JPH0394445A - Semiconductor wafer transfer system - Google Patents

Semiconductor wafer transfer system

Info

Publication number
JPH0394445A
JPH0394445A JP1232199A JP23219989A JPH0394445A JP H0394445 A JPH0394445 A JP H0394445A JP 1232199 A JP1232199 A JP 1232199A JP 23219989 A JP23219989 A JP 23219989A JP H0394445 A JPH0394445 A JP H0394445A
Authority
JP
Japan
Prior art keywords
wafer
temperature
semiconductor wafer
transfer device
stocker
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1232199A
Other languages
Japanese (ja)
Inventor
Kouichirou Tsutahara
晃一郎 蔦原
Toru Yamaguchi
徹 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP1232199A priority Critical patent/JPH0394445A/en
Publication of JPH0394445A publication Critical patent/JPH0394445A/en
Pending legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To reduce foreign bodies adhering to the surface of a semiconductor wafer by installing a transfer device which transports the semiconductor wafer while a temperature of the wafer is being kept at a high temperature; and a wafer stocker which holds the semiconductor wafer while the temperature of the wafer is being kept at the high temperature. CONSTITUTION:In a transfer device 3 which transfers a wafer 2 to individual treatment devices 1, one route of the transfer device is formed as a module; a transfer operation between modules is executed by using another intermodule transfer device 4. A wafer stocker 5 which temporarily keeps the wafer is provided at an entrance of the module to execute the transfer operation smoothly; a clean bench 6 is provided at the upper part of the wafer stocker 5. That is to say, the following are provided: the transfer device 3 which keeps a temperature of the semiconductor wafer 2 at a temperature higher than an ambient temperature and which transports the wafer 2; and the wafer stocker 5 which keeps the temperature of the semiconductor wafer 2 at the temperature higher than the ambient temperature and which keeps the wafer 2. Thereby, it is possible to prevent a foreign body from adhering as far as possible in a wafer transfer system and to enhance yield during manufacturing operation of the wafer at a low cost and surely.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は.半導体ウェハ製造に訃ける搬送Vステムに
関するものである。
[Detailed Description of the Invention] [Field of Industrial Application] This invention... This invention relates to a conveying V-stem that is used in semiconductor wafer manufacturing.

〔従来の技術〕[Conventional technology]

半導体ウェハ製造にかいては,ウェハの装置間の搬送が
従来の人手によるものからロボットや搬送車による自動
搬送に変わってきた。これは,人手をなくすことにより
.ウェハに付着する異物の減少(人間は異物の最大の発
生源である).複雑な工程搬送への対応をめざすもので
ある。
In semiconductor wafer manufacturing, the transport of wafers between devices has changed from the traditional manual transport to automatic transport using robots and transport vehicles. This is done by eliminating human labor. Reduced foreign matter adhering to wafers (humans are the largest source of foreign matter). The aim is to handle complex process transportation.

従来は,装置間の搬送はクエ八が複数枚収容された容器
(ウェハカセット)をロボットや搬送車で運ぶことが多
かったが,近年,ウェハの大口径化や.多品種小量生産
の対応のため.ウェハを一枚ずつ搬送する必要が生じて
きた。
Traditionally, containers containing multiple wafers (wafer cassettes) were often transported between devices using robots or transport vehicles, but in recent years, wafers have become larger in diameter. To support high-mix, low-volume production. It has become necessary to transport wafers one by one.

第9図に従来のウェハ枚葉搬送システムの一例を示す。FIG. 9 shows an example of a conventional single wafer transfer system.

図にかいて,(1)はウェハ処理装置であり,これらの
装置を所定の順序でウェハ(2)が通過し,処理される
ことによυ.ウェハ(2)上にパターンが形或され.デ
バイスができあがっていく。(3)は各処理装It (
1)にウェハ(2)を搬送する搬送装置であシ,本例で
は搬送装置の一系路をモジ二一μとし,モジュー/I/
r1JJ搬送を別のモジュール間搬送装@(4)により
行なっている。モジュールの入口にはウェハ(2)を一
時保管するウェハストツカ−(5)が備えられ,搬送の
平潤化を目ざす。搬送装置(3)及びウェハストツカ−
(5)の上方には,クリーンベンチ(6)を備え,ウェ
ハ(2)表面上への異物付着を防いでいる。
In the figure, (1) is a wafer processing device, and wafers (2) pass through these devices in a predetermined order and are processed. A pattern is formed on the wafer (2). The device is completed. (3) is each processing unit It (
1) is a transfer device that transfers a wafer (2) to a wafer (2).
r1JJ transport is performed by another inter-module transport device @(4). A wafer stocker (5) is installed at the entrance of the module to temporarily store wafers (2), with the aim of making transportation smoother. Transfer device (3) and wafer stocker
A clean bench (6) is provided above (5) to prevent foreign matter from adhering to the surface of the wafer (2).

〔発明が解決しよりとする課題〕[Problems that the invention helps solve]

ところが上記のよりに構威されている.従来のウェハ枚
葉搬送システムにおいては.次に述べるよりな問題点が
あった。
However, the above is a problem. In the conventional single wafer transfer system. There were more problems than mentioned below.

(i)  ウェハを一枚ずつ裸の状態で運んだシ.保管
するため,従来の25枚まとめて容器に入れた状態で運
ぶものに比べて.ウェハ表面に異物が付着し易い。
(i) A case in which wafers were transported one by one in a bare state. Compared to the conventional method of transporting 25 sheets in a container for storage. Foreign matter easily adheres to the wafer surface.

(it)  ウェハを一枚ずつ運ぶため.@送系のスピ
ードを向上させたとしても,搬送系路の増大は避けられ
ず.搬送系上方に設けられるべきクリーンベンチの費用
が増大する。會た(i)項で述べた異物の付着し易さを
クリーンベンチのクリーン度向上で補なかうとすると,
クリーンベンチは筐すます高価なものが必要となう,費
用がかさむ。
(it) To transport wafers one by one. @Even if the speed of the transport system is improved, the number of transport lines will inevitably increase. The cost of a clean bench to be provided above the transport system increases. If we try to compensate for the tendency for foreign matter to adhere as mentioned in section (i) by improving the cleanliness of the clean bench,
Clean benches require increasingly expensive cabinets, increasing costs.

(i′li)  また,クリーンベンチを設けたとして
も.装置や搬送系のトフプルで人間が介在することは必
ずあシ,その時にウェハ上に異物が付着する。
(i'li) Also, even if a clean bench is installed. Human intervention is inevitable in the top pulls of equipment and transport systems, and foreign matter adheres to the wafers during this time.

以上に述べた理由で,ウェハ枚葉搬送システムにおいて
は.ウェハ表面上に異物が付着し易く,ウェハ製造にか
ける歩留シ低下をもたらすという問題があった。
For the reasons stated above, in single wafer transfer systems. There is a problem in that foreign matter tends to adhere to the wafer surface, resulting in a decrease in yield in wafer manufacturing.

この発明は,以上のよりな事情に鑑みてなされたもので
.ウェハ表面上に付着する異物が少ない,ウェハ枚葉搬
送システムを安価に提供するものである。
This invention was made in view of the above circumstances. This provides a low cost single wafer transfer system with less foreign matter adhering to the wafer surface.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係るウェハ枚葉搬送システムは.半導体ウェ
ハの温度を周辺温度よ少高温に保ちながらウェハを運ぶ
搬送装置と,半導体ウェハの温度を周辺温度より高温に
保ちながらウェハを保管するウェハストツ力一とを有す
るものである。
The single wafer transfer system according to this invention is. It has a transport device that transports the semiconductor wafer while keeping the temperature of the semiconductor wafer slightly higher than the ambient temperature, and a wafer storage device that stores the wafer while keeping the temperature of the semiconductor wafer higher than the ambient temperature.

〔作用〕[Effect]

この発明にかいては,搬送システムにかける搬送装置あ
るいはウェハストッ力に,搬送中あるいは保管中のウェ
ハ温度を周辺温度よシ高温に保つ機能を設けたことによ
り.異物の付着を防止するものである。
In this invention, the transfer device or wafer holding force applied to the transfer system is equipped with a function to maintain the wafer temperature during transfer or storage at a higher temperature than the surrounding temperature. This prevents foreign matter from adhering.

なカ定明者の実験によると,ウェハ温度を4o○℃に加
熱すると周辺温度と同一温度の場合に比べ,約175〜
1/10に異物付着が減少できることが実証されてカシ
.これを搬送系に組み込むことによυ,異物付着を防止
できる。
According to an experiment by a certain person, when the wafer temperature is heated to 4o○℃, the temperature decreases by about 175~
It has been demonstrated that foreign matter adhesion can be reduced by 1/10. By incorporating this into the conveyance system, it is possible to prevent foreign matter from adhering.

ウェハを周辺よシ高温にすると,異物付着を防止できる
By heating the wafer to a higher temperature than its surroundings, foreign matter can be prevented from adhering to the wafer.

理由は.熱泳動現象によるものと考えられるが.筐だ明
解な理論は確立されていない。
Reason. This is thought to be due to thermophoretic phenomena. However, no clear theory has been established.

熱泳動現象とは.エアロゾiv(微小粒子を含む気体)
に温度勾配が存在すると,粒子は高温側の媒質気体分子
から低温測よυも大きな運動量を与えられ,その結果,
高温側から低温側に力を受けてエアロゾルが移動する現
象である。
What is thermophoresis? Aeroso IV (gas containing microparticles)
When a temperature gradient exists at
This is a phenomenon in which aerosol moves from a high-temperature side to a low-temperature side under the influence of force.

この現象によシ,高温物体表面のごく近傍にはエアロゾ
ル粒子を含まない空間が生じ.高温物体表面にはエアロ
ゾル粒子(異物)が付着しないのである。この様子を第
10図に示している。
This phenomenon creates a space that does not contain aerosol particles in the close vicinity of the surface of a high-temperature object. Aerosol particles (foreign matter) do not adhere to the surface of a high-temperature object. This situation is shown in FIG.

〔実施例〕〔Example〕

以下.この余明の一実施例を図について説明する。 below. An embodiment of this Yumei will be explained with reference to the drawings.

第1図に本発明による半導体ウェハ搬送システムの一実
施例の斜視図を示し.第2図に本システムを構或する搬
送装置の斜視図,第3図に同じくウェハストッ力一の斜
視図を示す。
FIG. 1 shows a perspective view of an embodiment of a semiconductor wafer transport system according to the present invention. FIG. 2 is a perspective view of the transfer device constituting this system, and FIG. 3 is a perspective view of the wafer holding force.

第1図にかいて.(3)は各処理装置(1)にウェハ(
2)を搬送する搬送装置であシ.本例では.搬送装置の
一系路をモジューμとし,モジューノレ間搬送を別のモ
ジュール間搬送装置(4)により行なっている。
As shown in Figure 1. (3) The wafer (
2) A conveying device that conveys the. In this example. One path of the transport device is a module μ, and transport between modules is performed by another inter-module transport device (4).

モジュールの入口にはウェハを一時保管するウェハスト
ッ力−(5)が備えられ.搬送の平潤化を図っている。
A wafer storage device (5) for temporarily storing wafers is provided at the entrance of the module. We are trying to make transportation easier.

ウェハストツカー(5)の上方にはクリーンベンチ(6
)を備えている。
Above the wafer stocker (5) is a clean bench (6).
).

第2図は.上述した搬送システムを構或する搬送装置(
3)の一実施例である。ウェハ(2)はヒーター(7)
を内蔵した加熱ステージ上に置かれ.400℃程度に加
熱された状態で運ばれる。(8)は搬送レーμであう.
リニアモータ(図示せず)などによυ駆動力を得て高速
で処理装置間を移動する。
Figure 2 is. Conveyance device (which constitutes the above-mentioned conveyance system)
This is an example of 3). Wafer (2) is heater (7)
placed on a heating stage with a built-in It is transported heated to around 400 degrees Celsius. (8) is the transport rail μ.
It is moved between processing devices at high speed by obtaining υ driving force from a linear motor (not shown) or the like.

@3図は,同じく搬送システムを構戒するウェハストッ
カー(5)の一実施例である。ウェハ(2)ハヒーター
(7)を内蔵した加熱棚(9)上に置かれ,40O℃程
度に加熱された状態で保管される。加熱棚(9)へのウ
ェハ出し入れは別の搬送装置(図示せず)が行なう。
Figure @3 is an example of a wafer stocker (5) that also monitors the transfer system. The wafer (2) is placed on a heating shelf (9) containing a heater (7) and stored in a heated state of about 400°C. A separate transfer device (not shown) takes wafers into and out of the heating shelf (9).

なお.本実施例にかいては,搬送装置をレーμ上のステ
ージタイプとしたが,本発明はこれに限定されるもので
はなく.@4図のよりに搬送ロボットタイプでもよい。
In addition. In this embodiment, the conveyance device is a stage type on a rail μ, but the present invention is not limited to this. @4 A transfer robot type as shown in Figure 4 may also be used.

その場合,図のよりにグリップ部にヒーター(7)を設
けることになる。1た,第5図のよりに搬送車タイプの
ものでもよく.この場合.図のよりに搬送車上にヒータ
ー(7)を設け,ウェハ温度を周辺温度よジ高温に保て
ばよい。
In that case, a heater (7) will be provided in the grip as shown in the figure. 1. It may also be a transport vehicle type as shown in Figure 5. in this case. As shown in the figure, a heater (7) may be provided on the transport vehicle to maintain the wafer temperature at a higher temperature than the surrounding temperature.

また,本実施例に訃いては.ウェハの加熱源をヒーター
とステージによる伝4によるものとしたが.それに限る
ものでなく.第6図のよりにランプαGによる放射加熱
,あるいはマイクロ波による加熱(図示せず)fkとで
もよく.とにかくウエ八温度を周辺温度よシ高温に保て
ばよいのである。
Also, regarding this example. The heating source for the wafer was a heater and a stage. It is not limited to that. As shown in Fig. 6, radiant heating by lamp αG or heating by microwave (not shown) fk may be used. In any case, all you have to do is keep the wafer temperature higher than the surrounding temperature.

1た,本′4i!施例にシいては.ウェハを400℃に
加熱することによりウェハ温度を周辺温度よシ高温に保
ったが,ウェハを加熱すると不都合の場合は第7図のよ
りにウェハ外気を冷却し,ウェハと周辺温度の間に熱勾
配を設けてもよい。本夾施例のウエ〃加熱と外気冷却を
併用すれば.ウェハ温度をあまり上げずに温度勾配を大
きくとることができ,異物付着防止には一層効果的であ
る。
1, book'4i! As for the example. By heating the wafer to 400°C, the wafer temperature was maintained at a higher temperature than the surrounding temperature. However, if heating the wafer is inconvenient, the air outside the wafer is cooled as shown in Figure 7, and the heat is kept between the wafer and the surrounding temperature. A gradient may also be provided. If the wafer heating and outside air cooling in this example are used together. It is possible to create a large temperature gradient without raising the wafer temperature too much, making it more effective in preventing foreign matter from adhering.

筐た.木実施例にかいては,ウェハ表面を上方に向けた
状態での搬送.保管を示したが.それに限らず,@H図
のよりに,ウェハ表面を下方に向ければ温度勾配の熱泳
動だげでは防げない大きな落下する異物の付着防止に非
常に効果があシ.本発明との併用でほぼ異物の付着を完
全になくすことができる。
It was a cabinet. In the wooden example, the wafer is transported with the surface facing upward. I indicated that I would keep it. Not only that, but as shown in Figure @H, if the wafer surface is facing downward, it is very effective in preventing the adhesion of large falling foreign particles that cannot be prevented by thermophoresis due to the temperature gradient. In combination with the present invention, attachment of foreign matter can be almost completely eliminated.

〔発明の効果〕〔Effect of the invention〕

以上のよりにこの発明はL」゛半導体ウェハの温度を周
辺温度よF)K温に床ちクエハを運ぶ搬送装置と,半導
体ウェハの温度を周辺温度よシ高温に保ちウェハを保管
するウェハストッヵーとを有するウェハ搬送システムで
あるので,ウェハ搬送システムでの異物の付着を販力防
止でき,ウェハ製造に釦ける歩留シ向上が低価格で確実
に実現できる効果がある。
Based on the above, the present invention provides a transfer device for transporting a semiconductor wafer to a temperature between the ambient temperature and F)K, a wafer stocker for keeping the temperature of the semiconductor wafer at a higher temperature than the ambient temperature, and storing the wafer. This wafer transport system has the advantage of being able to prevent foreign matter from adhering to the wafer transport system and reliably improve yields in wafer manufacturing at a low cost.

【図面の簡単な説明】[Brief explanation of drawings]

第1図〜wc3図は本発明の一実施例を示すもので,第
1図は半導体ウェハ搬送システムの一実施例を示す斜視
図.第2図は半導体ウェハ搬送システムを構或する搬送
装置を示す斜視図,第3図は半導体ウェハ搬送システム
を構或するウェハストツ力一を示す斜視図,第4図,第
5図,第6図.槙7図,@8図は夫A本発明に係る搬送
装置の他の実施例を示す略線図.第9図は従来の半導体
ウェハ搬送システムを示す斜視図.@10図は本発明の
原理を示す模式図である。 図中.(l〉は処理装置,(2)はウェハ.(3)はウ
ェハ搬送装置.(4)はモジューμ間搬送装置,(5)
はウエ八ストツカ, (6)はクリーンペンチ.(7)
はヒーター(8)はレーμ,(9)は加熱棚.αOはラ
ンプである。 なか.図中同一符号は同一または相当部分を示す。
Figures 1 to 3 show an embodiment of the present invention, and Figure 1 is a perspective view of an embodiment of a semiconductor wafer transfer system. FIG. 2 is a perspective view showing a transfer device that makes up a semiconductor wafer transfer system, FIG. 3 is a perspective view showing a wafer transport device that makes up a semiconductor wafer transfer system, FIGS. 4, 5, and 6. .. Figures 7 and 8 are schematic diagrams showing other embodiments of the conveying device according to the present invention. Figure 9 is a perspective view showing a conventional semiconductor wafer transport system. @Figure 10 is a schematic diagram showing the principle of the present invention. In the figure. (l> is the processing device, (2) is the wafer. (3) is the wafer transfer device. (4) is the module μ transfer device, (5)
(6) is clean pliers. (7)
is the heater (8), and (9) is the heating shelf. αO is a lamp. inside. The same reference numerals in the figures indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] 半導体ウェハを搬送するに際し、半導体ウェハの温度を
周辺温度より高温に保ちながら運ぶ搬送装置と、半導体
ウェハの温度を周辺温度より高温に保ちながら保管する
ウェハストッカーとを有する半導体ウェハ搬送システム
A semiconductor wafer transport system includes a transport device that transports a semiconductor wafer while keeping the temperature of the semiconductor wafer higher than the surrounding temperature, and a wafer stocker that stores the semiconductor wafer while keeping the temperature of the semiconductor wafer higher than the surrounding temperature.
JP1232199A 1989-09-06 1989-09-06 Semiconductor wafer transfer system Pending JPH0394445A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1232199A JPH0394445A (en) 1989-09-06 1989-09-06 Semiconductor wafer transfer system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1232199A JPH0394445A (en) 1989-09-06 1989-09-06 Semiconductor wafer transfer system

Publications (1)

Publication Number Publication Date
JPH0394445A true JPH0394445A (en) 1991-04-19

Family

ID=16935542

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1232199A Pending JPH0394445A (en) 1989-09-06 1989-09-06 Semiconductor wafer transfer system

Country Status (1)

Country Link
JP (1) JPH0394445A (en)

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