JPH04297810A - Optical tester - Google Patents

Optical tester

Info

Publication number
JPH04297810A
JPH04297810A JP8761691A JP8761691A JPH04297810A JP H04297810 A JPH04297810 A JP H04297810A JP 8761691 A JP8761691 A JP 8761691A JP 8761691 A JP8761691 A JP 8761691A JP H04297810 A JPH04297810 A JP H04297810A
Authority
JP
Japan
Prior art keywords
light
wide range
light source
reflected light
reflected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP8761691A
Other languages
Japanese (ja)
Inventor
Takahiro Sato
佐藤 ▲隆▼博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Priority to JP8761691A priority Critical patent/JPH04297810A/en
Publication of JPH04297810A publication Critical patent/JPH04297810A/en
Withdrawn legal-status Critical Current

Links

Landscapes

  • Machine Tool Sensing Apparatuses (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enable irradiation with beams of light over a wide range on a test object by irradiating the test object directly with beams of light diffused by a diffusion plate over a wide range and by guiding the reflected light in a direction different from that of incident light. CONSTITUTION:An emitted beam of light from a light source 2 is guided to a vicinity of a test object 10 by an optical fiber 14: after a diffusion plate 16 enlarges the irradiation range, this beam passes through a half mirror 6 to irradiate the object 10 from sideward. The mirror 6 reflects the reflected light of the object 10 in parallel with the axial line of the object 10, and a reflector 18 counterposed against the mirror 6 reflects that reflected light sideward by 90 deg.. A prism 20 totally reflects and guide it to an objective 8 of 90 deg. upward microscope 4 for further magnification; then, a CCD camera 12 forms an image. That is, the reflected light of a beam having irradiated the object 10 directly over a wide range is guided in a direction different from that of incident light for image formation. Therefore, a wide range of reflected light can be introduced into the lens 8, and a magnified image can be obtained regardless of direction of incident light and position of light source.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は例えばミニチュアドリル
などのような微小物体の外観検査や表面検査に好適に用
いられる光学検査装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical inspection device suitably used for visual inspection and surface inspection of minute objects such as miniature drills.

【0002】0002

【従来の技術】図3はミニチュアドリルの外観検査装置
の一従来例を示すものである。この装置の検査対象たる
ミニチュアドリルは、例えば直径1mm未満の非常に小
さな外径寸法に形成されている。
2. Description of the Related Art FIG. 3 shows a conventional example of a miniature drill visual inspection device. The miniature drill to be inspected by this device has a very small outer diameter, for example less than 1 mm in diameter.

【0003】かかる小径の検査対象の外観検査を行おう
とする場合、図示のように、顕微鏡などを用いて拡大し
た画像をCCDカメラによって撮像する方式がとられて
いる。すなわち、光源2から出射された光線を顕微鏡4
内のハーフミラー6によって、90°反射させ、さらに
、対物レンズ8によって検査対象(ドリル)10へ導き
、この検査対象10の表面で反射した光線を対物レンズ
8、および、ハーフミラー6を介してCCDカメラ12
に集光させるようになっている。
[0003] When attempting to conduct an external appearance inspection of such a small-diameter inspection object, a method is used in which a CCD camera captures an enlarged image using a microscope or the like, as shown in the figure. That is, the light beam emitted from the light source 2 is transmitted to the microscope 4.
The light beam is reflected at 90 degrees by the half mirror 6 in the interior, and is further guided to the inspection object (drill) 10 by the objective lens 8. CCD camera 12
It is designed to focus light on

【0004】0004

【発明が解決しようとする課題】ところで、前記検査装
置においては、前記対物レンズ8によって必要な拡大率
を得るには、対物レンズ8を検査対象10へ接近させざ
るを得ず、これらの間に別の光源を設けるためのスペー
ス的な余裕がなく、したがって、検査対象10へ照射さ
れる光線も対物レンズ8を経由させざるを得ない。そし
て、対物レンズ8を経由した光線を曲面状の検査対象1
0へ照射すると、特定角度に反射した光線のみしか対物
レンズ8へ導入されないこととなり、図4にハッチング
を付して示すような、きわめて狭い範囲の画像しか得る
ことができないという問題があった。また、広範囲の反
射光を得るため、たとえば検査対象10を中心とする円
筒面上に光源を配置することも考えられるが、前述のご
とく対物レンズ8と検査対象10とが接近した配置であ
るため、必要なスペースを得ることは困難である。
However, in the inspection apparatus, in order to obtain the necessary magnification with the objective lens 8, the objective lens 8 must be brought close to the inspection object 10, and there is no There is no space available for providing another light source, and therefore, the light rays irradiated onto the inspection object 10 must also pass through the objective lens 8. Then, the light beam passing through the objective lens 8 is transmitted to the curved inspection object 1.
When irradiating to 0, only the light beam reflected at a specific angle is introduced into the objective lens 8, and there is a problem in that only an image of an extremely narrow range can be obtained, as shown by hatching in FIG. In order to obtain reflected light over a wide range, it is also possible to arrange the light source on a cylindrical surface centered on the inspection object 10, but as mentioned above, since the objective lens 8 and the inspection object 10 are arranged close to each other, , it is difficult to obtain the necessary space.

【0005】本発明は上記事情に鑑みてなされたもので
、検査対象へ広範囲にわたって光線を照射することので
きる検査装置を得ることを目的とするものである。
The present invention has been made in view of the above-mentioned circumstances, and an object of the present invention is to provide an inspection device that can irradiate a wide range of light beams onto an object to be inspected.

【0006】[0006]

【課題を解決するための手段】かかる目的を達成するた
め本発明は、光源と、該光源と検査対象との間に設けら
れて光線を拡散させる拡散板と、検査対象で反射した光
線を拡大して受光手段へ結像させる対物レンズと、前記
拡散板と検査対象との間に介在して光線の通過を許容す
るとともに、検査対象で反射した光線を光源からの光線
の入射方向と異なる方向へ反射させるハーフミラーとか
ら構成したものである。
[Means for Solving the Problems] In order to achieve the above object, the present invention includes a light source, a diffuser plate provided between the light source and an object to be inspected to diffuse the light rays, and a diffuser plate that magnifies the rays reflected by the object to be inspected. An objective lens is provided between the diffuser plate and the object to be inspected to form an image on the light-receiving means, and allows the light rays to pass through, and also directs the light rays reflected by the object to be inspected in a direction different from the direction of incidence of the light rays from the light source. It consists of a half mirror that reflects the light.

【0007】[0007]

【作用】上記構成によれば、光源から出射された光線が
拡散板によって広範囲に拡散された後、直接的に検査対
象に照射される。また検査対象の表面で反射した光線は
、ハーフミラーによって入射光と異なる方向へ案内され
た後、対物レンズによって受光手段に入射される。
[Operation] According to the above structure, the light beam emitted from the light source is diffused over a wide range by the diffuser plate, and then directly irradiated onto the object to be inspected. Further, the light beam reflected by the surface of the object to be inspected is guided by a half mirror in a direction different from that of the incident light, and then enters the light receiving means by the objective lens.

【0008】[0008]

【実施例】図1を参照して本発明の一実施例を説明する
。なお、図中従来例と共通の部分には同一符号を付し、
説明を省略する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to FIG. In the figure, parts common to the conventional example are given the same reference numerals.
The explanation will be omitted.

【0009】光源2から出射された光線は、光ファイバ
14によって検査対象10の近くに導かれ、拡散板16
によって照射範囲が広げられた後、ハーフミラー6を通
過して、検査対象10へ側方から照射されるようになっ
ている。また前記ハーフミラー6は、検査対象の軸線に
対してほぼ45°傾斜した姿勢に配置されていて、前記
検査対象10で反射した光線を検査対象10の軸線と並
行な方向へ反射するようになっている。また前記ハーフ
ミラー6と対向する位置には、反射鏡18がハーフミラ
ーと線対称に配置されて反射光を90°側方へ反射し、
さらに、この反射鏡18によって反射した光線はプリズ
ム20によって全反射されて90°上方へ導かれて顕微
鏡4の対物レンズ8へ導かれ、さらに、拡大された後、
CCDカメラ12に結像するようになっている。
The light beam emitted from the light source 2 is guided near the inspection object 10 by an optical fiber 14, and is passed through a diffuser plate 16.
After the irradiation range is expanded by , the light passes through the half mirror 6 and is irradiated to the inspection object 10 from the side. Further, the half mirror 6 is arranged at an angle of about 45 degrees with respect to the axis of the inspection object, and is adapted to reflect the light beam reflected by the inspection object 10 in a direction parallel to the axis of the inspection object 10. ing. Further, at a position facing the half mirror 6, a reflecting mirror 18 is disposed line-symmetrically with the half mirror to reflect the reflected light 90° laterally,
Further, the light beam reflected by this reflecting mirror 18 is totally reflected by a prism 20 and guided upward by 90 degrees to the objective lens 8 of the microscope 4, and further, after being magnified,
The image is formed on a CCD camera 12.

【0010】すなわち、上記光学系においては、ハーフ
ミラー6の裏側から検査対象10の広い範囲に照射され
た光線が前記ハーフミラー6〜反射鏡18〜プリズム2
0を経由する反射経路を経由して入射光と異なる方向へ
導かれ、CCDカメラ12において結像されるようにな
っている。
That is, in the above optical system, a light beam irradiated onto a wide range of the inspection object 10 from the back side of the half mirror 6 is transmitted through the half mirror 6 to the reflecting mirror 18 to the prism 2.
The light is guided in a direction different from that of the incident light via a reflection path passing through 0, and is imaged by the CCD camera 12.

【0011】上記光学系では、検査対象10へ照射すべ
き光線が拡散板16によって拡散されているから広範囲
にわたって、あるいは、種々の角度から検査対象10へ
照射され、また、この光線は対物レンズ8を経由せずに
検査対象10へ直接照射されるから、対物レンズ8の特
性に影響されることがなく、したがって、検査対象10
が曲面状であっても、図2にハッチングを付して示すよ
うに、広範囲で反射した光線を対物レンズ8を導入する
ことができる。また検査対象10の表面で反射した光線
は、入射光と異なる方向へ導かれた後、顕微鏡4の対物
レンズ8へ入射されるから、入射光の方向や、光源の位
置に影響されることなく、拡大像を得ることができる。
In the above optical system, the light beam to be irradiated onto the inspection object 10 is diffused by the diffusion plate 16, so that it is irradiated onto the inspection object 10 over a wide range or from various angles. Since the irradiation is directly onto the inspection object 10 without passing through the
Even if the curved surface is curved, the objective lens 8 can introduce light rays reflected over a wide range, as shown by hatching in FIG. In addition, the light beam reflected on the surface of the inspection object 10 is guided in a direction different from the incident light and then enters the objective lens 8 of the microscope 4, so it is not affected by the direction of the incident light or the position of the light source. , an enlarged image can be obtained.

【0012】なお上記光学系では、各種の反射手段を用
いて光線の反射経路を定めるようにしたが、光源2と対
物レンズ8との相対的な位置の変更に対応して、光ファ
イバ14による案内方向を変更し、あるいは、反射鏡1
8、プリズム20の構成、配置、または数を変更して反
射経路を変更するようにしてもよいのはもちろんである
In the above optical system, various reflection means are used to determine the reflection path of the light beam, but in response to changes in the relative positions of the light source 2 and the objective lens 8, Change the guiding direction or reflector 1
8. Of course, the configuration, arrangement, or number of prisms 20 may be changed to change the reflection path.

【0013】[0013]

【発明の効果】以上の説明で明かなように、本発明は、
該光源と検査対象との間に拡散板が儲られているので、
光源から出射された光線が拡散板によって広範囲に拡散
された後、種々の方向から検査対象に照射され、広い範
囲で反射した光線を対物レンズへ導入して測定すること
ができる。また検査対象の表面で反射した光線は、ハー
フミラーによって入射光と異なる方向へ案内された後、
対物レンズによって受光手段に入射されるので、光源と
対物レンズとが互いに配置の自由度を損なうことなく配
置されることとなり、したがって、任意の照度、および
、倍率を得て能率良く検査を行うことができるという効
果を有する。
[Effects of the Invention] As is clear from the above explanation, the present invention has the following advantages:
Since there is a diffuser plate between the light source and the object to be inspected,
After the light rays emitted from the light source are diffused over a wide range by a diffuser plate, they are irradiated onto the object to be inspected from various directions, and the light rays reflected over a wide range can be introduced into an objective lens for measurement. In addition, the light beam reflected from the surface to be inspected is guided in a direction different from the incident light by a half mirror, and then
Since the light enters the light receiving means through the objective lens, the light source and the objective lens can be arranged without sacrificing the degree of freedom in mutual arrangement. Therefore, arbitrary illuminance and magnification can be obtained for efficient inspection. It has the effect of being able to.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本発明の一実施例の側面図である。FIG. 1 is a side view of an embodiment of the invention.

【図2】図1の装置によって検査対象に光線が照射され
る範囲の説明図である。
FIG. 2 is an explanatory diagram of a range in which a light beam is irradiated onto an inspection object by the apparatus of FIG. 1;

【図3】従来例の側面図である。FIG. 3 is a side view of a conventional example.

【図4】図3の装置によって検査対象に光線が照射され
る範囲の説明図である。
FIG. 4 is an explanatory diagram of a range in which the inspection target is irradiated with a light beam by the apparatus of FIG. 3;

【符号の説明】[Explanation of symbols]

2    光源 6    ハーフミラー 10    検査対象物 12    CCDカメラ 14    光ファイバ 16    拡散板 18    反射鏡 20    プリズム 2 Light source 6 Half mirror 10 Object to be inspected 12 CCD camera 14 Optical fiber 16 Diffusion plate 18 Reflector 20 Prism

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】    光源と、該光源と検査対象との間
に設けられて光線を拡散させる拡散板と、検査対象で反
射した光線を拡大して受光手段へ結像させる対物レンズ
と、前記拡散板と検査対象との間に介在して光線の通過
を許容するとともに、検査対象で反射した光線を光源か
らの光線の入射方向と異なる方向へ反射させるハーフミ
ラーとからなることを特徴とする光学検査装置。
1. A light source, a diffusion plate disposed between the light source and an inspection object to diffuse light rays, an objective lens for magnifying the light rays reflected by the inspection object and forming an image on a light receiving means, and the diffusion plate disposed between the light source and the inspection object. An optical system characterized by comprising a half mirror interposed between the plate and the object to be inspected to allow the passage of light rays and to reflect the rays reflected by the object to be inspected in a direction different from the incident direction of the rays from the light source. Inspection equipment.
JP8761691A 1991-03-27 1991-03-27 Optical tester Withdrawn JPH04297810A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8761691A JPH04297810A (en) 1991-03-27 1991-03-27 Optical tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8761691A JPH04297810A (en) 1991-03-27 1991-03-27 Optical tester

Publications (1)

Publication Number Publication Date
JPH04297810A true JPH04297810A (en) 1992-10-21

Family

ID=13919908

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8761691A Withdrawn JPH04297810A (en) 1991-03-27 1991-03-27 Optical tester

Country Status (1)

Country Link
JP (1) JPH04297810A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998019150A3 (en) * 1996-10-30 1998-10-29 Kronseder Maschf Krones Device for inspecting bottles and the like
WO2006135295A1 (en) * 2005-06-17 2006-12-21 Volvo Aero Corporation A method and a device for measurement of edges
WO2009013926A1 (en) * 2007-07-26 2009-01-29 Kou Yamagishi Rotary body measuring device
JP2012013698A (en) * 2010-06-29 2012-01-19 General Electric Co <Ge> Tool abrasion quantization system and method
CN106840028A (en) * 2016-12-23 2017-06-13 湖北文理学院 The on-position measure method and apparatus of tool wear

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998019150A3 (en) * 1996-10-30 1998-10-29 Kronseder Maschf Krones Device for inspecting bottles and the like
EP1382961A2 (en) * 1996-10-30 2004-01-21 Krones Ag Device for inspecting bottles and the like
EP1382961A3 (en) * 1996-10-30 2004-01-28 Krones Ag Device for inspecting bottles and the like
WO2006135295A1 (en) * 2005-06-17 2006-12-21 Volvo Aero Corporation A method and a device for measurement of edges
US7570369B2 (en) 2005-06-17 2009-08-04 Volvo Aero Corporation Method and a device for measurement of edges
WO2009013926A1 (en) * 2007-07-26 2009-01-29 Kou Yamagishi Rotary body measuring device
JP2009031091A (en) * 2007-07-26 2009-02-12 Ko Yamagishi Device for measuring rotary body
JP2012013698A (en) * 2010-06-29 2012-01-19 General Electric Co <Ge> Tool abrasion quantization system and method
CN106840028A (en) * 2016-12-23 2017-06-13 湖北文理学院 The on-position measure method and apparatus of tool wear

Similar Documents

Publication Publication Date Title
KR100293126B1 (en) Inspection device
JP3385432B2 (en) Inspection device
EP0856728B1 (en) Optical method and apparatus for detecting defects
JPS61212733A (en) Method of orienting beam and reflected-beam spectral device
JPH10506202A (en) Equipment for stabilizing and homogenizing lighting
JPS6345543A (en) Test apparatus for unconformability and occlusion of surface of transparent material element
US6853446B1 (en) Variable angle illumination wafer inspection system
KR100425412B1 (en) A device for measuring the photometric and colorimetric characteristics of an object
JPH04297810A (en) Optical tester
JPH11183326A (en) Lens measuring device and method
JPH08166514A (en) Obliquely illuminating device
JP3754164B2 (en) Sample inspection equipment
JPH07198620A (en) Inspection device
JPH0783845A (en) Inspection device
US6034815A (en) Laser scan microscope
JP3194642B2 (en) Lens performance inspection device
JPH01143904A (en) Thin film inspecting device
JPH11304640A (en) Inspection apparatus for optical element
WO2001013098A1 (en) Variable angle illumination wafer inspection system
TWI832171B (en) Inspection device, inspection method and laser processing device
JPH11142241A (en) Measuring apparatus for spectral transmittance
JPH09178452A (en) Surface observing optical system
JPH0471453B2 (en)
JPH09189534A (en) Surface observation optical system
JPH11201913A (en) Flaw inspection apparatus

Legal Events

Date Code Title Description
A300 Application deemed to be withdrawn because no request for examination was validly filed

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19980514