JPH0346895B2 - - Google Patents

Info

Publication number
JPH0346895B2
JPH0346895B2 JP62321152A JP32115287A JPH0346895B2 JP H0346895 B2 JPH0346895 B2 JP H0346895B2 JP 62321152 A JP62321152 A JP 62321152A JP 32115287 A JP32115287 A JP 32115287A JP H0346895 B2 JPH0346895 B2 JP H0346895B2
Authority
JP
Japan
Prior art keywords
photoresist
predetermined
layer
recording
photoresist layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62321152A
Other languages
Japanese (ja)
Other versions
JPS63177329A (en
Inventor
Eru Uirukinson Richaado
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Discovision Associates
Original Assignee
Discovision Associates
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=22645656&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JPH0346895(B2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Discovision Associates filed Critical Discovision Associates
Publication of JPS63177329A publication Critical patent/JPS63177329A/en
Publication of JPH0346895B2 publication Critical patent/JPH0346895B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26Apparatus or processes specially adapted for the manufacture of record carriers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/162Coating on a rotating support, e.g. using a whirler or a spinner
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/004Recording, reproducing or erasing methods; Read, write or erase circuits therefor
    • G11B7/0045Recording
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26Apparatus or processes specially adapted for the manufacture of record carriers
    • G11B7/261Preparing a master, e.g. exposing photoresist, electroforming

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing Optical Record Carriers (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Non-Silver Salt Photosensitive Materials And Non-Silver Salt Photography (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Holo Graphy (AREA)
  • Surface Treatment Of Glass (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Magnetic Record Carriers (AREA)
  • Color Television Image Signal Generators (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Rotational Drive Of Disk (AREA)
  • Moulding By Coating Moulds (AREA)
  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)
  • Glass Compositions (AREA)
  • Polymers With Sulfur, Phosphorus Or Metals In The Main Chain (AREA)

Abstract

In a method of forming a video disc or a digital sound recording disc for example, a uniform layer of a predetermined thickness has to be applied to a substrate, and according to the invention, the layer material is applied in the form of a liquid with a known viscosity and the disc is rotated at a first velocity to spread the liquid and then the disc is rotated at a higher velocity to dry the liquid at least partly, to be in the form of a coating having a thickness which is dependent upon the viscosity of the liquid and the higher velocity at which the substrate is rotated. The method may be used is preparing a glass or other substrate for the application of a photoresist layer, or it may be used in the application of the photoresist layer, or in the application of a developer for developing an exposed photoresist layer.

Description

【発明の詳細な説明】 本発明はビデオ・デイスクを成形する方法、い
つそう詳しくは、光学読取式ビデオ・デイスクの
マスタおよびビデオ・デイスクのレプリカを成形
するのに用いるスタンパを製造する方法に関す
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method of molding video discs, and more particularly to a method of manufacturing a stamper for use in molding optically readable video disc masters and video disc replicas.

光学読取式ビデオ・デイスク・レプリカは、通
常、周波数変調した搬送信号の形態で記録密度も
高く膨大な量の情報を記憶させるのに有用であ
る。周波数変調信号は、一続きのほぼ円形で同心
の記録トラツクの形態で配置した一連の間隔を置
いたピツトまたはバンプとして記録したものが代
表的である。
Optically readable video disk replicas are useful for storing large amounts of information, usually in the form of frequency modulated carrier signals, with high recording densities. The frequency modulated signal is typically recorded as a series of spaced pits or bumps arranged in a series of generally circular, concentric recording tracks.

代表的には、デイスク・レプリカは記録マスタ
から得たデイスク状のスタンパを用いた射出成形
装置で成形する。記録マスタの代表的なものは、
デイスク状の平らな表面を有するガラス基体を包
含し、この表面に薄い記録層、たとえば金属膜が
重ねてある。通常は、マスタを所定の速度で回転
させながら半径方向移動式の対物レンズを用いて
記録層に輝度変調した書込光線を焦点合わせする
ことによつて、情報が記録層に記録される。この
光線の輝度は周波数変調信号によつて変調されて
金属膜の溶ける所定の限界よりも交互に大きくな
つたり小さくなつたりし、それによつて一連の間
隔を置いたピツトが金属膜に形成される。これら
のピツトおよび間隔は、好ましくは、公称衝撃係
数が50/50であり、それによつて、信号を最低の
第二調波ひずみ(Second harmonic distortion)
で記録することができる。
Typically, a disk replica is molded using an injection molding device using a disk-shaped stamper obtained from a recording master. Typical recording masters are:
It includes a glass substrate with a disk-like flat surface, on which a thin recording layer, for example a metal film, is superimposed. Typically, information is recorded on the recording layer by focusing a brightness-modulated writing beam onto the recording layer using a radially movable objective lens while rotating the master at a predetermined speed. The intensity of this beam is modulated by a frequency modulated signal to alternately increase or decrease the intensity above a predetermined melting limit of the metal film, thereby forming a series of spaced pits in the metal film. . These pits and spacings preferably have a nominal shock factor of 50/50, thereby reducing the signal to the lowest Second harmonic distortion.
can be recorded.

本発明はフオトレジスト記録層を有する形式の
ビデオ・デイスク・マスタの製作に用いる方法お
よびこのようなマスタからスタンパを製造する方
法にある。マスタは滑らかで平らな表面を持つた
ガラス基体を包含し、この表面に薄くて均一なフ
オトレジストの記録層が付着させてある。周波数
変調した情報信号は輝度変調した書込光線を用い
てフオトレジスト記録層に記録され、一続きのほ
ぼ円形で同心の記録トラツクの形状で配置した一
連の間隔を置いた露光区域を生じさせる。
The invention resides in a method for use in the production of video disc masters of the type having a photoresist recording layer, and in a method for manufacturing stampers from such masters. The master includes a glass substrate with a smooth, flat surface to which a thin, uniform recording layer of photoresist is deposited. A frequency modulated information signal is recorded in the photoresist recording layer using an intensity modulated writing beam, producing a series of spaced exposure areas arranged in a series of generally circular and concentric recording tracks.

本発明の1つの特徴では、ガラス基体を比較的
低い速度、たとえば、約75乃至100rpmで回転さ
せながら基体表面に塩化第一錫のような定着剤を
計量分配することによつてまず下ごしらえをす
る。次に、なお同じ速度で回転させながら表面を
水で洗い、残余の定着剤を除去し、その後、比較
的高い速度で、たとえば、約750乃至1000rpmで
回転させることによつて洗浄済の表面を乾燥させ
る。
In one aspect of the invention, the glass substrate is first primed by dispensing a fixative, such as stannous chloride, onto the surface of the substrate while rotating at a relatively low speed, e.g., about 75 to 100 rpm. . The surface is then rinsed with water, still rotating at the same speed, to remove any residual fixer, and then the cleaned surface is cleaned by rotating at a relatively high speed, e.g., about 750 to 1000 rpm. dry.

基体を下ごしらえするこの方法には、超微分子
サイズの艶出剤を用いて基体表面を磨き、磨いた
表面を清掃する予備段階を加えてもよい。清掃段
階には、まず表面を洗浄溶液で洗浄し、次に水で
洗浄し、基体を比較的高い速度で回転させること
によつて乾燥させ、表面をアセトンでふいてダス
トや油の痕跡を取り除くという段階を含んでもよ
い。
This method of preparing the substrate may include a preliminary step of polishing the substrate surface with a polishing agent of ultrafine molecular size and cleaning the polished surface. The cleaning step involves first cleaning the surface with a cleaning solution, then with water, drying by rotating the substrate at a relatively high speed, and wiping the surface with acetone to remove traces of dust and oil. It may also include the step of

本発明の別の特徴では、フオトレジスト記録層
をガラス基体の下ごしらえした表面に塗布するの
に、基体を比較的低い速度で回転させながらその
表面にフオトレジスト溶液を計量分配し、次に基
体を比較的高い速度で回転させてフオトレジスト
溶液を部分的に乾燥させ、ほぼ均一な厚さの層を
形成し、最後にフオトレジストで被覆した基体を
所定の要領で焼いてフオトレジスト層を完全に乾
燥させる。フオトレジスト溶液は約1.3センチポ
アズの粘度を有するShipley AZ1350フオトレジ
ストであると好ましく、焼成段階では、マスタを
約80℃で約20分間焼くのが好ましい。
In another feature of the invention, a photoresist recording layer is applied to the prepared surface of a glass substrate by dispensing a photoresist solution onto the surface of the glass substrate while rotating the substrate at a relatively low speed; Rotate at a relatively high speed to partially dry the photoresist solution to form a layer of approximately uniform thickness, and finally bake the photoresist-coated substrate in a predetermined manner to completely remove the photoresist layer. dry. The photoresist solution is preferably Shipley AZ1350 photoresist having a viscosity of about 1.3 centipoise, and the baking step preferably bakes the master at about 80° C. for about 20 minutes.

本発明の別の特徴では、感光性記録層の塗布に
先立つて薄い金属層をガラス基体に形成する。ま
た別の特徴はフオトレジスト記録層に周波数変調
信号を記録するのに用いる輝度変調書込光線の最
適なピーク輝度を選定する方法にある。この場
合、所定のテスト信号を、まず、一続きの狭い組
の記録トラツクの形態でデイスクに記録する。各
組のトラツクは異なつたピーク輝度の書込光線を
用いて記録する。光線の強さが所定の限界を越え
たときはいつでもフオトレジスト層が露光される
ので、より高いピーク輝度がより長い長さの露光
区域を生じさせることになる。こうして、各組の
記録トラツクが異なつた衝撃係数を持つ。
In another feature of the invention, a thin metal layer is formed on the glass substrate prior to application of the photosensitive recording layer. Another feature resides in the method of selecting the optimum peak brightness of the brightness modulated writing beam used to record the frequency modulated signal on the photoresist recording layer. In this case, a given test signal is first recorded on the disk in the form of a narrow series of recording tracks. Each set of tracks is recorded using a writing beam of different peak intensity. Since the photoresist layer is exposed whenever the intensity of the light beam exceeds a predetermined limit, a higher peak brightness will result in a longer length of exposed area. Thus, each set of recording tracks has a different shock coefficient.

好ましい方法では、約5パーセントの段階で異
なるピーク輝度を持つた3組または4組のトラツ
クを記録する。各トラツクを形成している露光区
域を一続きの間隔を置いたピツトに変換する現像
の後、デイスクを検査して、最適な値に最も近い
衝撃係数のピツトを有する特定組のトラツクを決
定する。この決定に従つて光線のピーク輝度を調
節し、その後、フオトレジスト層の残つている未
露光部分に最適な衝撃係数を持つ周波数変調信号
を記録することができる。
In a preferred method, three or four sets of tracks are recorded, each having a different peak brightness in steps of about 5 percent. After development, which converts the exposed areas forming each track into a series of spaced pits, the disk is inspected to determine the particular set of tracks that have pits with a coefficient of impact closest to the optimum value. . The peak brightness of the light beam can be adjusted according to this determination and then a frequency modulated signal with an optimal impact coefficient can be recorded on the remaining unexposed portions of the photoresist layer.

テスト信号は、好ましくは、一定の周波数を有
し、各組の記録トラツクは、好ましくは、フオト
レジスト層の周縁付近にある。また、好ましく
は、各組が数百のトラツクを包含し、狭い未露光
バンドをはさんで隣接の組から隔たつている。好
ましくは、現像したフオトレジスト層を検査する
には、各組のトラツクを読取光線で走査して間隔
を置いたピツトの記録パターンに従つて輝度の変
調した反射光線を生じさせ、この変調した輝度を
検出し、スペクトル分析器を用いて監視する。
The test signal preferably has a constant frequency and each set of recording tracks is preferably near the periphery of the photoresist layer. Also, each set preferably contains several hundred tracks and is separated from adjacent sets by a narrow unexposed band. Preferably, the developed photoresist layer is inspected by scanning each set of tracks with a reading beam to produce a reflected beam whose brightness is modulated according to the recorded pattern of spaced pits; detected and monitored using a spectrum analyzer.

本発明のまた別の特徴では、露光したフオトレ
ジスト層を現像するために、基体を比較的低い速
度(たとえば、75乃至100rpm)で回転させなが
らまず層に水を与えて予湿潤させ、次に水と所定
規定度の現像剤溶液とを与えて層を部分的に現像
し、最後に現像剤溶液のみを与えて完全な現像を
行う。現像したフオトレジスト層を次に水で洗つ
て残余の現像剤溶液を除き、最後に比較的高い速
度(好ましくは、750乃至1000rpm)で回転させ
て現像層を乾燥させる。フオトレジスト層は、好
ましくは、Shipley AZ1350フオトレジストから
得、現像剤溶液は、好ましくは、約0.230乃至
0.240の規定度を持つた水酸化カリウムまたは水
酸化ナトリウムのいずれかである。本発明のさら
にまた別の特徴では、水と現像剤溶液の両方を与
える段階は約5乃至10秒であり、現像剤のみを与
える段階は約20秒であり、洗浄段階は約30乃至60
秒である。
In another feature of the invention, in order to develop the exposed photoresist layer, the layer is first pre-wetted with water while the substrate is rotated at a relatively low speed (e.g., 75-100 rpm) and then Water and a developer solution of a predetermined normality are applied to partially develop the layer, and finally only developer solution is applied for complete development. The developed photoresist layer is then washed with water to remove residual developer solution and finally rotated at a relatively high speed (preferably 750 to 1000 rpm) to dry the developed layer. The photoresist layer is preferably obtained from Shipley AZ1350 photoresist and the developer solution is preferably from about 0.230 to
It is either potassium hydroxide or sodium hydroxide with a normality of 0.240. In yet another feature of the invention, the step of applying both water and developer solution is about 5 to 10 seconds, the step of applying only developer is about 20 seconds, and the washing step is about 30 to 60 seconds.
Seconds.

本発明のまた別の特徴はビデオ・デイスク・レ
プリカを成形するのに用いるためのスタンパを現
像した記録マスタから製造する技術である。この
特徴では、現像済の記録層に第1の薄くて均一な
金属膜を蒸着させ、その後、第1の金属膜に第2
の薄くて均一な金属膜を電気めつきし、これらの
膜で一体の金属層を形成する。次に、この一体金
属層をマスタから分離し、適当な溶剤を用いて残
留フオトレジスト材を金属層の下面から除き、ス
タンパとする。第1金属膜の厚さは約500乃至
600A゜、第2金属膜の厚さは約15ミルであると好
ましい。両金属膜ともニツケルで形成すると好ま
しい。
Another feature of the invention is a technique for manufacturing stampers from developed recording masters for use in molding video disc replicas. In this feature, a first thin, uniform metal film is deposited on the developed recording layer, and then a second metal film is deposited on the first metal film.
Electroplating thin, uniform metal films to form an integral metal layer. The integral metal layer is then separated from the master and any residual photoresist material removed from the underside of the metal layer using a suitable solvent to form a stamper. The thickness of the first metal film is approximately 500 to
Preferably, the thickness of the second metal film is about 15 mils. Preferably, both metal films are made of nickel.

本発明の多くの他の特徴および利点は添付図面
に関連した以下の詳細な説明から明らかになろ
う。
Many other features and advantages of the invention will become apparent from the following detailed description taken in conjunction with the accompanying drawings.

図面、特に第1図を参照して、記録マスタ11
に周波数変調した情報を記録する装置が示してあ
る。マスタは滑らかで平らな上面を有するガラス
基体13を包含し、この上面には所定の均一な厚
さのフオトレジスト層15が付着させてある。所
定の記録限界を越えた輝度を有する光線を当てる
ことによつてフオトレジスト層を露光させる。
With reference to the drawings, particularly FIG.
A device for recording frequency modulated information is shown. The master includes a glass substrate 13 having a smooth, flat top surface onto which a predetermined uniform thickness of photoresist layer 15 is deposited. The photoresist layer is exposed by applying a light beam having a brightness exceeding a predetermined recording limit.

この記録装置は、所定の輝度を有する書込光線
19を発生するアルゴンイオンレーザのような書
込レーザ17と、ライン23に受けた周波数変調
情報信号に従つて書込光線の輝度を変調する輝度
変調器21とを包含する。さらに、記録装置は、
所定角速度で記録マスタ11を回転させるスピン
ドル・モータ25と、記録マスタのフオトレジス
ト層15に輝度変調した光線を焦点合わせする対
物レンズ27とを包含する。対物レンズはマスタ
に対して半径方向に動くことのできるキヤリツジ
(図示せず)に装着してあり、焦点合わせされた
光線がフオトレジスト層上でらせんパターンを画
くことになる。
This recording device includes a writing laser 17, such as an argon ion laser, which generates a writing beam 19 having a predetermined brightness, and a brightness modulating beam 19 that modulates the brightness of the writing beam in accordance with a frequency modulated information signal received on line 23. A modulator 21 is included. Furthermore, the recording device
It includes a spindle motor 25 that rotates the recording master 11 at a predetermined angular velocity, and an objective lens 27 that focuses a brightness-modulated light beam onto the photoresist layer 15 of the recording master. The objective lens is mounted on a carriage (not shown) that is movable radially relative to the master so that the focused light beam traces a helical pattern on the photoresist layer.

第2,3,4図に示すように、輝度変調した光
線19の輝度はフオトレジスト層15の所定の記
録限界よりも交互に大きくなつたり小さくなつた
りし、それによつて、複数のほぼ円形で同心の記
録トラツク31の形態に配置された一連の間隔を
置いた露光区域29が層に形成される。各露光区
域および隣りとの間隔は周波数変調した記号の1
サイクルに相当する。第5図は露光区域を除いた
現像後の記録マスタ11を示しており、マスタは
スタンパを製造するのに用いるに適した状態にあ
る。
As shown in FIGS. 2, 3 and 4, the brightness of the brightness-modulated light beam 19 is alternately greater and less than a predetermined recording limit of the photoresist layer 15, thereby producing a plurality of generally circular shapes. A series of spaced exposure areas 29 arranged in the form of concentric recording tracks 31 are formed in the layer. Each exposure area and the spacing from its neighbor are one frequency modulated symbol.
corresponds to a cycle. FIG. 5 shows the recording master 11 after development with the exposed areas removed and the master in a condition suitable for use in manufacturing a stamper.

記録マスタ11は、まず、特殊な工程を経て第
1図の記録装置と共に用いられるように下ごしら
えされる。この工程では、ガラス基体13の上面
をまず研磨してから清掃する。次に、この表面に
フオトレジスト溶液を与え、その後、所定の要領
で乾燥させ、焼成することによつてフオトレジス
ト層15を形成する。焼成後、記録マスタは記録
に適した状態になる。本発明の別の特徴では、フ
オトレジスタ層を形成するに先立つて基体上に薄
い金属層を形成する。
The recording master 11 is first prepared for use with the recording apparatus of FIG. 1 through a special process. In this step, the top surface of the glass substrate 13 is first polished and then cleaned. Next, a photoresist solution is applied to this surface, and then a photoresist layer 15 is formed by drying and baking in a predetermined manner. After firing, the recording master is in a state suitable for recording. Another feature of the invention is to form a thin metal layer on the substrate prior to forming the photoresistor layer.

いつそう詳しく言えば、ガラス基体13の平ら
な表面は、まず、約9ミクロン粒度の酸化アルミ
ニウム・コンパウンドを用いて普通の要領で研削
する。次に超微分子粒度の酸化ジルコニウムまた
は酸化セリウム艶出剤を用いて磨く。酸化セリウ
ムがより迅速に表面を磨くことができるとわかつ
ているが、一般に清掃がむずかしい。
More specifically, the flat surface of the glass substrate 13 is first ground in the conventional manner using an aluminum oxide compound having a particle size of about 9 microns. Next, polish using ultrafine particle size zirconium oxide or cerium oxide polish. Cerium oxide has been found to be able to polish surfaces more quickly, but is generally difficult to clean.

ガラス基体13の研磨表面は特殊な3段階の工
程で清掃する。まず、表面を高純度の脱イオン水
で洗浄して細かいブラシでこすり、艶出剤の大部
分を除く。脱イオン水は、好ましくは、18メガオ
ーム・センチメートルの抵抗を持つている。ガラ
ス基体13の清掃面を高輝度の光の下で裸眼で点
検する。この光の下で、スクラツチのような欠陥
や顕微鏡的なピツトが点状の散乱光源として現わ
れる。欠陥があつた場合、その寸法を測定するた
め顕微鏡を用いる。25ミクロンより大きい欠陥が
検出されたが、あるいは10ミクロンより小さい欠
陥の数が1平方ミリメートルあたり1つ以上ある
場合には、この基体を不合格とし、磨きと清掃を
繰り返す。次に、表面をアセトンでぬぐい、取扱
い中に入り込んだダストや油の痕跡を除く。
The polished surface of glass substrate 13 is cleaned in a special three-step process. First, wash the surface with high-purity deionized water and scrub with a fine brush to remove most of the polish. Deionized water preferably has a resistance of 18 megaohm-cm. The cleaned surface of the glass substrate 13 is inspected with the naked eye under high-intensity light. Under this light, scratch-like defects and microscopic pits appear as point-like scattered light sources. If a defect is found, a microscope is used to measure its dimensions. If defects larger than 25 microns are detected, or if there is more than one defect per square millimeter smaller than 10 microns, the substrate is rejected and the polishing and cleaning process is repeated. Next, wipe the surface with acetone to remove any traces of dust or oil that may have been introduced during handling.

第2に、表面を洗剤溶液で洗浄し、第3に、約
10乃至20分間、脱イオン水で再び洗浄する。
Second, the surface is cleaned with a detergent solution and third, about
Wash again with deionized water for 10-20 minutes.

清掃後、基体13を第6図に示すようにターン
テーブルに置き、約750−1000rpmの回転速度で
回転させて表面を乾燥させる。第6図は清掃済の
基体13にフオトレジスト層15を形成する際に
用いる装置を示している。この装置は所定の要領
で基体を回転させる可変速度モータ33と、所定
の順序で脱イオン水、塩化第一錫溶液およびフオ
トレジスト溶液を分配する3本の分配チユーブ3
7,39,41を装着したピボツトアーム35と
を包含する。
After cleaning, the substrate 13 is placed on a turntable as shown in FIG. 6 and rotated at a rotation speed of approximately 750-1000 rpm to dry the surface. FIG. 6 shows an apparatus used to form a photoresist layer 15 on a cleaned substrate 13. The apparatus includes a variable speed motor 33 that rotates the substrate in a predetermined manner and three distribution tubes 3 that dispense deionized water, stannous chloride solution and photoresist solution in a predetermined sequence.
7, 39, 41 are mounted on the pivot arm 35.

基体13は、まず、約75乃至100rpmに相当す
る角速度で回転させ、その間分配チユーブ39を
通して清掃済の上面に塩化第一錫を分配する。ピ
ボツトアーム35は手で回転させて表面全体にわ
たつて塩化第一錫を散布する。塩化第一錫の分子
が基体の清掃面に付着し、引き続いてのフオトレ
ジスト溶液の付着を助けると考えられる。
The substrate 13 is first rotated at an angular velocity corresponding to about 75-100 rpm while dispensing the stannous chloride through the distribution tube 39 onto the cleaned top surface. The pivot arm 35 is rotated by hand to distribute the stannous chloride over the entire surface. It is believed that the stannous chloride molecules adhere to the cleaned surface of the substrate and assist in subsequent deposition of the photoresist solution.

次に、分配チユーブ37を通して表面に水を与
えて残余の塩化第一錫溶液を洗い落し、モータ3
3の回転速度を約750−1000rpmまで高めて洗浄
済の面を乾燥させる。今や、表面はフオトレジス
ト溶液を与えた適正状態にある。
Water is then applied to the surface through the distribution tube 37 to wash off any remaining stannous chloride solution and the motor 3
Increase the rotation speed in step 3 to approximately 750-1000 rpm to dry the cleaned surface. The surface is now in good condition for applying the photoresist solution.

フオトレジスト溶液は、Shipley AZ1350フオ
トレジストを、セロソルブアセテートを含むと考
えられるShipley AZシンナーで、約3対1の比
率によつて希釈することによつて調製する。この
溶液は約1.3センチポアズの粘度を有し、約半ミ
クロンより大きい粒子を除くように過する。標
準技術によつて、たとえば、Canon−Finske粘
度計によつて粘度を測定することはできる。
The photoresist solution is prepared by diluting Shipley AZ1350 photoresist with Shipley AZ thinner, which is believed to contain cellosolve acetate, by an approximately 3 to 1 ratio. This solution has a viscosity of about 1.3 centipoise and is filtered to remove particles larger than about half a micron. Viscosity can be measured by standard techniques, for example by a Canon-Finske viscometer.

次に、この希釈したフオトレジスト溶液を、約
75−100rpmで回転している基体13の下ごしら
え済の上面にチユーブ41を通して与える。この
ときもピボツトアーム35を手で回転させて基体
の全半径を横切つて溶液を分配する。約75rpmよ
り下の速度では、比較的長い時間をかけるならば
ほぼ均一な厚さの膜を得ることができるが、これ
は層汚染の傾向を高める。一方、100rpmより上
の速度では、半径方向のすじや流れ模様が生じ、
後の情報記録の質の悪影響を与える可能性があ
る。約35.56cmの直径を持つた基体を完全に覆う
には約35mlのフオトレジスト溶液を必要とする。
Next, add this diluted photoresist solution to approx.
The tube 41 is applied to the prepared top surface of the substrate 13 rotating at 75-100 rpm. Again, pivot arm 35 is manually rotated to distribute solution across the entire radius of the substrate. At speeds below about 75 rpm, a film of approximately uniform thickness can be obtained over a relatively long period of time, but this increases the tendency for layer contamination. On the other hand, at speeds above 100 rpm, radial streaks and flow patterns occur;
This may have a negative impact on the quality of subsequent information recording. Approximately 35 ml of photoresist solution is required to completely cover a substrate having a diameter of approximately 35.56 cm.

基体13の表面をフオトレジスト溶液で覆つた
後、モータ33の回転速度を乾燥するまで約750
−1000rpmまで高まる。これによつて、所定の均
一な厚さのフオトレジスト層15を得ることがで
きる。
After covering the surface of the substrate 13 with the photoresist solution, the rotational speed of the motor 33 is increased to approximately 750°C until drying.
- Increases to 1000rpm. This makes it possible to obtain the photoresist layer 15 with a predetermined uniform thickness.

フオトレジスト層15の厚さが毎分回転数
(rpm)と温度とに逆比例することがわかつたな
らば、基体を回転させてフオトレジスト溶液を部
分的に乾燥させる特定の回転速度を調節して所定
の厚さを得ることができる。たとえば、
Tolansky干渉計を用いて適当な回転速度を普通
の要領で測定することができる。この技術は層の
相対厚さを表示することができ、回転速度を連続
的に調節する反復過程を経て、最適の回転速度を
決定することができる。フオトレジスト溶液の粘
度および温度をほぼ均一に保てるならば、この回
転速度調節はほんのたまに行なえばよい。現在の
ところ、層の厚さが約1150乃至1350A゜であるこ
とが好ましく、これで作つたデイスク・レプリカ
はそれに相当した高さの情報担持バンプまたはピ
ツトを持つことになる。
Once the thickness of the photoresist layer 15 is found to be inversely proportional to revolutions per minute (rpm) and temperature, the substrate can be rotated to adjust a specific rotational speed that partially dries the photoresist solution. A predetermined thickness can be obtained. for example,
Appropriate rotational speeds can be measured in the usual manner using a Tolansky interferometer. This technique can indicate the relative thickness of the layers, and through an iterative process of continuously adjusting the rotation speed, the optimal rotation speed can be determined. If the viscosity and temperature of the photoresist solution can be maintained approximately uniform, this rotational speed adjustment may only be made occasionally. It is currently preferred that the layer thickness be approximately 1150 to 1350 Å, so that the disk replica produced will have information-bearing bumps or pits of corresponding height.

乾燥したフオトレジスト層15がなんらかの欠
陥(たとえば、半径方向すじ、外部粒子)を持つ
ていることがわかつたならば、Shipley AZシン
ナーのような適当な溶剤を用いて層を除去するこ
とができる。それから、上述した要領で新しい層
を塗布することができる。
If the dried photoresist layer 15 is found to have any defects (eg, radial streaks, extraneous particles), the layer can be removed using a suitable solvent such as Shipley AZ thinner. A new layer can then be applied as described above.

第6図のターンテーブルから除去した後、記録
マスタ11を焼いてフオトレジスト層15を完全
に乾燥させ、露光許容差を最大にする。マスタ
は、好ましくは、約80℃で約20分間焼く、これら
のパラメータは、多数の記録マスタに情報を連続
的に記録する場合に露光許容差の変動を最小限に
抑えるために狭い許容差に保たねばならない。
After removal from the turntable of FIG. 6, recording master 11 is baked to completely dry photoresist layer 15 and maximize exposure tolerance. The masters are preferably baked for about 20 minutes at about 80°C; these parameters are kept to tight tolerances to minimize variations in exposure tolerances when sequentially recording information on a large number of recording masters. must be preserved.

各記録マスタの露光感度は他のものと少しずつ
異なりがちなので、各マスタに対する輝度変調光
線19(第1図)のピーク輝度を最適なものとす
ることが望ましく、そうすれば、最適な50/50衝
撃係数で周波数変調情報信号を記録することがで
きる。本発明の別の特徴によれば、複数の組の隣
合つた記録トラツクの形態で所定のテスト信号を
各マスタ11に記録し、各組は異なつたピーク輝
度で記録してある。以下に詳しく説明する現像技
術を用いてテスト信号を現像した後、記録マスタ
を点検して所望の50/50値に最も近い衝撃係数を
持つ特定組のトラツクを決定する。こうして最適
のピーク輝度を決定した後、周波数変換情報信号
を記録マスタの残つた未露光部分に最適衝撃係数
で記録することができる。
Since the exposure sensitivity of each recording master tends to be slightly different from the others, it is desirable to optimize the peak brightness of the brightness modulated light beam 19 (FIG. 1) for each master. Able to record frequency modulated information signals with an impact factor of 50. According to another feature of the invention, a predetermined test signal is recorded on each master 11 in the form of a plurality of sets of adjacent recording tracks, each set being recorded at a different peak brightness. After developing the test signal using the development technique described in detail below, the recorded master is inspected to determine the particular set of tracks with the shock coefficient closest to the desired 50/50 value. After determining the optimal peak brightness in this manner, the frequency-converted information signal can be recorded on the remaining unexposed portions of the recording master with the optimal impact coefficient.

テスト信号は約7−8MHzの一定周波数を持つ
ていると好ましく、この信号が3組または4組の
トラツクに記録され、各組が約5パーセントだけ
変動するピーク輝度で記録されるのが好ましい。
各組は数百の記録トラツクに相当する約10秒間記
録される。また、これらの組がフオトレジスト層
15の未露光部分の狭いバンドをはさんで互に隔
たつており、層の内周付近の狭い区域に位置して
いると好ましい。
The test signal preferably has a constant frequency of about 7-8 MHz and is preferably recorded on three or four sets of tracks, each set having a peak intensity varying by about 5 percent.
Each set is recorded for approximately 10 seconds, which corresponds to several hundred recording tracks. Preferably, these sets are separated by a narrow band of unexposed portions of the photoresist layer 15 and located in a narrow area near the inner periphery of the layer.

これらの組の現像した記録トラツクは、読取光
線(図示せず)を用いて各組を走査し、記録した
テスト信号に従つて変調した輝度を持つた反射光
線を生じさせて検査することができる。この反射
光線は輝度変調される。なぜならば、フオトレジ
スト層15の未露光部分の反射率が約4パーセン
トであり、別部分の反射率がほぼゼロであるから
である。変調した光線は普通のスペクトル分析器
で適当に検出し、監視して第2調波ひずみの存在
を知る。このひずみは、テスト信号が最適な50/5
0衝撃係数で記録されたときに最小となる。
These sets of developed recording tracks can be inspected by scanning each set with a reading beam (not shown) and producing a reflected beam with an intensity modulated according to the recorded test signal. . This reflected light beam is intensity modulated. This is because the reflectance of the unexposed portion of the photoresist layer 15 is approximately 4 percent, and the reflectance of other portions is approximately zero. The modulated beam is suitably detected and monitored with a conventional spectrum analyzer for the presence of second harmonic distortion. This distortion means that the test signal is optimally 50/5
Minimum when recorded at 0 impact coefficient.

読取光線が各組のトラツクの個々の記録トラツ
クをたどる必要はない。同じテスト信号が隣接の
トラツクに記録されているからである。しかしな
がら、記録マスタ11の偏心率が読取光線をして
一度に複数組のトラツクを走査させることがない
ことが確実であることに注目されたい。読取光線
は好ましくはヘリウム・ネオンレーザで生じさせ
る。その波長がフオトレジスト層15を露光する
ことがないからである。
It is not necessary for the reading beam to follow each recording track of each set of tracks. This is because the same test signal is recorded on adjacent tracks. Note, however, that the eccentricity of recorded master 11 ensures that the reading beam does not scan more than one set of tracks at a time. The reading beam is preferably generated by a helium-neon laser. This is because the wavelength does not expose the photoresist layer 15.

第1図の記録装置を用い、最適値に調節した書
込光線19のピーク輝度でもつて、フオトレジス
ト層15の残つた未露光部分に周波数変調した情
報信号を記録する。次に、この記録済のマスタ1
1を現像して各記録トラツクを均一な深さ、幅で
連続的に変化する長さを持つた一連の間隔を置い
たピツトに変換する。
Using the recording apparatus of FIG. 1, a frequency-modulated information signal is recorded on the remaining unexposed portions of the photoresist layer 15 with the peak brightness of the writing beam 19 adjusted to an optimum value. Next, this recorded master 1
1 is developed to convert each recording track into a series of spaced pits of uniform depth, width, and continuously varying length.

本発明のまたさらに別の特徴では、露光した記
録マスタ11を特殊な工程で現像する。この工程
では、マスタを第6図に示す形式のターンテーブ
ルによつて約75−100rpmの速度で回転させなが
ら一連の流体を分配する。この工程では、まず水
が分配されて層を予湿潤させ、次に、水と所定の
規定度の現像剤溶液とを分配して層を部分的に現
像し、最後に現像剤溶液のみを分配して完全な現
像を行う。現像したフオトレジスト層を次に水で
洗つて残留現像剤溶液を除去し、その後、マスタ
の回転速度を約750−1000rpmまで高めて現像層
を乾燥させる。
In yet another feature of the invention, the exposed recording master 11 is developed in a special process. In this process, a series of fluids are dispensed while the master is rotated by a turntable of the type shown in FIG. 6 at a speed of approximately 75-100 rpm. The process involves first dispensing water to pre-wet the layer, then dispensing water and a developer solution of a given normality to partially develop the layer, and finally dispensing only the developer solution. and then perform complete development. The developed photoresist layer is then washed with water to remove residual developer solution, after which the master rotation speed is increased to about 750-1000 rpm to dry the developed layer.

好ましい現像剤溶液は水酸化カリウム、水酸化
ナトリウムを含むグループから選定したものであ
り、規定度が約0.230乃至0.240である。好ましく
は、水と現像剤溶液とを分配する段階は約5乃至
10秒であり、現像剤溶液のみを分配する段階は約
20秒であり、洗浄段階は約30乃至60秒である。
Preferred developer solutions are selected from the group including potassium hydroxide, sodium hydroxide, and have a normality of about 0.230 to 0.240. Preferably, the step of dispensing the water and developer solution takes about 5 to 5 minutes.
10 seconds, and the stage of dispensing only the developer solution is approx.
20 seconds and the wash step is about 30-60 seconds.

ビデオ・デイスク・レプリカを成形するのに用
いるに適したスタンパは現像した記録マスタ11
から作る。本発明の別の特徴では、スタンパを作
るのに、まず、フオトレジスト記録層15に約
500−600A゜厚さの均一な金属膜を蒸着し、次に、
この第1の金属膜に約15ミル厚の第2の均一な金
属膜を電気めつきする。第1の膜の下面はフオト
レジスト層に形成されている間隔を置いたピツト
のパターンに正確に一致し、2つの膜は一体の金
属層となる。この一体の金属層を記録マスタから
分離し、適当なフオトレジストシンナーを用いて
残留フオトレジスト材を除去し、スタンパを形成
する。好ましい実施例では、金属膜は共にニツケ
ルで作る。
A stamper suitable for molding a video disc replica is a developed recording master 11.
make from In another feature of the invention, in making the stamper, the photoresist recording layer 15 is first coated with approximately
Deposit a uniform metal film with a thickness of 500−600A゜, then
A second uniform metal film approximately 15 mils thick is electroplated onto this first metal film. The underside of the first film conforms exactly to the pattern of spaced pits formed in the photoresist layer, and the two films become an integral metal layer. The integral metal layer is separated from the recording master and any residual photoresist material is removed using a suitable photoresist thinner to form a stamper. In a preferred embodiment, both metal films are made of nickel.

前記の説明から明らかなように、本発明は記録
マスタを効果的に製造するのに用いる新規な技術
を多数提供する。マスタは、周波数変調情報信号
を高い信号対ノイズ比および密度でもつて記録す
ることのできるフオトレジスト記録層を包含す
る。本発明の別の特徴では、マスタのレプリカを
成形するのに用いる金属スタンパはこれらの記録
マスタから作る。
As can be seen from the foregoing description, the present invention provides a number of novel techniques for use in effectively manufacturing recording masters. The master includes a photoresist recording layer capable of recording frequency modulated information signals with high signal-to-noise ratio and density. In another feature of the invention, metal stampers used to mold replicas of the masters are made from these recorded masters.

本発明を今のところ好ましい実施例によつて説
明してきたが、発明の精神、範囲から逸脱するこ
となく種々の変更を行ないうることは当業者であ
ればわかるであろう。したがつて、本発明を特許
請求の範囲による以外に限定する意図はない。
Although the invention has been described in terms of preferred embodiments, those skilled in the art will recognize that various changes can be made without departing from the spirit or scope of the invention. Accordingly, it is not intended that the invention be limited except as by the claims.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の方法に従つて作つた記録マス
タ上に周波数変調した情報信号を記録する装置の
概略図、第2図は第1図の記録マスタの一部の拡
大平面図で、複数のほぼ円形で同心の記録トラツ
クの形態で配置した一連の間隔を置いた露光区域
を示す図、第3図は第1図の記録装置における書
込光線の変調輝度を示すグラフ、第4図は記録ト
ラツクに沿つた、記録マスタの一部の断面図で、
第3図の書込光線の輝度が所定の限界を越えたと
きにいつでも露光されるフオトレジスト記録層を
示す図、第5図は露光区域を除去した現像後の、
第4図の記録マスタの断面図、第6図は第1図の
記録マスタにフオトレジスト記録層を形成するの
に用いるターンテーブルの斜視図である。 11……記録マスタ、13……ガラス基体、1
5……フオトレジスト層、17……書込レーザ、
25……モータ、27……対物レンズ、29……
露光区域、31……記録トラツク、33……モー
タ、35……ピボツトアーム、37,39,41
……分配チユーブ。
FIG. 1 is a schematic diagram of an apparatus for recording a frequency-modulated information signal on a recording master made according to the method of the present invention, and FIG. 2 is an enlarged plan view of a part of the recording master shown in FIG. FIG. 3 is a graph showing the modulated intensity of the writing beam in the recording device of FIG. 1; FIG. A cross-sectional view of a part of the recording master along the recording track.
FIG. 3 shows the photoresist recording layer exposed whenever the brightness of the writing beam exceeds a predetermined limit; FIG. 5 shows the photoresist recording layer after development with the exposed areas removed;
FIG. 4 is a sectional view of the recording master, and FIG. 6 is a perspective view of a turntable used to form a photoresist recording layer on the recording master of FIG. 1. 11...Recording master, 13...Glass substrate, 1
5... Photoresist layer, 17... Writing laser,
25...Motor, 27...Objective lens, 29...
Exposure area, 31... Recording track, 33... Motor, 35... Pivot arm, 37, 39, 41
...Distribution tube.

Claims (1)

【特許請求の範囲】 1 光デイスクマスタの成形に用いるガラス基体
に所定の均一な厚さのフオトレジスト層を塗布す
る方法であつて、平らな表面を有するガラス基体
を準備し、所定の粘度を有するフオトレジストを
選び、所定量のフオトレジストを前記表面に、前
記ガラス基体を第1の所定速度で回転させながら
分配し、このフオトレジストで被覆したガラス基
体を第2の所定速度で回転させて所定の乾燥度ま
でフオトレジストを乾燥させ、フオトレジストの
当初の粘度および第2の所定速度によつて決定さ
れる均一な厚さを有するフオトレジスト層を形成
し、この所定の乾燥度まで乾いたフオトレジスト
被覆の基体を所定時間所定温度で焼いてフオトレ
ジスト層を完全に乾燥させる段階を包含するフオ
トレジスト層を塗布する方法。 2 特許請求の範囲第1項記載の方法において、
選定したフオトレジストが約1.3センチポアズの
粘度を有するフオトレジストであり、焼成段階に
おいて、所定温度が約80℃であり、所定時間が約
20分であることを特徴とするフオトレジスト層を
塗布する方法。 3 特許請求の範囲第1項記載の方法において、
第1の所定速度が約75rpm乃至100rpmの範囲に
あり、第2の所定速度が約750rpm乃至1000rpm
の範囲にあることを特徴とするフオトレジスト層
を塗布する方法。
[Claims] 1. A method of coating a photoresist layer with a predetermined uniform thickness on a glass substrate used for molding an optical disk master, the method comprising: preparing a glass substrate with a flat surface, and applying a photoresist layer with a predetermined viscosity to a glass substrate with a predetermined uniform thickness. dispensing a predetermined amount of photoresist onto the surface while rotating the glass substrate at a first predetermined speed, and rotating the glass substrate coated with the photoresist at a second predetermined speed. drying the photoresist to a predetermined degree of dryness to form a layer of photoresist having a uniform thickness determined by the initial viscosity of the photoresist and a second predetermined rate; A method of applying a photoresist layer comprising the step of baking the photoresist-coated substrate at a predetermined temperature for a predetermined time to completely dry the photoresist layer. 2. In the method described in claim 1,
The selected photoresist has a viscosity of about 1.3 centipoise, and in the firing step, the predetermined temperature is about 80°C and the predetermined time is about
A method of applying a photoresist layer, characterized in that it takes 20 minutes. 3. In the method described in claim 1,
The first predetermined speed is in the range of about 75 rpm to 100 rpm, and the second predetermined speed is in the range of about 750 rpm to 1000 rpm.
A method of applying a photoresist layer characterized in that the photoresist layer is in the range of .
JP62321152A 1980-08-11 1987-12-18 Molding of video disc Granted JPS63177329A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US17674380A 1980-08-11 1980-08-11
US176743 1980-08-11

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP3026661A Division JPH0760534B2 (en) 1980-08-11 1991-01-29 How to select the optimum peak brightness of a light beam
JP3026662A Division JP2521849B2 (en) 1980-08-11 1991-01-29 Method of developing photoresist layer

Publications (2)

Publication Number Publication Date
JPS63177329A JPS63177329A (en) 1988-07-21
JPH0346895B2 true JPH0346895B2 (en) 1991-07-17

Family

ID=22645656

Family Applications (4)

Application Number Title Priority Date Filing Date
JP55146985A Expired - Lifetime JPH0246366B2 (en) 1980-08-11 1980-10-22
JP62321152A Granted JPS63177329A (en) 1980-08-11 1987-12-18 Molding of video disc
JP3026661A Expired - Lifetime JPH0760534B2 (en) 1980-08-11 1991-01-29 How to select the optimum peak brightness of a light beam
JP3026662A Expired - Lifetime JP2521849B2 (en) 1980-08-11 1991-01-29 Method of developing photoresist layer

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP55146985A Expired - Lifetime JPH0246366B2 (en) 1980-08-11 1980-10-22

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP3026661A Expired - Lifetime JPH0760534B2 (en) 1980-08-11 1991-01-29 How to select the optimum peak brightness of a light beam
JP3026662A Expired - Lifetime JP2521849B2 (en) 1980-08-11 1991-01-29 Method of developing photoresist layer

Country Status (12)

Country Link
EP (1) EP0072378B1 (en)
JP (4) JPH0246366B2 (en)
KR (1) KR850001002B1 (en)
AT (1) ATE48200T1 (en)
AU (1) AU539526B2 (en)
BR (1) BR8104816A (en)
CA (1) CA1186570A (en)
DE (1) DE3177126D1 (en)
ES (5) ES504533A0 (en)
HK (1) HK26991A (en)
MX (5) MX151549A (en)
NO (3) NO158519C (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0246366B2 (en) * 1980-08-11 1990-10-15 Discovision Ass
KR870002142B1 (en) * 1982-09-20 1987-12-12 디스커비소젼 어시에이츠 Optical recording medium and its making method
US4564280A (en) * 1982-10-28 1986-01-14 Fujitsu Limited Method and apparatus for developing resist film including a movable nozzle arm
US4514439A (en) * 1983-09-16 1985-04-30 Rohm And Haas Company Dust cover
EP0139478B1 (en) * 1983-09-23 1989-06-28 Unisys Corporation Improved method for overcoating optical recording media
JPS60182030A (en) * 1984-02-29 1985-09-17 Hoya Corp Substrate for information recording and its production
CA1265394A (en) * 1986-09-19 1990-02-06 James E. Geary, Jr. Free surface casting method
US4810527A (en) * 1986-09-19 1989-03-07 E. I. Du Pont Nemours And Company Free surface casting method
US5057685A (en) * 1989-01-04 1991-10-15 Kabushiki Kaisha Toshiba Optical rotation detector including a disk having slits with concave and convex parts and method of manufacturing
JP2545677B2 (en) * 1992-09-30 1996-10-23 東芝イーエムアイ株式会社 How to apply photoresist
US5395803A (en) * 1993-09-08 1995-03-07 At&T Corp. Method of spiral resist deposition
US6207247B1 (en) 1998-03-27 2001-03-27 Nikon Corporation Method for manufacturing a molding tool used for sustrate molding
US6814897B2 (en) 1998-03-27 2004-11-09 Discovision Associates Method for manufacturing a molding tool used for substrate molding
CN102445862A (en) * 2010-09-30 2012-05-09 中芯国际集成电路制造(上海)有限公司 Improved wafer developing method
CN104570609A (en) * 2013-10-29 2015-04-29 沈阳芯源微电子设备有限公司 Implementation method of photoresist coating track

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5062403A (en) * 1973-10-01 1975-05-28
JPS50136333A (en) * 1974-04-17 1975-10-29
JPS5226214A (en) * 1975-08-25 1977-02-26 Hitachi Ltd Method for coating resist
JPS5335502A (en) * 1976-09-14 1978-04-03 Sony Corp Manufacture of original disk
JPS5346004A (en) * 1976-10-08 1978-04-25 Fuji Photo Film Co Ltd Manufacture of press.master for video disk
JPS5541864A (en) * 1978-09-20 1980-03-24 Fuji Photo Film Co Ltd Spin coating method
JPS5736446A (en) * 1980-08-11 1982-02-27 Discovision Ass
JPH0246366A (en) * 1988-08-05 1990-02-15 Honda Motor Co Ltd Directly coupling mechanism control method for fluid type power transmission device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2554692C2 (en) * 1975-12-05 1977-11-17 Basf Ag, 6700 Ludwigshafen Device for the production of the magnetic layers of magnetic storage disks
JPS5567742A (en) * 1978-11-16 1980-05-22 Matsushita Electric Ind Co Ltd Glass substrate recording medium
JPS5927229B2 (en) * 1979-09-19 1984-07-04 富士通株式会社 spinner

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5062403A (en) * 1973-10-01 1975-05-28
JPS50136333A (en) * 1974-04-17 1975-10-29
JPS5226214A (en) * 1975-08-25 1977-02-26 Hitachi Ltd Method for coating resist
JPS5335502A (en) * 1976-09-14 1978-04-03 Sony Corp Manufacture of original disk
JPS5346004A (en) * 1976-10-08 1978-04-25 Fuji Photo Film Co Ltd Manufacture of press.master for video disk
JPS5541864A (en) * 1978-09-20 1980-03-24 Fuji Photo Film Co Ltd Spin coating method
JPS5736446A (en) * 1980-08-11 1982-02-27 Discovision Ass
JPH0246366A (en) * 1988-08-05 1990-02-15 Honda Motor Co Ltd Directly coupling mechanism control method for fluid type power transmission device

Also Published As

Publication number Publication date
JPS63177329A (en) 1988-07-21
ES504532A0 (en) 1982-05-16
ES8301542A1 (en) 1982-12-01
MX151549A (en) 1984-12-13
MX149813A (en) 1983-12-26
EP0072378B1 (en) 1989-11-23
ES8301043A1 (en) 1982-11-01
AU539526B2 (en) 1984-10-04
HK26991A (en) 1991-04-19
NO813612L (en) 1982-02-12
NO158519C (en) 1988-10-05
BR8104816A (en) 1982-04-13
JPH05225616A (en) 1993-09-03
DE3177126D1 (en) 1989-12-28
AU7086681A (en) 1982-02-18
ES504536A0 (en) 1982-12-01
NO158519B (en) 1988-06-13
KR850001002B1 (en) 1985-07-15
EP0072378A1 (en) 1983-02-23
NO813611L (en) 1982-02-12
CA1186570A (en) 1985-05-07
ES8204867A1 (en) 1982-05-16
JPH05225617A (en) 1993-09-03
MX151350A (en) 1984-11-12
JPH0246366B2 (en) 1990-10-15
ES8301543A1 (en) 1982-12-01
MX149707A (en) 1983-12-13
ES504535A0 (en) 1982-12-01
MX150294A (en) 1984-04-10
JPS5736446A (en) 1982-02-27
ES504534A0 (en) 1982-12-01
NO811797L (en) 1982-02-12
JPH0760534B2 (en) 1995-06-28
ES8301544A1 (en) 1982-12-01
ES504533A0 (en) 1982-11-01
JP2521849B2 (en) 1996-08-07
ATE48200T1 (en) 1989-12-15

Similar Documents

Publication Publication Date Title
JPH0346895B2 (en)
US4175145A (en) Making memory structure for laser recording system
JPH11296918A (en) Manufacture of stamper for optical information recording medium
JPH06223418A (en) Spin coating method and device therefor
CA1165613A (en) Method for developing photoresist layer on a video disc master
CA1194595A (en) Method for forming video discs
US4422904A (en) Method for forming video discs
CA1173304A (en) Method for forming video discs
EP1473717A1 (en) Method for manufacturing stamper for information medium manufacture; stamper; and photoresist master disk
NO163758B (en) PROCEDURE FOR THE formation of a photoresist layer.
JP2663912B2 (en) Disc manufacturing method
EP0081649B1 (en) Method for forming optical discs
KR0133405B1 (en) Manufacturing method of optical disk substrate
JPH08203132A (en) Production of optical disk master disk
JPS6243257B2 (en)
JPH09134550A (en) Manufacture for stamper and optical master disk
JPS60187952A (en) Manufacture of stamper for optical disk
JPS60226043A (en) Apparatus for producing master disk for reproduction of information recording carrier
JP2776453B2 (en) Photoresist developing apparatus and developing method
JPH09274744A (en) Production of metal master disk
JPH10106046A (en) Master disk for information recording medium and its production
JPH07201085A (en) Master disk of optical disk and its production
JP2002251797A (en) Blank master and its manufacturing method
JPS60136044A (en) Production of optical disc
JPH0991768A (en) Stamper for magnetic recording medium substrate and substrate for magnetic recording medium produced by using this stamper