JPH0399485A - Semiconductor laser device - Google Patents
Semiconductor laser deviceInfo
- Publication number
- JPH0399485A JPH0399485A JP23758589A JP23758589A JPH0399485A JP H0399485 A JPH0399485 A JP H0399485A JP 23758589 A JP23758589 A JP 23758589A JP 23758589 A JP23758589 A JP 23758589A JP H0399485 A JPH0399485 A JP H0399485A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- threshold current
- correction
- modulation signal
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 78
- 230000003287 optical effect Effects 0.000 claims abstract description 19
- 238000000034 method Methods 0.000 abstract 1
- 230000007423 decrease Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/06804—Stabilisation of laser output parameters by monitoring an external parameter, e.g. temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
- H01S5/06832—Stabilising during amplitude modulation
Landscapes
- Semiconductor Lasers (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、露光装置などに利用される半導体レーザ装置
で、詳しくは外部より入力された変調信号に対応して半
導体レーザの光出力の強度変調を行う半導体レーザ装置
に関するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a semiconductor laser device used in an exposure device, etc., and more specifically, the present invention relates to a semiconductor laser device that is used in an exposure device or the like. The present invention relates to a semiconductor laser device that performs modulation.
[従来技術]
従来、この種の半導体レーザ装置では、外部から入力さ
れた変調信号に基づいた電流で半導体レーザを駆動させ
、その光出力の強度変調を行う場合、半導体レーザの周
囲温度に変化があると、半導体レーザのしきい値電流が
変化して光出力の強度が変化し、入力された変調信号に
対応した強度の光出力が得られない。そこで、従来は、
4の温度変化に伴う誤動作を回避するために、半導体レ
ーザを一定温度に保つ温度管理手段や、半導体レーザの
温度変化に伴うしきい値電流の変化に追従して半導体レ
ーザの動作点を変化させるしきい値電流補正手段が一般
に採用されている。[Prior Art] Conventionally, in this type of semiconductor laser device, when driving the semiconductor laser with a current based on a modulation signal input from the outside and modulating the intensity of its optical output, it is necessary to avoid changes in the ambient temperature of the semiconductor laser. If so, the threshold current of the semiconductor laser changes and the intensity of the optical output changes, making it impossible to obtain an optical output with an intensity corresponding to the input modulation signal. Therefore, conventionally,
In order to avoid malfunctions due to temperature changes in step 4, temperature control means are used to keep the semiconductor laser at a constant temperature, and the operating point of the semiconductor laser is changed to follow changes in the threshold current due to temperature changes in the semiconductor laser. Threshold current correction means are commonly employed.
前者の温度管理手段は、半導体レーザを加温したり、ペ
ルチェ素子を用いたりするなどして温度を一定に保つ手
段であるが、精密な温度管理が困難で信頼性に欠けるこ
とから、上記しきい値電流補正手段が多用されている。The former temperature control means keeps the temperature constant by heating a semiconductor laser or using a Peltier element, but since precise temperature control is difficult and unreliable, Threshold current correction means are often used.
このしきい値電流補正手段を備えた半導体レーザ装置は
、半導体レーザの光出力をホトダイオードでモニターし
て、しきい値電流の変化を検知し、この変化に追従させ
て半導体レーザの駆動電流を制御する制御回路を備えて
おり、この制御回路によって半導体レーザが温度変化で
しきい値電流が変化したときも、これを補正して変調信
号入力に対応した半導体レーザの光出力の強度変調を行
うようになっている。A semiconductor laser device equipped with this threshold current correction means monitors the optical output of the semiconductor laser with a photodiode, detects changes in the threshold current, and controls the drive current of the semiconductor laser by following this change. It is equipped with a control circuit that compensates for changes in the threshold current of the semiconductor laser due to temperature changes and modulates the intensity of the optical output of the semiconductor laser in response to the modulation signal input. It has become.
[発明が解決しようとする課題]
しかしながら、従来の半導体レーザ装置では、半導体レ
ーザは温度変化に伴いしきい値電流が変化すると共に、
半導体レーザの発光効率である外部微分量子効率(以下
、スロープ効率と称す)も変化する。例えば、第2図に
半導体レーザの光出力P。と駆動電流1.の関係を示す
ように、ある温度条件下でのしきい値電流をI th。[Problems to be Solved by the Invention] However, in conventional semiconductor laser devices, the threshold current of the semiconductor laser changes with temperature changes, and
The external differential quantum efficiency (hereinafter referred to as slope efficiency), which is the luminous efficiency of the semiconductor laser, also changes. For example, FIG. 2 shows the optical output P of a semiconductor laser. and drive current 1. As shown in the relationship, the threshold current under a certain temperature condition is I th.
スロープ効率をηとすると、
Po= (IF I th)η
と表される。スロープ効率ηは、光出力P。の増分に対
する消費電流の増分の比で、これは第3図に示すように
、半導体レーザの温度変化に対してほぼ直線的に変化す
る。When the slope efficiency is η, it is expressed as Po=(IF I th)η. The slope efficiency η is the optical output P. As shown in FIG. 3, this ratio changes almost linearly with changes in the temperature of the semiconductor laser.
したがって、変調信号入力に対応して半導体レーザの光
出力の強度変調を行う半導体レーザ装置では、半導体レ
ーザの温度変化に伴うしきい値電流補正をしても、スロ
ープ効率が変化して光出力の強度が温度上昇に伴い減少
し、温度低下に伴い増加することがあるため、変調記号
入力と光強度変調を正確に対応させることが難しいとい
う問題があった。Therefore, in a semiconductor laser device that performs intensity modulation of the optical output of a semiconductor laser in response to a modulation signal input, even if the threshold current is corrected due to temperature changes in the semiconductor laser, the slope efficiency changes and the optical output decreases. Since the intensity sometimes decreases as the temperature rises and increases as the temperature decreases, there is a problem in that it is difficult to accurately correspond the modulation symbol input and the light intensity modulation.
本発明は上述の点に鑑みなされたもので、その目的とす
るところは、半導体レーザの温度変化に伴う光強度変調
の誤差原因を除いて、変調信号入力に正確に対応させて
光強度変調を行う半導体レーザ装置を提供することにあ
る。The present invention has been made in view of the above points, and its purpose is to eliminate the cause of errors in light intensity modulation due to temperature changes in semiconductor lasers, and to perform light intensity modulation in accurate correspondence with modulation signal input. An object of the present invention is to provide a semiconductor laser device that performs the following steps.
[課題を解決するための手段]
本発明の半導体レーザ装置は、半導体レーザの温度変化
に伴うしきい値電流補正手段と、スロープ効率の変化を
補正するスロープ効率補正手段を具備することで上記目
的を達成するもので、次の構成よりなる。すなわち、本
発明の半導体レーザ装置は、外部からの変調信号入力に
対応して半導体レーザの光強度変調を行うもので、半導
体レーザの温度情報に基づくスロープ効率の逆数の補正
係数を算出し、この補正係数を変調信号入力に掛け合わ
せた補正変調信号を出力する補正回路と、半導体レーザ
のしきい値電流を発生して補正回路の補正変調信号に加
算した駆動電流を出力するしきい値電流発生回路と、し
きい値電流発生回路の駆動電流に基づいて半導体レーザ
を駆動させる電流駆動回路とを具備している。[Means for Solving the Problems] The semiconductor laser device of the present invention achieves the above object by comprising a threshold current correction means for correcting a change in the temperature of the semiconductor laser and a slope efficiency correction means for correcting a change in slope efficiency. It achieves this and consists of the following configuration: That is, the semiconductor laser device of the present invention modulates the light intensity of the semiconductor laser in response to an external modulation signal input, and calculates a correction coefficient of the reciprocal of the slope efficiency based on temperature information of the semiconductor laser. A correction circuit that outputs a corrected modulation signal obtained by multiplying the modulation signal input by a correction coefficient, and a threshold current generator that generates a threshold current for the semiconductor laser and outputs a drive current that is added to the corrected modulation signal of the correction circuit. circuit, and a current drive circuit that drives the semiconductor laser based on the drive current of the threshold current generation circuit.
[作用]
上記の構成を有する本発明の半導体レーザ装置によれば
、前記補正回路は、半導体レーザの温度変化に伴うスロ
ープ効率の変化を補正した補正変調信号をしきい値電流
発生回路に出力し、しきい値電流発生回路は、半導体レ
ーザの温度変化に伴うしきい値電流と前記補正変調信号
を加算した駆動電流を電流駆動回路に出力して半導体レ
ーザを駆動させるので、半導体レーザはスロープ効率及
びしきい値電流の補正された、従って、温度変化に対し
て誤差の少ない、人力変調信号に比例した光出力で駆動
する。[Function] According to the semiconductor laser device of the present invention having the above configuration, the correction circuit outputs a correction modulation signal that corrects a change in slope efficiency due to a temperature change of the semiconductor laser to the threshold current generation circuit. , the threshold current generation circuit outputs a drive current that is the sum of the threshold current caused by the temperature change of the semiconductor laser and the correction modulation signal to the current drive circuit to drive the semiconductor laser, so the semiconductor laser has a slope efficiency. It is driven with an optical output proportional to the manual modulation signal, with the threshold current corrected and therefore less error sensitive to temperature changes.
[実施例]
以下、本発明を具体化した一実施例について第1図を参
照して説明する。[Example] Hereinafter, an example embodying the present invention will be described with reference to FIG. 1.
第1図は本発明の半導体レーザ装置の構成全体を説明す
るためのブロック図で、第1図に示すように、外部から
人力される変調信号り、に対し、半導体レーザ1のスロ
ープ効率η(第2図)の変化を補正する補正回路2と、
半導体レーザlのしきい値電流を発生するしきい値電流
発生回路3と、半導体レーザlを電流駆動させる電流駆
動回路4と、半導体レーザlの温度を検知して電気信号
に変換した信号を補正回路2に出力する温度センサ5と
、半導体レーザlの光出力を電気信号に変換してしきい
値電流発生回路3に出力する受光素子、例えばフォトダ
イオード6とで構成される。温度センサ5は半導体レー
ザlに熱結合されて、半導体レーザ1の温度に応じたス
ロープ効率η(第2図)の温度情報を補正回路2に送出
する。フォトダイオード6は半導体レーザ1に光結合さ
れて、半導体レーザlのしきい値電流を決める信号をし
きい値電流発生回路3に送出する。FIG. 1 is a block diagram for explaining the entire configuration of the semiconductor laser device of the present invention. As shown in FIG. 1, the slope efficiency η( a correction circuit 2 for correcting the change in FIG. 2);
A threshold current generation circuit 3 that generates a threshold current of the semiconductor laser l, a current drive circuit 4 that drives the semiconductor laser l with current, and a signal that detects the temperature of the semiconductor laser l and corrects the signal converted into an electrical signal. It is comprised of a temperature sensor 5 that outputs an output to the circuit 2, and a light receiving element, for example a photodiode 6, that converts the optical output of the semiconductor laser l into an electrical signal and outputs it to the threshold current generation circuit 3. The temperature sensor 5 is thermally coupled to the semiconductor laser 1 and sends temperature information of the slope efficiency η (FIG. 2) according to the temperature of the semiconductor laser 1 to the correction circuit 2. The photodiode 6 is optically coupled to the semiconductor laser 1 and sends a signal determining the threshold current of the semiconductor laser 1 to the threshold current generation circuit 3.
さらに詳しく説明する。補正回路2は、温度センサ5か
らの温度情報に基づいて半導体レーザIの温度で決まる
スロープ効率η(第2図)の逆数である補正係数!/η
を算出する機能と、この補正係数I/ηと外部から人力
された変調信号D6とを掛け合わせたり、・1/ηなる
補正変調信号を出力する機能を備えている。I will explain in more detail. The correction circuit 2 calculates a correction coefficient, which is the reciprocal of the slope efficiency η (FIG. 2) determined by the temperature of the semiconductor laser I, based on the temperature information from the temperature sensor 5! /η
It has a function of calculating the correction coefficient I/η and a function of multiplying the correction coefficient I/η by a modulation signal D6 manually input from the outside, or outputting a correction modulation signal of 1/η.
しきい値電流発生回路3は、フォトダイオード6からの
信号に基づいて半導体レーザlの温度に応じたしきい値
電流I thを発生する機能と、発生したしきい値電流
1thと補正回路2からの補正変調信号り、/ηを加算
したり、/η+I thなる駆動電流を電流駆動回路4
に出力する機能を備えている。しきい値電流発生回路3
のしきい値電流発生は次のように行われる。すなわち、
外部から所定の周期をもって入力される制御指令信号で
、補正回路2からの入力変調データを遮断してしきい値
電流のみを電流駆動回路4に出ツノし、その出力電流を
零から除々に増加させる。そして、半導体レーザlの光
出力が急激に増加してフォトダイオード6が所定レベル
の光を検知した時点でのしきい値電流1 thを固定し
、補正回路2からの入力変調データの遮断を解除する。The threshold current generation circuit 3 has a function of generating a threshold current Ith according to the temperature of the semiconductor laser l based on a signal from the photodiode 6, and a function of generating a threshold current Ith from the generated threshold current 1th and the correction circuit 2. The current drive circuit 4 adds /η to the correction modulation signal of /η+I th.
It has the ability to output to. Threshold current generation circuit 3
The threshold current generation is performed as follows. That is,
Using a control command signal input from the outside at a predetermined period, the input modulation data from the correction circuit 2 is cut off, only the threshold current is output to the current drive circuit 4, and the output current is gradually increased from zero. let Then, the threshold current 1th is fixed at the time when the optical output of the semiconductor laser 1 suddenly increases and the photodiode 6 detects light at a predetermined level, and the cutoff of the input modulation data from the correction circuit 2 is released. do.
電流駆動回路4は、しきい値電流発生回路3からの駆動
電流(D、/η+I th)に基づいて半導体レーザ1
を駆動させる。この半導体レーザ!の光出力P。は、駆
動電流をIFとして第2図のグラフから
Po=(Ip 1th)77
と表されのであるが、本発明においての駆動電流1.は
、前述したように(D、/η+I th)であるので、
これを上式に代入すれば光出力P。The current drive circuit 4 controls the semiconductor laser 1 based on the drive current (D, /η+I th) from the threshold current generation circuit 3.
drive. This semiconductor laser! optical output P. is expressed as Po=(Ip 1th)77 from the graph of FIG. 2, where the drive current is IF, but the drive current 1. As mentioned above, is (D, /η+I th), so
Substituting this into the above equation gives the optical output P.
は次式の通りになる。is as follows.
PO−(D、/77 + I th−I th) 77
=D。PO-(D, /77 + I th-I th) 77
=D.
すなわち、半導体レーザ1の光出力P。は、温度変化に
伴ってしきい値電流11hやスロープ効率ηが変化して
もその影響を受けず、外部から入力される変調信号D6
に比例したものとなる。That is, the optical output P of the semiconductor laser 1. is not affected by changes in the threshold current 11h and slope efficiency η due to temperature changes, and the modulation signal D6 input from the outside is
It will be proportional to.
[発明の効果]
以上詳述したことから明らかなように、本発明の半導体
レーザ装置は、半導体レーザの温度変化に伴うしきい値
電流とスロープ効率を補正して、外部から入力される変
調信号に対応させて半導体レーザの光強度変調を行うよ
うにしたので、半導体レーザの温度が変化してもその影
響を受けることなく、変調信号人力に比例した光出力で
もって半導体レーザを安定して駆動させることができ、
高精度で信頼性の高いといろ効果がある。また、半導体
レーザの精密な温度管理が不要で、装置全体の小型化、
保守の容易化が達成できるという効果もある。[Effects of the Invention] As is clear from the detailed description above, the semiconductor laser device of the present invention corrects the threshold current and slope efficiency accompanying temperature changes of the semiconductor laser, and adjusts the modulation signal input from the outside. Since the light intensity modulation of the semiconductor laser is performed in response to the change in temperature of the semiconductor laser, it is not affected by changes in the temperature of the semiconductor laser, and the semiconductor laser can be stably driven with an optical output proportional to the modulation signal human power. can be made,
High precision, high reliability, and effectiveness. In addition, there is no need for precise temperature control of the semiconductor laser, making the entire device more compact.
Another effect is that maintenance can be facilitated.
第1図は本発明に係る半導体レーザ装置の実施例を示す
ブロック図、第2図は半導体レーザにおける光出力と駆
動電流の特性を示すグラフ図、第3図は半導体レーザの
スロープ効率(外部微分量子効率)と温度の特性を示す
グラフ図である。
l・・・半導体レーザ、2・・・補正回路、3・・・し
きい値電流発生回路、4・・・電流駆動回路、5・・・
温度センサ、6・・・フォトダイオード。Fig. 1 is a block diagram showing an embodiment of the semiconductor laser device according to the present invention, Fig. 2 is a graph showing the characteristics of optical output and drive current in the semiconductor laser, and Fig. 3 is the slope efficiency (external differential FIG. 2 is a graph diagram showing characteristics of quantum efficiency (quantum efficiency) and temperature. l... Semiconductor laser, 2... Correction circuit, 3... Threshold current generation circuit, 4... Current drive circuit, 5...
Temperature sensor, 6...photodiode.
Claims (1)
光出力の強度変調を行う半導体レーザ装置であって、 半導体レーザの温度情報に基づく外部微分量子効率の逆
数の補正係数を算出し、この補正係数を前記変調信号に
掛け合わせた補正変調信号を出力する補正回路と、 半導体レーザのしきい値電流を発生して前記補正回路の
補正変調信号に加算した駆動電流を出力するしきい値電
流発生回路と、 しきい値電流発生回路の駆動電流に基づいて半導体レー
ザを駆動させる電流駆動回路とを具備したことを特徴と
する半導体レーザ装置。[Claims] A semiconductor laser device that performs intensity modulation of the optical output of a semiconductor laser in response to a modulation signal input from the outside, comprising: a correction coefficient of the reciprocal of external differential quantum efficiency based on temperature information of the semiconductor laser; a correction circuit that calculates the correction coefficient and outputs a correction modulation signal by multiplying the modulation signal by this correction coefficient; and a correction circuit that generates a threshold current of the semiconductor laser and outputs a drive current that is added to the correction modulation signal of the correction circuit. What is claimed is: 1. A semiconductor laser device comprising: a threshold current generation circuit; and a current drive circuit that drives a semiconductor laser based on a drive current of the threshold current generation circuit.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23758589A JPH0399485A (en) | 1989-09-12 | 1989-09-12 | Semiconductor laser device |
US07/578,270 US5018154A (en) | 1989-09-12 | 1990-09-06 | Semiconductor laser drive device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23758589A JPH0399485A (en) | 1989-09-12 | 1989-09-12 | Semiconductor laser device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0399485A true JPH0399485A (en) | 1991-04-24 |
Family
ID=17017500
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP23758589A Pending JPH0399485A (en) | 1989-09-12 | 1989-09-12 | Semiconductor laser device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0399485A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001059896A1 (en) * | 2000-02-09 | 2001-08-16 | Koninklijke Philips Electronics N.V. | Control circuit for a radiation source and method for controlling a radiation source |
WO2004105004A1 (en) * | 2003-05-20 | 2004-12-02 | Koninklijke Philips Electronics N.V. | Method and radiation source driving device for controlling radiation power |
-
1989
- 1989-09-12 JP JP23758589A patent/JPH0399485A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001059896A1 (en) * | 2000-02-09 | 2001-08-16 | Koninklijke Philips Electronics N.V. | Control circuit for a radiation source and method for controlling a radiation source |
US6577655B2 (en) | 2000-02-09 | 2003-06-10 | Koninklijke Philips Electronics N.V. | Control circuit for a radiation source, apparatus comprising the control circuit, optical transmitter comprising the control circuit, and method for controlling a radiation source |
WO2004105004A1 (en) * | 2003-05-20 | 2004-12-02 | Koninklijke Philips Electronics N.V. | Method and radiation source driving device for controlling radiation power |
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