JPH04278407A - All-directionally optical-cutting shape measuring apparatus - Google Patents

All-directionally optical-cutting shape measuring apparatus

Info

Publication number
JPH04278407A
JPH04278407A JP4029291A JP4029291A JPH04278407A JP H04278407 A JPH04278407 A JP H04278407A JP 4029291 A JP4029291 A JP 4029291A JP 4029291 A JP4029291 A JP 4029291A JP H04278407 A JPH04278407 A JP H04278407A
Authority
JP
Japan
Prior art keywords
objective lens
light
sample stage
image
slit light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4029291A
Other languages
Japanese (ja)
Inventor
Shoichi Yoshiyama
吉山 正一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP4029291A priority Critical patent/JPH04278407A/en
Publication of JPH04278407A publication Critical patent/JPH04278407A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To efficiently detect the three-dimensional shape of an object by rotating an objective lens for a projecting light, an objective lens for a detected light and a photographing device around a vertical line as a rotating axis, and projecting slit beams from many directions to the same measuring point. CONSTITUTION:A sample stage 1 is moved and a common focusing position of an objective lens 3 for a projecting light and an objective lens 4 for a detected light is agreed with a measuring position of an object placed on the sample stage 1. While a rotating axis 9 is sequentially rotated, slit beams are cast to the same measuring position from many directions. An image of the reflecting slit beams is photographed at 5. The image data of the reflecting slit beams photographed at 5 is output to an image processor 11 via a supporting body 10 and arm image signal line 13. The processor 11 stores the data in a frame memory and processes the image. The operating result, is displayed at a personal computer 12 via an image signal line 15. Accordingly, the three-dimensional shape of the object can be easily and effectively detected by totally evaluating the images from many directions.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、IC(集積回路)等の
微細なパターンの3次元形状計測装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a three-dimensional shape measuring device for fine patterns of ICs (integrated circuits) and the like.

【0002】半導体装置の高集積化における進歩には著
しいものがあるが、高い信頼性を保ちながらさらに高集
積化を進めるためには、半導体装置の微細形状を十分把
握することが必要である。
There has been remarkable progress in increasing the degree of integration of semiconductor devices, but in order to further increase the degree of integration while maintaining high reliability, it is necessary to fully understand the fine shape of semiconductor devices.

【0003】0003

【従来の技術】被計測物の3次元形状を計測する方法に
光切断法がある。この方法は、被計測物に1方向からス
リット光を照射し、被計測物から反射するスリット光の
映像を受像して画像処理装置を使用して演算処理を施し
、被計測物の3次元形状を求めるもので、大気中におい
て非接触・非破壊的に計測可能である。
2. Description of the Related Art A light cutting method is a method for measuring the three-dimensional shape of an object to be measured. This method irradiates the object to be measured with slit light from one direction, receives an image of the slit light reflected from the object, and performs arithmetic processing using an image processing device to form a three-dimensional shape of the object. It can be measured non-contact and non-destructively in the atmosphere.

【0004】0004

【発明が解決しようとする課題】スリット光は被計測物
に対して1方向のみから照射されるので、被計測物にお
けるスリット光の反射や屈折の具合で必ずしも適切な映
像が得られない場合がある。例えば、被計測物の形状に
よってはスリット光が途中で遮られて目的とする領域に
照射されなかったり、あるいは、受光できない方向に反
射したりして、3次元形状が計測できない場合がある。
[Problem to be solved by the invention] Since the slit light illuminates the object to be measured from only one direction, it may not always be possible to obtain an appropriate image due to the reflection or refraction of the slit light on the object to be measured. be. For example, depending on the shape of the object to be measured, the slit light may be blocked midway and not illuminate the target area, or may be reflected in a direction where it cannot be received, making it impossible to measure the three-dimensional shape.

【0005】この問題を解決するには、被計測物を水平
面内において回転して同一計測点に多方向からスリット
光を照射し、多方向からの映像を総合的に判断して3次
元形状を求める必要がある。しかし、被計測物を回転す
ると、計測点とスリット光の照射位置との間にずれが生
ずるため、被計測物を載置する試料台を移動してその都
度位置合わせをしなければならない。
[0005] To solve this problem, the object to be measured is rotated in a horizontal plane, slit light is irradiated from multiple directions at the same measurement point, and the three-dimensional shape is determined by comprehensively judging the images from the multiple directions. need to ask. However, when the object to be measured is rotated, a deviation occurs between the measurement point and the irradiation position of the slit light, so the sample stage on which the object to be measured is placed must be moved and aligned each time.

【0006】本発明の目的は、この欠点を解消すること
にあり、被計測物上の任意の計測点に対して、被計測物
の位置を調整することなく多方向からのスリット光の照
射を可能にし、効率よく被計測物の3次元形状を計測す
ることができる全方向型光切断形状計測装置を提供する
ことにある。
The purpose of the present invention is to eliminate this drawback, and to irradiate an arbitrary measurement point on an object with slit light from multiple directions without adjusting the position of the object. An object of the present invention is to provide an omnidirectional optical cutting shape measuring device that can efficiently measure the three-dimensional shape of an object to be measured.

【0007】[0007]

【課題を解決するための手段】上記の目的は、X・Y・
Z軸方向に移動可能な試料台(1)と、この試料台(1
)上に載置された被計測物にスリット光を投光する投光
用対物レンズ(3)と、前記のスリット光を発生するス
リット光発生源(2)と、前記の被計測物から反射する
スリット光を受光する受光用対物レンズ(4)と、この
受光用対物レンズ(4)で受光されたスリット光を撮像
する撮像器(5)とを有し、前記の投光用対物レンズ(
3)と前記の受光用対物レンズ(4)とは相互に結合さ
れており、前記の試料台(1)上における前記の投光用
対物レンズ(3)と前記の受光用対物レンズ(4)との
共通焦点位置を通る垂直線(8)を回転軸として回転可
能とされている全方向型光切断形状計測装置によって達
成される。なお、前記の撮像器(5)に撮像された映像
情報を記憶するフレームメモリ(6)とこのフレームメ
モリ(6)に記憶された映像情報を演算処理するCPU
(7)とを設けることによって三次元形状を計測するこ
とができる
[Means for solving the problem] The above purpose is to
A sample stand (1) movable in the Z-axis direction, and a sample stand (1) that can move in the Z-axis direction.
); a light projection objective lens (3) that projects a slit light onto an object to be measured placed on the top; a slit light generation source (2) that generates the slit light; It has a light-receiving objective lens (4) that receives the slit light, and an imager (5) that images the slit light received by the light-receiving objective lens (4).
3) and the light-receiving objective lens (4) are mutually coupled, and the light-emitting objective lens (3) and the light-receiving objective lens (4) on the sample stage (1) are connected to each other. This is achieved by an omnidirectional optical cutting shape measuring device that is rotatable about a vertical line (8) passing through a common focal point with the rotation axis. A frame memory (6) that stores video information captured by the image pickup device (5) and a CPU that performs arithmetic processing on the video information stored in the frame memory (6).
(7) Three-dimensional shapes can be measured by providing

【0008】[0008]

【作用】図1に示す原理説明図を使用して作用を説明す
る。図中、1は被計測物を載置してX・Y・Z方向に移
動可能な試料台であり、2はスリット光発生源であり、
3はスリット光発生源2の発生するスリット光を試料台
1上に載置された被計測物(図示せず。)上に投光する
投光用対物レンズであり、4は被計測物から反射するス
リット光を受光する受光用対物レンズであり、5は受光
用対物レンズ4で受光した映像を撮像する撮像器である
。6は撮像器5の撮像した情報を記憶するフレームメモ
リであり、7はフレームメモリに記憶された情報を演算
処理して3次元形状情報を出力するCPUである。
[Operation] The operation will be explained using the principle explanatory diagram shown in FIG. In the figure, 1 is a sample stage on which the object to be measured can be placed and movable in the X, Y, and Z directions, 2 is a slit light source,
Reference numeral 3 designates a light projection objective lens that projects the slit light generated by the slit light generation source 2 onto an object to be measured (not shown) placed on the sample stage 1; A light-receiving objective lens receives the reflected slit light, and 5 is an imager that captures an image received by the light-receiving objective lens 4. 6 is a frame memory that stores information captured by the imager 5, and 7 is a CPU that processes the information stored in the frame memory and outputs three-dimensional shape information.

【0009】投光用対物レンズ3と受光用対物レンズ4
とはそれぞれ、試料台1上に載置される被計測物上の同
一の点に焦点を結ぶように配設されている。スリット光
発生源2と投光用対物レンズ3と受光用対物レンズ4と
撮像器5とは一体に組み立てられて相互位置関係は固定
されており、投光用対物レンズ3と受光用対物レンズ4
との共通焦点位置を通る垂直線8を回転軸として回転し
うる構造になっている。
Light projecting objective lens 3 and light receiving objective lens 4
are arranged so as to focus on the same point on the object to be measured placed on the sample stage 1, respectively. The slit light generation source 2, the light-emitting objective lens 3, the light-receiving objective lens 4, and the imager 5 are assembled integrally and their mutual positional relationship is fixed.
The structure is such that it can rotate about a vertical line 8 passing through a common focal point with the rotation axis.

【0010】この一体に構成されているスリット光発生
源2と投光用対物レンズ3と受光用対物レンズ4と撮像
器5とを垂直線8を回転軸として回転することによって
、試料台1を移動して被計測物の位置を調整することな
く被計測物の同一計測点に多方向からスリット光を照射
することが可能になり、多方向からの映像を総合的に判
断して被計測物の3次元形状を極めて容易に、効率的に
計測することが可能になる。
The sample stage 1 is rotated by rotating the slit light generating source 2, the light emitting objective lens 3, the light receiving objective lens 4, and the imager 5, which are integrally constituted, about a vertical line 8 as a rotation axis. It is now possible to irradiate the same measurement point on the object with slit light from multiple directions without moving and adjusting the position of the object. It becomes possible to measure the three-dimensional shape of the object extremely easily and efficiently.

【0011】[0011]

【実施例】以下、図面を参照して、本発明の一実施例に
係る全方向型光切断形状計測装置について説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An omnidirectional optical cutting shape measuring device according to an embodiment of the present invention will be described below with reference to the drawings.

【0012】図2に本発明に係る全方向型光切断形状計
測装置の構成図を示す。図中、図1で示したものと同一
のものは同一記号で示してある。スリット光発生源2と
投光用対物レンズ3と受光用対物レンズ4と撮像器5と
は、試料台1上における投光用対物レンズ3と受光用対
物レンズ4との共通焦点位置を通る垂直線を中心軸とす
る回転軸9に固定されており、この回転軸9は支持体1
0に回転可能に取り付けられている。11は画像処理装
置であり、12はパーソナルコンピュータであり、13
は撮像器5からの映像信号線であり、14はコンピュー
タ12からの制御線であり、15は画像処理装置からの
映像信号線である。
FIG. 2 shows a configuration diagram of an omnidirectional optical cutting shape measuring device according to the present invention. In the figure, the same parts as those shown in FIG. 1 are indicated by the same symbols. The slit light generation source 2, the light-emitting objective lens 3, the light-receiving objective lens 4, and the imager 5 are arranged vertically through the common focal point of the light-emitting objective lens 3 and the light-receiving objective lens 4 on the sample stage 1. It is fixed to a rotating shaft 9 whose central axis is the line, and this rotating shaft 9 is connected to the support 1.
0 is rotatably mounted. 11 is an image processing device, 12 is a personal computer, 13
is a video signal line from the imager 5, 14 is a control line from the computer 12, and 15 is a video signal line from the image processing device.

【0013】試料台1を移動して、試料台1上に載置さ
れた被計測物(図示せず。)の計測位置に投光用対物レ
ンズ3と受光用対物レンズ4との共通焦点位置を合わせ
、回転軸9を逐次回転して被計測物の同一計測位置に多
方向からスリット光を照射し、その反射スリット光の映
像を撮像器5で撮像する。
The sample stage 1 is moved to the measurement position of the object to be measured (not shown) placed on the sample stage 1 to a common focal point of the light emitting objective lens 3 and the light receiving objective lens 4. The rotation axis 9 is sequentially rotated to irradiate the same measurement position of the object with slit light from multiple directions, and an image of the reflected slit light is captured by the imager 5.

【0014】撮像器5で撮像された被計測物からの反射
スリット光映像の情報は映像信号線13を介して通常の
画像処理装置11のフレームメモリに記憶されて画像処
理演算がなされ、演算結果は映像信号線15を介してパ
ーソナルコンピュータ12に送られ表示される。試料台
1の移動、回転軸9の回転、画像処理装置11の制御等
のシステムの制御信号は制御線14を介してパーソナル
コンピュータ12より出力される。
Information on the reflected slit light image from the object to be measured, which is imaged by the imager 5, is stored in a frame memory of a normal image processing device 11 via a video signal line 13, and image processing calculations are performed. is sent to the personal computer 12 via the video signal line 15 and displayed. Control signals for the system, such as movement of the sample stage 1, rotation of the rotating shaft 9, and control of the image processing device 11, are output from the personal computer 12 via a control line 14.

【0015】撮像器5からの映像信号線13は、撮像器
5が回転軸9の廻りを回転するので、静止している支持
体10を介して画像処理装置11に出力されるようにな
っているが、回転軸9の回転の範囲が少なければ撮像器
5から直接出力してもよい。また、装置の規模によって
は画像処理装置11を撮像器5と同じく回転軸9に固着
してもよい。
Since the image pickup device 5 rotates around the rotation axis 9, the video signal line 13 from the image pickup device 5 is outputted to the image processing device 11 via the stationary support 10. However, if the range of rotation of the rotating shaft 9 is small, it may be output directly from the imager 5. Furthermore, depending on the scale of the device, the image processing device 11 may be fixed to the rotating shaft 9 in the same way as the image pickup device 5.

【0016】なお、3次元形状の計測結果は表示のみで
なく、他の機械等の制御にも利用しうることは云うまで
もない。
[0016] It goes without saying that the measurement results of the three-dimensional shape can be used not only for display but also for controlling other machines.

【0017】[0017]

【発明の効果】以上説明したとおり、本発明に係る全方
向型光切断形状計測装置においては、スリット光発生源
と投光用対物レンズと受光用対物レンズと撮像器とが一
体に組み立てられ、試料台上の投光用対物レンズと受光
用対物レンズとの共通焦点位置を通る垂直線を回転軸と
して回転するので、被計測物を移動することなく被計測
物上の同一計測点に多方向からスリット光を照射して多
方向からの映像を撮像することができ、この多方向から
の映像を画像処理することによって、被計測物の3次元
形状を正確に効率よく計測することができる。
[Effects of the Invention] As explained above, in the omnidirectional light cutting shape measuring device according to the present invention, the slit light generation source, the light emitting objective lens, the light receiving objective lens, and the imager are integrally assembled, Since the rotation axis is a vertical line that passes through the common focal point of the light emitting objective lens and the light receiving objective lens on the sample stage, the same measurement point on the measured object can be measured in multiple directions without moving the measured object. Images from multiple directions can be captured by irradiating slit light from the center, and by image processing the images from multiple directions, the three-dimensional shape of the object to be measured can be accurately and efficiently measured.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の原理説明図である。FIG. 1 is a diagram explaining the principle of the present invention.

【図2】全方向型光切断形状計測装置の構成図である。FIG. 2 is a configuration diagram of an omnidirectional optical cutting shape measuring device.

【符号の説明】[Explanation of symbols]

1  試料台 2  スリット光発生源 3  投光用対物レンズ 4  受光用対物レンズ 5  撮像器 6  フレームメモリ 7  CPU 8  回転中心線 9  回転軸 10  支持体 11  画像処理装置 12  パーソナルコンピュータ 1 Sample stage 2 Slit light source 3 Objective lens for light projection 4 Objective lens for light reception 5 Imaging device 6 Frame memory 7 CPU 8 Center line of rotation 9 Rotation axis 10 Support 11 Image processing device 12 Personal computer

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】  X・Y・Z軸方向に移動可能な試料台
(1)と、該試料台(1)上に載置された被計測物にス
リット光を投光する投光用対物レンズ(3)と、前記ス
リット光を発生するスリット光発生源(2)と、前記被
計測物から反射する前記スリット光を受光する受光用対
物レンズ(4)と、該受光用対物レンズ(4)で受光さ
れた前記スリット光を撮像する撮像器(5)とを有し、
前記投光用対物レンズ(3)と前記受光用対物レンズ(
4)とは相互に結合されてなり、前記試料台(1)上に
おける前記投光用対物レンズ(3)と前記受光用対物レ
ンズ(4)との共通焦点位置を通る垂直線(8)を回転
軸として回転可能とされてなることを特徴とする全方向
型光切断形状計測装置。
Claim 1: A sample stage (1) movable in X, Y, and Z axis directions, and a light projection objective lens that projects a slit light onto an object to be measured placed on the sample stage (1). (3), a slit light generation source (2) that generates the slit light, a light receiving objective lens (4) that receives the slit light reflected from the object to be measured, and the light receiving objective lens (4). an imager (5) that images the slit light received by the
The light emitting objective lens (3) and the light receiving objective lens (
4) is a vertical line (8) that passes through the common focal point of the light emitting objective lens (3) and the light receiving objective lens (4) on the sample stage (1). An omnidirectional optical cutting shape measuring device characterized by being rotatable as a rotation axis.
【請求項2】  前記撮像器(5)に撮像された映像情
報を記憶するフレームメモリ(6)と該フレームメモリ
(6)に記憶された映像情報を演算処理するCPU(7
)とが設けられてなることを特徴とする請求項1記載の
全方向型光切断形状計測装置。
2. A frame memory (6) for storing video information captured by the image pickup device (5), and a CPU (7) for processing the video information stored in the frame memory (6).
2. The omnidirectional optical cutting shape measuring device according to claim 1, further comprising: ).
JP4029291A 1991-03-06 1991-03-06 All-directionally optical-cutting shape measuring apparatus Pending JPH04278407A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4029291A JPH04278407A (en) 1991-03-06 1991-03-06 All-directionally optical-cutting shape measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4029291A JPH04278407A (en) 1991-03-06 1991-03-06 All-directionally optical-cutting shape measuring apparatus

Publications (1)

Publication Number Publication Date
JPH04278407A true JPH04278407A (en) 1992-10-05

Family

ID=12576533

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4029291A Pending JPH04278407A (en) 1991-03-06 1991-03-06 All-directionally optical-cutting shape measuring apparatus

Country Status (1)

Country Link
JP (1) JPH04278407A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007085936A (en) * 2005-09-22 2007-04-05 Tohoku Univ Positioning device
JP2013542401A (en) * 2010-10-27 2013-11-21 株式会社ニコン Shape measuring device, structure manufacturing method and structure manufacturing system
WO2014084131A1 (en) * 2012-11-29 2014-06-05 株式会社ニコン Shape measuring apparatus, structure manufacturing system, stage apparatus, shape measuring method, structure manufacturing method, program, and recording medium

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007085936A (en) * 2005-09-22 2007-04-05 Tohoku Univ Positioning device
JP2013542401A (en) * 2010-10-27 2013-11-21 株式会社ニコン Shape measuring device, structure manufacturing method and structure manufacturing system
WO2014084131A1 (en) * 2012-11-29 2014-06-05 株式会社ニコン Shape measuring apparatus, structure manufacturing system, stage apparatus, shape measuring method, structure manufacturing method, program, and recording medium
JP6020593B2 (en) * 2012-11-29 2016-11-02 株式会社ニコン Shape measuring device, structure manufacturing system, stage system, shape measuring method, structure manufacturing method, recording medium recording program
JPWO2014084131A1 (en) * 2012-11-29 2017-01-05 株式会社ニコン Shape measuring device, structure manufacturing system, stage system, shape measuring method, structure manufacturing method, recording medium recording program
US9733070B2 (en) 2012-11-29 2017-08-15 Nikon Corporation Shape measuring apparatus, structure manufacturing system, stage apparatus, shape measuring method, structure manufacturing method, program, and recording medium

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