JPH04350544A - Quality judging apparatus for grain particle - Google Patents

Quality judging apparatus for grain particle

Info

Publication number
JPH04350544A
JPH04350544A JP15115391A JP15115391A JPH04350544A JP H04350544 A JPH04350544 A JP H04350544A JP 15115391 A JP15115391 A JP 15115391A JP 15115391 A JP15115391 A JP 15115391A JP H04350544 A JPH04350544 A JP H04350544A
Authority
JP
Japan
Prior art keywords
sample
grain
hole
suction
decompression
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15115391A
Other languages
Japanese (ja)
Inventor
Toru Shimohara
下原 融
Yoshitake Aoshima
由武 青島
Masanori Sugimoto
真規 杉本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shizuoka Seiki Co Ltd
Original Assignee
Shizuoka Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shizuoka Seiki Co Ltd filed Critical Shizuoka Seiki Co Ltd
Priority to JP15115391A priority Critical patent/JPH04350544A/en
Publication of JPH04350544A publication Critical patent/JPH04350544A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To achieve higher quality judging accuracy with the prevention of noises by providing a hole for a sample of a rotatable disc with a suction mechanism to fix a sample grain particle by suction to block a change in attitude of the sample grain. CONSTITUTION:A sample grain S being transferred held in a hole 8 for samples provided in the circumferential direction of an outer periphery of a disc 6 at an equal interval is held stable with a holding section 8-1 on the side of the top surface 16 with a hole of a diameter larger than that of a pierced part 8-2 on the side of the undersurface 18 while blocked form changing in attitude. In a suction mechanism 20, a decompression fan 42 is driven with a decompression motor 40 at a decompression section 24 to discharge ait in a decompression space 28 negative and the resulting negative pressure is transmitted to a suction space 28 through a communication path 44 to act on the through hole 8-2 so that the grain S is fixed on the holding part 8-1 by suction to keep it at a fixed attitude. This can prevent a change in incident light into the grain S thereby enabling the obtaining of a detection value without noise with a reduction in change of reflected light and transmission light of the grain S.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】この発明は穀粒の品質判定装置に
係り、特に回転可能な円板の試料用孔に保持されて移送
される試料穀粒の姿勢変化を阻止し得て判定精度を向上
し得る穀粒の品質判定装置に関する。
[Field of Industrial Application] This invention relates to a grain quality determination device, and in particular, it is capable of preventing changes in the posture of sample grains held and transferred in a sample hole of a rotatable disk, thereby improving determination accuracy. The present invention relates to a grain quality determination device that can be improved.

【0002】0002

【従来の技術】穀粒の品質判定装置は、外周縁の円周方
向等間隔に複数の試料用孔を有する回転可能な円板を設
け、この円板の試料用孔に保持されて移送される試料穀
粒の一粒毎に光の状態、例えば、透過光およびまたは反
射光を検出し、その検出値により穀粒について良質粒や
不良粒、胴割粒等の判定を行うものである。
[Prior Art] A grain quality determination device is provided with a rotatable disk having a plurality of sample holes at equal intervals in the circumferential direction on the outer periphery, and the grain is transferred while being held in the sample holes of this disk. The light condition, for example, transmitted light and/or reflected light, is detected for each sample grain, and the detected values are used to determine whether the grain is of good quality, defective, or split.

【0003】このような穀粒の品質判定装置としては、
この発明の出願人により既に出願され、例えば、特開昭
63−103947号公報に開示されているものがある
。この公報に開示のものは、外周縁の円周方向等間隔に
複数の試料用孔を有する回転可能な円板を傾斜させて設
け、この円板の傾斜最上部位から試料穀粒の移送方向前
方の下降した位置に検出部を設けることにより、円板の
試料用孔に保持されて移送される試料穀粒の状態が安定
する位置において光の状態を検出し得て、誤判定の防止
を図ったものである。
[0003] As such a grain quality determination device,
An application has already been filed by the applicant of the present invention, and is disclosed in, for example, Japanese Patent Laid-Open No. 103947/1983. What is disclosed in this publication is that a rotatable disk having a plurality of sample holes at equal intervals in the circumferential direction on the outer periphery is provided in an inclined manner, and the sample grain is transferred from the top of the disk toward the front in the direction of transfer. By providing the detection unit at the lowered position of the disc, the state of light can be detected at a position where the state of the sample grain held in the sample hole of the disk and transferred is stable, thereby preventing misjudgment. It is something that

【0004】0004

【発明が解決しようとする課題】ところで、従来の穀粒
の品質判定装置においては、品種や作柄等により試料穀
粒の大きさにばらつきがあるので、これらばらつきに対
応し得るように、円板の試料用孔の大きさを大きめに設
定している。したがって、試料穀粒は、円板の試料用孔
に不安定な姿勢で保持されており、移送される間に複雑
に姿勢が変化する問題がある。即ち、円板の試料用孔に
保持されて移送される試料穀粒は、円板の回転方向の力
や底面との摩擦力、重力等の相互作用により、試料用孔
内において複雑に姿勢を変化しながら移送されることに
なる。
[Problems to be Solved by the Invention] However, in conventional grain quality determination devices, the size of sample grains varies depending on the variety, crop, etc. The size of the sample hole is set large. Therefore, the sample grain is held in an unstable position in the sample hole of the disk, and there is a problem in that the position changes in a complicated manner while being transferred. In other words, the sample grains held in the sample hole of the disk and transferred undergo complicated postures within the sample hole due to interactions such as the force in the rotational direction of the disk, the frictional force with the bottom surface, and gravity. It will be transported while changing.

【0005】このため、このように試料用孔内において
複雑に姿勢変化する試料穀粒の光の状態を検出すべく光
を照射すると、試料穀粒に対する入射光の変化が惹起さ
れることになる。この結果、試料穀粒の反射光や透過光
が複雑に変化し、ノイズの重畳した検出値となり、品質
の判定に悪影響を及ぼして判定精度を低下させる不都合
があった。
[0005] Therefore, when light is irradiated to detect the light state of the sample grain whose posture changes in a complicated manner within the sample hole, a change in the incident light on the sample grain will be induced. . As a result, the reflected light and transmitted light of the sample grain change in a complicated manner, resulting in a detected value with superimposed noise, which has an inconvenient effect on the quality determination and reduces the determination accuracy.

【0006】[0006]

【課題を解決するための手段】このような不都合を解消
すべく、この発明は、外周縁の円周方向等間隔に複数の
試料用孔を有する回転可能な円板の前記試料用孔に保持
されて移送される試料穀粒の一粒毎に光の状態を検出し
て穀粒の品質を判定する穀粒の品質判定装置において、
前記試料用孔に保持されて移送される試料穀粒の姿勢変
化を阻止すべくこの試料穀粒を前記試料用孔に吸引圧着
させる吸引機構を設けたことを特徴とする。
[Means for Solving the Problems] In order to eliminate such inconveniences, the present invention provides a rotatable disk having a plurality of sample holes at equal intervals in the circumferential direction on the outer periphery of the disk. In a grain quality determination device that determines the quality of grains by detecting the light condition of each sample grain that is transported
The present invention is characterized in that a suction mechanism is provided to suction-press the sample grains to the sample holes in order to prevent the sample grains held and transferred in the sample holes from changing their posture.

【0007】[0007]

【作用】この発明の構成によれば、穀粒の品質判定装置
において、試料用孔に保持されて移送される試料穀粒の
姿勢変化を阻止すべくこの試料穀粒を前記試料用孔に吸
引圧着させる吸引機構を設けたことにより、試料用孔に
保持されて移送される試料穀粒の姿勢変化を阻止するこ
とができる。
[Operation] According to the configuration of the present invention, in the grain quality determination device, the sample grains are sucked into the sample hole in order to prevent the sample grains held in the sample hole and transferred from changing their posture. By providing the suction mechanism for crimping, it is possible to prevent the sample grains held in the sample hole and transferred from changing their posture.

【0008】[0008]

【実施例】次にこの発明の実施例を図に基づいて詳細に
説明する。
Embodiments Next, embodiments of the present invention will be described in detail with reference to the drawings.

【0009】図1〜図3は、この発明の第1実施例を示
すものである。図において、2は品質判定装置、4はモ
ータ、6は円板、8は試料用孔、10は光源、12は受
光素子、14は制御部である。品質判定装置2は、モー
タ4により回転される円板6の外周縁の円周方向等間隔
に、複数の試料用孔8を設けている。試料用孔8は、後
述の如く、保持部8−1と貫通部8−2とからなり、円
板6の上面16側から下面18側に貫通して設けられて
いる。試料用孔8の保持部8−1に保持されて移送され
る試料穀粒Sは、一粒毎に光の状態を検出される。この
実施例においては、光源10から照射されて試料穀粒S
を透過し、貫通部8−2を通過した光量を、受光素子1
2により検出する。透過光量である検出値は、制御部1
4に入力される。制御部14は、この検出値により試料
穀粒Sについて良質粒や不良粒、胴割粒等の判定を行う
1 to 3 show a first embodiment of the present invention. In the figure, 2 is a quality determination device, 4 is a motor, 6 is a disk, 8 is a sample hole, 10 is a light source, 12 is a light receiving element, and 14 is a control section. The quality determination device 2 has a plurality of sample holes 8 provided at equal intervals in the circumferential direction of the outer periphery of a disk 6 rotated by a motor 4. As will be described later, the sample hole 8 is made up of a holding part 8-1 and a through part 8-2, and is provided so as to penetrate from the upper surface 16 side of the disk 6 to the lower surface 18 side. The state of light is detected for each grain of the sample grain S held and transferred by the holding part 8-1 of the sample hole 8. In this example, the sample grain S is irradiated by the light source 10.
The amount of light transmitted through the penetrating portion 8-2 is detected by the light receiving element 1.
Detected by 2. The detected value, which is the amount of transmitted light, is determined by the control unit 1.
4 is input. The control unit 14 determines whether the sample grain S is a good quality grain, a bad grain, a split grain, etc. based on this detected value.

【0010】このような品質判定装置2において、前記
円板6の試料用孔8に保持されて移送される試料穀粒S
の姿勢変化を阻止すべく、この試料穀粒Sを試料用孔8
に吸引圧着させる吸引機構20を設けている。
In such a quality determination device 2, the sample grain S held in the sample hole 8 of the disk 6 and transferred
In order to prevent the sample grain S from changing its posture, the sample grain S is inserted into the sample hole 8.
A suction mechanism 20 is provided for suction-pressing.

【0011】この第1実施例において、吸引機構20は
、図3に示す如く、吸引部22と減圧部24とからなる
In this first embodiment, the suction mechanism 20 includes a suction section 22 and a pressure reducing section 24, as shown in FIG.

【0012】吸引部22は、円板6の下面18側に試料
用孔8を包囲するように設けられている。この円板6の
試料用孔8は、上面16側の孔径の大なる保持部8−1
と下面18側の孔径の小なる貫通部8−2とからなり、
上面16側から下面18側に貫通して設けられている。 前記吸引部22は、略筒状の吸引本体26に吸引空間2
8を内包して設けている。この吸引本体26は、一側開
口を弾性体30を介して摺接体32により円環状に囲繞
して設けるとともに、他側開口を透明体34により封鎖
して設けている。吸引本体26の一側開口の円環状の摺
接体32は、円板6の下面18の試料用孔8の貫通孔8
−2周囲に密着して摺接させていることにより、吸引空
間28を試料用孔8の貫通孔8−2に連通させている。 また、吸引本体26の他側開口を閉鎖する透明体34に
は、試料用孔8の貫通孔8−2に指向させて前記受光素
子12を配設している。
The suction section 22 is provided on the lower surface 18 side of the disk 6 so as to surround the sample hole 8 . The sample hole 8 of this disk 6 is located at a holding portion 8-1 with a large hole diameter on the upper surface 16 side.
and a penetration part 8-2 with a small hole diameter on the lower surface 18 side,
It is provided so as to penetrate from the upper surface 16 side to the lower surface 18 side. The suction unit 22 includes a suction space 2 in a substantially cylindrical suction body 26.
8 is included. The suction body 26 has an opening on one side surrounded by a sliding body 32 via an elastic body 30 in an annular shape, and an opening on the other side closed by a transparent body 34. The annular sliding body 32 at one side opening of the suction body 26 is connected to the through hole 8 of the sample hole 8 on the lower surface 18 of the disk 6.
The suction space 28 is brought into communication with the through hole 8-2 of the sample hole 8 by being in close sliding contact with the periphery of the sample hole 8-2. Further, the light receiving element 12 is disposed in the transparent body 34 that closes the other side opening of the suction body 26 so as to be oriented toward the through hole 8 - 2 of the sample hole 8 .

【0013】前記減圧部24は、略筒状の減圧本体36
に減圧空間38を内包して設け、この減圧空間38に減
圧モータ40により駆動される減圧ファン42を配設し
ている。前記減圧本体36は、一側開口を外気に開放し
て設けるとともに、他側開口を連絡通路44を内包する
連絡体46により前記吸引部22の吸引本体26に連絡
して設けている。これにより、吸引本体26の吸引空間
28と減圧本体36の減圧空間38とは、連絡通路44
により連絡されている。なお、減圧ファン42は、軸流
ファンや遠心ファンとすることができる。あるいは、減
圧ファンに変えて、真空ポンプとすることもできる。
The pressure reducing section 24 includes a substantially cylindrical pressure reducing body 36.
A decompression space 38 is provided within the decompression space 38, and a decompression fan 42 driven by a decompression motor 40 is disposed in the decompression space 38. The decompression body 36 has an opening on one side open to the outside air, and an opening on the other side connected to the suction body 26 of the suction section 22 through a connecting body 46 containing a communication passage 44 . Thereby, the suction space 28 of the suction main body 26 and the decompression space 38 of the decompression main body 36 are connected to the communication passage 44.
has been contacted by. Note that the pressure reducing fan 42 can be an axial fan or a centrifugal fan. Alternatively, a vacuum pump can be used instead of a pressure reducing fan.

【0014】次に作用を説明する。Next, the operation will be explained.

【0015】品質判定装置2は、モータ4により回転さ
れる円板6の外周縁の円周方向等間隔に設けた試料用孔
8の保持部8−1に保持されて移送される試料穀粒Sの
一粒毎に光源10から光を照射し、試料穀粒Sを透過し
て貫通部8−2を通過した光量を受光素子12により検
出する。透過光量である検出値は、制御部14に入力さ
れ、試料穀粒Sについて良質粒や不良粒、胴割粒等の判
定を行う。
The quality determination device 2 is configured to transfer sample grains held in holding portions 8-1 of sample holes 8 provided at equal intervals in the circumferential direction on the outer periphery of a disk 6 rotated by a motor 4. Light is irradiated from the light source 10 to each grain of S, and the amount of light transmitted through the sample grain S and passed through the penetration part 8-2 is detected by the light receiving element 12. The detected value, which is the amount of transmitted light, is input to the control unit 14, and the sample grains S are determined as good quality grains, bad grains, split grains, etc.

【0016】試料用孔8に保持されて移送される試料穀
粒Sは、上面16側の保持部8−1を下面18側の貫通
部8−2よりも大に形成していることにより、安定して
保持される。これにより、試料穀粒Sは、姿勢変化を阻
止される。また、吸引機構20は、減圧部24の減圧モ
ータ40により減圧ファン42を駆動して減圧空間38
の空気を排出し、減圧空間38を減圧して負圧状態にす
る。減圧空間38の負圧は、連絡通路44により吸引部
22の吸引空間28に伝達され、この吸引空間28に連
通する試料用孔8の貫通孔8−2に作用される。これに
より、試料用孔8の保持部8−1に保持されて移送され
る試料穀粒Sは、保持部8−2に吸引されて圧着される
The sample grain S held and transferred in the sample hole 8 can be transported by forming the holding portion 8-1 on the upper surface 16 side larger than the penetrating portion 8-2 on the lower surface 18 side. Stably held. Thereby, the sample grain S is prevented from changing its posture. In addition, the suction mechanism 20 drives the decompression fan 42 by the decompression motor 40 of the decompression unit 24 to create the decompression space 38 .
The air is discharged, and the pressure in the reduced pressure space 38 is reduced to a negative pressure state. The negative pressure in the reduced pressure space 38 is transmitted to the suction space 28 of the suction section 22 through the communication passage 44, and is applied to the through hole 8-2 of the sample hole 8 that communicates with this suction space 28. Thereby, the sample grain S held and transferred by the holding part 8-1 of the sample hole 8 is sucked and crimped by the holding part 8-2.

【0017】このように、試料用孔8の上面16側の保
持部8−1を下面18側の貫通部8−2よりも大に形成
していることにより、試料穀粒Sの姿勢変化を阻止する
ことができる。また、試料穀粒Sを試料用孔8に吸引機
構20によって吸引圧着させることにより、さらに試料
穀粒Sの姿勢変化を阻止することができる。
In this way, by forming the holding portion 8-1 on the upper surface 16 side of the sample hole 8 larger than the penetrating portion 8-2 on the lower surface 18 side, changes in the posture of the sample grain S can be prevented. can be prevented. Moreover, by suction-pressing the sample grain S into the sample hole 8 by the suction mechanism 20, it is possible to further prevent the sample grain S from changing its posture.

【0018】このため、試料穀粒Sを試料用孔8内にお
いて一定の姿勢で移送することができる。これにより、
試料穀粒Sに対する入射光の変化を防止することができ
、試料穀粒Sの反射光や透過光の変化を防止し得て、ノ
イズの無い検出値を得ることができる。この結果、品質
の判定に悪影響を及ぼす不都合を回避し得て、判定精度
を向上することができる。また、吸引機構20は、試料
用孔8周囲の塵埃を吸引して排出することができる。 これにより、光源10や受光素子12付近の塵埃を除去
し得て、検出精度の向上を果たすことができる。
Therefore, the sample grain S can be transferred in a constant posture within the sample hole 8. This results in
It is possible to prevent changes in the incident light on the sample grain S, and it is also possible to prevent changes in the reflected light and transmitted light of the sample grain S, and it is possible to obtain noise-free detected values. As a result, inconveniences that adversely affect quality determination can be avoided, and determination accuracy can be improved. Further, the suction mechanism 20 can suck and discharge dust around the sample hole 8. Thereby, dust near the light source 10 and the light receiving element 12 can be removed, and detection accuracy can be improved.

【0019】図4は、この発明の第2実施例を示すもの
である。
FIG. 4 shows a second embodiment of the invention.

【0020】この第2実施例の特徴とするところは、吸
引機構20の吸引部22を円板6の下面18側において
試料用孔8を包囲するように設け、吸引部22の吸引本
体26の他側開口を封鎖する透明体34を円板6の下面
18の試料用孔8の貫通孔8−2に近接させて配設し、
吸引本体26の吸引空間28は吸引部22と減圧部24
との間に設けたフィルタ部48に連結させたことにある
。このフィルタ部48は、フィルタ本体50にフィルタ
空間52を内包して設け、このフィルタ空間52を連絡
通路44により吸引空間28と減圧空間38とに連絡す
るとともにこのフィルタ空間52にフィルタエレメント
54を配設している。
The feature of this second embodiment is that the suction section 22 of the suction mechanism 20 is provided so as to surround the sample hole 8 on the lower surface 18 side of the disk 6, and the suction body 26 of the suction section 22 is A transparent body 34 that closes the opening on the other side is disposed close to the through hole 8-2 of the sample hole 8 on the lower surface 18 of the disk 6,
The suction space 28 of the suction main body 26 includes the suction section 22 and the pressure reducing section 24.
The reason is that it is connected to a filter section 48 provided between. This filter section 48 is provided with a filter space 52 contained in a filter body 50, and this filter space 52 is connected to the suction space 28 and the decompression space 38 through a communication passage 44, and a filter element 54 is disposed in this filter space 52. It is set up.

【0021】この第2実施例の構成によれば、前述の第
1実施例と同様の効果を奏し得て、さらに、透明体34
を円板6の下面18の試料用孔8の貫通孔8−2に近接
させて配設したことにより、受光素子12を試料用孔8
の貫通孔8−2に近接させ得て、試料穀粒Sの透過光を
より直接的に受光し得て、検出精度の向上を図ることが
できる。また、吸引機構20は、試料用孔8の周囲や光
源10や受光素子12付近の塵埃を除去し得て、検出精
度の向上に寄与し得て、吸引部22と減圧部24との間
にフィルタ部48を介設したことにより、塵埃の飛散を
防止し得るものである。
According to the configuration of this second embodiment, the same effects as those of the first embodiment described above can be achieved, and furthermore, the transparent body 34
By disposing the light-receiving element 12 close to the through hole 8-2 of the sample hole 8 on the lower surface 18 of the disk 6, the light receiving element 12 is
can be placed close to the through hole 8-2 of the sample grain S, and the transmitted light of the sample grain S can be more directly received, thereby improving the detection accuracy. In addition, the suction mechanism 20 can remove dust around the sample hole 8, the light source 10, and the light receiving element 12, and can contribute to improving detection accuracy. By providing the filter section 48, scattering of dust can be prevented.

【0022】図5・図6は、この発明の第3実施例を示
すものである。
FIGS. 5 and 6 show a third embodiment of the present invention.

【0023】この第3実施例の特徴とするところは、吸
引機構20の吸引部22の吸引本体26の他側開口を封
鎖する透明体34を円板6の下面18の試料用孔8の貫
通孔8−2に近接させて配設し、減圧部24を円板6の
下面18側に配設するとともにこの減圧部24の減圧空
間38を吸引部22の吸引空間28に直接的に連絡して
いる。
The feature of this third embodiment is that the transparent body 34 that closes the other side opening of the suction body 26 of the suction section 22 of the suction mechanism 20 is passed through the sample hole 8 of the lower surface 18 of the disk 6. The pressure reducing part 24 is arranged close to the hole 8-2, and the pressure reducing part 24 is arranged on the lower surface 18 side of the disc 6, and the pressure reducing space 38 of this pressure reducing part 24 is directly connected to the suction space 28 of the suction part 22. ing.

【0024】この第3実施例の構成によれば、前述の第
1実施例と同様の効果を奏し得て、さらに、透明体34
を円板6の下面18の試料用孔8の貫通孔8−2に近接
させて配設したことにより、受光素子12を試料用孔8
の貫通孔8−2に近接させ得て、試料穀粒Sの透過光を
より直接的に受光し得て、検出精度の向上を図ることが
できる。また、減圧部24を円板6の下面18側に配設
するとともに減圧部24の減圧空間38を吸引部22の
吸引空間28に直接的に連絡していることにより、装置
のコンパクト化を果たし得るとともに圧力損失を減少し
得て、減圧部24の小型化にも寄与し得るものである。
According to the configuration of the third embodiment, the same effects as those of the first embodiment described above can be achieved, and furthermore, the transparent body 34
By disposing the light-receiving element 12 close to the through hole 8-2 of the sample hole 8 on the lower surface 18 of the disk 6, the light receiving element 12 is
can be placed close to the through hole 8-2 of the sample grain S, and the transmitted light of the sample grain S can be more directly received, thereby improving the detection accuracy. Furthermore, by arranging the pressure reducing section 24 on the lower surface 18 side of the disk 6 and directly communicating the pressure reducing space 38 of the pressure reducing section 24 with the suction space 28 of the suction section 22, the device can be made more compact. At the same time, it is possible to reduce pressure loss and contribute to downsizing of the pressure reducing section 24.

【0025】なお、前述実施例においては、試料用孔8
として、図7に示す如く貫通部8−2に対して段差状の
保持部8−1を設けたものを例示したが、図8に示す如
くテーパ状の保持部8−1を設けたものや、図9に示す
如く保持部8−1と貫通部8−2との間に段差を設ける
ことなく上面16側から下面18側に向って先窄まりの
テーパ状のものとすることができる。
[0025] In the above embodiment, the sample hole 8
As shown in FIG. 7, a step-shaped holding part 8-1 is provided for the penetrating part 8-2, but a tapered holding part 8-1 is provided as shown in FIG. As shown in FIG. 9, the holding part 8-1 and the penetrating part 8-2 can be tapered from the upper surface 16 side to the lower surface 18 side without providing a step.

【0026】[0026]

【発明の効果】このように、この発明によれば、試料用
孔に保持されて移送される試料穀粒の姿勢変化を阻止す
ることができる。このため、試料穀粒は、試料用孔内に
おいて一定の姿勢で移送されることにより、試料穀粒に
対する入射光の変化を防止し得る。この結果、試料穀粒
の反射光や透過光の変化を防止し得て、ノイズの無い検
出値を得ることができ、品質の判定に悪影響を及ぼす不
都合を回避し得て判定精度を向上することができる。
As described above, according to the present invention, it is possible to prevent a change in the posture of sample grains held in sample holes and transferred. Therefore, the sample grain is transferred in a constant posture within the sample hole, thereby preventing changes in the incident light on the sample grain. As a result, it is possible to prevent changes in the reflected light and transmitted light of the sample grain, and to obtain noise-free detection values, thereby avoiding inconveniences that adversely affect quality judgment and improving judgment accuracy. Can be done.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】この発明の第1実施例を示す穀粒の品質判定装
置の概略平面図である。
FIG. 1 is a schematic plan view of a grain quality determination device showing a first embodiment of the present invention.

【図2】この発明の第1実施例を示す穀粒の品質判定装
置の概略側面図である。
FIG. 2 is a schematic side view of a grain quality determination device showing a first embodiment of the present invention.

【図3】この発明の第1実施例を示す穀粒の品質判定装
置の要部拡大断面図である。
FIG. 3 is an enlarged sectional view of a main part of a grain quality determination device showing a first embodiment of the present invention.

【図4】第2実施例を示す穀粒の品質判定装置の要部拡
大断面図である。
FIG. 4 is an enlarged sectional view of a main part of a grain quality determination device showing a second embodiment.

【図5】第3実施例を示す穀粒の品質判定装置の要部拡
大平面図である。
FIG. 5 is an enlarged plan view of main parts of a grain quality determination device showing a third embodiment.

【図6】第3実施例を示す穀粒の品質判定装置の要部拡
大断面図である。
FIG. 6 is an enlarged sectional view of a main part of a grain quality determination device showing a third embodiment.

【図7】試料用孔の一実施例を示す円板の要部拡大断面
図である。
FIG. 7 is an enlarged sectional view of a main part of a disk showing an example of a sample hole.

【図8】試料用孔の別の実施例を示す円板の要部拡大断
面図である。
FIG. 8 is an enlarged sectional view of a main part of a disk showing another example of a sample hole.

【図9】試料用孔のさらに別の実施例を示す円板の要部
拡大断面図である。
FIG. 9 is an enlarged sectional view of a main part of a disk showing still another example of a sample hole.

【符号の説明】[Explanation of symbols]

2  品質判定装置 4  モータ 6  円板 8  試料用孔 10  光源 12  受光素子 14  制御部 16  上面 18  下面 20  吸引機構 22  吸引部 24  減圧部 26  吸引本体 28  吸引空間 30  弾性体 32  摺接体 34  透明体 36  減圧本体 38  減圧空間 40  減圧モータ 42  減圧ファン 44  連絡通路 46  連絡体 48  フィルタ部 50  フィルタ本体 52  フィルタ空間 54  フィルタエレメント 2 Quality determination device 4 Motor 6 Disk 8 Sample hole 10 Light source 12 Photo receiving element 14 Control section 16 Top surface 18 Bottom surface 20 Suction mechanism 22 Suction part 24 Pressure reduction section 26 Suction body 28 Suction space 30 Elastic body 32 Sliding body 34 Transparent body 36 Reducing pressure body 38 Decompression space 40 Reducing motor 42 Decompression fan 44 Connecting passage 46 Contact body 48 Filter section 50 Filter body 52 Filter space 54 Filter element

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】  外周縁の円周方向等間隔に複数の試料
用孔を有する回転可能な円板の前記試料用孔に保持され
て移送される試料穀粒の一粒毎に光の状態を検出して穀
粒の品質を判定する穀粒の品質判定装置において、前記
試料用孔に保持されて移送される試料穀粒の姿勢変化を
阻止すべくこの試料穀粒を前記試料用孔に吸引圧着させ
る吸引機構を設けたことを特徴とする穀粒の品質判定装
置。
1. A rotatable disk having a plurality of sample holes arranged at equal intervals in the circumferential direction of the outer periphery, and the light state of each grain being transferred while being held in the sample holes of the rotatable disc. In a grain quality determination device that detects and determines the quality of grains, the sample grains are sucked into the sample hole in order to prevent the sample grains held in the sample hole and transferred from changing their posture. A grain quality determination device characterized by being provided with a suction mechanism for crimping.
【請求項2】  前記試料用孔は、円板の上面側の孔径
を下面側の孔径よりも大に形成したことを特徴とする請
求項1に記載の穀粒の品質判定装置。
2. The grain quality determining device according to claim 1, wherein the sample hole has a diameter larger on the upper surface side of the disk than on the lower surface side.
JP15115391A 1991-05-27 1991-05-27 Quality judging apparatus for grain particle Pending JPH04350544A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15115391A JPH04350544A (en) 1991-05-27 1991-05-27 Quality judging apparatus for grain particle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15115391A JPH04350544A (en) 1991-05-27 1991-05-27 Quality judging apparatus for grain particle

Publications (1)

Publication Number Publication Date
JPH04350544A true JPH04350544A (en) 1992-12-04

Family

ID=15512519

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15115391A Pending JPH04350544A (en) 1991-05-27 1991-05-27 Quality judging apparatus for grain particle

Country Status (1)

Country Link
JP (1) JPH04350544A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7016043B2 (en) * 2001-10-31 2006-03-21 Satake Corporation Quality evaluation method and apparatus for non-bran rice
JP2011156514A (en) * 2010-02-03 2011-08-18 Daiichi Jitsugyo Viswill Co Ltd Device for inspection of spherical appearance
CN111093847A (en) * 2017-09-14 2020-05-01 波米尔公司 Object conveying and/or sorting system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7016043B2 (en) * 2001-10-31 2006-03-21 Satake Corporation Quality evaluation method and apparatus for non-bran rice
JP2011156514A (en) * 2010-02-03 2011-08-18 Daiichi Jitsugyo Viswill Co Ltd Device for inspection of spherical appearance
CN111093847A (en) * 2017-09-14 2020-05-01 波米尔公司 Object conveying and/or sorting system

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