continuously.

この発明は上記のような従来のものの欠点を除
去するためになされたもので、光源と光電変換器
の出力とがある一定の範囲内に入つているか否か
を常時監視することにより、異常の有無を使用者
に知らせ、測定装置を正常な状態で使用させるこ
とを目的としたものである。
This invention was made to eliminate the drawbacks of the conventional ones as described above, and by constantly monitoring whether the output of the light source and the photoelectric converter are within a certain range, it is possible to detect abnormalities. The purpose of this is to inform the user of the presence or absence of the measurement device and to allow the user to use the measurement device in a normal condition.

以下図に示すこの発明の一実施例について説明
する。図はこの発明に係る光学的測定装置の一実
施例を示す構成図で、図において、1は例えば
LEDである光源、2は光源1の駆動電流を検出
するための第1の検出抵抗、3は光源1の光を伝
送すれための第1の光フアイバ、4は例えば電界
中に設置され被測定量である電圧に応じて第1の
光フアイバ3からの入射光を強度変化させる光セ
ンサ、5は光センサ4の出射光を伝送するための
第2の光フアイバ、6は第2の光フアイバ5から
の光を電気信号に変換する例えばフオトダイオー
ドである光電変換器、7は光電変換器6の出力を
検出する第2の検出抵抗、8は第1の検出抵抗2
の出力が第1の所定範囲外になると出力を生じる
第1のウインドコンパレータ、9は第2の検出抵
抗7の出力の平均値を得る平均値回路、10は平
均値回路9の出力が第2の所定範囲外になると出
力を生じる第2のウインドコンパレータ、11は
第1、第2のウインドコンパレータ8,10の少
なくとも何れか一方が出力を生じると付勢されて
出力を生じるオア回路、12はオア回路11の出
力によつて付勢され装置が異常であることを表示
する表示器、13は第2の検出抵抗7の交流成分
出力と平均値回路9の出力との比によつて例えば
電圧である被測定量に比例した出力を生じる処理
回路である。
An embodiment of the present invention shown in the drawings will be described below. The figure is a configuration diagram showing an embodiment of the optical measuring device according to the present invention, and in the figure, 1 is, for example,
The light source is an LED; 2 is a first detection resistor for detecting the drive current of light source 1; 3 is a first optical fiber for transmitting the light from light source 1; 4 is a device placed in an electric field to be measured. 5 is a second optical fiber for transmitting the light emitted from the optical sensor 4; 6 is a second optical fiber; A photoelectric converter such as a photodiode converts the light from 5 into an electrical signal, 7 is a second detection resistor that detects the output of the photoelectric converter 6, and 8 is the first detection resistor 2.
a first window comparator that generates an output when the output of the second detection resistor 7 is out of the first predetermined range; 9 an average value circuit that obtains the average value of the output of the second detection resistor 7; 11 is an OR circuit that is energized to produce an output when at least one of the first and second window comparators 8 and 10 produces an output, and 12 is an OR circuit that produces an output when An indicator 13 is energized by the output of the OR circuit 11 to indicate that the device is abnormal. This is a processing circuit that produces an output proportional to the measured quantity.

次に動作について説明する。光源1はその駆動
電流に応じた輝度を発する。このため駆動電流が
一定になるように設定しておけば、一定の光が第
1の光フアイバ3に伝搬し、光センサ4に入射す
る。光センサ4は例えば電界中に設置され、被測
定量である電圧に応じて第1の光フアイバ3から
の入射光を強度変化して出射する。光センサ4と
しては、例えば偏光子、光弾性素子、検光子等で
構成される加速度センサで、振動加速度により一
定の入射光が輝度変調されて出射されるものが用
いられる。光センサ4からの出射光は第2の光フ
アイバ5を伝搬して光電変換器6に照射され、光
電変換器6はその照射された光に応じた電流を第
2の検出抵抗7に流して電圧に変換する。この電
圧の平均値を平均値回路9で求める。また、この
平均値に対する第2の検出抵抗7に現われる電圧
の交流成分の比は、光センサ4における変調度が
一定であるため、光源1の劣化並びに第1、第2
の光フアイバ3,5の伝搬損失の変化等で光量が
変化しても一定となる。従つて、処理回路13に
おいて第2の検出抵抗7に現われる電圧の交流成
分を平均値回路9で求められる平均値で割算する
ことにより、常に正確な被測定量である電圧を求
めることができる。
Next, the operation will be explained. The light source 1 emits brightness according to its driving current. Therefore, if the drive current is set to be constant, a constant amount of light will propagate to the first optical fiber 3 and enter the optical sensor 4. The optical sensor 4 is installed, for example, in an electric field, and emits the incident light from the first optical fiber 3 with the intensity changed depending on the voltage as the measured quantity. As the optical sensor 4, there is used an acceleration sensor composed of, for example, a polarizer, a photoelastic element, an analyzer, etc., which emits a certain amount of incident light that is luminance-modulated by vibration acceleration. The light emitted from the optical sensor 4 propagates through the second optical fiber 5 and is irradiated onto the photoelectric converter 6, and the photoelectric converter 6 causes a current corresponding to the irradiated light to flow through the second detection resistor 7. Convert to voltage. The average value of this voltage is determined by an average value circuit 9. Moreover, since the degree of modulation in the optical sensor 4 is constant, the ratio of the AC component of the voltage appearing at the second detection resistor 7 to this average value is determined by the deterioration of the light source 1 and the
The amount of light remains constant even if the amount of light changes due to changes in the propagation loss of the optical fibers 3 and 5. Therefore, by dividing the alternating current component of the voltage appearing at the second detection resistor 7 in the processing circuit 13 by the average value determined by the average value circuit 9, it is possible to always obtain an accurate voltage, which is the measured quantity. .

次に、光源1または光電変換器6が断線、シヨ
ートした場合、処理回路13の出力が異常な値と
なる。また光源1が大きく劣化したり、第1、第
2の光フアイバ3,5等が伝搬損失が異常に大き
くなつた場合、処理回路13では補償しきれず精
度が悪くなる。あるいは光電変換器6は所定量以
上の光量ではその出力が処理回路13中の割算機
の許容値以上になるので、これもまた測定精度が
悪くなる。更に半導体光源や半導体光電変換機に
過大な電流が流れるとこれら半導体の劣化を早め
るのである。従つて、光源1の駆動電流を第1の
検出抵抗2で電圧に変換し、この電圧が第1の所
定範囲(補償できる範囲)以外であると、第1の
ウインドコンパレータ8が付勢されて出力を生
じ、オアゲート11を付勢して表示器12に異常
を表示させるようにしている。また光電変換器6
側においても、平均値回路9の出力が第2の所定
範囲(補償できる範囲)以外であると、第2のウ
インドコンパレータ8が付勢されて出力を生じ、
オアゲート11を付勢して表示器12に異常を表
示させる。すなわち第1、第2の検出抵抗2,7
に現われる電圧は、光源1、光電変換器6が断線
すれば零になるし、シヨートすれば異常に高くな
る。また光源1が劣化したり、第1、第2の光フ
アイバ3,5等で伝搬損失が異常に大きくなつて
も、光電変換器6側の出力は低下する。従つて、
第1、第2のウインドコンパレータ8,10にお
いて第1の検出抵抗2、平均値回路9の出力が第
1、第2の所定範囲外になることを検出して、異
常を検出することができる。
Next, when the light source 1 or the photoelectric converter 6 is disconnected or shot, the output of the processing circuit 13 becomes an abnormal value. Furthermore, if the light source 1 deteriorates significantly or the propagation loss of the first and second optical fibers 3, 5, etc. becomes abnormally large, the processing circuit 13 cannot compensate and the accuracy deteriorates. Alternatively, the output of the photoelectric converter 6 exceeds the allowable value of the divider in the processing circuit 13 when the amount of light exceeds a predetermined amount, which also deteriorates measurement accuracy. Furthermore, when an excessive current flows through a semiconductor light source or a semiconductor photoelectric converter, the deterioration of these semiconductors is accelerated. Therefore, when the drive current of the light source 1 is converted into a voltage by the first detection resistor 2, and this voltage is outside the first predetermined range (compensable range), the first window comparator 8 is activated. An output is generated, the OR gate 11 is energized, and an abnormality is displayed on the display 12. Also photoelectric converter 6
On the side, if the output of the average value circuit 9 is outside the second predetermined range (compensable range), the second window comparator 8 is energized and produces an output,
The OR gate 11 is energized to display an abnormality on the display 12. That is, the first and second detection resistors 2 and 7
If the light source 1 or the photoelectric converter 6 is disconnected, the voltage appearing on the light source 1 or the photoelectric converter 6 will become zero, and if the light source 1 or the photoelectric converter 6 is shorted, it will become abnormally high. Further, even if the light source 1 deteriorates or the propagation loss becomes abnormally large in the first and second optical fibers 3, 5, etc., the output on the photoelectric converter 6 side will decrease. Therefore,
An abnormality can be detected by detecting that the outputs of the first detection resistor 2 and the average value circuit 9 are outside the first and second predetermined ranges in the first and second window comparators 8 and 10. .

なお、上記実施例では電圧の測定について述べ
たが、その他温度等の物理量の測定であつてもよ
い。
Note that although the above embodiments have described the measurement of voltage, other physical quantities such as temperature may also be measured.

以上のようにこの発明によれば、光学系の異常
を常時監視することにより、常に信頼できる正確
な被測定量に応じた出力を得ることができ、異常
時には異常を表示するこができる効果を有する。
As described above, according to the present invention, by constantly monitoring abnormalities in the optical system, it is possible to obtain reliable and accurate output according to the measured quantity at all times, and when an abnormality occurs, it is possible to display the abnormality. have

【図面の簡単な説明】[Brief explanation of the drawing]

図はこの発明に係る光学的測定装置の一実施例
を示す構成図である。 図において、1は光源、2は第1の検出抵抗、
3は第1の光フアイバ、4は光センサ、5は第2
の光フアイバ、6は光電変換器、7は第2の検出
抵抗、8は第1のウインドコンパレータ、9は平
均値回路、10は第2のウインドコンパレータ、
11はオア回路、12は表示器、13は処理回路
である。
The figure is a configuration diagram showing an embodiment of an optical measuring device according to the present invention. In the figure, 1 is a light source, 2 is a first detection resistor,
3 is the first optical fiber, 4 is the optical sensor, and 5 is the second optical fiber.
, 6 is a photoelectric converter, 7 is a second detection resistor, 8 is a first window comparator, 9 is an average value circuit, 10 is a second window comparator,
11 is an OR circuit, 12 is a display, and 13 is a processing circuit.

Claims (1)

【特許請求の範囲】 1 一定の駆動電流で駆動される半導体光源、前
記光源からの光を受けこれを被測定量に応じて強
度変調して出射する光センサ、この光センサから
の出射光を受け前記出射光を電気信号に変換する
半導体光電変換器、および前記光電変換器の出力
から前記被測定量に対応した電気出力を取出す処
理回路を備え、前記処理回路は前記光電変換器の
出力の平均値を得る平均値回路を含んでいて前記
光電変換器の出力の瞬時値を前記平均値回路の平
均値で割り算して前記電気出力を出すようにした
光学的測定装置において、 前記光源の駆動電流値が所定範囲内にあるかい
なかを判別するウインドコンパレータ、前記平均
値回路の平均値が所定範囲内にあるか否かを判別
するウインドコンパレータ、およびこれらウイン
ドコンパレータの少なくとも一方が出力すると装
置自体の異常を表示する手段を具備したことを特
徴とする光学的測定装置。
[Scope of Claims] 1. A semiconductor light source driven by a constant drive current, an optical sensor that receives light from the light source, modulates the intensity of the light according to the amount to be measured, and emits the light, and emits the light emitted from the optical sensor. A semiconductor photoelectric converter receives and converts the emitted light into an electrical signal, and a processing circuit extracts an electrical output corresponding to the measured quantity from the output of the photoelectric converter, and the processing circuit converts the output of the photoelectric converter into an electrical signal. An optical measuring device including an average value circuit for obtaining an average value, and configured to output the electric output by dividing the instantaneous value of the output of the photoelectric converter by the average value of the average value circuit, comprising: driving the light source; A window comparator that determines whether the current value is within a predetermined range, a window comparator that determines whether the average value of the average value circuit is within a predetermined range, and when at least one of these window comparators outputs, the device itself An optical measuring device characterized by comprising means for displaying an abnormality in the.
JP57149604A 1982-08-26 1982-08-26 Optical measuring device Granted JPS5937466A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57149604A JPS5937466A (en) 1982-08-26 1982-08-26 Optical measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57149604A JPS5937466A (en) 1982-08-26 1982-08-26 Optical measuring device

Publications (2)

Publication Number Publication Date
JPS5937466A JPS5937466A (en) 1984-02-29
JPH0472181B2 true JPH0472181B2 (en) 1992-11-17

Family

ID=15478832

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57149604A Granted JPS5937466A (en) 1982-08-26 1982-08-26 Optical measuring device

Country Status (1)

Country Link
JP (1) JPS5937466A (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5434624U (en) * 1977-08-12 1979-03-07
JPS5434624B2 (en) * 1974-12-27 1979-10-27
JPS557604A (en) * 1978-06-20 1980-01-19 Komatsu Ltd Detector for displacement
JPS5781776A (en) * 1980-11-10 1982-05-21 Mitsubishi Electric Corp Facsimile equipment
JPS5781766A (en) * 1980-11-11 1982-05-21 Ricoh Co Ltd Storage system of picture information

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5434624B2 (en) * 1974-12-27 1979-10-27
JPS5434624U (en) * 1977-08-12 1979-03-07
JPS557604A (en) * 1978-06-20 1980-01-19 Komatsu Ltd Detector for displacement
JPS5781776A (en) * 1980-11-10 1982-05-21 Mitsubishi Electric Corp Facsimile equipment
JPS5781766A (en) * 1980-11-11 1982-05-21 Ricoh Co Ltd Storage system of picture information

Also Published As

Publication number Publication date
JPS5937466A (en) 1984-02-29

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