JPH0444314A - Semiconductor substrate processor - Google Patents
Semiconductor substrate processorInfo
- Publication number
- JPH0444314A JPH0444314A JP15307390A JP15307390A JPH0444314A JP H0444314 A JPH0444314 A JP H0444314A JP 15307390 A JP15307390 A JP 15307390A JP 15307390 A JP15307390 A JP 15307390A JP H0444314 A JPH0444314 A JP H0444314A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- semiconductor substrate
- pipe
- furnace
- heat exchanger
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 35
- 239000000758 substrate Substances 0.000 title claims abstract description 31
- 239000002994 raw material Substances 0.000 claims abstract description 10
- 238000007599 discharging Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 3
- 238000009825 accumulation Methods 0.000 claims 2
- 238000010438 heat treatment Methods 0.000 claims 1
- 239000010453 quartz Substances 0.000 abstract description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 6
- 238000005452 bending Methods 0.000 abstract description 2
- 239000000463 material Substances 0.000 abstract 2
- 230000000149 penetrating effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 2
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は半導体装置の製造に用いる半導体基板処理装
置に関するものである0
〔従来の技術〕
第2図は従来の半導体基板処理装置を示す断面図である
。図において(1)は被処理半導体基板、(2)は半導
体基板(1)を処理する炉、(3ンは炉(2)内で半導
体基板(1)を処理する際に半導体基板(1)を並べる
ボー ) 、(4)は炉(2)内の温度を上げるための
ヒーター(5)は炉(2)内にガスを供給するためのガ
ス供給口、〔6)はガス供給口(5)より炉(2)内に
ガスを供給するための原料ガスボンベ、(7)Fi炉(
2)内で半導体基板(1)を処理したガスを排出するガ
ス排出口、GOは原料ガスボンへ(6)とガス供給口(
5)とを継ぐガスパイプである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a semiconductor substrate processing apparatus used for manufacturing semiconductor devices. [Prior Art] Fig. 2 is a cross section showing a conventional semiconductor substrate processing apparatus. It is a diagram. In the figure, (1) is the semiconductor substrate to be processed, (2) is the furnace that processes the semiconductor substrate (1), and (3) is the semiconductor substrate (1) that is used when processing the semiconductor substrate (1) in the furnace (2). ), (4) is the heater (5) for raising the temperature inside the furnace (2), is the gas supply port for supplying gas into the furnace (2), and [6] is the gas supply port (5). ) to supply gas into the furnace (2), (7) Fi furnace (
2) is a gas exhaust port for discharging the gas that processed the semiconductor substrate (1) in the gas supply port (6) to the raw material gas cylinder (6).
5) This is a gas pipe that connects the
次にこのようにして構成される半導体基板処理装置によ
る処理方法を説明する。まず被処理半導体基板(1)は
ボート(3)上に並べられ、io−) (3)とともに
炉(2)内に挿入される。この後、ヒーター(4)等を
使用して、炉(2)内の気圧、温度を設定したのち、ガ
ス供給管(5)より炉(2)内にガスを吸引し、所定の
処理が行われる。炉(2)内での処理が終了すると半導
体基板(1)を並べたボート(3)は炉(2)外へ取り
出され、処理済みの半導体基板(1)をボート(3)よ
りおろす。半導体基板(1)は以上のようにして処理さ
れ、処理中、炉(2)内で使用されたガスはガス排出口
(7)より炉(2)外に排出される。Next, a processing method using the semiconductor substrate processing apparatus configured in this manner will be explained. First, semiconductor substrates to be processed (1) are arranged on a boat (3) and inserted into a furnace (2) together with io-) (3). After this, the pressure and temperature inside the furnace (2) are set using a heater (4), etc., and then gas is sucked into the furnace (2) through the gas supply pipe (5), and the prescribed process is carried out. be exposed. When the processing in the furnace (2) is completed, the boat (3) on which the semiconductor substrates (1) are lined up is taken out of the furnace (2), and the processed semiconductor substrates (1) are unloaded from the boat (3). The semiconductor substrate (1) is processed as described above, and the gas used in the furnace (2) during processing is discharged to the outside of the furnace (2) from the gas outlet (7).
従来の半導体基板処理装置は以上のようであり、炉(2
)内で使用されたガスはガス排出口(7)よF)炉(2
>外に排出されるのであるが、炉(2)内で高温度まで
熱せられたガスは高温度のまま排出されておシ、熱エネ
ルギーが無駄になってしまうという問題点があった0こ
の発明は上記のような問題点を解消するためになされた
もので、排出されたガスの熱エネルギーを再利用し、二
本〜ギーの損失を少なくした半導体基板処理装置を得る
ことを目的とする0
(111題を解決するための手段〕
この発明に係る半導体基板処理装置は、排出口から排出
されるガスを一旦、滞溜するガス滞溜部と、原料ガスを
導入するガス導入管が前記ガス滞溜部内を貫通し死後、
半導体処理手段本体のガス導入口に接続される導入部か
ら構成される熱交換手段を備えたものである。The conventional semiconductor substrate processing equipment is as described above, and has a furnace (2
) The gas used in F) is transferred from the gas outlet (7) to the furnace (2).
>The gas heated to a high temperature in the furnace (2) is discharged outside, but the problem is that the gas is discharged at a high temperature, resulting in wasted thermal energy. The invention was made to solve the above-mentioned problems, and its purpose is to reuse the thermal energy of the exhausted gas and to obtain a semiconductor substrate processing apparatus that reduces the loss of energy. 0 (Means for Solving Problem 111) In the semiconductor substrate processing apparatus according to the present invention, the gas retention section for temporarily retaining the gas discharged from the exhaust port and the gas introduction pipe for introducing the raw material gas are arranged as described above. Penetrates the inside of the gas reservoir and after death,
It is equipped with a heat exchange means constituted by an introduction part connected to a gas introduction port of the semiconductor processing means main body.
この発明において、半導体処理手段本体に熱交換手段を
設けることによシ、熱エネルギーの再利用が出来る0
〔実施例〕
以下、この発明の一実施例を図について説明する。第1
図はこの発明のjil!施例を示す半導体基板処理装置
の断面図である。図において(1)〜(7)は従来例に
おけるものと同等のものである。In this invention, thermal energy can be reused by providing a heat exchange means in the main body of the semiconductor processing means. [Embodiment] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. 1st
The figure is a diagram of this invention! 1 is a cross-sectional view of a semiconductor substrate processing apparatus showing an example. In the figure, (1) to (7) are equivalent to those in the conventional example.
(8)は熱交換器であり、石英製の中空状のチャンバー
(8a)と、このチャンバー(8&)内を屈曲しながら
に通する石英製のパイプ(8b)と、ガス排気口(8o
)とで構成されており、(1)〜(7)からなる半導体
基板処理装置のガス排出口(7)に接続される。また、
αGは原料ガスボンベ(6)より、炉(2)内にガスを
供給するためのガスパイプであシ、このガスパイプ00
は原料ガスボンベ(6)と熱交換器(8)内パイプ(8
b)とを接続しているパイプ(lo&)と、熱交換器(
8)内パイプ(8b)と炉(2)内のガス供給口(5)
とを接続している石英製バイブ(lob )とで構成さ
れている。この発明の一実施例による半導体基板処理装
置は、以上のように構成されているので、炉(2)内で
高温にまで熱せられ、使用されたガスは半導体基板処理
装置のガス排気口(7)に接続された熱交換#(8)内
に導入され、熱交換器(8)内を通っているパイプ(8
b)内の原料ガスと熱交換を行う。(8) is a heat exchanger, which includes a hollow chamber (8a) made of quartz, a pipe (8b) made of quartz that passes through the chamber (8&) while bending, and a gas exhaust port (8o).
), and is connected to the gas exhaust port (7) of the semiconductor substrate processing apparatus consisting of (1) to (7). Also,
αG is a gas pipe for supplying gas from the raw material gas cylinder (6) into the furnace (2), and this gas pipe 00
is the raw material gas cylinder (6) and the pipe (8) inside the heat exchanger (8).
b) and the pipe (lo&) connecting it to the heat exchanger (
8) Inner pipe (8b) and gas supply port (5) in the furnace (2)
It consists of a quartz vibrator (lob) connected to the Since the semiconductor substrate processing apparatus according to one embodiment of the present invention is configured as described above, the gas used is heated to a high temperature in the furnace (2) and the gas is discharged through the gas exhaust port (7) of the semiconductor substrate processing apparatus. ) is introduced into the heat exchanger # (8) and passes through the heat exchanger (8).
b) Performs heat exchange with the raw material gas in
その結果、パイプ(8b)内の原料ガスは暖められてガ
ス供給口(5)より炉(2)内に供給される。As a result, the raw material gas in the pipe (8b) is warmed and supplied into the furnace (2) through the gas supply port (5).
以上のように半導体基板(1)の処理中に排出されるガ
スは従来のもののようKi*温状態のままで排出される
ことなく熱エネルギーの再利用が行われる0
〔発明の効果〕
以上のようにこの発明によれば、半導体基板処理装置に
熱交換器を接続したので、エネルギー効率の向上がはか
られるという優れた効果が得られる0As described above, the gas discharged during the processing of the semiconductor substrate (1) is not discharged in the Ki* temperature state as in the conventional case, but the thermal energy is reused. According to this invention, since a heat exchanger is connected to a semiconductor substrate processing apparatus, an excellent effect of improving energy efficiency can be obtained.
第1図はこの発明の一実施例を示す半導体基板処理装置
の断面図、第2図は従来の半導体基板処理装置の断面図
である。
図において、(2)は炉、(4)はヒーター、(5)は
ガス供給口、(6)は原料ガスボンベ、(7)はガス排
出口、(8)は熱交換器、(9)はガス排気口、aoは
ガスパイプである。
なお、各図中、同一符号は同一、又は相当部分を示す。
代理人 大 岩 増 雄FIG. 1 is a sectional view of a semiconductor substrate processing apparatus showing an embodiment of the present invention, and FIG. 2 is a sectional view of a conventional semiconductor substrate processing apparatus. In the figure, (2) is the furnace, (4) is the heater, (5) is the gas supply port, (6) is the raw gas cylinder, (7) is the gas discharge port, (8) is the heat exchanger, and (9) is the The gas exhaust port ao is a gas pipe. In each figure, the same reference numerals indicate the same or equivalent parts. Agent Masuo Oiwa
Claims (1)
導体基板処理手段本体と、この半導体基板処理手段本体
内で使用されたガスを排出するガス排出口と、この排出
口から排出されるガスを一旦滞溜するガス滞溜部と、前
記原料ガスを導入するガス導入管が前記ガス滞溜部内を
貫通した後、前記半導体処理手段本体のガス導入口に接
続されるガス導入部から構成される熱交換手段からなる
半導体基板処理装置。A semiconductor substrate processing means body into which raw material gas is introduced to process semiconductor substrates, a gas exhaust port for discharging the gas used in the semiconductor substrate processing means body, and a gas discharge port for discharging the gas discharged from the exhaust port. A heat treatment system consisting of a gas accumulation section in which the gas accumulates, and a gas introduction section that is connected to the gas introduction port of the semiconductor processing means main body after the gas introduction pipe for introducing the raw material gas passes through the gas accumulation section. A semiconductor substrate processing device consisting of an exchange means.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15307390A JPH0444314A (en) | 1990-06-11 | 1990-06-11 | Semiconductor substrate processor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15307390A JPH0444314A (en) | 1990-06-11 | 1990-06-11 | Semiconductor substrate processor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0444314A true JPH0444314A (en) | 1992-02-14 |
Family
ID=15554391
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15307390A Pending JPH0444314A (en) | 1990-06-11 | 1990-06-11 | Semiconductor substrate processor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0444314A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003051505A (en) * | 2001-06-01 | 2003-02-21 | Semiconductor Energy Lab Co Ltd | Apparatus and method for heat treatment |
US7879693B2 (en) | 2001-06-01 | 2011-02-01 | Semiconductor Energy Laboratory Co., Ltd. | Thermal treatment equipment and method for heat-treating |
US7974524B2 (en) | 2001-03-16 | 2011-07-05 | Semiconductor Energy Laboratory Co., Ltd. | Heat treatment apparatus and heat treatment method |
US20130272930A1 (en) * | 2009-02-17 | 2013-10-17 | Mcalister Technologies, Llc | Induction for thermochemical processes, and associated systems and methods |
US9617983B2 (en) | 2011-08-12 | 2017-04-11 | Mcalister Technologies, Llc | Systems and methods for providing supplemental aqueous thermal energy |
-
1990
- 1990-06-11 JP JP15307390A patent/JPH0444314A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7974524B2 (en) | 2001-03-16 | 2011-07-05 | Semiconductor Energy Laboratory Co., Ltd. | Heat treatment apparatus and heat treatment method |
US9666458B2 (en) | 2001-03-16 | 2017-05-30 | Semiconductor Energy Laboratory Co., Ltd. | Heat treatment apparatus and heat treatment method |
JP2003051505A (en) * | 2001-06-01 | 2003-02-21 | Semiconductor Energy Lab Co Ltd | Apparatus and method for heat treatment |
US7879693B2 (en) | 2001-06-01 | 2011-02-01 | Semiconductor Energy Laboratory Co., Ltd. | Thermal treatment equipment and method for heat-treating |
US7923352B2 (en) | 2001-06-01 | 2011-04-12 | Semiconductor Energy Laboratory Co., Ltd. | Thermal treatment equipment and method for heat-treating |
US8318567B2 (en) | 2001-06-01 | 2012-11-27 | Semiconductor Energy Laboratory Co., Ltd. | Thermal treatment equipment and method for heat-treating |
US20130272930A1 (en) * | 2009-02-17 | 2013-10-17 | Mcalister Technologies, Llc | Induction for thermochemical processes, and associated systems and methods |
US9617983B2 (en) | 2011-08-12 | 2017-04-11 | Mcalister Technologies, Llc | Systems and methods for providing supplemental aqueous thermal energy |
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