JPH04266117A - Storage device - Google Patents

Storage device

Info

Publication number
JPH04266117A
JPH04266117A JP3027167A JP2716791A JPH04266117A JP H04266117 A JPH04266117 A JP H04266117A JP 3027167 A JP3027167 A JP 3027167A JP 2716791 A JP2716791 A JP 2716791A JP H04266117 A JPH04266117 A JP H04266117A
Authority
JP
Japan
Prior art keywords
storage area
area
retry
alternative
defective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3027167A
Other languages
Japanese (ja)
Inventor
Atsushi Inoue
淳 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP3027167A priority Critical patent/JPH04266117A/en
Publication of JPH04266117A publication Critical patent/JPH04266117A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To reduce the labor and time and to prevent the loss of memory by estimating an area having the high possibility of the occurrence of a defect in a storage device based on number of times of the retrial and replacing automatically the estimated area with a substitute area. CONSTITUTION:A control table 5 to control a defective area and number of times of access retrial storage area 7 are provided. Then the number of times of retrial at every input/output operation and the number of times of total trial are controlled at storage area. An area having the high possibility of the occurrence of a defect is estimated when the number of times of retrial of the relevant area exceeds a set upper limit level. Then the estimated area is assigned to a substitute storage area. Thus the occurrence of defects can be prevented.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は記憶装置に関し、特に、
例えば、磁気デイスク装置・光磁気デイスク装置等のラ
ンダムアクセス可能な記憶装置に関する。
TECHNICAL FIELD The present invention relates to a storage device, and in particular,
For example, it relates to randomly accessible storage devices such as magnetic disk devices and magneto-optical disk devices.

【0002】0002

【従来の技術】従来のランダムアクセス可能な記憶装置
においては、図7に示すように製造工程で生じる不良な
記憶領域を管理するための管理テーブル5を持っており
、不良な領域を代替するための代替記憶領域6を持ち、
通常のデータ記憶領域7に不良な記憶領域が発生したと
きに、これを用いて新たな記憶領域として割り当てるこ
とによって不良な領域の代替を行つていた。
2. Description of the Related Art Conventional randomly accessible storage devices have a management table 5 for managing defective storage areas generated during the manufacturing process, as shown in FIG. has an alternative storage area 6 of
When a defective storage area occurs in the normal data storage area 7, this is used to replace the defective area by allocating it as a new storage area.

【0003】0003

【発明が解決しようとする課題】しかしながら上記従来
例では、記憶装置の使用中に不良が発生した場合は、人
が介入し代替用領域を装置に登録して不良な記憶領域を
整理しなければならなかった。また、すでに情報が格納
された領域から情報を読み出そうとして不良が発生した
場合は、その領域内の情報は失われしまうことになった
[Problems to be Solved by the Invention] However, in the above conventional example, if a defect occurs while the storage device is in use, a person must intervene and register an alternative area in the device to clean up the defective storage area. did not become. Furthermore, if a failure occurs when attempting to read information from an area where information has already been stored, the information in that area will be lost.

【0004】本発明は上記従来例に鑑みてなされたもの
で、不良な記憶領域発生を予測して入出力動作不良を予
防したり、不良な記憶領域を自動的に代替可能な記憶装
置を提供することを目的とする。
The present invention has been made in view of the above conventional example, and provides a storage device that can predict the occurrence of a defective storage area, prevent input/output operation failures, and automatically replace a defective storage area. The purpose is to

【0005】[0005]

【課題を解決するための手段】上記目的を達成するため
に本発明の記憶装置は、以下の様な構成からなる。即ち
、情報を記憶する記憶領域と前記記憶領域に対するアク
セス不良に対応する代替記憶領域とを備えたランダムア
クセス型の記憶装置であって、前記記憶領域に対する入
出力動作が発生するたび毎に前記入出力動作が正常か不
良かを調べる第1のチェック手段と、所定の時より通算
して前記第1のチェック手段によって検出された前記入
出力動作の不良回数を調べる第2のチェック手段と、前
記代替記憶領域を新たに記憶領域として割り当てる代替
記憶領域割り当て手段と、前記入出力動作の不良が発生
するたび毎に、前記第1のチェック手段及び前記第2の
チェック手段のチェック結果に基づいて、前記入出力動
作の再試行を行わせたり、或は、前記代替記憶領域割り
当て手段に代替記憶領域を割り当てさせたりするよう制
御する制御手段とを有することを特徴とする記憶装置を
備える。
Means for Solving the Problems In order to achieve the above object, the storage device of the present invention has the following configuration. In other words, it is a random access type storage device that includes a storage area for storing information and an alternative storage area for responding to failures in access to the storage area, and the input/output operation is performed every time an input/output operation to the storage area occurs. a first checking means for checking whether the output operation is normal or defective; a second checking means for checking the total number of times the input/output operation is defective detected by the first checking means from a predetermined time; an alternative storage area allocating means for allocating an alternative storage area as a new storage area, and each time a failure in the input/output operation occurs, based on the check results of the first checking means and the second checking means, and a control means for controlling the input/output operation to be retried or for the alternative storage area allocating means to allocate an alternative storage area.

【0006】[0006]

【作用】以上の構成により本発明は、第1のチェック手
段及び第2のチェック手段のチェック結果に基づいて、
入出力動作の不良が発生した部分に対して入出力動作の
再試行を実行させたり代替記憶領域を割り当てたりする
ように制御する。
[Operation] With the above configuration, the present invention can perform the following operations based on the check results of the first checking means and the second checking means
Control is performed to retry the input/output operation or to allocate an alternative storage area to the part where the input/output operation failure has occurred.

【0007】[0007]

【実施例】以下添付図面を参照して本発明の好適な実施
例を詳細に説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

【0008】図1は本発明の代表的な実施例である情報
記憶装置の構成を示すブロック図である。図1において
、1は情報を記憶するための媒体となるハードディスク
、2は中央制御部(CPU)、3はROM、4はRAM
である。
FIG. 1 is a block diagram showing the configuration of an information storage device that is a typical embodiment of the present invention. In FIG. 1, 1 is a hard disk serving as a medium for storing information, 2 is a central control unit (CPU), 3 is a ROM, and 4 is a RAM.
It is.

【0009】図2は本実施例の情報記憶装置が用いるハ
ードディスク1の記憶領域状態管理の概念を示す図であ
る。図2において、5は不良な領域を管理する管理テー
ブル、6は代替記憶領域、7は通常のデータ記憶領域で
ある。さらに、8はハードディスク1へのアクセス再試
行回数記憶テーブルであり、これを用いて不良の発生を
予測する。なお、管理テーブル5及びアクセス再試行回
数記憶テーブル8は情報記憶装置のRAM4或はハード
ディスク1内の所定の場所に置かれる。図2によると、
データ記憶領域7が管理単位となる小さな記憶領域に分
割され、この中の不良な領域の管理情報が管理テーブル
5に格納される。これはA−3とB−1という管理単位
の小さな記憶領域が不良な記憶領域として管理され、代
替記憶領域6の一部が代替領域として割り当てられてい
る例である。管理テーブル5の領域の数は代替領域6の
数と同じだけ準備される(即ち、1対1に対応する)。 また、アクセス再試行回数記憶テーブル8は管理単位ご
とのアクセス再試行回数が記憶される。図2は、A−4
がi回、C−3がj回の通算アクセス再試行がある例で
ある。
FIG. 2 is a diagram showing the concept of storage area state management of the hard disk 1 used by the information storage device of this embodiment. In FIG. 2, 5 is a management table for managing defective areas, 6 is an alternative storage area, and 7 is a normal data storage area. Furthermore, 8 is a storage table for the number of retries to access the hard disk 1, and this is used to predict the occurrence of a failure. Note that the management table 5 and the access retry count storage table 8 are placed at predetermined locations in the RAM 4 of the information storage device or the hard disk 1. According to Figure 2,
The data storage area 7 is divided into small storage areas serving as management units, and management information for defective areas among these is stored in the management table 5. This is an example in which the small storage areas of management units A-3 and B-1 are managed as defective storage areas, and a part of the alternative storage area 6 is allocated as an alternative area. The number of areas in the management table 5 is the same as the number of alternative areas 6 (that is, one-to-one correspondence). Further, the access retry count storage table 8 stores the access retry count for each management unit. Figure 2 shows A-4
In this example, there are a total of i access retries for C-3 and j access retries for C-3.

【0010】次にこのような構成と記憶領域状態管理を
行う情報記憶装置を用いた、書き込み動作と読み出し動
作の際の不良記憶領域予測及び代替領域割り当て処理に
ついて、図3〜図4に示すフローチャートをそれぞれ参
照しながら説明する。なお、図3〜図4において、re
tryは入出力動作ごとの再試行回数、RETRYは通
算の再試行回数、rmaxは通算での再試行回数の上限
値、そして、Rmaxは通算での再試行回数の上限値を
表す。ここでは、処理の最初にretryには“0”が
、RETRYには以前のアクセス動作までの通算再試行
回数が、rmaxとRmaxにはそれぞれ適当な上限値
がセットされているものとする。
Next, the flowcharts shown in FIGS. 3 and 4 describe the process of predicting a defective storage area and allocating an alternative area during a write operation and a read operation using an information storage device that performs such a configuration and storage area state management. will be explained with reference to each. In addition, in FIGS. 3 and 4, re
try represents the number of retries for each input/output operation, RETRY represents the total number of retries, rmax represents the upper limit of the total number of retries, and Rmax represents the upper limit of the total number of retries. Here, it is assumed that at the beginning of processing, retry is set to "0", RETRY is set to the total number of retries up to the previous access operation, and rmax and Rmax are each set to an appropriate upper limit value.

【0011】まず書き込み時の処理について説明する。 まずステップS1において、書き込み動作があると、ス
テップS2では書き込み動作にエラーがあったかどうか
を調べる。ここで、エラー発生がなければ処理は終了し
、エラーが検出された場合は処理はステップS3に進む
。ステップS3では、retryの値を“1”にセット
する。続いてステップS4ではRETRYの値を更新(
+1)する。ステップS5ではretry及びRETR
Yをそれぞれrmax、Rmaxと比較してチエツクを
行う。ここで、retry或はRETRYどちらか一方
でもが条件値を越えていたら、不良が発生した(ret
ry≧rmax)あるいは、不良が発生する可能性が高
い(RETRY≧Rmax)と判断して処理はステップ
S6に進み、記憶領域の代替処理を行って、ステップS
7で新しく代替された箇所に書き込み動作を実行する。 続いて、ステップS8〜S9ではretry及びRET
RYの値を“0”にリセットし、ステップS10で代替
領域に対する書き込み動作のチェックを行う。ここで、
エラーがなければ処理は終了し、エラーがあれば処理は
ステップS3に戻って再試行処理を行う。
First, the processing at the time of writing will be explained. First, in step S1, if there is a write operation, it is checked in step S2 whether or not there was an error in the write operation. Here, if no error occurs, the process ends, and if an error is detected, the process proceeds to step S3. In step S3, the value of retry is set to "1". Next, in step S4, the value of RETRY is updated (
+1). In step S5, retry and RETR
A check is performed by comparing Y with rmax and Rmax, respectively. Here, if either retry or RETRY exceeds the condition value, a defect has occurred (ret
ry≧rmax) or that there is a high possibility that a defect will occur (RETRY≧Rmax), the process proceeds to step S6, performs storage area replacement processing, and then returns to step S6.
At step 7, a write operation is performed at the newly substituted location. Subsequently, in steps S8 to S9, retry and RET
The value of RY is reset to "0", and a write operation to the alternative area is checked in step S10. here,
If there is no error, the process ends, and if there is an error, the process returns to step S3 to perform a retry process.

【0012】これに対して、retry、RETRYと
も上限値に満たないときは処理はステップS11に進み
、書き込み動作の再試行を行う。ステップS12では、
retryの値を更新し(+1)し、続いてステップS
13で書き込み動作の再試行結果のチェックを行う。こ
こで、エラーであれば処理はステップS4に戻って書き
込み動作の再試行を続行し、エラーがなければ処理はス
テップS14に進み、RETRYの値を更新(+1)し
、最後にステップS15ではretryの値を“0”に
リセットして処理を終了する。
On the other hand, if both retry and RETRY are less than the upper limit, the process proceeds to step S11, and the write operation is retried. In step S12,
The value of retry is updated (+1), and then step S
At step 13, the retry result of the write operation is checked. Here, if there is an error, the process returns to step S4 and continues to retry the write operation; if there is no error, the process proceeds to step S14, where the value of RETRY is updated (+1), and finally, in step S15, the retry The value of is reset to "0" and the process ends.

【0013】以上、書き込み動作の処理においては、R
max>rmaxとすることで、エラー発生の頻度が高
く、潜在的な不良と思われる箇所も未然に回避すること
ができる。また、不良が発生した場合でも自動的に代替
を行うことができる。
As described above, in the write operation processing, R
By setting max>rmax, it is possible to avoid locations where errors occur frequently and are considered to be potential defects. Furthermore, even if a defect occurs, a replacement can be automatically performed.

【0014】次に読み出し時の処理について説明する。 なお、書き込みの処理と共通の処理については、同じス
テップ番号を付して説明を省略する。
Next, the processing at the time of reading will be explained. Note that processes common to the write process are given the same step numbers and their explanations are omitted.

【0015】まず、ステップS21における読み出し動
作に続いてステップS2〜S4の処理を行った後、ステ
ップS25でretryをrmaxと比較してチエツク
を行う。ここで、retry≧rmaxであるなら、処
理はステップS26に進み代替処理を実行するかどうか
を判断する。もし、代替処理を行わないならアクセスエ
ラーとして読み出し動作の処理を終了する。これに対し
て、retry<rmaxであるなら、処理はステップ
S27に進み、読み出し動作の再試行を行う。次にステ
ップS12〜S13でretry値の更新と読み出し動
作のチェックを行った後、処理はステップS28でRE
TRYをRmaxと比較してチエツクを行う。ここで、
RETRY<Rmaxであるなら読み出し動作を終了す
るが、RETRY≧Rmaxであるなら、もはや現在ア
クセス中の該当領域は処理は潜在的な不良とみなして処
理をステップS29に進め、該当領域の情報を代替領域
に移す処理を実行する。ステップS29では記憶領域の
代替処理を、ステップS30では代替領域に対する書き
込み処理を行う。
First, following the read operation in step S21, the processes in steps S2 to S4 are performed, and then in step S25, retry is compared with rmax and checked. Here, if retry≧rmax, the process proceeds to step S26, and it is determined whether or not to execute alternative processing. If alternative processing is not performed, the read operation processing is terminated as an access error. On the other hand, if retry<rmax, the process proceeds to step S27 and retries the read operation. Next, in steps S12 and S13, the retry value is updated and the read operation is checked, and then the process proceeds to step S28, where the RE
Check by comparing TRY with Rmax. here,
If RETRY<Rmax, the read operation ends; however, if RETRY≧Rmax, the corresponding area currently being accessed is considered to be potentially defective, and the process proceeds to step S29, where the information in the corresponding area is replaced. Executes the process of moving to the area. In step S29, storage area replacement processing is performed, and in step S30, writing processing to the replacement area is performed.

【0016】以上読み出し動作の際の処理は、基本的に
書き込み動作時の処理と同じだが、読み出し動作の際の
不良の発生は、本質的に回避することができない点で、
書き込みと処理が異なる。
The processing for the read operation described above is basically the same as the processing for the write operation, but the fact is that the occurrence of defects during the read operation is essentially unavoidable.
Writing and processing are different.

【0017】従って本実施例に従えば、アクセス動作発
生のたび毎に再試行回数や通算再試行回数を調べ、その
チェック結果に基づき代替領域を割り当てることができ
る。さて本実施例では、アクセス再試行数記憶テーブル
8を1ケ所にまとめて置いた場合について説明したが、
本発明はこれに限定されるものではない。例えば、図5
に示すようにハードディスク1の各記憶領域に、アクセ
ス再試行数記憶テーブル8に相当する情報を格納する領
域を設けることもできる。これにより、それぞれ再試行
数を得る処理が書き込み・読み出しと同時に行うことが
でき、別の領域を設けてそこから読み出すという手間を
省略することができる。また、図6に示すように、再試
行があつた領域についてのみ、再試行回数を記憶し再試
行がなかつた領域については記録をしないという方式も
可能である。これによつて、エラー率の低い記憶装置に
対しては、再試行回数の記録領域を節約することができ
る。
Therefore, according to this embodiment, it is possible to check the number of retries and the total number of retries every time an access operation occurs, and to allocate an alternative area based on the check results. Now, in this embodiment, the case where the access retry number storage table 8 is placed in one place has been explained.
The present invention is not limited to this. For example, Figure 5
As shown in FIG. 2, each storage area of the hard disk 1 may be provided with an area for storing information corresponding to the access retry number storage table 8. As a result, the process of obtaining the number of retries can be performed simultaneously with writing and reading, and the effort of providing a separate area and reading from there can be omitted. Furthermore, as shown in FIG. 6, it is also possible to store the number of retries only for areas where retries have been made, and not to record the number of retries for areas where no retries have been made. This makes it possible to save the area for recording the number of retries for a storage device with a low error rate.

【0018】また本実施例においてはアクセス動作が発
生するたび毎に通算再試行回数のチェックを行ったが、
記憶装置が含まれるシステムの起動時に、あるいは、定
期的に記憶装置内の全領域を読み出してアクセスするこ
とにより、潜在的なエラーをより高い確率で発見できる
ようにすることも可能である。
Furthermore, in this embodiment, the total number of retries was checked every time an access operation occurred.
It is also possible to discover potential errors with a higher probability by reading and accessing all areas within the storage device at the time of startup of a system including the storage device or periodically.

【0019】本発明は、複数の機器から構成されるシス
テムに適用しても良いし、1つの機器からなる装置に適
用しても良いし、システム或は装置にプログラムを供給
することによって達成される場合に適用できることは言
うまでもない。
The present invention may be applied to a system consisting of a plurality of devices, or may be applied to a device consisting of one device, or may be achieved by supplying a program to the system or device. Needless to say, this method can be applied in cases where

【0020】[0020]

【発明の効果】以上説明したように本発明によれば、記
憶装置内の不良の発生する可能性の高い領域を事前に予
想し、これを代替する記憶領域に割り当てることによつ
て、入出力動作不良の発生を未然に防ぐ効果がある。ま
た入出力動作不良が発生した際でも、その領域を自動的
に代替することによつて、人手による代替を行うという
手間を省くことができる。
Effects of the Invention As explained above, according to the present invention, by predicting in advance an area in a storage device where a failure is likely to occur and allocating it to an alternative storage area, input/output This has the effect of preventing malfunctions from occurring. Furthermore, even when an input/output malfunction occurs, by automatically replacing the area, it is possible to save the effort of manually performing the replacement.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の代表的な実施例である情報記憶装置の
構成を示すブロツク図である。
FIG. 1 is a block diagram showing the configuration of an information storage device that is a typical embodiment of the present invention.

【図2】記憶領域状態管理の概念を示す図である。FIG. 2 is a diagram showing the concept of storage area state management.

【図3】書き込み動作時における不良領域検出及び不良
領域代替処理のフローチヤートである。
FIG. 3 is a flowchart of defective area detection and defective area replacement processing during a write operation.

【図4】読み出し動作時における不良領域検出及び不良
領域代替処理のフローチヤートである。
FIG. 4 is a flowchart of defective area detection and defective area replacement processing during a read operation.

【図5】記憶領域状態管理の情報を通常の情報と同じ領
域に格納するようにした場合の概念を示す図である。
FIG. 5 is a diagram illustrating the concept of storing storage area status management information in the same area as normal information.

【図6】記憶領域状態管理情報の格納領域を削減した場
合の概念を示す図である。
FIG. 6 is a diagram illustrating the concept of reducing the storage area of storage area status management information.

【図7】従来例に従う記憶領域状態管理の概念図である
FIG. 7 is a conceptual diagram of storage area state management according to a conventional example.

【符号の説明】[Explanation of symbols]

1  ハードディスク 2  CPU 3  ROM 4  RAM 5  不良な領域の管理テーブル 6  代替記憶領域 7  通常のデータ記憶領域 1 Hard disk 2 CPU 3 ROM 4 RAM 5 Bad area management table 6 Alternative storage area 7. Normal data storage area

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  情報を記憶する記憶領域と前記記憶領
域に対するアクセス不良に対応する代替記憶領域とを備
えたランダムアクセス型の記憶装置であって、前記記憶
領域に対する入出力動作が発生するたび毎に前記入出力
動作が正常か不良かを調べる第1のチェック手段と、所
定の時より通算して前記第1のチェック手段によって検
出された前記入出力動作の不良回数を調べる第2のチェ
ック手段と、前記代替記憶領域を新たに記憶領域として
割り当てる代替記憶領域割り当て手段と、前記入出力動
作の不良が発生するたび毎に、前記第1のチェック手段
及び前記第2のチェック手段のチェック結果に基づいて
、前記入出力動作の再試行を行わせたり、或は、前記代
替記憶領域割り当て手段に代替記憶領域を割り当てさせ
たりするよう制御する制御手段とを有することを特徴と
する記憶装置。
1. A random access type storage device comprising a storage area for storing information and an alternative storage area for responding to failures in access to the storage area, wherein the random access storage device includes a storage area for storing information and an alternative storage area for responding to failures in access to the storage area, wherein a first checking means for checking whether the input/output operation is normal or defective; and a second checking means for checking the total number of times the input/output operation is defective detected by the first checking means from a predetermined time. and alternative storage area allocating means for allocating the alternative storage area as a new storage area; 1. A storage device comprising: control means for causing the input/output operation to be retried or causing the alternative storage area allocating means to allocate an alternative storage area based on the input/output operation.
JP3027167A 1991-02-21 1991-02-21 Storage device Pending JPH04266117A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3027167A JPH04266117A (en) 1991-02-21 1991-02-21 Storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3027167A JPH04266117A (en) 1991-02-21 1991-02-21 Storage device

Publications (1)

Publication Number Publication Date
JPH04266117A true JPH04266117A (en) 1992-09-22

Family

ID=12213502

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3027167A Pending JPH04266117A (en) 1991-02-21 1991-02-21 Storage device

Country Status (1)

Country Link
JP (1) JPH04266117A (en)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0721049A (en) * 1993-07-06 1995-01-24 Nec Corp Fault processing system
JPH08195046A (en) * 1995-01-13 1996-07-30 Internatl Business Mach Corp <Ibm> Method and equipment for data processing
JPH0916340A (en) * 1995-06-28 1997-01-17 Nec Corp Magnetic disk unit exchange system
WO1997027530A1 (en) * 1996-01-22 1997-07-31 Hitachi, Ltd. Magnetic disk subsystem
WO1999008273A1 (en) * 1997-08-12 1999-02-18 Sony Corporation Signal recording and reproducing device and method for managing defect of signal recording area
WO1999039347A1 (en) * 1998-02-02 1999-08-05 Hitachi, Ltd. Automatic replacing method in reading and magnetic disc drive using the method
US6169710B1 (en) 1998-07-31 2001-01-02 Nec Corporation Optical disc recording/reproducing method and apparatus
US6233108B1 (en) 1996-04-08 2001-05-15 Canon Kabushiki Kaisha Storage device with the ability to check for defects in same
US6513135B2 (en) 2000-08-02 2003-01-28 Hitachi, Ltd. Automatic read reassignment method and a magnetic disk drive
KR100375139B1 (en) * 1995-08-28 2003-05-01 삼성전자주식회사 Method for processing read data of magnetic disk drive
US6625096B1 (en) 1999-07-02 2003-09-23 Nec Corporation Optical disk recording and reproduction method and apparatus as well as medium on which optical disk recording and reproduction program is recorded

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0721049A (en) * 1993-07-06 1995-01-24 Nec Corp Fault processing system
JPH08195046A (en) * 1995-01-13 1996-07-30 Internatl Business Mach Corp <Ibm> Method and equipment for data processing
JPH0916340A (en) * 1995-06-28 1997-01-17 Nec Corp Magnetic disk unit exchange system
KR100375139B1 (en) * 1995-08-28 2003-05-01 삼성전자주식회사 Method for processing read data of magnetic disk drive
WO1997027530A1 (en) * 1996-01-22 1997-07-31 Hitachi, Ltd. Magnetic disk subsystem
US6233108B1 (en) 1996-04-08 2001-05-15 Canon Kabushiki Kaisha Storage device with the ability to check for defects in same
WO1999008273A1 (en) * 1997-08-12 1999-02-18 Sony Corporation Signal recording and reproducing device and method for managing defect of signal recording area
US6198709B1 (en) 1997-08-12 2001-03-06 Sony Corporation Signal recording/reproducing device and fault control method for signal recording area
US6393580B1 (en) 1998-02-02 2002-05-21 Hitachi, Ltd. Automatic read reassignment method and a magnetic disk drive
WO1999039347A1 (en) * 1998-02-02 1999-08-05 Hitachi, Ltd. Automatic replacing method in reading and magnetic disc drive using the method
US6169710B1 (en) 1998-07-31 2001-01-02 Nec Corporation Optical disc recording/reproducing method and apparatus
US6625096B1 (en) 1999-07-02 2003-09-23 Nec Corporation Optical disk recording and reproduction method and apparatus as well as medium on which optical disk recording and reproduction program is recorded
US6513135B2 (en) 2000-08-02 2003-01-28 Hitachi, Ltd. Automatic read reassignment method and a magnetic disk drive
US6766465B2 (en) 2000-08-02 2004-07-20 Hitachi, Ltd. Automatic read reassignment method and a magnetic disk drive

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